Operational amplifier detection method, device and storage medium

Abstract

The present application discloses an operational amplifier detection method, device and storage medium, which can realize the simultaneous evaluation of multiple chips, thereby greatly improving the evaluation efficiency and saving the evaluation time. Moreover, through the method of automated detection and judgment, the result judgment can be completed directly, which reduces the complexity of the operation process and the requirements for the professional level of the testers, and can avoid the misjudgment caused by manual detection.

Description

Technical Field

[0001] The present application relates to the field of chip detection, and in particular to an operational amplifier detection method, device and storage medium. Background Art

[0002] In the production and application of operational amplifier chips, it is crucial to accurately evaluate the voltage value of the operational amplifier chip. Traditional operational amplifier chip evaluation methods rely on professional equipment and complex testing processes. These methods often require a high level of professionalism from testers, and because the operating process is relatively complicated, the test efficiency is extremely low and the test cost is extremely high. Summary of the invention

[0003] The present application aims to propose an operational amplifier detection method, device and storage medium, which can reduce the requirements on the professional level of testers when testing operational amplifier chips and simplify the operation process.

[0004] According to the operational amplifier detection method of the first aspect of the present application, the acquisition circuit includes a control unit, a voltage sampling circuit and a current sampling circuit. The voltage sampling circuit includes a selection circuit. The selection circuit has a chip selection terminal, a voltage output terminal and multiple voltage input terminals. The multiple voltage input terminals are used to collect the output voltages of multiple operational amplifiers to be tested. The selection circuit is used to adjust the connectivity between the voltage output terminal and the multiple voltage input terminals according to the chip selection signal input by the chip selection terminal. The chip selection terminal and the voltage output terminal are both connected to the control unit. There are multiple chip selection signals, and the multiple chip selection signals correspond to multiple operational amplifiers to be tested. Multiple operational amplifiers to be tested are connected in series. The current sampling circuit is connected to the control unit and is used to collect the working current of the operational amplifiers to be tested after being connected in series.

[0005] The operational amplifier detection method comprises:

[0006] Outputting a plurality of the chip selection signals in sequence to obtain a plurality of output voltages of each of the operational amplifiers to be tested collected by the voltage sampling circuit;

[0007] Acquiring multiple working currents collected by the current sampling circuit;

[0008] Performing linear regression analysis on a plurality of output voltages corresponding to each of the operational amplifiers to be tested, to obtain an output voltage to be tested corresponding to each of the operational amplifiers to be tested;

[0009] Performing linear regression analysis on the plurality of working currents to obtain a working current to be measured;

[0010] Determine a voltage detection result corresponding to each of the operational amplifiers to be tested according to each of the output voltages to be tested and a preset voltage threshold range;

[0011] Determining a current detection result according to the working current to be measured and a preset voltage threshold range;

[0012] Final detection results of the plurality of operational amplifiers to be tested are determined according to the plurality of voltage detection results and the current detection results.

[0013] The operational amplifier detection device according to the second aspect of the present application is applied to an acquisition circuit, wherein the acquisition circuit includes a control unit, a voltage sampling circuit and a current sampling circuit, wherein the voltage sampling circuit includes a selection circuit, wherein the selection circuit has a chip selection terminal, a voltage output terminal and a plurality of voltage input terminals, wherein the plurality of voltage input terminals are used to acquire output voltages of a plurality of operational amplifiers to be tested, and wherein the selection circuit is used to adjust the connectivity between the voltage output terminal and the plurality of voltage input terminals according to a chip selection signal input from the chip selection terminal, wherein both the chip selection terminal and the voltage output terminal are connected to the control unit, wherein there are a plurality of chip selection signals, and the plurality of chip selection signals correspond to a plurality of operational amplifiers to be tested; wherein the plurality of operational amplifiers to be tested are connected in series; and wherein the current sampling circuit is connected to the control unit, and is used to acquire the operating current of the operational amplifiers to be tested after the series connection;

[0014] The operational amplifier detection device comprises:

[0015] A voltage acquisition unit, used to sequentially output the plurality of chip selection signals to acquire a plurality of output voltages of each of the operational amplifiers to be tested acquired by the voltage sampling circuit;

[0016] A current acquisition power supply, used to acquire multiple working currents collected by the current sampling circuit;

[0017] A voltage determination unit, used for performing a linear regression analysis on a plurality of output voltages corresponding to each of the operational amplifiers to be tested, to obtain an output voltage to be tested corresponding to each of the operational amplifiers to be tested;

[0018] A current determination unit, used for performing linear regression analysis on the plurality of working currents to obtain a working current to be measured;

[0019] A voltage detection unit, used to determine a voltage detection result corresponding to each of the operational amplifiers to be tested according to each of the output voltages to be tested and a preset voltage threshold range;

[0020] A current detection unit, used to determine a current detection result according to the working current to be measured and a preset voltage threshold range;

[0021] The result output unit is used to determine the final detection results of the plurality of operational amplifiers to be tested according to the plurality of voltage detection results and the current detection results.

[0022] According to the computer-readable storage medium of the third aspect embodiment of the present application, computer executable instructions are stored, and the computer executable instructions are used to execute the operational amplifier detection method as described in the first aspect embodiment. Since the computer-readable storage medium adopts all the technical solutions of the operational amplifier detection method of the above embodiment, it at least has all the beneficial effects brought by the technical solutions of the above embodiment.

[0023] The operational amplifier detection method, device and storage medium of the embodiments of the present application can realize the simultaneous evaluation of multiple chips, thereby greatly improving the efficiency of the evaluation and saving the time of the evaluation. Moreover, the result judgment can be completed directly through the automated detection and judgment method, which reduces the complexity of the operation process and the requirements for the professional level of the testers, and can avoid the misjudgment caused by manual detection.

[0024] Other features and advantages of the present application will be set forth in the following description, and in part will become apparent from the description, or may be understood by practicing the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The above and / or additional aspects and advantages of the present application will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0026] Figure 1 A circuit diagram of a selection circuit according to an embodiment of the present application;

[0027] Figure 2 A circuit diagram of a signal conditioning circuit according to an embodiment of the present application;

[0028] Figure 3 A circuit diagram of a current sampling circuit according to an embodiment of the present application;

[0029] Figure 4 Flow chart of an operational amplifier detection method according to an embodiment of the present application.

[0030] Reference numerals:

[0031] Selection circuit 110, signal conditioning circuit 120,

[0032] Current sampling circuit 200 . DETAILED DESCRIPTION

[0033] The embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application, and cannot be understood as limiting the present application.

[0034] In the description of this application, if there is a description of first, second, etc., it is only for the purpose of distinguishing technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.

[0035] In the description of the present application, it should be understood that the descriptions involving orientation, such as the orientation or positional relationship indicated as up, down, etc., are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0036] In the description of this application, it should be noted that, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meaning of the above terms in this application based on the specific content of the technical solution.

[0037] The technical solution of the present application will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the embodiments described below are only part of the embodiments of the present application, not all of the embodiments.

[0038] See also Figure 4 As shown, Figure 4 This is a flow chart of an operational amplifier detection method provided by an embodiment of the present application. The operational amplifier detection method includes but is not limited to the following steps:

[0039] Outputting a plurality of chip selection signals in sequence to obtain a plurality of output voltages of each operational amplifier to be tested collected by a voltage sampling circuit;

[0040] Acquire multiple working currents collected by the current sampling circuit 200;

[0041] Performing linear regression analysis on multiple output voltages corresponding to each operational amplifier to be tested to obtain the output voltage to be tested corresponding to each operational amplifier to be tested;

[0042] Performing linear regression analysis on multiple working currents to obtain the working current to be measured;

[0043] Determine a voltage detection result corresponding to each operational amplifier to be tested according to each output voltage to be tested and a preset voltage threshold range;

[0044] Determine the current detection result according to the working current to be measured and the preset voltage threshold range;

[0045] Final detection results of the plurality of operational amplifiers to be tested are determined according to the plurality of voltage detection results and the current detection results.

[0046] In order to better describe the operational amplifier detection method of the embodiment of the present application, the acquisition circuit used in the embodiment of the present application is briefly described here.

[0047] refer to Figures 1 to 3 The acquisition circuit includes a control unit, a voltage sampling circuit and a current sampling circuit 200.

[0048] The voltage sampling circuit includes a selection circuit 110, which has a chip selection terminal, a voltage output terminal, and multiple voltage input terminals. The multiple voltage input terminals are used to collect the output voltages of multiple operational amplifiers to be tested. The selection circuit 110 is used to adjust the connectivity between the voltage output terminal and the multiple voltage input terminals according to the chip selection signal input by the chip selection terminal. The chip selection terminal and the voltage output terminal are both connected to the control unit. There are multiple chip selection signals, and the multiple chip selection signals correspond to multiple operational amplifiers to be tested. In addition, in some embodiments, the voltage sampling circuit may also include a signal conditioning circuit 120, which may perform pre-processing operations such as filtering, gain adjustment, and signal amplification on the signal output by the selection circuit 110, so that the control unit can better complete ADC sampling. It should be noted that the selection circuit 110 may use a self-designed multi-channel switching circuit, or may directly use a multiplexing chip, for example, ADG409.

[0049] In the embodiment of the present application, the current sampling circuit 200 is connected to the control unit and is used to collect the working current of the operational amplifier to be tested after being connected in series; multiple operational amplifiers to be tested adopt a series structure, so the current in the loop formed by the multiple operational amplifiers to be tested in series is equal, so the current sampling circuit 200 can only detect the loop current. The current sampling circuit 200 converts the current acquisition into voltage acquisition, and the converted voltage signal also needs to be pre-processed by filtering, gain adjustment, signal amplification and other pre-processing operations before being completed by the control unit ADC sampling.

[0050] In addition, the acquisition circuit may also include a key circuit connected to the control unit, through which the detection can be triggered or stopped. The sampling circuit may also include a display unit connected to the control unit to indicate the detection result and subsequently display relevant image information such as the spectrum diagram.

[0051] The following describes the operational amplifier detection method of the embodiment of the present application based on the above-mentioned acquisition circuit.

[0052] The control unit will cyclically output multiple chip select signals, so that the output voltage of the operational amplifier to be tested corresponding to each chip select signal can be cyclically obtained in turn. The chip select signal can be cyclically output by the core processor in the control unit, or the DMA function module in the control unit can be used to realize automatic control switching.

[0053] When collecting voltage data and current data, in order to ensure the accuracy of the data, multiple output voltages and multiple operating currents will be collected when testing each operational amplifier to be tested. After that, the linear regression analysis method is used to perform statistical analysis on the multiple output voltages and operating currents corresponding to each operational amplifier to determine the output voltage to be tested and the operating current to be tested corresponding to each operational amplifier to be tested. At this time, the output voltage to be tested and the operating current to be tested fully consider the influence of multiple data, and can better characterize the working state of the operational amplifier to be tested.

[0054] It should be noted that if multiple operational amplifiers to be tested are of the same model, only one working current to be tested needs to be obtained, that is, the working current to be tested is common to multiple operational amplifiers for evaluation. If multiple operational amplifiers to be tested are of different models, it is recommended to separately allocate a working current to be tested for each operational amplifier to be tested. For example, when detecting the output voltage of any operational amplifier to be tested, the working current can be synchronously collected, and then the output voltage to be tested and the working current to be tested corresponding to the operational amplifier to be tested can be obtained based on the linear regression analysis method.

[0055] After obtaining the output voltage to be tested and the working current to be tested corresponding to each operational amplifier to be tested, it is possible to determine whether the output voltage to be tested is within the preset voltage threshold range, and then obtain the corresponding voltage detection result, and determine whether the working current to be tested is within the preset current threshold range, and then obtain the corresponding current detection result. According to the voltage detection result and the current detection result, the detection result of the operational amplifier to be tested can be determined. Among them, for each operational amplifier to be tested, as long as one of the output voltage to be tested and the working current to be tested is not within the threshold range, it means that the test fails, and a reminder can be given by lighting a light, sound and light alarm, etc.

[0056] Furthermore, in some embodiments, Figures 1 to 3 As shown, considering that the commonly used operational amplifier chips are equipped with two operational amplifiers, the operational amplifiers A in the multiple operational amplifier chips can form a loop, and the operational amplifiers B can form a loop, and both loops can be sampled by the voltage sampling circuit and the current sampling circuit 200, and then detected respectively. It should be noted that the detection method of the loop formed by the operational amplifier A and the loop formed by the operational amplifier B is the same. In the subsequent embodiments, the detection of one of the loops is taken as an example and will not be repeated.

[0057] The operational amplifier detection method of the embodiment of the present application can realize the simultaneous evaluation of multiple chips, thereby greatly improving the efficiency of the evaluation and saving the time of the evaluation. In addition, the result judgment can be directly completed through automated detection and judgment, which reduces the complexity of the operation process and the requirements for the professional level of the testers, and can avoid misjudgments caused by manual detection.

[0058] In some embodiments, the preset voltage threshold range and the preset voltage threshold range are both determined according to historical data or according to the specification of the operational amplifier to be tested.

[0059] The preset voltage threshold range and the preset voltage threshold can be directly set according to empirical values, or can be obtained by consulting the specification sheet of the operational amplifier to be tested.

[0060] In some embodiments, different types of operational amplifiers can also be tested to obtain a large amount of output voltages and operating currents as historical data, and then the historical data can be statistically analyzed to determine the corresponding preset voltage threshold range and preset voltage threshold range. Ultimately, each type of operational amplifier will determine the corresponding preset voltage threshold range and preset voltage threshold range. When it is necessary to perform a threshold judgment on the operational amplifier to be tested, the corresponding preset voltage threshold range and preset voltage threshold range can be directly determined using the model of the operational amplifier to be tested.

[0061] In some embodiments, the output voltage to be tested corresponding to each operational amplifier to be tested is obtained by the following steps:

[0062] Filtering the multiple output voltages to obtain multiple filtered intermediate voltages;

[0063] Based on multiple intermediate voltages and a pre-constructed first linear regression prediction model corresponding to the operational amplifier to be tested, the output voltage to be tested is obtained; wherein, when the operational amplifier to be tested has different models, each model of the operational amplifier to be tested corresponds to a first linear regression prediction model.

[0064] After collecting multiple output voltages corresponding to each operational amplifier, it is necessary to first filter the multiple output voltages, remove some obviously abnormal data in the multiple output voltages, and obtain multiple intermediate voltages, each of which includes a voltage value and a frequency, and then use the first linear regression prediction model to perform linear regression analysis on the multiple intermediate voltages to obtain the output voltage to be tested. The first linear regression prediction model can be constructed using historical data, and the historical data can be obtained by collecting data from a normally operating operational amplifier that is consistent with the model of the operational amplifier to be tested.

[0065] In some embodiments, each first linear regression prediction model is obtained by the following steps:

[0066] Obtain historical voltage data of the model-building operational amplifier at different operating frequencies, where the model of the model-building operational amplifier unit is consistent with the model of the operational amplifier to be tested;

[0067] A first linear regression prediction model is constructed based on historical voltage data.

[0068] Acquire multiple historical voltage data of the operational amplifier at different operating frequencies for model construction, and then construct a first linear regression prediction model related to the operating frequency and the historical voltage data based on these historical voltage data and the corresponding operating frequencies. Subsequently, the first linear regression prediction model can be used to analyze multiple intermediate voltages to obtain prediction results, and the predicted results are used to determine the output voltage to be measured. Specifically, the operating frequency of each intermediate voltage can be determined, and the first linear regression prediction model can be used to complete the prediction of each operating frequency to obtain the corresponding predicted voltage, and then the average of multiple predicted voltages can be calculated to obtain the final output voltage to be measured.

[0069] In some embodiments, after obtaining multiple output voltages corresponding to each operational amplifier, the multiple output voltages can be filtered to obtain multiple intermediate voltages, and then the multiple intermediate voltages are directly used to construct a linear regression model to obtain the predicted value. The independent variable used in the prediction can be the mean of the operating frequencies of the multiple intermediate voltages, and the dependent variable is the output voltage to be measured.

[0070] In some embodiments, performing linear regression analysis on multiple working currents to obtain the working current to be measured includes:

[0071] Filtering the multiple working currents to obtain multiple filtered intermediate currents;

[0072] Based on multiple intermediate currents and a pre-constructed second linear regression prediction model corresponding to the operational amplifier to be tested, the operating current to be tested is obtained; wherein, when the operational amplifier to be tested has different models, each model of the operational amplifier to be tested corresponds to a second linear regression prediction model.

[0073] After collecting multiple working currents, it is necessary to filter the multiple working currents first, eliminate some obviously abnormal data in the multiple working currents, and obtain multiple intermediate currents, each of which includes current value and frequency, and then use the second linear regression prediction model to perform linear regression analysis on the multiple intermediate currents to obtain the working current to be tested. The second linear regression prediction model can be constructed using historical data, and the historical data can be obtained by collecting data from a normally operating operational amplifier that is consistent with the model of the operational amplifier to be tested. It should be noted that when the models of the multiple operational amplifiers to be tested in series are different, it is necessary to use the second linear regression prediction model corresponding to each model of the operational amplifier to be tested to analyze and predict the multiple intermediate currents. In theory, if the computing power usage is not considered, the working current to be tested can be predicted separately for each operational amplifier to be tested.

[0074] In some embodiments, each second linear regression prediction model is obtained by the following steps:

[0075] Obtain historical current data of the model-building operational amplifier at different operating frequencies, where the model of the model-building operational amplifier unit is consistent with the model of the operational amplifier to be tested;

[0076] A second linear regression prediction model is constructed based on historical current data.

[0077] Acquire multiple historical current data of the operational amplifier at different operating frequencies for model construction, and then build a second linear regression prediction model related to the operating frequency and the historical current data based on these historical current data and the corresponding operating frequencies. Subsequently, the second linear regression prediction model can be used to analyze multiple intermediate currents to obtain prediction results, and the predicted results are used to determine the current to be worked. Specifically, the operating frequency of each intermediate current can be determined, and the second linear regression prediction model can be used to complete the prediction of each operating frequency to obtain the corresponding predicted current, and then the average of multiple predicted currents can be calculated to obtain the final working voltage to be measured.

[0078] In some embodiments, after obtaining multiple working currents corresponding to each operational amplifier, the multiple working currents can be filtered to obtain multiple intermediate currents, and then a linear regression model can be directly constructed using the multiple intermediate currents to obtain the predicted values. The independent variable used in the prediction can be the mean of the working frequencies of the multiple intermediate currents, and the dependent variable is the intermediate current to be measured.

[0079] In some embodiments, the operational amplifier detection method further includes:

[0080] Acquire multiple frequency spectrum graphs corresponding to the operational amplifier under test, each frequency spectrum graph corresponding to a different operation time and operation environment;

[0081] Obtaining a spectrum comparison result according to the working current to be measured, the output voltage to be measured and a plurality of spectrum graphs;

[0082] Displays the spectrum comparison results.

[0083] The multiple frequency spectrum diagrams of each operational amplifier to be tested correspond to different operating time periods and different operating environments, and each frequency spectrum diagram has a distribution curve of the corresponding voltage and current in the frequency domain.

[0084] While determining the working current to be tested and the output voltage to be tested, the environment, duration and model of the operational amplifier to be tested can be determined, so that the corresponding spectrum diagram can be determined. By displaying the working current to be tested, the output voltage to be tested and the spectrum diagram in correspondence, it can be easier for operators to understand the test results, and the specific working accuracy can also be determined for qualified operational amplifiers.

[0085] In some embodiments, the plurality of spectrograms are obtained by:

[0086] Acquire multiple time domain signal data corresponding to the model-building operational amplifier, the time domain signal data including time domain voltage data and time domain current data, each time domain signal data corresponding to a different operating time and operating environment;

[0087] Performing fast Fourier transform on each time domain signal data to obtain multiple frequency domain signal data;

[0088] Construct multiple spectrograms from multiple frequency-domain signal data.

[0089] By placing each model of model-built operational amplifier in different operating environments and testing it for different durations, multiple sets of current data and voltage data in the time domain can be obtained, and multiple sets of time-domain voltage data and time-domain current data can be obtained, that is, multiple time-domain signal data can be obtained. Then, the time-domain voltage data and time-domain current data in each time-domain signal data are subjected to fast Fourier transformation, and the time-domain data can be converted into frequency-domain data to obtain multiple frequency-domain signal data, each of which also includes frequency-domain voltage data and frequency-domain current data. A spectrum graph can be constructed based on the obtained frequency-domain voltage data and frequency-domain current data. Each model of model-built operational amplifier will correspond to multiple spectrum graphs, and each spectrum graph corresponds to an operating environment and operating duration.

[0090] When it is necessary to use the spectrum graph for display analysis, the corresponding spectrum graph can be determined by quickly confirming the operating environment and operating time of the operational amplifier under test, and then the display analysis can be performed in combination with the corresponding spectrum graph.

[0091] The embodiment of the present application further provides an operational amplifier detection device, the operational amplifier detection device comprising:

[0092] A voltage acquisition unit, used to sequentially output a plurality of chip selection signals to acquire a plurality of output voltages of each operational amplifier to be tested acquired by a voltage sampling circuit;

[0093] A current acquisition power supply, used to acquire multiple working currents collected by the current sampling circuit 200;

[0094] A voltage determination unit, used for performing a linear regression analysis on a plurality of output voltages corresponding to each operational amplifier to be tested, to obtain an output voltage to be tested corresponding to each operational amplifier to be tested;

[0095] A current determination unit, used for performing linear regression analysis on a plurality of working currents to obtain a working current to be measured;

[0096] A voltage detection unit, used to determine a voltage detection result corresponding to each operational amplifier to be tested according to each output voltage to be tested and a preset voltage threshold range;

[0097] A current detection unit, used to determine a current detection result according to a working current to be measured and a preset voltage threshold range;

[0098] The result output unit is used to determine the final detection results of the multiple operational amplifiers to be tested according to the multiple voltage detection results and the current detection results.

[0099] In order to better describe the operational amplifier detection method of the embodiment of the present application, the acquisition circuit used in the embodiment of the present application is briefly described here.

[0100] refer to Figures 1 to 3 The acquisition circuit includes a control unit, a voltage sampling circuit and a current sampling circuit 200.

[0101] The voltage sampling circuit includes a selection circuit 110, which has a chip selection terminal, a voltage output terminal, and multiple voltage input terminals. The multiple voltage input terminals are used to collect the output voltages of multiple operational amplifiers to be tested. The selection circuit 110 is used to adjust the connectivity between the voltage output terminal and the multiple voltage input terminals according to the chip selection signal input by the chip selection terminal. The chip selection terminal and the voltage output terminal are both connected to the control unit. There are multiple chip selection signals, and the multiple chip selection signals correspond to multiple operational amplifiers to be tested. In addition, in some embodiments, the voltage sampling circuit may also include a signal conditioning circuit 120, which may perform pre-processing operations such as filtering, gain adjustment, and signal amplification on the signal output by the selection circuit 110, so that the control unit can better complete ADC sampling. It should be noted that the selection circuit 110 may use a self-designed multi-channel switching circuit, or may directly use a multiplexing chip, for example, ADG409.

[0102] In the embodiment of the present application, the current sampling circuit 200 is connected to the control unit and is used to collect the working current of the operational amplifier to be tested after being connected in series; multiple operational amplifiers to be tested adopt a series structure, so the current in the loop formed by the multiple operational amplifiers to be tested in series is equal, so the current sampling circuit 200 can only detect the loop current. The current sampling circuit 200 converts the current acquisition into voltage acquisition, and the converted voltage signal also needs to be pre-processed by filtering, gain adjustment, signal amplification and other pre-processing operations before being completed by the control unit ADC sampling.

[0103] In addition, the acquisition circuit may also include a key circuit connected to the control unit, through which the detection can be triggered or stopped. The sampling circuit may also include a display unit connected to the control unit to indicate the detection result and subsequently display relevant image information such as the spectrum diagram.

[0104] The following describes the operational amplifier detection method of the embodiment of the present application based on the above-mentioned acquisition circuit.

[0105] The control unit will cyclically output multiple chip select signals, so that the output voltage of the operational amplifier to be tested corresponding to each chip select signal can be cyclically obtained in turn. The chip select signal can be cyclically output by the core processor in the control unit, or the DMA function module in the control unit can be used to realize automatic control switching.

[0106] When collecting voltage data and current data, in order to ensure the accuracy of the data, multiple output voltages and multiple operating currents will be collected when testing each operational amplifier to be tested. After that, the linear regression analysis method is used to perform statistical analysis on the multiple output voltages and operating currents corresponding to each operational amplifier to determine the output voltage to be tested and the operating current to be tested corresponding to each operational amplifier to be tested. At this time, the output voltage to be tested and the operating current to be tested fully consider the influence of multiple data, and can better characterize the working state of the operational amplifier to be tested.

[0107] It should be noted that if multiple operational amplifiers to be tested are of the same model, only one working current to be tested needs to be obtained, that is, the working current to be tested is common to multiple operational amplifiers for evaluation. If multiple operational amplifiers to be tested are of different models, it is recommended to separately allocate a working current to be tested for each operational amplifier to be tested. For example, when detecting the output voltage of any operational amplifier to be tested, the working current can be synchronously collected, and then the output voltage to be tested and the working current to be tested corresponding to the operational amplifier to be tested can be obtained based on the linear regression analysis method.

[0108] After obtaining the output voltage to be tested and the working current to be tested corresponding to each operational amplifier to be tested, it is possible to determine whether the output voltage to be tested is within the preset voltage threshold range, and then obtain the corresponding voltage detection result, and determine whether the working current to be tested is within the preset current threshold range, and then obtain the corresponding current detection result. According to the voltage detection result and the current detection result, the detection result of the operational amplifier to be tested can be determined. Among them, for each operational amplifier to be tested, as long as one of the output voltage to be tested and the working current to be tested is not within the threshold range, it means that the test fails, and a reminder can be given by lighting a light, sound and light alarm, etc.

[0109] Furthermore, in some embodiments, Figures 1 to 3 As shown, considering that the commonly used operational amplifier chips are equipped with two operational amplifiers, the operational amplifiers A in the multiple operational amplifier chips can form a loop, and the operational amplifiers B can form a loop, and both loops can be sampled by the voltage sampling circuit and the current sampling circuit 200, and then detected respectively. It should be noted that the detection method of the loop formed by the operational amplifier A and the loop formed by the operational amplifier B is the same. In the subsequent embodiments, the detection of one of the loops is taken as an example and will not be repeated.

[0110] The operational amplifier detection device of the embodiment of the present application can realize the simultaneous evaluation of multiple chips, thereby greatly improving the efficiency of the evaluation and saving the time of the evaluation. In addition, the result judgment can be directly completed through automated detection and judgment, which reduces the complexity of the operation process and the requirements for the professional level of the testers, and can avoid misjudgments caused by manual detection.

[0111] In addition, an embodiment of the present application also provides a computer-readable storage medium, which stores computer-executable instructions, and the computer-executable instructions are executed by a processor or a control module, so that the above-mentioned processor can execute the operational amplifier detection method in the above-mentioned embodiment, for example, execute the method described above.

[0112] It will be appreciated by those skilled in the art that all or some of the steps and systems in the disclosed methods above may be implemented as software, firmware, hardware and appropriate combinations thereof. Some physical components or all physical components may be implemented as software executed by a processor, such as a central processing unit, a digital signal processor or a microprocessor, or implemented as hardware, or implemented as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on a computer-readable medium, which may include a computer storage medium or a non-transitory medium and a communication medium or a temporary medium. As known to those skilled in the art, the term computer storage medium includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storing information such as computer-readable instructions, data structures, program modules or other data. Computer storage media include, but are not limited to, RAM, ROM, EEPROM, flash memory or other memory technologies, CD-ROM, digital versatile disk DVD or other optical disk storage, magnetic cassettes, magnetic tapes, disk storage or other magnetic storage devices, or any other medium that may be used to store desired information and may be accessed by a computer. Furthermore, it is well known to those skilled in the art that communication media typically embodies computer readable instructions, data structures, program modules, or other data in a modulated data signal such as a carrier wave or other transport mechanism, and may include any information delivery media.

[0113] The embodiments of the present application are described in detail above in conjunction with the accompanying drawings, but the present application is not limited to the above embodiments, and various changes can be made within the knowledge scope of ordinary technicians in the relevant technical field without departing from the purpose of the present application.

Claims

1. An operational amplifier detection method, characterized in that: Applied to an acquisition circuit, the acquisition circuit includes a control unit, a voltage sampling circuit and a current sampling circuit, the voltage sampling circuit includes a selection circuit, the selection circuit has a chip selection end, a voltage output end, and multiple voltage input ends, the multiple voltage input ends are used to collect the output voltages of multiple operational amplifiers to be tested, the selection circuit is used to adjust the connection state between the voltage output end and the multiple voltage input ends according to the chip selection signal input by the chip selection end, the chip selection end and the voltage output end are both connected to the control unit, there are multiple chip selection signals, and the multiple chip selection signals correspond to the multiple operational amplifiers to be tested; the multiple operational amplifiers to be tested are connected in series; the current sampling circuit is connected to the control unit, and is used to collect the working current of the operational amplifiers to be tested after the series connection; The operational amplifier detection method comprises: Outputting a plurality of the chip selection signals in sequence to obtain a plurality of output voltages of each of the operational amplifiers to be tested collected by the voltage sampling circuit; Acquiring multiple working currents collected by the current sampling circuit; Performing linear regression analysis on a plurality of output voltages corresponding to each of the operational amplifiers to be tested, to obtain an output voltage to be tested corresponding to each of the operational amplifiers to be tested; Performing linear regression analysis on the plurality of working currents to obtain a working current to be measured; Determine a voltage detection result corresponding to each of the operational amplifiers to be tested according to each of the output voltages to be tested and a preset voltage threshold range; Determining a current detection result according to the working current to be measured and a preset voltage threshold range; Determining final detection results of the plurality of operational amplifiers to be tested according to the plurality of voltage detection results and the current detection results; The output voltage to be tested corresponding to each of the operational amplifiers to be tested is obtained by the following steps: Filtering the plurality of output voltages to obtain a plurality of filtered intermediate voltages; The output voltage to be tested is obtained based on the multiple intermediate voltages and a pre-constructed first linear regression prediction model corresponding to the operational amplifier to be tested; wherein, when the operational amplifier to be tested has different models, each model of the operational amplifier to be tested corresponds to a first linear regression prediction model.

2. The operational amplifier detection method according to claim 1, characterized in that: The preset voltage threshold range and the preset voltage threshold range are both determined according to historical data or according to the specification of the operational amplifier to be tested.

3. The operational amplifier detection method according to claim 1, characterized in that: Each of the first linear regression prediction models is obtained by the following steps: Acquire historical voltage data of a model-building operational amplifier at different operating frequencies, wherein the model of the model-building operational amplifier unit is consistent with the model of the operational amplifier to be tested; The first linear regression prediction model is constructed according to the historical voltage data.

4. The operational amplifier detection method according to claim 1, characterized in that: The performing linear regression analysis on the plurality of working currents to obtain the working current to be measured comprises: Performing filtering on the plurality of working currents to obtain a plurality of filtered intermediate currents; The operating current to be tested is obtained based on the multiple intermediate currents and a pre-constructed second linear regression prediction model corresponding to the operational amplifier to be tested; wherein, when the operational amplifier to be tested has different models, each model of the operational amplifier to be tested corresponds to a second linear regression prediction model.

5. The operational amplifier detection method according to claim 4, characterized in that: Each of the second linear regression prediction models is obtained by the following steps: Acquire historical current data of a model-building operational amplifier at different operating frequencies, wherein the model of the model-building operational amplifier unit is consistent with the model of the operational amplifier to be tested; The second linear regression prediction model is constructed according to the historical current data.

6. The operational amplifier detection method according to claim 1, characterized in that: The operational amplifier detection method further includes: Acquire a plurality of frequency spectrum graphs corresponding to the operational amplifier to be tested, each frequency spectrum graph corresponding to a different operating time and operating environment; Obtaining a spectrum comparison result according to the working current to be measured, the output voltage to be measured and the plurality of spectrum graphs; The spectrum comparison result is displayed.

7. The operational amplifier detection method according to claim 6, characterized in that: The plurality of spectrum graphs are obtained by the following steps: Acquire multiple time domain signal data corresponding to the model-building operational amplifier, the time domain signal data including time domain voltage data and time domain current data, each of the time domain signal data corresponding to a different operating time and operating environment; Performing a fast Fourier transform on each of the time domain signal data to obtain a plurality of frequency domain signal data; A plurality of frequency spectrograms are constructed according to the plurality of frequency domain signal data.

8. An operational amplifier detection system, characterized in that: Applied to an acquisition circuit, the acquisition circuit includes a control unit, a voltage sampling circuit and a current sampling circuit, the voltage sampling circuit includes a selection circuit, the selection circuit has a chip selection end, a voltage output end, and multiple voltage input ends, the multiple voltage input ends are used to collect the output voltages of multiple operational amplifiers to be tested, the selection circuit is used to adjust the connection state between the voltage output end and the multiple voltage input ends according to the chip selection signal input by the chip selection end, the chip selection end and the voltage output end are both connected to the control unit, there are multiple chip selection signals, and the multiple chip selection signals correspond to the multiple operational amplifiers to be tested; the multiple operational amplifiers to be tested are connected in series; the current sampling circuit is connected to the control unit, and is used to collect the working current of the operational amplifiers to be tested after the series connection; The operational amplifier detection device comprises: A voltage acquisition unit, used to sequentially output the plurality of chip selection signals to acquire a plurality of output voltages of each of the operational amplifiers to be tested acquired by the voltage sampling circuit; A current acquisition power supply, used to acquire multiple working currents collected by the current sampling circuit; A voltage determination unit, used for performing a linear regression analysis on a plurality of output voltages corresponding to each of the operational amplifiers to be tested, to obtain an output voltage to be tested corresponding to each of the operational amplifiers to be tested; A current determination unit, used for performing linear regression analysis on the plurality of working currents to obtain a working current to be measured; A voltage detection unit, used to determine a voltage detection result corresponding to each of the operational amplifiers to be tested according to each of the output voltages to be tested and a preset voltage threshold range; A current detection unit, used to determine a current detection result according to the working current to be measured and a preset voltage threshold range; A result output unit, used for determining final detection results of the plurality of operational amplifiers to be tested according to the plurality of voltage detection results and the current detection results; The output voltage to be tested corresponding to each of the operational amplifiers to be tested is obtained by the following steps: Filtering the plurality of output voltages to obtain a plurality of filtered intermediate voltages; The output voltage to be tested is obtained based on the multiple intermediate voltages and a pre-constructed first linear regression prediction model corresponding to the operational amplifier to be tested; wherein, when the operational amplifier to be tested has different models, each model of the operational amplifier to be tested corresponds to a first linear regression prediction model.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer-executable instructions, and the computer-executable instructions are used to enable a computer to execute the operational amplifier detection method according to any one of claims 1 to 7.

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