The invention discloses an
external bias device for a low-temperature probe and further discloses a de-embedding calibration measurement method of the
external bias device for the low-temperature probe, the
external bias device comprises a
radio frequency test instrument, an external bias unit, a bias
feed network and a low-temperature magnetic
resonance probe, the external bias unit is used for providing direct-current bias
voltage, and the bias
feed network is used for providing direct-current bias
voltage; the
radio frequency test instrument is used for generating a test
signal in the low-temperature magnetic
resonance probe, and a direct-current bias
signal output by the external bias unit forces the
PIN diode to be converted from a high-resistance isolation state to a low-resistance conduction state; then the
radio frequency testing instrument is started, milliwatt-level signals generated by the radio frequency testing instrument can easily reach the
radio frequency coil through the passive T / R switch, so that the
radio frequency coil is tested, the passive T / R switch is switched on under the conditions that the packaging structure of the low-temperature magnetic
resonance probe is not damaged and an internal circuit is not changed, and the low-temperature magnetic resonance probe is tested. Therefore, a radio frequency
test channel is established.