A flash memory chip test fixture

Abstract

The present application relates to the technical field of chip testing, and particularly relates to a FLASH storage chip testing fixture, which comprises a fixture sliding base, an adjusting base, a clamping table, an adjusting cylinder, a clamping seat, a clamping lead screw, a clamping plate, a testing rack and an adjusting sliding seat. The present application sets the testing rack, and when testing a single FLASH chip body, the extension edge of the testing rack is connected with the FLASH chip body; when testing multiple groups of FLASH chip bodies, the testing limiting pins on the testing rack are connected with the multiple groups of FLASH chip bodies, so that the chip can be tested conveniently. The fixture sliding base drives the adjusting base to move along the working direction on the testing assembly line. The testing fixture can meet the requirements of the automatic chip testing assembly line for the chip installation and fixation, and the continuous working requirement of the testing movement, and is beneficial to improving the working efficiency of the chip testing.

Description

TECHNICAL FIELD

[0001] The application relates to the chip testing technical field, in particular to a FLASH storage chip testing fixture. BACKGROUND

[0002] The FLASH storage chip is a kind of flash memory chip, which adopts a nonlinear macro cell mode inside, and provides a cheap and effective solution for the realization of solid-state large-capacity memory. At present, the FLASH storage chip generally needs to be detected when it is processed or shipped. When the FLASH storage chip is detected, a corresponding fixture is generally needed.

[0003] The utility model discloses a FLASH storage chip testing fixture, by setting the positioning plate to the flash storage chip, the force is exerted downwards, so that all the pins on the flash storage chip are in close contact with the test contact, solve the existing chip testing fixture after installing the chip, will lead to the pin on the chip cannot be in close contact with the detection probe problem.

[0004] However, the above technical scheme has the following defects: the above fixture is an independent clamping and fixing detection device, which can meet the repeated fixing and detection of a single chip, but cannot realize multi-step detection of the chip positioning during the movement process on the chip detection assembly line, and cannot be widely popularized in the automatic chip production industry. The automatic degree of adjusting the chip detection position is low. SUMMARY

[0005] The application provides a FLASH storage chip testing fixture to solve the technical problems in the background art.

[0006] The technical scheme of the application is as follows: a FLASH storage chip testing fixture, which comprises a fixture sliding base, an adjusting base, a clamping table, an adjusting cylinder, a clamping seat, a clamping lead screw, a clamping plate, a test rack and an adjusting sliding seat.

[0007] The fixture sliding base is slidably arranged on the chip testing assembly line. The adjusting base is arranged on the fixture sliding base. The adjusting sliding seat is adjustably arranged on the adjusting base. The cylinder body end of the adjusting cylinder is arranged on the adjusting sliding seat. The clamping table is arranged at the piston end of the adjusting cylinder. The clamping seat is arranged on the clamping table. The clamping lead screw is threadedly connected with the clamping seat. The clamping plate is arranged at one end of the clamping lead screw. The test rack is arranged between the clamping seat and the clamping plate. The FLASH chip body is arranged on the test rack.

[0008] Preferably, the fixture further comprises an engaging gear, a driving motor and an engaging gear ring. The engaging gear driven by the driving motor is rotatably arranged on the adjusting sliding seat. The engaging gear ring is arranged on the adjusting base. The engaging gear is in meshing connection with the engaging gear ring.

[0009] Preferably, the test limiting pin is further included; the test rack is provided with an assembly test port; the test limiting pin is arranged on the test rack, and the test limiting pin is in communication connection with the assembly test port and a plurality of groups of FLASH chip bodies arranged on the test rack.

[0010] Preferably, the test limiting pin is further included; the test rack is provided with an assembly test port; the test limiting pin is arranged on the test rack, and the test limiting pin is in communication connection with the assembly test port and a plurality of groups of FLASH chip bodies arranged on the test rack.

[0011] Preferably, the test limiting pin is further included; the test rack is provided with an assembly test port; the test limiting pin is arranged on the test rack, and the test limiting pin is in communication connection with the assembly test port and a plurality of groups of FLASH chip bodies arranged on the test rack.

[0012] Preferably, the test limiting pin is further included; the test rack is provided with an assembly test port; the test limiting pin is arranged on the test rack, and the test limiting pin is in communication connection with the assembly test port and a plurality of groups of FLASH chip bodies arranged on the test rack.

[0013] Preferably, the test limiting pin is further included; the test rack is provided with an assembly test port; the test limiting pin is arranged on the test rack, and the test limiting pin is in communication connection with the assembly test port and a plurality of groups of FLASH chip bodies arranged on the test rack.

[0014] Preferably, the test limiting pin is further included; the test rack is provided with an assembly test port; the test limiting pin is arranged on the test rack, and the test limiting pin is in communication connection with the assembly test port and a plurality of groups of FLASH chip bodies arranged on the test rack.

[0015] Preferably, the test limiting pin is further included; the test rack is provided with an assembly test port; the test limiting pin is arranged on the test rack, and the test limiting pin is in communication connection with the assembly test port and a plurality of groups of FLASH chip bodies arranged on the test rack.

[0016] A FLASH storage chip test fixture, and a method for using the same, characterized in that the method comprises the following steps:

[0017] S1, arranging a FLASH chip body to be detected on a test rack, and making test pins of the FLASH chip body contact test ports on the test rack.

[0018] S2, when testing a single FLASH chip body, the extension edge of the test frame is clamped with the FLASH chip body; when testing multiple groups of FLASH chip bodies, the test limiting pins on the test frame are clamped with the multiple groups of FLASH chip bodies.

[0019] S3, the test frame provided with the FLASH chip body is arranged on the clamping seat; the FLASH chip body is clamped and fixed by the clamping plate driven by the clamping lead screw.

[0020] S4, the test frame is arranged on the stable clamping seat, the FLASH chip body is clamped by the stable clamping plate driven by the stable clamping lead screw, and the stability of the test frame is maintained by the spring.

[0021] S5, the position relationship between the clamping mounting rod and the clamping adjusting rod is adjusted by the fixing piece, so that the two ends of the test frame can be fixed on the clamping table of the two groups of adjusting cylinders at the two ends of the adjusting base.

[0022] S6, the adjusting sliding seat is driven by the meshing gear to slide on the adjusting base, so as to drive the whole test frame and the FLASH chip body thereon to rotate relative to the adjusting base, so that the test port of the test frame is in contact with the test probe on the test flow line; the adjusting base is driven by the jig sliding base to move on the test flow line along the working direction.

[0023] Compared with the prior art, the above technical scheme of the present application has the following beneficial technical effects: the FLASH chip body to be detected is arranged on the test frame, and the test pins of the FLASH chip body are in contact with the test ports on the test frame. By arranging the test frame, when a single FLASH chip body is tested, the extension edge of the test frame is clamped with the FLASH chip body; when multiple groups of FLASH chip bodies are tested, the test limiting pins on the test frame are clamped with the multiple groups of FLASH chip bodies, so that the chip is conveniently tested. The test frame provided with the FLASH chip body is arranged on the clamping seat; the FLASH chip body is clamped and fixed by the clamping plate driven by the clamping lead screw. The test frame is arranged on the stable clamping seat, the FLASH chip body is clamped by the stable clamping plate driven by the stable clamping lead screw, and the stability of the test frame and the chip body is maintained by the spring. The positional relationship between the clamping mounting rod and the clamping adjusting rod is adjusted by the fixing piece, so that the two ends of the test frame can be fixed on the clamping tables on the two groups of adjusting cylinders at the two ends of the adjusting base. The overall test frame and the FLASH chip body thereon rotate relative to the adjusting base, so that the test ports of the test frame are in contact with the test probes on the test flow line; the adjusting jig sliding base drives the adjusting base to move on the test flow line along the working direction. The test jig proposed in the present application can meet the continuous working requirements of the chip mounting and fixing and test movement of the automatic chip test flow line, and is beneficial to improving the working efficiency of chip testing. BRIEF DESCRIPTION OF DRAWINGS

[0024] Figure 1 It is a structural schematic diagram of an embodiment of the present application.

[0025] Figure 2 It is a connection structure schematic diagram of the clamping table and the test frame in an embodiment of the present application.

[0026] Figure 3 It is a structural schematic diagram of the adjusting base in an embodiment of the present application.

[0027] Figure 4 It is a structural schematic diagram of an embodiment of the present application in a stacked arrangement state.

[0028] Reference numerals in the attached diagram: 1. Fixture sliding base; 2. Adjusting base; 3. Clamping platform; 4. Adjusting cylinder; 5. Clamping seat; 6. Clamping screw; 7. Clamping plate; 8. Test frame; 9. FLASH chip body; 10. Adjusting sliding seat; 11. Meshing gear; 12. Drive motor; 13. Meshing gear ring; 14. Production line guide rail; 15. Sleeve rod; 16. Threaded rod; 17. Adjusting knob; 18. Stacked connecting seat; 19. Locking block; 20. Stacked base; 21. Clamping mounting rod; 22. Clamping adjusting rod; 23. Fixture; 24. Clamping adjusting seat; 25. Spring connecting seat; 26. Spring; 27. Stabilizing clamping seat; 28. Stabilizing clamping screw; 29. ​​Stabilizing clamping plate; 30. Test limit pin. Detailed Implementation

[0029] Example 1

[0030] This embodiment proposes a FLASH storage chip testing fixture, which includes a fixture sliding base 1, an adjusting base 2, a clamping platform 3, an adjusting cylinder 4, a clamping seat 5, a clamping screw 6, a clamping plate 7, a test frame 8, and an adjusting sliding seat 10.

[0031] like Figure 1 As shown, the fixture sliding base 1 is slidably mounted on the chip testing production line. An adjusting base 2 is mounted on the fixture sliding base 1; an adjusting sliding seat 10 is adjustablely mounted on the adjusting base 2; the cylinder end of the adjusting cylinder 4 is mounted on the adjusting sliding seat 10; and a clamping platform 3 is mounted on the piston end of the adjusting cylinder 4. A clamping seat 5 is mounted on the clamping platform 3; a clamping screw 6 is threadedly connected to the clamping seat 5; a clamping plate 7 is mounted on one end of the clamping screw 6; a test frame 8 is mounted between the clamping seat 5 and the clamping plate 7; and the FLASH chip body 9 is mounted on the test frame 8.

[0032] It needs to be explained that the FLASH chip body 9 to be detected is arranged on the test rack 8, and the test pins of the FLASH chip body 9 are in contact with the test ports on the test rack 8. When testing a single FLASH chip body 9, the extension edge of the test rack 8 is clamped with the FLASH chip body 9; when testing multiple groups of FLASH chip bodies 9, the test limiting pins 30 on the test rack 8 are clamped with the multiple groups of FLASH chip bodies 9. The test rack 8 provided with the FLASH chip body 9 is arranged on the clamping seat 5; the clamping plate 7 is driven by the clamping lead screw 6 to clamp and fix the FLASH chip body 9. The test rack 8 is arranged on the stable clamping seat 27. The positional relationship between the clamping mounting rod 21 and the clamping adjusting rod 22 is adjusted by the fixing piece 23, so that the two ends of the test rack 8 can be fixed on the clamping table 3 on the two groups of adjusting cylinders 4 at the two ends of the adjusting base 2. The whole test rack 8 and the FLASH chip body 9 thereon rotate relative to the adjusting base 2, so that the test ports of the test rack 8 are in contact with the test probes on the test flow line; the jig sliding base 1 drives the adjusting base 2 to move on the test flow line along the working direction.

[0033] Embodiment two

[0034] The FLASH storage chip test jig provided in the embodiment comprises a jig sliding base 1, an adjusting base 2, a clamping table 3, an adjusting cylinder 4, a clamping seat 5, a clamping lead screw 6, a clamping plate 7, a test rack 8 and an adjusting sliding seat 10.

[0035] As shown in Figures 1-4 , the jig sliding base 1 is slidingly arranged on the chip test flow line. The adjusting base 2 is arranged on the jig sliding base 1; the adjusting sliding seat 10 is adjustably arranged on the adjusting base 2; the cylinder body end of the adjusting cylinder 4 is arranged on the adjusting sliding seat 10; the clamping table 3 is arranged at the piston end of the adjusting cylinder 4. The clamping seat 5 is arranged on the clamping table 3; the clamping lead screw 6 is threadedly connected with the clamping seat 5; the clamping plate 7 is arranged at one end of the clamping lead screw 6; the test rack 8 is arranged between the clamping seat 5 and the clamping plate 7; and the FLASH chip body 9 is arranged on the test rack 8.

[0036] Further, it further comprises an engaging gear 11, a driving motor 12 and an engaging gear ring 13; the engaging gear 11 driven by the driving motor 12 is rotationally arranged on the adjusting sliding seat 10; the engaging gear ring 13 is arranged on the adjusting base 2; and the engaging gear 11 is in meshing connection with the engaging gear ring 13.

[0037] It needs to be explained that the FLASH chip body 9 to be detected is arranged on the test rack 8, and the test pins of the FLASH chip body 9 are in contact with the test ports on the test rack 8. When testing a single FLASH chip body 9, the extension edge of the test rack 8 is clamped with the FLASH chip body 9; when testing multiple groups of FLASH chip bodies 9, the test limiting pins 30 on the test rack 8 are clamped with the multiple groups of FLASH chip bodies 9. The test rack 8 provided with the FLASH chip body 9 is arranged on the clamping seat 5; the FLASH chip body 9 is clamped and fixed by the clamping plate 7 driven by the clamping lead screw 6. The test rack 8 is arranged on the stable clamping seat 27. The position relationship between the clamping mounting rod 21 and the clamping adjusting rod 22 is adjusted by the fixing piece 23, so that the two ends of the test rack 8 can be fixed on the clamping table 3 on the two groups of adjusting cylinders 4 at the two ends of the adjusting base 2. The adjusting sliding seat 10 is driven by the meshing gear 11 to slide on the adjusting base 2, so as to drive the whole test rack 8 and the FLASH chip body 9 thereon to rotate relative to the adjusting base 2, so that the test ports of the test rack 8 are in contact with the test probes on the test flow line; the adjusting base 2 is driven by the jig sliding base 1 to move on the test flow line along the working direction.

[0038] Embodiment three

[0039] The FLASH storage chip test jig provided in the embodiment comprises a jig sliding base 1, an adjusting base 2, a clamping table 3, an adjusting cylinder 4, a clamping seat 5, a clamping lead screw 6, a clamping plate 7, a test rack 8 and an adjusting sliding seat 10.

[0040] As shown in Figures 1-3 , the jig sliding base 1 is slidably arranged on the chip test flow line. The adjusting base 2 is arranged on the jig sliding base 1; the adjusting sliding seat 10 is adjustably arranged on the adjusting base 2; the cylinder body end of the adjusting cylinder 4 is arranged on the adjusting sliding seat 10; the clamping table 3 is arranged at the piston end of the adjusting cylinder 4. The clamping seat 5 is arranged on the clamping table 3; the clamping lead screw 6 is threadedly connected with the clamping seat 5; the clamping plate 7 is arranged at one end of the clamping lead screw 6; the test rack 8 is arranged between the clamping seat 5 and the clamping plate 7; the FLASH chip body 9 is arranged on the test rack 8.

[0041] Further, it further comprises a test limiting pin 30; the test rack 8 is provided with a general assembly test port; the test limiting pin 30 is arranged on the test rack 8, and the test limiting pin 30 is in communication connection with the general assembly test port and the multiple groups of FLASH chip bodies 9 arranged on the test rack 8.

[0042] It needs to be explained that the FLASH chip body 9 to be detected is arranged on the test rack 8, and the test pins of the FLASH chip body 9 are in contact with the test ports on the test rack 8. When testing a single FLASH chip body 9, the extension edge of the test rack 8 is clamped with the FLASH chip body 9; when testing multiple groups of FLASH chip bodies 9, the test limiting pins 30 on the test rack 8 are clamped with the multiple groups of FLASH chip bodies 9. The test rack 8 provided with the FLASH chip body 9 is arranged on the clamping seat 5; the FLASH chip body 9 is clamped and fixed by the clamping plate 7 driven by the clamping lead screw 6. The test rack 8 is arranged on the stable clamping seat 27. The position relationship between the clamping mounting rod 21 and the clamping adjusting rod 22 is adjusted by the fixing piece 23, so that the two ends of the test rack 8 can be fixed on the clamping table 3 on the two groups of adjusting cylinders 4 at the two ends of the adjusting base 2. The adjusting sliding seat 10 is driven by the meshing gear 11 to slide on the adjusting base 2, so as to drive the whole test rack 8 and the FLASH chip body 9 thereon to rotate relative to the adjusting base 2, so that the test ports of the test rack 8 are in contact with the test probes on the test flow line; the adjusting base 2 is driven by the jig sliding base 1 to move on the test flow line along the working direction.

[0043] Embodiment four

[0044] The FLASH storage chip test jig provided in the embodiment comprises a jig sliding base 1, an adjusting base 2, a clamping table 3, an adjusting cylinder 4, a clamping seat 5, a clamping lead screw 6, a clamping plate 7, a test rack 8 and an adjusting sliding seat 10.

[0045] As shown in Figures 1-3 , the jig sliding base 1 is slidably arranged on the chip test flow line. The adjusting base 2 is arranged on the jig sliding base 1; the adjusting sliding seat 10 is adjustably arranged on the adjusting base 2; the cylinder body end of the adjusting cylinder 4 is arranged on the adjusting sliding seat 10; the clamping table 3 is arranged at the piston end of the adjusting cylinder 4. The clamping seat 5 is arranged on the clamping table 3; the clamping lead screw 6 is threadedly connected with the clamping seat 5; the clamping plate 7 is arranged at one end of the clamping lead screw 6; the test rack 8 is arranged between the clamping seat 5 and the clamping plate 7; and the FLASH chip body 9 is arranged on the test rack 8.

[0046] Further, it further comprises a laminated support rod, a laminated connecting seat 18 and a laminated base 20; the laminated support rod is arranged on the adjusting base 2; the laminated connecting seat 18 is arranged at one end of the laminated support rod away from the adjusting base 2; the laminated base 20 is arranged on the other side of the adjusting base 2, and the laminated base 20 and the laminated connecting seat 18 are correspondingly clamped.

[0047] In an alternative embodiment, the layered support rod comprises a sleeve rod 15, a threaded rod 16 and an adjusting knob 17; the sleeve rod 15 is arranged on the adjusting base 2; the adjusting knob 17 is rotationally arranged on the sleeve rod 15, and the adjusting knob 17 is threadedly connected with the threaded rod 16; the threaded rod 16 is slidingly arranged on the sleeve rod 15; and a layered connecting seat 18 is arranged at an end of the threaded rod 16 away from the sleeve rod 15. When a plurality of groups of adjusting bases 2 are arranged in layers, the layered support rod ensures that the adjusting base 2 and the jig sliding base 1 do not collide with the test rack 8, and the layered support rod can be connected with the layered base 20, thereby achieving the effect of layering and fixing the plurality of groups of adjusting bases 1.

[0048] In an alternative embodiment, a clamping block 19 is further included; the clamping block 19 is arranged on the layered connecting seat 18; and the layered base 20 is provided with a clamping groove corresponding to the clamping block 19, and the layered base 20 is clamped with the clamping block 19 through the clamping groove.

[0049] It should be noted that the FLASH chip body 9 to be detected is arranged on the test rack 8, and the test pins of the FLASH chip body 9 are brought into contact with the test ports on the test rack 8. When a single FLASH chip body 9 is tested, the extended edge of the test rack 8 is clamped with the FLASH chip body 9; when a plurality of groups of FLASH chip bodies 9 are tested, the test limiting pins 30 on the test rack 8 are clamped with the plurality of groups of FLASH chip bodies 9. The test rack 8 provided with the FLASH chip body 9 is arranged on the clamping seat 5; the FLASH chip body 9 is clamped and fixed by the clamping plate 7 driven by the clamping lead screw 6. The test rack 8 is arranged on the stable clamping seat 27. The position relationship between the clamping mounting rod 21 and the clamping adjusting rod 22 is adjusted by the fixing member 23, so that the two ends of the test rack 8 can be fixed on the clamping table 3 on the two groups of adjusting cylinders 4 at the two ends of the adjusting base 2. The adjusting sliding seat 10 is driven by the meshing gear 11 to slide on the adjusting base 2, thereby driving the overall test rack 8 and the FLASH chip bodies 9 thereon to rotate relative to the adjusting base 2, so that the test ports of the test rack 8 are brought into contact with the test probes on the test pipeline.

[0050] Embodiment Five

[0051] The FLASH storage chip test jig provided in this embodiment comprises a jig sliding base 1, an adjusting base 2, a clamping table 3, an adjusting cylinder 4, a clamping seat 5, a clamping lead screw 6, a clamping plate 7, a test rack 8 and an adjusting sliding seat 10.

[0052] As Figures 1-3As shown, the jig sliding base 1 is slidingly arranged on the chip testing pipeline. The adjusting base 2 is arranged on the jig sliding base 1; the adjusting sliding seat 10 is adjustably arranged on the adjusting base 2; the cylinder end of the adjusting cylinder 4 is arranged on the adjusting sliding seat 10; the clamping table 3 is arranged at the piston end of the adjusting cylinder 4. The clamping seat 5 is arranged on the clamping table 3; the clamping lead screw 6 is threadedly connected with the clamping seat 5; the clamping plate 7 is arranged at one end of the clamping lead screw 6; the testing rack 8 is arranged between the clamping seat 5 and the clamping plate 7; and the FLASH chip body 9 is arranged on the testing rack 8.

[0053] Further, the pipeline guide rail 14 is further included; the pipeline guide rail 14 is arranged on the chip testing pipeline; and the jig sliding base 1 is slidingly arranged on the pipeline guide rail 14.

[0054] It should be noted that the FLASH chip body 9 to be detected is arranged on the testing rack 8, and the testing pins of the FLASH chip body 9 are in contact with the testing ports on the testing rack 8. When testing a single FLASH chip body 9, the extension edge of the testing rack 8 is clamped with the FLASH chip body 9; when testing multiple groups of FLASH chip bodies 9, the testing limiting pins 30 on the testing rack 8 are clamped with the multiple groups of FLASH chip bodies 9. The testing rack 8 provided with the FLASH chip body 9 is arranged on the clamping seat 5; the clamping plate 7 is driven by the clamping lead screw 6 to clamp and fix the FLASH chip body 9. The testing rack 8 is arranged on the stable clamping seat 27. The position relationship between the clamping mounting rod 21 and the clamping adjusting rod 22 is adjusted by the fixing member 23, so that the two ends of the testing rack 8 can be fixed on the clamping tables 3 of the two groups of adjusting cylinders 4 at the two ends of the adjusting base 2. The adjusting sliding seat 10 is driven by the meshing gear 11 to slide on the adjusting base 2, so as to drive the overall testing rack 8 and the FLASH chip bodies 9 thereon to rotate relative to the adjusting base 2, so that the testing ports of the testing rack 8 are in contact with the testing probes on the testing pipeline; the jig sliding base 1 is arranged to drive the adjusting base 2 to move along the working direction on the pipeline guide rail 14.

[0055] Embodiment six

[0056] The FLASH storage chip testing jig provided in the embodiment includes a jig sliding base 1, an adjusting base 2, a clamping table 3, an adjusting cylinder 4, a clamping seat 5, a clamping lead screw 6, a clamping plate 7, a testing rack 8, and an adjusting sliding seat 10.

[0057] As Figures 1-4As shown, the jig sliding base 1 is slidingly arranged on the chip testing pipeline. The adjusting base 2 is arranged on the jig sliding base 1; the adjusting sliding seat 10 is adjustably arranged on the adjusting base 2; the cylinder end of the adjusting cylinder 4 is arranged on the adjusting sliding seat 10; the clamping table 3 is arranged at the piston end of the adjusting cylinder 4. The clamping seat 5 is arranged on the clamping table 3; the clamping lead screw 6 is threadedly connected with the clamping seat 5; the clamping plate 7 is arranged at one end of the clamping lead screw 6; the testing rack 8 is arranged between the clamping seat 5 and the clamping plate 7; and the FLASH chip body 9 is arranged on the testing rack 8.

[0058] Further, the clamping mounting rod 21, the clamping adjusting rod 22, the fixing member 23 and the clamping adjusting seat 24 are further included; the clamping adjusting seat 24 is arranged on the clamping table 3; the clamping mounting rod 21 is arranged on the clamping adjusting seat 24; and the clamping adjusting rod 22 is adjustably arranged on the clamping mounting rod 21 through the fixing member 23. The FLASH chip body 9 is clamped by the stable clamping lead screw 28 and the stable clamping plate 29.

[0059] In an optional embodiment, the spring connecting seat 25, the spring 26, the stable clamping seat 27, the stable clamping lead screw 28 and the stable clamping plate 29 are further included; the spring connecting seat 25 is arranged on the clamping table 3; one end of the spring 26 is arranged on the spring connecting seat 25, and the other end of the spring 26 is arranged on the stable clamping seat 27; the stable clamping lead screw 28 is threadedly connected with the stable clamping seat 27; the stable clamping plate 29 is arranged at one end of the stable clamping lead screw 28; and the FLASH chip body 9 is arranged between the stable clamping seat 27 and the stable clamping plate 29. The FLASH chip body 9 is clamped by the stable clamping lead screw 28 and the stable clamping plate 29, and the testing rack 8 is kept stable by the spring 26. The elastic restoring force of the spring 26 can play a role in shock absorption during transportation of the chip body 9.

[0060] It needs to be explained that the FLASH chip body 9 to be detected is arranged on the test rack 8, and the test pins of the FLASH chip body 9 are in contact with the test ports on the test rack 8. When testing a single FLASH chip body 9, the extension edge of the test rack 8 is clamped with the FLASH chip body 9; when testing multiple groups of FLASH chip bodies 9, the test limiting pins 30 on the test rack 8 are clamped with the multiple groups of FLASH chip bodies 9. The test rack 8 provided with the FLASH chip body 9 is arranged on the clamping seat 5; the clamping plate 7 is driven by the clamping lead screw 6 to clamp and fix the FLASH chip body 9. The test rack 8 is arranged on the stable clamping seat 27, the stable clamping plate 29 is driven by the stable clamping lead screw 28 to clamp the FLASH chip body 9, and the spring 26 is used to keep the stability of the test rack 8. The positional relationship between the clamping mounting rod 21 and the clamping adjusting rod 22 is adjusted by the fixing piece 23, so that the two ends of the test rack 8 can be fixed on the clamping table 3 on the two groups of adjusting cylinders 4 at the two ends of the adjusting base 2. The adjusting sliding seat 10 is driven by the meshing gear 11 to slide on the adjusting base 2, so as to drive the whole test rack 8 and the FLASH chip body 9 thereon to rotate relative to the adjusting base 2, so that the test ports of the test rack 8 are in contact with the test probes on the test flow line; the jig sliding base 1 drives the adjusting base 2 to move on the test flow line along the working direction.

[0061] A FLASH storage chip test fixture, a method for using the same, characterized in that it comprises the following steps:

[0062] S1, arranging the FLASH chip body 9 to be detected on the test rack 8, and making the test pins of the FLASH chip body 9 in contact with the test ports on the test rack 8.

[0063] S2, when testing a single FLASH chip body 9, the extension edge of the test rack 8 is clamped with the FLASH chip body 9; when testing multiple groups of FLASH chip bodies 9, the test limiting pins 30 on the test rack 8 are clamped with the multiple groups of FLASH chip bodies 9.

[0064] S3, the test rack 8 provided with the FLASH chip body 9 is arranged on the clamping seat 5; the clamping plate 7 is driven by the clamping lead screw 6 to clamp and fix the FLASH chip body 9.

[0065] S4, the test rack 8 is arranged on the stable clamping seat 27, the stable clamping plate 29 is driven by the stable clamping lead screw 28 to clamp the FLASH chip body 9, and the spring 26 is used to keep the stability of the test rack 8.

[0066] S5, adjust the position relationship between the clamping installation rod 21 and the clamping adjustment rod 22 by the fixing part 23, so that the two ends of the test rack 8 can be fixed on the clamping table 3 on the two groups of adjustment cylinders 4 at the two ends of the adjustment base 2.

[0067] S6, drive the adjustment sliding seat 10 to slide on the adjustment base 2 by the meshing gear 11, so as to drive the whole test rack 8 and the FLASH chip body 9 thereon to rotate relative to the adjustment base 2, so as to make the test port of the test rack 8 contact with the test probe on the test flow line; set the jig sliding base 1 to drive the adjustment base 2 to move on the test flow line along the working direction as a whole.

[0068] It should be understood that the above specific embodiments of the present application are only used for illustrative or explanatory purposes of the principles of the present application, and do not constitute a limitation of the present application. Therefore, any modification, equivalent replacement, improvement, etc. made without departing from the spirit and scope of the present application shall be included in the protection scope of the present application. In addition, the appended claims of the present application are intended to cover all variations and modifications falling within the scope and boundary of the appended claims, or the equivalent forms of such scope and boundary.

Claims

1. A FLASH memory chip test fixture, comprising: The utility model relates to a FLASH chip testing device, including tool slide base (1), adjusting base (2), clamping platform (3), adjusting cylinder (4), clamping seat (5), clamping lead screw (6), clamping plate (7), test frame (8) and adjusting slide seat (10); The tool slide base (1) is slidably arranged on the chip testing pipeline; The adjusting base (2) is arranged on the tool slide base (1), the adjusting slide seat (10) is adjustably arranged on the adjusting base (2), the cylinder end of the adjusting cylinder (4) is arranged on the adjusting slide seat (10), and the clamping platform (3) is arranged on the piston end of the adjusting cylinder (4); The clamping seat (5) is arranged on the clamping platform (3), the clamping lead screw (6) is threadedly connected with the clamping seat (5), the clamping plate (7) is arranged at one end of the clamping lead screw (6), the test frame (8) is arranged between the clamping seat (5) and the clamping plate (7), and the FLASH chip body (9) is arranged on the test frame (8).

2. The FLASH memory chip test fixture of claim 1, wherein, The utility model also includes meshing gear (11), driving motor (12) and meshing gear ring (13), the meshing gear (11) driven by the driving motor (12) is rotatably arranged on the adjusting slide seat (10), the meshing gear ring (13) is arranged on the adjusting base (2), and the meshing gear (11) is in meshing connection with the meshing gear ring (13).

3. The FLASH memory chip test fixture of claim 1, wherein, The utility model also includes test limiting pin (30), the test frame (8) is provided with a general assembly test port, the test limiting pin (30) is arranged on the test frame (8), and the test limiting pin (30) is in communication connection with the general assembly test port and a plurality of FLASH chip bodies (9) arranged on the test frame (8).

4. The FLASH memory chip test fixture of claim 1, wherein, The utility model also includes laminated support rod, laminated connecting seat (18) and laminated base (20), the laminated support rod is arranged on the adjusting base (2), the laminated connecting seat (18) is arranged at one end of the laminated support rod away from the adjusting base (2), the laminated base (20) is arranged on the other side of the adjusting base (2), and the laminated base (20) and the laminated connecting seat (18) are correspondingly clamped.

5. The FLASH memory chip test fixture of claim 4, wherein, The laminated support rod includes sleeve rod (15), threaded rod (16) and adjusting knob (17), the sleeve rod (15) is arranged on the adjusting base (2), the adjusting knob (17) is rotatably arranged on the sleeve rod (15), the adjusting knob (17) is in threaded connection with the threaded rod (16), the threaded rod (16) is slidably arranged on the sleeve rod (15), and the laminated connecting seat (18) is arranged at one end of the threaded rod (16) away from the sleeve rod (15).

6. The FLASH memory chip test fixture of claim 4, wherein, The utility model also includes clamping block (19), the clamping block (19) is arranged on the laminated connecting seat (18), the laminated base (20) is provided with a clamping groove corresponding to the clamping block (19), and the laminated base (20) is clamped with the clamping block (19) through the clamping groove.

7. The FLASH memory chip test fixture of claim 1, wherein, The utility model also includes pipeline guide rail (14), the pipeline guide rail (14) is arranged on the chip testing pipeline, and the tool slide base (1) is slidably arranged on the pipeline guide rail (14).

8. The FLASH memory chip test fixture of claim 1, wherein, The clamp mounting rod (21), the clamp adjusting rod (22), the fixing piece (23) and the clamp adjusting seat (24) are further included; the clamp adjusting seat (24) is arranged on the clamping table (3); the clamp mounting rod (21) is arranged on the clamp adjusting seat (24); the clamp adjusting rod (22) is adjustably arranged on the clamp mounting rod (21) through the fixing piece (23).

9. The FLASH memory chip test fixture of claim 1, wherein, The spring connecting seat (25), the spring (26), the stable clamping seat (27), the stable clamping lead screw (28) and the stable clamping plate (29) are further included; the spring connecting seat (25) is arranged on the clamping table (3); one end of the spring (26) is arranged on the spring connecting seat (25), and the other end of the spring (26) is arranged on the stable clamping seat (27); the stable clamping lead screw (28) is threadedly connected with the stable clamping seat (27); the stable clamping plate (29) is arranged at one end of the stable clamping lead screw (28); the FLASH chip body (9) is arranged between the stable clamping seat (27) and the stable clamping plate (29).

10. The FLASH memory chip test fixture according to any one of claims 1-9, wherein the method of using the fixture comprises: The steps include: S1, the FLASH chip body (9) to be detected is arranged on the test frame (8), and the test pin of the FLASH chip body (9) is in contact with the test port on the test frame (8); S2, when testing a single FLASH chip body (9), the extension edge of the test frame (8) is clamped with the FLASH chip body (9); when testing multiple groups of FLASH chip bodies (9), the test limiting pin (30) on the test frame (8) is clamped with the multiple groups of FLASH chip bodies (9); S3, the test frame (8) provided with the FLASH chip body (9) is arranged on the clamping seat (5); the clamping plate (7) is driven by the clamping lead screw (6) to clamp and fix the FLASH chip body (9); S4, the test frame (8) is arranged on the stable clamping seat (27); the stable clamping plate (29) is driven by the stable clamping lead screw (28) to clamp the FLASH chip body (9), and the spring (26) is used to keep the stability of the test frame (8); S5, the positional relationship between the clamp mounting rod (21) and the clamp adjusting rod (22) is adjusted by the fixing piece (23), so that the two ends of the test frame (8) can be fixed on the clamping table (3) of the two groups of adjusting cylinders (4) at the two ends of the adjusting base (2); S6, the adjusting sliding seat (10) is driven by the meshing gear (11) to slide on the adjusting base (2), so as to drive the overall test frame (8) and the FLASH chip body (9) thereon to rotate relative to the adjusting base (2), so that the test port of the test frame (8) is in contact with the test probe on the test assembly line; the adjusting base (2) is driven by the jig sliding base (1) to move on the test assembly line along the working direction.

Images