Test probe for solenoid valve and test jig

By using a probe design made of tungsten steel and featuring a sliding contact structure, the problems of probe wear and high resistance in solenoid valve testing were solved, achieving high-precision measurement and reliable wiring connections.

CN115718210BActive Publication Date: 2026-04-17QINGDAO RUNZHONG AUTOMATION TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
QINGDAO RUNZHONG AUTOMATION TECH CO LTD
Filing Date
2022-11-18
Publication Date
2026-04-17

AI Technical Summary

Technical Problem

Existing solenoid valve test probes suffer from wear and corrosion problems, high resistance affects test accuracy, and the wires and steel needles are prone to breakage, posing a short circuit risk.

Method used

The probe, made of tungsten carbide, is designed with a sliding contact structure. The sliding connection between the support and the miniature probe reduces resistance, and the detachable connection structure design prevents wiring breakage.

Benefits of technology

The probe's strength has been improved, its service life extended, and its resistance reduced to within 0.5 ohms, ensuring measurement accuracy and avoiding the risk of wiring breakage and short circuits.

✦ Generated by Eureka AI based on patent content.

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Abstract

The application discloses a test probe for electromagnetic valve and a test fixture, which comprises a probe, two limiting pieces are arranged on the probe, the two limiting pieces are spaced apart by a certain distance, a spring and a support are arranged between the probe positions of the two limiting pieces, and a micro probe is embedded in the position where the support contacts the probe; the micro probe is in sliding contact with the probe; the test probe for electromagnetic valve is slidably connected with the support as a wiring end and the probe as a movable part, in use, the wiring end is fixed on the shell of the test fixture, so that the problem that the wiring is prone to breakage is avoided; and the resistance of the probe is reduced through the sliding connection, so that the problem that the measurement result is inaccurate due to the large resistance of the probe is avoided.
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Description

Technical Field

[0001] This invention belongs to the field of electromagnetic valve testing technology, specifically relating to a test probe and test fixture for electromagnetic valves. Background Technology

[0002] The statements herein provide only background information in relation to this invention and do not necessarily constitute prior art.

[0003] Solenoid valves are standard components. After manufacturing, their electrical performance must be tested. This testing requires a test fixture, which consists of multiple probes. Existing probe fixtures are mainly made of copper and stainless steel, which have the following problems: 1. The probes are not resistant to wear and corrosion, and the probes themselves have high resistance, affecting test accuracy and leading to misinterpretation of product parameters; 2. The wires and steel needles move simultaneously, making the cables prone to breakage, requiring frequent maintenance, and posing a risk of short circuits.

[0004] Chinese utility model patent CN213750022U discloses a test probe. By setting the test probe as a sheet structure, the probe contacts can make stable contact with the contact part of the product, thereby improving the stability of the test. It can be seen that the improvement of the probe in the prior art focuses on how to achieve stable contact between the probe and the product, while ignoring the impact of high probe resistance on the measurement results. Therefore, there is an urgent need for a probe that can reduce resistance. Summary of the Invention

[0005] The purpose of this invention is to provide a test probe and test fixture for solenoid valves, which can reduce the resistance of the probe itself and reduce the impact of high probe resistance on test accuracy.

[0006] To achieve the above objectives, the present invention is implemented through the following technical solution:

[0007] In a first aspect, embodiments of the present invention provide a test probe for a solenoid valve, comprising a probe, two limiting members disposed on the probe, the two limiting members being spaced a certain distance apart, a spring and a bracket sleeved at the probe position between the two limiting members, a miniature probe being embedded at the position where the bracket contacts the probe; the miniature probe being in sliding contact with the probe.

[0008] As a further technical solution, the bracket is positioned above the spring.

[0009] As a further technical solution, the probe and the micro probe are made of tungsten steel.

[0010] As a further technical solution, the limiting member is a cylindrical structure with a through hole. The wall surface of the through hole includes a flat part and an arc-shaped part. A set screw hole is provided at a position opposite to the flat part. The axis of the set screw hole is perpendicular to the axis of the limiting member.

[0011] As a further technical solution, the probe is provided with an embedded concave surface at the position of the limiting member, and the embedded concave surface contacts the planar part of the limiting member.

[0012] As a further technical solution, the bracket is a cuboid structure with a circular hole, the diameter of which matches the diameter of the probe, and the bracket can slide along the probe.

[0013] As a further technical solution, the bracket is provided with multiple wiring holes.

[0014] As a further technical solution, the axis of the micro probe is perpendicular to the axis of the probe, one end of the micro probe is in continuous sliding contact with the probe, and the other end is in continuous contact with the wall of the support.

[0015] As a further technical solution, multiple probes are arranged in a probe fixture inside the housing, with the probe contacts protruding from the housing and the bracket fixed to the wall of the housing.

[0016] Secondly, embodiments of the present invention provide a solenoid valve testing fixture, wherein a plurality of probes forming a probe fixture are disposed inside a housing, the contacts of the probes protruding from the housing, and a bracket is fixed to the wall of the housing.

[0017] As a further technical solution, the outer casing is made of plastic.

[0018] The beneficial effects of the above embodiments of the present invention are as follows:

[0019] The test probe for solenoid valves provided by this invention uses tungsten steel as the probe material, which improves the probe's strength, reduces probe wear, extends the probe's service life, and saves costs.

[0020] The test probe for solenoid valves provided by this invention has a probe, which is a movable part, slidably connected to a bracket, which is a terminal. In use, the terminal is fixed to the outer shell of the test fixture, thus avoiding the problem of easy breakage of the wiring.

[0021] The test probe for solenoid valves provided by this invention, by embedding a miniature probe in a bracket and by using a sliding connection between the probe and the bracket, allows the miniature probe and the probe to always slide in contact, reducing the resistance of the probe and controlling the resistance value within 0.5 ohms, thus avoiding the problem of inaccurate measurement results due to high probe resistance.

[0022] The test probe for solenoid valves provided by this invention has a detachable connection structure for each part, which makes it easy to replace when the probe is worn. Attached Figure Description

[0023] The accompanying drawings, which form part of this invention, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an improper limitation of the invention.

[0024] Figure 1 This is a schematic diagram of the overall structure of the test probe for the solenoid valve of the present invention;

[0025] Figure 2 This is a top view of the test probe for the solenoid valve of the present invention;

[0026] Figure 3 yes Figure 2 Cross-sectional view at point AA;

[0027] Figure 4 yes Figure 3 A magnified view of a section at point I;

[0028] Figure 5 This is a schematic diagram of the micro probe of the present invention;

[0029] Figure 6 This is a schematic diagram of the probe in this invention;

[0030] Figure 7 This is a schematic diagram of the limiting component in this invention;

[0031] Figure 8 yes Figure 7 Cross-sectional view at point BB;

[0032] Figure 9 This is a schematic diagram of the test fixture of the present invention.

[0033] The diagram is for illustrative purposes only.

[0034] Among them, 1. Probe; 2. First spring; 3. Bracket; 4. First limiting member; 5. Second limiting member; 6. Wiring hole; 7. Miniature probe; 7.1 Telescopic end; 7.2 Fixed end; 8. Embedded concave surface; 9. Through hole; 10. Flat part; 11. Set screw hole; 12. Outer shell; 13. Second spring; 14. Half thread bolt; 15. Probe fixture; 16. Cover plate; 17. Waterproof connector; 18. Through hole. Detailed Implementation

[0035] It should be noted that the following detailed description is illustrative and intended to provide further explanation of the invention. Unless otherwise specified, all technical and scientific terms used in this invention have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains.

[0036] Example 1

[0037] In a typical embodiment of the present invention, such as Figure 1-4As shown, a test probe for a solenoid valve is provided, including a probe 1. The probe 1 is provided with two limiting members, including a first limiting member 4 and a second limiting member 5. The two limiting members are spaced a certain distance apart. A first spring 2 and a bracket 3 are sleeved at the probe position between the two limiting members. A miniature probe 7 is embedded at the position where the bracket 3 contacts the probe. The miniature probe 7 is in sliding contact with the probe 1.

[0038] The bracket 3 is a cuboid structure with a circular hole whose diameter matches the diameter of the probe. The bracket 3 can slide between the first and second limiting members along the probe 1. The bracket is positioned above the first spring 2. The bracket has a wiring hole 6 for connecting a cable and two circular holes for fixing the bracket. A cylindrical cavity is formed at the contact point between the bracket and the probe to hold the miniature probe 7. The axis of the miniature probe is perpendicular to the axis of the probe.

[0039] The structure of the micro probe 7 is as follows Figure 5 As shown, it includes a telescopic end 7.1 and a fixed end 7.2. The telescopic end is embedded inside the fixed end, and a spring is provided inside the fixed end. When the bracket slides along the probe, the telescopic end 7.1 of the micro probe is in continuous sliding contact with the probe, and the fixed end 7.2 is in continuous contact with the wall surface of the bracket.

[0040] like Figure 6-8 As shown, two recessed surfaces 8 are provided on the wall of the probe. The two recessed surfaces are used to fix the first limiting member 4 and the second limiting member 5 respectively. The limiting member restricts the movement of the support. The limiting member is a cylindrical structure with a through hole 9. The wall of the through hole includes a flat part 10 and an arc part. A set screw hole 11 is provided at the position opposite to the flat part 10. The axis of the set screw hole 11 is perpendicular to the axis of the limiting member. During installation, the limiting member is put into the probe so that the recessed surface contacts the flat part of the limiting member. Then the set screw is screwed into the set screw hole and tightened to fix the limiting member on the set screw.

[0041] The probe is a rod-shaped structure with rounded tips. Both the main probe and the miniature probe are made of tungsten steel. They are machined using standard outer diameter tungsten steel rods. The probe shape can be changed, and the machining can be completed using wire cutting machines and grinding machines. Compared with existing copper and stainless steel probes, tungsten steel probes have higher material hardness, making them a material suitable for machine tool cutting tools and less prone to wear.

[0042] During use, the bracket remains stationary. Driven by the cylinder, the contact point of the product that needs to be energized approaches and contacts the round tip contact of the probe. The spring is compressed, and the probe moves, bringing the second limiting member and the bracket closer together. At the same time, the miniature probe also slides along the probe. When the bracket approaches the second limiting member, the distance between the probe contact point and the miniature probe is shortened, reducing the resistance of the probe and ensuring that the resistance value is below 0.5 ohms.

[0043] The solenoid valve test probe in this embodiment uses tungsten carbide as the probe material, which improves the probe's strength and reduces wear. Simultaneously, the probe, which is the movable part, is slidably connected to the bracket, which is the wiring terminal. During use, the wiring terminal is fixed to the outer shell of the test fixture, avoiding the problem of easy wire breakage. Furthermore, the sliding connection reduces the probe's resistance, preventing inaccurate measurement results due to high probe resistance.

[0044] Example 2

[0045] In another typical embodiment of the present invention, a solenoid valve testing fixture is also provided, such as... Figure 9 As shown, a probe fixture consisting of multiple probes is installed inside the housing, with the probe contacts protruding from the housing. The bracket is fixed to the wall of the housing. The probe fixture is installed inside the housing by a second spring 13, a half-threaded bolt 14, and a cover plate 16. A waterproof connector 17 is provided on the cover plate. The cable connected to the bracket passes through the outside of the housing through the waterproof connector. The waterproof connector can prevent water from entering the housing.

[0046] In use, the test fixture is installed on the test device through the through hole 18, and the contacts of multiple probes make contact with the contacts of the product that need to be energized to test the product.

[0047] In this embodiment, the shape of the test fixture's outer shell is adapted to the shape of the product, which allows for better contact between the product and the probe.

[0048] In this embodiment, the outer shell is made of plastic, and because the probe is charged, it can be waterproof. The second spring is a stainless steel spring.

[0049] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A test probe for a solenoid valve, characterized in that, The device includes a probe with two limiting members, a first limiting member and a second limiting member, spaced a certain distance apart. A spring and a bracket are fitted around the probe position between the two limiting members. A miniature probe is embedded in the bracket at the contact point with the probe. The miniature probe slides in contact with the probe. The bracket can slide along the probe between the first and second limiting members. The bracket is positioned above the spring and has a wiring hole for connecting a cable. The axis of the miniature probe is perpendicular to the axis of the probe. One end of the miniature probe continuously slides in contact with the probe, while the other end continuously maintains contact with the wall of the bracket. The miniature probe includes a telescopic end and a fixed end. The telescopic end is embedded inside the fixed end, which contains a spring. When the bracket slides along the probe, the telescopic end of the miniature probe continuously slides in contact with the probe, while the fixed end continuously maintains contact with the wall of the bracket.

2. The test probe for a solenoid valve according to claim 1, wherein The probes and microprobes are made of tungsten steel.

3. The test probe for a solenoid valve according to claim 1, wherein The limiting member is a cylindrical structure with a through hole. The wall surface of the through hole includes a flat part and an arc-shaped part. A set screw hole is provided at a position opposite to the flat part. The axis of the set screw hole is perpendicular to the axis of the limiting member.

4. The test probe for a solenoid valve according to claim 3, wherein The probe is positioned at the location of the limiting member and has an embedded concave surface, which contacts the planar portion of the limiting member.

5. The test probe for a solenoid valve as described in claim 1, characterized in that, The support is a cuboid structure with a circular hole, the diameter of which matches the diameter of the probe, and the support can slide along the probe.

6. An electromagnetic valve testing jig comprising the electromagnetic valve testing probe according to any one of claims 1 to 5, characterized by Multiple probes form a probe fixture housed inside the housing, with the probe contacts protruding from the housing and the bracket fixed to the wall of the housing.

7. The electromagnetic valve testing fixture of claim 6, wherein, The outer shell is made of plastic.

Citation Information

Patent Citations

  • Test probe

    CN213750022U

  • Test probe and test fixture for solenoid valve

    CN219456284U