A motherboard testing device

Abstract

The present invention discloses a mainboard testing device, which relates to the mainboard testing technology field, including a testing machine, wherein a base structure is arranged on the right side of the top of the testing machine, an external bearing mechanism is fixedly arranged on the top of the base structure, a top plate structure is arranged directly above the external bearing mechanism, a hydraulic cylinder is connected to the top of the top plate structure, a driving mechanism is arranged on the left side of the top of the testing machine, an elastic lifting mechanism is arranged on the outside of the driving mechanism, and a double limiting mechanism is arranged on the left side of the elastic lifting mechanism. The present invention can complete the positioning of the mainboard outside the device, thereby effectively shortening the lifting height of the top plate structure and reducing the time required for the lifting of the top plate structure. At the same time, when outputting the mainboard that has completed the test, it can also synchronously drive the mainboard to be tested into the device, effectively shortening the equipment downtime, improving the mainboard testing efficiency, and being more suitable for industrial production.

Description

Technical Field

[0001] The present invention relates to the technical field of mainboard testing, and in particular to a mainboard testing device. Background Art

[0002] Motherboard testing mainly detects various errors on printed circuit boards, such as open circuits, short circuits, and incorrect parts. It combines the error signal data generated by the test machine with the wiring data generated by the computer-aided design of the circuit board to be tested, allowing maintenance personnel to quickly find the cause of the defect on the tested circuit board on the screen, thereby saving time in repairing defective products.

[0003] The invention patent with patent application publication number CN 1189821 C discloses a motherboard testing device, which includes a testing device fixing seat and a pneumatic pressing structure; wherein the testing device fixing seat is provided with a top plate structure and a base structure electrically connected to each other, the upper surface of the base structure is provided with a plurality of slots, and the pressing structure is provided with a plurality of probes, the probes are electrically connected to the wiring of the testing machine, and the probes can contact the slots of the testing device fixing seat at appropriate times.

[0004] After putting the above-mentioned device into practical use, technicians skilled in the art found that when testing the motherboard to be tested, the technician first needs to place the motherboard into the positioning groove on the top of the carrier board, then lower the top plate structure to contact the motherboard, and press down the motherboard. After the test is completed, the user needs to reset the top plate structure, then manually take the motherboard out of the positioning groove, and then re-place a new motherboard to be tested and repeat the above-mentioned operation.

[0005] In the above process, due to the size limitation of the positioning slot, the user needs to manually calibrate before the motherboard to be tested can be placed. During the calibration process, the equipment needs to be shut down continuously, so the long calibration time directly leads to a decrease in the motherboard test efficiency.

[0006] At the same time, in order to facilitate the user to calibrate the motherboard to be tested, it is also necessary to keep a sufficient distance between the top plate structure and the base structure to facilitate user operation. This will also extend the time required for the top plate structure to be raised and lowered, which again reduces the motherboard testing efficiency.

[0007] Therefore, it is necessary to invent a motherboard testing device to solve the above problems. Summary of the invention

[0008] The object of the present invention is to provide a motherboard testing device to solve the problems raised in the above background technology.

[0009] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a motherboard testing device, comprising a testing machine, a base structure is arranged on the right side of the top of the testing machine, an external bearing mechanism is fixedly arranged on the top of the base structure, a top plate structure is arranged directly above the external bearing mechanism, a hydraulic cylinder is connected to the top of the top plate structure, a driving mechanism is arranged on the left side of the top of the testing machine, an elastic lifting mechanism is arranged on the outside of the driving mechanism, a double limit mechanism is arranged on the left side of the elastic lifting mechanism, and both sides of the driving mechanism are connected to the internal bearing mechanism;

[0010] The torsion spring in the driving mechanism drives the driving plate in the driving mechanism to rotate, the first annular sleeve in the elastic lifting mechanism drives the driving plate in the driving mechanism to lift, the transverse limiting block in the double limiting mechanism limits the longitudinal limiting block in the elastic lifting mechanism, and the driving plate in the driving mechanism drives the main board inside the positioning frame in the inner bearing mechanism to rotate and lift;

[0011] The driving mechanism comprises a driving motor, a rotating shaft, an end plate, a torsion spring and a driving plate;

[0012] The driving motor is fixedly arranged inside the test machine, the rotating shaft is located at the top of the test machine and is drivingly connected to the driving motor, a reciprocating thread is arranged on the outer side of the rotating shaft, the end plate is fixedly arranged on the top of the rotating shaft, the torsion spring is sleeved on the outer side of the rotating shaft, the driving plate is slidingly sleeved on the outer side of the rotating shaft, one end of the torsion spring is fixedly connected to the end plate and the other end is fixedly connected to the driving plate;

[0013] The elastic lifting mechanism comprises a first annular sleeve, a second annular sleeve, a longitudinal limit block, a telescopic rod, a first spring, a third annular sleeve and a lifting sleeve plate;

[0014] The double limiting mechanism comprises a side plate, a limiting sleeve plate, a transverse limiting block, a connecting plate and a second spring;

[0015] The inner bearing mechanism comprises an extension rod, a positioning frame and a limiting frame;

[0016] The extension rod is fixedly arranged on the side of the driving plate, the positioning frame is fixedly arranged on the end of the extension rod, and the limit frame is fixedly arranged on the inner bottom of the positioning frame.

[0017] Preferably, the external bearing mechanism includes a bearing plate, a test slot and an avoidance slot;

[0018] The bearing plate is fixedly arranged on the top of the base structure, the test slot is opened on the right side of the top of the bearing plate, and the avoidance slot is opened on the left side of the top of the bearing plate and is communicated with the test slot.

[0019] Preferably, the first annular sleeve is fixedly arranged at the bottom of the driving plate, the second annular sleeve is rotatably connected to the inner side of the first annular sleeve through a bearing, the longitudinal limit block is fixedly arranged on the left side of the second annular sleeve, a plurality of the telescopic rods and the first spring are provided, a plurality of the telescopic rods are evenly and fixedly connected to the bottom of the second annular sleeve, a plurality of the first springs are respectively sleeved on the outside of a plurality of telescopic rods, the third annular sleeve is fixedly connected to the bottom ends of the plurality of telescopic rods, the lifting sleeve is fixedly arranged at the bottom of the third annular sleeve, and is sleeved on the outside of the rotating shaft, and is transmission-connected to the rotating shaft through a reciprocating thread.

[0020] Preferably, the side panel is fixedly arranged on the top of the testing machine, the limit sleeve is slidably sleeved on the outside of the side panel and fixedly connected to the lifting sleeve, the transverse limit block is slidably penetrated and arranged on the top of the side surface of the side panel, the connecting plate is fixedly arranged on the left end of the transverse limit block, the second spring is sleeved on the outside of the transverse limit block, one end of the second spring is fixedly connected to the side panel and the other end is fixedly connected to the connecting plate.

[0021] The present invention also provides a testing method for a motherboard testing device, which specifically comprises the following steps:

[0022] S1. Place the main board to be tested into the inner side of the left positioning frame. The positioning frame positions the main board to be tested. The limit frame inside the positioning frame blocks the main board to be tested, so that the driving motor drives the rotating shaft to rotate. When the rotating shaft rotates, the driving plate is driven to rotate through the end plate and the torsion spring. Since the right positioning frame is located inside the test slot and is limited, the driving plate cannot rotate. The force generated by the rotation acts on the torsion spring, causing the torsion spring to deform.

[0023] S2, during the rotation of the rotating shaft, the lifting sleeve plate limited by the limiting sleeve plate is driven to rise, and when the lifting sleeve plate rises, the driving plate is driven to rise through the third annular sleeve, the first spring, the telescopic rod, the second annular sleeve and the first annular sleeve. When the driving plate rises, the deformed torsion spring is compressed. When the lifting sleeve plate moves to the top of the reciprocating thread, the driving plate drives the right positioning frame to move out of the inner side of the test slot through the right extension rod;

[0024] S3, after the right positioning frame is moved out from the inside of the test slot, the deformed torsion spring drives the driving plate to rotate, and then drives the two positioning frames to rotate respectively through the two extension rods. At this time, the longitudinal limit block is driven by the second annular sleeve to move to the top of the transverse limit block and fits with the transverse limit block. At this time, the transverse limit block forms a limit on the longitudinal limit block;

[0025] S4. During the subsequent rotation of the rotating shaft, the lifting sleeve begins to descend along the reciprocating thread. Since the lateral limit block limits the longitudinal limit block at this time, the second annular sleeve cannot descend synchronously with the lifting sleeve. The lifting sleeve stretches the first spring through the third annular sleeve.

[0026] S5. When the lifting sleeve moves to the bottom of the reciprocating thread, the pulling force generated by the first spring on the second annular sleeve is greater than the resistance formed by the lateral limit block on the longitudinal limit block, and the lateral limit block moves to the left and stretches the second spring through the connecting plate, thereby releasing the limit on the longitudinal limit block. At this time, the first spring drives the driving plate to descend through the second annular sleeve and the first annular sleeve, and the driving plate drives the positioning frame to enter the inner side of the test slot through the extension rod, and the main board to be tested enters the inner side of the test slot synchronously with the positioning frame;

[0027] S6, the hydraulic cylinder drives the top plate structure to descend, and after the top plate structure descends, it presses the main board to be tested, and the probe at the bottom of the top plate structure contacts the corresponding point on the main board to be tested, and then the computer host connected to the top plate structure detects whether the main board to be tested has an open circuit, a short circuit, and whether the solder joints are intact;

[0028] S7. During the testing process, a new host board to be tested is placed inside the current left positioning frame. After the previous host board to be tested is tested, the hydraulic cylinder drives the top plate structure to rise, and then the above operation is repeated to output the tested host board and input the current host board to be tested.

[0029] Technical effects and advantages of the present invention:

[0030] The present invention is provided with a driving mechanism, an elastic lifting mechanism, a double limiting mechanism and two internal bearing mechanisms, so that the two internal bearing mechanisms can be used to carry the two main boards to be tested, and the main board positioning operation can be completed outside the device, and the driving mechanism is used to drive the elastic lifting mechanism and the internal bearing mechanism at the same time, so that the internal bearing mechanism can be lifted and lowered while rotating, and the double limiting mechanism is used to limit the elastic lifting mechanism, so that the internal bearing mechanism can be directly lowered to the inside of the test slot after moving to the top of the test slot, so as to avoid the internal bearing mechanism causing scratches on the top of the bearing plate. Compared with the same type of device in the prior art, the present invention can complete the positioning of the main board outside the device, thereby effectively shortening the lifting height of the top plate structure and reducing the time required for lifting the top plate structure. At the same time, when the main board that has completed the test is output, the main board to be tested can also be driven into the device synchronously, which effectively shortens the equipment downtime, improves the main board testing efficiency, and is more suitable for industrial production. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] Figure 1It is a schematic diagram of the overall front view structure of the present invention.

[0032] Figure 2 It is a front cross-sectional structural schematic diagram of the outer bearing mechanism and the inner bearing mechanism of the present invention.

[0033] Figure 3 It is a front cross-sectional structural schematic diagram of the driving mechanism of the present invention.

[0034] Figure 4 It is a front cross-sectional structural schematic diagram of the elastic lifting mechanism of the present invention.

[0035] In the figure: 1. test machine; 2. base structure; 3. external bearing mechanism; 31. bearing plate; 32. test slot; 33. avoidance slot; 4. top plate structure; 5. hydraulic cylinder; 6. driving mechanism; 61. driving motor; 62. rotating shaft; 63. end plate; 64. torsion spring; 65. driving plate; 7. elastic lifting mechanism; 71. first annular sleeve; 72. second annular sleeve; 73. longitudinal limit block; 74. telescopic rod; 75. first spring; 76. third annular sleeve; 77. lifting sleeve; 8. double limit mechanism; 81. side plate; 82. limit sleeve; 83. transverse limit block; 84. connecting plate; 85. second spring; 9. internal bearing mechanism; 91. extension rod; 92. positioning frame; 93. limit frame. DETAILED DESCRIPTION

[0036] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0037] Example 1

[0038] The present invention provides Figure 1-4 A mainboard testing device shown in the figure comprises a testing machine 1, a base structure 2 is arranged on the right side of the top of the testing machine 1, an external bearing mechanism 3 is fixedly arranged on the top of the base structure 2, a top plate structure 4 is arranged just above the external bearing mechanism 3, a hydraulic cylinder 5 is connected to the top of the top plate structure 4, a driving mechanism 6 is arranged on the left side of the top of the testing machine 1, an elastic lifting mechanism 7 is arranged on the outside of the driving mechanism 6, a double limiting mechanism 8 is arranged on the left side of the elastic lifting mechanism 7, and both sides of the driving mechanism 6 are connected to internal bearing mechanisms 9;

[0039] The torsion spring 64 in the driving mechanism 6 drives the driving plate 65 in the driving mechanism 6 to rotate, the first annular sleeve 71 in the elastic lifting mechanism 7 drives the driving plate 65 in the driving mechanism 6 to rise and fall, the transverse limit block 83 in the double limit mechanism 8 limits the longitudinal limit block 73 in the elastic lifting mechanism 7, and the driving plate 65 in the driving mechanism 6 drives the main board inside the positioning frame 92 in the inner bearing mechanism 9 to rotate and rise and fall.

[0040] It should also be noted that the above-mentioned base structure 2 and top plate structure 4 are structures that have been disclosed in the prior art and are not essential technical features of the present application, so the present application will not elaborate on their specific structures.

[0041] like Figure 2 As shown, the external bearing mechanism 3 includes a bearing plate 31, a test slot 32 and an avoidance slot 33, wherein the bearing plate 31 is fixedly arranged on the top of the base structure 2, the test slot 32 is opened on the right side of the top of the bearing plate 31, and the avoidance slot 33 is opened on the left side of the top of the bearing plate 31 and is connected to the test slot 32.

[0042] like Figure 2 and Figure 3 As shown, the driving mechanism 6 includes a driving motor 61, a rotating shaft 62, an end plate 63, a torsion spring 64 and a driving plate 65, wherein the driving motor 61 is fixedly arranged inside the test machine 1, the rotating shaft 62 is located at the top of the test machine 1, and is transmission-connected to the driving motor 61, a reciprocating thread is arranged on the outer side of the rotating shaft 62, the end plate 63 is fixedly arranged on the top of the rotating shaft 62, the torsion spring 64 is sleeved on the outer side of the rotating shaft 62, the driving plate 65 is slidingly sleeved on the outer side of the rotating shaft 62, one end of the torsion spring 64 is fixedly connected to the end plate 63, and the other end is fixedly connected to the driving plate 65.

[0043] By setting the above structure, the driving motor 61 drives the end plate 63 to rotate through the rotating shaft 62, and the end plate 63 drives the driving plate 65 to rotate through the torsion spring 64. When the driving plate 65 is limited, the torsion spring 64 is deformed by the force during the rotation of the rotating shaft 62.

[0044] like Figure 3 and Figure 4As shown, the elastic lifting mechanism 7 includes a first annular sleeve 71, a second annular sleeve 72, a longitudinal limit block 73, a telescopic rod 74, a first spring 75, a third annular sleeve 76 and a lifting sleeve 77, wherein the first annular sleeve 71 is fixedly arranged at the bottom of the driving plate 65, the second annular sleeve 72 is rotatably connected to the inner side of the first annular sleeve 71 through a bearing, the longitudinal limit block 73 is fixedly arranged on the left side of the second annular sleeve 72, a plurality of the telescopic rods 74 and the first spring 75 are provided, a plurality of the telescopic rods 74 are evenly fixedly connected to the bottom of the second annular sleeve 72, a plurality of the first springs 75 are respectively sleeved on the outside of a plurality of telescopic rods 74, the third annular sleeve 76 is fixedly connected to the bottom ends of the plurality of telescopic rods 74, the lifting sleeve 77 is fixedly arranged at the bottom of the third annular sleeve 76, and is sleeved on the outside of the rotating shaft 62, and is transmission-connected to the rotating shaft 62 through a reciprocating thread.

[0045] By setting the above structure, when the lifting sleeve 77 is lifted or lowered, the driving plate 65 is driven to lift or lower through the third annular sleeve 76, the first spring 75, the second annular sleeve 72 and the first annular sleeve 71. It is noted that since the first annular sleeve 71 is connected to the second annular sleeve 72 through a bearing, the driving plate 65 can be prevented from affecting the lifting sleeve 77 in a rotating state.

[0046] like Figure 3 and Figure 4 As shown, the double limit mechanism 8 includes a side plate 81, a limit sleeve 82, a transverse limit block 83, a connecting plate 84 and a second spring 85, wherein the side plate 81 is fixedly arranged on the top of the test machine 1, the limit sleeve 82 is slidably sleeved on the outside of the side plate 81, and is fixedly connected to the lifting sleeve 77, the transverse limit block 83 is slidably penetrated and arranged on the top of the side of the side plate 81, the connecting plate 84 is fixedly arranged on the left end of the transverse limit block 83, the second spring 85 is sleeved on the outside of the transverse limit block 83, one end of the second spring 85 is fixedly connected to the side plate 81 and the other end is fixedly connected to the connecting plate 84.

[0047] By setting the above structure, the transverse limit block 83 can block the longitudinal limit block 73, thereby preventing the longitudinal limit block 73 from descending. When the force exerted by the longitudinal limit block 73 on the transverse limit block 83 reaches a threshold, the transverse limit block 83 drives the connecting plate 84 to move left, thereby extending the second spring 85. At this time, the transverse limit block 83 releases the limit on the longitudinal limit block 73.

[0048] like Figure 2As shown, the inner supporting mechanism 9 includes an extension rod 91, a positioning frame 92 and a limit frame 93, wherein the extension rod 91 is fixedly arranged on the side of the driving plate 65, the positioning frame 92 is fixedly arranged on the end of the extension rod 91, and the limit frame 93 is fixedly arranged on the inner bottom of the positioning frame 92.

[0049] By setting the above structure, the extension rod 91 can drive the positioning frame 92 to rotate or rise and fall synchronously. At the same time, the positioning frame 92 positions the motherboard to be tested, and the limit frame 93 blocks the motherboard to be tested located inside the positioning frame 92 to prevent the motherboard to be tested from escaping from the inside of the positioning frame 92.

[0050] Example 2

[0051] The present invention also provides a testing method for a motherboard testing device, which specifically comprises the following steps:

[0052] S1. Put the main board to be tested into the inner side of the left positioning frame. The positioning frame 92 positions the main board to be tested. The limit frame 93 inside the positioning frame 92 blocks the main board to be tested, so that the driving motor 61 drives the rotating shaft 62 to rotate. When the rotating shaft 62 rotates, the driving plate 65 is driven to rotate through the end plate 63 and the torsion spring 64. Since the right positioning frame is located inside the test slot 32 and is limited, the driving plate 65 cannot rotate. The force generated by the rotation acts on the torsion spring 64, causing the torsion spring 64 to deform.

[0053] S2. During the rotation of the rotating shaft 62, the lifting sleeve 77 limited by the limiting sleeve 82 is driven to rise. When the lifting sleeve 77 rises, the driving plate 65 is driven to rise through the third annular sleeve 76, the first spring 75, the telescopic rod 74, the second annular sleeve 72 and the first annular sleeve 71. When the driving plate 65 rises, the deformed torsion spring 64 is compressed. When the lifting sleeve 77 moves to the top of the reciprocating thread, the driving plate 65 drives the right positioning frame to move out of the inner side of the test slot 32 through the right extension rod 91.

[0054] S3, after the right positioning frame is moved out from the inner side of the test slot 32, the deformed torsion spring 64 drives the driving plate 65 to rotate, and then drives the two positioning frames 92 to rotate respectively through the two extension rods 91. At this time, the longitudinal limit block 73 is driven by the second annular sleeve 72 to move to the top of the transverse limit block 83 and fits with the transverse limit block 83. At this time, the transverse limit block 83 forms a limit on the longitudinal limit block 73;

[0055] S4. During the subsequent rotation of the rotating shaft 62, the lifting sleeve 77 begins to descend along the reciprocating thread. Since the transverse limit block 83 limits the longitudinal limit block 73 at this time, the second annular sleeve 72 cannot be synchronously descended with the lifting sleeve 77. The lifting sleeve 77 stretches the first spring 75 through the third annular sleeve 76.

[0056] S5. When the lifting sleeve 77 moves to the bottom of the reciprocating thread, the pulling force generated by the first spring 75 on the second annular sleeve 72 is greater than the resistance formed by the lateral limit block 83 on the longitudinal limit block 73, and the lateral limit block 83 moves to the left and stretches the second spring 85 through the connecting plate 84, thereby releasing the limit on the longitudinal limit block 73. At this time, the first spring 75 drives the driving plate 65 to descend through the second annular sleeve 72 and the first annular sleeve 71, and the driving plate 65 drives the positioning frame 92 to enter the inner side of the test slot 32 through the extension rod 91, and the main board to be tested enters the inner side of the test slot 32 synchronously with the positioning frame 92;

[0057] S6, the hydraulic cylinder 5 drives the top plate structure 4 to descend, and after the top plate structure 4 descends, it presses the main board to be tested, and the probe at the bottom of the top plate structure 4 contacts the corresponding point on the main board to be tested, and then the computer host connected to the top plate structure 4 detects whether the main board to be tested has an open circuit, a short circuit, and a solder joint is intact;

[0058] S7. During the testing process, a new main board to be tested is placed inside the current left positioning frame. After the previous main board to be tested is tested, the hydraulic cylinder 5 drives the top plate structure 4 to rise, and then the above operation is repeated to output the main board after the test, and at the same time input the current main board to be tested.

[0059] Finally, it should be noted that the above is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, it is still possible for those skilled in the art to modify the technical solutions described in the aforementioned embodiments or to make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A motherboard testing device, comprising a testing machine (1), wherein a base structure (2) is arranged on the right side of the top of the testing machine (1), an external bearing mechanism (3) is fixedly arranged on the top of the base structure (2), a top plate structure (4) is arranged directly above the external bearing mechanism (3), and a hydraulic cylinder (5) is connected to the top of the top plate structure (4), characterized in that: A driving mechanism (6) is arranged on the left side of the top of the testing machine (1); an elastic lifting mechanism (7) is arranged on the outside of the driving mechanism (6); a double limiting mechanism (8) is arranged on the left side of the elastic lifting mechanism (7); and both sides of the driving mechanism (6) are connected to an internal bearing mechanism (9); The torsion spring (64) in the driving mechanism (6) drives the driving plate (65) in the driving mechanism (6) to rotate, the first annular sleeve (71) in the elastic lifting mechanism (7) drives the driving plate (65) in the driving mechanism (6) to rise and fall, the transverse limiting block (83) in the double limiting mechanism (8) limits the longitudinal limiting block (73) in the elastic lifting mechanism (7), and the driving plate (65) in the driving mechanism (6) drives the main board inside the positioning frame (92) in the inner bearing mechanism (9) to rotate and rise and fall; The driving mechanism (6) comprises a driving motor (61), a rotating shaft (62), an end plate (63), a torsion spring (64) and a driving plate (65); The driving motor (61) is fixedly arranged inside the test machine (1); the rotating shaft (62) is located at the top of the test machine (1) and is drivingly connected to the driving motor (61); a reciprocating thread is arranged on the outside of the rotating shaft (62); the end plate (63) is fixedly arranged on the top of the rotating shaft (62); the torsion spring (64) is sleeved on the outside of the rotating shaft (62); the driving plate (65) is slidably sleeved on the outside of the rotating shaft (62); one end of the torsion spring (64) is fixedly connected to the end plate (63) and the other end is fixedly connected to the driving plate (65); The elastic lifting mechanism (7) comprises a first annular sleeve (71), a second annular sleeve (72), a longitudinal limit block (73), a telescopic rod (74), a first spring (75), a third annular sleeve (76) and a lifting sleeve plate (77); The double limiting mechanism (8) comprises a side plate (81), a limiting sleeve plate (82), a transverse limiting block (83), a connecting plate (84) and a second spring (85); The inner bearing mechanism (9) comprises an extension rod (91), a positioning frame (92) and a limiting frame (93); The extension rod (91) is fixedly arranged on the side of the driving plate (65), the positioning frame (92) is fixedly arranged on the end of the extension rod (91), and the limiting frame (93) is fixedly arranged on the inner bottom of the positioning frame (92).

2. A motherboard testing device according to claim 1, characterized in that: The external bearing mechanism (3) comprises a bearing plate (31), a test slot (32) and an avoidance slot (33); The bearing plate (31) is fixedly arranged on the top of the base structure (2), the test slot (32) is opened on the right side of the top of the bearing plate (31), and the avoidance slot (33) is opened on the left side of the top of the bearing plate (31) and is connected to the test slot (32).

3. A motherboard testing device according to claim 2, characterized in that: The first annular sleeve (71) is fixedly arranged at the bottom of the driving plate (65); the second annular sleeve (72) is rotatably connected to the inner side of the first annular sleeve (71) via a bearing; the longitudinal limit block (73) is fixedly arranged at the left side of the second annular sleeve (72); a plurality of telescopic rods (74) and a plurality of first springs (75) are provided; the plurality of telescopic rods (74) are evenly fixedly connected to the bottom of the second annular sleeve (72); the plurality of first springs (75) are respectively sleeved on the outside of the plurality of telescopic rods (74); the third annular sleeve (76) is fixedly connected to the bottom ends of the plurality of telescopic rods (74); the lifting sleeve (77) is fixedly arranged at the bottom of the third annular sleeve (76), sleeved on the outside of the rotating shaft (62), and is transmission-connected to the rotating shaft (62) via a reciprocating thread.

4. A motherboard testing device according to claim 3, characterized in that: The side plate (81) is fixedly arranged on the top of the test machine (1); the limit sleeve (82) is slidably sleeved on the outside of the side plate (81) and fixedly connected to the lifting sleeve (77); the transverse limit block (83) is slidably penetrated and arranged on the top of the side of the side plate (81); the connecting plate (84) is fixedly arranged on the left end of the transverse limit block (83); the second spring (85) is sleeved on the outside of the transverse limit block (83); one end of the second spring (85) is fixedly connected to the side plate (81) and the other end is fixedly connected to the connecting plate (84).

5. A testing method for a motherboard testing device according to any one of claims 1 to 4, characterized in that: The specific steps include: S1, placing the main board to be tested into the inner side of the left positioning frame, the positioning frame (92) positions the main board to be tested, and the limiting frame (93) inside the positioning frame (92) blocks the main board to be tested, so that the driving motor (61) drives the rotating shaft (62) to rotate, and when the rotating shaft (62) rotates, the driving plate (65) is driven to rotate through the end plate (63) and the torsion spring (64). At this time, because the right positioning frame is located inside the test slot (32) and is limited, the driving plate (65) cannot rotate, and the force generated by the rotation acts on the torsion spring (64), causing the torsion spring (64) to deform; S2, during the rotation of the rotating shaft (62), the lifting sleeve (77) limited by the limiting sleeve (82) is driven to rise. When the lifting sleeve (77) rises, the driving plate (65) is driven to rise through the third annular sleeve (76), the first spring (75), the telescopic rod (74), the second annular sleeve (72) and the first annular sleeve (71). When the driving plate (65) rises, the deformed torsion spring (64) is compressed. When the lifting sleeve (77) moves to the top of the reciprocating thread, the driving plate (65) drives the right positioning frame to move out from the inside of the test slot (32) through the right extension rod (91); S3, after the right positioning frame is moved out from the inner side of the test slot (32), the deformed torsion spring (64) drives the driving plate (65) to rotate, and then drives the two positioning frames (92) to rotate respectively through the two extension rods (91). At this time, the longitudinal limit block (73) is driven by the second annular sleeve (72) to move to the top of the transverse limit block (83) and fits with the transverse limit block (83). At this time, the transverse limit block (83) forms a limit on the longitudinal limit block (73); S4. During the subsequent rotation of the rotating shaft (62), the lifting sleeve (77) begins to descend along the reciprocating thread. Since the transverse limit block (83) limits the longitudinal limit block (73), the second annular sleeve (72) cannot descend synchronously with the lifting sleeve (77). The lifting sleeve (77) stretches the first spring (75) through the third annular sleeve (76); S5. When the lifting sleeve (77) moves to the bottom of the reciprocating thread, the pulling force generated by the first spring (75) on the second annular sleeve (72) is greater than the resistance formed by the lateral limit block (83) on the longitudinal limit block (73), and the lateral limit block (83) moves to the left and stretches the second spring (85) through the connecting plate (84), thereby releasing the limit on the longitudinal limit block (73). At this time, the first spring (75) drives the driving plate (65) to descend through the second annular sleeve (72) and the first annular sleeve (71), and the driving plate (65) drives the positioning frame (92) to enter the inner side of the test slot (32) through the extension rod (91), and the main board to be tested enters the inner side of the test slot (32) synchronously with the positioning frame (92); S6, the hydraulic cylinder (5) drives the top plate structure (4) to descend, and after the top plate structure (4) descends, it presses the main board to be tested, and the probe at the bottom of the top plate structure (4) contacts the corresponding point on the main board to be tested, and then the computer host connected to the top plate structure (4) detects whether the main board to be tested has an open circuit, a short circuit, and whether the solder joints are intact; S7. During the testing process, a new main board to be tested is placed inside the current left positioning frame. After the previous main board to be tested is tested, the hydraulic cylinder (5) drives the top plate structure (4) to rise, and then the above operation is repeated, thereby outputting the main board after the test, and inputting the current main board to be tested.

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