A method and system for testing electronic components

Abstract

The invention discloses a testing method and system for electronic components, and relates to the technical field of electronic component testing. The technical key points of the scheme are as follows: the impedance value and the admittance value of the electronic component to be tested at different frequencies are calculated by the voltage value and the current value of the electronic component to be tested at different frequencies, the impedance value or the admittance value and the corresponding frequency are combined, the slope of the impedance value or the admittance value changing with the frequency is calculated, the performance stability coefficient of the electronic component to be tested is further calculated, the signal attenuation index of the electronic component to be tested is calculated by the input signal amplitude and the output signal amplitude, the performance attenuation coefficient of the electronic component to be tested is further calculated, and the performance evaluation value of the electronic component is calculated by the performance stability coefficient and the performance attenuation coefficient. The invention realizes low-cost, fast, accurate and non-destructive testing of electronic components, thereby evaluating the reliability and stability of the electronic components.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic component testing, and in particular to a method and system for testing electronic components. Background Art

[0002] With the continuous development of science and technology, electronic components are used more and more widely in various electronic devices. Due to the wide variety of electronic components and strict performance requirements, an efficient and accurate electronic component testing method is needed to ensure their quality and reliability. At present, commonly used electronic component testing methods include functional testing and life testing, etc. However, these testing methods have some problems.

[0003] In a Chinese invention application with application publication number CN103645403A, a system and method for testing electronic components in semiconductor production are disclosed, the main technical points of which are: the test machine controls to open the relay switch to connect the polarity electrical parameter test board or the second electrical parameter test board, and loads the corresponding test conditions on the electronic components to complete the polarity test and primary electrical performance parameter test of the electronic components at the first station, and complete the secondary electrical performance parameter test of the electronic components at the second station.

[0004] In a Chinese invention application with application publication number CN114860530A, a testing device, a testing method and a system for electronic components are disclosed, the device comprising: a supporting component for supporting the electronic components to be tested; a central control unit for setting standard specifications and constructing test instruction information and issuing test instruction information according to the types of the electronic components to be tested; a detection component connected to the central control unit, for adjusting the working state of the detection component according to the test instruction information, and obtaining test results under the corresponding working state; a spring component for supporting the supporting component and providing elastic force; the central control unit is also used to determine whether the electronic components to be tested are qualified according to the test results.

[0005] In view of the above invention, the prior art has the following deficiencies:

[0006] 1. The electrical characteristics of electronic components are not fixed, but will fluctuate with the change of operating frequency. The existing technology often fails to fully consider this key factor when evaluating the performance of electronic components. This means that the electrical characteristics of the components may change due to the influence of frequency during actual operation, which in turn poses a potential threat to the stability of the entire system.

[0007] 2. The performance of electronic components is not permanent, but will decay over time. During the production process, if the materials are not stored properly or are stored for too long, this performance degradation phenomenon may become more obvious, which not only affects the service life of the components, but may also cause them to be unable to maintain stable performance output during long-term use, thereby affecting the reliability of the entire system. Summary of the invention

[0008] 1. Technical issues to be resolved

[0009] In view of the deficiencies in the prior art, the present invention provides a method and system for testing electronic components. The impedance value and admittance value of the electronic component to be tested at different frequencies are calculated by using the voltage value and current value of the electronic component to be tested at different frequencies. The impedance value or admittance value and the corresponding frequency are combined to calculate the slope of the impedance value or admittance value changing with the frequency. The performance stability coefficient of the electronic component to be tested is further calculated. The signal attenuation index of the electronic component to be tested is calculated by the input signal amplitude and the output signal amplitude. The performance attenuation coefficient of the electronic component to be tested is calculated according to the signal attenuation index at different frequencies and the signal attenuation index at a reference frequency. The performance of the electronic component is evaluated by the performance stability coefficient and the performance attenuation coefficient, and the performance evaluation value of the electronic component is calculated. The present invention analyzes the performance stability and performance attenuation of the electronic component at different frequencies to achieve low-cost, fast, accurate and non-destructive testing and evaluation of the electronic component, and can achieve full coverage of the test object, thereby solving the problems mentioned in the background technology.

[0010] (II) Technical solution

[0011] To achieve the above objectives, the present invention is implemented by the following technical solutions: A method for testing electronic components, comprising the following steps:

[0012] Collect the voltage and current values ​​of the electronic components under test under sinusoidal signals of different frequencies, the amplitude values ​​of the input signal and the output signal, and establish a test data set;

[0013] The impedance value and admittance value of the electronic component under test at different frequencies are calculated by using the voltage value and current value of the electronic component under test at different frequencies, and the slope of the impedance value or admittance value changing with the frequency is calculated by combining the impedance value or admittance value and the corresponding frequency, and the performance stability coefficient of the electronic component under test is further calculated;

[0014] The signal attenuation index of the electronic component to be tested is calculated by the input signal amplitude and the output signal amplitude, and the performance attenuation coefficient of the electronic component to be tested is calculated according to the signal attenuation index at different frequencies and the signal attenuation index at the reference frequency;

[0015] The performance stability coefficient and the performance attenuation coefficient are normalized to the interval [0,1], the performance of the electronic component is evaluated by the performance stability coefficient and the performance attenuation coefficient, and the performance evaluation value of the electronic component is calculated;

[0016] A first evaluation threshold and a second evaluation threshold are preset, the performance evaluation value of the electronic component is compared with the first evaluation threshold and the second evaluation threshold respectively, and corresponding measures are taken according to the comparison results.

[0017] Furthermore, a signal source is used to generate a series of sinusoidal signals of different frequencies, with the signal frequency gradually increasing from low frequency to high frequency, and a measuring instrument is used to measure the voltage and current values ​​of the electronic component under test at different frequencies, and the amplitude values ​​of the input signal and the output signal.

[0018] Furthermore, the impedance value and admittance value of the electronic component under test at different frequencies are calculated by the voltage value and current value of the electronic component under test at different frequencies. The calculation formula is as follows:

[0019]

[0020] Among them, Z represents impedance, U represents voltage, I represents current, R represents the real part of impedance, X represents the imaginary part of impedance, Y represents admittance, G represents the real part of admittance, B represents the imaginary part of admittance, and j represents the imaginary unit.

[0021] Furthermore, by using the impedance value and admittance value of the electronic component to be tested at different frequencies, a curve graph of the impedance value or admittance value changing with frequency is drawn, with the frequency as the horizontal axis and the impedance value or admittance value as the vertical axis.

[0022] Furthermore, according to the impedance value or admittance value curve, the impedance value or admittance value and the corresponding frequency are combined and dimensionless processed to calculate the slope of the impedance value or admittance value changing with the frequency, and further calculate the performance stability coefficient of the electronic component to be tested, and analyze the performance changes of the electronic component to be tested at different frequencies. The calculation formula is as follows:

[0023]

[0024] Where Rf represents the performance stability coefficient, i represents the number of the impedance value or admittance value at each frequency, i = 1, 2, ..., n, n is a positive integer, f i Indicates the frequency value, V i It represents the reciprocal of impedance or admittance at different frequencies.

[0025] Furthermore, the signal attenuation degree of the electronic component under test at different frequencies is evaluated through the input signal amplitude and the output signal amplitude, and the signal attenuation index of the electronic component under test is calculated. The calculation formula is as follows:

[0026]

[0027] Among them, Sa represents the signal attenuation exponent, and A out represents the output signal amplitude, and A in represents the input signal amplitude.

[0028] Furthermore, based on the signal attenuation exponents at different frequencies and the signal attenuation exponent at the reference frequency, analyze the signal attenuation fluctuation of the electronic component to be measured, and calculate the performance attenuation coefficient of the electronic component to be measured. The calculation formula is as follows:

[0029]

[0030] Among them, Pf represents the performance attenuation coefficient, j represents the number of the signal attenuation exponent at each frequency, j = 1, 2, …, m, m is a positive integer, and Sa j represents the signal attenuation exponents at different frequencies, and Sa represents the signal attenuation exponent at the reference frequency.

[0031] Furthermore, normalize the performance stability coefficient and the performance attenuation coefficient to the interval [0, 1], and evaluate the performance of the electronic component through the performance stability coefficient and the performance attenuation coefficient. Calculate the performance evaluation value of the electronic component. The calculation formula is as follows:

[0032]

[0033] Among them, Ef represents the performance evaluation value, Rf represents the performance stability coefficient, Pf represents the performance attenuation coefficient, k1 and k2 represent the weight coefficients, 0 < k1 < 1, 0 < k2 < 1, and k1 + k2 = 1.

[0034] Furthermore, preset the first evaluation threshold and the second evaluation threshold, compare the performance evaluation value of the electronic component with the first evaluation threshold and the second evaluation threshold respectively, and take corresponding measures according to the comparison results, specifically including:

[0035] When the performance evaluation value < the first evaluation threshold, it indicates that the performance of the electronic component is stable and the performance attenuation degree is low, and no treatment is required;

[0036] When the first evaluation threshold ≤ the performance evaluation value ≤ the second evaluation threshold, it indicates that the performance stability of the electronic component is average and the performance attenuation degree is relatively high. Mark the electronic component as unqualified and prompt that rework or repair is required;

[0037] When the performance evaluation value > the first evaluation threshold, it indicates that the performance of the electronic component is unstable and the performance attenuation degree is high. Mark the electronic component as seriously unqualified and prompt that scrapping treatment is required.

[0038] A test system for electronic components includes a data acquisition module, a performance stability analysis module, a performance degradation analysis module and a result determination module; wherein:

[0039] The data acquisition module collects the voltage and current values ​​of the electronic components to be tested under sinusoidal signals of different frequencies, the amplitude values ​​of the input signal and the output signal, and establishes a test data set;

[0040] The performance stability analysis module calculates the impedance value and admittance value of the electronic component under test at different frequencies through the voltage value and current value of the electronic component under test at different frequencies, combines the impedance value or admittance value with the corresponding frequency, calculates the slope of the impedance value or admittance value changing with the frequency, and further calculates the performance stability coefficient of the electronic component under test;

[0041] The performance attenuation analysis module calculates the signal attenuation index of the electronic component to be tested through the input signal amplitude and the output signal amplitude, and calculates the performance attenuation coefficient of the electronic component to be tested based on the signal attenuation index at different frequencies and the signal attenuation index at the reference frequency;

[0042] The result judgment module normalizes the performance stability coefficient and the performance attenuation coefficient to the interval [0,1], calculates the performance evaluation value of the electronic component through the performance stability coefficient and the performance attenuation coefficient, evaluates the performance of the electronic component, pre-sets a first evaluation threshold and a second evaluation threshold, compares the performance evaluation value of the electronic component with the first evaluation threshold and the second evaluation threshold, and takes corresponding measures according to the comparison results.

[0043] (III) Beneficial effects

[0044] The present invention provides a method and system for testing electronic components, which have the following beneficial effects:

[0045] (1) The performance stability coefficient is used to quantify the degree of performance change of electronic components at different frequencies, compare the performance stability coefficients of different electronic components, and evaluate the performance stability of electronic components, so as to make better choices during design and selection. It helps engineers consider the potential impact of frequency changes during system design and debugging, and improve the stability of the entire system.

[0046] (2) The performance degradation coefficient is a parameter that describes the change of electronic component performance over time. By calculating the performance degradation coefficient, the degree of performance degradation of electronic components at different frequencies can be quantified, thereby evaluating the reliability and stability of electronic components, timely discovering electronic components with degraded performance, and ensuring the stable operation of electronic components.

[0047] (3) The performance stability coefficient and the performance attenuation coefficient respectively reflect different aspects of the performance of electronic components. The performance stability coefficient focuses on the stability of the component during long-term use, while the performance attenuation coefficient focuses on the changes of the component over time. By comprehensively considering these two parameters, a more comprehensive and accurate evaluation of the performance of electronic components can be made.

[0048] (4) By presetting the first evaluation threshold and the second evaluation threshold, comparing the performance evaluation value of the electronic component with the two thresholds, and taking corresponding measures based on the comparison results, the performance of the electronic component can be effectively managed, the stability and reliability of the system can be improved, and continuous improvement can be promoted. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] Figure 1 Schematic diagram of the steps of the testing method for electronic components of the present invention;

[0050] Figure 2 It is a schematic flow chart of the testing method of electronic components of the present invention;

[0051] Figure 3 It is a schematic diagram of the structure of the testing system of the electronic components of the present invention. DETAILED DESCRIPTION

[0052] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0053] See also Figure 1 and Figure 2 The present invention provides a method for testing an electronic component, comprising the following steps:

[0054] Step 1: Collect the voltage and current values ​​of the electronic component under test under sinusoidal signals of different frequencies, the amplitude values ​​of the input signal and the output signal, and establish a test data set;

[0055] The step 1 includes the following contents:

[0056] Step 101: Fix the electronic component to be tested on a test platform and connect a signal source and a measuring instrument;

[0057] It should be noted that a signal source refers to a device or apparatus that generates an electrical signal with certain parameters (such as frequency, waveform, pulse width, etc.). Signal sources are needed in many fields, such as communication, radar, navigation, electronic countermeasures, etc. Signal sources can be divided into many types according to different classification methods. For example, according to the type of output signal, signal sources can be divided into analog signal sources and digital signal sources. Analog signal sources can generate continuously changing signals, such as sine waves, square waves, etc.; digital signal sources can generate digital signals, such as pulse signals, etc.

[0058] Step 102: using a signal source to generate a series of sinusoidal signals with different frequencies, the signal frequency gradually increases from a low frequency to a high frequency, and using a measuring instrument to measure the voltage value and the current value of the electronic component under test at different frequencies, and the amplitude value of the input signal and the output signal;

[0059] Step 103: Record the voltage values, current values, and amplitude values ​​of the input signal and the output signal measured at different frequencies to establish a sample data set.

[0060] It should be noted that analyzing the frequency response of electronic components can help us understand the differences in their performance at different frequencies. This is because the electrical characteristics of many electronic components change with frequency. For example, capacitors and inductors are two typical low-frequency components. They have good performance at low frequencies. However, as the frequency increases, the inductance of capacitors and the capacitance of inductors begin to appear, which causes their performance to deteriorate. Resistors have relatively stable performance at low and high frequencies.

[0061] When using, combine the contents of step 101 to step 103:

[0062] By fixing the electronic component to be tested on the test platform and connecting the signal source and measuring instrument, the working state of the component in the actual circuit can be simulated. By measuring the voltage and current values, impedance and admittance values ​​of the component at different frequencies, the performance of the component at different frequencies can be fully understood.

[0063] Step 2: Calculate the impedance value and admittance value of the electronic component under test at different frequencies through the voltage value and current value of the electronic component under test at different frequencies, combine the impedance value or admittance value and the corresponding frequency, calculate the slope of the impedance value or admittance value changing with the frequency, and further calculate the performance stability coefficient of the electronic component under test;

[0064] The step 2 includes the following contents:

[0065] Step 201: Obtain the voltage value and current value of the electronic component under test at different frequencies from the test data set, and calculate the impedance value and admittance value of the electronic component under test at different frequencies through the voltage value and current value of the electronic component under test at different frequencies. The calculation formula is as follows:

[0066]

[0067] Among them, Z represents impedance, U represents voltage, I represents current, R represents the real part of impedance, X represents the imaginary part of impedance, Y represents admittance, G represents the real part of admittance, B represents the imaginary part of admittance, and j represents the imaginary unit;

[0068] Step 202: using the impedance values ​​and admittance values ​​of the electronic component to be tested at different frequencies, a curve graph of the impedance value or admittance value changing with frequency is drawn, with the frequency as the horizontal axis and the impedance value or admittance value as the vertical axis;

[0069] Step 203: According to the impedance value or admittance value curve, the impedance value or admittance value and the corresponding frequency are combined and dimensionless processed to calculate the slope of the impedance value or admittance value changing with the frequency, and further calculate the performance stability coefficient of the electronic component to be tested, and analyze the performance change of the electronic component to be tested at different frequencies. The calculation formula is as follows:

[0070]

[0071] Where Rf represents the performance stability coefficient, i represents the number of the impedance value or admittance value at each frequency, i = 1, 2, ..., n, n is a positive integer, f i Indicates the frequency value, V i It represents the reciprocal of impedance or admittance at different frequencies.

[0072] It should be noted that the performance stability coefficient is obtained by dividing the slope by the inverse of the impedance value or the admittance value in the performance stability coefficient formula. The electrical characteristics of electronic components will change with the change of frequency. This is because the movement speed of electrons and charges inside the component is affected by the frequency, causing the impedance and admittance values ​​of the component to change with the frequency. Impedance and admittance are important parameters for describing the electrical characteristics of electronic components.

[0073] Specifically, impedance is the ratio of voltage to current, reflecting the component's resistance to current, while admittance is the ratio of current to voltage, reflecting the component's support for voltage. In analysis, impedance and admittance values ​​are usually expressed as complex numbers, consisting of real and imaginary parts. The real part represents the resistance component, and the imaginary part represents the reactance component.

[0074] When used, combine the contents of step 201 to step 203:

[0075] The performance stability coefficient can be used to quantify the degree of performance change of electronic components at different frequencies, compare the performance stability coefficients of different electronic components, and evaluate the performance stability of electronic components, so as to make better choices during design and selection, and help engineers consider the potential impact of frequency changes during system design and debugging, thereby improving the stability of the entire system.

[0076] Step 3: Calculate the signal attenuation index of the electronic component to be tested by the input signal amplitude and the output signal amplitude, and calculate the performance attenuation coefficient of the electronic component to be tested according to the signal attenuation index at different frequencies and the signal attenuation index at the reference frequency;

[0077] The step three includes the following contents:

[0078] Step 301: Set the reference frequency, adjust the amplitude and frequency of the input signal of the signal source, and record the amplitude values ​​of the input signal and the output signal at different frequencies;

[0079] Step 302: Evaluate the signal attenuation degree of the electronic component under test at different frequencies by using the input signal amplitude and the output signal amplitude, and calculate the signal attenuation index of the electronic component under test. The calculation formula is as follows:

[0080]

[0081] Where Sa represents the signal attenuation index, A out Indicates the output signal amplitude, A in Indicates the input signal amplitude;

[0082] Step 303: Analyze the signal attenuation fluctuation of the electronic component to be tested according to the signal attenuation index at different frequencies and the signal attenuation index at the reference frequency, and calculate the performance attenuation coefficient of the electronic component to be tested. The calculation formula is as follows:

[0083]

[0084] Where Pf represents the performance attenuation coefficient, j represents the number of the signal attenuation index at each frequency, j = 1, 2, ..., m, m is a positive integer, Sa j It represents the signal attenuation index at different frequencies, and Sa represents the signal attenuation index at the reference frequency.

[0085] It should be noted that when the ratio of the output signal amplitude to the input signal amplitude is larger, the signal attenuation index is smaller, indicating that the performance of the electronic component to be tested is better. Conversely, the larger the signal attenuation index is, the worse the performance of the electronic component is. At different frequencies, the greater the signal attenuation fluctuation of the electronic component is, indicating that the performance of the electronic component is more unstable.

[0086] During use, combine the content of steps 301 to 303:

[0087] The performance attenuation coefficient is a parameter that describes the change in the performance of electronic components over time. By calculating the performance attenuation coefficient, the performance attenuation degree of electronic components at different frequencies can be quantified, so as to evaluate the reliability and stability of electronic components, timely detect electronic components with performance degradation, and ensure the stable operation of electronic components.

[0088] Step Four: Normalize the performance stability coefficient and the performance attenuation coefficient to the interval [0, 1]. Evaluate the performance of the electronic component through the performance stability coefficient and the performance attenuation coefficient, and calculate the performance evaluation value of the electronic component;

[0089] The content of the above Step Four includes the following:

[0090] Step 401: Obtain the performance stability coefficient and the performance attenuation coefficient of the electronic component, and normalize the performance stability coefficient and the performance attenuation coefficient to the interval [0, 1]. The normalization process uses min-max normalization;

[0091] Step 402: Evaluate the performance of the electronic component through the performance stability coefficient and the performance attenuation coefficient, and calculate the performance evaluation value of the electronic component. The calculation formula is as follows:

[0092]

[0093] Among them, Ef represents the performance evaluation value, Rf represents the performance stability coefficient, Pf represents the performance attenuation coefficient, k1 and k2 represent weight coefficients, 0 < k1 < 1, 0 < k2 < 1, and k1 + k2 = 1.

[0094] It should be noted that the above formula is to remove the dimension and take its numerical value for calculation. The weight coefficients in the performance evaluation value formula are values obtained by collecting a large amount of data for software simulation to be closest to the real situation, and can also be set by those skilled in the art according to the actual situation.

[0095] During use, combine the content of steps 401 to 402:

[0096] The performance stability coefficient and the performance attenuation coefficient respectively reflect different aspects of the component performance. The performance stability coefficient focuses on the stability of the component during long-term use, while the performance attenuation coefficient focuses on the change of the component over time. By comprehensively considering these two parameters, a more comprehensive and accurate evaluation of the component performance can be made.

[0097] Step Five: Preset the first evaluation threshold and the second evaluation threshold, compare the performance evaluation value of the electronic component with the first evaluation threshold and the second evaluation threshold respectively, and take corresponding measures according to the comparison results, specifically including:

[0098] When the performance evaluation value is less than the first evaluation threshold, it indicates that the performance of the electronic component is stable and the performance degradation is low, and no processing is required;

[0099] When the first evaluation threshold ≤ performance evaluation value ≤ second evaluation threshold, it indicates that the performance stability of the electronic component is general and the performance degradation degree is high, and the electronic component is marked as unqualified, indicating that rework or repair is required;

[0100] When the performance evaluation value is greater than the first evaluation threshold, it indicates that the performance of the electronic component is unstable and the performance degradation degree is high, and the electronic component is marked as seriously unqualified, indicating that it needs to be scrapped.

[0101] By presetting the first evaluation threshold and the second evaluation threshold, comparing the performance evaluation value of the electronic component with the two thresholds, and taking corresponding measures according to the comparison results, the performance of the electronic component can be effectively managed, the stability and reliability of the system can be improved, and continuous improvement can be promoted.

[0102] See also Figure 3 The present invention also provides a test system for electronic components, including a data acquisition module, a performance stability analysis module, a performance degradation analysis module and a result determination module; wherein,

[0103] The data acquisition module collects the voltage and current values ​​of the electronic components to be tested under sinusoidal signals of different frequencies, the amplitude values ​​of the input signal and the output signal, and establishes a test data set;

[0104] The performance stability analysis module calculates the impedance value and admittance value of the electronic component under test at different frequencies through the voltage value and current value of the electronic component under test at different frequencies, combines the impedance value or admittance value with the corresponding frequency, calculates the slope of the impedance value or admittance value changing with the frequency, and further calculates the performance stability coefficient of the electronic component under test;

[0105] The performance attenuation analysis module calculates the signal attenuation index of the electronic component to be tested through the input signal amplitude and the output signal amplitude, and calculates the performance attenuation coefficient of the electronic component to be tested based on the signal attenuation index at different frequencies and the signal attenuation index at the reference frequency;

[0106] The result judgment module normalizes the performance stability coefficient and the performance attenuation coefficient to the interval [0,1], calculates the performance evaluation value of the electronic component through the performance stability coefficient and the performance attenuation coefficient, evaluates the performance of the electronic component, pre-sets a first evaluation threshold and a second evaluation threshold, compares the performance evaluation value of the electronic component with the first evaluation threshold and the second evaluation threshold, and takes corresponding measures according to the comparison results.

[0107] In the application, the several formulas involved are all calculated by removing dimensions and taking their numerical values. The formula is a formula of the most recent real situation obtained by collecting a large amount of data and performing software simulation. The coefficients in the formula are set by technicians in this field according to actual conditions.

[0108] The above embodiments may be implemented in whole or in part by software, hardware, firmware or any other combination thereof. When implemented by software, the above embodiments may be implemented in whole or in part in the form of a computer program product. A person of ordinary skill in the art may appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein may be implemented in combination with electronic hardware, computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution.

[0109] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, and may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0110] The above description is only a specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application.

Claims

1. A method for testing electronic components, characterized in that: The following steps are involved: Collect the voltage and current values ​​of the electronic components under test under sinusoidal signals of different frequencies, the amplitude values ​​of the input signal and the output signal, and summarize them to establish a test data set; The impedance value and admittance value of the electronic component under test at different frequencies are calculated by using the voltage value and current value of the electronic component under test at different frequencies, and the slope of the impedance value or admittance value changing with the frequency is calculated by combining the impedance value or admittance value and the corresponding frequency, and the performance stability coefficient of the electronic component under test is further calculated; The signal attenuation index of the electronic component to be tested is calculated by the input signal amplitude and the output signal amplitude, and the performance attenuation coefficient of the electronic component to be tested is calculated according to the signal attenuation index at different frequencies and the signal attenuation index at the reference frequency; The performance stability coefficient and the performance attenuation coefficient are normalized to the interval [0,1], and the performance evaluation value of the electronic component is calculated; Presetting a first evaluation threshold and a second evaluation threshold, comparing the performance evaluation value of the electronic component with the first evaluation threshold and the second evaluation threshold respectively, and taking corresponding measures according to the comparison results, specifically including: When the performance evaluation value is less than the first evaluation threshold, it indicates that the performance of the electronic component is stable and the performance degradation is low, and no processing is required; When the first evaluation threshold ≤ performance evaluation value ≤ second evaluation threshold, it indicates that the performance stability of the electronic component is general and the performance degradation degree is high, and the electronic component is marked as unqualified, indicating that rework or repair is required; When the performance evaluation value is greater than the second evaluation threshold, it indicates that the performance of the electronic component is unstable and the degree of performance degradation is high. The electronic component is marked as seriously unqualified and needs to be scrapped.

2. The method for testing an electronic component according to claim 1, characterized in that: A signal source is used to generate a series of sinusoidal signals of different frequencies. The signal frequency gradually increases from low frequency to high frequency. The voltage and current values ​​of the electronic components under test at different frequencies, and the amplitude values ​​of the input signal and the output signal are measured respectively.

3. The method for testing an electronic component according to claim 1, characterized in that: The impedance and admittance values ​​of the electronic component under test at different frequencies are calculated by using the voltage and current values ​​of the electronic component under test at different frequencies. The calculation formula is as follows: Among them, Z represents impedance, U represents voltage, I represents current, R represents the real part of impedance, X represents the imaginary part of impedance, Y represents admittance, G represents the real part of admittance, B represents the imaginary part of admittance, and j represents the imaginary unit.

4. The method for testing an electronic component according to claim 3, characterized in that: By using the impedance values ​​and admittance values ​​of the electronic component to be tested at different frequencies, a curve graph of impedance value or admittance value changing with frequency is drawn, with frequency as the horizontal axis and impedance value or admittance value as the vertical axis.

5. The electronic component testing method according to claim 4, characterized in that: According to the impedance value or admittance value curve, the impedance value or admittance value and the corresponding frequency are combined and dimensionless processed to calculate the slope of the impedance value or admittance value changing with the frequency. The performance stability coefficient of the electronic component to be tested is further calculated to analyze the performance changes of the electronic component to be tested at different frequencies. The calculation formula is as follows: Where Rf represents the performance stability coefficient, i represents the number of the impedance value or admittance value at each frequency, , n is a positive integer, Indicates the frequency value, Indicates the impedance value at different frequencies.

6. The method for testing an electronic component according to claim 1, characterized in that: The signal attenuation degree of the electronic component to be tested at different frequencies is evaluated by the input signal amplitude and the output signal amplitude, and the signal attenuation index of the electronic component to be tested is calculated. The calculation formula is as follows: Where Sa represents the signal attenuation index, Represents the output signal amplitude, Indicates the input signal amplitude.

7. The electronic component testing method according to claim 6, characterized in that: According to the signal attenuation index at different frequencies and the signal attenuation index at the reference frequency, the signal attenuation fluctuation of the electronic component to be tested is analyzed, and the performance attenuation coefficient of the electronic component to be tested is calculated. The calculation formula is as follows: Where Pf represents the performance attenuation coefficient, j represents the number of the signal attenuation index at each frequency, , m is a positive integer, It represents the signal attenuation index at different frequencies, and Sa represents the signal attenuation index at the reference frequency.

8. The method for testing an electronic component according to claim 7, characterized in that: The performance stability coefficient and the performance attenuation coefficient are normalized to the interval [0,1]. The performance of the electronic component is evaluated by the performance stability coefficient and the performance attenuation coefficient, and the performance evaluation value of the electronic component is calculated. The calculation formula is as follows: Among them, Ef represents the performance evaluation value, Rf represents the performance stability coefficient, and Pf represents the performance attenuation coefficient. represents the weight coefficient, , ,and .

9. A testing system for electronic components, used to implement the method according to any one of claims 1 to 8, characterized in that: It includes a data acquisition module, a performance stability analysis module, a performance decay analysis module and a result determination module; wherein, The data acquisition module collects the voltage and current values ​​of the electronic components to be tested under sinusoidal signals of different frequencies, the amplitude values ​​of the input signal and the output signal, and establishes a test data set; The performance stability analysis module calculates the impedance value and admittance value of the electronic component under test at different frequencies through the voltage value and current value of the electronic component under test at different frequencies, combines the impedance value or admittance value with the corresponding frequency, calculates the slope of the impedance value or admittance value changing with the frequency, and further calculates the performance stability coefficient of the electronic component under test; The performance attenuation analysis module calculates the signal attenuation index of the electronic component to be tested through the input signal amplitude and the output signal amplitude, and calculates the performance attenuation coefficient of the electronic component to be tested based on the signal attenuation index at different frequencies and the signal attenuation index at the reference frequency; The result determination module normalizes the performance stability coefficient and the performance attenuation coefficient to the interval [0,1], calculates the performance evaluation value of the electronic component through the performance stability coefficient and the performance attenuation coefficient, evaluates the performance of the electronic component, pre-sets a first evaluation threshold and a second evaluation threshold, compares the performance evaluation value of the electronic component with the first evaluation threshold and the second evaluation threshold, and takes corresponding measures according to the comparison results, specifically including: When the performance evaluation value is less than the first evaluation threshold, it indicates that the performance of the electronic component is stable and the performance degradation is low, and no processing is required; When the first evaluation threshold ≤ performance evaluation value ≤ second evaluation threshold, it indicates that the performance stability of the electronic component is general and the performance degradation degree is high, and the electronic component is marked as unqualified, indicating that rework or repair is required; When the performance evaluation value is greater than the second evaluation threshold, it indicates that the performance of the electronic component is unstable and the degree of performance degradation is high. The electronic component is marked as seriously unqualified and needs to be scrapped.

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