Hot spot test method for photovoltaic module coupons

Abstract

The present application relates to a kind of hot spot test methods of photovoltaic module sample, method includes: providing photovoltaic module sample;Photovoltaic module sample is placed into to steady-state test box, and reverse voltage is input;Photovoltaic module sample is formed by different proportion of shading and is formed shading part, the photo-generated current of the remaining part of shading part reaches Imp;Shading part is connected to temperature monitoring device, temperature monitoring device is suitable for real-time monitoring the temperature of shading part;The point of the highest temperature of shading part is as hot spot.The method manufacturing process is simple, and the consumables used are less, and economic cost is low.

Description

TECHNICAL FIELD

[0001] The present application relates to a kind of hot spot test method of photovoltaic module sample, belong to photovoltaic field. BACKGROUND

[0002] Currently, for the hot spot test of photovoltaic module finished product, there is a standard test method in the industry. First, each cell of photovoltaic module is shielded by shielding piece, and the cell with maximum leakage current and minimum leakage current is selected, a total of 4 pieces.

[0003] Secondly, IV test is carried out by shielding the cell, so that the inflection point current of test is close to Imp under the condition of no shielding, so that the best shielding area of each cell is found. Finally, the selected cell is shielded with the best area, and thermocouple is arranged at the high hot spot and shielding of hot spot cell. In turn, the cell is irradiated, and the temperature is recorded if the temperature of the module is stable after irradiation for 1 hour. However, this test method is only suitable for testing the finished product of photovoltaic module, the steps are complicated, the test time is long, not only the inflection point in the process of selecting the cell with large leakage current is not easy to obtain, and if the test fails, the economic cost is relatively high. SUMMARY

[0004] The purpose of the present application is to provide a kind of hot spot test method of photovoltaic module sample, which is suitable for packaging material and cell introduction initial stage, and is convenient and saves economic cost and time.

[0005] To achieve the above purpose, the present application provides the following technical scheme: a kind of hot spot test method of photovoltaic module sample, the method comprises:

[0006] providing a photovoltaic module sample;

[0007] put the photovoltaic module sample into a steady-state test box, and input reverse voltage;

[0008] shielding the photovoltaic module sample to form a shielding part at different proportions, and the photo-generated current of the remaining part of the shielding part reaches Imp;

[0009] the shielding part is connected to a temperature monitoring device, which is suitable for real-time monitoring the temperature of the shielding part;

[0010] the point of the highest temperature of the shielding part is used as the hot spot.

[0011] In one embodiment, the "shielding part formed by different proportions of shielding" is specifically:

[0012] The different proportions are sequentially decreased by a preset gradient from 100% shielding of the photovoltaic module sample, and temperature test is carried out at different proportions.

[0013] In one of the embodiments, the photovoltaic module sample includes a cell, a busbar connected with the cell, and a solder strip.

[0014] The busbar is adapted to converge the current generated by the cell except the shielding part.

[0015] In one of the embodiments, the photovoltaic module sample further includes a glass box having a receiving cavity, and the photovoltaic module sample is embedded in the receiving cavity and then placed in the steady-state test box.

[0016] In one of the embodiments, the busbar has a connecting end protruding out of the glass box.

[0017] In one of the embodiments, the method further includes a direct current power supply adapted to provide the reverse voltage, and the connecting end is adapted to be connected with the direct current power supply.

[0018] In one of the embodiments, the step of shielding the photovoltaic module sample to form shielding parts in different proportions is specifically shielding the cell in different proportions by using a black shielding sheet to form the shielding parts.

[0019] In one of the embodiments, the temperature monitoring device includes a thermocouple connected with the shielding part and a paperless recorder connected with the thermocouple.

[0020] In one of the embodiments, the method further includes:

[0021] The photovoltaic module sample is exposed to the sun in the steady-state test box for 1 hour;

[0022] After the temperature of the shielding part is stabilized, the highest temperature of the shielding part is tested by using an infrared thermal imager and recorded.

[0023] The present application has the following beneficial effects: the present application simulates the working state of the cell in a normal applicable environment by making a photovoltaic module sample, placing the photovoltaic module sample in a steady-state test box, inputting a reverse voltage, and shielding the photovoltaic module sample in different proportions, so as to complete the hot spot test of the photovoltaic module sample and obtain the hot spot of the photovoltaic module sample, which only needs to package one cell to complete the test, and the manufacturing process is simple, the consumables used are less, and the economic cost is low.

[0024] The above description is only a summary of the technical solutions of the present application, in order to more clearly understand the technical means of the present application, and the content of the specification can be implemented as follows. BRIEF DESCRIPTION OF DRAWINGS

[0025] Figure 1This is a flowchart of the hot spot testing method for a photovoltaic module sample according to the present invention;

[0026] Figure 2 for Figure 1 The diagram shows the test structure of the photovoltaic module sample in the hot spot test method for the photovoltaic module sample. Detailed Implementation

[0027] The technical solutions of this application will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this application. The application will be described in detail below with reference to the accompanying drawings and embodiments. It should be noted that, unless otherwise specified, the embodiments and features in the embodiments of this application can be combined with each other.

[0028] It should be noted that the terms "first," "second," etc., in the specification, claims, and drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0029] In this application, unless otherwise stated, directional terms such as "upper," "lower," "top," and "bottom" are generally used in relation to the direction shown in the accompanying drawings, or in relation to the vertical, perpendicular, or gravitational direction of the component itself; similarly, for ease of understanding and description, "inner" and "outer" refer to the inner and outer contours of each component itself, but the above directional terms are not intended to limit this application.

[0030] Please see Figure 1 and Figure 2 The preferred embodiment of this invention provides a hot spot testing method for photovoltaic module samples, suitable for hot spot testing of photovoltaic module samples. This testing method can be used in the initial stage of introducing photovoltaic module samples and in the experimental research stage. This method is not only simple in structure and easy to implement, but also saves time and reduces costs.

[0031] Specifically, the method includes:

[0032] Provide photovoltaic module samples;

[0033] The photovoltaic module prototype includes solar cells, busbars 3 connected to the solar cells, and solder strips. The busbars 3 are used to collect current generated by the portion of the solar cell other than the shaded portion 4. In this embodiment, two busbars 3 are provided, one on each side of the solar cell. In other embodiments, the number of busbars 3 can be different; the specific number of busbars 3 is not limited here and depends on the actual situation.

[0034] The photovoltaic module sample further comprises a glass box 2, wherein the glass box 2 has a containing cavity, and the at least partial photovoltaic module sample is embedded in the containing cavity and then placed in the steady-state test box. It can also be understood that the glass box 2, the cell sheet, the bus bar 3 arranged on both sides of the cell sheet and the solder strip form a photovoltaic module sample,

[0035] The photovoltaic module sample is placed in the steady-state test box and a reverse voltage is inputted;

[0036] The test method further comprises a direct current power supply 1 adapted to provide the reverse voltage, and the direct current power supply 1 is connected with the connecting end 31 of the bus bar 3 through the test wire 6.

[0037] The photovoltaic module sample is subjected to different proportions of shading to form a shading part 4, and the photo-generated current of the remaining part of the shading part 4 reaches Imp.

[0038] The shading part 4 is connected with a temperature monitoring device adapted to monitor the temperature of the shading part 4 in real time.

[0039] The shading part 4 is connected with a temperature monitoring device adapted to monitor the temperature of the shading part 4 in real time.

[0040] The temperature monitoring device comprises a thermocouple 7 connected with the shading part 4 and a paperless recorder 5 connected with the thermocouple 7, so as to monitor the temperature of the shading part 4 with different proportions.

[0041] The point of the highest measured temperature of the shading part 4 is taken as the hot spot.

[0042] In the embodiment, the shading part 4 can be understood as the part of the photovoltaic module which is shaded by dirt or damaged in the working environment, and the part which is not shaded is the cell sheet which is not covered by dirt or can normally work in the photovoltaic module.

[0043] The method further comprises the following steps:

[0044] The photovoltaic module sample is exposed to the sun in the steady-state test box for 1 hour;

[0045] After the temperature of the shading part 4 is stabilized, the highest temperature of the shading part 4 is tested by using an infrared thermal imager and recorded.

[0046] The purpose of such arrangement is to expose the photovoltaic module sample in the steady-state test box for one hour, which can be understood as simulating the situation of the photovoltaic module sample with a dirty (shading part 4) cell exposed to the sun outdoors. When the temperature of the shading part 4 stabilizes, the highest temperature of the shading part 4 is tested by an infrared thermal imager to obtain the hot spot of the cell under the condition.

[0047] In summary, the above-mentioned method is used to test the packaged photovoltaic module sample, which has the following advantages: on the one hand, the present application only uses one cell for packaging, and the manufacturing process is simpler than the traditional hot spot test of photovoltaic modules, and the material consumption is less, the economic cost is greatly reduced, and if the test result is not ideal, the corresponding financial and human resources required for testing will also be reduced; on the other hand, only one packaged cell is tested, compared with the traditional hot spot test method of photovoltaic modules, the test method in the present application has fewer test steps, and the process of selecting a piece and the step of IV test are omitted, saving test time; in addition, since the test object is a packaged cell, which is small in size, it can be used for related research and testing of packaging material matching, etc.

[0048] The technical features of the above-described embodiments can be combined in any manner. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described, but as long as the combinations of the technical features do not contradict, they should be considered within the scope of the present disclosure.

[0049] The above-described embodiments only express several embodiments of the present application, and the description is more specific and detailed, but it should not be understood as limiting the scope of the patent. It should be pointed out that for ordinary skilled in the art, without departing from the concept of the present application, a number of modifications and improvements can be made, which are within the scope of the present application. Therefore, the scope of protection of the present application should be subject to the appended claims.

Claims

1. A method for testing hot spots on a photovoltaic module sample, characterized in that, The method comprises: providing a photovoltaic module sample comprising a piece of cell, a busbar connected with the cell, a solder strip and a glass box, shielding the photovoltaic module sample at different proportions to form a shaded part, the busbar is adapted to converge the current generated by the other part of the cell except the shaded part, the busbar has a connecting end protruding out of the glass box, the connecting end is adapted to be connected with a direct current power supply, the direct current power supply is adapted to provide a reverse voltage, the glass box has a containing cavity, at least part of the photovoltaic module sample is embedded in the containing cavity; putting the photovoltaic module sample into a steady-state test box and inputting the reverse voltage; the photo-generated current of the rest of the shaded part reaches Imp; the shaded part is connected with a temperature monitoring device, the temperature monitoring device is adapted to monitor the temperature of the shaded part in real time; the point of the highest temperature of the shaded part is the hot spot.

2. The method of hot spot testing of a photovoltaic assembly coupon of claim 1, wherein, The different proportions of the shaded part are: the different proportions are sequentially decreased by a preset gradient from 100% shielding of the photovoltaic module sample, and the temperature test is performed at different proportions.

3. The method of hot spot testing of a photovoltaic assembly coupon of claim 1, wherein, The different proportions of the shaded part are formed by using a black shielding sheet to shield the cell at different proportions to form the shaded part.

4. The method of hot spot testing of a photovoltaic assembly sample of claim 1, wherein, The temperature monitoring device comprises a thermocouple connected with the shaded part and a paperless recorder connected with the thermocouple.

5. The hot spot test method of a photovoltaic assembly coupon according to any one of claims 1 to 4, wherein, The method further comprises: the photovoltaic module sample is exposed to the sun in the steady-state test box for 1 hour; after the temperature of the shaded part is stable, the highest temperature of the shaded part is tested by an infrared thermal imager and recorded.

Images