Device and method for testing leakage current of electrical appliances after simulating tidal conditions

Abstract

The present invention belongs to the field of electrical protection, and specifically relates to a simulated post-tidal leakage current test device and test method, which aims to solve the problem that the test results of the existing household appliance leakage test are low and easily bring potential safety hazards. The present invention includes: based on the general safety requirements of household and similar electrical appliances, calculating the resistance of the device to be tested; decomposing the resistance of the device to be tested into a preset number of device electrodes; simulating the resistance between the surface or metal through the device electrodes, reducing the number of resistances, and obtaining a simulation schematic diagram; connecting the leakage current test device based on the simulation schematic diagram to perform electrical safety testing. The present invention can simulate Class I, Class II or Class III appliances, and the power supply type is single-phase or three-phase, so as to realize the simulation test of the leakage current, determine the final value and uncertainty, and provide the accuracy of the test results for the relevant laboratories.

Description

Background Art

[0002] When a voltage is applied across any insulating material, a certain current will always flow through it. The active component of this current is called leakage current. Leakage current is an important electrical safety test indicator.

[0003] For electrical appliances, leakage current refers to the current formed between mutually insulated metal parts, or between live parts and grounded parts, through the surrounding medium or insulating surface when there is no fault and voltage is applied.

[0004] The overall revenue scale of the home appliance industry is huge, exceeding one trillion for many consecutive years, and the industry still has room for development, and the small home appliance industry is developing even more rapidly. Leakage current is closely related to people's daily life. Excessive leakage current can cause safety accidents such as electric shock and damage to electrical appliances, seriously affecting people's quality of life. According to previous laboratory-related test statistics, there are laboratory and working temperature leakage current tests that are confused, and there is a problem of small results. This will cause electrical products with leakage current exceeding the standard requirements to be misjudged as qualified products and enter the market, causing safety hazards and increasing laboratory testing risks. Summary of the invention

[0005] In order to solve the above-mentioned problem in the prior art, that is, the problem that the measurement results of the existing leakage current test device are not accurate enough and easily bring potential safety hazards, the present invention provides a leakage current test device for an electrical appliance after simulating a tidal state, the device comprising: an electrode test subcircuit, a single-phase appliance test subcircuit and a three-phase appliance test subcircuit;

[0006] The electrode test subcircuit is used to simulate the “-” pole, “+” pole and ground terminal of single-phase and three-phase appliances;

[0007] The single-phase appliance test subcircuit is used to simulate the leakage current test condition of the single-phase appliance after the tidal state, and the single-phase appliance test subcircuit includes a terminal between the simulated single-phase appliance and the easily accessible metal part and a resistance between the simulated single-phase appliance and the easily accessible metal part;

[0008] The three-phase appliance test subcircuit is used to simulate the leakage current test condition of the three-phase appliance after the tidal state. The three-phase appliance test subcircuit includes a terminal between the simulated three-phase appliance and an easily accessible metal part and a resistance between the simulated three-phase appliance and the easily accessible metal part.

[0009] In some preferred embodiments, the electrode testing subcircuit specifically comprises:

[0010] Terminal 1, used for analog grounding;

[0011] Resistor R1 is used to simulate the resistance between the ground terminal and the easily accessible metal part connected to the metal foil;

[0012] Terminal 2, used for the N pole of the simulated appliance or the “-” pole of Class III appliances;

[0013] Resistance R2, used to simulate the resistance between the N pole of the appliance or the “-” pole of Class III appliances and the accessible metal part connected to the metal foil;

[0014] Terminal 3, used to simulate the "+" pole of Class III appliances;

[0015] Resistor R3, used to simulate the resistance between the "+" pole of the Class III appliance and the accessible metal part connected to the metal foil;

[0016] Terminal 20 is used to simulate accessible metal parts connected to the metal foil.

[0017] In some preferred embodiments, the single-phase appliance testing subcircuit specifically comprises:

[0018] Terminals 4, 15, 16, 17, 18 and 19 are used to simulate the L terminal of a single-phase appliance;

[0019] Resistors R4, R15, R16, R17, R18 and R19 are used to simulate the resistance between the L terminal of a single-phase appliance and the accessible metal part to which the metal foil is connected.

[0020] In some preferred embodiments, the three-phase appliance test subcircuit realizes functions by combining with the single-phase appliance test subcircuit, specifically including:

[0021] Terminals 5, 6, 7, 8, 9 and 10 are used to simulate an L terminal of a three-phase appliance;

[0022] Resistor R5, resistor R6+R19, resistor R7+R18, resistor R8+R17, resistor R9+R16 and resistor R10+R15 are used to simulate the resistance between one L terminal of the three-phase appliance and the accessible metal parts of the connected metal foil;

[0023] Terminals 13 and 14 are used to simulate the two L terminals of a three-phase appliance with a neutral line;

[0024] Resistors R13 and R14 are used to simulate the resistance between accessible metal parts of a three-phase appliance with a neutral line, in which the two L terminals are respectively connected to metal foils.

[0025] In some preferred embodiments, the device for simulating leakage current testing of electrical appliances after tidal state is connected as follows:

[0026] Terminals 1, 2, 3, 4 and 5 are connected in parallel to terminal 20 via R1, R2, R3, R4 and R5 respectively;

[0027] Terminal 6 is connected to R6, terminal 19, R19 and terminal 20 in sequence;

[0028] Terminal 7 is connected to R7, terminal 18, R18 and terminal 20 in sequence;

[0029] Terminal 8 is connected to R8, terminal 17, R17 and terminal 20 in sequence;

[0030] Terminal 9 is connected to R9, terminal 16, R16 and terminal 20 in sequence;

[0031] Terminal 10 is connected to R10, terminal 15, R15 and terminal 20 in sequence;

[0032] Terminal 11 is connected to R11, terminal 14, R14 and terminal 20 in sequence;

[0033] Terminal 12 is connected to R12, terminal 13, R13 and terminal 20 in sequence.

[0034] Another aspect of the present invention provides a method for testing leakage current of an electrical appliance after simulating a tidal state, comprising:

[0035] Based on the circuit diagram of the device under test, determine the "+" pole, "-" pole or N pole of the device under test;

[0036] Performing a standard test on the "+" pole, "-" pole or N pole of the device to be tested to determine the resistance to be simulated;

[0037] Based on the "+" pole, "-" pole or N pole of the simulated resistor and the device to be tested, the resistance parameters of the simulated device for testing the leakage current of the electrical appliance after the tidal state are set on the device for testing the leakage current of the electrical appliance after the tidal state, a simulated device sample consistent with the device to be tested is obtained, and the simulated device sample is subjected to a uniformity test to obtain the test result. The present invention can simulate 7 types of appliances including three-phase 380V class I appliances with a neutral line, three-phase 380V class II appliances with a neutral line, three-phase 380V class I appliances without a neutral line, three-phase 380V class II appliances without a neutral line, single-phase 220V class I appliances, single-phase 220V class II appliances and class III appliances;

[0038] In some preferred implementations, the resistance to be simulated is determined by performing a standard test on the "+" pole, "-" pole or N pole of the device to be tested to determine the resistance to be simulated, specifically:

[0039] Apply a test standard voltage to the device under test, adjust the resistance value of the resistor R1, make the test current flowing through the circuit corresponding to the terminal 1 of the device under test, i.e., the ground terminal, be the standard current 0.1 mA, and make the test current deviation measured by repeated tests less than the preset first deviation threshold value, and determine the resistance value of the resistor R1;

[0040] Apply the test standard voltage to the device under test, adjust the resistance value of the resistor R2, so that the current flowing through the circuit corresponding to the terminal 2 of the device under test, i.e., the N pole of the device or the “-” pole of the Class III device, is the standard current of 0.1 mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold value, and determine the resistance value of the resistor R2;

[0041] Connect the circuit corresponding to terminal 2 and the circuit corresponding to terminal 3 to form a first test circuit, that is, connect the N pole of the appliance or the "-" pole of the Class III appliance with the "+" pole of the Class III appliance, apply the test standard voltage to the appliance to be tested, adjust the resistance value of the resistor R3, make the current flowing through the first test circuit be the standard current of 0.5 mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold, and determine the resistance value of the resistor R3;

[0042] Apply a test standard voltage to the device under test, and control the resistance values ​​of resistors R4, R15, R16, R17, R18, and R19 respectively, so that the currents of the circuits corresponding to terminals 4, 15, 16, 17, 18, and 19, i.e., the L terminal of the single-phase device, are respectively the standard currents of 0.25 mA, 0.5 mA, 0.75 mA, 1.5 mA, 3.5 mA, and 5 mA, and the test current deviation measured by repeated tests is less than a preset second deviation threshold value, and determine the resistance values ​​of resistors R4, R15, R16, R17, R18, and R19;

[0043] Apply the test standard voltage to the device under test, adjust the resistance values ​​of the resistor R13 and the resistor R14 respectively, so that the current of the circuit corresponding to the terminal 13 and the terminal 14, that is, the current of the two L terminals in the three-phase device is the standard current 0.1mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold value, and determine the resistance values ​​of the resistor R13 and the resistor R14;

[0044] Connect the circuit corresponding to terminal 13 to terminal 5, and connect the circuit corresponding to terminal 14 to the circuit corresponding to terminal 5, that is, connect two L terminals of the three-phase appliance with a neutral line to one L terminal of the three-phase appliance, apply a voltage of a first preset multiple of the rated voltage of the appliance to the corresponding circuit between terminal 20 and terminal 5, adjust the resistance value of resistor R5, make the current flowing through the circuit corresponding to terminal 5 be the standard current 0.25mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold, and determine the resistance value of resistor R5;

[0045] The circuits corresponding to the terminals 10, 9, 8, 7 and 6 are connected to the circuit corresponding to the terminal 20 via the resistors R15, R16, R17, R18 and R19, i.e., a test standard voltage is applied from one L terminal of the three-phase appliance to the ground terminal, and the resistance values ​​of the resistors R10, R9, R8, R7 and R6 are adjusted respectively, so that the currents flowing through the circuits corresponding to the terminals 10, 9, 8, 7 and 6 are the standard currents of 0.5 mA, 0.75 mA, 1.5 mA, 3.5 mA and 5 mA respectively, and the test current deviation measured by repeated tests is less than the preset second deviation threshold value, and the resistance value of the resistor R10 is determined;

[0046] The circuits corresponding to terminals 11 and 12 are connected to the circuits corresponding to terminal 20 via resistors R14+R11 and R13+R12 respectively, and terminals 11, 12, terminal 1 and terminal 5 are connected, a second standard test voltage is applied to terminals 11 and 12, and the resistance values ​​of resistors R11 and R12 are adjusted so that the current flowing through terminals 11 and 12 is the standard current of 0.25 mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold value, and the resistance values ​​of resistors R11 and R12 are determined; the second standard test voltage is 1.06 times the three-phase voltage, i.e.

[0047] In this embodiment, the standard currents corresponding to different devices are:

[0048] Three-phase 380V with neutral line Class I appliances 0.25mA, 0.5mA, 0.75mA, 1.5mA, 3.5mA, 5mA

[0049] Three-phase 380V with neutral line Class II appliances 0.25mA, 0.5mA, 0.75mA, 1.5mA, 3.5mA, 5mA

[0050] Three-phase 380V without neutral line Class I appliances 0.25mA, 0.5mA, 0.75mA, 1.5mA, 3.5mA, 5mA

[0051] Three-phase 380V without neutral line Class II appliances 0.25mA, 0.5mA, 0.75mA, 1.5mA, 3.5mA, 5mA

[0052] Single-phase 220V Class I appliances 0.25mA, 0.5mA, 0.75mA, 1.5mA, 3.5mA, 5mA

[0053] Single-phase 220V Class II appliances 0.25mA, 0.5mA, 0.75mA, 1.5mA, 3.5mA, 5mA

[0054] Class III equipment: 0.5 mA.

[0055] In some preferred embodiments, the uniformity test of the device to be tested specifically includes:

[0056] For each device to be tested, multiple simulation device samples are prepared to test the leakage current value;

[0057] Change the test sequence and repeat the test of leakage current value;

[0058] If all leakage current value test results are within the standard deviation of the leakage current value of the simulated target device, the simulated device sample is judged to be uniform;

[0059] If the leakage current value test result of the simulated device sample is outside the standard deviation range, confirm the circuit connection and the corresponding resistance value, and re-measure until all leakage current value test results are within the leakage current value standard deviation range of the simulated target device, and the standard deviation range is preferably 1%.

[0060] In some preferred embodiments, the testing method further comprises the steps of short-term stability testing, long-term stability testing and periodic repeated testing:

[0061] Extract equal amounts of the first experimental group and the second experimental group from the uniform simulation device sample;

[0062] The short-term stability test is to place the first experimental group and the second experimental group in a high temperature and high humidity environment and a vibration environment for a preset first gradient experimental time, respectively, to test the leakage current value. If all the leakage current value test results are within the leakage current value standard deviation range of the simulated target device, then the simulation device sample is judged to be a short-term stable simulation device sample;

[0063] For the long-term stability test and the periodic repetition test, the short-term stable simulation device samples are re-extracted from the first experimental group and the second experimental group in equal amounts, and are respectively divided into the third experimental group and the fourth experimental group and placed in a room temperature environment for a preset second gradient time and placed in a standard link circuit for a preset number of periodic power cycles to test the leakage current value. If all leakage current value test results are within the standard deviation range of the leakage current value of the simulated target device, the simulation device sample is judged to be a long-term stable sample and a periodic repetition sample. In this embodiment, at least 8 simulation device samples are selected to ensure that there are at least 2 experimental groups for each condition of the short-term test.

[0064] In some preferred embodiments, the test method further comprises the step of laboratory testing:

[0065] Select simulation device samples that have not been tested for short-term stability and long-term stability, assign values ​​through different laboratory assignment methods, complete leakage current value tests, calculate the average value of laboratory parameters, and perform component outlier tests to obtain laboratory test results; the test results of different laboratories have different biases, and this method of statistically calculating the average value of the test results of different laboratories can offset the laboratory bias. The input quantities obtained by uniformity and stability, as well as the third uncertainty input quantity obtained by assignment, are combined into the final uncertainty.

[0066] In the laboratory test results, the average value of all returned results of the same target value is taken as the leakage current value of the device under test.

[0067] In some preferred embodiments, the test method further comprises a step of simulating the end of device life, specifically:

[0068] For a uniform simulated device sample, an Ss value is calculated by an F test, and the Ss value is used as a first input quantity of uncertainty; the Ss value is less than one fifth of the standard deviation range of the leakage current value;

[0069] Based on the short-term stable simulation device samples, the s(β1) value calculated by the straight line fitting method is used as the second input quantity of the final uncertainty; s(β1) represents the standard deviation of β1, and β1 is a straight line.

[0070] Based on the long-term stable and periodically repeated simulation device samples, the s(β1) value calculated by the straight line fitting method is used as the input quantity of the final uncertainty;

[0071] The standard deviation of the statistical laboratory test results is used as the third input quantity of uncertainty;

[0072] Combining the first input quantity, the second input quantity and the third input quantity of the uncertainty into a total uncertainty;

[0073] For the simulation device samples for long-term stability inspection, they are respectively placed in a normal temperature environment and a periodic power-on cycle environment with a preset power-on interval, and leakage current tests are performed at preset time intervals. If all leakage current value test results are within the standard deviation range of the leakage current value of the simulated target device, and the calculated total uncertainty is lower than the preset target uncertainty, the current time placed in the normal temperature environment and the periodic power-on cycle environment with a preset power-on interval is determined to be the achievable life span.

[0074] Beneficial effects of the present invention:

[0075] (1) The device and method for testing the leakage current of an electrical appliance after tidal simulation proposed in the present invention can realize the simulation test of the leakage current of various types of appliances to determine the final leakage current value through a simple circuit structure, and verify the experimental accuracy by adding the uncertainty obtained by multiple simulation experiments, thereby improving the accuracy of the experimental results.

[0076] (2) The present invention can meet the needs of internal quality control activities such as equipment inspection, personnel assessment, personnel comparison, and equipment comparison in the laboratory, and can also provide a reference for the laboratory to conduct post-tidal leakage current tests on uncommon instruments, as well as when the instrument test results are close to the limit value, thereby providing a strong guarantee for reducing laboratory risks. BRIEF DESCRIPTION OF THE DRAWINGS

[0077] Other features, objects and advantages of the present application will become more apparent by reading the detailed description of non-limiting embodiments made with reference to the following drawings:

[0078] Figure 1 is a circuit diagram of a device for testing leakage current of an electrical appliance after simulating a tidal state according to an embodiment of the present invention;

[0079] Figure 2 1 is a flow chart of a method for testing leakage current of an electrical appliance after simulating a tidal state according to an embodiment of the present invention; DETAILED DESCRIPTION

[0080] The present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the relevant invention, rather than to limit the invention. It is also necessary to explain that, for ease of description, only the parts related to the relevant invention are shown in the accompanying drawings.

[0081] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0082] The present invention provides a device for testing leakage current of electrical appliances after simulating tidal conditions. The device proposes a method for performing simulation tests on leakage current of various types of appliances through a simple circuit structure to determine the final leakage current value, and verifies the experimental accuracy by adding uncertainties obtained from multiple simulation experiments, thereby improving the accuracy of the experimental results and providing a complete traceability chain.

[0083] The present invention provides a device for testing leakage current of an electrical appliance after simulating a tidal state, comprising: an electrode testing subcircuit, a single-phase appliance testing subcircuit and a three-phase appliance testing subcircuit;

[0084] The electrode test subcircuit is used to simulate the “-” pole, “+” pole and ground terminal of single-phase and three-phase appliances;

[0085] The single-phase appliance test subcircuit is used to simulate the leakage current test condition of the single-phase appliance after the tidal state, and the single-phase appliance test subcircuit includes a terminal between the simulated single-phase appliance and the easily accessible metal part and a resistance between the simulated single-phase appliance and the easily accessible metal part;

[0086] The three-phase appliance test subcircuit is used to simulate the leakage current test condition of the three-phase appliance after the tidal state. The three-phase appliance test subcircuit includes a terminal between the simulated three-phase appliance and an easily accessible metal part and a resistance between the simulated three-phase appliance and the easily accessible metal part.

[0087] The present invention also discloses a method for testing leakage current of an electrical appliance after simulating a tidal state, the method comprising:

[0088] Based on the circuit diagram of the device under test, determine the "+" pole, "-" pole or N pole of the device under test;

[0089] Performing a standard test on the "+" pole, "-" pole or N pole of the device to be tested to determine the resistance to be simulated;

[0090] Based on the "+" pole, "-" pole or N pole of the simulated resistor and the device to be tested, the resistance parameters of the simulated post-tidal electrical appliance leakage current test device are set on the simulated post-tidal electrical appliance leakage current test device, a simulated device sample consistent with the device to be tested is obtained, the simulated device sample is subjected to a uniformity test, and a test result is obtained.

[0091] In order to more clearly illustrate the system of the present invention, Figure 1 Each step in the embodiment of the present invention is described in detail.

[0092] The simulated tidal post-electrical appliance leakage current test device of the first embodiment of the present invention comprises: an electrode test subcircuit, a single-phase appliance test subcircuit and a three-phase appliance test subcircuit;

[0093] The electrode test subcircuit is used to simulate the “-” pole, “+” pole and ground terminal of single-phase and three-phase appliances;

[0094] In this embodiment, the electrode testing subcircuit specifically includes:

[0095] Terminal 1, used for analog grounding;

[0096] Resistor R1 is used to simulate the resistance between the ground terminal and the easily accessible metal part connected to the metal foil;

[0097] Terminal 2, used for the N pole of the simulated appliance or the “-” pole of Class III appliances;

[0098] Resistance R2, used to simulate the resistance between the N pole of the appliance or the “-” pole of Class III appliances and the accessible metal part connected to the metal foil;

[0099] Terminal 3, used to simulate the "+" pole of Class III appliances;

[0100] Resistor R3, used to simulate the resistance between the "+" pole of the Class III appliance and the accessible metal part connected to the metal foil;

[0101] Terminal 20 is used to simulate accessible metal parts connected to the metal foil.

[0102] The single-phase appliance test subcircuit is used to simulate the leakage current test condition of the single-phase appliance after the tidal state, and the single-phase appliance test subcircuit includes a terminal between the simulated single-phase appliance and the easily accessible metal part and a resistance between the simulated single-phase appliance and the easily accessible metal part;

[0103] In this embodiment, the single-phase appliance test subcircuit specifically includes:

[0104] Terminals 4, 15, 16, 17, 18 and 19 are used to simulate the L terminal of a single-phase appliance;

[0105] Resistors R4, R15, R16, R17, R18 and R19 are used to simulate the resistance between the L terminal of a single-phase appliance and the accessible metal part to which the metal foil is connected.

[0106] The three-phase appliance test subcircuit is used to simulate the leakage current test condition of the three-phase appliance after the tidal state. The three-phase appliance test subcircuit includes a terminal between the simulated three-phase appliance and an easily accessible metal part and a resistance between the simulated three-phase appliance and the easily accessible metal part.

[0107] In this embodiment, the three-phase appliance test subcircuit realizes functions by combining with the single-phase appliance test subcircuit, specifically including:

[0108] Terminals 5, 6, 7, 8, 9 and 10 are used to simulate an L terminal of a three-phase appliance;

[0109] Resistor R5, resistor R6+R19, resistor R7+R18, resistor R8+R17, resistor R9+R16 and resistor R10+R15 are used to simulate the resistance between one L terminal of the three-phase appliance and the accessible metal parts of the connected metal foil;

[0110] Terminals 13 and 14 are used to simulate the two L terminals of a three-phase appliance with a neutral line;

[0111] Resistors R13 and R14 are used to simulate the resistance between accessible metal parts of a three-phase appliance with a neutral line, in which the two L terminals are respectively connected to metal foils.

[0112] In this embodiment, the connection method of the device for simulating the leakage current test of electrical appliances after tidal state is as follows:

[0113] Terminals 1, 2, 3, 4 and 5 are connected in parallel to terminal 20 via R1, R2, R3, R4 and R5 respectively;

[0114] Terminal 6 is connected to R6, terminal 19, R19 and terminal 20 in sequence;

[0115] Terminal 7 is connected to R7, terminal 18, R18 and terminal 20 in sequence;

[0116] Terminal 8 is connected to R8, terminal 17, R17 and terminal 20 in sequence;

[0117] Terminal 9 is connected to R9, terminal 16, R16 and terminal 20 in sequence;

[0118] Terminal 10 is connected to R10, terminal 15, R15 and terminal 20 in sequence;

[0119] Terminal 11 is connected to R11, terminal 14, R14 and terminal 20 in sequence;

[0120] Terminal 12 is connected to R12, terminal 13, R13 and terminal 20 in sequence.

[0121] The method for testing leakage current of an electrical appliance after tidal simulation according to the second embodiment of the present invention is implemented based on the above-mentioned device for testing leakage current of an electrical appliance after tidal simulation, and comprises:

[0122] Based on the circuit diagram of the device under test, determine the "+" pole, "-" pole or N pole of the device under test;

[0123] Performing a standard test on the "+" pole, "-" pole or N pole of the device to be tested to determine the resistance to be simulated;

[0124] In this embodiment, the resistance to be simulated is determined by performing a standard test on the "+" pole, "-" pole or N pole of the device to be tested to determine the resistance to be simulated, specifically:

[0125] Apply a test standard voltage to the device under test, adjust the resistance value of the resistor R1, make the test current flowing through the circuit corresponding to the terminal 1 of the device under test, i.e., the ground terminal, be the standard current 0.1 mA, and make the test current deviation measured by repeated tests less than a preset first deviation threshold, and determine the resistance value of the resistor R1; the first deviation threshold is set to 10%;

[0126] Apply the test standard voltage to the device under test, adjust the resistance value of the resistor R2, so that the current flowing through the circuit corresponding to the terminal 2 of the device under test, i.e., the N pole of the device or the "-" pole of the Class III device, is the standard current of 0.1 mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold, and determine the resistance value of the resistor R2; the second deviation threshold is set to 1%;

[0127] Connect the circuit corresponding to terminal 2 and the circuit corresponding to terminal 3 to form a first test circuit, that is, connect the N pole of the appliance or the "-" pole of the Class III appliance with the "+" pole of the Class III appliance, apply the test standard voltage to the appliance to be tested, adjust the resistance value of the resistor R3, make the current flowing through the first test circuit be the standard current of 0.5 mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold, and determine the resistance value of the resistor R3;

[0128] Apply the test standard voltage to the device under test, and control the resistance values ​​of resistors R4, R15, R16, R17, R18, and R19 respectively, so that the currents of the circuits corresponding to terminals 4, 15, 16, 17, 18, and 19, i.e., the L terminal of the single-phase device, are 0.25 mA, 0.5 mA, 0.75 mA, 1.5 mA, 3.5 mA, and 5 mA respectively, and the test current deviation measured by repeated tests is less than a preset second deviation threshold value, and determine the resistance values ​​of resistors R4, R15, R16, R17, R18, and R19;

[0129] Apply the test standard voltage to the device under test, adjust the resistance values ​​of the resistor R13 and the resistor R14 respectively, so that the current of the circuit corresponding to the terminal 13 and the terminal 14, that is, the current of the two L terminals in the three-phase device is the standard current 0.1mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold value, and determine the resistance values ​​of the resistor R13 and the resistor R14;

[0130] Connect the circuit corresponding to terminal 13 to terminal 5, and connect the circuit corresponding to terminal 14 to the circuit corresponding to terminal 5, that is, connect two L terminals of the three-phase appliance with a neutral line to one L terminal of the three-phase appliance, apply a voltage of a first preset multiple of the rated voltage of the appliance to the corresponding circuit between terminal 20 and terminal 5, adjust the resistance value of resistor R5, make the current flowing through the circuit corresponding to terminal 5 be the standard current 0.25mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold, and determine the resistance value of resistor R5;

[0131] The circuits corresponding to the terminals 10, 9, 8, 7 and 6 are connected to the circuit corresponding to the terminal 20 via the resistors R15, R16, R17, R18 and R19, that is, the test standard voltage is applied from one L terminal of the three-phase appliance to the ground terminal, and the resistance values ​​of the resistors R10, R9, R8, R7 and R6 are adjusted respectively, so that the currents flowing through the circuits corresponding to the terminals 10, 9, 8, 7 and 6 are 0.5 mA, 0.75 mA, 1.5 mA, 3.5 mA and 5 mA respectively, and the test current deviation measured by repeated tests is less than the preset second deviation threshold, and the resistance value of the resistor R10 is determined;

[0132] The circuits corresponding to terminals 11 and 12 are connected to the circuits corresponding to terminal 20 via resistors R14+R11 and R13+R12 respectively, and terminals 11, 12, terminal 1 and terminal 5 are connected, a second standard test voltage is applied to terminals 11 and 12, and the resistance values ​​of resistors R11 and R12 are adjusted so that the current flowing through terminals 11 and 12 is 0.25 mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold value, and the resistance values ​​of resistors R11 and R12 are determined; the second standard test voltage is 1.06 times the three-phase voltage, i.e.

[0133] Based on the "+" pole, "-" pole or N pole of the simulated resistor and the device to be tested, the resistance parameters of the simulated post-tidal electrical appliance leakage current test device are set on the simulated post-tidal electrical appliance leakage current test device, a simulated device sample consistent with the device to be tested is obtained, the simulated device sample is subjected to a uniformity test, and a test result is obtained.

[0134] In this embodiment, the uniformity test of the device to be tested specifically includes:

[0135] For each device to be tested, multiple simulation device samples are prepared to test the leakage current value;

[0136] Change the test sequence and repeat the leakage current test multiple times;

[0137] If all leakage current value test results are within the standard deviation of the leakage current value of the simulated target device, the simulated device sample is judged to be uniform;

[0138] If the leakage current value test result of any simulated device sample is outside the standard deviation range, confirm the circuit connection and the corresponding resistance value, and re-measure until all leakage current value test results are within the leakage current value standard deviation range of the simulated target device.

[0139] In this embodiment, the testing method further includes the steps of short-term stability testing, long-term stability testing and periodic repeated testing:

[0140] Extract equal amounts of the first experimental group and the second experimental group from the uniform simulation device sample;

[0141] The short-term stability test is performed by placing the first experimental group and the second experimental group in different environments for a preset first gradient experimental time, respectively, to test the leakage current value. If all the leakage current value test results are within the standard deviation range of the leakage current value of the simulated target device, the simulated device sample is judged to be a short-term stable simulated device sample; preferably, the first experimental group and the second experimental group are both set to 6 simulated device samples, which are placed in a high temperature and high humidity environment and a vibration environment simulating transportation conditions for 0 days, 2 days, 5 days, 9 days, and 14 days, respectively, and then a leakage current test is performed; when one device does not meet the deviation requirement in a certain test, the device is retested. If it still does not meet the deviation requirement, it indicates that the current batch of devices is unstable in the short term; when more than one device does not meet the deviation requirement, the current batch of devices does not meet the short-term stability test. When all the results of the short-term stability tests are within the standard deviation of the leakage current value of the simulated target device, and there is no monotonic trend using the straight line fitting method, if there is more than one simulated device sample with a leakage current exceeding the standard deviation range, it is determined that the corresponding device under test does not meet the short-term stability standard; the specific determination method for the lack of monotonic trend is: Quantitative formula |β1|<t 0.95，n-2 s(β1) satisfies this formula, indicating stability. 0.95，n-2 It is the number obtained by looking up the table according to the number of tests n;

[0142] The long-term stability test and the periodic repetition test are as follows: the short-term stable simulation device samples are re-extracted from the first experimental group and the second experimental group with equal amounts of simulation device samples, respectively divided into the third experimental group and the fourth experimental group, and respectively placed in a room temperature environment for a preset second gradient time and placed in a standard link circuit for a preset number of periodic power-on cycles to test the leakage current value. If all leakage current value test results are within the standard deviation range of the leakage current value of the simulated target device, the simulation device samples are judged to be long-term stable samples and periodic repetition samples;

[0143] Specifically: the short-term stable simulation device samples are placed in a normal temperature environment for a preset second gradient time and in a standard link circuit for a preset number of periodic power-on cycles to test leakage current values. If all leakage current value test results are within the standard deviation range of the leakage current value of the simulated target device, the simulation device samples are judged to be long-term stable samples and periodically repeated samples.

[0144] If there is a simulation device sample with a leakage current that exceeds the standard deviation range, the simulation device sample shall be retested. If the leakage current test result is still not within the leakage current value standard deviation range, it is determined that the corresponding device under test does not meet the long-term stability standard; if there is more than one simulation device sample with a leakage current that exceeds the standard deviation range, it is determined that the corresponding device under test does not meet the long-term stability standard;

[0145] In this embodiment, the testing method further comprises the step of laboratory testing:

[0146] Select simulation device samples that have not been subjected to short-term stability tests and long-term stability tests, assign values ​​using different laboratory value assignment methods, complete parameter tests, calculate the average values ​​of laboratory parameters, perform component outlier tests, and obtain laboratory test results;

[0147] A normal distribution test is performed on the leakage current values ​​(test results) returned by the laboratory. If the repeated test fails to pass the normal distribution test, the parameters that fail the normal distribution test are eliminated and subsequent tests are performed on other parameters. If the number of target values ​​that do not meet the normal distribution test is ≥20%, the batch of simulation devices cannot be assigned a value.

[0148] A test for outliers within the group is performed on a set of results for each parameter of each laboratory. If <90% of the parameter test results of each laboratory have no outliers, it indicates that the results of this laboratory are unavailable. Replace other laboratories to test the samples of the simulation device. If the test results pass the normal distribution test, the test for outliers within the group is performed again. If ≥90% of the parameter test results of each laboratory have no outliers, the laboratory needs to retest the results with outliers. After the retest results pass the normal distribution test, the test for outliers within the group is performed. The results show that there are no outliers, indicating that the results of this laboratory are available. If the repeated test still fails to pass the test for outliers within the group, the sample of the simulation device is discarded, and another simulation device is replaced and sent to the laboratory for retesting. If the repeated measurement still fails to meet the test for outliers within the group, the batch of simulation devices cannot be assigned a value. The leakage current value (test result) tested 6 times by each laboratory on a target test device is called within the group.

[0149] Calculate the average value for each group of parameters returned by the laboratory, and perform an inter-group outlier test on the average value of the 8 laboratories for each parameter. The test results show that there are no outliers between groups, indicating that this test has passed. If there are outliers between groups, the simulation device tested by the outlier laboratory will be retested in another laboratory. After the results returned by the laboratory meet the normal distribution test and the intra-group outlier test, recalculate the average value, and after meeting the inter-group equal precision test, perform an inter-group outlier test. If it still fails to pass the test. Discard this simulation device, replace other simulation devices in this batch and send them to the laboratory for retesting, and repeat the above three procedures. If it still fails to meet the inter-group outlier test, this batch of simulation devices cannot be assigned a value.

[0150] In the laboratory test results, the average value of all returned results of the same target value is taken as the leakage current value of the device under test.

[0151] In this embodiment, the test method further includes a step of simulating the end of device life, specifically:

[0152] For a uniform simulated device sample, an Ss value is calculated by an F test, and the Ss value is used as a first input quantity of uncertainty; the Ss value is less than one fifth of the standard deviation range of the leakage current value;

[0153] The s(β1) value calculated by the straight-line fitting method based on the short-term stable simulation device samples is used as the second input quantity of the final uncertainty;

[0154] Based on the long-term stable and periodically repeated simulation device samples, the s(β1) value calculated by the straight line fitting method is used as the input quantity of the final uncertainty;

[0155] The standard deviation of the statistical laboratory test results is used as the third input quantity of uncertainty;

[0156] Combining the first input quantity, the second input quantity and the third input quantity of the uncertainty into a total uncertainty;

[0157] For the simulation device samples for long-term stability inspection, they are respectively placed in a normal temperature environment and a periodic power-on cycle environment with a preset power-on interval, and leakage current tests are performed at preset time intervals. If all leakage current value test results are within the standard deviation range of the leakage current value of the simulated target device, and the calculated total uncertainty is lower than the preset target uncertainty, the current time placed in the normal temperature environment and the periodic power-on cycle environment with a preset power-on interval is determined to be the achievable life span.

[0158] An electronic device according to the third embodiment of the present invention comprises: at least one processor; and a memory communicatively connected to at least one of the processors; wherein the memory stores instructions executable by the processor, and the instructions are used to be executed by the processor to implement the above method.

[0159] A fourth embodiment of the present invention provides a computer-readable storage medium, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to be executed by the computer to implement the above method.

[0160] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process and related instructions of the storage device and processing device described above can refer to the corresponding process in the aforementioned method embodiment and will not be repeated here.

[0161] The terms "first", "second", etc. are used to distinguish similar objects rather than to describe or indicate a particular order or sequence.

[0162] The term "comprise" or any other similar term is intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus / device that includes a list of elements includes not only those elements but also other elements not expressly listed, or also includes elements inherent to such process, method, article, or apparatus / device.

[0163] So far, the technical solutions of the present invention have been described in conjunction with the preferred embodiments shown in the accompanying drawings. However, it is easy for those skilled in the art to understand that the protection scope of the present invention is obviously not limited to these specific embodiments. Without departing from the principle of the present invention, those skilled in the art can make equivalent changes or substitutions to the relevant technical features, and the technical solutions after these changes or substitutions will fall within the protection scope of the present invention.

Claims

1. A device for testing leakage current of electrical appliances after simulating tidal conditions, characterized in that: The device comprises: an electrode test subcircuit, a single-phase appliance test subcircuit and a three-phase appliance test subcircuit; The electrode test subcircuit is used to simulate the "-" pole, "+" pole and ground terminal of a single-phase appliance and a three-phase appliance, and specifically includes: Terminal 1, used for analog grounding; Resistor R1 is used to simulate the resistance between the ground terminal and the easily accessible metal part connected to the metal foil; Terminal 2, used for the N pole of the simulated appliance or the "-" pole of Class III appliances; Resistance R2, used to simulate the resistance between the N pole of the appliance or the "-" pole of Class III appliances and the accessible metal part connected to the metal foil; Terminal 3, used to simulate the "+" pole of Class III appliances; Resistor R3, used to simulate the resistance between the "+" pole of the Class III appliance and the accessible metal part connected to the metal foil; Terminal 20, used to simulate accessible metal parts connected to the metal foil; The single-phase appliance test subcircuit is used to simulate the leakage current test condition of the single-phase appliance after the tidal state. The single-phase appliance test subcircuit includes a terminal between the simulated single-phase appliance and an easily accessible metal part and a resistance between the simulated single-phase appliance and the easily accessible metal part. The single-phase appliance test subcircuit specifically includes: Terminal 4, terminal 15, terminal 16, terminal 17, terminal 18 and terminal 19 are used to simulate the L terminal of the single-phase appliance; Resistors R4, R15, R16, R17, R18 and R19 are used to simulate the resistance between the L terminal of the single-phase appliance and the easily accessible metal part connected to the metal foil; The three-phase appliance test subcircuit is used to simulate the leakage current test condition of the three-phase appliance after the tidal state. The three-phase appliance test subcircuit includes a terminal simulating the three-phase appliance and an easily accessible metal part and a resistance simulating the three-phase appliance and an easily accessible metal part. The three-phase appliance test subcircuit realizes the function by combining with the single-phase appliance test subcircuit. The three-phase appliance test subcircuit specifically includes: Terminal 5, terminal 6, terminal 7, terminal 8, terminal 9 and terminal 10 are used to simulate an L terminal of the three-phase appliance; Resistor R5, resistor R6+R19, resistor R7+R18, resistor R8+R17, resistor R9+R16 and resistor R10+R15, used to simulate the resistance between one L terminal of the three-phase appliance and the accessible metal part of the connected metal foil; Terminals 13 and 14 are used to simulate two L terminals of the three-phase appliance with a neutral line; Resistors R13 and R14 are used to simulate the resistance between accessible metal parts of the three-phase appliance with a neutral line, in which the two L terminals are respectively connected to metal foils; The connection method of the simulated tidal electrical appliance leakage current test device is as follows: Terminals 1, 2, 3, 4 and 5 are connected in parallel to terminal 20 via R1, R2, R3, R4 and R5 respectively; Terminal 6 is connected to R6, terminal 19, R19 and terminal 20 in sequence; Terminal 7 is connected to R7, terminal 18, R18 and terminal 20 in sequence; Terminal 8 is connected to R8, terminal 17, R17 and terminal 20 in sequence; Terminal 9 is connected to R9, terminal 16, R16 and terminal 20 in sequence; Terminal 10 is connected to R10, terminal 15, R15 and terminal 20 in sequence; Terminal 11 is connected to R11, terminal 14, R14 and terminal 20 in sequence; Terminal 12 is connected to R12, terminal 13, R13 and terminal 20 in sequence.

2. A method for testing leakage current of electrical appliances after simulating tidal conditions, characterized in that: Based on the simulated tidal electrical appliance leakage current test device according to claim 1, the method comprises: Based on the circuit diagram of the device under test, determine the "+" pole, "-" pole or N pole of the device under test; Perform standard test on the "+" pole, "-" pole or N pole of the device to be tested to determine the resistance to be simulated, specifically: Apply a test standard voltage to the device under test, adjust the resistance value of the resistor R1, make the test current flowing through the circuit corresponding to the terminal 1 of the device under test, i.e., the ground terminal, be the standard current 0.1 mA, and make the test current deviation measured by repeated tests less than the preset first deviation threshold value, and determine the resistance value of the resistor R1; Apply the test standard voltage to the device under test, adjust the resistance value of the resistor R2, so that the current flowing through the circuit corresponding to the terminal 2 of the device under test, i.e., the N pole of the device or the "-" pole of the Class III device, is the standard current of 0.1 mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold value, and determine the resistance value of the resistor R2; Connect the circuit corresponding to terminal 2 and the circuit corresponding to terminal 3 to form a first test circuit, that is, connect the N pole of the appliance or the "-" pole of the Class III appliance with the "+" pole of the Class III appliance, apply the test standard voltage to the appliance to be tested, adjust the resistance value of the resistor R3, make the current flowing through the first test circuit the standard current of 0.5 mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold, and determine the resistance value of the resistor R3; Apply a test standard voltage to the device under test, and control the resistance values ​​of resistors R4, R15, R16, R17, R18, and R19 respectively, so that the currents of the circuits corresponding to terminals 4, 15, 16, 17, 18, and 19, i.e., the L end of the single-phase device, are 0.25 mA, 0.5 mA, 0.75 mA, 1.5 mA, 3.5 mA, and 5 mA respectively, and the test current deviation measured by repeated tests is less than a preset second deviation threshold, and determine the resistance values ​​of resistors R4, R15, R16, R17, R18, and R19; Apply a test standard voltage to the device under test, adjust the resistance values ​​of the resistor R13 and the resistor R14 respectively, so that the current of the circuit corresponding to the terminal 13 and the terminal 14, that is, the current of the two L terminals in the three-phase device is the standard current 0.1 mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold value, and determine the resistance values ​​of the resistor R13 and the resistor R14; Connect the circuit corresponding to terminal 13 to terminal 5, and connect the circuit corresponding to terminal 14 to the circuit corresponding to terminal 5, that is, connect the two L terminals of the three-phase appliance with a neutral line of the appliance to one L terminal of the three-phase appliance, apply a voltage of a first preset multiple of the rated voltage of the appliance to the corresponding circuit between terminal 20 and terminal 5, adjust the resistance value of resistor R5, make the current flowing through the circuit corresponding to terminal 5 be the standard current 0.25mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold, and determine the resistance value of resistor R5; The circuits corresponding to the terminals 10, 9, 8, 7 and 6 are connected to the circuit corresponding to the terminal 20 via the resistors R15, R16, R17, R18 and R19, that is, the test standard voltage is applied from one L terminal of the three-phase appliance to the ground terminal, and the resistance values ​​of the resistors R10, R9, R8, R7 and R6 are adjusted respectively, so that the currents flowing through the circuits corresponding to the terminals 10, 9, 8, 7 and 6 are 0.5 mA, 0.75 mA, 1.5 mA, 3.5 mA and 5 mA respectively, and the test current deviation measured by repeated tests is less than the preset second deviation threshold, and the resistance value of the resistor R10 is determined; The circuits corresponding to terminals 11 and 12 are connected to the circuit corresponding to terminal 20 via resistors R14+R11 and R13+R12 respectively, and terminals 11, 12, terminal 1 and terminal 5 are connected, a second standard test voltage is applied to terminals 11 and 12, and the resistance values ​​of resistors R11 and R12 are adjusted so that the current flowing through terminals 11 and 12 is the standard current of 0.25 mA, and the test current deviation measured by repeated tests is less than the preset second deviation threshold value, and the resistance values ​​of resistors R11 and R12 are determined; the second standard test voltage is 1.06 times the three-phase voltage, that is, 380 / √3V; Based on the "+" pole, "-" pole or N pole of the resistor to be simulated and the device to be tested, the resistance parameters of the device for simulating the leakage current test of the electrical appliance after tidal state are set on the device for simulating the leakage current test of the electrical appliance after tidal state, a simulated device sample consistent with the device to be tested is obtained, and the simulated device sample is subjected to a uniformity test to obtain a test result.

3. The method for testing leakage current of an electrical appliance after simulating tidal state according to claim 2, characterized in that: The uniformity test of the simulation device sample specifically includes: For each device to be tested, multiple simulation device samples are made to test the leakage current value; Change the test sequence and repeat the test of leakage current value; If all leakage current value test results are within the standard deviation of the leakage current value of the simulated target device, the simulated device sample is judged to be uniform; If the leakage current value test result of any simulated device sample is outside the standard deviation range, confirm the circuit connection and the corresponding resistance value, and re-measure until all leakage current value test results are within the leakage current value standard deviation range of the simulated target device.

4. The method for testing leakage current of an electrical appliance after simulating tidal state according to claim 3, characterized in that: The test method further includes the steps of short-term stability test, long-term stability test and periodic repeated test: Extract equal amounts of the first experimental group and the second experimental group from the uniform simulation device sample; The short-term stability test is to place the first experimental group and the second experimental group in different environments for a preset first gradient experimental time, respectively, to test the leakage current value, and if all the leakage current value test results are within the leakage current value standard deviation range of the simulated target device, then the simulation device sample is judged to be a short-term stable simulation device sample; The long-term stability test and the periodic repetition test are as follows: the short-term stable simulation device samples are re-extracted from the first experimental group and the second experimental group with equal amounts of simulation device samples, and are respectively divided into the third experimental group and the fourth experimental group and placed in a room temperature environment for a preset second gradient time and in a standard link circuit for a preset number of periodic power-on cycles to test the leakage current value. If all leakage current value test results are within the standard deviation range of the leakage current value of the simulated target device, the simulation device samples are judged to be long-term stable samples and periodic repetition samples.

5. The method for testing leakage current of an electrical appliance after simulating tidal state according to claim 4, characterized in that: The test method also includes the steps of laboratory testing: Select simulation device samples that have not been subjected to short-term stability tests and long-term stability tests, assign values ​​using different laboratory value assignment methods, complete parameter tests, calculate the average values ​​of laboratory parameters, perform component outlier tests, and obtain laboratory test results; In the laboratory test results, the average value of all returned results of the same target value is taken as the leakage current value of the device under test.

6. The method for testing leakage current of an electrical appliance after simulating tidal conditions according to claim 5, characterized in that: The test method also includes the step of simulating the end of device life, specifically: For a uniform simulated device sample, an Ss value is calculated by an F test, and the Ss value is used as a first input quantity of uncertainty; the Ss value is less than one fifth of the standard deviation range of the leakage current value; The s(β1) value calculated by the straight-line fitting method based on the short-term stable simulation device samples is used as the second input quantity of the final uncertainty; Based on the long-term stable and periodically repeated simulation device samples, the s(β1) value calculated by the straight line fitting method is used as the input quantity of the final uncertainty; The standard deviation of the statistical laboratory test results is used as the third input quantity of uncertainty; Combining the first input quantity, the second input quantity and the third input quantity of the uncertainty into a total uncertainty; For the simulation device samples for long-term stability inspection, they are respectively placed in a normal temperature environment and a periodic power-on cycle environment with a preset power-on interval, and leakage current tests are performed at preset time intervals. If all leakage current value test results are within the standard deviation range of the leakage current value of the simulated target device, and the calculated total uncertainty is lower than the preset target uncertainty, the current time placed in the normal temperature environment and the periodic power-on cycle environment with a preset power-on interval is determined to be the achievable life span.

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