A method, device, storage medium and terminal for optimizing drift rate of rubidium atomic clock

Abstract

The present application relates to a method, device, storage medium and terminal for optimizing the drift rate of a rubidium atomic clock. The method comprises: collecting frequency difference data of the rubidium atomic clock relative to a reference signal; establishing a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and the least squares method; and adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship. The present application focuses on the frequency drift compensation technology for the aging of key components inside the rubidium atomic clock. By analyzing the drift rate characteristics of the rubidium atomic clock, it is proposed to adjust the accuracy of the output frequency of the rubidium atomic clock by adjusting the voltage-controlled voltage of the constant temperature crystal oscillator inside the rubidium atomic clock, thereby improving the drift rate of the rubidium atomic clock.

Description

Technical Field

[0001] The present invention relates to the technical field of rubidium atomic clock optimization, and more specifically, to a method, device, storage medium and terminal for optimizing the drift rate of a rubidium atomic clock. Background Art

[0002] There are three main indicators of rubidium atomic clocks, namely frequency stability, frequency accuracy and frequency drift rate. The frequency drift rate is calculated through frequency accuracy, which is an inherent characteristic of atomic frequency standards and has a significant impact on the overall performance of rubidium atomic clocks.

[0003] The frequency drift rate plays an important role in satellite time synchronization and frequency calibration systems. When the accuracy requirements for time synchronization and frequency calibration are high, the frequency drift rate needs to meet certain requirements. As one of the most important indicators of rubidium atomic clocks, the quality of this indicator determines the performance of rubidium atomic clocks. The drift phenomenon of rubidium atomic clocks is the result of the combined influence of multiple factors, among which the most important are temperature drift and aging drift. Temperature drift is the frequency drift caused by changes in the working environment temperature of the rubidium atomic clock. Aging drift refers to the frequency drift caused by the aging of the internal components of the rubidium atomic clock. The drift rate is a key indicator for measuring the autonomous navigation time of the rubidium atomic clock. Therefore, the adjustment and optimization of the drift rate is the core link in the development process of the rubidium atomic clock. We must find a way to minimize the indicator as much as possible in order to obtain better overall performance. The main problem with drift rate adjustment at present is that many steps in the production process of rubidium atomic clocks are completed manually, and there are many factors that affect the drift rate index, such as the size of the rubidium bubble, absorption bubble, filter bubble, etc. Therefore, it is difficult for the drift rate index of the rubidium atomic clock to achieve an absolute value less than 5E-14.

[0004] In order to improve the drift rate, the frequency drift characteristics of the rubidium atomic clock are generally optimized by the following two methods: 1. First, a drift rate model is established based on the frequency drift test data of the rubidium atomic clock, and then the DDS is adjusted to achieve the purpose of optimizing the frequency drift rate of the rubidium atomic clock; 2. The temperature of the lamp room and chamber of the physical part of the rubidium atomic clock is adjusted. The basic principle of this method is to achieve the purpose of optimizing the frequency drift rate characteristics of the rubidium atomic clock by reducing the optical frequency shift. The above two methods require a lot of theoretical analysis and experimental data, including measuring the startup characteristics of the rubidium atomic clock, the buffer gas pressure frequency shift, the influence of the lamp temperature and the cavity temperature on the accuracy, the microwave power frequency shift, etc., and considering that there are many links in the production process of each rubidium atomic clock that need to be completed manually, such as the rubidium bubble, the absorption gun and the filter bubble filling process, the debugging of the microwave cavity, the assembly of the cavity bubble system, etc. This results in each rubidium atomic clock may have different frequency drift rate indicators, so the above methods are difficult to effectively optimize the frequency drift rate of the rubidium atomic clock. Summary of the invention

[0005] The embodiments of the present application provide a method, device, storage medium and terminal for optimizing the drift rate of a rubidium atomic clock. In order to have a basic understanding of some aspects of the disclosed embodiments, a simple summary is given below. This summary is not a general review, nor is it intended to identify key / important components or describe the scope of protection of these embodiments. Its only purpose is to present some concepts in a simple form as a preface to the detailed description that follows.

[0006] In a first aspect, an embodiment of the present application provides a method for optimizing the drift rate of a rubidium atomic clock, the method comprising:

[0007] Collect frequency difference data of the rubidium atomic clock relative to the reference signal;

[0008] Establishing a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and the least square method;

[0009] The output frequency of the rubidium atomic clock is adjusted according to the time-frequency difference model and the voltage-frequency fitting relationship.

[0010] According to a preferred embodiment, the collecting of frequency difference data of the rubidium atomic clock relative to the reference signal includes:

[0011] The frequency difference data is collected within a first preset time range.

[0012] According to a preferred implementation, the collecting the frequency difference data within a first preset time range includes:

[0013] Collecting the output frequency and reference frequency of the rubidium atomic clock within a first preset time range;

[0014] The frequency difference data is obtained according to the output frequency and the reference frequency.

[0015] According to a preferred embodiment, adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship includes:

[0016] Predicting the frequency adjustment amount of the rubidium atomic clock according to the time-frequency difference model;

[0017] Converting the frequency adjustment amount into a voltage change amount of the rubidium atomic clock;

[0018] The output frequency within a second preset time range is adjusted according to the voltage variation and the voltage-frequency fitting relationship.

[0019] According to a preferred embodiment, before adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship, the method further includes:

[0020] Testing the constant temperature crystal oscillator voltage control voltage and output frequency of the rubidium atomic clock;

[0021] The temperature-controlled crystal oscillator voltage and output frequency are fitted to obtain the voltage-frequency fitting relationship.

[0022] According to a preferred embodiment, further comprising:

[0023] The time-frequency difference model is updated according to the frequency difference data and the output frequency.

[0024] According to another aspect of a preferred embodiment, the present application provides a device for optimizing the drift rate of a rubidium atomic clock, the device comprising:

[0025] A data acquisition module, used to collect frequency difference data of the rubidium atomic clock relative to the reference signal;

[0026] A model building module, used to build a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and the least square method;

[0027] The adjustment module is used to adjust the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship.

[0028] According to a preferred embodiment, the adjustment module comprises:

[0029] A prediction unit, configured to predict a frequency adjustment amount of the rubidium atomic clock according to the time-frequency difference model;

[0030] A conversion unit, used for converting the frequency adjustment amount into a voltage change amount of the rubidium atomic clock;

[0031] A frequency adjustment unit is used to adjust the output frequency of the rubidium atomic clock within a second preset time range according to the voltage change amount and the voltage-frequency fitting relationship.

[0032] According to another aspect of a preferred implementation, an embodiment of the present application provides a computer storage medium, which stores a plurality of instructions suitable for being loaded by a processor and executing the above-mentioned method steps.

[0033] According to another aspect of a preferred implementation, an embodiment of the present application provides a terminal, which may include: a processor and a memory; wherein the memory stores a computer program, and the computer program is suitable for being loaded by the processor and executing the above-mentioned method steps.

[0034] The technical solution provided by the embodiments of the present application may have the following beneficial effects:

[0035] In an embodiment of the present application, the method for optimizing the drift rate of a rubidium atomic clock collects frequency difference data of the rubidium atomic clock relative to a reference signal; based on the frequency difference data and the least squares method, a time-frequency difference model of the rubidium atomic clock is established; and based on the time-frequency difference model and the voltage-frequency fitting relationship, the output frequency of the rubidium atomic clock is adjusted. The present application combines the time-frequency difference model of a rubidium atomic clock, the voltage-controlled voltage of a constant temperature crystal oscillator and the output frequency of the rubidium atomic clock. When the rubidium atomic clock operates normally, the output frequency of the rubidium atomic clock is adjusted by the voltage-controlled voltage of the crystal oscillator inside the rubidium atomic clock, thereby optimizing the frequency drift rate characteristics of the rubidium atomic clock. The frequency drift rate of the rubidium atomic clock can be automatically adjusted, and the adjustment range of the frequency drift rate of the rubidium atomic clock is widened, thereby improving the long-term stability and accuracy of the output frequency of the rubidium atomic clock. The present application is used to optimize the drift rate index of the rubidium atomic clock, thereby improving the performance index and yield rate of the rubidium atomic clock, and has positive significance for reducing the development cost of the rubidium atomic clock and improving the drift rate of the rubidium atomic clock.

[0036] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0038] Figure 1 It is a flow chart of a method for optimizing the drift rate of a rubidium atomic clock provided in an embodiment of the present application;

[0039] Figure 2 It is a schematic diagram of a fitting curve of the constant temperature crystal oscillator voltage-frequency data of a rubidium atomic clock A in a test laboratory of a method for optimizing the drift rate of a rubidium atomic clock provided in an embodiment of the present application;

[0040] Figure 3 It is a schematic diagram of a fitting curve of the constant temperature crystal oscillator voltage-frequency data of a rubidium atomic clock B in a test laboratory of a method for optimizing the drift rate of a rubidium atomic clock provided in an embodiment of the present application;

[0041] Figure 4 It is a schematic diagram of the optimization principle of a rubidium atomic clock according to a method for optimizing the drift rate of a rubidium atomic clock provided in an embodiment of the present application;

[0042] Figure 5 is a schematic diagram of a device for optimizing the drift rate of a rubidium atomic clock provided in an embodiment of the present application;

[0043] Figure 6 is a schematic diagram of an adjustment module of a device for optimizing the drift rate of a rubidium atomic clock provided in an embodiment of the present application;

[0044] Figure 7 This is a terminal schematic diagram provided in an embodiment of the present application. DETAILED DESCRIPTION

[0045] The following description and the drawings sufficiently illustrate specific embodiments of the invention to enable those skilled in the art to practice them.

[0046] It should be clear that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0047] When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present invention. Instead, they are only examples of systems and methods consistent with some aspects of the present invention as detailed in the attached claims.

[0048] In the description of the present invention, it should be understood that the terms "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying relative importance. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances. In addition, in the description of the present invention, unless otherwise specified, "plurality" refers to two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. The character " / " generally indicates that the previously associated objects are in an "or" relationship.

[0049] The following will be combined with the attached Figure 1 -Attached Figure 4 , a method for optimizing the drift rate of a rubidium atomic clock provided in an embodiment of the present application is introduced in detail.

[0050] See also Figure 1-4 , which is a flow chart of a method for optimizing the drift rate of a rubidium atomic clock according to an embodiment of the present application. Figure 1-4 As shown, the method of the embodiment of the present application may include the following steps:

[0051] In traditional rubidium atomic clocks, as the assembly of the rubidium atomic clock is completed, the drift rate is basically fixed. At this time, the drift rate can only slowly decrease with the increase of running time. However, through theoretical analysis and experiments, it is proved that there is a certain relationship between the voltage control voltage of the constant temperature crystal oscillator inside the rubidium atomic clock and the output frequency. When the voltage control voltage changes, the output frequency will also change accordingly. Therefore, by adjusting the voltage control terminal voltage of the constant temperature crystal oscillator, the output frequency accuracy of the rubidium atomic clock can be adjusted.

[0052] In order to solve the problem of large drift rate of rubidium atomic clock, the embodiment of the present application proposes a method for optimizing the drift rate of rubidium atomic clock. The system block diagram of the whole design is as follows: Figure 4 As shown, it specifically includes: a frequency difference measurement module, an MCU control module, a D / A converter and a rubidium atomic clock; the frequency difference measurement module is respectively connected to the constant temperature crystal oscillator, the reference signal and the MCU control module in the rubidium atomic clock, and the MCU control module is connected to the voltage control end of the constant temperature crystal oscillator in the rubidium atomic clock through the D / A converter; the reference signal can represent a signal of a reference frequency, and the rubidium atomic clock signal can represent a signal of the output frequency of the rubidium atomic clock.

[0053] Step 1, collecting frequency difference data of the rubidium atomic clock relative to the reference signal. In step 1, it includes:

[0054] Collecting the frequency difference data within a first preset time range includes:

[0055] The output frequency and the reference frequency of the rubidium atomic clock within the first preset time range are collected, and the frequency difference data is obtained according to the output frequency and the reference frequency.

[0056] After a rubidium atomic clock is determined to be stable after startup, the frequency difference data between the 10MHz signal output by the rubidium atomic clock and the reference 10MHz signal within the first preset time range is measured by the frequency difference measurement module. The output frequency can be the output 10MHz signal, and the reference frequency can be the reference 10MHz signal. The first preset time range represents the frequency difference measurement duration range, and the frequency difference measurement duration can be dynamically adjusted according to the frequency difference data, so that the embodiment of the present application can obtain the latest time-frequency difference model of the rubidium atomic clock and realize the rapid optimization of the frequency drift rate characteristics of the rubidium atomic clock. The frequency difference measurement module sends the frequency difference data to the MCU control module.

[0057] Step 2: Establish a time-frequency difference model of the rubidium atomic clock based on the frequency difference data and the least squares method.

[0058] In the embodiment of the present application, after the MCU control module receives the frequency difference data, the MCU control module fits the frequency difference data by a linear fitting method based on the principle of least squares, and the fitting model is: y=ax+b, so that the sum of the squares of the deviations between each actual data point and the fitting curve is minimized, and finally the values ​​of a and b are obtained, thereby realizing the modeling of the time-frequency difference relationship of the rubidium atomic clock and obtaining the time-frequency difference model of the rubidium atomic clock. The time-frequency difference model is also called the frequency difference change model, which represents the changing trend of the frequency difference.

[0059] Before step 3, also include:

[0060] Testing the constant temperature crystal oscillator voltage control voltage and output frequency of the rubidium atomic clock;

[0061] The constant temperature crystal oscillator voltage control voltage and the output frequency are fitted to obtain the voltage-frequency fitting relationship. The constant temperature crystal oscillator voltage control voltage can be a 10 MHz constant temperature crystal oscillator voltage control voltage.

[0062] In an embodiment of the present application, data between the voltage-controlled voltage and the output frequency accuracy of a specific constant temperature crystal oscillator inside a rubidium atomic clock are measured, and a mathematical model between the voltage-controlled voltage and the output frequency of the constant temperature crystal oscillator in the rubidium atomic clock is established by the linear fitting method based on the least squares principle, thereby determining the fitting relationship between the voltage-controlled voltage and the output frequency of the constant temperature crystal oscillator inside the rubidium atomic clock. The fitting relationship between the voltage-controlled voltage and the output frequency of the constant temperature crystal oscillator inside the rubidium atomic clock is the voltage-frequency fitting relationship of the rubidium atomic clock.

[0063] The embodiment of the present application fits the voltage-controlled voltage and output frequency of the constant temperature crystal oscillator in two known rubidium atomic clocks in the test laboratory. The fitting curve between the voltage-controlled voltage and output frequency of the constant temperature crystal oscillator in the rubidium atomic clock is shown in the figure. Figure 2 and Figure 3 As shown in the figure, the relationship between the voltage at the crystal oscillator voltage control terminal and the output frequency in the rubidium atomic clock A is:

[0064] y=1.45617x+9.99999E6

[0065] The relationship between the voltage at the crystal oscillator voltage control terminal and the output frequency in the rubidium atomic clock B is:

[0066] y=1.31097x+1E7

[0067] It can be seen that the voltage and output frequency of the constant temperature crystal oscillator are basically in a linear relationship. The embodiment of the present application can establish the relationship between the voltage at the voltage control terminal and the output frequency of the constant temperature crystal oscillator through linear fitting.

[0068] Step 3, adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship. In step 3, it includes:

[0069] Predicting the frequency adjustment amount of the rubidium atomic clock according to the time-frequency difference model;

[0070] Converting the frequency adjustment amount into a voltage change amount of the rubidium atomic clock;

[0071] The output frequency within a second preset time range is adjusted according to the voltage variation and the voltage-frequency fitting relationship.

[0072] In the embodiment of the present application, the MCU control module can predict the DAC compensation output parameter of the rubidium atomic clock within the second prediction time range according to the time-frequency difference model, and convert the DAC compensation output parameter of the rubidium atomic clock into the voltage change at the constant temperature crystal oscillator voltage control end, and finally adjust the output frequency of the rubidium atomic clock according to the way of adjusting the voltage change in the voltage-frequency fitting relationship, so that the accuracy of the output frequency is improved, the frequency drift rate of the rubidium atomic clock is optimized, and the overall performance of the rubidium atomic clock is improved. The DAC compensation output parameter of the rubidium atomic clock can refer to the frequency adjustment amount of the rubidium atomic clock.

[0073] The embodiment of the present application can cycle the operations of step 1, step 2 and step 3 in sequence to achieve the optimization of the frequency drift rate of the rubidium atomic clock. The second preset time range can be called the compensation time or the time range of frequency adjustment, which can be dynamically and flexibly adjusted according to the frequency difference data to achieve the best frequency drift rate optimization effect.

[0074] For example: after the rubidium atomic clock is powered on and stabilized, its frequency drift rate is large and the frequency difference data is also large, so the second preset time range can be relatively small. After the rubidium atomic clock has been running for a period of time, its frequency drift rate is small and the frequency difference data is also small. At this time, the second preset time range can be appropriately increased.

[0075] In an embodiment of the present application, the method further includes:

[0076] The time-frequency difference model is updated according to the frequency difference data and the output frequency.

[0077] The MCU processing unit included in the MCU control module is embedded with a software algorithm, that is, the time-frequency difference model of the rubidium atomic clock is updated every second preset time to ensure the authenticity of the time-frequency difference model of the rubidium atomic clock. The first preset time range is before the second preset time range.

[0078] When there is no external reference signal, the MCU processing unit can complete the modeling of the simplified drift rate model, namely the time-frequency difference model, according to the previous frequency difference data, and then optimize the drift rate according to the new time-frequency difference model.

[0079] In summary, the embodiment of the present application proposes a method for optimizing the drift rate of a rubidium atomic clock. After the rubidium atomic clock is powered on and stabilized, a time-frequency difference model of the rubidium atomic clock is constructed based on the frequency difference data between the output frequency of the rubidium atomic clock and the reference frequency within a first preset time range; the tested constant temperature crystal oscillator voltage-controlled voltage and output frequency of the rubidium atomic clock are fitted to obtain the voltage-frequency fitting relationship of the rubidium atomic clock. The frequency adjustment amount within the second preset time range is estimated based on the time-frequency difference model, and the frequency adjustment amount is converted into a voltage change amount. According to the voltage change amount and the voltage-frequency fitting relationship, the rubidium atomic clock DAC compensation output parameters are determined to achieve the adjustment of the output frequency of the atomic clock. The embodiment of the present application is simple, practical and has an optimized design. It combines the time-frequency difference model of the rubidium atomic clock, the voltage-controlled voltage of the constant temperature crystal oscillator and the output frequency of the rubidium atomic clock. When the rubidium atomic clock operates normally, the output frequency of the rubidium atomic clock is adjusted by the voltage-controlled voltage of the crystal oscillator inside the rubidium atomic clock, thereby optimizing the frequency drift rate characteristics of the rubidium atomic clock. It can not only automatically adjust the frequency drift rate of the rubidium atomic clock, but also broaden the adjustment range of the frequency drift rate of the rubidium atomic clock, thereby improving the long-term stability and accuracy of the output frequency of the rubidium atomic clock. It is used to optimize the drift rate index of the rubidium atomic clock, thereby improving the performance index and yield rate of the rubidium atomic clock, and has positive significance for reducing the development cost of the rubidium atomic clock and improving the drift rate of the rubidium atomic clock.

[0080] The following are embodiments of the device of the present invention, which can be used to implement the method embodiments of the present invention. For details not disclosed in the device embodiments of the present invention, please refer to the method embodiments of the present invention.

[0081] See also Figure 5 and Figure 6 , which shows a schematic diagram of the structure of a device for optimizing the drift rate of a rubidium atomic clock provided by an exemplary embodiment of the present invention. The device includes: a data acquisition module 1, a model building module 2 and an adjustment module 3. The adjustment module 3 includes a prediction unit 4, a conversion unit 5 and a frequency adjustment unit 6;.

[0082] Data acquisition module 1, used to collect frequency difference data of the rubidium atomic clock relative to the reference signal;

[0083] Model building module 2, used to build the time-frequency difference model of the rubidium atomic clock according to the frequency difference data and the least square method;

[0084] The adjustment module 3 adjusts the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship.

[0085] According to a preferred embodiment, the adjustment module 3 includes:

[0086] Prediction unit 4, used for predicting the frequency adjustment amount of the rubidium atomic clock according to the time-frequency difference model;

[0087] A conversion unit 5, used for converting the frequency adjustment amount into a voltage change amount of the rubidium atomic clock;

[0088] The frequency adjustment unit 6 is used to adjust the output frequency of the rubidium atomic clock within a second preset time range according to the voltage variation and the voltage-frequency fitting relationship.

[0089] It should be noted that, when executing the method, the above embodiment provides a device for optimizing the drift rate of a rubidium atomic clock, and only uses the division of the above functional modules as an example. In practical applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above. In addition, the above embodiment provides a device for optimizing the drift rate of a rubidium atomic clock and a method for optimizing the drift rate of a rubidium atomic clock, which are of the same concept. The implementation process is detailed in the method embodiment, which will not be repeated here.

[0090] The serial numbers of the above-mentioned embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0091] The device for optimizing the drift rate of a rubidium atomic clock collects frequency difference data of the rubidium atomic clock relative to a reference signal; establishes a time-frequency difference model of the rubidium atomic clock based on the frequency difference data and the least squares method; and adjusts the output frequency of the rubidium atomic clock based on the time-frequency difference model and a voltage-frequency fitting relationship. The embodiment of the present application combines the time-frequency difference model of the rubidium atomic clock, the voltage-controlled voltage of the constant temperature crystal oscillator and the output frequency of the rubidium atomic clock. When the rubidium atomic clock operates normally, the output frequency of the rubidium atomic clock is adjusted by the voltage-controlled voltage of the crystal oscillator inside the rubidium atomic clock, thereby optimizing the frequency drift rate characteristics of the rubidium atomic clock. Not only can the frequency drift rate of the rubidium atomic clock be automatically adjusted, but also the adjustment range of the frequency drift rate of the rubidium atomic clock is widened, and the long-term stability and accuracy of the output frequency of the rubidium atomic clock are improved; it is used to optimize the drift rate index of the rubidium atomic clock, improve the performance index and yield of the rubidium atomic clock, and has positive significance for reducing the development cost of the rubidium atomic clock and improving the drift rate of the rubidium atomic clock.

[0092] The present invention also provides a computer-readable medium having program instructions stored thereon, and when the program instructions are executed by a processor, the method for optimizing the drift rate of a rubidium atomic clock provided by the above-mentioned various method embodiments is implemented.

[0093] The present invention also provides a computer program product comprising instructions, which, when executed on a computer, enables the computer to execute the method for optimizing the drift rate of a rubidium atomic clock in the above-mentioned various method embodiments.

[0094] See also Figure 7 , which is a schematic diagram of the structure of a terminal provided in an embodiment of the present application. Figure 7 As shown, the terminal 1000 may include: at least one processor 1001 , at least one network interface 1004 , a user interface 1003 , a memory 1005 , and at least one communication bus 1002 .

[0095] The communication bus 1002 is used to realize the connection and communication between these components.

[0096] Among them, the user interface 1003 may include a display screen (Display), a camera (Camera), and the optional user interface 1003 may also include a standard wired interface and a wireless interface.

[0097] The network interface 1004 may include a standard wired interface or a wireless interface (such as a WI-FI interface) according to a preferred implementation.

[0098] Among them, the processor 1001 may include one or more processing cores. The processor 1001 uses various interfaces and lines to connect various parts of the entire electronic device 1000, and executes various functions and processes data of the electronic device 1000 by running or executing instructions, programs, code sets or instruction sets stored in the memory 1005, and calling data stored in the memory 1005. According to a preferred embodiment, the processor 1001 can be implemented in at least one hardware form of digital signal processing (Digital Signal Processing, DSP), field programmable gate array (Field-Programmable Gate Array, FPGA), and programmable logic array (Programmable Logic Array, PLA). The processor 1001 can integrate one or a combination of a central processing unit (Central Processing Unit, CPU), a graphics processing unit (Graphics Processing Unit, GPU) and a modem. Among them, the CPU mainly processes the operating system, user interface and application programs; the GPU is responsible for rendering and drawing the content to be displayed on the display screen; the modem is used to process wireless communication. It can be understood that the above-mentioned modem may not be integrated into the processor 1001, and it can be implemented separately through a chip.

[0099] Among them, the memory 1005 may include a random access memory (Random Access Memory, RAM) and may also include a read-only memory (Read-Only Memory). According to a preferred embodiment, the memory 1005 includes a non-transitory computer-readable storage medium. The memory 1005 can be used to store instructions, programs, codes, code sets or instruction sets. The memory 1005 may include a program storage area and a data storage area, wherein the program storage area may store instructions for implementing an operating system, instructions for at least one function (such as a touch function, a sound playback function, an image playback function, etc.), instructions for implementing the above-mentioned various method embodiments, etc.; the data storage area may store data involved in the above-mentioned various method embodiments, etc. According to a preferred embodiment, the memory 1005 may also be at least one storage device located away from the aforementioned processor 1001. As Figure 7 As shown, the memory 1005 as a computer storage medium may include an operating system, a network communication module, a user interface module, and a rubidium atomic clock drift rate optimization application.

[0100] exist Figure 7 In the terminal 1000 shown, the user interface 1003 is mainly used to provide an input interface for the user and obtain the data input by the user; and the processor 1001 can be used to call the rubidium atomic clock drift rate optimization application stored in the memory 1005, and specifically perform the following operations:

[0101] Collect frequency difference data of the rubidium atomic clock relative to the reference signal;

[0102] Establishing a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and the least square method;

[0103] The output frequency of the rubidium atomic clock is adjusted according to the time-frequency difference model and the voltage-frequency fitting relationship.

[0104] The time-frequency difference model is updated according to the frequency difference data and the output frequency.

[0105] In one embodiment, the processor 1001 specifically performs the following operations when collecting the frequency difference data of the rubidium atomic clock relative to the reference signal:

[0106] Collecting the frequency difference data within a first preset time range, specifically: collecting the frequency difference data within a first preset time range; and establishing a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and the least squares method.

[0107] In one embodiment, before the processor 1001 performs the step of adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship, the processor 1001 specifically performs the following operations:

[0108] Testing the constant temperature crystal oscillator voltage control voltage and output frequency of the rubidium atomic clock;

[0109] The temperature-controlled crystal oscillator voltage and output frequency are fitted to obtain the voltage-frequency fitting relationship.

[0110] In one embodiment, when the processor 1001 performs the step of adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship, the processor 1001 specifically performs the following operations:

[0111] Predicting the frequency adjustment amount of the rubidium atomic clock according to the time-frequency difference model;

[0112] Converting the frequency adjustment amount into a voltage change amount of the rubidium atomic clock;

[0113] The output frequency within a second preset time range is adjusted according to the voltage variation and the voltage-frequency fitting relationship.

[0114] The method and device for optimizing the drift rate of a rubidium atomic clock,

[0115] Collect frequency difference data of the rubidium atomic clock relative to the reference signal; establish the time-frequency difference model of the rubidium atomic clock according to the frequency difference data and the least square method; adjust the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship. The example of this application combines the time-frequency difference model of the rubidium atomic clock, the voltage-controlled voltage of the constant temperature crystal oscillator and the output frequency of the rubidium atomic clock. When the rubidium atomic clock is operating normally, the output frequency of the rubidium atomic clock is adjusted by the crystal oscillator voltage-controlled voltage inside the rubidium atomic clock, thereby optimizing the frequency drift rate characteristics of the rubidium atomic clock, not only automatically adjusting the frequency drift rate of the rubidium atomic clock, but also broadening the adjustment range of the frequency drift rate of the rubidium atomic clock, and improving the long-term stability and accuracy of the output frequency of the rubidium atomic clock; it is used to optimize the drift rate index of the rubidium atomic clock, improve the performance index and yield rate of the rubidium atomic clock, and has positive significance for reducing the development cost of the rubidium atomic clock and improving the drift rate of the rubidium atomic clock.

[0116] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiments can be implemented by instructing related hardware through a computer program. The program can be stored in a computer-readable storage medium, and when the program is executed, it can include the processes of the embodiments of the above-mentioned methods. The storage medium can be a disk, an optical disk, a read-only storage memory, or a random access memory, etc.

[0117] The above disclosure is only the preferred embodiment of the present application, which certainly cannot be used to limit the scope of rights of the present application. Therefore, equivalent changes made according to the claims of the present application are still within the scope covered by the present application.

Claims

1. A method for optimizing the drift rate of a rubidium atomic clock, characterized in that: The following steps are involved: Collect frequency difference data of the rubidium atomic clock relative to the reference signal; According to the frequency difference data and the least square method, a time-frequency difference model of the rubidium atomic clock is established, including: fitting the frequency difference data by a linear fitting method based on the least square method principle to establish the time-frequency difference model of the rubidium atomic clock; According to the time-frequency difference model and the voltage-frequency fitting relationship, adjusting the output frequency of the rubidium atomic clock; Wherein, adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship includes: Predicting a frequency adjustment amount of the rubidium atomic clock according to the time-frequency difference model; Converting the frequency adjustment amount into a voltage change amount of the rubidium atomic clock; According to the voltage variation and the voltage-frequency fitting relationship, adjusting the output frequency within a second preset time range; Before adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship, the method further includes: Testing the constant temperature crystal oscillator voltage control voltage and output frequency of the rubidium atomic clock; The constant temperature crystal oscillator voltage-controlled voltage and the output frequency are fitted to obtain the voltage-frequency fitting relationship. Specifically, a mathematical model between the constant temperature crystal oscillator voltage-controlled voltage and the output frequency is established based on a linear fitting method based on the least squares principle, thereby determining the fitting relationship between the constant temperature crystal oscillator voltage-controlled voltage and the output frequency. The fitting relationship between the constant temperature crystal oscillator voltage-controlled voltage and the output frequency is the voltage-frequency fitting relationship.

2. The method according to claim 1, characterized in that The collecting of frequency difference data of the rubidium atomic clock relative to the reference signal comprises: The frequency difference data is collected within a first preset time range.

3. The method according to claim 2, characterized in that The collecting the frequency difference data within a first preset time range includes: Collecting the output frequency and reference frequency of the rubidium atomic clock within the first preset time range; The frequency difference data is obtained according to the output frequency and the reference frequency.

4. The method according to claim 1, characterized in that: Further, including: The time-frequency difference model is updated according to the frequency difference data and the output frequency.

5. A device for optimizing the drift rate of a rubidium atomic clock, characterized in that: include: A data acquisition module, used to collect frequency difference data of the rubidium atomic clock relative to the reference signal; A model building module, used to build a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and the least squares method, specifically, to fit the frequency difference data by a linear fitting method based on the least squares principle to build the time-frequency difference model of the rubidium atomic clock; An adjustment module, which adjusts the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship; Wherein, the adjustment module includes: A prediction unit, configured to predict a frequency adjustment amount of the rubidium atomic clock according to the time-frequency difference model; A conversion unit, used for converting the frequency adjustment amount into a voltage change amount of the rubidium atomic clock; A frequency adjustment unit, used for adjusting the output frequency of the rubidium atomic clock within a second preset time range according to the voltage variation and the voltage-frequency fitting relationship; Before the adjustment module, it also includes: a voltage-frequency fitting module, which is used to test the constant temperature crystal oscillator voltage-controlled voltage and output frequency of the rubidium atomic clock; the constant temperature crystal oscillator voltage-controlled voltage and the output frequency are fitted to obtain the voltage-frequency fitting relationship. Specifically, a mathematical model between the constant temperature crystal oscillator voltage-controlled voltage and the output frequency is established based on a linear fitting method based on the least squares principle, so as to determine the fitting relationship between the constant temperature crystal oscillator voltage-controlled voltage and the output frequency. The fitting relationship between the constant temperature crystal oscillator voltage-controlled voltage and the output frequency is the voltage-frequency fitting relationship.

6. A computer storage medium, characterized in that: The computer storage medium stores a plurality of instructions, which are suitable for being loaded by a processor and executing the method steps according to any one of claims 1 to 4.

7. A terminal, characterized in that: include: A processor and a memory; wherein the memory stores a computer program, and the computer program is suitable for being loaded by the processor and executing the method steps as claimed in any one of claims 1 to 4.

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