Electronic device, test system, and test method

Abstract

Embodiments of the present application relate to an electronic device, a test system and a test method. The electronic device comprises: a radio frequency device configured with a first test port for transmitting a first radio frequency signal; a circuit board assembly, one end of the circuit board assembly being connected with the first test port, the circuit board assembly being used for transmitting the first radio frequency signal; a serial bus port connected with the other end of the circuit board assembly, used for transmitting the first radio frequency signal processed by the radio frequency device to an external test device, and / or transmitting the first radio frequency signal sent by the test device to the radio frequency device for receiving processing, the first radio frequency signal being used for testing the radio frequency performance of the electronic device. Since the thicknesses of the circuit board assemblies are relatively small, and the design flexibility of the shapes of the circuit board assemblies is relatively high, the circuit board assemblies can be customized according to the internal space of the electronic device, so that the space occupied in the electronic device can be greatly reduced.

Description

Technical Field

[0001] This application relates to the field of radio frequency technology, and in particular to an electronic device, a test system, and a test method. Background Technology

[0002] Before electronic devices leave the factory, manufacturers need to test their radio frequency (RF) performance to ensure their communication capabilities. However, with the evolution of RF technology and the increasing complexity of electronic device architectures, especially in the 5G era, more and more test sockets need to be set up in electronic devices to test RF performance. The number of test sockets may reach 7 to 10, resulting in the antenna group occupying more and more space, which greatly hinders the miniaturization of electronic devices. Summary of the Invention

[0003] Therefore, it is necessary to provide a smaller electronic device, testing system, and testing method to address the aforementioned technical problems.

[0004] In a first aspect, this application provides an electronic device, comprising:

[0005] The radio frequency device is configured with a first test port for transmitting a first radio frequency signal;

[0006] A circuit board assembly, one end of which is connected to the first test port, the circuit board assembly being used to transmit the first radio frequency signal;

[0007] A serial bus port, connected to the other end of the circuit board assembly, is used to transmit the first radio frequency signal after transmission processing by the radio frequency device to an external test device, and / or transmit the first radio frequency signal sent by the test device to the radio frequency device for reception processing. The first radio frequency signal is used to test the radio frequency performance of the electronic device.

[0008] Secondly, this application provides a testing system, including:

[0009] Such as the electronic devices mentioned above;

[0010] The test equipment is configured with a second test port for transmitting the first radio frequency signal. The second test port is connected to the first test port of the radio frequency device via the serial bus port and circuit board assembly of the electronic device. The test equipment is used to obtain the radio frequency performance of the electronic device based on the first radio frequency signal.

[0011] Thirdly, this application provides a testing method applied to the testing system described above, the method comprising:

[0012] The test equipment generates and sends a test indication signal via the second test port;

[0013] The electronic device transmits and receives a first radio frequency signal in response to the test indication signal;

[0014] The testing equipment obtains the radio frequency performance of the electronic device based on the first radio frequency signal transmitted and received by the electronic device.

[0015] The aforementioned electronic devices, testing systems, and testing methods utilize circuit board assemblies to connect radio frequency (RF) devices. Because the circuit board assemblies are relatively thin and their shape design is highly flexible, they can be customized to fit the internal space of the electronic device, significantly reducing the space they occupy. Furthermore, by connecting the circuit board assemblies to a serial bus port, the inherent serial bus port of the electronic device can be used to transmit the first RF signal, allowing the RF devices to be easily connected to external testing equipment. Moreover, based on this connection method, assembly-stage testing can be merged into the final device stage, simplifying the testing process. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments or related technologies of this application, the accompanying drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is one of the structural schematic diagrams of an electronic device according to an embodiment;

[0018] Figure 2 This is a second schematic diagram of the structure of an electronic device according to an embodiment;

[0019] Figure 3 This is the third schematic diagram of the structure of an electronic device according to an embodiment;

[0020] Figure 4 This is a fourth schematic diagram of the structure of an electronic device according to an embodiment;

[0021] Figure 5 Fifth schematic diagram of the structure of an electronic device according to an embodiment;

[0022] Figure 6 This is the sixth schematic diagram of the structure of an electronic device according to an embodiment;

[0023] Figure 7 This is the seventh schematic diagram of the structure of an electronic device according to an embodiment;

[0024] Figure 8 This is the eighth schematic diagram of the structure of an electronic device according to an embodiment;

[0025] Figure 9 One of the flowcharts for a test method in one embodiment;

[0026] Figure 10 A second flowchart of a test method in one embodiment;

[0027] Figure 11 This is an internal structural diagram of an electronic device according to an embodiment.

[0028] Component designation explanation:

[0029] RF device: 100; Second RF switch: 110; Circuit board assembly: 200; Serial bus port: 300; First RF switch: 400. Detailed Implementation

[0030] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0031] It is understood that the terms "first," "second," etc., used in this application may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another. For example, without departing from the scope of this application, a first radio frequency signal may be referred to as a second radio frequency signal, and similarly, a second radio frequency signal may be referred to as a first radio frequency signal. Both the first radio frequency signal and the second radio frequency signal are radio frequency signals, but they are not the same radio frequency signal.

[0032] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified. In the description of this application, "several" means at least one, such as one, two, etc., unless otherwise explicitly specified.

[0033] In RF performance testing of related technologies, a test socket or cable socket is typically placed on the RF board. During the surface mount technology (SMT) stage, testers attach the RF cables to the test socket or cable socket on the motherboard for conduction calibration and comprehensive testing. Then, the RF board and other functional modules are assembled into a complete device during the final assembly stage, where testers perform antenna coupling testing on the entire device. However, there is some overlap between the comprehensive testing during the assembly stage and the antenna coupling testing during the final assembly stage. Therefore, RF testing of related technologies requires the placement of a large area of ​​test sockets in the electronic device, and there is a certain degree of repetitive testing, resulting in insufficient testing efficiency.

[0034] This application provides an electronic device that reduces the space occupied by hardware supporting radio frequency testing, thereby achieving miniaturization of the electronic device. The electronic device in this application is an electronic device with wireless communication capabilities, such as a handheld device, in-vehicle device, wearable device, computing device, or other processing device connected to a wireless modem, as well as various forms of user equipment (UE) (e.g., mobile phone), mobile station (MS), etc. Figure 1 This is a schematic diagram of the structure of an electronic device according to an embodiment, with reference to... Figure 1 The electronic device includes a radio frequency device 100, a circuit board assembly 200, and a serial bus port 300.

[0035] Radio frequency (RF) device 100 refers to an integrated device that internally packages RF components. These internally packaged RF components include, for example, power amplifiers (PAs), low-noise amplifiers (LNAs), filters, RF switches, and antenna tuning switches. Depending on the internally packaged RF components, RF device 100 can be, but is not limited to, DiFEM (integrated RF switch and filter), LFEM (integrated RF switch, low-noise amplifier, and filter), FEMid (integrated RF switch, filter, and duplexer), PAMid (integrated multi-mode multi-band PA and FEMid), etc. RF device 100 is configured with a first test port for transmitting a first RF signal. Specifically, the first RF signal is used to test the RF performance of the electronic device. RF device 100 can output the first RF signal through the first test port to test transmit RF performance such as transmit power. RF device 100 can also input the first RF signal through the first test port to test receive RF performance such as receive power.

[0036] One end of the circuit board assembly 200 is connected to the first test port, and the other end is connected to the serial bus port 300. That is, the circuit board assembly 200 is used to connect the serial bus port 300 and the first test port of the RF device 100. The circuit board assembly 200 is used to transmit a first RF signal. Specifically, the circuit board assembly 200 has bidirectional transmission capabilities, capable of transmitting the first RF signal from the RF device 100 to the serial bus port 300, and vice versa. Optionally, the circuit board assembly 200 can be a flexible printed circuit (FPC), which can be freely bent. Therefore, the flexible circuit board can flexibly adapt to the space in electronic devices, thereby greatly improving space utilization.

[0037] The serial bus port 300 can be a USB port, and the type of USB port can be, but is not limited to, Type-A, Type-B, Type-C, miniUSB, microUSB, etc. The USB port can be used to support wired charging, wired data transmission, and other functions of the electronic device. In this embodiment, after the electronic device is assembled into a complete unit, the serial bus port 300 is also used to connect with testing equipment such as a comprehensive test instrument, thereby realizing RF performance testing in the complete unit state. Specifically, when testing the transmit RF performance of the electronic device, the serial bus port 300 is used to transmit the first RF signal processed by the RF device 100 to the external testing equipment. When testing the receive RF performance of the electronic device, the serial bus port 300 is used to transmit the first RF signal sent by the testing equipment to the RF device 100 for receiving processing. Therefore, the serial bus port 300 can be controlled to perform corresponding signal transmission according to the testing requirements. That is, the serial bus port 300 can be controlled to transmit only the transmitted first RF signal, or it can be controlled to transmit only the received first RF signal, or it can be controlled to transmit the received first RF signal and the transmitted RF signal sequentially.

[0038] In this embodiment, the circuit board assembly 200 is connected to the radio frequency device 100. Since the circuit board assembly 200 has a small thickness and a highly flexible shape design, it can be customized according to the internal space of the electronic device, thus significantly reducing the space it occupies within the electronic device. Furthermore, by connecting the circuit board assembly 200 to the serial bus port 300, the first radio frequency signal can be transmitted using the inherent serial bus port 300 of the electronic device, thereby conveniently connecting the radio frequency device 100 to external test equipment. Moreover, based on the above connection method, the testing during the assembly stage can be merged into the final stage, thus simplifying the testing process.

[0039] Figure 2 This is a second schematic diagram of the structure of an electronic device according to an embodiment, with reference to... Figure 2 The first test port is also used to connect an antenna, and the RF device 100 is also used to support the reception processing of a second RF signal received by the antenna and / or the transmission processing of a second RF signal transmitted by the antenna. Specifically, when performing RF performance testing, the first test port is used to transmit a first RF signal; when performing regular communication of the electronic device, the first test port is used to transmit a second RF signal. Wherein, if the RF device 100 is a device such as an LNA Bank used for signal reception processing, then the RF device 100 is only used to support the reception processing of the first and second RF signals. If the RF device 100 is a device such as a PAMid used for signal transmission processing, then the RF device 100 is only used to support the transmission processing of the first and second RF signals. If the RF device 100 is a device such as an L-PAMid capable of both signal transmission and signal reception processing, then the RF device 100 is used to support both the transmission and reception processing of the first RF signal, and also to support both the transmission and reception processing of the second RF signal. In this embodiment, by transmitting the first radio frequency signal and the second radio frequency signal in a time-division manner through the first test port, the number of ports required for the radio frequency device 100 can be reduced while ensuring communication and testing functions.

[0040] Figure 3 This is the third schematic diagram of the structure of an electronic device according to an embodiment, with reference to... Figure 3 In one embodiment, the RF device 100 is further configured with a transceiver port RFOUT1 for connecting to an RF transceiver. The RF device 100 transmits a first RF signal and a second RF signal to the RF transceiver via the transceiver port RFOUT1. The RF device 100 includes a second RF switch 110, which includes a first terminal and a second terminal. The second RF switch 110 can be a single RF switch or a switch module composed of multiple integrated RF switches; this embodiment does not impose any limitation.

[0041] At least a portion of the first terminal of the second RF switch 110 is connected to the transceiver port RFOUT1. Optionally, the number of first terminals of the second RF switch 110 may be equal to the number of transceiver ports RFOUT1. When the second RF switch 110 includes only one first terminal, the RF device 100 includes one transceiver port RFOUT1. When the second RF switch 110 includes multiple first terminals, the RF device 100 may include multiple transceiver ports RFOUT1, wherein at least a portion of the transceiver ports RFOUT1 are used to transmit signals of different frequency bands, and the multiple first terminals of the second RF switch 110 are respectively connected to the multiple transceiver ports RFOUT1 in a one-to-one correspondence. Optionally, the number of first terminals of the second RF switch 110 may also be greater than the number of transceiver ports RFOUT1, and some first terminals may be reserved for connection to other devices to realize other path switching functions. At least a portion of the second terminal of the second RF switch 110 is connected to the first test port RFIN. Optionally, the number of second terminals of the second RF switch 110 may be equal to the number of first test ports RFIN. When the second RF switch 110 includes a second terminal, the number of the first test port RFIN and the number of test lines connected to the first test port RFIN are both one. In this embodiment, by setting the second RF switch 110, the signal transmission path can be switched, thereby cutting off the path of ports that do not need to transmit signals, so as to avoid interference between different signal transmission paths.

[0042] Further reference Figure 3 When the second RF switch 110 includes multiple second terminals, the number of first test ports RFIN and test lines is also multiple, and the circuit board assembly 200 includes multiple pads for connecting the test lines. The multiple second terminals of the second RF switch 110 are connected one-to-one with the multiple first test ports RFIN, and each test line is connected to each pad of the circuit board assembly 200. Optionally, the number of second terminals of the second RF switch 110 may also be greater than the number of transceiver ports RFOUT1, and some second terminals may be reserved for connection to other devices, thereby realizing other path switching functions. In this embodiment, since the second RF switch 110 includes multiple second terminals, it can be quickly and sequentially switched to different test lines for testing without requiring manual switching of test lines by the test personnel, thus greatly improving the efficiency and flexibility of testing.

[0043] Continue to refer to Figure 3In one embodiment, the radio frequency device 100 further includes a Mobile Industry Processor Interface (MIPI). Accordingly, the radio frequency device 100 controlled by MIPI can be referred to as a MIPI RF Front-end (MIPI RFFE). The MIPI RFFE protocol bus consists of a power line (VIO) and two control lines (SCLK and SDATA). The SCLK control line provides clock signals and synchronization functions, while the SDATA control line provides control signals and transmits data. The power line VIO is powered on before the control lines SDATA and SCLK transmit signals, i.e., its voltage rises to the power supply voltage, for example, 1.8V. Furthermore, the MIPI interface may also include a USID port for device identity verification.

[0044] Figure 4 This is a fourth schematic diagram of the structure of an electronic device according to an embodiment, with reference to... Figure 4 The radio frequency device 100 also includes a first radio frequency switch 400, which includes a first terminal and two second terminals. The first terminal of the first radio frequency switch 400 is connected to a first test port RFIN of the radio frequency device 100. One second terminal of the first radio frequency switch 400 is connected to the circuit board assembly 200 via a test line, and the other second terminal of the first radio frequency switch 400 is connected to an antenna via a communication line. The first radio frequency switch 400 is used to select whether the first terminal is connected to the communication line or the test line. It is understood that... Figure 2 and Figure 3 In the previous embodiment, test leads were directly extended from the communication line, resulting in relatively long test leads. Furthermore, during normal operation of the RF device 100, total reflection signals from the test leads were fed back to the communication line, causing a certain degree of phase error and affecting the communication quality of the electronic device. However, in this embodiment, by setting a first RF switch 400, the RF device 100 can be switched on to only one of the test leads and the communication line at a time, effectively isolating the communication line from the test lead and avoiding the aforementioned total reflection signal problem, thus improving the communication quality of the electronic device.

[0045] In one embodiment, there are multiple first test ports RFIN, first RF switches 400, and test lines, and the circuit board assembly 200 includes multiple pads for connecting the test lines. Each first RF switch 400 has its first terminal connected to a corresponding first test port RFIN, and each test line is connected to a corresponding pad of the circuit board assembly 200. For example, in... Figure 4In the illustrated embodiment, the RF device 100 includes four first test ports RFIN, the first RF switch 400 includes four second terminals, the electronic device includes four test lines, and the circuit board assembly 200 includes four pads. In this embodiment, since the second RF switch 110 includes multiple second terminals, it can be quickly and sequentially switched to different test lines for testing without requiring manual switching of test lines by the tester, thereby greatly improving the efficiency and flexibility of testing.

[0046] Figure 5 This is the fifth schematic diagram of the structure of an electronic device according to an embodiment, with reference to... Figure 5 In one embodiment, the radio frequency device 100 is further configured with an antenna port ANT for connecting an antenna. The radio frequency device 100 is also configured to support reception processing of a second radio frequency signal received by the antenna and / or support transmission processing of a second radio frequency signal transmitted by the antenna. Wherein, if the radio frequency device 100 is a device such as an LNA Bank for receiving signals, then the radio frequency device 100 is only used to support reception processing of the first and second radio frequency signals. If the radio frequency device 100 is a device such as a PAMid for transmitting signals, then the radio frequency device 100 is only used to support transmission processing of the first and second radio frequency signals. If the radio frequency device 100 is a device such as an L-PAMid capable of both transmitting and receiving signals, then the radio frequency device 100 is used to support both transmission and reception processing of the first radio frequency signal, and also supports both transmission and reception processing of the second radio frequency signal. In this embodiment, since the first and second radio frequency signals are output from different ports respectively, there is no need to set up an additional radio frequency switch. Isolation between the communication line and the test line can also be achieved. This avoids the problem of total reflection signals while ensuring communication and testing functions, thus improving the communication quality of the electronic device. Moreover, based on the above connection method, the circuit board assembly 200 only needs to set up a single pad to realize the transmission of all the first radio frequency signals, thereby further reducing the size of the circuit board assembly 200.

[0047] Reference Figures 6 to 8In one embodiment, the electronic device includes multiple radio frequency (RF) devices 100, which are interconnected to form an RF system to achieve complex RF functions. Each RF device 100 is configured with at least one of an auxiliary input port RFOUT3 and an auxiliary output port RFOUT2. The auxiliary input port RFOUT3 of one RF device 100 is connected to the auxiliary output port RFOUT2 of another RF device 100 to transmit a first RF signal between the two connected RF devices 100. Specifically, a first terminal of a portion of the second RF switch 110 of the RF device 100 configured with the auxiliary input port RFOUT3 is connected to the auxiliary input port RFOUT3, and a second terminal of a portion of the second RF switch 110 of the RF device 100 configured with the auxiliary output port RFOUT2 is connected to the auxiliary output port RFOUT2. Figures 6 to 8 This embodiment uses two radio frequency (RF) devices 100 in an electronic device as an example. The upper RF device 100 is configured with an auxiliary output port RFOUT2, and the lower RF device 100 is configured with an auxiliary input port RFOUT3. A first RF signal can be transmitted from the upper RF device 100's auxiliary output port RFOUT2 to the lower RF device 100's auxiliary input port RFOUT3. Furthermore, when signals 0 to 4 are second RF signals, these signals can be transmitted to any antenna; when signals 0 to 4 are first RF signals, all first RF signals can be output via the circuit board assembly 200 and the serial bus port 300. Based on this connection method, when the number of signal ports of one RF device 100 is insufficient, signals can be routed to the signal ports of another RF device 100 for output, thereby improving the flexibility of signal output. It is understood that in other embodiments, the electronic device may include a larger number of RF devices 100, and the connected RF devices 100 may be different RF devices 100.

[0048] This application also provides a testing system, including a testing device and the electronic device described above. The testing device is configured with a second test port for transmitting a first radio frequency (RF) signal. The second test port is connected to the first test port RFIN of the RF device 100 via the serial bus port 300 and the circuit board assembly 200 of the electronic device. The testing device is used to obtain the RF performance of the electronic device based on the first RF signal. When the second test port of the testing device is incompatible with a USB port, an external converter can be used for port conversion, thereby ensuring a reliable connection between the electronic device and the testing device.

[0049] This application also provides a testing method applied to the testing system described above. Figure 9 One of the flowcharts for a test method in one embodiment is shown below. Figure 9 In one embodiment, the test method includes steps 902 to 906.

[0050] Step 902: The test device generates and sends a test indication signal through the second test port.

[0051] Specifically, the test equipment can be pre-configured with the types of radio frequency (RF) performance tests to be performed. The test equipment informs the electronic device of the upcoming RF performance test type through a test indication signal, thereby enabling the electronic device to activate the corresponding signal transmission path. The RF performance test types can include transmit RF performance and receive RF performance. For example, if a transmit RF performance test is required, the electronic device needs to activate the signal transmission path containing power amplifiers, filters, etc. If a receive RF performance test is required, the electronic device needs to activate the signal transmission path containing low-noise amplifiers, filters, etc.

[0052] Step 904: The electronic device transmits and receives a first radio frequency signal in response to the test instruction signal.

[0053] Specifically, after the electronic device completes the switching of the aforementioned signal transmission path in response to the test instruction signal, it can transmit and receive the first radio frequency (RF) signal. When the electronic device needs to transmit the first RF signal, it can immediately begin transmitting the first RF signal after completing the switching of the aforementioned signal transmission path. When the electronic device needs to receive the first RF signal, it can send a signal to the test device after completing the switching of the aforementioned signal transmission path to inform the test device that it can receive the first RF signal, so that the test device can transmit the first RF signal.

[0054] Step 906: The test equipment obtains the radio frequency performance of the electronic device based on the first radio frequency signal transmitted and received by the electronic device.

[0055] The method by which the testing equipment obtains the radio frequency performance of the electronic device can refer to relevant technologies, and this embodiment is not limited thereto. In this embodiment, based on the aforementioned testing system, the radio frequency performance of the electronic device can be accurately tested.

[0056] Figure 10 A second flowchart of a test method according to one embodiment, see reference. Figure 10 In one embodiment, the testing method includes steps 1002 to 1012. Steps 1008 to 1010 can be referred to... Figure 9 Steps 902 to 904 of the embodiment will not be described again in this embodiment. Figure 9 Step 906 of the embodiment further includes step 1012 of this embodiment.

[0057] Step 1002: The test equipment generates and sends a calibration indication signal through the second test port.

[0058] Step 1004: The electronic device disconnects the signal transmission path between the first terminal of the first RF switch 400 and the test line according to the calibration instruction signal.

[0059] Step 1006: The testing equipment acquires the loss information of the test leads.

[0060] Specifically, with Figure 8 For example, when signal 0 needs to be calibrated, it is first transmitted to antenna 0 in the default state. At this time, signal 0 is isolated from the test line. The test equipment can be connected to the auxiliary output port RFOUT2 of the upper RF device 100 via serial bus port 300, circuit board assembly 200, and the lower RF device 100, and obtain the information on the path as the loss information of the test line. Then, the first RF switch 400 is configured to the calibration state, so that signal 0 is connected to the test line for calibration. In this way, all signals from 0 to 4 are calibrated in turn. Moreover, since the test lines of each electronic device are random, the loss and phase shift at different frequencies fluctuate. Compared with the preset identical calibration data, the real-time calibration method in this embodiment can greatly improve the accuracy of calibration.

[0061] Step 1008: The test device generates and sends a test indication signal through the second test port.

[0062] Step 1010: The electronic device transmits and receives a first radio frequency signal in response to the test instruction signal.

[0063] Step 1012: The test equipment obtains the radio frequency performance of the electronic device based on the first radio frequency signal transmitted and received by the electronic device and the loss information.

[0064] In this embodiment, based on the above-described testing method, calibration accuracy can be guaranteed. Furthermore, when the testing method of this embodiment is applied... Figure 5 and Figure 8 In the electronic device of the embodiment, multiple signals can be calibrated through one test line, thereby reducing space occupation.

[0065] It should be understood that although the steps in each flowchart are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in a flowchart may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the sub-steps or stages of other steps.

[0066] In one embodiment, an electronic device is provided, which may be a terminal. The terminal may be, but is not limited to, various personal computers, laptops, smartphones, tablets, IoT devices, and portable wearable devices. IoT devices may include smart speakers, smart TVs, smart air conditioners, smart in-vehicle devices, etc. Portable wearable devices may include smartwatches, smart bracelets, head-mounted devices, etc. Figure 11 This is an internal structural diagram of an electronic device according to an embodiment. The electronic device includes a processor, memory, communication interface, display screen, and input device connected via a system bus. The processor provides computing and control capabilities. The memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores an operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage medium. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, NFC (Near Field Communication), or other technologies. When the computer program is executed by the processor, it implements a test method. The display screen can be a liquid crystal display (LCD) or an e-ink display. The input device can be a touch layer covering the display screen, buttons, a trackball, or a touchpad mounted on the device's casing, or an external keyboard, touchpad, or mouse.

[0067] Those skilled in the art will understand that Figure 11 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the electronic device to which the present application is applied. The specific electronic device may include more or fewer components than shown in the figure, or combine certain components, or have different component arrangements.

[0068] In one embodiment, an electronic device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above-described method embodiments.

[0069] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the steps in the above-described method embodiments.

[0070] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above-described method embodiments.

[0071] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0072] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0073] The above-described embodiments are merely illustrative of several implementation methods of the embodiments of this application, and their descriptions are relatively specific and detailed. However, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the embodiments of this application, and these all fall within the protection scope of the embodiments of this application. Therefore, the protection scope of the patent for the embodiments of this application should be determined by the appended claims.

Claims

1. An electronic device, comprising: The electronic device comprises: a radio frequency device configured with a first test port for transmitting a first radio frequency signal; a circuit board assembly connected to the first test port at one end, the circuit board assembly being configured to transmit the first radio frequency signal, the circuit board assembly having bidirectional transmission function; a serial bus port connected to the other end of the circuit board assembly, the serial bus port being configured to support at least one of wired charging and wired data transmission of the electronic device, and being further configured to transmit the first radio frequency signal processed by the radio frequency device to an external test device after the electronic device is assembled into a complete machine, and / or transmit the first radio frequency signal sent by the test device to the radio frequency device for receiving and processing, the first radio frequency signal being used for testing radio frequency performance of the electronic device.

2. The electronic device of claim 1, wherein, The first test port is further configured to connect an antenna, and the radio frequency device is further configured to support receiving and processing of a second radio frequency signal received by the antenna and / or support transmitting and processing of the second radio frequency signal transmitted by the antenna.

3. The electronic device of claim 2, wherein, The electronic device further comprises: a first radio frequency switch comprising a first end and two second ends, the first end of the first radio frequency switch being connected to the first test port of the radio frequency device, one of the second ends of the first radio frequency switch being connected to the circuit board assembly via a test line, the other of the second ends of the first radio frequency switch being connected to the antenna via a communication line, the first radio frequency switch being configured to selectively conduct the first end to one of the communication line and the test line.

4. The electronic device of claim 3, wherein, The number of the first test ports, the number of the first radio frequency switches and the number of the test lines are all plural, and the circuit board assembly comprises a plurality of pads for connecting the test lines; wherein the first end of each of the first radio frequency switches is connected to the corresponding first test port, and each of the test lines is connected to the corresponding pad of the circuit board assembly.

5. The electronic device of claim 1, wherein, The radio frequency device is further configured with an antenna port for connecting an antenna, and the radio frequency device is further configured to support receiving and processing of a second radio frequency signal received by the antenna and / or support transmitting and processing of the second radio frequency signal transmitted by the antenna.

6. The electronic device of any of claims 2 to 5, wherein, The radio frequency device is further configured with a transceiving port for connecting a radio frequency transceiver, and the radio frequency device is configured to transmit the first radio frequency signal and the second radio frequency signal to the radio frequency transceiver via the transceiving port. The radio frequency device comprises: a second radio frequency switch comprising a first end and a plurality of second ends, at least part of the first ends of the second radio frequency switch being connected to the transceiving port, and at least part of the second ends of the second radio frequency switch being connected to the first test port.

7. The electronic device of claim 6, wherein, The electronic device comprises a plurality of the radio frequency devices, each of the radio frequency devices being configured with at least one of an auxiliary input port and an auxiliary output port, the auxiliary input port of one of the radio frequency devices being connected to the auxiliary output port of another of the radio frequency devices to transmit the first radio frequency signal between the two connected radio frequency devices; Another part of the first end of the second radio frequency switch of the radio frequency device configured with the auxiliary input port is connected with the auxiliary input port, and another part of the second end of the second radio frequency switch of the radio frequency device configured with the auxiliary output port is connected with the auxiliary output port.

8. A test system, characterized by The method comprises: The electronic device according to any one of claims 1 to 7; The test device is configured with a second test port for transmitting the first radio frequency signal, and the second test port is connected to a first test port of a radio frequency device through a serial bus port and a circuit board assembly of the electronic device, and the test device is used to acquire the radio frequency performance of the electronic device according to the first radio frequency signal.

9. A test method characterized by, The method applied to the test system of claim 8, the method comprising: The test device generates and sends a test instruction signal through the second test port; The electronic device transmits and receives the first radio frequency signal in response to the test instruction signal; The test device acquires the radio frequency performance of the electronic device according to the first radio frequency signal transmitted and received by the electronic device.

10. The test method of claim 9, wherein, When the electronic device comprises a first radio frequency switch, before the test device generates and sends a test instruction signal through the second test port, the method further comprises: The test device generates and sends a calibration instruction signal through the second test port; The electronic device disconnects the signal transmission path between the first end of the first radio frequency switch and the test line according to the calibration instruction signal; The test device acquires the loss information of the test line; The test device acquires the radio frequency performance of the electronic device according to the first radio frequency signal transmitted and received by the electronic device, comprising: The test device acquires the radio frequency performance of the electronic device according to the first radio frequency signal transmitted and received by the electronic device and the loss information.

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