Method, test device, electronic equipment and computer program product for testing the capability of superimposed alternating current laboratory

Abstract

The present disclosure provides a method for detecting the capability of a superimposed alternating current laboratory, a test device for detecting the capability of a superimposed alternating current laboratory, an electronic device and a computer program product. A ripple voltage generating device is deployed in the superimposed alternating current laboratory. The output end of the ripple voltage generating device is connected to the input end of the test device. The ripple voltage generating device is used to generate a test ripple voltage after superimposed alternating current. The test device includes a howling circuit which generates a howling when the frequency of the test ripple voltage is the same as the resonant frequency of the howling circuit. The ripple voltage generating device is tested by the test device for superimposed alternating current to obtain test data corresponding to the ripple voltage generating device. Based on a plurality of howling frequencies included in the test data, the capability index of the superimposed alternating current laboratory is determined, thereby determining whether the superimposed alternating current laboratory can be used to perform performance evaluation on vehicle electronic devices. Compared with manual detection, the method saves time and effort and effectively improves the detection accuracy.

Description

Technical Field

[0001] The present disclosure relates to the field of vehicle detection technology, and in particular to a method for detecting the capability of a superimposed alternating current laboratory, a test device for detecting the capability of a superimposed alternating current laboratory, an electronic device, and a computer program product. Background Art

[0002] In the actual operation of the vehicle electrical system, since the inductive element in the inductive load has the function of energy storage, when the inductive load is connected or disconnected, a transient current will be generated, which will generate a reverse electromotive force in the circuit, causing the voltage to rise or fall instantly. When the current changes, harmonic currents with different frequencies from the original current will be generated. These harmonic currents will propagate in the circuit, causing the voltage and current waveforms to be distorted, thus affecting the stability of the circuit.

[0003] In order to evaluate the performance and reliability of vehicle electronic devices under the above conditions, superimposed AC experiments can be carried out in the laboratory to simulate the working environment of ripple voltage under DC power supply. For this purpose, it is necessary to conduct capacity testing on each superimposed AC laboratory to determine the laboratory that meets the requirements for superimposed AC experiment capabilities from multiple laboratories. For the process of superimposed AC experiment capability testing, the experimental capability is generally evaluated by on-site verification by experimental auditors. This method is time-consuming and labor-intensive, and brings a high labor cost burden. At the same time, the evaluation of experimental capability by this method is based solely on the subjective experience of the experimental auditors, which in turn affects the reliability of the capability test results. Summary of the invention

[0004] The embodiments of the present disclosure at least provide a method for detecting the capability of a superimposed alternating current laboratory, a testing device, an electronic device and a computer program product for detecting the capability of a superimposed alternating current laboratory.

[0005] The embodiment of the present disclosure provides a method for detecting the capability of a superimposed alternating current laboratory, wherein a ripple voltage generating device is deployed in the superimposed alternating current laboratory, wherein the output end of the ripple voltage generating device is connected to the input end of a testing device, and the ripple voltage generating device is used to generate a test ripple voltage after superimposing alternating current; the testing device includes a howling circuit, and the howling circuit generates a howling when the frequency of the test ripple voltage is the same as the resonant frequency of the howling circuit; the method includes:

[0006] Performing a superimposed alternating current test on the ripple voltage generating device to be tested by a testing device to obtain test data corresponding to the ripple voltage generating device; the test data includes a plurality of howling frequencies; the howling frequency refers to the frequency of the test ripple voltage corresponding to the howling of the testing device;

[0007] Determine a capability index of the superimposed alternating current laboratory based on the multiple howling frequencies, wherein the capability index is used to indicate the capability of the superimposed alternating current laboratory to perform a superimposed alternating current experiment;

[0008] Based on the capability index of the superimposed alternating current laboratory, a test result of the superimposed alternating current laboratory is determined, wherein the test result is used to indicate whether the superimposed alternating current laboratory can be used to perform performance evaluation on vehicle electronic devices.

[0009] In an embodiment of the present disclosure, a superimposed AC experiment is performed on a ripple voltage generating device deployed in a superimposed AC laboratory through a testing device, wherein the ripple voltage generating device generates a test ripple voltage after superimposed AC, and transmits the test ripple voltage to the testing device. When the frequency of the test ripple voltage is the same as the resonant frequency of the howling circuit in the testing device, the testing device generates a howling, and the frequency of the test ripple voltage corresponding to the howling is used as the howling frequency. The capability index of the superimposed AC laboratory is determined based on multiple howling frequencies, thereby determining whether the superimposed AC laboratory can be used to perform performance evaluation on vehicle electronic devices. Compared with manual detection, it saves time and effort, reduces labor costs, and can determine the capability index through quantified detection methods to obtain actual test data, which helps to improve the accuracy and reliability of the capability detection structure, thereby effectively ensuring the reliability and stability of the performance evaluation of vehicle electronic devices.

[0010] In an optional embodiment, the frequency of the test ripple voltage changes periodically. In each cycle, the frequency of the test ripple voltage changes from a first frequency threshold to a second frequency threshold, and then from the second frequency threshold to the first frequency threshold. The resonant frequency of the howling circuit is greater than the first frequency threshold and less than the second frequency threshold.

[0011] In the embodiment of the present disclosure, the frequency of the test ripple voltage changes periodically. By setting the resonant frequency of the howling circuit to be greater than the first frequency threshold and less than the second frequency threshold, under normal circumstances, the howling circuit will generate two howls in each cycle. Therefore, the howling frequency when the howling is generated can be used as a parameter for evaluating the quality of the ripple voltage generating device and the capability of the superimposed alternating current laboratory, which helps to improve the detection effect.

[0012] In an optional implementation, the howling circuit includes a buzzing capacitor and a variable inductor; one end of the buzzing capacitor is connected to the input end of the test device, and the other end of the buzzing capacitor is grounded through the variable inductor; the resonant frequency is determined by the inductive reactance of the variable inductor.

[0013] In the disclosed embodiment, the resonant frequency that can achieve buzzing capacitor howling can be determined by changing the inductive reactance of the variable inductor, which helps to ensure the stability of the superimposed alternating current laboratory capacity detection.

[0014] In an optional implementation manner, determining the capability index of the superimposed alternating current laboratory based on the multiple howling frequencies includes:

[0015] Based on the multiple howling frequencies, determining a first average howling frequency and a howling frequency standard deviation;

[0016] determining a difference between the first average howling frequency and the howling frequency standard deviation;

[0017] The ratio between the difference and the first average howling frequency is determined as the capability index of the superimposed alternating current laboratory.

[0018] In the embodiment of the present disclosure, the standard deviation of the howling frequency can be calculated to reflect the degree of discreteness of multiple howling frequencies, and then the difference can be calculated to reflect the actual capacity of the superimposed AC laboratory. The difference is then divided by the first average howling frequency for normalization processing to ensure the accuracy of the obtained capacity index.

[0019] In an optional embodiment, the test device belongs to one of two device types, and the deviation between the resonant frequencies respectively corresponding to the test devices of the two device types is less than a preset deviation;

[0020] The multiple test devices under the two device types are used to test multiple ripple voltage generating devices including the ripple voltage generating device. The multiple ripple voltage generating devices are divided into two groups, and different groups of ripple voltage generating devices are assigned different device types of test devices.

[0021] In the disclosed embodiment, two types of test devices are provided, and a plurality of ripple voltage generating devices including a ripple voltage generating device are divided into two groups. Different groups of ripple voltage generating devices are assigned different types of test devices, and the difference between the two types of test devices is small. It is difficult for different superimposed AC laboratories to predict the types of test devices to which they are assigned, so that different superimposed AC laboratories use unified test data to avoid the situation, which helps to improve the accuracy of detection.

[0022] In an optional implementation manner, before determining the capability index of the superimposed alternating current laboratory based on the multiple howling frequencies, the method further includes:

[0023] Processing and analyzing the test data based on at least one detection index to determine whether the index detection of the superimposed alternating current laboratory is qualified;

[0024] The step of determining the capability index of the superimposed alternating current laboratory based on the multiple howling frequencies includes:

[0025] After the indicator test of the superimposed alternating current laboratory is qualified, a capability index of the superimposed alternating current laboratory is determined based on the multiple howling frequencies.

[0026] In the embodiment of the present disclosure, before determining the capability index, the test data can be processed and analyzed based on at least one detection index to perform diversified tests on the superimposed AC current laboratory, thereby determining whether the indicator tests of the superimposed AC current laboratory are qualified. For superimposed AC current laboratories that fail the tests, there is no need to determine the capability index, which helps to reduce the amount of data processing and improve detection efficiency.

[0027] In an optional implementation, the detection index includes at least one of a waveform quality detection index, a frequency accuracy detection index, an outlier state detection index, and a frequency distribution detection index;

[0028] The waveform quality detection index is used to detect whether the waveform of the test ripple voltage generated by the superimposed AC current laboratory meets the target waveform requirements; the frequency accuracy detection index is used to detect whether the frequency accuracy of the test ripple voltage generated by the superimposed AC current laboratory meets the requirements; the outlier state detection index is used to detect the howling frequency corresponding to the superimposed AC current laboratory, and whether the outlier state in the howling frequency set corresponding to multiple superimposed AC current laboratories meets the requirements; the frequency distribution detection index is used to detect whether the distribution of the howling frequency corresponding to the superimposed AC current laboratory meets the requirements.

[0029] In the disclosed embodiments, the superposition AC current laboratory can be subjected to diversified tests in the above-mentioned manner, providing a multi-dimensional reference for evaluating and comparing the ability of the superposition AC current laboratory to conduct superposition AC current experiments, thereby helping to improve the accuracy of the test results.

[0030] In an optional embodiment, the test device is provided with a first indicator light and a second indicator light; the test data further includes the number of flashes of the first indicator light and the number of flashes of the second indicator light; the first indicator light flashes when the high frequency of the test ripple voltage meets the standard, and the second indicator light flashes when the low frequency of the test ripple voltage does not meet the standard;

[0031] According to the frequency accuracy detection index, the test data is processed and analyzed according to the following steps:

[0032] Determine the frequency accuracy level corresponding to the test data based on the mapping relationship between the number of flashes of the first indicator light and the number of flashes of the second indicator light, and the combination of the number of flashes of the first indicator light and the second indicator light, and the frequency accuracy level;

[0033] When the frequency accuracy level is lower than the preset level, it is determined that the index test of the superimposed alternating current laboratory under the frequency accuracy test index is unqualified.

[0034] In the disclosed embodiment, the number of flashes of the first indicator light and the number of flashes of the second indicator light, combined with a mapping relationship, can be used to detect whether the upper and lower frequency limits of the test ripple voltage meet the standards, providing a powerful reference for evaluating and comparing the ability of a superimposed AC laboratory to conduct superimposed AC experiments.

[0035] In an optional implementation, the frequency of the test ripple voltage changes periodically, and in each cycle, the frequency of the test ripple voltage changes from a first frequency threshold to a second frequency threshold, and then changes from the second frequency threshold to the first frequency threshold; the test device includes a high-frequency detection circuit and a low-frequency detection circuit;

[0036] The high-frequency detection circuit includes a high-pass filter and the first indicator light; one end of the high-pass filter is connected to the input end of the test device, and the other end of the high-pass filter is grounded through the first indicator light; the difference between the lower limit frequency of the high-pass filter and the second frequency threshold is within a first preset range; when the frequency of the test ripple voltage is greater than the lower limit frequency of the high-pass filter, the first indicator light flashes;

[0037] The low-frequency detection circuit includes a bandpass filter and the second indicator light; one end of the bandpass filter is connected to the input end of the test device, and the other end of the bandpass filter is grounded through the second indicator light; the difference between the upper limit frequency of the bandpass filter and the second frequency threshold is within a second preset range, and the difference between the lower limit frequency of the bandpass filter and the first frequency threshold is within a third preset range; when the frequency of the test ripple voltage is less than the lower limit frequency of the bandpass filter, the second indicator light flashes.

[0038] In the disclosed embodiment, by adopting the above-mentioned high-frequency detection circuit, it is ensured that the situation that the frequency of the test ripple voltage is greater than the lower limit frequency of the high-pass filter can be reflected by the flashing of the first indicator light, thereby realizing that the first indicator light flashes when the high frequency of the test ripple voltage meets the standard, and by adopting the above-mentioned low-frequency detection circuit, a higher upper limit frequency of the band-pass filter is set to avoid the flashing of the second indicator light when the frequency of the test ripple voltage is greater than the upper limit frequency of the band-pass filter as much as possible, and it is ensured that the situation that the frequency of the test ripple voltage is less than the lower limit frequency of the band-pass filter can be reflected by the second indicator light, thereby realizing that the second indicator light flashes when the low frequency of the test ripple voltage does not meet the standard, which helps to improve the reliability of the flashing times of the first indicator light and the second indicator light.

[0039] In an optional implementation manner, the test data further includes an effective duration, and the effective duration is the duration from when the ripple voltage generating device starts to generate the test ripple voltage to when it stops generating the test ripple voltage;

[0040] For the outlier state detection index, the test data is processed and analyzed according to the following steps:

[0041] Based on the effective duration and the multiple howling frequencies in the test data respectively corresponding to a plurality of superimposed alternating current laboratories including the superimposed alternating current laboratory, a Youden ellipse diagram is constructed; in the Youden ellipse diagram, the test data corresponding to each superimposed alternating current laboratory corresponds to a target point;

[0042] When the target point corresponding to the test data corresponding to the superimposed alternating current laboratory is outside the contour range of the Youden ellipse, it is determined that the indicator detection of the superimposed alternating current laboratory under the outlier state detection indicator is unqualified.

[0043] In the disclosed embodiment, by constructing a Youden ellipse diagram, multiple superposition AC current laboratories including a superposition AC current laboratory are verified and compared under the outlier state detection index, providing a powerful reference for evaluating and comparing the ability of superposition AC current laboratories to conduct superposition AC experiments.

[0044] In an optional implementation manner, with respect to the frequency distribution detection index, the test data is processed and analyzed according to the following steps:

[0045] Determine a second average howling frequency based on howling frequencies in test data corresponding to a plurality of superimposed alternating current laboratories including the superimposed alternating current laboratory;

[0046] When the maximum howling frequency among the multiple howling frequencies included in the test data corresponding to the superimposed AC current laboratory is less than the second average howling frequency or the minimum howling frequency is greater than the second average howling frequency, it is determined that the index test of the superimposed AC current laboratory under the frequency distribution detection index fails.

[0047] In the disclosed embodiment, by comparing the maximum howling frequency and the minimum howling frequency corresponding to the superimposed AC current laboratory with the second average howling frequency corresponding to multiple superimposed AC current laboratories including the superimposed AC current laboratory, multiple superimposed AC current laboratories including the superimposed AC current laboratory are verified and compared under the frequency distribution detection index, providing a strong reference for evaluating and comparing the ability of superimposed AC current laboratories to conduct superimposed AC experiments.

[0048] In an optional implementation, the test device is provided with a standby state indicator light and a working state indicator light, and the test device includes an alternating current detection circuit;

[0049] The input end of the AC detection circuit is connected to the input end of the test device, the first output end of the AC detection circuit is connected to the working state indicator light, and the second output end of the AC detection circuit is connected to the standby state indicator light; the AC detection circuit is used to generate a first control signal to control the working state indicator light to light up when receiving the test ripple voltage sent by the ripple voltage generating device;

[0050] The AC power detection circuit is also used to generate a second control signal to control the standby state indicator light to light up when receiving the DC voltage sent by the ripple voltage generating device.

[0051] In the disclosed embodiment, by setting the above-mentioned AC power detection circuit, the working status indicator light can be lit when the test device receives the test ripple voltage sent by the ripple voltage generating device, and the standby status indicator light can be lit when the test device receives the DC voltage sent by the ripple voltage generating device. By lighting up different indicator lights, the user can intuitively determine the voltage sending status of the ripple voltage generating device, thereby assisting in better testing the superimposed AC power laboratory capabilities.

[0052] In an optional implementation manner, the method of performing a superimposed alternating current test on the ripple voltage generating device to be tested by a testing device to obtain test data corresponding to the ripple voltage generating device includes:

[0053] Acquiring video data of the test device when performing a superimposed alternating current test on the ripple voltage generating device;

[0054] The test data is extracted from the video data.

[0055] In the disclosed embodiments, video data can be captured during the superimposed AC current test, and then test data can be extracted from the video data. There is no need for experimenters to manually record the test data during the test process, thereby improving the convenience of test data acquisition and effectively reducing the occurrence of test data errors due to manual recording errors.

[0056] The embodiment of the present disclosure also provides a test device for detecting the capability of a superimposed alternating current laboratory, wherein the test device is provided with an input end, and the input end of the test device is connected to the output end of a ripple voltage generating device deployed in the superimposed alternating current laboratory, and is used to receive a test ripple voltage generated by the ripple voltage generating device after superimposed alternating current, so as to perform a superimposed alternating current test on the ripple voltage generating device;

[0057] The testing device comprises a howling circuit; the howling circuit comprises a buzzing capacitor and a variable inductor;

[0058] One end of the buzzing capacitor is connected to the input end of the test device, and the other end of the buzzing capacitor is grounded through the variable inductor; the resonant frequency of the howling circuit is determined by the inductive reactance of the variable inductor;

[0059] When the frequency of the test ripple voltage is the same as the resonant frequency of the howling circuit, the buzzing capacitor generates howling, and the frequency of the test ripple voltage corresponding to the howling of the buzzing capacitor is the howling frequency; the howling frequency is used to determine the capability index of the corresponding superimposed alternating current laboratory, and the size of the capability index is used to indicate the strength of the capability of the superimposed alternating current laboratory to conduct superimposed alternating current experiments.

[0060] In an optional embodiment, the frequency of the test ripple voltage changes periodically. In each cycle, the frequency of the test ripple voltage changes from a first frequency threshold to a second frequency threshold, and then from the second frequency threshold to the first frequency threshold. The resonant frequency of the howling circuit is greater than the first frequency threshold and less than the second frequency threshold.

[0061] In an optional implementation, the testing device further includes a high-frequency detection circuit and a low-frequency detection circuit;

[0062] One end of the high-frequency detection circuit is connected to the input end of the test device, and the other end of the high-frequency detection circuit is grounded, so as to detect whether the high frequency of the test ripple voltage meets the standard;

[0063] One end of the low-frequency detection circuit is connected to the input end of the test device, and the other end of the low-frequency detection circuit is grounded, so as to detect whether the low frequency of the test ripple voltage meets the standard.

[0064] In an optional embodiment, the high-frequency detection circuit includes a high-pass filter and a first indicator light; one end of the high-pass filter is connected to the input end of the test device, and the other end of the high-pass filter is grounded through the first indicator light; the difference between the lower limit frequency of the high-pass filter and the second frequency threshold is within a first preset range; when the frequency of the test ripple voltage is greater than the lower limit frequency of the high-pass filter, the first indicator light flashes.

[0065] In an optional embodiment, the low-frequency detection circuit includes a bandpass filter and a second indicator light; one end of the bandpass filter is connected to the input end of the test device, and the other end of the bandpass filter is grounded through the second indicator light; the difference between the upper limit frequency of the bandpass filter and the second frequency threshold is within a second preset range, and the difference between the lower limit frequency of the bandpass filter and the first frequency threshold is within a third preset range; when the frequency of the test ripple voltage is less than the lower limit frequency of the bandpass filter, the second indicator light flashes.

[0066] In an optional implementation, the testing device further includes an alternating current detection circuit, a working status indicator light, and a first electronic switch;

[0067] The input end of the AC detection circuit is connected to the input end of the test device, the first output end of the AC detection circuit is connected to the control end of the first electronic switch, the first connection end of the first electronic switch is connected to the working status indicator light, and the second connection end of the first electronic switch is grounded;

[0068] The AC power detection circuit is used to generate a first control signal to control the first electronic switch to be turned on, so that the working status indicator light is turned on, when receiving the test ripple voltage sent by the ripple voltage generating device.

[0069] In an optional implementation, the testing device further includes a standby status indicator light and a second electronic switch;

[0070] The second output end of the AC detection circuit is connected to the control end of the second electronic switch, the first connection end of the second electronic switch is connected to the standby state indicator light, and the second connection end of the second electronic switch is grounded;

[0071] The AC power detection circuit is used to generate a second control signal when receiving the DC voltage sent by the ripple voltage generating device, so as to control the second electronic switch to be turned on, so that the standby state indicator light is turned on.

[0072] In an optional implementation, the AC detection circuit includes a capacitor, an operational amplifier, and a resistor;

[0073] One end of the capacitor is connected to the input end of the test device, the other end of the capacitor is grounded through the resistor, and the non-inverting input end of the operational amplifier is connected between the capacitor and the resistor;

[0074] The inverting input terminal of the operational amplifier is grounded, and the output terminal of the operational amplifier is the first output terminal of the alternating current detection circuit.

[0075] In an optional implementation manner, the AC detection circuit further includes a NAND gate;

[0076] The first input end of the NAND gate is connected to the input end of the test device, the second input end of the NAND gate is connected to the output end of the operational amplifier, and the output end of the NAND gate is the second output end of the AC detection circuit.

[0077] The embodiment of the present disclosure also provides an electronic device, including: a processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate via the bus, and when the machine-readable instructions are executed by the processor, the steps in any possible implementation of the above-mentioned superimposed alternating current laboratory capability detection method are performed.

[0078] The embodiment of the present disclosure further provides a computer program product, on which a computer program is stored. When the computer program is executed by a processor, the steps in any possible implementation of the method for detecting the laboratory capability of superimposed alternating current are executed.

[0079] It should be understood that the above general description and the following detailed description are merely exemplary and explanatory, and are not intended to limit the technical solutions of the present disclosure.

[0080] In order to make the above-mentioned objectives, features and advantages of the present disclosure more obvious and easy to understand, preferred embodiments are specifically cited below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0081] In order to more clearly illustrate the technical solutions of the embodiments of the present disclosure, the following is a brief introduction to the drawings required for use in the embodiments. The drawings herein are incorporated into the specification and constitute a part of the specification. These drawings illustrate embodiments consistent with the present disclosure and are used together with the specification to illustrate the technical solutions of the present disclosure. It should be understood that the following drawings only illustrate certain embodiments of the present disclosure and should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can also be obtained based on these drawings without creative work.

[0082] Figure 1 A three-dimensional schematic diagram of a testing device provided by an embodiment of the present disclosure is shown;

[0083] Figure 2 A schematic diagram of a test environment provided by an embodiment of the present disclosure is shown;

[0084] Figure 3 A flow chart of a method for detecting the capability of a superimposed alternating current laboratory provided by an embodiment of the present disclosure is shown;

[0085] Figure 4 A circuit structure diagram of a testing device provided by an embodiment of the present disclosure is shown;

[0086] Figure 5 A voltage-time diagram of a test ripple voltage provided by an embodiment of the present disclosure is shown;

[0087] Figure 6 A frequency-time diagram of a test ripple voltage provided by an embodiment of the present disclosure is shown;

[0088] Figure 7 A circuit schematic diagram of a testing device provided by an embodiment of the present disclosure is shown;

[0089] Figure 8 A schematic diagram of a scenario for obtaining test data provided by an embodiment of the present disclosure is shown;

[0090] Fig. 9 A schematic diagram showing a mapping relationship between a combination of the number of flashes of a first indicator light and a second indicator light and a frequency accuracy level provided by an embodiment of the present disclosure;

[0091] Fig.10 A schematic diagram showing a Youden ellipse diagram corresponding to a plurality of superimposed alternating current laboratories provided by an embodiment of the present disclosure is shown;

[0092] Fig.11 A schematic diagram showing the distribution of howling frequencies corresponding to a plurality of superimposed alternating current laboratories provided by an embodiment of the present disclosure is shown;

[0093] Fig.12 A schematic diagram of a synchronous comparison process provided by an embodiment of the present disclosure is shown;

[0094] Fig.13 A schematic diagram of a sequence comparison process provided by an embodiment of the present disclosure is shown;

[0095] Fig.14 One of the schematic diagrams showing a detection device for superimposed alternating current laboratory capacity provided by an embodiment of the present disclosure;

[0096] Fig.15 A second schematic diagram showing a device for detecting the laboratory capacity of superimposed alternating current provided by an embodiment of the present disclosure;

[0097] Fig.16 A schematic structural diagram of an electronic device provided by an embodiment of the present disclosure is shown. DETAILED DESCRIPTION

[0098] In order to make the purpose, technical scheme and advantages of the embodiments of the present disclosure clearer, the technical scheme in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the drawings in the embodiments of the present disclosure. Obviously, the described embodiments are only part of the embodiments of the present disclosure, rather than all of the embodiments. The components of the embodiments of the present disclosure generally described and shown in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present disclosure provided in the drawings is not intended to limit the scope of the present disclosure for protection, but merely represents the selected embodiments of the present disclosure. Based on the embodiments of the present disclosure, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present disclosure.

[0099] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0100] The term "and / or" herein only describes an association relationship, indicating that three relationships may exist. For example, A and / or B may represent three situations: A exists alone, A and B exist at the same time, and B exists alone. In addition, the term "at least one" herein represents any combination of at least two of any one or more of a plurality of. For example, including at least one of A, B, and C may represent including any one or more elements selected from the set consisting of A, B, and C.

[0101] Research has found that for inductive loads in vehicles, since the inductive elements in the inductive loads have an energy storage function, when the inductive loads are connected or disconnected, a transient current will be generated. This transient current will generate a reverse electromotive force in the circuit, causing the voltage to rise or fall instantly. When the current changes, harmonic currents with different frequencies from the original current will be generated. These harmonic currents will propagate in the circuit, causing distortion of the voltage and current waveforms, thereby affecting the stability of the circuit. In addition, the power factor of the inductive load is usually low, which means that the reactive power in the circuit is large and the active power is small, and the reactive power often causes the voltage in the power grid to drop, thus affecting the stability of the circuit.

[0102] In order to evaluate the performance and reliability of vehicle electronic devices under the above conditions, superimposed AC experiments can be carried out in the laboratory to simulate the working environment of ripple voltage under DC power supply. For this purpose, it is necessary to conduct capacity testing on each superimposed AC laboratory to identify the superimposed AC laboratory with stronger ability to conduct superimposed AC experiments from multiple laboratories.

[0103] Here, it often involves the proficiency verification and comparison of superimposed AC laboratories. Proficiency verification is to evaluate the capabilities of laboratories according to pre-established criteria by comparing laboratories. Laboratories understand their own capability levels by participating in proficiency verification activities. Laboratory accreditation criteria require laboratories to participate in proficiency verification and comparisons between different laboratories. Proficiency verification can help laboratories identify and solve possible problems, thereby improving the accuracy and reliability of test results. Participating in proficiency verification, according to the proficiency verification results, you can know whether the laboratory test results are in an outlier state / critical state among many laboratory test results, which can indirectly indicate the laboratory's testing capability level and the accuracy of the test results. Similarly, ensuring the accuracy of the test results can ensure the smooth progress of R&D / verification, avoid the product design standards not meeting the actual requirements due to inaccurate R&D test results, and lead to the failure of later trial production, component verification and other work, resulting in an extension of the R&D cycle and a waste of R&D costs.

[0104] However, there is a lack of quantitative laboratory capability evaluation methods for the process of testing the experimental capability of superimposed AC power. Generally, the experimental capability is evaluated through on-site verification by experimental auditors. This method is time-consuming and labor-intensive, and brings a high labor cost burden. At the same time, this method evaluates the experimental capability based solely on the subjective experience of the experimental auditors, which in turn affects the reliability of the capability test results, and it is impossible to obtain actual test data for the test ripple voltage. For unverified laboratories, there is a lack of standard test equipment and reference methods, and it is impossible to verify and confirm the ability of this laboratory to conduct superimposed AC experiments. For laboratories that have been running superimposed AC experiments for a long time, there is also a lack of internal control measures for experimental capabilities, and it is impossible to ensure that their testing capabilities are in a qualified state for a long time and that their experimental capabilities are in a group state among many laboratories.

[0105] Based on the above research, the present disclosure provides a method for detecting the capability of a superimposed AC laboratory. Through a test device, a superimposed AC experiment is performed on a ripple voltage generating device deployed in the superimposed AC laboratory. When the frequency of the test ripple voltage generated by the ripple voltage generating device is the same as the resonant frequency of the howling circuit in the test device, the test device generates a howling. The frequency of the test ripple voltage corresponding to the howling is used as the howling frequency. The capability index of the superimposed AC laboratory is determined based on multiple howling frequencies, thereby determining whether the superimposed AC laboratory can be used to perform performance evaluation on vehicle electronic devices. Compared with manual detection, it saves time and effort, and can obtain actual test data through quantitative detection methods to determine the capability index, which helps to improve the accuracy of detection.

[0106] To facilitate understanding of this embodiment, a method for detecting the capability of a superimposed alternating current laboratory disclosed in the embodiment of the present disclosure is first introduced in detail. The execution subject of the method for detecting the capability of a superimposed alternating current laboratory provided in the embodiment of the present disclosure is generally an electronic device with certain computing capabilities. In this embodiment, the electronic device may be a server. The server may be an independent physical server, or a server cluster or distributed system composed of multiple physical servers, or a cloud server that provides basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud storage, big data, and artificial intelligence platforms.

[0107] In other implementations, the electronic device may also be a terminal device or other processing device, and the terminal device may be a mobile device, a terminal, a computing device, etc. Other processing devices may be devices including a processor and a memory, which are not limited here. In some possible implementations, the method for detecting the laboratory capability of superimposed alternating current may be implemented by a processor calling a computer-readable instruction stored in a memory.

[0108] A method for detecting the laboratory capacity of superimposed alternating current provided by an embodiment of the present disclosure is described below in conjunction with the accompanying drawings.

[0109] In order to detect the superimposed AC power laboratory capability, the present disclosure provides a test device for detecting the superimposed AC power laboratory capability. Figure 1 , is a three-dimensional schematic diagram of a testing device provided in the disclosed embodiment, such as Figure 1As shown in , the test device 10 includes a housing 11, and the test device 10 is also provided with an input terminal 111. When the ripple voltage generating device is tested by superimposing AC power through the test device 10, the input terminal 111 of the test device 10 is connected to the ripple voltage generating device deployed in the superimposed AC power laboratory, and is used to receive the test ripple voltage generated by the ripple voltage generating device after superimposing AC power, so as to perform the superimposed AC power test on the ripple voltage generating device. Other parts of the test device 10 are described in detail in subsequent embodiments.

[0110] Please also see Figure 2 , is a schematic diagram of a test environment provided by an embodiment of the present disclosure. Figure 2 As shown in the figure, in the superimposed alternating current laboratory, a ripple voltage generating device 20 is deployed, and the ripple voltage generating device is used to generate a test ripple voltage after superimposed alternating current, and the input end of the test device 10 is connected to the output end of the ripple voltage generating device 20.

[0111] Optionally, if the ripple voltage generating device 20 has a display function, the test data can be obtained directly according to the display content of the ripple voltage generating device 20 later.

[0112] Optionally, if the ripple voltage generating device 20 does not have a display function, an oscilloscope 30 may also be deployed in the superimposed AC laboratory to obtain the test data through the display content of the oscilloscope 30, and the input end of the oscilloscope 30 is connected to the output end of the ripple voltage generating device 20.

[0113] See also Figure 3 As shown, it is a flow chart of a method for detecting the laboratory capability of superimposed alternating current provided by an embodiment of the present disclosure, such as Figure 3 As shown in , the method for detecting the laboratory capability of superimposed alternating current provided in the embodiment of the present disclosure includes steps S301 to S303, wherein:

[0114] S301: Perform a superimposed alternating current test on a ripple voltage generating device to be tested by a testing device to obtain test data corresponding to the ripple voltage generating device; the test data includes a plurality of howling frequencies; the howling frequency refers to the frequency of the test ripple voltage corresponding to when the testing device howls.

[0115] Here, the ripple voltage generating device includes a sweep frequency generator and a power supply unit, the power supply unit is used to generate a DC voltage, and the sweep frequency generator is used to superimpose an AC current on the DC voltage to generate the test ripple voltage.

[0116] The ripple voltage generating device includes two states, a standby state and a working state; after the output end of the ripple voltage generating device is connected to the input end of the test device, the ripple voltage generating device is initially in the standby state, in which the sweep frequency generator does not work, and the ripple voltage generating device is used to generate and send a DC voltage to the test device; in the working state, the sweep frequency generator works, and the ripple voltage generating device is used to generate and send the test ripple voltage to the test device.

[0117] It can be seen from the above contents that the test device 10 includes a housing 11. In the embodiment of the present disclosure, a test circuit 12 is disposed in the housing 11. Figure 4 , is a schematic diagram of the circuit structure of a test device provided by an embodiment of the present disclosure. Figure 4 As shown in , the test circuit 12 includes a howling circuit 121 , a high frequency detection circuit 122 , a low frequency detection circuit 123 and a state detection circuit 124 .

[0118] Among them, the howling circuit 121 generates howling when the frequency of the test ripple voltage is the same as the resonant frequency of the howling circuit 121, the high-frequency detection circuit 122 is used to detect whether the high frequency of the test ripple voltage meets the standard, the low-frequency detection circuit 123 is used to detect whether the low frequency of the test ripple voltage meets the standard, and the state detection circuit 124 is used to detect the state of the ripple voltage generating device.

[0119] In order to more intuitively show the change of the test ripple voltage over time, please refer to Figure 5 , is a voltage-time diagram for testing a ripple voltage provided by an embodiment of the present disclosure, such as Figure 5 As shown in , the horizontal axis represents time (t), and the vertical axis represents voltage (V). The test ripple voltage is a sine wave. Indicates the maximum test voltage, Indicates superimposed AC voltage. In practical applications, for a 12V power system, Generally it is 16V. For 24V power system, Generally 32V; The specific value of is determined by the severity of the superimposed AC test, generally between 1V and 10V. It can be understood that the more severe the superimposed AC test, The larger it is, the greater the impact on the test data.

[0120] In some possible embodiments, the frequency of the test ripple voltage changes periodically. In each cycle, the frequency of the test ripple voltage changes from a first frequency threshold to a second frequency threshold, and then from the second frequency threshold to the first frequency threshold. The resonant frequency of the howling circuit is greater than the first frequency threshold and less than the second frequency threshold.

[0121] Here, the first frequency threshold is the lower frequency limit of the test ripple voltage, the second frequency threshold is the upper frequency limit of the test ripple voltage, and the first frequency threshold is less than the second frequency threshold.

[0122] In order to more intuitively show the change of the frequency of the test ripple voltage over time, please refer to Figure 6 , which is a frequency-time diagram of a test ripple voltage provided by an embodiment of the present disclosure, such as Figure 6 As shown in the figure, the horizontal axis represents time (t) and the vertical axis represents frequency ( ), T represents the period, T / 2 represents half a period, represents the first frequency threshold, Indicates the second frequency threshold. In practical applications, a cycle lasts approximately 2 to 10 minutes. Usually 15Hz, The frequency sweep generator may have a variety of sweep modes, for example, L1 is a frequency curve in a triangular sweep mode, and L2 is a frequency curve in a logarithmic sweep mode. In practical applications, the sweep mode may be determined in combination with the generation requirements of the test ripple voltage.

[0123] In this way, the frequency of the test ripple voltage changes periodically. By setting the resonant frequency of the howling circuit to be greater than the first frequency threshold and less than the second frequency threshold, under normal circumstances, the howling circuit will generate two howls in each cycle. Therefore, the howling frequency when the howling is generated can be used as a parameter for evaluating the quality of the ripple voltage generating device and the capability of the superimposed AC laboratory, which helps to improve the detection effect.

[0124] It can be seen from the above contents that the test device 10 includes a housing 11, and a test circuit 12 is arranged in the housing 11. Figure 7 , is a schematic diagram of the circuit principle of a test device provided by an embodiment of the present disclosure. Figure 7 As shown in FIG. 1 , in the test circuit 12 , there is an input terminal INPUT for introducing the voltage generated by the ripple voltage generating device 20 . Figure 1 In practical applications, the input terminal INPUT corresponds to the input terminal 111, which can specifically be a power connector.

[0125] from Figure 7 It can be seen that the test circuit 12 includes a howling circuit 121, and the howling circuit 121 includes a buzzing capacitor BUZZER and a variable inductor L1. One end of the buzzing capacitor BUZZER is connected to the input end INPUT of the test device, and the other end of the buzzing capacitor BUZZER is grounded through the variable inductor L1.

[0126] The inductive reactance of the variable inductor L1 is adjustable, and the resonant frequency of the howling circuit 121 is determined by the inductive reactance of the variable inductor.

[0127] In this way, the resonant frequency that can achieve buzzing capacitor howling can be determined by changing the inductive reactance of the variable inductor, which helps to ensure the stability of the superimposed AC laboratory capacity detection.

[0128] In practical applications, in the LC resonant circuit, when the magnetic field energy and the electric field energy reach a balanced state, the sum of the electric field energy and the magnetic field energy remains unchanged. However, since the actual inductance and capacitance cannot be completely ideal and lossless, the electromagnetic energy will oscillate in the LC resonant circuit. Figure 7 As shown in , the variable inductor L1 can also be grounded through a resistor R1 to consume the above electromagnetic energy.

[0129] See again Figure 1 The testing device 10 includes a buzzer 112. In practical applications, the howling circuit 121 can be used as a driving circuit for at least part of the buzzer 112 so that the howling can be played clearly.

[0130] like Figure 7 As shown in , the test circuit 12 includes a high-frequency detection circuit 122, one end of which is connected to the input terminal INPUT of the test device, and the other end of which is grounded. The high-frequency detection circuit includes a first indicator light B1, which flashes when the high frequency of the test ripple voltage meets the standard. Figure 1 In actual application, the first indicator light B1 is disposed in the test circuit 12 under the housing 11 and is exposed through the housing 11 so that it is possible to visually observe whether the first indicator light B1 is flashing.

[0131] like Figure 7 As shown in , the test circuit 12 includes a low-frequency detection circuit 123, one end of which is connected to the input terminal INPUT of the test device, and the other end of which is grounded. The low-frequency detection circuit 123 includes a second indicator light B2, which flashes when the low frequency of the test ripple voltage does not meet the standard. Figure 1 In actual application, the second indicator light B2 is arranged in the test circuit 12 under the housing 11 and is exposed through the housing 11 so that it is possible to visually observe whether the second indicator light B2 is flashing.

[0132] In some possible implementations, the test circuit 12 includes a state detection circuit 124 , and the state detection circuit 124 includes an AC detection circuit 1241 , a working state indicator light B3 , and a standby state indicator light B4 .

[0133] The input end of the AC detection circuit 1241 is connected to the input end INPUT of the test device, the first output end OUTPUT1 of the AC detection circuit 1241 is connected to the working status indicator light B3, and the second output end OUTPUT2 of the AC detection circuit 1241 is connected to the standby status indicator light B4.

[0134] The AC power detection circuit 1241 is used to generate a first control signal to control the working status indicator light B3 to light up when receiving the test ripple voltage sent by the ripple voltage generating device 20.

[0135] The AC power detection circuit 1241 is also used to generate a second control signal to control the standby state indicator light B4 to light up when receiving the DC voltage sent by the ripple voltage generating device 20.

[0136] See again Figure 1 In actual application, the working status indicator light B3 and the standby status indicator light B4 are arranged in the test circuit 12 under the shell 11 and are exposed through the shell 11 so that it is possible to visually observe whether the working status indicator light B3 and the standby status indicator light B4 are on.

[0137] In this way, by setting up the above-mentioned AC power detection circuit, the working status indicator light can be lit when the test device receives the test ripple voltage sent by the ripple voltage generating device, and the standby status indicator light can be lit when the test device receives the DC voltage sent by the ripple voltage generating device. By lighting up different indicator lights, the user can intuitively determine the voltage sending status of the ripple voltage generating device, thereby assisting in better testing the superimposed AC power laboratory capabilities.

[0138] In some possible implementations, the test circuit 12 further includes a first electronic switch SW1 .

[0139] In this example, an insulated gate bipolar transistor (IGBT) is used as an electronic switch. In other examples, other components can also be used as electronic switches, such as a bipolar junction transistor (BJT), a metal-oxide-semiconductor field-effect transistor (MOSFET), etc.

[0140] The input end of the AC power detection circuit 1241 is connected to the input end INPUT of the testing device, the first output end OUTPUT1 of the AC power detection circuit 1241 is connected to the control end of the first electronic switch SW1, the first connection end of the first electronic switch SW1 is connected to the working status indicator light B3, and the second connection end of the first electronic switch SW1 is grounded.

[0141] Optionally, the first connection end of the first electronic switch SW1 may also be connected to the working status indicator light B3 via a resistor R4 to perform current limiting and voltage stabilization to ensure normal operation of the working status indicator light B3 and the first electronic switch SW1.

[0142] The AC power detection circuit 1241 is used to generate a first control signal when receiving the test ripple voltage sent by the ripple voltage generating device 20 to control the first electronic switch SW1 to be turned on, so that the working status indicator light B3 is lit.

[0143] In an optional implementation, the test circuit 12 further includes a second electronic switch SW2.

[0144] The second output terminal OUTPUT2 of the AC power detection circuit 1241 is connected to the control terminal of the second electronic switch SW2, the first connection terminal of the second electronic switch SW2 is connected to the standby state indicator light B4, and the second connection terminal of the second electronic switch SW2 is grounded;

[0145] The AC power detection circuit 1241 is used to generate a second control signal when receiving the DC voltage sent by the ripple voltage generating device 20 to control the second electronic switch SW2 to be turned on, so that the standby state indicator light B4 is lit.

[0146] Optionally, the first connection end of the second electronic switch SW2 may also be connected to the standby state indicator light B4 via a resistor R5 to perform current limiting and voltage stabilization to ensure normal operation of the standby state indicator light B4 and the second electronic switch SW2.

[0147] In an optional implementation, the AC detection circuit 1241 includes a capacitor C1, an operational amplifier OP, and a resistor R6;

[0148] One end of the capacitor C1 is connected to the input end of the test device, the other end of the capacitor C1 is grounded through the resistor R6, and the non-inverting input end of the operational amplifier OP is connected between the capacitor C1 and the resistor R6;

[0149] An inverting input terminal of the operational amplifier OP is grounded, and an output terminal of the operational amplifier OP is a first output terminal OUTPUT1 of the AC power detection circuit 1241 .

[0150] Optionally, the inverting input terminal of the operational amplifier OP is grounded through a resistor R7, and the inverting input terminal of the operational amplifier OP is grounded through a capacitor C2, so as to ensure that the inverting input terminal of OP is at a high level.

[0151] Optionally, the output end of the operational amplifier OP may be connected to a diode D1 to ensure unidirectional current flow.

[0152] In an optional implementation, the AC detection circuit 1241 further includes a NAND gate;

[0153] The first input end of the NAND gate NAND is connected to the input end INPUT of the test device, the second input end of the NAND gate NAND is connected to the output end of the operational amplifier OP, and the output end of the NAND gate NAND is the second output end OUTPUT2 of the AC detection circuit 1241.

[0154] Optionally, the first input end of the NAND gate NAND is connected to the input end of the test device through an inductor L2 and a resistor R8, and a resistor R9 is connected between the resistor R8 and the NAND gate NAND and grounded. This not only achieves current limiting and filtering, but also produces oscillation, delay, trap and other effects through their interaction, which helps to improve circuit stability.

[0155] In order to more clearly demonstrate the process of superimposed AC current testing, the principle of the testing device is introduced in detail below.

[0156] When the ripple voltage generating device 20 is in the standby state, the ripple voltage generating device 20 is used to generate and send a DC voltage to the test device 10, and the first input terminal of the NAND gate NAND is at a high level. Since no AC voltage signal passes through the capacitor C1 at this time, the in-phase input terminal of the operational amplifier OP is at a low level. The inverting input terminal of the operational amplifier OP is at a high level, so the output terminal of the operational amplifier OP is at a low level. Correspondingly, the second input terminal of the NAND gate NAND is at a low level, so that the output terminal of the NAND gate NAND is at a high level, the second electronic switch SW2 is turned on, and the standby state indicator light B4 is lit.

[0157] After the ripple voltage generating device 20 enters the working state, the ripple voltage generating device 20 is used to generate and send the test ripple voltage to the test device 10, and the first input terminal of the NAND gate NAND is at a high level. At this time, the superimposed AC voltage signal reaches the in-phase input terminal of the operational amplifier OP through the capacitor C1, so the in-phase input terminal of the operational amplifier OP is at a high level. The inverting input terminal of the operational amplifier OP is at a high level, so the output terminal of the operational amplifier OP is at a high level. Correspondingly, the second input terminal of the NAND gate NAND is at a high level, so that the output terminal of the NAND gate NAND is at a low level, the second electronic switch SW2 is not turned on, and the standby state indicator light B4 is off. In addition, since the output terminal of the operational amplifier OP is at a high level, the first electronic switch SW1 is turned on, and the working state indicator light B3 is lit.

[0158] When the ripple voltage generating device 20 sends the test ripple voltage to the testing device 10, the second indicator light B2 is always on, and when the frequency of the test ripple voltage is less than the lower limit frequency of the band-pass filter BPF, the second indicator light B2 flashes; the first indicator light B1 is always off, and when the frequency of the test ripple voltage is greater than the lower limit frequency of the high-pass filter HPF, the first indicator light B1 flashes; as the sweep frequency generator continuously increases the frequency of the test ripple voltage, when the frequency of the test ripple voltage is the same as the resonant frequency of the howling circuit 121, the buzzing capacitor BUZZER generates howling.

[0159] In order to more clearly demonstrate the process of superimposed AC current testing, the preliminary preparation stage and test implementation stage of the superimposed AC current testing are introduced in detail below.

[0160] In the preliminary preparation stage, the inductive reactance of the variable inductor in the howling circuit can be set according to the test requirements, and a simulated superimposed AC test can be performed through the test device to ensure that each indicator light and buzzer can work normally and that the frequency of the buzzer howls is consistent, so as to ensure the test uniformity between multiple test devices including the test device.

[0161] For multiple superimposed AC laboratories participating in laboratory capability verification and comparison, multiple superimposed AC laboratories can be coded, for example, 001, 002, etc., and a test device and a reference superimposed electrical performance experiment standard text can be issued to each superimposed AC laboratory, so that the superimposed AC laboratory can carry out superimposed AC testing in strict accordance with the experimental standard text, and the use of the test device can be publicized to the superimposed AC laboratories.

[0162] During the testing phase, refer again to Figure 2 In the superimposed alternating current laboratory, the input end of the test device 10 is connected to the output end of the ripple voltage generating device 20, and the length of the connection between the test device 10 and the ripple voltage generating device 20 is determined according to the experimental standard text. Exemplarily, the length of the cable connecting the test device 10 and the ripple voltage generating device 20 is less than 1m.

[0163] For example, see Figure 8 , which is a schematic diagram of a scenario for obtaining test data provided by an embodiment of the present disclosure, such as Figure 8 As shown in , during the superimposed AC test, the superimposed AC test process can be recorded by the recording device 40 to obtain video data when the test device performs the superimposed AC test on the ripple voltage generating device.

[0164] The video recording device 40 includes but is not limited to a smart phone, a tablet computer, a video recorder, a camera, etc. The video data includes the display contents on the test device 10 and the ripple voltage generating device 20, and the recorded howling.

[0165] In the case where the ripple voltage generating device 20 does not have a display function, an oscilloscope 30 may also be deployed in the superimposed AC laboratory, such as Figure 8 As shown in . Similarly, the length of the connection line between the oscilloscope 30 and the ripple voltage generating device 20 is determined according to the experimental standard text. Exemplarily, the length of the cable connecting the oscilloscope 30 and the ripple voltage generating device 20 is less than 1m.

[0166] Correspondingly, the video data includes the display contents of the testing device 10 , the ripple voltage generating device 20 and the oscilloscope 30 , and the recorded howling.

[0167] In the disclosed embodiment, the test data is related to the performance of the ripple voltage generating device, the length of the connection between the ripple voltage generating device and the testing device, and the capability of the operator.

[0168] After the ripple voltage generating device 20 is turned on, the ripple voltage generating device 20 provides a stable DC voltage to the test device 10 according to the experimental standard text, and the standby state indicator light B4 lights up. The display range and other settings of the oscilloscope 30 are adjusted to ensure that the oscilloscope 30 can work normally and display frequency. Then, the ripple voltage generating device 20 presets the sweep frequency loading frequency-time curve and the amplitude of the test ripple voltage to the sweep frequency generator according to the experimental standard text.

[0169] The superimposed AC test may be loaded with multiple cycles, and the specific number of cycles is determined according to the experimental standard text. In this example, the superimposed AC test process is loaded with 5 cycles as an example for explanation.

[0170] After the video recording device 40 starts recording or video recording, the ripple voltage generating device 20 starts to sweep the frequency to provide the test ripple voltage, and continues for 5 cycles. Under normal circumstances, the working state indicator light B3 and the second indicator light B2 are on, and the standby state indicator light B4 is off. Under normal circumstances, the second indicator light B2 will not flicker.

[0171] The first indicator light B1 will flash when the high frequency of the test ripple voltage meets the standard, and will flash once per cycle under normal circumstances, for a total of 5 flashes. Under normal circumstances, the buzzer 112 will sound twice per cycle, for a total of 10 sounds.

[0172] When the working state indicator light B3 goes out and the standby state indicator light B4 lights up again, the video recording device 40 ends recording and obtains the video data.

[0173] Accordingly, in order to obtain the test data, video data of the test device when performing a superimposed alternating current test on the ripple voltage generating device may be acquired; and the test data may be extracted from the video data.

[0174] The video format of the video data may be determined according to actual detection requirements, and is not specifically limited here. Exemplary formats include but are not limited to AVI, MP4, WMV, etc.

[0175] Here, when the test data is extracted from the video data, the video data may be read manually, or other algorithms may be used to automatically extract frames and data from the video data.

[0176] Optionally, after acquiring the video data, the validity of the video data may be tested first, and when the video data is determined to be valid, the test data may be extracted from the video data. The validity of the video data refers to whether the picture and sound recording of the video data meet preset requirements.

[0177] In this way, video data can be captured during the superimposed AC test, and then test data can be extracted from the video data. There is no need for experimenters to manually record test data during the test process, which improves the convenience of test data acquisition and effectively reduces the occurrence of test data errors caused by manual recording errors.

[0178] In some possible implementations, the test device belongs to one of two device types, and the deviation between the resonant frequencies respectively corresponding to the test devices of the two device types is less than a preset deviation;

[0179] The multiple test devices under the two device types are used to test multiple ripple voltage generating devices including the ripple voltage generating device. The multiple ripple voltage generating devices are divided into two groups, and different groups of ripple voltage generating devices are assigned different device types of test devices.

[0180] The preset deviation may be determined according to actual detection requirements and is not specifically limited here. For example, the preset deviation is specifically 10%.

[0181] In this way, two types of test devices are set up, and multiple ripple voltage generating devices including the ripple voltage generating device are divided into two groups. Different groups of ripple voltage generating devices are assigned test devices of different device types, and the difference between the two types of test devices is small. It is difficult for different superimposed AC laboratories to predict the device types of their assigned test devices, which avoids the situation where different superimposed AC laboratories use unified test data, and helps to improve the accuracy of detection.

[0182] S302: Determine a capability index of the superimposed AC current laboratory based on the multiple howling frequencies, wherein the capability index is used to indicate the capability of the superimposed AC current laboratory to perform superimposed AC current experiments.

[0183] In this step, the capability index of the superimposed AC current laboratory may be determined according to the multiple howling frequencies included in the test data corresponding to the superimposed AC current laboratory.

[0184] Specifically, based on the multiple howling frequencies, a first average howling frequency and a howling frequency standard deviation can be determined; the difference between the first average howling frequency and the howling frequency standard deviation can be determined; and the ratio between the difference and the first average howling frequency can be determined as the capability index of the superimposed alternating current laboratory.

[0185] In practical applications, the capability index of the superimposed alternating current laboratory can be obtained by the following formula (1):

[0186]

[0187] in, represents the capability index of the superimposed alternating current laboratory, represents the first average howling frequency, represents the i-th howling frequency in the test data, It represents the number of the multiple howling frequencies. Taking the superimposed AC test process loading 5 cycles as an example, N=10.

[0188] Here, the specific value of the capability index is between 0 and 1. The larger the capability index is, the stronger the capability of the superimposed alternating current laboratory to perform superimposed alternating current experiments is.

[0189] In this way, the discrete degree of multiple howling frequencies can be reflected by calculating the standard deviation of the howling frequency, and then the actual capacity of the superimposed AC laboratory can be reflected by calculating the difference. Finally, the difference is divided by the first average howling frequency for normalization processing to ensure the accuracy of the obtained capacity index.

[0190] In practical applications, multiple superimposed AC laboratories including the superimposed AC laboratory are often jointly verified and compared to preliminarily determine whether the capabilities of each superimposed AC laboratory meet the standards. If not, there is no need to calculate the capability index of the superimposed AC laboratory, and it can be directly considered that the superimposed AC laboratory cannot be used to perform performance evaluation on vehicle electronic devices.

[0191] In some possible implementations, before determining the capability index of the superimposed alternating current laboratory based on the multiple howling frequencies, the method further includes:

[0192] Processing and analyzing the test data based on at least one detection index to determine whether the index detection of the superimposed alternating current laboratory is qualified;

[0193] The step of determining the capability index of the superimposed alternating current laboratory based on the multiple howling frequencies includes:

[0194] After the indicator test of the superimposed alternating current laboratory is qualified, a capability index of the superimposed alternating current laboratory is determined based on the multiple howling frequencies.

[0195] Wherein, when the indicator test under any detection indicator fails, it is determined that the indicator test of the superimposed alternating current laboratory fails.

[0196] Optionally, when there are multiple detection indicators, the test data can be processed and analyzed based on each detection indicator in turn. If the indicator test under any detection indicator fails, there is no need to perform processing and analysis under other detection indicators.

[0197] In this way, before determining the capability index, the test data can be processed and analyzed based on at least one detection index to perform diversified tests on the superimposed AC current laboratory, thereby determining whether the indicator test of the superimposed AC current laboratory is qualified. For the superimposed AC current laboratory that fails the test, there is no need to determine the capability index, which helps to reduce the amount of data processing and improve detection efficiency.

[0198] Optionally, if the adopted test device belongs to one of the two device types, when the test data is processed and analyzed based on at least one detection index, only the multiple ripple voltage generating devices in the same group are processed and analyzed.

[0199] In some possible implementations, the detection index includes at least one of a waveform quality detection index, a frequency accuracy detection index, an outlier state detection index, and a frequency distribution detection index;

[0200] The waveform quality detection index is used to detect whether the waveform of the test ripple voltage generated by the superimposed AC current laboratory meets the target waveform requirements; the frequency accuracy detection index is used to detect whether the frequency accuracy of the test ripple voltage generated by the superimposed AC current laboratory meets the requirements; the outlier state detection index is used to detect the howling frequency corresponding to the superimposed AC current laboratory, and whether the outlier state in the howling frequency set corresponding to multiple superimposed AC current laboratories meets the requirements; the frequency distribution detection index is used to detect whether the distribution of the howling frequency corresponding to the superimposed AC current laboratory meets the requirements.

[0201] In this way, the superposition AC current laboratory can be subjected to diversified tests in the above-mentioned manner, which provides a multi-dimensional reference for evaluating and comparing the ability of the superposition AC current laboratory to conduct superposition AC current experiments, and helps to improve the accuracy of the test results.

[0202] In some possible implementations, the test data further includes a waveform image of a test ripple voltage.

[0203] According to the waveform quality detection index, the test data is processed and analyzed according to the following steps:

[0204] In the case where the waveform of the test ripple voltage generated by the superimposed alternating current laboratory has attenuation, notches, etc., it is determined that the superimposed alternating current laboratory fails the indicator test under the waveform quality test indicator.

[0205] In some possible implementations, see again Figure 7 The test device is provided with a first indicator light B1 and a second indicator light B2; the test data also includes the flashing times of the first indicator light and the flashing times of the second indicator light; the first indicator light flashes when the high frequency of the test ripple voltage meets the standard, and the second indicator light flashes when the low frequency of the test ripple voltage does not meet the standard.

[0206] According to the frequency accuracy detection index, the test data is processed and analyzed according to the following steps:

[0207] Determine the frequency accuracy level corresponding to the test data based on the mapping relationship between the number of flashes of the first indicator light and the number of flashes of the second indicator light, and the combination of the number of flashes of the first indicator light and the second indicator light, and the frequency accuracy level;

[0208] When the frequency accuracy level is lower than the preset level, it is determined that the index test of the superimposed alternating current laboratory under the frequency accuracy test index is unqualified.

[0209] For example, please refer to Fig. 9 , is a schematic diagram of a mapping relationship between a combination of the number of flashes of a first indicator light and a second indicator light and a frequency accuracy level provided by an embodiment of the present disclosure. Taking the superimposed AC test process loading 5 cycles as an example, under normal circumstances, the first indicator light flashes 5 times and the second indicator light does not flash. Fig. 9 As shown in , three frequency accuracy levels are set in this example, where level G represents GOOD, level P represents PASS, and level F represents FAIL, wherein the accuracy of level G, level P, and level F decreases in sequence. When the frequency accuracy level is lower than level P, it is determined that the indicator test of the superimposed AC laboratory under the frequency accuracy test indicator is unqualified.

[0210] In this way, the number of flashes of the first indicator light and the number of flashes of the second indicator light, combined with the mapping relationship, can be used to detect whether the upper and lower limits of the frequency of the test ripple voltage meet the standards, providing a powerful reference for evaluating and comparing the ability of superposition AC laboratories to conduct superposition AC experiments.

[0211] In some possible implementations, the frequency of the test ripple voltage changes periodically. In each cycle, the frequency of the test ripple voltage changes from a first frequency threshold to a second frequency threshold, and then changes from the second frequency threshold to the first frequency threshold. Figure 7 The testing device includes a high-frequency detection circuit 122 and a low-frequency detection circuit 123 .

[0212] The high-frequency detection circuit 122 includes a high-pass filter HPF and the first indicator light B1; one end of the high-pass filter HPF is connected to the input end of the test device, and the other end of the high-pass filter HPF is grounded through the first indicator light B1; the difference between the lower limit frequency of the high-pass filter HPF and the second frequency threshold is within a first preset range; when the frequency of the test ripple voltage is greater than the lower limit frequency of the high-pass filter HPF, the first indicator light B1 flashes.

[0213] In order to ensure that the first indicator light B1 can flash as much as possible, the lower limit frequency of the high pass filter HPF can be set to be less than the second frequency threshold. For example, the first preset range can be that the lower limit frequency of the high pass filter HPF is 96%~100% of the second frequency threshold.

[0214] Optionally, the first indicator light B1 may also be grounded via a resistor R2 to perform current limiting to ensure the normal operation of the high-frequency detection circuit 122 .

[0215] The low-frequency detection circuit 123 includes a bandpass filter BPF and the second indicator light B2; one end of the bandpass filter BPF is connected to the input end of the test device, and the other end of the bandpass filter BPF is grounded through the second indicator light B2; the difference between the upper limit frequency of the bandpass filter BPF and the second frequency threshold is within a second preset range, and the difference between the lower limit frequency of the bandpass filter BPF and the first frequency threshold is within a third preset range; when the frequency of the test ripple voltage is less than the lower limit frequency of the bandpass filter BPF, the second indicator light B2 flashes.

[0216] Among them, in order to minimize the flashing of the second indicator light B2 when the frequency of the test ripple voltage is greater than the upper limit frequency of the bandpass filter BPF, the upper limit frequency of the bandpass filter BPF can be set to be greater than the second frequency threshold. For example, the second preset range can be that the upper limit frequency of the bandpass filter BPF is 104%~110% of the second frequency threshold.

[0217] In practical applications, the frequency of the test ripple voltage may be smaller between two adjacent cycles. In order to detect the above situation, the lower limit frequency of the bandpass filter BPF can be set to be less than the first frequency threshold. For example, the third preset range can be that the lower limit frequency of the bandpass filter BPF is 96%~100% of the first frequency threshold.

[0218] Optionally, the second indicator light B2 may also be grounded via a resistor R3 to perform current limiting to ensure the normal operation of the low-frequency detection circuit 123 .

[0219] In this way, by adopting the above-mentioned high-frequency detection circuit, it is ensured that the situation that the frequency of the test ripple voltage is greater than the lower limit frequency of the high-pass filter can be reflected by the flashing of the first indicator light, thereby realizing that the first indicator light flashes when the high frequency of the test ripple voltage meets the standard, and, by adopting the above-mentioned low-frequency detection circuit, a higher upper limit frequency of the band-pass filter is set to avoid the flashing of the second indicator light when the frequency of the test ripple voltage is greater than the upper limit frequency of the band-pass filter as much as possible, and it is ensured that the situation that the frequency of the test ripple voltage is less than the lower limit frequency of the band-pass filter can be reflected by the second indicator light, thereby realizing that the second indicator light flashes when the low frequency of the test ripple voltage does not meet the standard, which helps to improve the reliability of the flashing times of the first indicator light and the second indicator light.

[0220] In some possible implementations, the test data further includes an effective duration, and the effective duration is the duration from when the ripple voltage generating device starts to generate the test ripple voltage to when it stops generating the test ripple voltage. Figure 7 The effective duration is the duration from when the working status indicator light B3 turns on to when it turns off.

[0221] For the outlier state detection index, the test data is processed and analyzed according to the following steps:

[0222] Based on the effective duration and the multiple howling frequencies in the test data respectively corresponding to a plurality of superimposed alternating current laboratories including the superimposed alternating current laboratory, a Youden ellipse diagram is constructed; in the Youden ellipse diagram, the test data corresponding to each superimposed alternating current laboratory corresponds to a target point;

[0223] When the target point corresponding to the test data corresponding to the superimposed alternating current laboratory is outside the contour range of the Youden ellipse, it is determined that the indicator detection of the superimposed alternating current laboratory under the outlier state detection indicator is unqualified.

[0224] For example, please refer to Fig.10, is a schematic diagram of a Youden ellipse diagram corresponding to a plurality of superimposed alternating current laboratories provided by an embodiment of the present disclosure. Fig.10 As shown in the figure, the horizontal axis represents the howling frequency (Hz) and the vertical axis represents the effective duration (t). It can be seen that there are multiple target points outside the contour range of the Youden ellipse. The superimposed alternating current laboratory corresponding to these multiple target points outside the contour range of the Youden ellipse fails the indicator test under the outlier state detection indicator.

[0225] In this way, by constructing the Youden ellipse, multiple superposition AC laboratories, including the superposition AC laboratory, were verified and compared under the outlier state detection index, which provides a strong reference for evaluating and comparing the ability of superposition AC laboratories to conduct superposition AC experiments.

[0226] In some possible implementations, with respect to the frequency distribution detection index, the test data is processed and analyzed according to the following steps:

[0227] Determine a second average howling frequency based on howling frequencies in test data corresponding to a plurality of superimposed alternating current laboratories including the superimposed alternating current laboratory;

[0228] When the maximum howling frequency among the multiple howling frequencies included in the test data corresponding to the superimposed AC current laboratory is less than the second average howling frequency or the minimum howling frequency is greater than the second average howling frequency, it is determined that the index test of the superimposed AC current laboratory under the frequency distribution detection index fails.

[0229] For example, see Fig.11 , is a schematic diagram of the distribution of howling frequencies corresponding to a plurality of superimposed alternating current laboratories provided by an embodiment of the present disclosure. Fig.11 As shown in the figure, the vertical axis represents the howling frequency (Hz). Taking the laboratory verification and comparison of 30 superimposed AC laboratories as an example, under the previous other test indicators, 9 superimposed AC laboratories failed the test of indicators, namely 004, 007, 011, 013, 014, 016, 019, 026, and 027. Fig.11 The horizontal line in is the second average howling frequency determined by the howling frequencies in the test data corresponding to the remaining 21 superimposed AC current laboratories, including the superimposed AC current laboratory, except for those that fail other test indicators. Fig.11The 21 vertical lines correspond to the remaining 21 superimposed AC laboratories respectively, the top endpoint of the vertical line corresponds to the maximum howling frequency among the multiple howling frequencies included in the test data corresponding to the superimposed AC laboratory, and the bottom endpoint of the vertical line corresponds to the minimum howling frequency among the multiple howling frequencies included in the test data corresponding to the superimposed AC laboratory.

[0230] It can be understood that if the horizontal line does not pass through the vertical line, the maximum howling frequency is less than the second average howling frequency or the minimum howling frequency is greater than the second average howling frequency, and it can be considered that the superimposed AC current laboratory corresponding to the vertical line fails the indicator test under the frequency distribution detection indicator.

[0231] Therefore, the superimposed AC current laboratories 001, 002, 006, 010, 012, 015, 017, 018, 020, 021, 023, 024, and 030 in this example failed the index test under the frequency distribution detection index, and the superimposed AC current laboratories 003, 005, 008, 009, 022, 025, 028, and 029 passed the index test under the frequency distribution detection index.

[0232] In this way, by comparing the maximum howling frequency and the minimum howling frequency corresponding to the superposition AC current laboratory with the second average howling frequency corresponding to multiple superposition AC current laboratories including the superposition AC current laboratory, multiple superposition AC current laboratories including the superposition AC current laboratory are verified and compared under the frequency distribution detection index, which provides a strong reference for evaluating and comparing the ability of superposition AC current laboratories to conduct superposition AC experiments.

[0233] S303: Determine a test result of the superimposed AC laboratory based on a capability index of the superimposed AC laboratory, wherein the test result is used to indicate whether the superimposed AC laboratory can be used to perform performance evaluation on vehicle electronic devices.

[0234] In this step, based on the capability index of the superimposed AC current laboratory, it can be determined whether the superimposed AC current laboratory can be used to perform performance evaluation on vehicle electronic devices, and the superimposed AC current laboratory that can be used to perform performance evaluation on vehicle electronic devices can be indicated based on the test results. Subsequently, the performance evaluation of vehicle electronic devices can be performed through the superimposed AC current laboratory.

[0235] The vehicle electronic device may specifically be an inductive load including an inductive element on the vehicle.

[0236] When determining the test results of the superimposed AC current laboratory, optionally, a preset capability index can be obtained. When the capability index of the superimposed AC current laboratory is greater than the preset capability index, the test result is determined to be that the superimposed AC current laboratory can be used to perform performance evaluation on vehicle electronic components. Otherwise, it cannot be used to perform performance evaluation on vehicle electronic components.

[0237] Optionally, the capability indexes of a plurality of superimposed alternating current laboratories including the superimposed alternating current laboratory may be sorted to obtain a sorting result; and the detection result may be determined based on the sorting result and a preset rule.

[0238] Among them, the preset rules can be determined according to the screening needs of the superimposed alternating current laboratory. There is no specific limitation here. For example, it can be the top preset percentage in the sorting results, such as the top 30%, or the top preset number in the sorting results, such as the top 2, etc.

[0239] Here, regardless of whether the test device belongs to one of the two device types, all superimposed AC laboratories can be sorted together without distinguishing between different groups.

[0240] In the embodiment of the present disclosure, for multiple superimposed AC current laboratories including the superimposed AC current laboratory, when verifying and comparing the superimposed AC current laboratories, synchronous comparison or sequential comparison can be used.

[0241] Among them, the synchronous comparison refers to performing superimposed AC power tests on ripple voltage generating devices deployed in different superimposed AC power laboratories through the same test device, and the sequential comparison refers to performing superimposed AC power tests on ripple voltage generating devices deployed in different superimposed AC power laboratories through different test devices.

[0242] To more clearly show the difference between synchronous comparison and sequential comparison, you can also refer to Fig.12 and Fig.13 , Fig.12 A schematic diagram of a synchronous comparison process provided by an embodiment of the present disclosure is shown in FIG. Fig.13 A schematic diagram of a sequential comparison process provided by an embodiment of the present disclosure.

[0243] like Fig.12 As shown in , in the preliminary preparation stage, the experimental standard text is determined, and multiple test devices are prepared. The multiple test devices correspond to multiple superimposed AC laboratories one by one. Simulated superimposed AC tests are performed on the multiple test devices to ensure the test uniformity between the multiple test devices including the test device, and then each test device is distributed to each superimposed AC laboratory.

[0244] During the test implementation phase, the test device is connected to the ripple voltage generating device, and the ripple voltage generating device is connected to the oscilloscope. The ripple voltage generating device is turned on, and the frequency sweep program is preset so that the ripple voltage generating device can generate the test ripple voltage. The oscilloscope is turned on and debugged to ensure that the oscilloscope can work normally. The video recording device is turned on and debugged to ensure that the video recording device can work normally. Then, a superimposed AC test is performed to obtain the test data corresponding to the ripple voltage generating device.

[0245] In the data processing stage, the test data is processed and analyzed based on at least one detection index to determine whether the index detection of the superimposed AC laboratory is qualified. After the index detection of the superimposed AC laboratory is qualified, the capability index of the superimposed AC laboratory corresponding to the test data is determined based on the multiple howling frequencies. Based on the capability index of the superimposed AC laboratory, the detection result of the superimposed AC laboratory is determined, and the detection result is used to indicate whether the superimposed AC laboratory can be used to perform performance evaluation on vehicle electronic devices.

[0246] like Fig.13 As shown in , unlike synchronous comparison, sequential comparison only requires preparing one set of test equipment, which is transferred between different superimposed AC laboratories until all superimposed AC laboratories have completed the superimposed AC test using the test equipment.

[0247] Compared with synchronous comparison, sequential comparison can eliminate the non-uniformity between multiple test devices, thereby reducing test errors.

[0248] In practical applications, laboratories that run superimposed alternating current experiments for a long time lack internal control measures for their experimental capabilities, and are unable to ensure that their experimental capabilities are in a qualified state for a long time and that their experimental capabilities are in line with those of many laboratories.

[0249] Therefore, in the embodiment of the present disclosure, for the above-mentioned superimposed AC laboratory (i.e., a superimposed AC laboratory that can be used to evaluate the performance of vehicle electronic devices), the test device can be retained to detect the operating stability of the superimposed AC experiment for a long time or to continuously improve the experimental capabilities. The laboratory sample retention self-test implementation process is consistent with the process of the experiment development stage and the data processing stage in the above-mentioned embodiment, and will not be repeated here.

[0250] Optionally, the superimposed AC current laboratory can be provided with the Youden ellipse diagram and the average value of the howling frequency obtained during the previous capability verification and comparison of multiple laboratories for reference. If the indicator fails to meet the test or the capability index is too low, the superimposed AC current laboratory needs to investigate the cause and make improvements so as to better evaluate the performance of vehicle electronic devices in the future.

[0251] The present disclosure provides a method for detecting the capability of a superimposed AC laboratory. A superimposed AC experiment is performed on a ripple voltage generating device deployed in the superimposed AC laboratory through a testing device. The ripple voltage generating device generates a test ripple voltage after superimposed AC, and transmits the test ripple voltage to the testing device. When the frequency of the test ripple voltage is the same as the resonant frequency of the howling circuit in the testing device, the testing device generates a howling. The frequency of the test ripple voltage corresponding to the howling is used as the howling frequency. The capability index of the superimposed AC laboratory is determined based on multiple howling frequencies, thereby determining whether the superimposed AC laboratory can be used for performance evaluation of vehicle electronic devices. Compared with manual detection, the method saves time and effort, reduces labor costs, and can determine the capability index through quantified detection methods to obtain tangible test data, which helps to improve the accuracy and reliability of the capability detection structure, thereby effectively ensuring the reliability and stability of the performance evaluation of vehicle electronic devices.

[0252] Those skilled in the art will appreciate that, in the above method of specific implementation, the order in which the steps are written does not imply a strict execution order and does not constitute any limitation on the implementation process. The specific execution order of the steps should be determined by their functions and possible internal logic.

[0253] Based on the same inventive concept, the embodiments of the present disclosure also provide a device for detecting the superimposed AC current laboratory capacity corresponding to the method for detecting the superimposed AC current laboratory capacity. Since the principle of solving the problem by the device for detecting the superimposed AC current laboratory capacity in the embodiments of the present disclosure is similar to the method for detecting the superimposed AC current laboratory capacity in the embodiments of the present disclosure, the implementation of the device can refer to the implementation of the method, and the repeated parts will not be repeated.

[0254] See also Fig.14 and Fig.15 , Fig.14 This is one of the schematic diagrams of a detection device for superimposed alternating current laboratory capacity provided by an embodiment of the present disclosure, Fig.15The second schematic diagram of a device for detecting the capability of a superimposed alternating current laboratory provided in an embodiment of the present disclosure. A ripple voltage generating device is deployed in the superimposed alternating current laboratory, the output end of the ripple voltage generating device is connected to the input end of the testing device, and the ripple voltage generating device is used to generate a test ripple voltage after superimposing alternating current; the testing device includes a howling circuit, and the howling circuit generates a howling when the frequency of the test ripple voltage is the same as the resonant frequency of the howling circuit; Fig.14 As shown in the figure, the detection device 1400 for superimposed alternating current laboratory capacity provided by the embodiment of the present disclosure includes:

[0255] The test data determination module 1410 is used to perform a superimposed alternating current test on the ripple voltage generating device to be detected through a test device to obtain test data corresponding to the ripple voltage generating device; the test data includes a plurality of howling frequencies; the howling frequency refers to the frequency of the test ripple voltage corresponding to the howling of the test device;

[0256] A capability index determination module 1420 is used to determine the capability index of the superimposed alternating current laboratory based on the multiple howling frequencies, wherein the magnitude of the capability index is used to indicate the capability of the superimposed alternating current laboratory to perform superimposed alternating current experiments;

[0257] The test result determination module 1430 is used to determine the test result of the superimposed AC laboratory based on the capability index of the superimposed AC laboratory, and the test result is used to indicate whether the superimposed AC laboratory can be used to perform performance evaluation on vehicle electronic devices.

[0258] In an optional embodiment, the frequency of the test ripple voltage changes periodically. In each cycle, the frequency of the test ripple voltage changes from a first frequency threshold to a second frequency threshold, and then from the second frequency threshold to the first frequency threshold. The resonant frequency of the howling circuit is greater than the first frequency threshold and less than the second frequency threshold.

[0259] In an optional implementation, the howling circuit includes a buzzing capacitor and a variable inductor; one end of the buzzing capacitor is connected to the input end of the test device, and the other end of the buzzing capacitor is grounded through the variable inductor; the resonant frequency is determined by the inductive reactance of the variable inductor.

[0260] In an optional implementation manner, the capability index determination module 1420 is specifically used to:

[0261] Based on the multiple howling frequencies, determining a first average howling frequency and a howling frequency standard deviation;

[0262] determining a difference between the first average howling frequency and the howling frequency standard deviation;

[0263] The ratio between the difference and the first average howling frequency is determined as the capability index of the superimposed alternating current laboratory.

[0264] In an optional embodiment, the test device belongs to one of two device types, and the deviation between the resonant frequencies respectively corresponding to the test devices of the two device types is less than a preset deviation;

[0265] The multiple test devices under the two device types are used to test multiple ripple voltage generating devices including the ripple voltage generating device. The multiple ripple voltage generating devices are divided into two groups, and different groups of ripple voltage generating devices are assigned different device types of test devices.

[0266] In an optional implementation, Fig.15 As shown in , the superimposed alternating current laboratory capability detection device 1400 further includes a data processing and analysis module 1440, and the data processing and analysis module 1440 is used to:

[0267] Processing and analyzing the test data based on at least one detection index to determine whether the index detection of the superimposed alternating current laboratory is qualified;

[0268] The capability index determination module 1420 is specifically used for:

[0269] After the indicator test of the superimposed alternating current laboratory is qualified, a capability index of the superimposed alternating current laboratory is determined based on the multiple howling frequencies.

[0270] In an optional implementation, the detection index includes at least one of a waveform quality detection index, a frequency accuracy detection index, an outlier state detection index, and a frequency distribution detection index;

[0271] The waveform quality detection index is used to detect whether the waveform of the test ripple voltage generated by the superimposed AC current laboratory meets the target waveform requirements; the frequency accuracy detection index is used to detect whether the frequency accuracy of the test ripple voltage generated by the superimposed AC current laboratory meets the requirements; the outlier state detection index is used to detect the howling frequency corresponding to the superimposed AC current laboratory, and whether the outlier state in the howling frequency set corresponding to multiple superimposed AC current laboratories meets the requirements; the frequency distribution detection index is used to detect whether the distribution of the howling frequency corresponding to the superimposed AC current laboratory meets the requirements.

[0272] In an optional embodiment, the test device is provided with a first indicator light and a second indicator light; the test data further includes the number of flashes of the first indicator light and the number of flashes of the second indicator light; the first indicator light flashes when the high frequency of the test ripple voltage meets the standard, and the second indicator light flashes when the low frequency of the test ripple voltage does not meet the standard;

[0273] The data processing and analysis module 1440 processes and analyzes the test data according to the following steps with respect to the frequency accuracy detection index:

[0274] Determine the frequency accuracy level corresponding to the test data based on the mapping relationship between the number of flashes of the first indicator light and the number of flashes of the second indicator light, and the combination of the number of flashes of the first indicator light and the second indicator light, and the frequency accuracy level;

[0275] When the frequency accuracy level is lower than the preset level, it is determined that the index test of the superimposed alternating current laboratory under the frequency accuracy test index is unqualified.

[0276] In an optional implementation, the frequency of the test ripple voltage changes periodically, and in each cycle, the frequency of the test ripple voltage changes from a first frequency threshold to a second frequency threshold, and then changes from the second frequency threshold to the first frequency threshold; the test device includes a high-frequency detection circuit and a low-frequency detection circuit;

[0277] The high-frequency detection circuit includes a high-pass filter and the first indicator light; one end of the high-pass filter is connected to the input end of the test device, and the other end of the high-pass filter is grounded through the first indicator light; the difference between the lower limit frequency of the high-pass filter and the second frequency threshold is within a first preset range; when the frequency of the test ripple voltage is greater than the lower limit frequency of the high-pass filter, the first indicator light flashes;

[0278] The low-frequency detection circuit includes a bandpass filter and the second indicator light; one end of the bandpass filter is connected to the input end of the test device, and the other end of the bandpass filter is grounded through the second indicator light; the difference between the upper limit frequency of the bandpass filter and the second frequency threshold is within a second preset range, and the difference between the lower limit frequency of the bandpass filter and the first frequency threshold is within a third preset range; when the frequency of the test ripple voltage is less than the lower limit frequency of the bandpass filter, the second indicator light flashes.

[0279] In an optional implementation manner, the test data further includes an effective duration, and the effective duration is the duration from when the ripple voltage generating device starts to generate the test ripple voltage to when it stops generating the test ripple voltage;

[0280] The data processing and analysis module 1440 processes and analyzes the test data according to the following steps with respect to the outlier state detection index:

[0281] Based on the effective duration and the multiple howling frequencies in the test data respectively corresponding to a plurality of superimposed alternating current laboratories including the superimposed alternating current laboratory, a Youden ellipse diagram is constructed; in the Youden ellipse diagram, the test data corresponding to each superimposed alternating current laboratory corresponds to a target point;

[0282] When the target point corresponding to the test data corresponding to the superimposed alternating current laboratory is outside the contour range of the Youden ellipse, it is determined that the indicator detection of the superimposed alternating current laboratory under the outlier state detection indicator is unqualified.

[0283] In an optional implementation manner, the data processing and analysis module 1440 processes and analyzes the test data according to the following steps with respect to the frequency distribution detection index:

[0284] Determine a second average howling frequency based on howling frequencies in test data corresponding to a plurality of superimposed alternating current laboratories including the superimposed alternating current laboratory;

[0285] When the maximum howling frequency among the multiple howling frequencies included in the test data corresponding to the superimposed AC current laboratory is less than the second average howling frequency or the minimum howling frequency is greater than the second average howling frequency, it is determined that the index test of the superimposed AC current laboratory under the frequency distribution detection index fails.

[0286] In an optional implementation, the test device is provided with a standby state indicator light and a working state indicator light, and the test device includes an alternating current detection circuit;

[0287] The input end of the AC detection circuit is connected to the input end of the test device, the first output end of the AC detection circuit is connected to the working state indicator light, and the second output end of the AC detection circuit is connected to the standby state indicator light; the AC detection circuit is used to generate a first control signal to control the working state indicator light to light up when receiving the test ripple voltage sent by the ripple voltage generating device;

[0288] The AC power detection circuit is also used to generate a second control signal to control the standby state indicator light to light up when receiving the DC voltage sent by the ripple voltage generating device.

[0289] In an optional implementation manner, the test data determination module 1410 is specifically configured to:

[0290] Acquiring video data of the test device when performing a superimposed alternating current test on the ripple voltage generating device;

[0291] The test data is extracted from the video data.

[0292] For descriptions of the processing flow of each module in the device and the interaction flow between each module, reference may be made to the relevant descriptions in the above method embodiment, which will not be described in detail here.

[0293] The present disclosure provides a device for detecting the capability of a superimposed AC laboratory. A test device is used to perform a superimposed AC experiment on a ripple voltage generating device deployed in the superimposed AC laboratory. The ripple voltage generating device generates a test ripple voltage after superimposed AC, and transmits the test ripple voltage to the test device. When the frequency of the test ripple voltage is the same as the resonant frequency of the howling circuit in the test device, the test device generates a howling. The frequency of the test ripple voltage corresponding to the howling is used as the howling frequency. The capability index of the superimposed AC laboratory is determined based on multiple howling frequencies, thereby determining whether the superimposed AC laboratory can be used for performance evaluation of vehicle electronic devices. Compared with manual detection, the method saves time and effort, reduces labor costs, and can determine the capability index through quantified detection methods to obtain tangible test data, which helps to improve the accuracy and reliability of the capability detection structure, thereby effectively ensuring the reliability and stability of the performance evaluation of vehicle electronic devices.

[0294] Corresponds to Figure 1 The present disclosure also provides an electronic device 1600, such as Fig.16 As shown in FIG. 1 , it is a schematic diagram of the structure of an electronic device 1600 provided in an embodiment of the present disclosure, including:

[0295] Processor 1610, memory 1620, and bus 1630. The memory 1620 is used to store execution instructions, including internal memory 1621 and external memory 1622; the internal memory 1621 is also called internal memory, which is used to temporarily store the operation data in the processor 1610 and the data exchanged with the external memory 1622 such as a hard disk. The processor 1610 exchanges data with the external memory 1622 through the internal memory 1621.

[0296] In the embodiment of the present application, the memory 1620 is specifically used to store the application code for executing the solution of the present application, and the execution is controlled by the processor 1610. That is, when the electronic device 1600 is running, the processor 1610 communicates with the memory 1620 through the bus 1630, so that the processor 1610 executes the application code stored in the memory 1620, and then executes the steps of the method for detecting the laboratory capability of superimposed alternating current described in any of the aforementioned embodiments.

[0297] Among them, the memory 1620 can be, but is not limited to, random access memory (Random Access Memory, RAM), read only memory (Read Only Memory, ROM), programmable read-only memory (Programmable Read-Only Memory, PROM), erasable programmable read-only memory (Erasable Programmable Read-Only Memory, EPROM), electrically erasable read-only memory (Electric Erasable Programmable Read-Only Memory, EEPROM), etc.

[0298] Processor 1610 may be an integrated circuit chip with signal processing capabilities. The above-mentioned processor may be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it may also be a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components. The disclosed methods, steps and logic block diagrams in the embodiments of the present invention may be implemented or executed. The general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0299] It is to be understood that the structure illustrated in the embodiment of the present application does not constitute a specific limitation on the electronic device 1600. In other embodiments of the present application, the electronic device 1600 may include more or fewer components than shown in the figure, or combine some components, or split some components, or arrange the components differently. The components shown in the figure may be implemented in hardware, software, or a combination of software and hardware.

[0300] The present disclosure also provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps of the method for detecting the laboratory capability of superimposed alternating current described in the above method embodiment are executed. The storage medium may be a volatile or non-volatile computer-readable storage medium.

[0301] In addition, an embodiment of the present disclosure also provides a computer program product, which stores a computer program. When the computer program is executed by a processor, the steps of the method for detecting the laboratory capability of superimposed alternating current provided in any of the above embodiments of the present disclosure are executed. For details, please refer to the above method embodiments, which will not be repeated here.

[0302] The computer program product may be implemented in hardware, software or a combination thereof. In an optional embodiment, the computer program product is embodied as a computer storage medium, which may be a volatile or non-volatile computer-readable storage medium. In another optional embodiment, the computer program product is embodied as a software product, such as a software development kit (SDK) and the like.

[0303] Those skilled in the art can clearly understand that, for the convenience and simplicity of description, the specific working process of the above-described equipment and devices can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here. In the several embodiments provided in the present disclosure, it should be understood that the disclosed equipment, devices and methods can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0304] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0305] In addition, each functional unit in each embodiment of the present disclosure may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0306] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a non-volatile computer-readable storage medium that is executable by a processor. Based on this understanding, the technical solution of the present disclosure, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present disclosure. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0307] Finally, it should be noted that the above-described embodiments are only specific implementation methods of the present disclosure, which are used to illustrate the technical solutions of the present disclosure, rather than to limit them. The protection scope of the present disclosure is not limited thereto. Although the present disclosure is described in detail with reference to the above-described embodiments, ordinary technicians in the field should understand that any technician familiar with the technical field can still modify the technical solutions recorded in the above-described embodiments within the technical scope disclosed in the present disclosure, or can easily think of changes, or make equivalent replacements for some of the technical features therein; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present disclosure, and should be included in the protection scope of the present disclosure. Therefore, the protection scope of the present disclosure should be based on the protection scope of the claims.

Claims

1. A method for detecting the capability of a superimposed alternating current laboratory, characterized in that: A ripple voltage generating device is deployed in the superimposed alternating current laboratory, the output end of the ripple voltage generating device is connected to the input end of the test device, and the ripple voltage generating device is used to generate a test ripple voltage after superimposed alternating current; The testing device comprises a howling circuit, wherein the howling circuit generates a howling sound when the frequency of the test ripple voltage is the same as the resonant frequency of the howling circuit; and the method comprises: Performing a superimposed alternating current test on the ripple voltage generating device to be tested by a testing device to obtain test data corresponding to the ripple voltage generating device; The test data includes a plurality of howling frequencies; the howling frequency refers to the frequency of the test ripple voltage corresponding to when the test device howls; Determine a capability index of the superimposed alternating current laboratory based on the multiple howling frequencies, wherein the capability index is used to indicate the capability of the superimposed alternating current laboratory to perform a superimposed alternating current experiment; Based on the capability index of the superimposed alternating current laboratory, a test result of the superimposed alternating current laboratory is determined, wherein the test result is used to indicate whether the superimposed alternating current laboratory can be used to perform performance evaluation on vehicle electronic devices.

2. The method according to claim 1, characterized in that The frequency of the test ripple voltage changes periodically. In each cycle, the frequency of the test ripple voltage changes from a first frequency threshold to a second frequency threshold, and then changes from the second frequency threshold to the first frequency threshold. The resonant frequency of the howling circuit is greater than the first frequency threshold and less than the second frequency threshold.

3. The method according to claim 1 or 2, characterized in that: The howling circuit includes a buzzing capacitor and a variable inductor; one end of the buzzing capacitor is connected to the input end of the test device, and the other end of the buzzing capacitor is grounded through the variable inductor; the resonant frequency is determined by the inductive reactance of the variable inductor.

4. The method according to claim 1, characterized in that: The step of determining the capability index of the superimposed alternating current laboratory based on the multiple howling frequencies includes: Based on the multiple howling frequencies, determining a first average howling frequency and a howling frequency standard deviation; determining a difference between the first average howling frequency and the howling frequency standard deviation; The ratio between the difference and the first average howling frequency is determined as the capability index of the superimposed alternating current laboratory.

5. The method according to claim 1, characterized in that The test device belongs to one of two device types, the two device types correspond to different resonant frequencies, and the deviation between the resonant frequencies respectively corresponding to the test devices of the two device types is less than a preset deviation; The multiple test devices under the two device types are used to test multiple ripple voltage generating devices including the ripple voltage generating device, and the multiple ripple voltage generating devices are divided into two groups, and different groups of ripple voltage generating devices are assigned different device types of test devices; the multiple ripple voltage generating devices are deployed in multiple superimposed AC power laboratories including the superimposed AC power laboratory, and the multiple superimposed AC power laboratories are used to jointly carry out laboratory capability verification and comparison, and the multiple ripple voltage generating devices and the multiple superimposed AC power laboratories correspond one to one.

6. The method according to claim 1, characterized in that Before determining the capability index of the superimposed alternating current laboratory based on the multiple howling frequencies, the method further includes: Processing and analyzing the test data based on at least one detection index to determine whether the index detection of the superimposed alternating current laboratory is qualified; The step of determining the capability index of the superimposed alternating current laboratory based on the multiple howling frequencies includes: After the indicator test of the superimposed alternating current laboratory is qualified, a capability index of the superimposed alternating current laboratory is determined based on the multiple howling frequencies.

7. The method according to claim 6, characterized in that The detection index includes at least one of a waveform quality detection index, a frequency accuracy detection index, an outlier state detection index, and a frequency distribution detection index; The waveform quality detection index is used to detect whether the waveform of the test ripple voltage generated by the superimposed AC current laboratory meets the target waveform requirements; the frequency accuracy detection index is used to detect whether the frequency accuracy of the test ripple voltage generated by the superimposed AC current laboratory meets the requirements; the outlier state detection index is used to detect the howling frequency corresponding to the superimposed AC current laboratory, and whether the outlier state in the howling frequency set corresponding to multiple superimposed AC current laboratories meets the requirements; the frequency distribution detection index is used to detect whether the distribution of the howling frequency corresponding to the superimposed AC current laboratory meets the requirements.

8. The method according to claim 7, characterized in that The test device is provided with a first indicator light and a second indicator light; the test data also includes the number of flashes of the first indicator light and the number of flashes of the second indicator light; the first indicator light flashes when the high frequency of the test ripple voltage meets the standard, and the second indicator light flashes when the low frequency of the test ripple voltage does not meet the standard; According to the frequency accuracy detection index, the test data is processed and analyzed according to the following steps: Determine the frequency accuracy level corresponding to the test data based on the mapping relationship between the number of flashes of the first indicator light and the number of flashes of the second indicator light, and the combination of the number of flashes of the first indicator light and the second indicator light, and the frequency accuracy level; When the frequency accuracy level is lower than the preset level, it is determined that the index test of the superimposed alternating current laboratory under the frequency accuracy test index is unqualified.

9. The method according to claim 8, characterized in that The frequency of the test ripple voltage changes periodically. In each cycle, the frequency of the test ripple voltage changes from a first frequency threshold to a second frequency threshold, and then changes from the second frequency threshold to the first frequency threshold; the test device includes a high-frequency detection circuit and a low-frequency detection circuit; The high-frequency detection circuit includes a high-pass filter and the first indicator light; one end of the high-pass filter is connected to the input end of the test device, and the other end of the high-pass filter is grounded through the first indicator light; the difference between the lower limit frequency of the high-pass filter and the second frequency threshold is within a first preset range; when the frequency of the test ripple voltage is greater than the lower limit frequency of the high-pass filter, the first indicator light flashes; The low-frequency detection circuit includes a bandpass filter and the second indicator light; one end of the bandpass filter is connected to the input end of the test device, and the other end of the bandpass filter is grounded through the second indicator light; the difference between the upper limit frequency of the bandpass filter and the second frequency threshold is within a second preset range, and the difference between the lower limit frequency of the bandpass filter and the first frequency threshold is within a third preset range; when the frequency of the test ripple voltage is less than the lower limit frequency of the bandpass filter, the second indicator light flashes.

10. The method according to claim 7, characterized in that The test data also includes an effective duration, which is the duration from when the ripple voltage generating device starts to generate the test ripple voltage to when it stops generating the test ripple voltage; For the outlier state detection index, the test data is processed and analyzed according to the following steps: Based on the effective duration and the multiple howling frequencies in the test data respectively corresponding to a plurality of superimposed alternating current laboratories including the superimposed alternating current laboratory, a Youden ellipse diagram is constructed; in the Youden ellipse diagram, the test data corresponding to each superimposed alternating current laboratory corresponds to a target point; The multiple superimposed AC laboratories are used to jointly conduct laboratory capability verification and comparison; When the target point corresponding to the test data corresponding to the superimposed alternating current laboratory is outside the contour range of the Youden ellipse, it is determined that the indicator detection of the superimposed alternating current laboratory under the outlier state detection indicator is unqualified.

11. The method according to claim 7, characterized in that With respect to the frequency distribution detection index, the test data is processed and analyzed according to the following steps: Determine a second average howling frequency based on the howling frequencies in the test data corresponding to a plurality of superimposed alternating current laboratories including the superimposed alternating current laboratory; the plurality of superimposed alternating current laboratories are used to jointly perform laboratory capability verification and comparison; each superimposed alternating current laboratory corresponds to a set of test data; each set of test data includes a plurality of howling frequencies; When the maximum howling frequency among the multiple howling frequencies included in the test data corresponding to the superimposed AC current laboratory is less than the second average howling frequency or the minimum howling frequency is greater than the second average howling frequency, it is determined that the index test of the superimposed AC current laboratory under the frequency distribution detection index fails.

12. The method according to claim 1, characterized in that The test device is provided with a standby state indicator light and a working state indicator light, and the test device includes an alternating current detection circuit; The input end of the AC detection circuit is connected to the input end of the test device, the first output end of the AC detection circuit is connected to the working state indicator light, and the second output end of the AC detection circuit is connected to the standby state indicator light; the AC detection circuit is used to generate a first control signal to control the working state indicator light to light up when receiving the test ripple voltage sent by the ripple voltage generating device; The AC power detection circuit is also used to generate a second control signal to control the standby state indicator light to light up when receiving the DC voltage sent by the ripple voltage generating device.

13. The method according to claim 1, characterized in that The method of performing a superimposed alternating current test on the ripple voltage generating device to be tested by the testing device to obtain test data corresponding to the ripple voltage generating device includes: Acquiring video data of the test device when performing a superimposed alternating current test on the ripple voltage generating device; The test data is extracted from the video data.

14. A test device for detecting the laboratory capability of superimposed alternating current, characterized in that: The test device is provided with an input end, which is connected to the output end of a ripple voltage generating device deployed in a superimposed alternating current laboratory, and is used to receive a test ripple voltage generated by the ripple voltage generating device after superimposed alternating current, so as to perform a superimposed alternating current test on the ripple voltage generating device; The testing device comprises a howling circuit; the howling circuit comprises a buzzing capacitor and a variable inductor; One end of the buzzing capacitor is connected to the input end of the test device, and the other end of the buzzing capacitor is grounded through the variable inductor; the resonant frequency of the howling circuit is determined by the inductive reactance of the variable inductor; When the frequency of the test ripple voltage is the same as the resonant frequency of the howling circuit, the buzzing capacitor generates howling, and the frequency of the test ripple voltage corresponding to the howling of the buzzing capacitor is the howling frequency; the howling frequency is used to determine the capability index of the corresponding superimposed alternating current laboratory, and the size of the capability index is used to indicate the strength of the capability of the superimposed alternating current laboratory to conduct superimposed alternating current experiments.

15. The testing device according to claim 14, characterized in that: The frequency of the test ripple voltage changes periodically. In each cycle, the frequency of the test ripple voltage changes from a first frequency threshold to a second frequency threshold, and then changes from the second frequency threshold to the first frequency threshold. The resonant frequency of the howling circuit is greater than the first frequency threshold and less than the second frequency threshold.

16. The testing device according to claim 15, characterized in that: The test device also includes a high-frequency detection circuit and a low-frequency detection circuit; One end of the high-frequency detection circuit is connected to the input end of the test device, and the other end of the high-frequency detection circuit is grounded, so as to detect whether the high frequency of the test ripple voltage meets the standard; One end of the low-frequency detection circuit is connected to the input end of the test device, and the other end of the low-frequency detection circuit is grounded, so as to detect whether the low frequency of the test ripple voltage meets the standard.

17. The testing device according to claim 16, characterized in that: The high-frequency detection circuit includes a high-pass filter and a first indicator light; one end of the high-pass filter is connected to the input end of the test device, and the other end of the high-pass filter is grounded through the first indicator light; the difference between the lower limit frequency of the high-pass filter and the second frequency threshold is within a first preset range; when the frequency of the test ripple voltage is greater than the lower limit frequency of the high-pass filter, the first indicator light flashes.

18. The testing device according to claim 16, characterized in that: The low-frequency detection circuit includes a bandpass filter and a second indicator light; one end of the bandpass filter is connected to the input end of the test device, and the other end of the bandpass filter is grounded through the second indicator light; the difference between the upper limit frequency of the bandpass filter and the second frequency threshold is within a second preset range, and the difference between the lower limit frequency of the bandpass filter and the first frequency threshold is within a third preset range; when the frequency of the test ripple voltage is less than the lower limit frequency of the bandpass filter, the second indicator light flashes.

19. The testing device according to claim 14, characterized in that: The testing device also includes an AC detection circuit, a working status indicator light and a first electronic switch; The input end of the AC detection circuit is connected to the input end of the test device, the first output end of the AC detection circuit is connected to the control end of the first electronic switch, the first connection end of the first electronic switch is connected to the working status indicator light, and the second connection end of the first electronic switch is grounded; The AC power detection circuit is used to generate a first control signal to control the first electronic switch to be turned on, so that the working status indicator light is turned on, when receiving the test ripple voltage sent by the ripple voltage generating device.

20. The testing device according to claim 19, characterized in that The testing device also includes a standby state indicator light and a second electronic switch; The second output end of the AC detection circuit is connected to the control end of the second electronic switch, the first connection end of the second electronic switch is connected to the standby state indicator light, and the second connection end of the second electronic switch is grounded; The AC power detection circuit is used to generate a second control signal when receiving the DC voltage sent by the ripple voltage generating device, so as to control the second electronic switch to be turned on, so that the standby state indicator light is turned on.

21. The testing device according to claim 20, characterized in that The AC detection circuit includes a capacitor, an operational amplifier and a resistor; One end of the capacitor is connected to the input end of the test device, the other end of the capacitor is grounded through the resistor, and the non-inverting input end of the operational amplifier is connected between the capacitor and the resistor; The inverting input terminal of the operational amplifier is grounded, and the output terminal of the operational amplifier is the first output terminal of the alternating current detection circuit.

22. The testing device according to claim 21, characterized in that The AC detection circuit also includes a NAND gate; The first input end of the NAND gate is connected to the input end of the test device, the second input end of the NAND gate is connected to the output end of the operational amplifier, and the output end of the NAND gate is the second output end of the AC detection circuit.

23. An electronic device, characterized in that: include: A processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate via the bus, and when the machine-readable instructions are executed by the processor, the steps of the method for detecting the laboratory capability of superimposed alternating current as described in any one of claims 1 to 13 are performed.

24. A computer program product, characterized in that The computer program product stores a computer program, and when the computer program is executed by a processor, the steps of the method for detecting the laboratory capability of superimposed alternating current according to any one of claims 1 to 13 are executed.

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