Reliability analysis method and device for barium titanate-based multilayer ceramic capacitors

Abstract

The present application relates to a reliability analysis method, device, computer equipment, storage medium and computer program product for a barium titanate-based multilayer ceramic capacitor, which obtains a first test parameter of the capacitor to be tested at a first temperature; obtains a second test parameter of the capacitor to be tested at a second temperature; seals the capacitor to be tested, makes slices, and the slices are perpendicular to the inner electrodes of the capacitor to be tested; irradiates the slices with X-rays, obtains the X-ray photoelectron spectrum of the barium titanate ceramic dielectric region of the slices, and determines the reliability analysis results of the capacitor to be tested based on the X-ray photoelectron spectrum. By analyzing the normal temperature state and high temperature state of the capacitor to be tested, a preliminary judgment is made on the reliability of the capacitor to be tested. According to the analysis of the X-ray photoelectron spectrum of the capacitor to be tested, the insulation performance of the barium titanate dielectric in the capacitor to be tested is analyzed, and then the reliability and service life of the capacitor to be tested are accurately determined.

Description

Technical Field

[0001] The present application relates to the field of reliability detection technology, and in particular to a reliability analysis method, device, computer equipment, storage medium and computer program product for barium titanate-based multilayer ceramic capacitors. Background Art

[0002] Multilayer ceramic capacitors (MLCC) are widely used in power electronics, household appliances, aerospace and other fields due to their advantages such as low cost, small size, long life and high reliability. In the actual application of the whole machine, MLCC mainly plays the role of filtering, energy storage, bypassing, coupling and so on. The reliability of MLCC directly affects the stability of the whole machine. Barium titanate (BaTiO3) is often used as the dielectric material of MLCC due to its advantages such as high dielectric constant and low dielectric loss. In the context of MLCC miniaturization, internal electrode metallization has become the first choice. Among them, electrode materials such as nickel and copper have been studied and applied to the internal electrodes of MLCC due to their advantages such as low cost and good conductivity. However, since nickel electrodes and copper electrodes are easily oxidized, the dielectric materials matching them need to be sintered in an atmosphere with low oxygen partial pressure. Therefore, the dielectric material used in MLCC is required to have good anti-reduction performance, but the titanium oxide in the dielectric material is easy to change valence in a low oxygen partial pressure atmosphere, causing the insulation performance of the dielectric material to deteriorate, affecting the reliability of the capacitor. Summary of the invention

[0003] Based on this, it is necessary to provide an accurate and effective reliability analysis method, device, computer equipment, computer-readable storage medium and computer program product for barium titanate-based multilayer ceramic capacitors in response to the above technical problems.

[0004] In a first aspect, the present application provides a reliability analysis method for a barium titanate-based multilayer ceramic capacitor. The method comprises:

[0005] Determining a first test parameter of the capacitor to be tested at a first temperature according to the rated operating parameters of the capacitor to be tested, wherein the capacitor to be tested is a barium titanate-based multilayer ceramic capacitor;

[0006] When the first test parameter satisfies the first preset condition, by making the capacitor to be tested operate under the preset first power-on test condition, a second test parameter of the capacitor to be tested at a second temperature is obtained, and the second temperature is greater than the first temperature;

[0007] When the second test parameter satisfies the second preset condition, the capacitor to be tested is sealed and sliced, wherein the slice is perpendicular to the inner electrode of the capacitor to be tested;

[0008] The slice is irradiated with X-rays to obtain an X-ray photoelectron spectrum of the barium titanate ceramic dielectric region of the slice, and a reliability analysis result of the capacitor to be tested is determined based on the X-ray photoelectron spectrum.

[0009] In one embodiment, determining a first test parameter of the capacitor to be detected at a first temperature according to the rated operating parameter of the capacitor to be detected includes:

[0010] Determine the second power-on test condition of the capacitor to be tested according to the rated operating parameters;

[0011] The first test parameter of the capacitor to be detected is obtained at the first temperature by making the capacitor to be detected operate under the second power-on test condition.

[0012] In one embodiment, the preset first power-on test condition includes a test temperature, a test voltage, a test duration, and a size of a current-limiting resistor in a test circuit;

[0013] Among them, the test temperature refers to the temperature of the working environment of the capacitor to be tested; the test voltage refers to the total voltage of the circuit where the capacitor to be tested is located; and the test time refers to the total time that the capacitor to be tested works at the test temperature.

[0014] In one embodiment, the first test parameter includes at least one of the following three parameters, which are capacitance, loss tangent and insulation resistance.

[0015] In one embodiment, determining the reliability analysis result of the capacitor to be tested according to X-ray photoelectron spectroscopy includes:

[0016] Determine the maximum absorption peak position of the target orbit according to the X-ray photoelectron spectrum, the target orbit refers to the preset electron layer orbit of the titanium element in the barium titanate ceramic medium;

[0017] When the energy of the maximum absorption peak is not less than the preset energy, the reliable analysis result of the capacitor to be detected is determined to be the first reliability level. When the energy of the maximum absorption peak is less than the preset energy, the reliable analysis result of the capacitor to be detected is determined to be the second reliability level. The reliability of the capacitor represented by the first reliability level is greater than that of the second reliability level.

[0018] In one embodiment, the method further comprises:

[0019] When the first test parameter does not meet the first preset condition or the second test parameter does not meet the second preset condition, the reliability analysis result of the capacitor to be tested is determined to be the third reliability level, and the reliability of the capacitor represented by the second reliability level is greater than the third reliability level.

[0020] In a second aspect, the present application also provides a reliability analysis device for a barium titanate-based multilayer ceramic capacitor. The device comprises:

[0021] A first detection module, used for determining a first test parameter of the capacitor to be detected at a first temperature according to the rated working parameters of the capacitor to be detected, wherein the capacitor to be detected is a barium titanate-based multilayer ceramic capacitor;

[0022] A second detection module is used to obtain a second test parameter of the capacitor to be detected at a second temperature by making the capacitor to be detected work under a preset first power-on test condition when the first test parameter meets the first preset condition, and the second temperature is greater than the first temperature;

[0023] The encapsulation and slicing module is used to seal the capacitor to be tested and make slices when the second test parameter meets the second preset condition, and the slices are perpendicular to the inner electrodes of the capacitor to be tested;

[0024] The third detection module is used to irradiate the slice with X-rays to obtain the X-ray photoelectron spectrum of the barium titanate ceramic dielectric region of the slice, and determine the reliability analysis result of the capacitor to be detected based on the X-ray photoelectron spectrum.

[0025] In a third aspect, the present application further provides a computer device. The computer device includes a memory and a processor, the memory stores a computer program, and the processor implements the following steps when executing the computer program:

[0026] Determining a first test parameter of the capacitor to be tested at a first temperature according to the rated operating parameters of the capacitor to be tested, wherein the capacitor to be tested is a barium titanate-based multilayer ceramic capacitor;

[0027] When the first test parameter satisfies the first preset condition, by making the capacitor to be tested operate under the preset first power-on test condition, a second test parameter of the capacitor to be tested at a second temperature is obtained, and the second temperature is greater than the first temperature;

[0028] When the second test parameter satisfies the second preset condition, the capacitor to be tested is sealed and sliced, wherein the slice is perpendicular to the inner electrode of the capacitor to be tested;

[0029] The slice is irradiated with X-rays to obtain an X-ray photoelectron spectrum of the barium titanate ceramic dielectric region of the slice, and a reliability analysis result of the capacitor to be tested is determined based on the X-ray photoelectron spectrum.

[0030] In a fourth aspect, the present application further provides a computer-readable storage medium. The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0031] Determining a first test parameter of the capacitor to be tested at a first temperature according to the rated operating parameters of the capacitor to be tested, wherein the capacitor to be tested is a barium titanate-based multilayer ceramic capacitor;

[0032] When the first test parameter satisfies the first preset condition, by making the capacitor to be tested operate under the preset first power-on test condition, a second test parameter of the capacitor to be tested at a second temperature is obtained, and the second temperature is greater than the first temperature;

[0033] When the second test parameter satisfies the second preset condition, the capacitor to be tested is sealed and sliced, wherein the slice is perpendicular to the inner electrode of the capacitor to be tested;

[0034] The slice is irradiated with X-rays to obtain an X-ray photoelectron spectrum of the barium titanate ceramic dielectric region of the slice, and a reliability analysis result of the capacitor to be tested is determined based on the X-ray photoelectron spectrum.

[0035] In a fifth aspect, the present application further provides a computer program product. The computer program product includes a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0036] Determining a first test parameter of the capacitor to be tested at a first temperature according to the rated operating parameters of the capacitor to be tested, wherein the capacitor to be tested is a barium titanate-based multilayer ceramic capacitor;

[0037] When the first test parameter satisfies the first preset condition, by making the capacitor to be tested operate under the preset first power-on test condition, a second test parameter of the capacitor to be tested at a second temperature is obtained, and the second temperature is greater than the first temperature;

[0038] When the second test parameter satisfies the second preset condition, the capacitor to be tested is sealed and sliced, wherein the slice is perpendicular to the inner electrode of the capacitor to be tested;

[0039] The slice is irradiated with X-rays to obtain an X-ray photoelectron spectrum of the barium titanate ceramic dielectric region of the slice, and a reliability analysis result of the capacitor to be tested is determined based on the X-ray photoelectron spectrum.

[0040] The reliability analysis method, device, computer equipment, storage medium and computer program product of the barium titanate-based multilayer ceramic capacitor described above determine the first test parameter of the capacitor to be tested at the first temperature according to the rated working parameters of the capacitor to be tested, and the capacitor to be tested is a barium titanate-based multilayer ceramic capacitor; when the first test parameter meets the first preset condition, the capacitor to be tested is operated under the preset first power-on test condition to obtain the second test parameter of the capacitor to be tested at the second temperature, and the second temperature is greater than the first temperature; when the second test parameter meets the second preset condition, the capacitor to be tested is sealed and sliced, and the slice is perpendicular to the inner electrode of the capacitor to be tested; the slice is irradiated with X-rays to obtain the X-ray photoelectron spectrum of the barium titanate ceramic dielectric region of the slice, and the reliability analysis result of the capacitor to be tested is determined according to the X-ray photoelectron spectrum. By analyzing the normal temperature state and high temperature state of the capacitor to be tested, combined with the preset parameter standard, a preliminary judgment is made on the reliability of the capacitor to be tested. Then, according to the X-ray photoelectron spectrum of the capacitor to be tested, the insulation performance of the barium titanate dielectric in the capacitor to be tested is analyzed, and the reliability of the capacitor to be tested is accurately determined, and the service life of the capacitor to be tested is quickly analyzed. In addition, the reliability of the capacitor to be detected is analyzed under multiple conditions, thereby improving the robustness and stability of the reliability analysis system of the capacitor to be detected. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] Figure 1 is an application environment diagram of a reliability analysis method for a barium titanate-based multilayer ceramic capacitor in one embodiment;

[0042] Figure 2 1 is a schematic flow chart of a reliability analysis method for a barium titanate-based multilayer ceramic capacitor in one embodiment;

[0043] Figure 3 A schematic diagram of a cutting method for making slices in one embodiment;

[0044] Figure 4 is a schematic flow chart of a reliability analysis method for a barium titanate-based multilayer ceramic capacitor in another embodiment;

[0045] Figure 5 is a schematic flow chart of a reliability analysis method for a barium titanate-based multilayer ceramic capacitor in yet another embodiment;

[0046] Figure 6 is a structural block diagram of a reliability analysis device for a barium titanate-based multilayer ceramic capacitor in one embodiment;

[0047] Figure 7 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0048] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0049] Multilayer ceramic capacitors (MLCC) are widely used in power electronics, household appliances, aerospace and other fields due to their advantages such as low cost, small size, long life and high reliability. In the actual application of the whole machine, MLCC mainly plays the role of filtering, energy storage, bypassing, coupling and so on. The reliability of MLCC directly affects the stability of the whole machine. Barium titanate (BaTiO3) is often used as the dielectric material of MLCC due to its advantages such as high dielectric constant and low dielectric loss. In the context of MLCC miniaturization, internal electrode metallization has become the first choice. Among them, electrode materials such as nickel and copper have been studied and applied to the internal electrodes of MLCC due to their advantages such as low cost and good conductivity. However, since nickel electrodes and copper electrodes are easily oxidized, the dielectric materials matching them need to be sintered in an atmosphere with low oxygen partial pressure. Therefore, the dielectric material used in MLCC is required to have good anti-reduction performance, but the titanium oxide in the dielectric material is easy to change valence in a low oxygen partial pressure atmosphere, causing the insulation performance of the dielectric material to deteriorate, affecting the reliability of the capacitor.

[0050] The reliability analysis method of the barium titanate-based multilayer ceramic capacitor provided in the embodiment of the present application can be applied to Figure 1 In the application environment shown in the figure, the terminal 102 communicates with the server 104 through the network. The terminal 102 obtains the working parameters of the capacitor to be detected through various sensors, and sends the obtained working parameters to the server 104, and the server 104 analyzes the reliability of the capacitor to be detected according to the obtained working parameters. The data storage system can store the data that the server 104 needs to process. The data storage system can be integrated on the server 104, or it can be placed on the cloud or other network servers.

[0051] The terminal 102 may be, but is not limited to, various personal computers, laptops, smart phones, tablet computers, IoT devices, and portable wearable devices. The IoT devices may be smart speakers, smart TVs, smart air conditioners, smart car-mounted devices, etc. The portable wearable devices may be smart watches, smart bracelets, head-mounted devices, etc. The server 104 may be implemented as an independent server or a server cluster consisting of multiple servers.

[0052] In one embodiment, Figure 2 As shown, a reliability analysis method for barium titanate-based multilayer ceramic capacitors is provided. Figure 1 The server in the example is used to illustrate the following steps:

[0053] Step 202, determining a first test parameter of the capacitor to be detected at a first temperature according to the rated operating parameters of the capacitor to be detected, wherein the capacitor to be detected is a barium titanate-based multilayer ceramic capacitor;

[0054] Among them, the rated operating parameters refer to the parameters of the capacitor when it is in normal working state as determined by the design and production, which may include parameters such as rated operating voltage, temperature coefficient, and frequency characteristics. For example, the rated operating voltage is also called the nominal voltage. For capacitors, the rated operating voltage refers to the maximum DC voltage that the capacitor can withstand in the circuit to work stably and reliably for a long time, also known as withstand voltage. For devices with the same structure, dielectric, and capacity, the higher the withstand voltage, the smaller the volume. The first temperature refers to the ambient temperature in which the capacitor to be tested is operating. Here, the first temperature is used to indicate the temperature of the capacitor in normal working state, that is, the capacitor works at room temperature. It should be noted that for different capacitors, the corresponding range of "normal temperature state" is different. For example, the normal operating temperature of a film capacitor is -40 to 85°C, the normal operating temperature of a double-sided metallized resonant capacitor is -40 to 105°C, and for a barium titanate-based multilayer ceramic capacitor, the normal working environment temperature for its normal operation is approximately -55 to 125°C.

[0055] The first test parameter refers to the value obtained by testing the performance parameters of the capacitor to be tested when it is operating under the first temperature condition, such as the insulation resistance of the capacitor to be tested. It is understandable that there is a certain error between the performance adoption number determined during the design and production of the capacitor to be tested, that is, it is not necessarily possible to produce a capacitor with performance parameters exactly equal to the design value, so it is necessary to conduct actual performance testing on the produced capacitor to be tested as a sample.

[0056] Step 204, when the first test parameter satisfies the first preset condition, by operating the capacitor to be tested under a preset first power-on test condition, obtaining a second test parameter of the capacitor to be tested at a second temperature, wherein the second temperature is greater than the first temperature;

[0057] It should be noted that when the first test parameter meets the first preset condition, it means that the capacitor to be tested has no reliability problem before the second temperature test. If the first test parameter does not meet the first preset condition, it means that the capacitor to be tested has reliability problem.

[0058] Among them, the second temperature is used to indicate the high-temperature working state of the capacitor to be tested, and the first power-on test condition refers to the high-temperature power-on test of the capacitor to be tested, that is, to detect whether the capacitor to be tested still has the performance that meets the conditions after being powered on by high voltage. The purpose of this step is to detect the high-temperature performance of the capacitor to be tested and avoid the high-temperature environment from affecting the reliability of the capacitor. Generally, the range greater than the upper limit operating temperature of the capacitor to be tested can be regarded as high temperature, that is, the second temperature.

[0059] Specifically, a high-temperature power-on test platform for the capacitor to be tested can be built, the capacitor to be tested is placed in a high-temperature box, the capacitor to be tested is powered on, so that the capacitor to be tested runs for a period of time in a high-temperature (second temperature) environment, and then the performance parameters of the capacitor to be tested are tested to determine the second test parameters of the capacitor to be tested. It should be noted that the performance of the capacitor to be tested reflected by the second test parameter and the first test parameter is the same. For example, if the first test parameter includes the insulation resistance of the capacitor to be tested, the second test parameter also includes the insulation resistance of the capacitor to be tested. In one embodiment, the reliability of the capacitor to be tested can also be judged by comparing the first test parameter with the second test parameter.

[0060] Step 206, when the second test parameter satisfies the second preset condition, the capacitor to be tested is sealed and sliced, wherein the slice is perpendicular to the inner electrode of the capacitor to be tested;

[0061] Among them, solid sealing refers to completely encapsulating the capacitor to be tested through a certain process, so that only the pins of the capacitor to be tested are left outside, and the other parts are isolated from the outside world, so as to prevent impurities in the air from corroding the capacitor and affecting the degradation of the capacitor's electrical performance and reducing the reliability of the capacitor. For example, highly reducing substances in the air change the valence of titanium oxides in the barium titanate medium in the capacitor to be tested, reducing the insulation performance of the barium titanate medium.

[0062] In biology, slicing refers to using a special knife to cut the tissue or mineral of an organism into thin slices. In the embodiment of the present application, slicing refers to cutting the packaged capacitor to be tested from a certain direction to obtain a cross-section for X-ray irradiation. The shape of the barium titanate-based multilayer ceramic capacitor is similar to a rectangular parallelepiped. On a set of opposite surfaces of the rectangular parallelepiped are the outer electrodes and outer coating of the capacitor, and the interior of the rectangular parallelepiped is the inner electrode and the ceramic dielectric between the inner electrodes. When making slices, the slices are perpendicular to the inner electrodes of the capacitor to be tested, forming two types of longitudinal and transverse sections. In both slices, the internal multilayer inner electrodes and multilayer ceramic dielectric structure of the capacitor to be tested can be seen. In one embodiment, see Figure 3 , the method of making slices is as follows Figure 3 Cutting method shown.

[0063] Step 208 , irradiate the slice with X-rays to obtain an X-ray photoelectron spectrum of the barium titanate ceramic dielectric region of the slice, and determine the reliability analysis result of the capacitor to be tested based on the X-ray photoelectron spectrum.

[0064] Among them, the purpose of X-ray irradiation is to use X-ray photoelectron spectroscopy (XPS) to analyze components, which can accurately measure the inner electron binding energy of atoms and their chemical shifts. The energy of X-ray photons is between 1000 and 1500 eV, which can not only ionize the valence electrons of molecules but also excite the inner electrons. The energy level of the inner electrons is little affected by the molecular environment. The inner electron binding energy of the same atom varies very little in different molecules, so it is characteristic. Photons are incident on the surface of solids to excite photoelectrons, and the experimental technique of analyzing photoelectrons using an energy analyzer is called photoelectron spectroscopy.

[0065] In this embodiment, X-rays are used to irradiate the slice of the capacitor to be tested. Specifically, the position of the middle ceramic medium of the slice can be selected as the test point to stimulate the inner electrons or valence electrons of atoms or molecules to emit. Electrons excited by photons are called photoelectrons. The energy of photoelectrons can be measured, and the photoelectron energy spectrum of the ceramic medium in the middle of the slice can be obtained with the kinetic energy / binding energy of the photoelectrons as the horizontal coordinate and the relative intensity as the vertical coordinate. In this way, relevant information about the ceramic medium in the middle of the slice can be obtained, and by analyzing the photoelectron energy spectrum of the middle ceramic medium, the valence change of the titanium element in the ceramic medium can be determined, and then the reliability of the capacitor to be tested can be determined.

[0066] In the method provided in the above embodiment, according to the rated working parameters of the capacitor to be detected, the first test parameter of the capacitor to be detected at the first temperature is determined, and the capacitor to be detected is a barium titanate-based multilayer ceramic capacitor; when the first test parameter meets the first preset condition, the capacitor to be detected is operated under the preset first power-on test condition to obtain the second test parameter of the capacitor to be detected at the second temperature, and the second temperature is greater than the first temperature; when the second test parameter meets the second preset condition, the capacitor to be detected is sealed, and a slice is made, and the slice is perpendicular to the inner electrode of the capacitor to be detected; the slice is irradiated with X-rays to obtain the X-ray photoelectron spectrum of the barium titanate ceramic dielectric region of the slice, and the reliability analysis result of the capacitor to be detected is determined according to the X-ray photoelectron spectrum. By analyzing the normal temperature state and high temperature state of the capacitor to be detected, combined with the preset parameter standard, a preliminary judgment is made on the reliability of the capacitor to be detected. Then, according to the X-ray photoelectron spectrum of the capacitor to be detected, the insulation performance of the barium titanate dielectric in the capacitor to be detected is analyzed, and then the reliability of the capacitor to be detected is accurately determined, and the service life of the capacitor to be detected is quickly analyzed. In addition, the reliability of the capacitor to be detected is analyzed under multiple conditions, thereby improving the robustness and stability of the reliability analysis system of the capacitor to be detected.

[0067] In one embodiment, see Figure 4 , determining a first test parameter of the capacitor to be detected at a first temperature according to the rated operating parameters of the capacitor to be detected, including:

[0068] Step 402, determining a second power-on test condition of the capacitor to be tested according to the rated operating parameters;

[0069] Step 404 , obtaining a first test parameter of the capacitor to be tested at a first temperature by operating the capacitor to be tested under a second power-on test condition.

[0070] The power-on test conditions of the capacitor to be detected under the first temperature state are determined by the rated operating parameters of the capacitor to be detected and the preset detection rules corresponding to the capacitor to be detected. For example, if the rated operating voltage of the capacitor to be detected is not greater than 10V, the test voltage range of the capacitor to be detected is 0.9 to 1.1 times the rated operating voltage; if the rated operating voltage of the capacitor to be detected is 10 to 100V, the test voltage range of the capacitor to be detected is 85 to 115V; if the rated operating voltage of the capacitor to be detected is 100 to 500V, the test voltage range of the capacitor to be detected is 450 to 550V; the insulation resistance of the capacitor to be detected is determined according to the measured voltage.

[0071] For another example, if the performance parameters to be tested of the capacitor to be tested include capacitance, the rated capacitance of the capacitor to be tested is obtained, the test frequency is determined according to the rated capacitance, and then the actual capacitance of the capacitor to be tested is determined according to the test frequency. If the rated capacitance is less than 1nF, the measurement frequency is 1MHz; if the rated capacitance is 1nF~10μF, the measurement frequency is 1MHz; if the rated capacitance is not less than 10μF, the measurement frequency is 1MHz.

[0072] In the method provided in the above embodiment, the reliability of the capacitor to be detected is preliminarily judged by analyzing the normal temperature state and high temperature state of the capacitor to be detected in combination with the preset parameter standard. Then, the insulation performance of the barium titanate medium in the capacitor to be detected is analyzed based on the X-ray photoelectron spectrum of the capacitor to be detected, and the reliability of the capacitor to be detected is accurately determined, and the service life of the capacitor to be detected is quickly analyzed.

[0073] In one embodiment, the preset first power-on test condition includes a test temperature, a test voltage, a test duration, and a size of a current-limiting resistor in a test circuit;

[0074] Among them, the test temperature refers to the temperature of the working environment of the capacitor to be tested; the test voltage refers to the total voltage of the circuit where the capacitor to be tested is located; and the test time refers to the total time that the capacitor to be tested works at the test temperature.

[0075] The construction of the high-temperature test platform for the capacitor to be tested requires the determination of the first power-on test condition. In one embodiment, the upper limit operating temperature of the capacitor to be tested can be selected as the test temperature (second temperature), and the test voltage can be 1.5 times the rated working voltage of the capacitor to be tested; the capacitor to be tested is assembled on the test board, the positive and negative poles are led out at both ends of the capacitor to be tested, and the current limiting resistor is selected to be 100Ω~1kΩ. The capacitor to be tested is placed in a high-temperature box, the temperature is set to the test temperature, and the capacitor to be tested is powered by the test voltage, so that the capacitor to be tested runs in the high-temperature box for several hours. Then, according to the same detection method as the first test parameter, the capacitor to be tested after the high-temperature test is tested to obtain the second detection parameter.

[0076] In the method provided in the above embodiment, the reliability of the capacitor to be detected is preliminarily judged by analyzing the normal temperature state and high temperature state of the capacitor to be detected in combination with the preset parameter standard. Then, the insulation performance of the barium titanate medium in the capacitor to be detected is analyzed based on the X-ray photoelectron spectrum of the capacitor to be detected, and the reliability of the capacitor to be detected is accurately determined, and the service life of the capacitor to be detected is quickly analyzed.

[0077] In one embodiment, the first test parameter includes at least one of the following three parameters, which are capacitance, loss tangent and insulation resistance.

[0078] The above three parameters are three common performance parameters of capacitors. The size of the parameters is directly related to the performance of the capacitor. Capacitance refers to the storage of free charge of a capacitor under a given potential difference, which is a physical quantity that indicates the ability of a capacitor to hold charge. The loss tangent refers to the ratio of the active power P to the reactive power Q of a capacitor. Insulation resistance is used to indicate the leakage of a capacitor. Generally, small-capacity capacitors have large insulation resistance, and electrolytic capacitors of hundreds of megohms or thousands of megohms generally have small insulation resistance. Relatively speaking, the larger the insulation resistance, the better, and the smaller the leakage.

[0079] In the method provided in the above embodiment, by testing a variety of performance parameters, the reliability of the capacitor to be tested can be more comprehensively tested to ensure the accuracy of the reliability evaluation result.

[0080] In one embodiment, determining the reliability analysis result of the capacitor to be tested according to X-ray photoelectron spectroscopy includes:

[0081] Determine the maximum absorption peak position of the target orbit according to the X-ray photoelectron spectrum, the target orbit refers to the preset electron layer orbit of the titanium element in the barium titanate ceramic medium;

[0082] When the energy of the maximum absorption peak is not less than the preset energy, the reliable analysis result of the capacitor to be detected is determined to be the first reliability level. When the energy of the maximum absorption peak is less than the preset energy, the reliable analysis result of the capacitor to be detected is determined to be the second reliability level. The reliability of the capacitor represented by the first reliability level is greater than that of the second reliability level.

[0083] By subjecting the slice to be sliced ​​to X-ray irradiation, the X-ray photoelectron spectrum of the barium titanate medium inside the capacitor to be tested is obtained, and the valence state of the titanium element in the medium is analyzed. It is understandable that the energy of the photoelectrons emitted by titanium elements of different valence states will be different. In this example, the preset orbit of the outer electron layer of the titanium element is selected as the target orbit, such as the 2p orbit of the outer electron of Ti, and the maximum absorption peak position of the target orbit is determined. When the energy corresponding to the maximum absorption peak position is lower than 458.2eV, it means that there are reliability risks in the capacitor to be tested; when the energy corresponding to the maximum absorption peak position is not lower than 458.2eV, it means that the capacitor to be tested is reliable. For example, the test results show that after the test, the Ti2p orbit of the intermediate ceramic medium of the capacitor to be tested has strong absorption peaks at 458.08eV and 529.18eV, of which 458.08eV is less than 458.2eV, indicating that the Ti in the ceramic medium 4+There is a tendency for the electrons to be converted into low-valent ions, so it is determined that the capacitor to be tested has reliability risks and its anti-reduction performance is low.

[0084] In the method provided in the above embodiment, the insulation performance of the barium titanate medium in the capacitor to be detected is analyzed by analyzing the X-ray photoelectron spectrum of the capacitor to be detected, thereby accurately determining the reliability of the capacitor to be detected and quickly analyzing the service life of the capacitor to be detected. In addition, by analyzing the reliability of the capacitor to be detected under multiple conditions, the robustness and stability of the reliability analysis system of the capacitor to be detected are improved.

[0085] In one embodiment, the method further comprises:

[0086] When the first test parameter does not meet the first preset condition or the second test parameter does not meet the second preset condition, the reliability analysis result of the capacitor to be tested is determined to be the third reliability level, and the reliability of the capacitor represented by the second reliability level is greater than the third reliability level.

[0087] See also Figure 5 , a method flow chart for reliability analysis of barium titanate-based multilayer ceramic capacitors is provided, wherein the temperature before the test corresponds to the first temperature, the high temperature power-on corresponds to the second temperature, the first reliability level is reliable, the second reliability level is sub-reliable, and the third reliability level is unreliable.

[0088] It should be understood that, although the steps in the flowcharts involved in the above embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0089] Based on the same inventive concept, the embodiment of the present application also provides a reliability analysis device for a barium titanate-based multilayer ceramic capacitor for implementing the reliability analysis method for the barium titanate-based multilayer ceramic capacitor involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in the embodiments of one or more reliability analysis devices for barium titanate-based multilayer ceramic capacitors provided below can refer to the limitations of the reliability analysis method for barium titanate-based multilayer ceramic capacitors above, and will not be repeated here.

[0090] In one embodiment, Figure 6 As shown, a reliability analysis device for a barium titanate-based multilayer ceramic capacitor is provided, comprising: a first detection module 601, a second detection module 602, a packaging and slicing module 603 and a third detection module 604, wherein:

[0091] A first detection module 601 is used to determine a first test parameter of the capacitor to be detected at a first temperature according to the rated operating parameters of the capacitor to be detected, wherein the capacitor to be detected is a barium titanate-based multilayer ceramic capacitor;

[0092] The second detection module 602 is used to obtain a second test parameter of the capacitor to be detected at a second temperature by operating the capacitor to be detected under a preset first power-on test condition when the first test parameter satisfies a first preset condition, and the second temperature is greater than the first temperature;

[0093] The packaging and slicing module 603 is used to seal the capacitor to be tested and make slices when the second test parameter meets the second preset condition, and the slices are perpendicular to the inner electrodes of the capacitor to be tested;

[0094] The third detection module 604 is used to perform X-ray irradiation on the slice to obtain an X-ray photoelectron spectrum of the barium titanate ceramic dielectric region of the slice, and determine the reliability analysis result of the capacitor to be detected based on the X-ray photoelectron spectrum.

[0095] In one embodiment, the first detection module 601 is further used for:

[0096] Determine the second power-on test condition of the capacitor to be tested according to the rated operating parameters;

[0097] The first test parameter of the capacitor to be detected is obtained at the first temperature by making the capacitor to be detected operate under the second power-on test condition.

[0098] In one embodiment, the second detection module 602 is further used to determine that the preset first power-on test conditions include a test temperature, a test voltage, a test duration, and a size of a current-limiting resistor in a test circuit;

[0099] Among them, the test temperature refers to the temperature of the working environment of the capacitor to be tested; the test voltage refers to the total voltage of the circuit where the capacitor to be tested is located; and the test time refers to the total time that the capacitor to be tested works at the test temperature.

[0100] In one embodiment, the first detection module 601 is further used to determine that the first test parameter includes at least one of the following three parameters, where the following three parameters are capacitance, loss tangent, and insulation resistance.

[0101] In one embodiment, the third detection module 604 is further configured to:

[0102] Determine the maximum absorption peak position of the target orbit according to the X-ray photoelectron spectrum, the target orbit refers to the preset electron layer orbit of the titanium element in the barium titanate ceramic medium;

[0103] When the energy of the maximum absorption peak is not less than the preset energy, the reliable analysis result of the capacitor to be detected is determined to be the first reliability level. When the energy of the maximum absorption peak is less than the preset energy, the reliable analysis result of the capacitor to be detected is determined to be the second reliability level. The reliability of the capacitor represented by the first reliability level is greater than that of the second reliability level.

[0104] In one embodiment, the third detection module is further used for:

[0105] When the first test parameter does not meet the first preset condition or the second test parameter does not meet the second preset condition, the reliability analysis result of the capacitor to be tested is determined to be the third reliability level, and the reliability of the capacitor represented by the second reliability level is greater than the third reliability level.

[0106] Each module in the reliability analysis device of the barium titanate-based multilayer ceramic capacitor can be implemented in whole or in part by software, hardware, or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute operations corresponding to each module.

[0107] In one embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be as follows: Figure 7 As shown. The computer device includes a processor, a memory and a network interface connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store the working parameter data of the capacitor to be tested. The network interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a reliability analysis method for a barium titanate-based multilayer ceramic capacitor is implemented.

[0108] Those skilled in the art will understand that Figure 7The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0109] In one embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the following steps are implemented:

[0110] Determining a first test parameter of the capacitor to be tested at a first temperature according to the rated operating parameters of the capacitor to be tested, wherein the capacitor to be tested is a barium titanate-based multilayer ceramic capacitor;

[0111] When the first test parameter satisfies the first preset condition, by making the capacitor to be tested operate under the preset first power-on test condition, a second test parameter of the capacitor to be tested at a second temperature is obtained, and the second temperature is greater than the first temperature;

[0112] When the second test parameter satisfies the second preset condition, the capacitor to be tested is sealed and sliced, wherein the slice is perpendicular to the inner electrode of the capacitor to be tested;

[0113] The slice is irradiated with X-rays to obtain an X-ray photoelectron spectrum of the barium titanate ceramic dielectric region of the slice, and a reliability analysis result of the capacitor to be tested is determined based on the X-ray photoelectron spectrum.

[0114] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0115] Determine the second power-on test condition of the capacitor to be tested according to the rated operating parameters;

[0116] The first test parameter of the capacitor to be detected is obtained at the first temperature by making the capacitor to be detected operate under the second power-on test condition.

[0117] In one embodiment, when the processor executes the computer program, the following steps are further implemented: determining the preset first power-on test condition including the test temperature, the test voltage, the test duration, and the size of the current limiting resistor in the test circuit;

[0118] Among them, the test temperature refers to the temperature of the working environment of the capacitor to be tested; the test voltage refers to the total voltage of the circuit where the capacitor to be tested is located; and the test time refers to the total time that the capacitor to be tested works at the test temperature.

[0119] In one embodiment, when the processor executes the computer program, the following steps are further implemented: determining that the first test parameter includes at least one of the following three parameters, wherein the following three parameters are capacitance, loss tangent, and insulation resistance.

[0120] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0121] Determine the maximum absorption peak position of the target orbit according to the X-ray photoelectron spectrum, the target orbit refers to the preset electron layer orbit of the titanium element in the barium titanate ceramic medium;

[0122] When the energy of the maximum absorption peak is not less than the preset energy, the reliable analysis result of the capacitor to be detected is determined to be the first reliability level. When the energy of the maximum absorption peak is less than the preset energy, the reliable analysis result of the capacitor to be detected is determined to be the second reliability level. The reliability of the capacitor represented by the first reliability level is greater than that of the second reliability level.

[0123] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0124] When the first test parameter does not meet the first preset condition or the second test parameter does not meet the second preset condition, the reliability analysis result of the capacitor to be tested is determined to be the third reliability level, and the reliability of the capacitor represented by the second reliability level is greater than the third reliability level.

[0125] In one embodiment, a computer readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented:

[0126] Determining a first test parameter of the capacitor to be tested at a first temperature according to the rated operating parameters of the capacitor to be tested, wherein the capacitor to be tested is a barium titanate-based multilayer ceramic capacitor;

[0127] When the first test parameter satisfies the first preset condition, by making the capacitor to be tested operate under the preset first power-on test condition, a second test parameter of the capacitor to be tested at a second temperature is obtained, and the second temperature is greater than the first temperature;

[0128] When the second test parameter satisfies the second preset condition, the capacitor to be tested is sealed and sliced, wherein the slice is perpendicular to the inner electrode of the capacitor to be tested;

[0129] The slice is irradiated with X-rays to obtain an X-ray photoelectron spectrum of the barium titanate ceramic dielectric region of the slice, and a reliability analysis result of the capacitor to be tested is determined based on the X-ray photoelectron spectrum.

[0130] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0131] Determine the second power-on test condition of the capacitor to be tested according to the rated operating parameters;

[0132] The first test parameter of the capacitor to be detected is obtained at the first temperature by making the capacitor to be detected operate under the second power-on test condition.

[0133] In one embodiment, when the computer program is executed by the processor, the following steps are further implemented: determining the preset first power-on test condition including the test temperature, the test voltage, the test duration, and the size of the current limiting resistor in the test circuit;

[0134] Among them, the test temperature refers to the temperature of the working environment of the capacitor to be tested; the test voltage refers to the total voltage of the circuit where the capacitor to be tested is located; and the test time refers to the total time that the capacitor to be tested works at the test temperature.

[0135] In one embodiment, when the computer program is executed by the processor, the following steps are further implemented: determining that the first test parameter includes at least one of the following three parameters, wherein the following three parameters are capacitance, loss tangent and insulation resistance.

[0136] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0137] Determine the maximum absorption peak position of the target orbit according to the X-ray photoelectron spectrum, the target orbit refers to the preset electron layer orbit of the titanium element in the barium titanate ceramic medium;

[0138] When the energy of the maximum absorption peak is not less than the preset energy, the reliable analysis result of the capacitor to be detected is determined to be the first reliability level. When the energy of the maximum absorption peak is less than the preset energy, the reliable analysis result of the capacitor to be detected is determined to be the second reliability level. The reliability of the capacitor represented by the first reliability level is greater than that of the second reliability level.

[0139] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0140] When the first test parameter does not meet the first preset condition or the second test parameter does not meet the second preset condition, the reliability analysis result of the capacitor to be tested is determined to be the third reliability level, and the reliability of the capacitor represented by the second reliability level is greater than the third reliability level.

[0141] In one embodiment, a computer program product is provided, comprising a computer program, which, when executed by a processor, implements the following steps:

[0142] Determining a first test parameter of the capacitor to be tested at a first temperature according to the rated operating parameters of the capacitor to be tested, wherein the capacitor to be tested is a barium titanate-based multilayer ceramic capacitor;

[0143] When the first test parameter satisfies the first preset condition, by making the capacitor to be tested operate under the preset first power-on test condition, a second test parameter of the capacitor to be tested at a second temperature is obtained, and the second temperature is greater than the first temperature;

[0144] When the second test parameter satisfies the second preset condition, the capacitor to be tested is sealed and sliced, wherein the slice is perpendicular to the inner electrode of the capacitor to be tested;

[0145] The slice is irradiated with X-rays to obtain an X-ray photoelectron spectrum of the barium titanate ceramic dielectric region of the slice, and a reliability analysis result of the capacitor to be tested is determined based on the X-ray photoelectron spectrum.

[0146] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0147] Determine the second power-on test condition of the capacitor to be tested according to the rated operating parameters;

[0148] The first test parameter of the capacitor to be detected is obtained at the first temperature by making the capacitor to be detected operate under the second power-on test condition.

[0149] In one embodiment, when the computer program is executed by the processor, the following steps are further implemented: determining the preset first power-on test condition including the test temperature, the test voltage, the test duration, and the size of the current limiting resistor in the test circuit;

[0150] Among them, the test temperature refers to the temperature of the working environment of the capacitor to be tested; the test voltage refers to the total voltage of the circuit where the capacitor to be tested is located; and the test time refers to the total time that the capacitor to be tested works at the test temperature.

[0151] In one embodiment, when the computer program is executed by the processor, the following steps are further implemented: determining that the first test parameter includes at least one of the following three parameters, wherein the following three parameters are capacitance, loss tangent and insulation resistance.

[0152] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0153] Determine the maximum absorption peak position of the target orbit according to the X-ray photoelectron spectrum, the target orbit refers to the preset electron layer orbit of the titanium element in the barium titanate ceramic medium;

[0154] When the energy of the maximum absorption peak is not less than the preset energy, the reliable analysis result of the capacitor to be detected is determined to be the first reliability level. When the energy of the maximum absorption peak is less than the preset energy, the reliable analysis result of the capacitor to be detected is determined to be the second reliability level. The reliability of the capacitor represented by the first reliability level is greater than that of the second reliability level.

[0155] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0156] When the first test parameter does not meet the first preset condition or the second test parameter does not meet the second preset condition, the reliability analysis result of the capacitor to be tested is determined to be the third reliability level, and the reliability of the capacitor represented by the second reliability level is greater than the third reliability level.

[0157] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties.

[0158] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0159] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0160] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A reliability analysis method for a barium titanate-based multilayer ceramic capacitor, characterized in that: The method comprises: Determining a first test parameter of the capacitor to be detected at a first temperature according to the rated operating parameters of the capacitor to be detected, wherein the capacitor to be detected is a barium titanate-based multilayer ceramic capacitor; When the first test parameter satisfies a first preset condition, by making the capacitor to be detected operate under a preset first power-on test condition, a second test parameter of the capacitor to be detected at a second temperature is obtained, and the second temperature is greater than the first temperature; When the second test parameter satisfies the second preset condition, the capacitor to be tested is sealed and sliced, wherein the slice is perpendicular to the inner electrode of the capacitor to be tested; Exposing the slice to X-rays to obtain an X-ray photoelectron spectrum of a barium titanate ceramic dielectric region of the slice, and determining a reliability analysis result of the capacitor to be tested based on the X-ray photoelectron spectrum; Determining a first test parameter of the capacitor to be detected at a first temperature according to the rated operating parameter of the capacitor to be detected includes: Determining a second power-on test condition of the capacitor to be tested according to the rated operating parameters; Acquire a first test parameter of the capacitor to be detected at a first temperature by operating the capacitor to be detected under the second power-on test condition; The preset first power-on test condition includes the test temperature, the test voltage, the test duration, and the size of the current limiting resistor in the test circuit; Among them, the test temperature refers to the temperature of the working environment of the capacitor to be tested; the test voltage refers to the total voltage of the circuit where the capacitor to be tested is located; and the test duration refers to the total duration that the capacitor to be tested works at the test temperature.

2. The method according to claim 1, characterized in that The first test parameter includes at least one of the following three parameters, and the following three parameters are capacitance, loss tangent and insulation resistance.

3. The method according to claim 1, characterized in that Determining the reliability analysis result of the capacitor to be tested according to the X-ray photoelectron spectrum includes: Determine the maximum absorption peak position of the target orbit according to the X-ray photoelectron spectrum, wherein the target orbit refers to the preset electron layer orbit of the titanium element in the barium titanate ceramic medium; When the energy of the maximum absorption peak is not less than the preset energy, the reliable analysis result of the capacitor to be detected is determined to be a first reliability level. When the energy of the maximum absorption peak is less than the preset energy, the reliable analysis result of the capacitor to be detected is determined to be a second reliability level. The reliability of the capacitor represented by the first reliability level is greater than that of the second reliability level.

4. The method according to claim 3, characterized in that The method further comprises: When the first test parameter does not meet the first preset condition or the second test parameter does not meet the second preset condition, the reliability analysis result of the capacitor to be tested is determined to be a third reliability level, and the reliability of the capacitor represented by the second reliability level is greater than the third reliability level.

5. A reliability analysis device for a barium titanate-based multilayer ceramic capacitor, characterized in that: The device comprises: A first detection module, used to determine a first test parameter of the capacitor to be detected at a first temperature according to a rated operating parameter of the capacitor to be detected, wherein the capacitor to be detected is a barium titanate-based multilayer ceramic capacitor; A second detection module is used for obtaining a second test parameter of the capacitor to be detected at a second temperature by making the capacitor to be detected operate under a preset first power-on test condition when the first test parameter satisfies a first preset condition, wherein the second temperature is greater than the first temperature; A packaging and slicing module, used for sealing the capacitor to be tested and making slices when the second test parameter meets the second preset condition, wherein the slices are perpendicular to the inner electrodes of the capacitor to be tested; A third detection module is used to perform X-ray irradiation on the slice to obtain an X-ray photoelectron spectrum of the barium titanate ceramic dielectric region of the slice, and determine a reliability analysis result of the capacitor to be detected according to the X-ray photoelectron spectrum; The first detection module is further used to determine a second power-on test condition of the capacitor to be detected according to the rated operating parameters; and obtain a first test parameter of the capacitor to be detected at a first temperature by making the capacitor to be detected operate under the second power-on test condition; The preset first power-on test condition includes the test temperature, the test voltage, the test duration, and the size of the current limiting resistor in the test circuit; Among them, the test temperature refers to the temperature of the working environment of the capacitor to be tested; the test voltage refers to the total voltage of the circuit where the capacitor to be tested is located; and the test duration refers to the total duration that the capacitor to be tested works at the test temperature.

6. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 4 are implemented.

7. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 4 are implemented.

8. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 4 are implemented.

Images