A quality monitoring method based on working conditions and related devices and program medium products

Abstract

The embodiment of the present application provides a quality monitoring method based on working conditions and related devices and program medium products, the method comprising: determining the production working conditions corresponding to the current production batch; obtaining the quality database of the production working conditions, the quality database including the product performance parameter table corresponding to the target product, the component parameter table corresponding to the component product and the process equipment parameter table corresponding to the production equipment; determining the target monitoring parameters according to the product performance parameter table; obtaining the production equipment corresponding to the target monitoring parameters; determining the first component product corresponding to the production equipment; determining the target component product from the first component product according to the process equipment parameter table corresponding to the production equipment; and performing quality monitoring on the target component product according to the component parameter table corresponding to the target component product. In this way, accurate monitoring of product quality in the actual production process can be achieved based on different working conditions, thereby improving production efficiency.

Description

Technical Field

[0001] The present application belongs to the field of data processing, and specifically relates to a quality monitoring method based on working conditions and related devices and program medium products. Background Art

[0002] The quality inspection standards are usually formulated during the trial production according to the trial production results, and are usually only applicable to a certain working condition. With the mass production, various working conditions will appear, and the previous control standards will be difficult to meet the actual production. In addition, there is no precise product quality control point in the existing production process, so the quality of the product can only be guaranteed through a large number of inspections, which not only reduces production efficiency, but also increases the production cost of the enterprise. Summary of the invention

[0003] The embodiments of the present application provide a quality monitoring method based on working conditions and related devices and program media products, in order to improve the quality monitoring efficiency of each product in the production process, improve production efficiency, and reduce production costs.

[0004] In a first aspect, an embodiment of the present application provides a quality monitoring method based on working conditions, the method comprising:

[0005] Determine the production conditions corresponding to the current production batch, where the production conditions are used to indicate changes in characteristic values ​​of input elements in the industrial production process;

[0006] Acquire a quality database of the production conditions, wherein the quality database includes a product performance parameter table corresponding to the target product, a component parameter table corresponding to the component product, and a process equipment parameter table corresponding to the production equipment, wherein the component product is used to indicate a production material or an intermediate product when producing the target product;

[0007] Determine target monitoring parameters according to the product performance parameter table;

[0008] Obtaining the production equipment corresponding to the target monitoring parameter;

[0009] Determining a first component product corresponding to the production equipment;

[0010] Determining a target component product from the first component products according to a process equipment parameter table corresponding to the production equipment;

[0011] The quality of the target component product is monitored according to the component parameter table corresponding to the target component product.

[0012] In a second aspect, an embodiment of the present application provides a quality monitoring device based on working conditions, the device comprising:

[0013] A first determination unit, used to determine a production condition corresponding to a current production batch, wherein the production condition is used to indicate a characteristic value change of an input element in an industrial production process;

[0014] A first acquisition unit is used to acquire a quality database of the production conditions, wherein the quality database includes a product performance parameter table corresponding to the target product, a component parameter table corresponding to the component product, and a process equipment parameter table corresponding to the production equipment, wherein the component product is used to indicate a production material or an intermediate product when producing the target product;

[0015] A second determining unit, configured to determine a target monitoring parameter according to the product performance parameter table;

[0016] A second acquisition unit, used to acquire the production equipment corresponding to the target monitoring parameter;

[0017] A third determining unit, configured to determine a first component product corresponding to the production equipment;

[0018] a fourth determining unit, configured to determine a target component product from the first component products according to a process equipment parameter table corresponding to the production equipment;

[0019] A monitoring unit is used to monitor the quality of the target component product according to the component parameter table corresponding to the target component product.

[0020] In a third aspect, an embodiment of the present application provides an electronic device, comprising a processor, a memory, a communication interface, and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the processor, and the program includes instructions for executing the steps in the first aspect of the embodiment of the present application.

[0021] In a fourth aspect, an embodiment of the present application provides a computer storage medium, characterized in that it stores a computer program for electronic data exchange, wherein the computer program enables a computer to execute some or all of the steps described in the first aspect of this embodiment.

[0022] In a fifth aspect, an embodiment of the present application provides a computer program product, wherein the computer program product includes a non-transitory computer-readable storage medium storing a computer program, and the computer program is operable to cause a computer to execute some or all of the steps described in the first aspect of the embodiment of the present application. The computer program product may be a software installation package.

[0023] It can be seen that in the embodiment of the present application, the production conditions corresponding to the current production batch are first determined, and the production conditions are used to indicate the characteristic value changes of the input elements in the industrial production process, and then the quality database of the production conditions is obtained, and the quality database includes the product performance parameter table corresponding to the target product, the component parameter table corresponding to the component product, and the process equipment parameter table corresponding to the production equipment, and the component product is used to indicate the intermediate product when producing the production material or the target product, and then the target monitoring parameters are determined according to the product performance parameter table, and then the production equipment corresponding to the target monitoring parameters is obtained, and then the first component product corresponding to the production equipment is determined, and then the target component product is determined from the first component product according to the process equipment parameter table corresponding to the production equipment, and finally the target component product is quality monitored according to the component parameter table corresponding to the target component product. In this way, different monitoring parameters can be determined based on different working conditions, and accurate monitoring of products in the actual production process can be achieved, and there is no need to perform quality inspection on each product in the generation process, which can save production costs and improve production efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0025] Figure 1a It is a structural schematic diagram of a quality monitoring system provided in an embodiment of the present application;

[0026] Figure 1b It is a structural schematic diagram of an electronic device provided in an embodiment of the present application;

[0027] Figure 2 It is a flow chart of a quality monitoring method based on working conditions provided in an embodiment of the present application;

[0028] Figure 3 It is a block diagram of the functional units of a quality monitoring device based on working conditions provided in an embodiment of the present application;

[0029] Figure 4 This is a block diagram of the functional units of another quality monitoring device based on working conditions provided in an embodiment of the present application. DETAILED DESCRIPTION

[0030] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0031] The terms "first", "second", etc. in the specification and claims of this application and the above-mentioned drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally includes steps or units that are not listed, or optionally includes other steps or units inherent to these processes, methods, products or devices.

[0032] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0033] In the actual production process, the intermediate products obtained generally need to be tested, and each test takes a long time. Before the test results are obtained, the actual production will be stopped to wait for the test results. At present, in order to ensure product quality, it can only be achieved through a large number of tests, and the quality standards of the products are also determined based on the data obtained during the trial production. Not only can it not adapt to the complex working conditions in the actual production process, but a large number of tests will also cause a waste of resources and reduce production efficiency.

[0034] In response to the above problems, an embodiment of the present application provides a quality monitoring method based on working conditions and related devices. The embodiment of the present application is described in detail below in conjunction with the accompanying drawings.

[0035] See also Figure 1a , Figure 1a1 is a schematic diagram of the structure of a quality monitoring system provided by an embodiment of the present application. As shown in the figure, the quality control system 10 includes a server 110 and multiple electronic devices 111, and the server 110 is respectively connected to the multiple electronic devices 111 for communication. The server 110 is used to monitor the quality of the products in the production process according to the information from the electronic devices 111. The multiple electronic devices 111 can be located in different places, respectively, and provide the server 110 with relevant information in the production process such as the product status of the target product in the production process, the status of the production equipment, the production environment, the production line status, etc.

[0036] The structure of the server 110 is shown in FIG. Figure 1b As shown, the server 110 includes a processor 120, a memory 130, a communication interface 140, and one or more programs 131, wherein the one or more programs 131 are stored in the above-mentioned memory 130 and are configured to be executed by the above-mentioned processor 120, and the one or more programs 131 include instructions for executing any step in the following method embodiment. In a specific implementation, the processor 120 is used to execute any step executed by the server in the following method embodiment, and when performing data transmission operations such as receiving, the communication interface 140 can be selectively called to complete the corresponding operation. It should be noted that the server 110 can be a server cluster.

[0037] See also Figure 2 , Figure 2 1 is a flow chart of a quality monitoring method based on working conditions provided in an embodiment of the present application. As shown in the figure, the quality monitoring method based on working conditions includes the following steps.

[0038] S201, determining the production conditions corresponding to the current production batch, where the production conditions are used to indicate changes in characteristic values ​​of input elements in an industrial production process.

[0039] The input factors may include production personnel's shift information, production equipment information, production methods, production environment and other factors. Different combinations of these factors will produce different production conditions. Determine the production condition of the current production batch, that is, determine the characteristic values ​​of each factor included in the current production, and obtain a production condition based on different characteristic value combinations.

[0040] S202, obtaining a quality database of the production conditions, wherein the quality database includes a product performance parameter table corresponding to the target product, a component parameter table corresponding to the component product, and a process equipment parameter table corresponding to the production equipment, wherein the component product is used to indicate production materials or intermediate products when producing the target product.

[0041] Different production conditions correspond to different quality databases, and each parameter table includes the target value of the parameter under the corresponding condition, as well as the mean and standard deviation of the actual production process under the condition. Each parameter table in the quality database can be updated according to the parameter information obtained after each production.

[0042] S203: Determine target monitoring parameters according to the product performance parameter table.

[0043] Among them, in order to improve production efficiency while ensuring the product quality of the target product, when monitoring the quality of the intermediate product, the target monitoring parameters to be monitored can be determined according to the product performance parameter table corresponding to the target product. For example, the target product is A, and the product performance parameter table corresponding to the target product A includes 5 product parameters, namely ae. Since not all of these 5 parameters have a significant impact on the final product quality, the target monitoring parameters to be monitored can be determined from these 5 parameters according to the impact of each parameter on the quality of the target product. For example, if the main component of the target product A is a, then only the intermediate products related to parameter a need to be monitored to ensure the quality of the target product A, so parameter a can be determined as the target monitoring parameter.

[0044] S204: Obtain the production equipment corresponding to the target monitoring parameter.

[0045] The production equipment may be a device directly used to generate the product corresponding to the target monitoring parameter, or a device that generates an intermediate product associated with the target monitoring parameter. For example, the first generating device may be a device that generates the product corresponding to parameter a, or the product corresponding to parameter a is generated by product m, then the production equipment may also be a production equipment that generates product m.

[0046] S205: Determine the first component product corresponding to the production equipment.

[0047] S206: Determine a target component product from the first component products according to a process equipment parameter table corresponding to the production equipment.

[0048] Among them, the first component product can be an intermediate product or a corresponding production material when produced according to the production equipment. The process equipment parameter table includes the process capability index CPK of each process equipment parameter, and the first component products that need to be quality monitored can be determined based on the CPK of each process equipment parameter. The user can view each parameter table in the instruction database in real time, determine the overall quality of the product under the current working conditions based on the parameter values ​​in the parameter table, and manually determine the target monitoring parameters. When determining the target monitoring parameters, the user can also determine the production equipment that needs to be monitored and / or the component products that need to be monitored.

[0049] S207: Perform quality monitoring on the target component product according to the component parameter table corresponding to the target component product.

[0050] Among them, the quality inspection of the target component product can be carried out during the production process, and the quality of the target component product can be determined according to the target value in the component parameter table.

[0051] It can be seen that in this example, the production conditions corresponding to the current production batch are first determined, and the production conditions are used to indicate the characteristic value changes of the input elements in the industrial production process, and then the quality database of the production conditions is obtained, and the quality database includes the product performance parameter table corresponding to the target product, the component parameter table corresponding to the component product, and the process equipment parameter table corresponding to the production equipment. The component product is used to indicate the intermediate product when producing the production material or the target product, and then the target monitoring parameter is determined according to the product performance parameter table, and then the production equipment corresponding to the target monitoring parameter is obtained, and then the first component product corresponding to the production equipment is determined, and then the target component product is determined from the first component product according to the process equipment parameter table corresponding to the production equipment, and finally the target component product is quality monitored according to the component parameter table corresponding to the target component product. In this way, different monitoring parameters can be determined based on different working conditions, and accurate monitoring of products in the actual production process can be achieved, and there is no need to perform quality inspection on each product in the generation process, which can save production costs and improve production efficiency.

[0052] In a possible example, determining a target component product from the first component products according to a process equipment parameter table corresponding to the production equipment includes: determining a first process capability index CPK corresponding to each process equipment parameter included in the process equipment parameter table; determining a corresponding relationship between each process equipment parameter and the first component; if the first CPK is within a first preset interval, determining that the first component product having a corresponding relationship with the process equipment parameter corresponding to the first CPK is an inspection-exempt product; if the first CPK is within a second preset interval, determining that some of the first component products having a corresponding relationship with the process equipment parameter corresponding to the first CPK are the target component products; if the first CPK is within a third preset interval, determining that all first component products having a corresponding relationship with the process equipment parameter corresponding to the first CPK are the target component products.

[0053] Among them, if the first CPK corresponding to a certain process equipment parameter is located in the first preset interval, it means that the process of producing the corresponding component product is highly controlled, so the quality of the corresponding component product is also controlled, and there is no need to monitor the part of the component product. If the first CPK corresponding to a certain process equipment parameter is located in the second preset interval, it means that the process of producing the corresponding component product is generally controlled. In order to ensure the quality of the target product, some of the first component products can be selected for quality inspection. If the first CPK corresponding to a certain process equipment parameter is located in the third preset interval, it means that the process of producing the corresponding first component product is not controlled. In order to ensure the quality of the target product, it is necessary to perform quality inspection on all the first component products of this part. It should be noted that the relationship between the first CPK values ​​contained in the first preset interval, the second preset interval and the third preset interval is: the first preset interval> the second preset interval> the third preset interval. Among them, when actually performing quality inspection, if the first CPK of the process equipment parameter corresponding to the target component product is in the second preset interval, the target component product can be sampled, and if the first CPK of the process equipment parameter corresponding to the target component product is in the third preset interval, the target component product needs to be fully inspected. In particular, if a first component product corresponds to multiple process equipment parameters at the same time, as long as it is determined that the first component product needs to be inspected according to one of the process equipment parameters, the first component product is the target component product.

[0054] It can be seen that in this example, determining the target component product according to the CPK value of the process equipment parameter can not only monitor the quality of the target product, but also reduce the quality monitoring cost and improve production efficiency.

[0055] In a possible example, before determining the target component product from the first component product according to the process equipment parameter table corresponding to the production equipment, the method further includes: obtaining a second CPK of the target product obtained each time when the first preset number of productions are performed; determining that the target product whose second CPK is within the first preset interval is a qualified target product; obtaining component parameters and process equipment parameters corresponding to the qualified target product; determining the standard deviation and target value of each component parameter according to the component parameters corresponding to the qualified target product, and updating the component parameter table; determining the standard deviation and target value of each process equipment parameter according to the production equipment parameters corresponding to the qualified target product, and updating the process equipment parameter table.

[0056] Among them, when the quality database is updated, the second CPK of the target product is based on the component parameters and process equipment parameters corresponding to the target product in the first preset interval. The second CPK of the target product obtained each time the first preset number of productions is obtained, including: obtaining the standard deviation of the target product obtained each time; obtaining the upper specification limit value and / or the lower specification limit value of the target product set by the customer; determining the second CPK of the target product according to the standard deviation, the upper specification limit value and / or the lower specification limit value. It should be noted that when the quality database is updated, the product performance parameter table will also be updated according to the target product performance parameters of the qualified target product.

[0057] It can be seen that in this example, the parameter values ​​used to determine the quality monitoring standards are determined by the parameters of the qualified target products, which makes the CPK of the determined process equipment parameters more accurate and improves the accuracy and efficiency of quality monitoring.

[0058] In a possible instance, determining the target monitoring parameter based on the product performance parameter table includes: obtaining the priority of all product performance parameters of the target product in the product performance parameter table; determining the product performance parameter with a priority of a first preset level as a first target monitoring parameter; determining a product performance parameter among all the product performance parameters whose correlation with the first target monitoring parameter is greater than a preset correlation as a second target monitoring parameter; determining, according to the product performance parameter table, a second target monitoring parameter among the second target monitoring parameters whose parameter value does not meet the standard as a third target monitoring parameter; and determining that the target monitoring parameters include the first target monitoring parameter and the third target monitoring parameter.

[0059] The priority of the performance parameter is used to indicate the degree of influence of the performance parameter on the quality of the target product. The greater the degree of influence, the higher the priority. The first preset level may be the highest level. The non-compliance of the parameter value may be that the mean value corresponding to the product performance parameter does not meet the preset condition, and the preset condition is determined according to the target value of the product performance parameter.

[0060] In a specific implementation, determining the correlation between all product performance parameters and the first target monitoring parameter includes: determining the production equipment corresponding to all the product performance parameters, determining, among all the product performance parameters except the first target monitoring parameter, the product performance parameters whose production equipment is the same as the production equipment of the first target monitoring parameter as the target product performance parameters; determining the material overlap between the production of the product corresponding to each target product performance parameter and the production of the product corresponding to the first target monitoring parameter, and determining the first correlation of each target product performance parameter based on the overlap; determining the production time difference between the production of the product corresponding to each target product performance parameter and the production of the product corresponding to the first target monitoring parameter, and determining the correlation of each target product performance parameter based on the first correlation and the time difference.

[0061] It can be seen that in this example, determining the target monitoring parameters according to the priority of the product performance parameters can not only monitor the quality of the target product, but also reduce the quality monitoring cost and improve production efficiency.

[0062] In a possible instance, determining that some of the first component products are the target component products includes: when the production equipment corresponding to the first component products is the production equipment corresponding to the first target monitoring parameter, obtaining historical parameter values ​​of all component parameters corresponding to each first component product and historical target values ​​of the component parameters corresponding to each historical parameter value; determining the change trend of all component parameters of each first component product according to the historical parameter values ​​and the historical target values; determining the overall quality change trend of each first component product according to the change trend of all component parameters, wherein the overall quality change trend includes upward change, downward change and fluctuating change; determining that the first component product among the first component products whose overall quality change trend is the downward change is the target component product; extracting a preset number of first component products from the first component products whose overall quality change trend is the fluctuating change as the target component product; when the production equipment corresponding to the first component product is the production equipment corresponding to the third target monitoring parameter, extracting a preset number of first component products from the first component products as the target component product.

[0063] Among them, determining the change trend of all component parameters of each first component product according to the historical parameter value and the historical target value includes: determining the difference between each historical parameter value and the corresponding historical target value to obtain multiple differences, wherein each component parameter includes multiple differences; summing up the multiple differences of the same component parameter to obtain a calculation result, and the calculation result is used to indicate the change trend of each component parameter. Determining the overall quality change trend of each first component product according to the change trends of all component parameters includes: determining the priority of each component parameter; determining a weighted value according to the priority, wherein the higher the priority, the greater the weighted value; weighting and normalizing the calculation results corresponding to each component parameter according to the weighted value to obtain a target value; if the target value is close to 1, that is, the target value is within a first preset interval, which may be an interval between 0.5 and 1, then it is considered that the overall change trend of the first component product is an upward change; if the target value is close to 0, that is, the target value is within a second preset interval, which may be an interval between -0.5 and 0.5, then it is considered that the overall change trend of the first component product is a fluctuating change; if the target value is close to -1, that is, the target value is within a third preset interval, which may be an interval between -1 and -0.5, then it is considered that the overall change trend of the first component product is a downward change.

[0064] It can be seen that in this example, by determining the corresponding target component product selection scheme according to different target monitoring parameters, it is possible to monitor the quality of the target product, reduce the quality monitoring cost, and improve production efficiency.

[0065] In a possible example, the determining of the first process capability index CPK corresponding to each process equipment parameter included in the process equipment parameter table includes: determining a target value and an expected trend for each process equipment parameter included in the process equipment parameter table, wherein the expected trend includes an expected large, an expected small, and an expected target, wherein the expected large is used to indicate that the actual value of the process equipment parameter is expected to be greater than the target value of the process equipment parameter, the expected small is used to indicate that the actual value of the process equipment parameter is expected to be less than the target value of the process equipment parameter, and the expected target is used to indicate that the actual value of the process equipment parameter is expected to be equal to the target value of the process equipment parameter; determining the standard deviation of each process equipment parameter according to the process equipment parameter table; When the expected trend of the process equipment parameter is the expected maximum, the lower limit value of the process equipment parameter is determined according to the target value and the standard deviation, and the first CPK of the process equipment parameter is determined according to the lower limit value; when the expected trend of the process equipment parameter is the expected minimum, the upper limit value of the process equipment parameter is determined according to the target value and the standard deviation, and the first CPK of the process equipment parameter is determined according to the upper limit value; when the expected trend of the process equipment parameter is the expected minimum, the upper limit value and lower limit value of the process equipment parameter are determined according to the target value and the standard deviation, and the first CPK of the process equipment parameter is determined according to the upper limit value and the lower limit value.

[0066] The lower limit of the process equipment parameter is determined according to the target value and the standard deviation, which can be calculated by the following formula:

[0067] LSL=Nk×S,

[0068] Wherein, the LSL is the lower limit value, the S is the standard deviation, the N is the target value, and the k is a constant.

[0069] Similarly, the upper limit of the process equipment parameters can be calculated by the following formula:

[0070] USL=N+j×S,

[0071] Among them, USL is the upper limit value, S is the standard deviation, N is the target value, and j is a constant.

[0072] In particular, the values ​​of k and j may be the same. Determining the first CPK of the process equipment parameter according to the lower limit value comprises:

[0073] CPK=CPL=(μ-LSL)÷(3×S),

[0074] Wherein, μ is the mean value of the process equipment parameter, and S is the standard deviation.

[0075] The step of determining the first CPK of the process equipment parameter according to the upper limit value comprises:

[0076] CPK=CPU=(USL-μ)÷(3×S),

[0077] Wherein, μ is the mean value of the process equipment parameter, and S is the standard deviation.

[0078] The first CPK of the process equipment parameter is determined according to the upper limit value and the lower limit value, including: CPK=MIN{CPU, CPL}, that is, the CPK is the smaller one of CPU and CPL.

[0079] It can be seen that in this example, determining the value of the first CPK according to the expected trend of each process equipment parameter can make the first CPK of the acquired process equipment parameter meet the actual production standards, thereby improving the practicality and accuracy of quality monitoring of the production process.

[0080] In a possible instance, the method further includes: determining a second CPK of a target product obtained in each production in a second preset number of productions according to the product performance parameter table; obtaining parameter values ​​of component parameters of each component product corresponding to each production when the second CPK is less than a preset value and the number of productions is greater than a preset number; determining a comprehensive parameter value of each component product in each production according to the parameter values ​​of the component parameters; determining a second component product in which a fluctuation range of the comprehensive parameter value is greater than a preset range in the second preset number of productions according to the comprehensive parameter values; and outputting prompt information for the production equipment corresponding to the second component product, wherein the prompt information is used to indicate that there is a quality risk in the production equipment corresponding to the second component product.

[0081] Among them, the first preset number of times and the second preset number of times can be the same number of times. The comprehensive parameter value can be used to indicate the parameter value of the component parameter with the highest priority of the component parameter corresponding to the component product, or it can be a comprehensive parameter value of a component product calculated and obtained according to the priority of each component parameter. For example, component product B includes three component parameters, namely x, y and z, wherein the priority of these three component parameters is x>y>z, then the comprehensive parameter value of component product B at this time can be the value corresponding to component parameter x, or it can be a value calculated based on the parameter values ​​of component parameters x, y and z. In a specific implementation, determining the fluctuation range of the comprehensive parameter value of each component parameter includes: obtaining the comprehensive parameter value of each component product corresponding to each production in the second preset number of productions; generating a fluctuation line graph for each component product according to the comprehensive parameter value, wherein the horizontal axis and the vertical axis of the line graph are used to represent the production batch and the comprehensive parameter value respectively; determining the fluctuation range of each component product according to the fluctuation line graph.

[0082] It can be seen that in this example, by monitoring the production equipment according to the second CPK of the target product and the fluctuation range of each component product, the user can be notified in time to check the production equipment that may have problems.

[0083] In a possible instance, the method further includes: determining the quality compliance rate of the target product obtained in each production in the second preset number of productions according to the product performance parameter table; obtaining the comprehensive compliance rate of the target product corresponding to the second preset number of productions according to the quality compliance rate of the target product produced each time; when the comprehensive compliance rate is lower than a preset value, obtaining the parameter value of the component parameter of each component product corresponding to each production; determining the comprehensive parameter value of each component product in each production according to the parameter value of the component parameter; determining, according to the comprehensive parameter value, a second component product in which the fluctuation amplitude of the comprehensive parameter value is greater than the preset amplitude in the second preset number of productions; and outputting prompt information for the production equipment corresponding to the second component product, wherein the prompt information is used to indicate that the production equipment corresponding to the second component product has a quality risk.

[0084] Among them, the quality compliance rate of the target product obtained in each production of the second preset number of productions is determined according to the product performance parameter table, including: determining the actual production value of each product performance parameter of the target product in each production, comparing the actual production value with the target value of the product performance parameter corresponding to the actual production value, and obtaining the compliance status of each product performance parameter; the quality compliance rate of each target product is determined according to the compliance status of all product performance parameters corresponding to each target product. It can be seen that in this example, the production equipment is monitored according to the compliance rate of the target product and the fluctuation range of each component product, and the user can be notified in time to check the production equipment that may have problems.

[0085] It can be seen that through real-time data updates, the monitoring targets can be dynamically adjusted to better fit the actual production process and ensure the accuracy of production quality monitoring.

[0086] For the above embodiments, please refer to Figure 3 , Figure 3 It is a functional unit composition block diagram of a quality monitoring device based on working conditions provided by an embodiment of the present application. The quality monitoring device 300 based on working conditions includes: a first determination unit 301, used to determine the production working conditions corresponding to the current production batch, the production working conditions are used to indicate the characteristic value changes of the input elements in the industrial production process; a first acquisition unit 302, used to obtain the quality database of the production working conditions, the quality database includes a product performance parameter table corresponding to the target product, a component parameter table corresponding to the component product, and a process equipment parameter table corresponding to the production equipment, the component product is used to indicate the intermediate product when producing materials or producing the target product; a second determination unit 303, used to determine the target monitoring parameter according to the product performance parameter table; a second acquisition unit 304, used to obtain the production equipment corresponding to the target monitoring parameter; a third determination unit 305, used to determine the first component product corresponding to the production equipment; a fourth determination unit 306, used to determine the target component product from the first component product according to the process equipment parameter table corresponding to the production equipment; a monitoring unit 307, used to monitor the quality of the target component product according to the component parameter table corresponding to the target component product.

[0087] In a possible example, in terms of determining the target component product from the first component product according to the process equipment parameter table corresponding to the production equipment, the fourth determination unit 306 is specifically used to: determine the first process capability index CPK corresponding to each process equipment parameter included in the process equipment parameter table; determine the corresponding relationship between each process equipment parameter and the first component; if the first CPK is within a first preset interval, determine that the first component product having a corresponding relationship with the process equipment parameter corresponding to the first CPK is an inspection-exempt product; if the first CPK is within a second preset interval, determine that some of the first component products having a corresponding relationship with the process equipment parameter corresponding to the first CPK are the target component products; if the first CPK is within a third preset interval, determine that all first component products having a corresponding relationship with the process equipment parameter corresponding to the first CPK are the target component products.

[0088] In a possible example, before determining the target component product from the first component product according to the process equipment parameter table corresponding to the production equipment, the device 300 is further used to: obtain a second CPK of the target product obtained each time when the first preset number of productions are performed; determine that the target product whose second CPK is within the first preset interval is a qualified target product; obtain component parameters and process equipment parameters corresponding to the qualified target product; determine the standard deviation and target value of each component parameter according to the component parameters corresponding to the qualified target product, and update the component parameter table; determine the standard deviation and target value of each process equipment parameter according to the production equipment parameters corresponding to the qualified target product, and update the process equipment parameter table.

[0089] In a possible example, in terms of determining the target monitoring parameters according to the product performance parameter table, the second determination unit 303 is specifically used to: obtain the priority of all product performance parameters of the target product in the product performance parameter table; determine the product performance parameter with a priority of the first preset level as the first target monitoring parameter; determine the product performance parameter among all the product performance parameters whose correlation with the first target monitoring parameter is greater than the preset correlation as the second target monitoring parameter; determine according to the product performance parameter table that the second target monitoring parameter whose parameter value does not meet the standard among the second target monitoring parameters is the third target monitoring parameter; and determine that the target monitoring parameters include the first target monitoring parameter and the third target monitoring parameter.

[0090] In a possible example, in terms of determining that some of the first component products are the target component products, the fourth determination unit 306 is specifically used to: when the production equipment corresponding to the first component products is the production equipment corresponding to the first target monitoring parameter, obtain the historical parameter values ​​of all component parameters corresponding to each first component product and the historical target value of the component parameter corresponding to each historical parameter value; determine the change trend of all component parameters of each first component product according to the historical parameter values ​​and the historical target values; determine the overall quality change trend of each first component product according to the change trend of all component parameters, and the overall quality change trend includes upward change, downward change and fluctuating change; determine that the first component product whose overall quality change trend is the downward change among the first component products is the target component product; extract a preset number of first component products from the first component products whose overall quality change trend is the fluctuating change as the target component product; when the production equipment corresponding to the first component product is the production equipment corresponding to the third target monitoring parameter, extract a preset number of first component products from the first component product as the target component product.

[0091] In a possible example, in terms of determining the first process capability index CPK corresponding to each process equipment parameter included in the process equipment parameter table, the fourth determining unit 306 is specifically used to: determine the target value and expected trend of each process equipment parameter included in the process equipment parameter table, the expected trend includes expected large, expected small and expected target, the expected large is used to indicate that the actual value of the process equipment parameter is expected to be greater than the target value of the process equipment parameter, the expected small is used to indicate that the actual value of the process equipment parameter is expected to be less than the target value of the process equipment parameter, and the expected target is used to indicate that the actual value of the process equipment parameter is expected to be equal to the target value of the process equipment parameter; determine the first process capability index CPK corresponding to each process equipment parameter included in the process equipment parameter table according to the process equipment parameter table. standard deviation of the parameter; when the expected trend of the process equipment parameter is the expected maximum, the lower limit value of the process equipment parameter is determined according to the target value and the standard deviation, and the first CPK of the process equipment parameter is determined according to the lower limit value; when the expected trend of the process equipment parameter is the expected minimum, the upper limit value of the process equipment parameter is determined according to the target value and the standard deviation, and the first CPK of the process equipment parameter is determined according to the upper limit value; when the expected trend of the process equipment parameter is the expected minimum, the upper limit value and lower limit value of the process equipment parameter are determined according to the target value and the standard deviation, and the first CPK of the process equipment parameter is determined according to the upper limit value and the lower limit value.

[0092] In a possible instance, the device 300 is also used to: determine a second CPK of a target product obtained in each production in a second preset number of productions based on the product performance parameter table; obtain parameter values ​​of component parameters of each component product corresponding to each production when the second CPK is less than a preset value and the number of productions is greater than a preset number; determine a comprehensive parameter value of each component product in each production based on the parameter values ​​of the component parameters; determine a second component product in which a fluctuation range of the comprehensive parameter value is greater than a preset range in the second preset number of productions based on the comprehensive parameter values; and output a prompt message for the production equipment corresponding to the second component product, wherein the prompt message is used to indicate that there is a quality risk in the production equipment corresponding to the second component product.

[0093] It can be understood that since the method embodiment and the device embodiment are different presentation forms of the same technical concept, the content of the method embodiment part in this application should be synchronously adapted to the device embodiment part and will not be repeated here.

[0094] In the case of integrated units, such as Figure 4 As shown, Figure 4 This is a functional unit block diagram of another quality monitoring device based on working conditions provided by an embodiment of the present application. Figure 4 In the embodiment, the quality monitoring device 400 based on working condition includes: a processing module 412 and a communication module 411. The processing module 412 is used to control and manage the actions of the quality monitoring device based on working condition, for example, to execute the steps of the first determination unit 301, the first acquisition unit 302, the second determination unit 303, the second acquisition unit 304, the third determination unit 305, the fourth determination unit 306 and the monitoring unit 307, and / or to execute other processes of the technology described herein. The communication module 411 is used for the interaction between the quality monitoring device based on working condition and other devices. Figure 4 As shown, the quality monitoring device based on working conditions may further include a storage module 413, and the storage module 413 is used to store program codes and data of the quality monitoring device based on working conditions.

[0095] Among them, the processing module 412 can be a processor or a controller, for example, a central processing unit (CPU), a general processor, a digital signal processor (DSP), an ASIC, an FPGA or other programmable logic device, a transistor logic device, a hardware component or any combination thereof. It can implement or execute various exemplary logic blocks, modules and circuits described in conjunction with the disclosure of this application. The processor can also be a combination that implements a computing function, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, and the like. The communication module 411 can be a transceiver, an RF circuit or a communication interface, and the like. The storage module 413 can be a memory.

[0096] Among them, all relevant contents of each scenario involved in the above method embodiment can be referred to the functional description of the corresponding functional module, and will not be repeated here. The above working condition-based quality monitoring device 400 can execute the above Figure 2 The condition-based quality monitoring method shown.

[0097] The above mainly introduces the scheme of the embodiment of the present application from the perspective of the execution process on the method side. It is understandable that, in order to realize the above functions, the electronic device includes a hardware structure and a software module corresponding to the execution of each function. It should be easily appreciated by those skilled in the art that, in combination with the units and algorithm steps of each example described in the embodiments provided herein, the present application can be implemented in the form of hardware or a combination of hardware and computer software. Whether a function is executed in the form of hardware or computer software driving hardware depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present application.

[0098] The embodiment of the present application can divide the electronic device into functional units according to the above method example. For example, each functional unit can be divided according to each function, or two or more functions can be integrated into one processing unit. The above integrated unit can be implemented in the form of hardware or in the form of software functional units. It should be noted that the division of units in the embodiment of the present application is schematic and is only a logical function division. There may be other division methods in actual implementation.

[0099] An embodiment of the present application also provides a chip, wherein the chip includes a processor for calling and running a computer program from a memory, so that a device equipped with the chip executes some or all of the steps described for the electronic device in the above method embodiment.

[0100] An embodiment of the present application also provides a computer storage medium, wherein the computer storage medium stores a computer program for electronic data exchange, wherein the computer program enables a computer to execute part or all of the steps of any method described in the above method embodiments, and the above computer includes an electronic device.

[0101] The embodiment of the present application also provides a computer program product, the computer program product includes a non-transitory computer-readable storage medium storing a computer program, the computer program is operable to cause a computer to execute some or all of the steps of any method described in the method embodiment. The computer program product may be a software installation package, and the computer includes an electronic device.

[0102] It should be noted that, for the aforementioned method embodiments, for the sake of simplicity, they are all expressed as a series of action combinations, but those skilled in the art should be aware that the present application is not limited by the described order of actions, because according to the present application, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by the present application.

[0103] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0104] In the several embodiments provided in the present application, it should be understood that the disclosed device can be implemented in other ways. For example, the device embodiments described above are only schematic, such as the division of the above-mentioned units, which is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, and the indirect coupling or communication connection of devices or units can be electrical or other forms.

[0105] The units described above as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0106] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0107] If the above-mentioned integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable memory. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a memory, including a number of instructions to enable a computer device (which can be a personal computer, server or network device, etc.) to perform all or part of the steps of the above-mentioned methods of each embodiment of the present application. The aforementioned memory includes: U disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), mobile hard disk, disk or CD-ROM and other media that can store program codes.

[0108] A person skilled in the art can understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable memory, and the memory can include: a flash drive, a read-only memory (English: Read-Only Memory, abbreviated as: ROM), a random access memory (English: Random Access Memory, abbreviated as: RAM), a magnetic disk or an optical disk, etc.

[0109] The embodiments of the present application are introduced in detail above. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method and core idea of ​​the present application. At the same time, for general technical personnel in this field, according to the idea of ​​the present application, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

[0110] Although the present invention is disclosed as above, the present invention is not limited thereto. Any person skilled in the art can easily think of changes or substitutions without departing from the spirit and scope of the present invention, and can make various changes and modifications, including the combination of the above-mentioned different functions and implementation steps, including software and hardware implementation methods, all of which are within the scope of protection of the present invention.

Claims

1. A quality monitoring method based on working conditions, characterized in that: The method comprises: Determine the production conditions corresponding to the current production batch, wherein the production conditions are used to indicate changes in characteristic values ​​of input elements in the industrial production process; Acquire a quality database of the production conditions, wherein the quality database includes a product performance parameter table corresponding to the target product, a component parameter table corresponding to the component product, and a process equipment parameter table corresponding to the production equipment, wherein the component product is used to indicate a production material or an intermediate product when producing the target product; Determine target monitoring parameters according to the product performance parameter table; Obtaining the production equipment corresponding to the target monitoring parameter; Determine the overall quality of the component product under the current working conditions according to the process equipment parameter table corresponding to the production equipment; Determine a target component product from the first component products corresponding to the production equipment according to the overall quality condition; The quality of the target component product is monitored according to the component parameter table corresponding to the target component product.

2. The method according to claim 1, characterized in that Before determining a target component product from the first component product according to the overall quality condition, the method further includes: Obtaining a second CPK of the target product obtained each time during the first preset number of productions; Determine that the target product whose second CPK is within the first preset interval is a qualified target product; Obtaining component parameters and process equipment parameters corresponding to the qualified target product; Determine the standard deviation and target value of each component parameter according to the component parameters corresponding to the qualified target product, and update the component parameter table; The standard deviation and target value of each process equipment parameter are determined according to the production equipment parameters corresponding to the qualified target product, and the process equipment parameter table is updated.

3. The method according to claim 1, characterized in that Determining the target monitoring parameters according to the product performance parameter table includes: Obtaining the priorities of all product performance parameters of the target product in the product performance parameter table; Determine the product performance parameter with the priority of the first preset level as the first target monitoring parameter; Determine, among all the product performance parameters, a product performance parameter whose correlation with the first target monitoring parameter is greater than a preset correlation as a second target monitoring parameter; According to the product performance parameter table, determine the second target monitoring parameter whose parameter value does not meet the standard in the second target monitoring parameter as the third target monitoring parameter; Determining the target monitoring parameter includes the first target monitoring parameter and the third target monitoring parameter.

4. The method according to claim 3, characterized in that Determining that some of the first component products are the target component products includes: In a case where the production equipment corresponding to the first component product is the production equipment corresponding to the first target monitoring parameter, obtaining historical parameter values ​​of all component parameters corresponding to each first component product and historical target values ​​of the component parameters corresponding to each historical parameter value; Determine the variation trend of all component parameters of each first component product according to the historical parameter value and the historical target value; Determine the overall quality change trend of each first component product according to the change trends of all component parameters, wherein the overall quality change trend includes an upward change, a downward change, and a fluctuating change; Determine the first component product whose overall quality change trend in the first component product is the downward change as the target component product; Extracting a preset number of first component products whose overall quality change trend among the first component products is the fluctuating change as the target component products; In a case where the production equipment corresponding to the first component product is the production equipment corresponding to the third target monitoring parameter, a preset number of first component products are extracted from the first component products as the target component products.

5. The method according to any one of claims 1 to 4, characterized in that: The method further comprises: Determine a second CPK of the target product obtained in each production of a second preset number of productions according to the product performance parameter table; When the second CPK is less than the preset value and the number of productions is greater than the preset number, obtaining the parameter value of the component parameter of each component product corresponding to each production; Determine the comprehensive parameter value of each component product in each production according to the parameter value of the component parameter; Determine, according to the comprehensive parameter value, a second component product in which the fluctuation range of the comprehensive parameter value is greater than the preset range during the second preset number of productions; Output prompt information for the production equipment corresponding to the second component product, where the prompt information is used to indicate that the production equipment corresponding to the second component product has quality risks.

6. A quality monitoring device based on working conditions, characterized in that: The device comprises: A first determination unit, used to determine the production conditions corresponding to the current production batch, where the production conditions are used to indicate changes in characteristic values ​​of input elements in the industrial production process; A first acquisition unit is used to acquire a quality database of the production conditions, wherein the quality database includes a product performance parameter table corresponding to the target product, a component parameter table corresponding to the component product, and a process equipment parameter table corresponding to the production equipment, wherein the component product is used to indicate a production material or an intermediate product when producing the target product; A second determining unit, configured to determine a target monitoring parameter according to the product performance parameter table; A second acquisition unit, used to acquire the production equipment corresponding to the target monitoring parameter; a fourth determination unit, configured to determine the overall quality of the component product under the current working condition according to the process equipment parameter table corresponding to the production equipment; and to determine a target component product from the first component product corresponding to the production equipment according to the overall quality; A monitoring unit is used to monitor the quality of the target component product according to the component parameter table corresponding to the target component product.

7. A server, characterized in that: The method comprises a processor and a memory, wherein one or more programs are stored in the memory and configured to be executed by the processor, wherein the programs include instructions for executing the steps in the method according to any one of claims 1 to 5.

8. A computer-readable storage medium or a computer program product, characterized in that: The computer program stored in the computer-readable storage medium enables a computer to execute the method according to any one of claims 1 to 5, or the computer program product enables a computer to execute the method according to any one of claims 1 to 5.

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