A resistance test device for enhanced field effect tube packaging

Abstract

The invention discloses a resistance test device for an enhanced field effect tube after packaging, which relates to the field of resistance testing and comprises: a bottom plate, wherein a collecting groove is arranged on the bottom plate, and a telescopic spring 1 is evenly arranged on the inner wall of the collecting groove, and the outer surface of the telescopic spring 1 is fixedly connected to the inner wall of the collecting groove, and a soft pad is fixedly connected to the top of the telescopic spring 1, and a metal shielding net is fixedly connected to the top of the bottom plate; an assembly line mechanism, which is used to fix and transport the packaged field effect tube in an assembly line manner; and an auxiliary mechanism, which is used to place and unload the field effect tube and perform resistance detection on the field effect tube, firstly, the field effect tube is placed in the auxiliary mechanism, and then the auxiliary mechanism will first place the field effect tubes one by one into the assembly line mechanism, and then the auxiliary mechanism will test the resistance of the field effect tube in the metal shielding net, and release the field effect tube above the collecting groove for subsequent recycling.

Description

Technical Field

[0001] The invention relates to the technical field of resistance testing, in particular to a resistance testing device after packaging an enhanced field effect transistor. Background Art

[0002] Field Effect Transistor (FET) is abbreviated as field effect tube. There are two main types: junction field effect tube (JFET) and metal-oxide semiconductor field effect tube (MOS-FET). The majority of carriers participate in the conduction, also known as a unipolar transistor. It is a voltage-controlled semiconductor device. It has the advantages of high input resistance (107~1015Ω), low noise, low power consumption, large dynamic range, easy integration, no secondary breakdown phenomenon, and a wide safe working area. It has become a strong competitor of bipolar transistors and power transistors.

[0003] When testing the resistance of a field effect tube, since the field effect tube is small in size and is easily disturbed by external magnetic fields and dust, if dust adheres to the electrodes of the field effect tube, the measured resistance will be inaccurate. Therefore, it is necessary to avoid external interference before testing. Summary of the invention

[0004] In view of the shortcomings of the prior art, the present invention solves the technical problems by adopting a technical solution: a resistance test device after encapsulation of an enhanced field effect transistor according to the present invention comprises:

[0005] A bottom plate, wherein a collecting groove is arranged on the bottom plate, a telescopic spring 1 is evenly arranged on the inner wall of the collecting groove, an outer surface of the telescopic spring 1 is fixedly connected to the inner wall of the collecting groove, a soft pad is fixedly connected to the top of the telescopic spring 1, and a metal shielding net is fixedly connected to the top of the bottom plate;

[0006] An assembly line mechanism, which is used to fix and transport the packaged field effect transistors in an assembly line manner;

[0007] An auxiliary mechanism, which is used for placing and unloading the field effect tube and performing resistance detection on the field effect tube;

[0008] The assembly line mechanism comprises a support plate 1, a servo motor 1 is fixedly connected to the support plate 1, a roller is fixedly connected to the output end of the servo motor 1, a crawler is slidably connected to the outer surface of the roller, and a placement mechanism is evenly arranged on the outer surface of the crawler;

[0009] The placement mechanism includes a support bar, a placement plate is fixedly connected to the top of the support bar, a clamping mechanism is fixedly connected to the inner wall of the placement plate, notches are symmetrically arranged on the outer surface of the placement plate, a field effect tube is placed on the placement plate, a gate is fixedly connected to the field effect tube, an end of the field effect tube close to the gate is fixedly connected to the drain, and an end of the field effect tube close to the drain is fixedly connected to the source.

[0010] Preferably, the bottom of the support plate 1 is fixedly connected to the top of the base plate, and the bottom of the support strip is fixedly connected to the outer surface of the track.

[0011] Preferably, the clamping mechanism includes two telescopic springs, the number of which is two, the outer surface of which is fixedly connected to a clamping plate, the outer surface of which is slidably connected to the inner wall of the notch, the top of which is fixedly connected to a magnet, and support rods are symmetrically arranged at both ends of the clamping plate, the outer surface of which is fixedly connected to both ends of the clamping plate, and the end of which is away from the clamping plate is slidably connected to a cleaning mechanism.

[0012] Preferably, the cleaning mechanism includes a sealing column, an end of the sealing column away from the support rod is fixedly connected to a push plate, the outer surface of the push plate is slidably connected to an air cavity, an end of the air cavity close to the field effect tube is provided with an air outlet groove, and the outer surface of the air cavity is fixedly connected to the end of the placement plate close to the field effect tube.

[0013] Preferably, the outer surface of the second telescopic spring is fixedly connected to the inner wall of the placement plate, and the outer surface of the sealing column is fixedly connected to an end of the support rod 1 away from the clamping plate.

[0014] Preferably, the auxiliary mechanism includes a support plate 2, support feet are symmetrically arranged on the bottom of the support plate 2, a support column 1 is fixedly connected to the outer surface of the support plate 2, an end of the support column 1 away from the support plate 2 is fixedly connected to the detection mechanism, a side of the support plate 2 away from the support column 1 is fixedly connected to a support column 2, and an end of the support column 2 away from the support plate 2 is fixedly connected to the loading and unloading mechanism.

[0015] Preferably, the detection mechanism includes a support block, the inner wall of the support block is fixedly connected to a telescopic rod, the output end of the telescopic rod is fixedly connected to a preprocessing mechanism, the top of the support block is fixedly connected to a universal meter, the outer surface of the universal meter is symmetrically provided with wire grooves, and both ends of the support block are fixedly connected to contact mechanisms.

[0016] Preferably, the pretreatment mechanism includes servo motor 2, the output point of servo motor 2 is fixedly connected to a rotating shaft, the top of the rotating shaft is fixedly connected to a rotating plate, soft brushes are evenly arranged on the top of the rotating plate, the bottom of the soft brush is fixedly connected to the top of the rotating plate, the bottom of the rotating shaft is fixedly connected to telescopic rod 2, the bottom of telescopic rod 2 is fixedly connected to a metal rod, the top of telescopic rod 1 is fixedly connected to support rod 2, the inner wall of support rod 2 is fixedly connected to a test lead, the outer surface of the test lead is fixedly connected to a wire, and the end of the wire away from the test lead is fixedly connected to the inner wall of the wire trough.

[0017] Preferably, the contact mechanism includes a support rod three, the support rod three is fixed on the outer surface of the support block, the end of the support rod three away from the support block is fixedly connected to a support plate three, the outer surface of the support plate three is fixedly connected to a scratch plate, the end of the support block away from the support plate three is fixedly connected to a support rod four, the end of the support rod four away from the support block is fixedly connected to a support plate four, and the outer surface of the support plate four is fixedly connected to a metal ring.

[0018] Preferably, the loading and unloading mechanism includes a convex plate, the outer surface of the convex plate is fixedly connected to the end of the support column 2 away from the support plate 2, the top of the convex plate is fixedly connected to a pipe placing bin, the bottom of the convex plate is fixedly connected to a discharge device, the end of the convex plate away from the support column 2 is fixedly connected to a control panel, both ends of the control panel are fixedly connected to electric wires, the end of the electric wire away from the control panel is fixedly connected to an electromagnet, and the outer surface of the electromagnet is fixedly connected to the outer surface of the convex plate.

[0019] The beneficial effects of the present invention are as follows:

[0020] 1. The present invention sets a placement mechanism. After the field effect tube is placed on the placement plate through the auxiliary mechanism, the supporting mechanism starts to work, the telescopic spring 2 is compressed first, and the field effect tube subsequently enters the placement plate. After that, the telescopic spring 2 restores its deformation, and drives the clamping plate 3542 to fix the field effect tube in the placement plate and leak out the gate, drain, and source, so as to facilitate the subsequent detection of the resistance.

[0021] 2. The present invention sets a dust cleaning mechanism. When the telescopic spring 2 drives the clamping plate to move, it drives the support rod 1 to move and squeezes the air in the air cavity by the sealing column and the pushing plate. The squeezed air flows out from the air outlet slot at a faster speed and impact force. The air will blow off the dust adhered to the grid, drain and source, thereby facilitating the subsequent resistance detection and preventing the dust from obstructing the contact of the test lead.

[0022] 3. The present invention sets a pretreatment mechanism. The telescopic rod 1 drives the pretreatment mechanism to move, and then drives the support rod 2 to move, and makes the two electric pens contact with the gate and source of the field effect tube. Before the contact, the servo motor 2 drives the rotating shaft to rotate, and then drives the rotating plate to rotate, and makes the soft brush contact with the test pen, so as to brush off the dust on the test pen and avoid the dust hindering the resistance test. After that, static electricity is generated due to friction, and the rotating shaft drives the telescopic rod 2 to rotate to the test pen, and the telescopic rod 2 then contacts the metal rod with the test pen to take away the generated static electricity and avoid the influence of static electricity on the resistance measurement.

[0023] 4. The present invention provides a contact mechanism. When the rotating shaft drives the rotating plate to rotate, the soft brush is driven to come into contact with the scratch plate, thereby scraping off the dust adhered to the soft brush when cleaning the test lead, thereby achieving self-cleaning. After that, as it rotates, the soft brush will also come into contact with the metal ring to take away the static electricity generated during the scratching. Because static electricity can generate adsorption force, it can not only prevent static electricity from being transferred to the electric meter, but also make the dust fall off better.

[0024] 5. The present invention sets up a loading and unloading mechanism, places the field effect tube in the tube storage bin, and then discharges it downward in sequence through the discharge device. At the same time, the control board is used to power on and off the upper and lower electromagnets, so that the electromagnets attract and do not attract the magnet, which facilitates the telescopic spring to drive the clamping plate to fix and release the field effect tube. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 It is a schematic diagram of the structure of the present invention;

[0026] Figure 2 It is a cross-sectional view of the structure of the present invention;

[0027] Figure 3 is a structural cross-sectional view of the bottom plate of the present invention;

[0028] Figure 4 It is a structural schematic diagram of the assembly line mechanism of the present invention;

[0029] Figure 5 It is a structural schematic diagram of the placement mechanism of the present invention;

[0030] Figure 6 It is a partial structural schematic diagram of the placement mechanism of the present invention;

[0031] Figure 7 It is a structural schematic diagram of the clamping mechanism of the present invention;

[0032] Figure 8 It is a structural schematic diagram of the dust cleaning mechanism of the present invention;

[0033] Fig. 9 It is a structural schematic diagram of the auxiliary mechanism of the present invention;

[0034] Fig.10 It is a structural schematic diagram of the detection mechanism of the present invention;

[0035] Fig.11 It is a structural schematic diagram of the pretreatment mechanism of the present invention;

[0036] Fig.12 yes Fig.10 The enlarged view of point A in the middle;

[0037] Fig.13 yes Fig.10 The enlarged view of point B in the middle;

[0038] Fig.14 It is a structural schematic diagram of the loading and unloading mechanism of the present invention;

[0039] In the figure: 1, bottom plate; 2, metal shielding net; 3, assembly line mechanism; 4, auxiliary mechanism; 5, collecting tank; 6, telescopic spring 1; 7, cushion; 31, support plate 1; 32, servo motor 1; 33, crawler; 34, roller; 35, placement mechanism; 351, support bar; 352, placement plate; 353, notch; 354, clamping mechanism; 355, field effect tube; 356, gate; 357, drain; 358, source; 3541, telescopic spring 2; 3542, clamping plate; 3543, magnet; 3544, support rod 1; 3545, dust cleaning mechanism; 35451, sealing column; 35452, push plate; 35453, air cavity; 35454, air outlet slot; 41, support plate 2; 42, support foot; 43, support column 1; 44 , detection mechanism; 45, support column two; 46, loading and unloading mechanism; 441, support block; 442, telescopic rod one; 443, pretreatment mechanism; 444, universal ammeter; 445, contact mechanism; 446, wire trough; 4431, servo motor two; 4432, rotating shaft; 4433, rotating plate; 4434, soft brush; 4435, telescopic rod two; 4436, metal rod; 4437, support rod two; 4438, test lead; 4439, wire; 4451, support rod three; 4452, support plate three; 4453, scratch plate; 4454, support rod four; 4455, support plate four; 4456, metal ring; 461, convex plate; 462, pipe storage bin; 463, discharge device; 464, control panel; 465, wire; 466, electromagnet;. DETAILED DESCRIPTION

[0040] The present invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments. The embodiments of the present invention are provided for the purpose of illustration and description, and are not intended to be exhaustive or to limit the present invention to the disclosed forms. Many modifications and variations will be apparent to those of ordinary skill in the art. The embodiments are selected and described in order to better illustrate the principles and practical applications of the present invention, and to enable those of ordinary skill in the art to understand the present invention and thereby design various embodiments with various modifications suitable for specific uses.

[0041] Example 1, using Figure 1-Figure 14 A resistance testing device for a packaged enhanced field effect transistor 355 according to an embodiment of the present invention is described as follows.

[0042] like Figure 1-Figure 14 As shown, a resistance testing device after encapsulation of an enhanced field effect transistor 355 of the present invention comprises:

[0043] like Figure 1-Figure 3 As shown, a bottom plate 1 is provided with a collecting groove 5, the inner wall of the collecting groove 5 is evenly provided with a telescopic spring 6, the outer surface of the telescopic spring 6 is fixedly connected to the inner wall of the collecting groove 5, the top of the telescopic spring 6 is fixedly connected with a soft pad 7, and the top of the bottom plate 1 is fixedly connected with a metal shielding net 2;

[0044] An assembly line mechanism 3, which is used to fix and transport the packaged field effect transistors 355 in an assembly line manner;

[0045] An auxiliary mechanism 4, the auxiliary mechanism 4 is used to place and unload the field effect tube 355 and perform resistance detection on the field effect tube 355;

[0046] When a resistance testing device in which an enhanced field effect transistor 355 is packaged starts working, the field effect transistor 355 is first placed in the auxiliary mechanism 4, and then the auxiliary mechanism 4 places the field effect transistors 355 one by one into the assembly line mechanism 3, and then the auxiliary mechanism 4 tests the resistance of the field effect transistor 355 in the metal shielding net 2, and releases the field effect transistor 355 above the collection slot 5.

[0047] like Figure 4 As shown, the assembly line mechanism 3 includes a support plate 31, a servo motor 32 is fixedly connected to the support plate 31, a roller 34 is fixedly connected to the output end of the servo motor 32, a crawler 33 is slidably connected to the outer surface of the roller 34, and a placement mechanism 35 is evenly arranged on the outer surface of the crawler 33;

[0048] The servo motor 1 32 drives the roller 34 to rotate, thereby moving the track 33 and driving the placement mechanism 35 to move.

[0049] like Figure 5-Figure 6The placement mechanism 35 includes a support bar 351, a placement plate 352 is fixedly connected to the top of the support bar 351, a clamping mechanism 354 is fixedly connected to the inner wall of the placement plate 352, and notches 353 are symmetrically arranged on the outer surface of the placement plate 352. A field effect tube 355 is placed on the placement plate 352, a gate 356 is fixedly connected to the field effect tube 355, an end of the field effect tube 355 close to the gate 356 is fixedly connected to the drain 357, and an end of the field effect tube 355 close to the drain 357 is fixedly connected to the source 358.

[0050] When the placement mechanism 35 moves to the position of the auxiliary mechanism 4 outside the metal shielding net 2, the clamping mechanism 354 starts to work.

[0051] The bottom of the support plate 1 31 is fixedly connected to the top of the bottom plate 1 , and the bottom of the support bar 351 is fixedly connected to the outer surface of the crawler track 33 .

[0052] like Figure 7 As shown, the clamping mechanism 354 includes a telescopic spring 3541, the number of the telescopic spring 3541 is two, the outer surface of the telescopic spring 3541 is fixedly connected to a clamping plate 3542, the outer surface of the clamping plate 3542 is slidably connected to the inner wall of the notch 353, the top of the clamping plate 3542 is fixedly connected to a magnet 3543, and support rods 3544 are symmetrically arranged at both ends of the clamping plate 3542, the outer surface of the support rod 3544 is fixedly connected to the two ends of the clamping plate 3542, and the end of the support rod 3544 away from the clamping plate 3542 is slidably connected to a cleaning mechanism 3545.

[0053] The magnet 3543 will be attracted, thereby compressing the telescopic spring 3541. The field effect tube 355 will then enter the placement plate 352. After that, the telescopic spring 3541 will restore its deformation, driving the clamping plate 3542 to fix the field effect tube 355 in the placement plate 352 and leak out the gate 356, drain 357, and source 358, so as to facilitate the subsequent detection of the resistance. At the same time, the cleaning mechanism 3545 will also start working along with the movement of the clamping plate 3542.

[0054] like Figure 8 As shown, the cleaning mechanism 3545 includes a sealing column 35451, and the end of the sealing column 35451 away from the support rod 3544 is fixedly connected to a push plate 35452, the outer surface of the push plate 35452 is slidably connected to an air cavity 35453, and the end of the air cavity 35453 close to the field effect tube 355 is provided with an air outlet groove 35454, and the outer surface of the air cavity 35453 is fixedly connected to the end of the placement plate 352 close to the field effect tube 355.

[0055] When the telescopic spring 2 3541 drives the clamping plate 3542 to move, the support rod 1 3544 will be driven to move and the sealing column 35451 and the push plate 35452 will squeeze the air in the air cavity 35453. The squeezed air will flow out from the air outlet slot 35454 at a faster speed and impact force. The air will blow off the dust adhering to the gate 356, the drain 357 and the source 358, thereby facilitating the subsequent resistance detection and preventing the dust from obstructing the contact of the test lead 4438. The advantage of using air blowing for cleaning is that it can not only reduce static electricity, but also prevent the gate 356, the drain 357 and the source 358 from being scratched and damaged.

[0056] The outer surface of the telescopic spring 2 3541 is fixedly connected to the inner wall of the placement plate 352 , and the outer surface of the sealing column 35451 is fixedly connected to an end of the support rod 1 3544 away from the clamping plate 3542 .

[0057] The specific workflow is as follows:

[0058] During operation, the servo motor 1 32 drives the roller 34 to rotate, thereby moving the crawler 33 and driving the placement mechanism 35 to move. When the placement mechanism 35 moves to the position of the auxiliary mechanism 4 outside the metal shielding net 2, the clamping mechanism 354 starts to work, and the magnet 3543 is attracted, thereby compressing the telescopic spring 2 3541, and the field effect tube 355 subsequently enters the placement plate 352. After that, the telescopic spring 2 3541 will restore its deformation, and drive the clamping plate 3542 to fix the field effect tube 355 in the placement plate 352 and leak the gate 356, drain 357, and source 358 to facilitate the subsequent detection of the resistor. At the same time, the cleaning mechanism 3545 will also be accompanied by the clamping Plate 3542 moves and starts working. When telescopic spring 2 3541 drives clamping plate 3542 to move, support rod 1 3544 will be driven to move and seal column 35451 and push plate 35452 will squeeze the air in air cavity 35453. The squeezed air will flow out from air outlet slot 35454 at a faster speed and with greater impact force. The air will blow off dust adhered to gate 356, drain 357 and source 358, thereby facilitating subsequent resistance detection and preventing dust from obstructing contact of test lead 4438. The advantage of using air blowing for cleaning is that it can not only reduce static electricity, but also prevent gate 356, drain 357 and source 358 from being scratched and damaged.

[0059] Embodiment 2, use Figure 1-Figure 14 A resistance testing device for a packaged enhanced field effect transistor 355 according to an embodiment of the present invention is described as follows.

[0060] like Figure 1-Figure 14As shown, a resistance test device after encapsulation of an enhanced field effect transistor 355 of the present invention is based on the first embodiment, as shown in FIG. Fig. 9 As shown, the auxiliary mechanism 4 includes a support plate 41, and support feet 42 are symmetrically arranged at the bottom of the support plate 41. A support column 43 is fixedly connected to the outer surface of the support plate 41, and a detection mechanism 44 is fixedly connected to the end of the support column 43 away from the support plate 41, a support column 45 is fixedly connected to the side of the support plate 41 away from the support column 43, and a loading and unloading mechanism 46 is fixedly connected to the end of the support column 45 away from the support plate 41.

[0061] The loading and unloading mechanism 46 can control the fixing and releasing of the field effect tube 355 by the clamping mechanism 354 , and the detection mechanism 44 is used to detect the resistance of the fixed field effect tube 355 .

[0062] like Figure 8 As shown, the detection mechanism 44 includes a support block 441, the inner wall of the support block 441 is fixedly connected to a telescopic rod 442, the output end of the telescopic rod 442 is fixedly connected to a pre-processing mechanism 443, the top of the support block 441 is fixedly connected to a universal meter 444, the outer surface of the universal meter 444 is symmetrically provided with wire grooves 446, and the two ends of the support block 441 are fixedly connected to contact mechanisms 445.

[0063] like Fig.11 As shown, the pretreatment mechanism 443 includes a servo motor 4431, the output point of the servo motor 4431 is fixedly connected to a rotating shaft 4432, the top of the rotating shaft 4432 is fixedly connected to a rotating plate 4433, soft brushes 4434 are evenly arranged on the top of the rotating plate 4433, the bottom of the soft brush 4434 is fixedly connected to the top of the rotating plate 4433, the bottom of the rotating shaft 4432 is fixedly connected to a telescopic rod 4435, the bottom of the telescopic rod 4435 is fixedly connected to a metal rod 4436, the top of the telescopic rod 442 is fixedly connected to a support rod 4437, the inner wall of the support rod 4437 is fixedly connected to a test lead 4438, the outer surface of the test lead 4438 is fixedly connected to a wire 4439, and the end of the wire 4439 away from the test lead 4438 is fixedly connected to the inner wall of the wire groove 446.

[0064] The telescopic rod 1 442 will drive the pre-processing mechanism 443 to move, and then drive the support rod 2 4437 to move, and make the two electric pens contact with the gate 356 and source 358 of the field effect tube 355, so as to measure the resistance of the field effect tube 355.

[0065] Before the test lead 4438 contacts the field effect transistor 355, the servo motor 4431 drives the shaft 4432 to rotate, and then drives the rotating plate 4433 to rotate, and makes the soft brush 4434 contact the test lead 4438 to brush off the dust on the test lead 4438 to prevent the dust from hindering the resistance test. After that, static electricity is generated due to friction, and the shaft 4432 drives the telescopic rod 4435 to rotate to the test lead 4438. The telescopic rod 4435 then makes the metal rod 4436 contact the test lead 4438 to take away the generated static electricity, so as to avoid the influence of static electricity on the resistance measurement.

[0066] like Figure 12-13 As shown, the contact mechanism 445 includes a support rod three 4451, the support rod three 4451 is fixed on the outer surface of the support block 441, the end of the support rod three 4451 away from the support block 441 is fixedly connected to the support plate three 4452, the outer surface of the support plate three 4452 is fixedly connected to the scratch plate 4453, the end of the support block 441 away from the support plate three 4452 is fixedly connected to the support rod four 4454, the end of the support rod four 4454 away from the support block 441 is fixedly connected to the support plate four 4455, and the outer surface of the support plate four 4455 is fixedly connected to the metal ring 4456.

[0067] When the rotating shaft 4432 drives the rotating plate 4433 to rotate, it will drive the soft brush 4434 to come into contact with the scratch plate 4453, thereby scraping off the dust adhered to the soft brush 4434 when cleaning the test lead 4438, thereby achieving self-cleaning. After that, as it rotates, the soft brush 4434 will also come into contact with the metal ring 4456, taking away the static electricity generated by the scratching. Because static electricity will generate adsorption force, it can not only prevent static electricity from being transferred to the meter, but also make the dust fall off better.

[0068] like Figure 4 As shown, the loading and unloading mechanism 46 includes a protruding plate 461, the outer surface of the protruding plate 461 is fixedly connected to the end of the supporting column 45 away from the supporting plate 41, the top of the protruding plate 461 is fixedly connected with a tube placing bin 462, the bottom of the protruding plate 461 is fixedly connected with a discharge device 463, the end of the protruding plate 461 away from the supporting column 45 is fixedly connected with a control board 464, both ends of the control board 464 are fixedly connected with electric wires 465, the end of the electric wire 465 away from the control board 464 is fixedly connected with an electromagnet 466, and the outer surface of the electromagnet 466 is fixedly connected to the outer surface of the protruding plate 461.

[0069] By placing the field effect tube 355 in the tube storage bin 462 and then discharging it downward in sequence through the discharge device 463, when placing it, the control board 464 will energize the electromagnet 466 located above, thereby attracting the magnet 3543 and driving the clamping plate 3542 to move, so as to facilitate the placement of the field effect tube 355. After that, the power will be turned off, and the elastic force of the telescopic spring 3541 will fix the field effect tube 355. When the field effect tube 355 needs to be removed, the electromagnet 466 at the bottom is energized, so that the clamping plate 3542 is pulled backward again, and gravity causes the field effect tube 355 to fall onto the soft pad 7, which is convenient for subsequent centralized recovery.

[0070] The specific workflow is as follows:

[0071] When working, the telescopic rod 1 442 will drive the pretreatment mechanism 443 to move, and then drive the support rod 2 4437 to move, and make the two electric pens contact with the gate 356 and the source 358 of the field effect tube 355, so as to measure the resistance of the field effect tube 355. Before the test pen 4438 contacts the field effect tube 355, the servo motor 2 4431 will drive the rotating shaft 4432 to rotate, and then drive the rotating plate 4433 to rotate, and make the soft brush 4434 contact the test pen 4438. The metal rod 4436 is in contact with the test lead 4438 to remove the dust on the test lead 4438, thereby preventing the dust from hindering the resistance test. After that, static electricity is generated due to friction. The rotating shaft 4432 drives the telescopic rod 2 4435 to rotate to the test lead 4438. The telescopic rod 2 4435 then brings the metal rod 4436 into contact with the test lead 4438 to take away the generated static electricity, thereby preventing the influence of static electricity on the resistance measurement. When the rotating shaft 4432 drives the rotating plate 4433 to rotate, it drives the soft brush 4434 to come into contact with the scratch plate 4453, thereby The dust adhered to the soft brush 4434 when cleaning the test lead 4438 is scraped off, thereby achieving self-cleaning. After that, as it rotates, the soft brush 4434 will also come into contact with the metal ring 4456, and take away the static electricity generated when scratching. Because static electricity will generate adsorption force, it can not only prevent static electricity from being transferred to the meter, but also make the dust fall off better. Finally, when the loading and unloading mechanism 46 is working, the field effect tube 355 is placed in the tube placement bin 462, and then discharged downward in sequence through the discharge device 463. When the FET 355 needs to be removed, the electromagnet 466 at the bottom is energized, so that the clamping plate 3542 is pulled backwards again, and gravity causes the FET 355 to fall onto the cushion 7, which is convenient for subsequent centralized recovery.

[0072] Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field and related fields without creative work should fall within the scope of protection of the present invention. The structures, devices and operating methods not specifically described and explained in the present invention are implemented according to the conventional means in the field unless otherwise specified and limited.

Claims

1. A resistance test device for a packaged enhanced field effect transistor, characterized in that: include: A bottom plate (1), wherein a collecting groove (5) is arranged on the bottom plate (1), a telescopic spring (6) is evenly arranged on the inner wall of the collecting groove (5), a soft pad (7) is fixedly connected to the top of the telescopic spring (6), and a metal shielding net (2) is fixedly connected to the top of the bottom plate (1); An assembly line mechanism (3), the assembly line mechanism (3) being used to fix and transport the packaged field effect tubes (355) in an assembly line manner; An auxiliary mechanism (4), the auxiliary mechanism (4) being used for placing and unloading the field effect tube (355) and performing resistance detection on the field effect tube (355); The assembly line mechanism (3) comprises a support plate (31), a servo motor (32) is fixedly connected to the support plate (31), a roller (34) is fixedly connected to the output end of the servo motor (32), a crawler (33) is slidably connected to the outer surface of the roller (34), and a placement mechanism (35) is evenly arranged on the outer surface of the crawler (33); The placement mechanism (35) comprises a support bar (351), a placement plate (352) is fixedly connected to the top of the support bar (351), a clamping mechanism (354) is fixedly connected to the inner wall of the placement plate (352), notches (353) are symmetrically arranged on the outer surface of the placement plate (352), a field effect tube (355) is placed on the placement plate (352), a gate (356) is fixedly connected to the field effect tube (355), one end of the field effect tube (355) close to the gate (356) is fixedly connected to the drain (357), and one end of the field effect tube (355) close to the drain (357) is fixedly connected to the source (358); The clamping mechanism (354) comprises a second telescopic spring (3541), the number of the second telescopic spring (3541) is two, the outer surface of the second telescopic spring (3541) is fixedly connected to a clamping plate (3542), the outer surface of the clamping plate (3542) is slidably connected to the inner wall of the notch (353), the top of the clamping plate (3542) is fixedly connected to a magnet (3543), support rods (3544) are symmetrically arranged at both ends of the clamping plate (3542), and the end of the support rod (3544) away from the clamping plate (3542) is slidably connected to a dust cleaning mechanism (3545); The dust cleaning mechanism (3545) includes a sealing column (35451), one end of the sealing column (35451) away from the support rod (3544) is fixedly connected to a push plate (35452), the outer surface of the push plate (35452) is slidably connected to an air cavity (35453), an end of the air cavity (35453) close to the field effect tube (355) is provided with an air outlet groove (35454), and the outer surface of the air cavity (35453) is fixedly connected to the end of the placement plate (352) close to the field effect tube (355).

2. The resistance test device after encapsulation of an enhanced field effect transistor according to claim 1, characterized in that: The bottom of the support plate 1 (31) is fixedly connected to the top of the bottom plate (1), and the bottom of the support bar (351) is fixedly connected to the outer surface of the crawler (33).

3. The resistance test device after encapsulation of an enhanced field effect transistor according to claim 1, characterized in that: The outer surface of the telescopic spring 2 (3541) is fixedly connected to the inner wall of the placement plate (352), and the outer surface of the sealing column (35451) is fixedly connected to the end of the support rod 1 (3544) away from the clamping plate (3542).

4. The resistance test device after encapsulation of an enhanced field effect transistor according to claim 1, characterized in that: The auxiliary mechanism (4) comprises a second support plate (41), the bottom of the second support plate (41) is symmetrically provided with support feet (42), the outer surface of the second support plate (41) is fixedly connected with a first support column (43), one end of the first support column (43) away from the second support plate (41) is fixedly connected with a detection mechanism (44), a side of the second support plate (41) away from the first support column (43) is fixedly connected with a second support column (45), and one end of the second support column (45) away from the second support plate (41) is fixedly connected with a loading and unloading mechanism (46).

5. The resistance test device after encapsulation of an enhanced field effect transistor according to claim 4, characterized in that: The detection mechanism (44) comprises a support block (441), the inner wall of the support block (441) is fixedly connected to a telescopic rod (442), the output end of the telescopic rod (442) is fixedly connected to a pre-processing mechanism (443), the top of the support block (441) is fixedly connected to a universal meter (444), the outer surface of the universal meter (444) is symmetrically provided with wire grooves (446), and both ends of the support block are fixedly connected to contact mechanisms (445).

6. The resistance test device after encapsulation of an enhanced field effect transistor according to claim 5, characterized in that: The pretreatment mechanism (443) comprises a second servo motor (4431), the output point of the second servo motor (4431) is fixedly connected to a rotating shaft (4432), the top of the rotating shaft (4432) is fixedly connected to a rotating plate (4433), the top of the rotating plate (4433) is evenly provided with soft brushes (4434), the bottom of the rotating shaft (4432) is fixedly connected to a second telescopic rod (4435), the bottom of the second telescopic rod (4435) is fixedly connected to a metal rod (4436), the top of the first telescopic rod (442) is fixedly connected to a second support rod (4437), the inner wall of the second support rod (4437) is fixedly connected to a test lead (4438), the outer surface of the test lead (4438) is fixedly connected to a wire (4439), and the end of the wire (4439) away from the test lead (4438) is fixedly connected to the inner wall of the wire slot (446).

7. The resistance test device after encapsulation of an enhanced field effect transistor according to claim 5, characterized in that: The contact mechanism (445) comprises a support rod three (4451), wherein the support rod three (4451) is fixed on the outer surface of the support block (441), the end of the support rod three (4451) away from the support block (441) is fixedly connected to a support plate three (4452), the outer surface of the support plate three (4452) is fixedly connected to a scratch plate (4453), the end of the support block (441) away from the support plate three (4452) is fixedly connected to a support rod four (4454), the end of the support rod four (4454) away from the support block (441) is fixedly connected to a support plate four (4455), and the outer surface of the support plate four (4455) is fixedly connected to a metal ring (4456).

8. The resistance test device after encapsulation of an enhanced field effect transistor according to claim 4, characterized in that: The loading and unloading mechanism (46) comprises a convex plate (461), the outer surface of the convex plate (461) is fixedly connected to one end of the second support column (45) away from the second support plate (41), the top of the convex plate (461) is fixedly connected to a tube placing bin (462), the bottom of the convex plate (461) is fixedly connected to a discharge device (463), the end of the convex plate (461) away from the second support column (45) is fixedly connected to a control board (464), both ends of the control board (464) are fixedly connected to electric wires (465), the end of the electric wire (465) away from the control board (464) is fixedly connected to a conductive electromagnet (466), and the outer surface of the conductive electromagnet (466) is fixedly connected to the outer surface of the convex plate (461).

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