Withstand voltage testing device

Abstract

The application relates to a voltage withstanding test device. The device comprises a first control assembly, a plurality of test ports, a switch array and a test assembly, wherein the plurality of test ports are connected with a first shell of a first electric connector and a plurality of first contact pieces respectively, the first electric connector is connected with a second electric connector to be tested, the first control assembly controls the opening and closing of switches in the switch array through communication with the switch array, so that the test assembly forms a test path between every adjacent two contact piece rows, forms a test path between every adjacent two contact piece columns, forms a test path between each contact piece row and a second shell, forms a test path between each contact piece column and the second shell, finally, the test assembly applies a test voltage to the second electric connector through the test path, and measures a leakage current after the test voltage is applied. The device can improve the efficiency and accuracy of the voltage withstanding test of the electric connector.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of dielectric withstand voltage test of electrical connectors, and particularly relates to a dielectric withstand voltage test device. BACKGROUND

[0002] Electrical connectors are interconnection elements for connecting and disconnecting components such as wires, cables and electrical plugs, and are widely used in fields such as aerospace, rail transportation, new energy vehicles and major equipment. The dielectric withstand voltage is an important reliability index of electrical connectors, which is used to represent the insulation performance of electrical connectors. If the dielectric withstand voltage of the electrical connector is unqualified, when the voltage of the electrical connector suddenly increases, the insulation capacity of the electrical connector will decrease significantly, which may cause short circuit of the electrical connector. Therefore, the dielectric withstand voltage test is a necessary detection item in the detection of electrical connectors.

[0003] At present, the commonly used method for dielectric withstand voltage test is two-step measurement method, and the basic principle is to measure the insulation capacity between the contact pieces with the closest distance on the electrical connector and the contact pieces or the contact pieces and the shell of the electrical connector.

[0004] However, the two-step measurement method needs to manually measure the distance between the contact pieces, which is low in measurement efficiency, and manual measurement is prone to errors, affecting the accuracy of the dielectric withstand voltage test. SUMMARY

[0005] Therefore, it is necessary to provide a withstand voltage test device with high measurement efficiency and high accuracy in view of the above technical problems.

[0006] In a first aspect, the present application provides a withstand voltage test device. The withstand voltage test device comprises:

[0007] a first control component, a plurality of test ports, a switch array and a test component, the switch array being arranged between the plurality of test ports and the test component, and the switch array comprising a plurality of switches; the plurality of test ports are used to be connected with a first shell and a plurality of first contact pieces of a first electrical connector respectively, the first electrical connector being used to be connected with a second electrical connector to be tested, when connected, the plurality of first contact pieces and a plurality of second contact pieces of the second electrical connector are in contact with each other, and the first shell and a second shell of the second electrical connector are in contact with each other, wherein the plurality of second contact pieces are arranged in an array, and the array is divided into a plurality of contact piece rows and a plurality of contact piece columns; the first control component is in communication connection with the switch array, and is used to control the opening and closing of the switches in the switch array, so that the test component sequentially forms a test path between every adjacent two contact piece rows, forms a test path between every adjacent two contact piece columns, forms a test path between each contact piece row and the second shell, and forms a test path between each contact piece column and the second shell; the test component is used to apply a test voltage to the second electrical connector through the test path, and measure the leakage current after applying the test voltage.

[0008] In one of the embodiments, for the adjacent first contactor row and the second contactor row, the first control component is specifically configured to control the opening and closing of the switches in the switch array, so as to short-circuit each second contactor in the first contactor row and each second contactor in the second contactor row, and form a test path between the test component and the first target contactor in the first contactor row and the second target contactor in the second contactor row.

[0009] In one of the embodiments, for the adjacent first contactor column and the second contactor column, the first control component is specifically configured to control the opening and closing of the switches in the switch array, so as to short-circuit each second contactor in the first contactor column and each second contactor in the second contactor column, and form a test path between the test component and the third target contactor in the first contactor column and the fourth target contactor in the second contactor column.

[0010] In one of the embodiments, for each contactor row and the second housing, the first control component is specifically configured to control the opening and closing of the switches in the switch array, so as to short-circuit each second contactor in the contactor row, and form a test path between the test component and the fifth target contactor in the contactor row and the second housing.

[0011] In one of the embodiments, for each contactor column and the second housing, the first control component is specifically configured to control the opening and closing of the switches in the switch array, so as to short-circuit each second contactor in the contactor column, and form a test path between the test component and the sixth target contactor in the contactor column and the second housing.

[0012] In one of the embodiments, the withstand voltage test device further comprises a connection port configured to be connected with the test component.

[0013] In one of the embodiments, the withstand voltage test device further comprises a second control component, the first control component is built-in with a plurality of test programs, the second control component is configured to send a program selection instruction to the first control component, the first control component is configured to control the opening and closing of the switches in the switch array according to a target test program indicated by the program selection instruction, and each test program corresponds to a different type of electrical connector to be tested.

[0014] In one of the embodiments, the withstand voltage test device further comprises a display component connected with the first control component, and configured to display a current test path, a test voltage and a measured leakage current under the control of the first control component.

[0015] In a second aspect, the application further provides a withstand voltage test method, which comprises:

[0016] The control test assembly sequentially forms a test path between each adjacent two contact rows, between each adjacent two contact columns, between each contact row and the second housing, and between each contact column and the second housing. The control test assembly applies a test voltage to the second electrical connector through the test path and measures the leakage current after applying the test voltage.

[0017] In one embodiment, the maximum measured value of the leakage current in the test path is 1 mA.

[0018] The above voltage withstand test device includes a first control assembly, a plurality of test ports, a switch array, and a test assembly. The plurality of test ports are respectively connected to the first housing and the plurality of first contacts of the first electrical connector. The first electrical connector is connected to the second electrical connector to be tested. After the connection, the plurality of first contacts are in contact with the plurality of second contacts of the second electrical connector, and the first housing is in contact with the second housing of the second electrical connector. The first control assembly communicates with the switch array to control the opening and closing of the switches in the switch array, so that the test assembly sequentially forms a test path between each adjacent two contact rows, between each adjacent two contact columns, between each contact row and the second housing, and between each contact column and the second housing. Finally, the test assembly applies a test voltage to the second electrical connector through the test path and measures the leakage current after applying the test voltage. In this way, the device can control the switch array to sequentially connect the contacts of the second electrical connector to form a test path through the first control assembly, and the test assembly can perform voltage withstand testing on the test path. In the electrical connector test, only the second electrical connector to be tested needs to be connected to the first electrical connector, and the voltage withstand test device automatically performs testing. After the test is completed, the next electrical connector is replaced for testing. During the testing process, there is no need for manual measurement and selection of the test path, the testing efficiency is high, errors caused by manual measurement of the contact distance are avoided, and the test result is more accurate. BRIEF DESCRIPTION OF DRAWINGS

[0019] Figure 1 A schematic diagram of a voltage withstand test device in one embodiment;

[0020] Figure 2 A schematic diagram of a measurement path between contact rows in another embodiment;

[0021] Figure 3 A schematic diagram of a measurement path between contact columns in another embodiment;

[0022] Figure 4 A schematic diagram of a measurement path between contact rows and the second housing in another embodiment;

[0023] Figure 5 A schematic diagram of a measurement path between the contactor array and the second housing in another embodiment;

[0024] Figure 6 A schematic diagram of a voltage withstand test device in another embodiment;

[0025] Figure 7 A schematic diagram of a voltage withstand test device in another embodiment;

[0026] Figure 8 A schematic diagram of a voltage withstand test device in another embodiment;

[0027] Figure 9 A schematic diagram of a voltage withstand test device in another embodiment;

[0028] Figure 10 A schematic diagram of a voltage withstand test method in another embodiment;

[0029] Figure 11 A schematic diagram of a circular electrical connector array division scheme one in another embodiment;

[0030] Figure 12 A schematic diagram of a circular electrical connector array division scheme two in another embodiment;

[0031] Figure 13 A schematic diagram of a rectangular electrical connector array division scheme one in another embodiment;

[0032] Figure 14 A schematic diagram of a rectangular electrical connector array division scheme two in another embodiment. DETAILED DESCRIPTION

[0033] In order to make the purposes, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and should not be used to limit the present application.

[0034] In the present application, the terms "first" and "second" are only used for the purpose of description, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined with "first" and "second" can explicitly or implicitly include at least one of the features. In the description of the present application, the meaning of "a plurality of" is at least two, for example, two, three, etc., unless otherwise specifically limited.

[0035] In this application, unless otherwise explicitly specified and limited, the terms "mounting", "connecting", "connecting", "fixing" and the like should be understood broadly, for example, it can be fixedly connected, or it can be detachably connected, or it can be integrated; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium; it can be the internal communication of two elements or the interaction relationship between two elements, unless otherwise explicitly limited. For those skilled in the art, the specific meaning of the above terms in this application can be understood according to the specific circumstances.

[0036] In this application, unless otherwise explicitly specified and limited, the first feature is "on" or "under" the second feature. The first and second features can be in direct contact, or the first and second features can be in indirect contact through an intermediate medium. Moreover, the first feature "above", "above" and "above" the second feature can be the first feature directly above or obliquely above the second feature, or it can only mean that the horizontal height of the first feature is higher than that of the second feature. The first feature "below", "below" and "below" the second feature can be the first feature directly below or obliquely below the second feature, or it can only mean that the horizontal height of the first feature is less than that of the second feature.

[0037] It should be noted that when an element is referred to as "fixed to" or "provided on" another element, it can be directly on another element or there can be a middle element. When an element is considered to be "connected" to another element, it can be directly connected to another element or there can be a middle element. The terms "vertical", "horizontal", "up", "down", "left", "right" and similar expressions used herein are for illustrative purposes only and are not the only implementation.

[0038] Figure 1 The structure schematic diagram of the withstand voltage test device provided by the embodiment of the application is shown in the figure. Figure 1 As shown in the figure, the withstand voltage test device includes a first control component 11, a plurality of test ports 12, a switch array 13 and a test component 14. The switch array 13 is arranged between the plurality of test ports 12 and the test component 14, and the switch array 13 includes a plurality of switches.

[0039] In an optional implementation, the first control component 11 can be an FPGA (Field Programmable Gate Array, Field Programmable Gate Array) device. The FPGA, as the main control core of the withstand voltage test device, can control the measurement process through programming. The switch array 13 can be a high-voltage switch array, which includes a plurality of high-voltage switches. The test component 14 can be a withstand voltage tester.

[0040] a plurality of test ports 12, each of which is connected to the first housing of the first electrical connector 15 and the plurality of first contacts, respectively, the first electrical connector being configured to be connected to a second electrical connector 16 to be tested, when connected, the plurality of first contacts being in contact with a plurality of second contacts of the second electrical connector, and the first housing being in contact with a second housing of the second electrical connector 16, wherein the plurality of second contacts are arranged in an array, the array being divided into a plurality of contact rows and a plurality of contact columns.

[0041] The plurality of test ports 12 can be input and output ports, each of which is connected to the first housing of the first electrical connector 15 and the plurality of first contacts, respectively.

[0042] Optionally, in the voltage withstand test device, the first electrical connector 15 is a fixed end of the device, and the second electrical connector 16 is an electrical connector to be tested. When testing, the first electrical connector 15 and the second electrical connector 16 to be tested are used in matching, for example, when the first electrical connector 15 is a female electrical connector, a male type second electrical connector 16 can be tested, and when the first electrical connector 15 is a male electrical connector, a female type second electrical connector 16 can be tested. When the first electrical connector 15 is connected to the second electrical connector 16, the contacts on the two electrical connectors are in conduction, and the housings of the two electrical connectors are in conduction. The plurality of second contacts on the second electrical connector 16 are arranged in an array and can be divided into a plurality of contact rows and a plurality of contact columns.

[0043] The first control component 11 is in communication connection with the switch array 13, and is configured to control the opening and closing of the switches in the switch array 13, so that the test assembly 14 forms a test path between each adjacent two contact rows, forms a test path between each adjacent two contact columns, forms a test path between each contact row and the second housing, and forms a test path between each contact column and the second housing.

[0044] The test assembly 14 is configured to apply a test voltage to the second electrical connector 16 through the test path, and measure a leakage current after applying the test voltage.

[0045] The voltage withstand test is to determine whether the electrical connector can work safely under the rated voltage by applying a specified voltage between the contact pieces of the electrical connector and the contact pieces, between the contact pieces and the shell within a specified time. Therefore, the opening and closing of the switches in the switch array 13 are controlled by the first control component FPGA connected with the switch array 13 to switch the test path that needs to be tested for voltage withstand. The test component 14 can be a voltage withstand tester, which can output high voltage to apply voltage to the second electrical connector 16 through the test path, and then measure the leakage current of the second electrical connector 16 to determine whether the insulation performance of the second electrical connector 16 to be tested is qualified. That is, when the voltage suddenly increases, the leakage current cannot be too large, otherwise it may cause the electrical connector to short circuit and affect the entire circuit.

[0046] Among them, since the electrical connector has many contact pieces, the voltage withstand test is performed between adjacent two rows of contact pieces by controlling the switch array to connect the contact pieces in each row. If the voltage withstand test between the two rows is qualified, it means that the voltage withstand test between all the contact pieces is qualified, and it is not necessary to measure the voltage withstand between each contact piece in the two rows. This way can simplify the measurement process and improve the measurement efficiency. Similarly, by controlling the switch array to connect the contact pieces in each column, the voltage withstand test is performed between each adjacent two columns of contact pieces, and the voltage withstand test is performed between each row of contact pieces and the shell of the electrical connector, and the voltage withstand test is also performed between each column of contact pieces and the shell of the electrical connector, without the need to separately measure the voltage withstand between each contact piece and the shell of the electrical connector.

[0047] In this embodiment, the voltage withstanding test device comprises a first control assembly, a plurality of test ports, a switch array and a test assembly, wherein the plurality of test ports are respectively connected with a first housing of a first electrical connector and a plurality of first contact pieces, the first electrical connector is connected with a second electrical connector to be tested, after the connection, the plurality of first contact pieces are in contact with a plurality of second contact pieces of the second electrical connector, at the same time, the first housing is in contact with a second housing of the second electrical connector, the first control assembly controls the opening and closing of the switches in the switch array through communication with the switch array, so that the test assembly forms a test path between each adjacent two contact piece rows, between each adjacent two contact piece columns, between each contact piece row and the second housing, and between each contact piece column and the second housing in turn, finally, the test assembly applies a test voltage to the second electrical connector through the test path, and measures the leakage current after applying the test voltage. In this way, the device can control the switch array to form a test path by connecting each contact piece of the second electrical connector in turn through the first control assembly, and the test assembly can perform voltage withstanding test on the test path, so that in the electrical connector test, only the second electrical connector to be tested needs to be connected to the first electrical connector, the voltage withstanding test device automatically performs test, and after the test is completed, the next electrical connector is replaced for test, without manual measurement and selection of the test path during the test, the test efficiency is high, at the same time, the error caused by manual measurement of the contact piece distance is avoided, and the test result is more accurate.

[0048] In an optional embodiment, as shown in Figure 2 For the adjacent first contact piece row 21 and the second contact piece row 22, the first control assembly is specifically used for controlling the opening and closing of the switches in the switch array, so that each second contact piece in the first contact piece row 21 is short-circuited, each second contact piece in the second contact piece row 22 is short-circuited, and the test assembly forms a test path 23 between the first target contact piece in the first contact piece row 21 and the second target contact piece in the second contact piece row 22.

[0049] In this embodiment, the switch array is connected with the test assembly and the contact piece port, the first control assembly FPGA is the main control core, the opening and closing of the switches in the switch array are controlled through programming, the switches between each second contact piece in the first contact piece row 21 are closed, the switches between each second contact piece in the second contact piece row 22 are closed, that is, each contact piece between the first contact piece row 21 is connected together, and each contact piece in the second contact piece row 22 is connected together.

[0050] The first target contact can be the first contact in the first contact row 21, the second target contact can be the first contact in the second contact row 22, and the test assembly and the first target contact and the second target contact form a test path 23. At this time, the insulation capability between the first contact row 21 and the second contact row 22 can be measured through the test path.

[0051] In the above embodiment, by connecting all the contacts in the first contact row in parallel and connecting all the contacts in the second contact row in parallel, and then measuring the insulation capability between the two rows, it is not necessary to measure the distance between each two contacts and then measure the insulation capability between the closest contacts, thereby simplifying the test process, reducing the test time, and improving the test efficiency.

[0052] Optionally, as shown in Figure 3 For the adjacent first contact column 31 and the second contact column 32, the first control assembly is specifically configured to control the opening and closing of the switches in the switch array, so that each second contact in the first contact column 31 is short-circuited with each other, and each second contact in the second contact column 32 is short-circuited with each other. The test assembly and the third target contact in the first contact column 31 and the fourth target contact in the second contact column 32 form a test path 33.

[0053] In this embodiment, the switch array is connected to the test assembly and the contact port, and the first control assembly FPGA is the main control core. By programming the opening and closing of the switches in the switch array, the switches between each second contact in the first contact column 31 are closed, and the switches between each second contact in the second contact column 32 are closed, that is, each contact in the first contact column 31 is connected together, and each contact in the second contact column 32 is connected together.

[0054] The third target contact can be the first contact in the first contact column 31, the fourth target contact can be the first contact in the second contact column 32, and the test assembly and the third target contact and the fourth target contact form a test path 33. At this time, the insulation capability between the first contact column 31 and the second contact column 32 can be measured through the test path.

[0055] In the above embodiment, by connecting all the contacts in the first contact column in parallel and connecting all the contacts in the second contact column in parallel, and then measuring the insulation capability between the two rows, it is not necessary to measure the distance between each two contacts and then measure the insulation capability between the closest contacts, thereby simplifying the test process, reducing the test time, and improving the test efficiency.

[0056] In one of the embodiments, as shown in Figure 4As shown, for each contact row and the second shell 42, the first control component is specifically configured to control the opening and closing of the switches in the switch array, so that each second contact in the contact row is short-circuited with each other, and the test component forms a test path 44 between the fifth target contact 43 in the contact row and the second shell 42.

[0057] In this embodiment, the switch array connects the test component and the contact port, and the first control component FPGA is the main control core, which can control the opening and closing of the switches in the switch array through programming. When measuring the insulation capability between each contact row and the second shell 42, the first control component controls the closing of the switches between each second contact in each contact row, that is, connects each second contact in each contact row, the fifth target contact 43 can be the first contact in each contact row, and the second shell 42 is the shell of the electrical connector to be tested. The test component forms a test path 44 between the fifth target contact 43 and the second shell 42, so that the insulation capability between each contact row 41 and the second shell 42 can be measured through the test path.

[0058] In the above embodiment, by connecting the contacts in each contact row in parallel in the electrical connector, and then measuring the insulation capability between each contact row and the shell, it is not necessary to measure the distance between each contact and the shell, and then measure the insulation capability between the closest contact and the shell, thereby simplifying the test process, reducing the test time, and improving the test efficiency.

[0059] In one of the embodiments, as shown, Figure 5 As shown, for each contact row and the second shell 42, the first control component is specifically configured to control the opening and closing of the switches in the switch array, so that each second contact in the contact row is short-circuited with each other, and the test component forms a test path 44 between the fifth target contact 43 in the contact row and the second shell 42.

[0060] In this embodiment, the switch array connects the test component and the contact port, and the first control component FPGA is the main control core, which can control the opening and closing of the switches in the switch array through programming. When measuring the insulation capability between each contact row and the second shell 42, the first control component controls the closing of the switches between each second contact in each contact row, that is, connects each second contact in each contact row, the fifth target contact 43 can be the first contact in each contact row, and the second shell 42 is the shell of the electrical connector to be tested. The test component forms a test path 44 between the fifth target contact 43 and the second shell 42, so that the insulation capability between each contact row 41 and the second shell 42 can be measured through the test path.

[0061] In the above embodiments, by connecting the contacts in each contact column of the electrical connector in parallel and then measuring the insulation capability between each contact column and the housing, it is not necessary to measure the distance between each contact and the housing and then measure the insulation capability between the closest contact and the housing. This simplifies the testing process, reduces testing time, and improves testing efficiency.

[0062] In one alternative approach, such as Figure 6 As shown, the withstand voltage test device also includes a connection port 61, which is used to connect to the test component.

[0063] Optionally, the withstand voltage test device also includes a connection port 61, which is located between the test component and the switch array. The switch array switches to output the test path to be tested to the connection port 61, and then the test component performs a withstand voltage test on the test path.

[0064] Optional, such as Figure 7 As shown, the withstand voltage testing device also includes a second control component 71. The first control component has multiple test programs built in. The second control component 71 is used to send program selection instructions to the first control component. The first control component is used to control the opening and closing of the switches in the switch array according to the target test program indicated by the program selection instructions. Each test program corresponds to a different type of electrical connector to be tested.

[0065] There are different types of electrical connectors, and different test procedures are required for different types of electrical connectors. The withstand voltage test device also includes a second control component 71, which can be a touch screen controller or a selection switch. The second control component 71 can control the first control component to select different test procedures according to the type of electrical connector.

[0066] In the above embodiments, by pre-setting test programs for different types of electrical connectors, the test can be performed according to the type of electrical connector, which improves the flexibility of the withstand voltage test device and makes it easy to perform batch testing.

[0067] In another embodiment, such as Figure 8 As shown, the withstand voltage test device also includes a display component 81, which is connected to the first control component and is used to display the current test path, test voltage and measured leakage current under the control of the first control component.

[0068] In the embodiment, the display component 81 can be a display screen connected with the first control component FPGA. The display screen receives the parameters in the test process sent by the first control component and displays the parameters, including the current test path, i.e., which two contactors are currently tested for the withstand voltage test. The test voltage and the measured leakage current are also included. The test voltage is the high voltage output by the test component and applied to the test path. The leakage current is the leakage current measured in the test path after the test voltage is applied. The leakage current can reflect whether the insulation performance of the contactors in the test path meets the requirements.

[0069] In the above embodiment, by setting the display component, the current test path and parameters in the measurement process can be seen, the display is more intuitive, and the user is more convenient to use.

[0070] Further, the overall block diagram of the withstand voltage test device is as shown in Figure 9 .

[0071] In a second aspect, the application also provides a withstand voltage test method, as shown in Figure 10 , the method comprises:

[0072] Step 1001, control the test component to form a test path with each adjacent two contactor rows in the second electric connector to be tested, form a test path with each adjacent two contactor columns, form a test path with each contactor row and the second shell, and form a test path with each contactor column and the second shell.

[0073] Among them, for different types of electric connectors, different division schemes are used for row and column division. The division scheme for circular electric connectors can be as shown in Figure 11 and Figure 12 Two kinds of row and column division for rectangular electric connectors can be as shown in Figure 13 and Figure 14 Two kinds. After dividing the different contactor rows and contactor columns, the insulation capability of each adjacent two contactor rows, each adjacent two contactor columns, each contactor row and the second shell, and each contactor column and the second shell can be measured.

[0074] In the above embodiment, the contactors of the electric connector are divided into rows and columns, and the rows and columns are tested according to the parallel method respectively, which can realize flexible switching and selection of the contactors and the shell of the electric connector, effectively cover the dielectric withstand voltage test between the contactors and the shell, and easily perform batch testing, with short test time and higher efficiency.

[0075] Step 1002, control the test component to apply a test voltage to the second electric connector through the test path, and measure the leakage current after applying the test voltage.

[0076] In this embodiment, the maximum measured value of the leakage current in the test path is 1 mA.

[0077] Optionally, the leakage current in the test path reflects whether the insulation performance of the contact in the test path meets the requirements. When the leakage current is too large, it can cause short circuit between the contacts, affecting the insulation performance. Therefore, the maximum measured value of the leakage current in the measuring circuit is 1 mA. When the leakage current measured after a high voltage is applied to the test assembly during the test is less than 1 mA, it indicates that the contact in the test path passes the voltage resistance test and the insulation performance meets the requirements.

[0078] The technical features of the above embodiments can be combined in any manner. To make the description concise, all possible combinations of the technical features in the above embodiments are not described, but as long as the combinations of the technical features do not contradict, they should be considered as falling within the scope of the present disclosure.

[0079] The above embodiments only express several implementation manners of the present application, and the description is relatively specific and detailed, but it should not be understood as a limitation on the scope of the patent of the present application. It should be pointed out that, for those skilled in the art, some modifications and improvements can be made without departing from the concept of the present application, and these all fall within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A voltage withstand testing device, characterized by, The voltage withstanding test device comprises a first control assembly, a plurality of test ports, a switch array and a test assembly, the switch array is arranged between the plurality of test ports and the test assembly, and the switch array comprises a plurality of switches; The plurality of test ports are used for being connected with a first shell and a plurality of first contact pieces of a first electrical connector respectively, the first electrical connector is used for being connected with a second electrical connector to be tested, when being connected, the plurality of first contact pieces and a plurality of second contact pieces of the second electrical connector are in contact with each other, and the first shell and a second shell of the second electrical connector are in contact with each other, wherein the plurality of second contact pieces are arranged in an array, and the array is divided into a plurality of contact piece rows and a plurality of contact piece columns; The first control assembly is in communication connection with the switch array, and is used for controlling the opening and closing of the switches in the switch array, so that the test assembly forms a test path between each adjacent two contact piece rows, forms a test path between each adjacent two contact piece columns, forms a test path between each contact piece row and the second shell, and forms a test path between each contact piece column and the second shell; The test assembly is used for applying a test voltage to the second electrical connector through the test path, and measuring a leakage current after the test voltage is applied; For adjacent first contact piece rows and second contact piece rows, the first control assembly is specifically used for controlling the opening and closing of the switches in the switch array, so that each second contact piece in the first contact piece row is short-circuited with each second contact piece in the second contact piece row, each second contact piece in the second contact piece row is short-circuited with each other, and the test assembly forms the test path between a first target contact piece in the first contact piece row and a second target contact piece in the second contact piece row. For adjacent first contact piece columns and second contact piece columns, the first control assembly is specifically used for controlling the opening and closing of the switches in the switch array, so that each second contact piece in the first contact piece column is short-circuited with each second contact piece in the second contact piece column, each second contact piece in the second contact piece column is short-circuited with each other, and the test assembly forms the test path between a third target contact piece in the first contact piece column and a fourth target contact piece in the second contact piece column.

2. The apparatus of claim 1, wherein, For each contact piece row and the second shell, the first control assembly is specifically used for controlling the opening and closing of the switches in the switch array, so that each second contact piece in the contact piece row is short-circuited with each other, and the test assembly forms the test path between a fifth target contact piece in the contact piece row and the second shell.

3. The apparatus of claim 1, wherein, For each contact piece column and the second shell, the first control assembly is specifically used for controlling the opening and closing of the switches in the switch array, so that each second contact piece in the contact piece column is short-circuited with each other, and the test assembly forms the test path between a sixth target contact piece in the contact piece column and the second shell.

4. The apparatus of claim 1, wherein, The voltage withstanding test device further comprises a connection port, and the connection port is used for being connected with the test assembly.

5. The apparatus of claim 1, wherein, The voltage-withstanding test device further comprises a second control component, the first control component is built-in with a plurality of test programs, the second control component is used to send program selection instructions to the first control component; the first control component is used to control the opening and closing of the switches in the switch array according to the target test program indicated by the program selection instructions. Each test program corresponds to a different type of electrical connector to be tested.

6. The apparatus of claim 5, wherein, The second control component is a touch screen controller or a selection switch.

7. The apparatus of claim 1, wherein, The first control component is a field programmable logic gate array (FPGA).

8. The apparatus of claim 1, wherein, The voltage-withstanding test device further comprises a display component connected with the first control component, used to display the current test path, the test voltage and the measured leakage current under the control of the first control component.

9. A withstand voltage test method characterized by comprising: The method is applied to the voltage-withstanding test device of any one of claims 1 to 8, and the method comprises: Controlling the test component to sequentially form a test path between each adjacent two contact rows, between each adjacent two contact columns, between each contact row and the second shell, and between each contact column and the second shell in the second electrical connector to be tested; Controlling the test component to apply a test voltage to the second electrical connector through the test path, and measuring the leakage current after applying the test voltage.

10. The method of claim 9, wherein, The maximum measured value of the leakage current in the test path is 1 mA.

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