Infrared lens transmittance testing system, method and device

Abstract

The present invention discloses an infrared lens transmittance test system, method and device, wherein the system comprises: a data acquisition module and a data calculation module; the data acquisition module is used to perform high-temperature baking on an optical lens to be tested, and test the optical lens to be tested after baking in the high-temperature box based on an infrared standard black body, a detector device, a temperature measuring device and a high-temperature box, and measure a series of data, including the temperature of the optical lens to be tested, and the grayscale value of the detector's response to the optical lens to be tested and the optical lens not to be tested. During the test, suitable temperatures are set for the detector and the high-temperature box, respectively, and a series of data are used in the data calculation module to calculate gain, bias, estimated temperature, etc., and finally the transmittance of the optical lens to be tested at each temperature value is obtained using a preset formula, and the preset formula is established based on Planck's blackbody radiation law. The present invention reduces the infrared lens transmittance test cost and realizes the transmittance test of infrared lenses at different temperatures.

Description

Technical Field

[0001] The present invention relates to the technical field of transmittance testing, and in particular to an infrared lens transmittance testing system, method and device. Background Art

[0002] This section is intended to provide a background or context to the embodiments of the invention recited in the claims. No admission is made that the description herein is prior art by inclusion in this section.

[0003] An infrared thermometer is a non-contact temperature measurement device that measures temperature by detecting infrared radiation emitted by the object being measured. At present, high-precision temperature measurement methods mostly use temperature segment calibration methods to ignore or reduce the impact of changes in infrared lens transmittance with temperature. However, the temperature in the actual environment is constantly changing, which will inevitably cause changes in transmittance. Transmittance is a key optical performance indicator, and its accuracy is of great significance to infrared imaging and subsequent imaging data calculations. Ignoring or reducing the changes in infrared lens transmittance with temperature will affect the temperature measurement accuracy of the infrared thermometer.

[0004] In the prior art, Fourier transform infrared spectrometer is generally used to measure transmittance. The interference light generated by the Fourier transform infrared spectrometer passes through the infrared lens test sample after the beam splitter. The interference light containing the sample information reaches the detector. The signal is processed based on Fourier transform to finally obtain the transmittance of the infrared lens test sample. However, the Fourier transform infrared spectrometer is expensive, which will cause the cost of infrared lens transmittance testing to be high. In addition, the Fourier transform method can only test the infrared transmittance of samples at room temperature, and the impact of temperature changes on transmittance cannot be evaluated. Summary of the invention

[0005] The embodiment of the present invention provides an infrared lens transmittance testing system, which is used to implement transmittance testing of infrared lenses at different temperatures and reduce the cost of infrared lens transmittance testing. The system includes: a data acquisition module and a data calculation module;

[0006] The data acquisition module includes: infrared standard black body, detector equipment, lens fixing module, temperature measuring equipment, and high temperature box;

[0007] The light window of the detector device is aligned with the infrared standard black body, and the detector device is used to detect the radiation emitted by the infrared standard black body and output a gray value signal; the lens fixing module is used to install the optical lens to be tested, and is arranged between the infrared standard black body and the detector device; the high temperature box is used to bake the optical lens to be tested at a third temperature, and the temperature measuring device is used to measure multiple temperature values ​​of the optical lens to be tested baked in the high temperature box at preset interval time points;

[0008] Wherein, the gray value signal includes a first type of gray value, a second type of gray value, and a plurality of third type of gray values;

[0009] The first type of grayscale value and the second type of grayscale value are: when the optical lens to be tested is not installed in the lens fixing module, and the infrared standard black body is set at the ambient temperature and the second temperature respectively, the grayscale value signal output by the detector device; the third temperature is higher than the second temperature, and the second temperature is higher than the ambient temperature;

[0010] The third type of grayscale value is: when the optical lens to be tested is baked in a high-temperature box and installed in the lens fixing module, and the infrared standard black body is set at the ambient temperature, the detector device outputs the grayscale value signal at the preset interval time point;

[0011] The data calculation module is used to obtain a first-class grayscale value, a second-class grayscale value, multiple third-class grayscale values ​​and multiple temperature values; determine the gain and bias of the detector device according to the first-class grayscale value, the second-class grayscale value, the ambient temperature and the second temperature; the gain reflects the influence of temperature change on grayscale value change, and the bias is determined according to the gain; determine multiple inferred temperatures of the detector device's response to an infrared standard black body according to multiple third-class grayscale values, gain and bias; use a preset formula, multiple inferred temperatures and multiple temperature values ​​to determine the transmittance of the optical lens to be tested at each temperature value, and the preset formula is established based on Planck's blackbody radiation law and Stefan-Boltzmann law.

[0012] The embodiment of the present invention provides an infrared lens transmittance testing method, which is used to implement transmittance testing of infrared lenses at different temperatures and reduce the transmittance testing cost of infrared lenses. The method includes:

[0013] Obtaining a first-category grayscale value, a second-category grayscale value, a plurality of third-category grayscale values, and a plurality of temperature values;

[0014] Determine the gain and bias of the detector device according to the first type of grayscale value, the second type of grayscale value, the ambient temperature and the second temperature; the gain reflects the influence of temperature change on the change of grayscale value, and the bias is determined according to the gain;

[0015] Determining a plurality of inferred temperatures of the detector device's response to an infrared standard black body based on a plurality of third-category grayscale values, a gain, and an offset;

[0016] The transmittance of the optical lens to be tested at each temperature value is determined using a preset formula, multiple estimated temperatures and multiple temperature values, wherein the preset formula is established based on Planck's blackbody radiation law and Stefan-Boltzmann law.

[0017] The embodiment of the present invention further provides an infrared lens transmittance testing device, which is used to implement transmittance testing of infrared lenses at different temperatures and reduce the cost of infrared lens transmittance testing. The device includes:

[0018] A data acquisition module, used for acquiring a first type of grayscale value, a second type of grayscale value, a plurality of third type of grayscale values ​​and a plurality of temperature values;

[0019] A gain offset determination module, used to determine the gain and offset of the detector device according to the first type of grayscale value, the second type of grayscale value, the ambient temperature and the second temperature; the gain reflects the influence of temperature change on the change of grayscale value, and the offset is determined according to the gain;

[0020] An inferred temperature determination module, for determining a plurality of inferred temperatures of the detector device in response to an infrared standard black body according to a plurality of third-category grayscale values, gain and bias;

[0021] The transmittance determination module is used to determine the transmittance of the optical lens to be tested at each temperature value using a preset formula, multiple estimated temperatures and multiple temperature values, wherein the preset formula is established based on Planck's blackbody radiation law and Stefan-Boltzmann law.

[0022] An embodiment of the present invention further provides a computer device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the above-mentioned infrared lens transmittance testing method when executing the computer program.

[0023] An embodiment of the present invention further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the above-mentioned infrared lens transmittance testing method is implemented.

[0024] An embodiment of the present invention further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the above-mentioned infrared lens transmittance testing method is implemented.

[0025] In the embodiment of the present invention, the infrared lens transmittance test system includes a data acquisition module and a data calculation module. The data acquisition module can perform high-temperature baking on the optical lens to be tested, and test the optical lens to be tested that has been baked in a high-temperature box, and measure a series of data, including lens temperature, the grayscale value of the detector's response to the optical lens to be tested and the optical lens not to be tested, etc., and during the test, the detector and the high-temperature box are respectively set with appropriate temperatures, and finally a series of valid data is obtained. The data calculation module uses a series of valid data to calculate gain, bias, estimated temperature, etc., and finally obtains the transmittance of the optical lens to be tested at each temperature value. Compared with the Fourier transform method in the prior art, the embodiment of the present invention avoids expensive equipment and reduces the cost of infrared lens transmittance testing. In addition, the embodiment of the present invention can adjust the temperature of the infrared lens to be tested to achieve transmittance testing of infrared lenses at different temperatures. The method is simple and efficient. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the prior art descriptions. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. In the drawings:

[0027] Figure 1 It is a schematic diagram of the principle of an existing infrared thermometer;

[0028] Figure 2 Schematic diagram of an infrared lens transmittance testing system according to an embodiment of the present invention;

[0029] Figure 3 A specific example diagram of an infrared lens transmittance testing system in an embodiment of the present invention;

[0030] Figure 4 Schematic diagram of the process of infrared lens transmittance testing method in an embodiment of the present invention;

[0031] Figure 5 Schematic diagram of an infrared lens transmittance testing device according to an embodiment of the present invention;

[0032] Figure 6 Schematic diagram of a computer device in an embodiment of the present invention. DETAILED DESCRIPTION

[0033] To make the purpose, technical solution and advantages of the embodiments of the present invention more clear, the embodiments of the present invention are further described in detail below in conjunction with the accompanying drawings. Here, the exemplary embodiments of the present invention and their descriptions are used to explain the present invention, but are not intended to limit the present invention.

[0034] Figure 1 This is a schematic diagram of the principle of an existing infrared thermometer. The infrared thermometer includes an optical lens, a detector, a signal processing system, etc., which can measure the temperature of infrared objects. However, the current high-precision temperature measurement method mostly uses a temperature-segment calibration method to ignore or reduce the impact of changes in the transmittance of the infrared lens with temperature.

[0035] An embodiment of the present invention proposes a method for measuring the change of transmittance of an infrared optical lens / lens with temperature. After using this method to calculate the curve of the change of transmittance of the infrared lens / lens with temperature, the curve can be used to perform higher-precision temperature measurement calculations and reduce the workload during the factory temperature calibration of the infrared thermometer.

[0036] Figure 2 FIG. 1 is a schematic diagram of an infrared lens transmittance testing system according to an embodiment of the present invention. Figure 2 As shown, the system includes: a data acquisition module and a data calculation module.

[0037] Among them, the data acquisition module may include: infrared standard black body, detector equipment, lens fixing module, temperature measuring equipment, high temperature box, etc.

[0038] The optical window of the detector device is aligned with the infrared standard black body, and the detector device is used to detect the radiation emitted by the infrared standard black body and output a gray value signal;

[0039] The lens fixing module is used to install the optical lens to be tested and is set between the infrared standard black body and the detector device;

[0040] The high temperature box is used to bake the optical lens to be tested at a third temperature, and the temperature measuring device is used to measure multiple temperature values ​​of the optical lens to be tested baked in the high temperature box at preset time intervals.

[0041] The preset interval time points are, for example, multiple time points at intervals of 1 minute, 10 minutes, etc. after the optical lens to be tested is taken out of the high temperature box and installed in the lens fixing module. After the temperature of the optical lens to be tested drops to the ambient temperature and remains stable, stop measuring the temperature value of the optical lens to be tested and stop collecting the grayscale value signal output by the detector device.

[0042] Wherein, the gray value signal includes a first type of gray value, a second type of gray value, and a plurality of third type of gray values;

[0043] The first type of grayscale value and the second type of grayscale value are: when the optical lens to be tested is not installed in the lens fixing module, and the infrared standard black body is set at the ambient temperature and the second temperature respectively, the grayscale value signal output by the detector device; in the embodiment of the present invention, the third temperature is higher than the second temperature, and the second temperature is higher than the ambient temperature;

[0044] The third type of grayscale value is: when the optical lens to be tested is baked in a high-temperature box and installed in the lens fixing module, and the infrared standard black body is set at the ambient temperature, the detector device outputs the grayscale value signal at the preset interval time point.

[0045] The data calculation module is used to obtain a first-class grayscale value, a second-class grayscale value, multiple third-class grayscale values ​​and multiple temperature values; determine the gain and bias of the detector device according to the first-class grayscale value, the second-class grayscale value, the ambient temperature and the second temperature; the gain reflects the influence of temperature change on grayscale value change, and the bias can be determined according to the gain; determine multiple inferred temperatures of the detector device's response to an infrared standard black body according to multiple third-class grayscale values, gain and bias; use a preset formula, multiple inferred temperatures and multiple temperature values ​​to determine the transmittance of the optical lens to be tested at each temperature value, and the preset formula is established based on Planck's blackbody radiation law and Stefan-Boltzmann law.

[0046] The data calculation module may include a computer, which executes the above-mentioned functions of the data calculation module. The computer is connected to the detector device via a transmission cable, and can directly obtain the grayscale value signal detected by the detector device. The computer can obtain multiple temperature values ​​of the optical lens to be tested measured by the temperature measuring device through a wireless network or a wired network.

[0047] In one embodiment, the high temperature box is specifically used to: when the optical lens to be tested is baked at high temperature, keep it warm at the third temperature for a preset time. During implementation, the baking time in the high temperature box is set according to the actual conditions of the high temperature box and the lens.

[0048] In a specific embodiment, the temperature measuring device is a temperature measuring instrument such as a contact temperature measuring pen or a non-contact temperature measuring gun.

[0049] In one embodiment, the lens fixing module is arranged between the infrared standard black body and the detector device, on a side close to the infrared standard black body. When the optical lens to be tested is installed on the lens fixing module, the distance between the optical lens to be tested and the infrared standard black body is less than a first distance. The first distance indicates that the optical lens to be tested is close enough to the infrared standard black body. The first distance can be determined according to actual experiments.

[0050] A specific embodiment of the use of the data acquisition module is given below.

[0051] Step 1: Without the optical lens to be tested, align the light window of the detector device with the infrared standard black body at the closest distance;

[0052] Step 2: The infrared standard black body is adjusted to the ambient temperature (recorded as T1, for example, 20°C), and the AD (Analog Digital) grayscale value (recorded as Y1) of the current detector device response is recorded based on the computer;

[0053] Step 3: The infrared standard black body is adjusted to a temperature higher than the ambient temperature (recorded as T2, for example, 40°C), and the AD grayscale value of the current detector response is recorded based on the computer (recorded as Y2);

[0054] Step 4: Place the optical lens to be tested in a high temperature box. Set the temperature of the high temperature box to a temperature higher than T2 (recorded as T3, for example, 60°C). Keep the high temperature box at T3 for 1 hour.

[0055] Step 5: Set the infrared standard black body to T1. Take the optical lens to be tested out of the high temperature box and install it between the infrared standard black body and the detector. Keep the distance between the optical lens to be tested and the infrared standard black body close enough, but not touching.

[0056] Step 6: Use the temperature measuring device to measure the current temperature of the optical lens to be tested and record it (recorded as Tu1), and record the AD grayscale value of the detector device response at this time based on the computer (recorded as Z1);

[0057] Step 7: After 5 minutes, record the optical temperature to be measured and the AD grayscale value of the detector response again, and record them as Tu2 and Z2. Until the optical temperature to be measured returns to near room temperature, record them as Tu(i) and Z(i) (i=1, 2, 3...).

[0058] It should be noted that 20℃, 40℃ and 60℃ are indicative temperatures. In actual situations, the temperature should be redesigned based on the actual working conditions or the working conditions of the infrared thermometer.

[0059] Figure 3 FIG. 1 is a specific example diagram of an infrared lens transmittance testing system according to an embodiment of the present invention. Figure 3 As shown, the detector device may include a detector body and a processing circuit;

[0060] Among them, the light window of the detector body is aligned with the infrared standard black body, and the detector body is used to obtain the original signal responding to the infrared standard black body; the processing circuit is connected to the detector body, and the processing circuit is used to perform photoelectric signal processing on the original signal and output the gray value signal to the data calculation module.

[0061] refer to Figure 3 The system also includes a constant temperature device, which is used to dissipate heat for the detector body and the processing circuit. The constant temperature device can be a fan, an air conditioner, or a TEC (Thermo Electric Cooler) thermostat.

[0062] In the embodiment of the present invention, the optical lens to be tested includes a single-layer lens or a lens composed of multiple layers of lenses. Therefore, the embodiment of the present invention can be applied to engineering applications of multiple lenses, for example, after multiple lenses are cascaded into a whole system, the optical transmittance performance of the whole system is measured, which is convenient for the analysis of the improvement of the indicators of the whole system.

[0063] In the embodiment of the present invention, the optical lens to be measured may include a plane lens and a curved lens. In the prior art, the Fourier transform measurement method can only measure a plane lens, but not a curved lens. Compared with the prior art, the embodiment of the present invention has a wider application range.

[0064] An acquisition program is set in the data calculation module, and an acquisition time point is set according to a preset interval time point. The first type of grayscale value, the second type of grayscale value, multiple third type of grayscale values ​​and multiple temperature values ​​are obtained regularly through wired or wireless transmission, and stored in a local file. During implementation, the local file is read for calculation.

[0065] In one embodiment, the data calculation module is specifically used for:

[0066] The gain and bias of the detector device are determined according to the first grayscale value, the second grayscale value, the ambient temperature and the second temperature according to the following formula:

[0067] k = (T2-T1) / (Y2-Y1)

[0068] b=T1-k×Y1

[0069] In the formula, k is gain, b is bias, T1 is ambient temperature, T2 is second temperature, Y1 is first grayscale value, and Y2 is second grayscale value. A set of k and b determined by this formula can satisfy the mapping of original grayscale value "Z" to inferred temperature Tr.

[0070] Furthermore, the obtained k and b are used to calculate the estimated temperature Tr(i) (where i=1, 2, 3…) of the detector device in response to the infrared standard black body.

[0071] For example, the estimated temperature of the detector device for the infrared standard black body response is determined according to the third type gray value, gain and offset according to the following formula:

[0072] Tr=Z×k+b

[0073] Where Tr is the estimated temperature, Z is the third type gray value, k is the gain, and b is the bias.

[0074] Furthermore, Tr(i) and Tu(i) are used to calculate the transmittance Ta(i) of the optical lens to be tested at different temperatures.

[0075] For example, a preset formula is established in advance based on Planck's blackbody radiation law and Stefan-Boltzmann law. The Stefan-Boltzmann law describes the mathematical relationship between the total radiation energy of a standard radiator, the remaining energy after passing through a medium, and the loss energy of the medium. In specific implementation, the parameters in the preset formula are verified and determined through experiments. The preset formula can be expressed as follows:

[0076]

[0077] Where Ta is the transmittance of the optical lens to be tested at temperature Tu, ε is the emissivity of the infrared standard black body, for example, 0.98, Tr is the estimated temperature, Tu is the temperature value, n is a parameter, and n is determined according to the detector response band. For example, the value of n for the infrared medium-wave detector is 5, and the value of n for the infrared long-wave detector is 7.

[0078] In one embodiment, the data calculation module can also be used to generate a curve showing the transmittance of the optical lens to be tested changing with temperature. After obtaining the curve showing the transmittance of the optical lens to be tested changing with temperature, a higher precision temperature calculation can be performed. For example, the curve can be used to perform factory temperature calibration of an infrared thermometer, which includes the optical lens to be tested. This can greatly reduce the workload of the infrared thermometer during factory temperature calibration and reduce the number of temperature segment calibration segments.

[0079] The embodiment of the present invention also provides an infrared lens transmittance testing method using the above infrared lens transmittance testing system, as described in the following embodiment. Since the principle of solving the problem by this method is similar to that of the infrared lens transmittance testing system, the implementation of this method can refer to the implementation of the infrared lens transmittance testing system, and the repeated parts will not be repeated.

[0080] Figure 4 FIG. 1 is a flow chart of a method for testing transmittance of an infrared lens in an embodiment of the present invention. Figure 4 As shown, the method includes:

[0081] Step 401, obtaining a first type of grayscale value, a second type of grayscale value, a plurality of third type of grayscale values ​​and a plurality of temperature values;

[0082] Step 402, determining the gain and bias of the detector device according to the first type of grayscale value, the second type of grayscale value, the ambient temperature and the second temperature; the gain reflects the effect of temperature change on grayscale value change, and the bias is determined according to the gain;

[0083] Step 403, determining a plurality of estimated temperatures of the detector device in response to an infrared standard black body according to a plurality of third-category gray values, gains, and biases;

[0084] Step 404, using a preset formula, a plurality of estimated temperatures and a plurality of temperature values, to determine the transmittance of the optical lens to be tested at each temperature value, wherein the preset formula is established based on Planck's blackbody radiation law and the Stefan-Boltzmann law.

[0085] In one embodiment, step 402 may include:

[0086] The gain and bias of the detector device are determined according to the first grayscale value, the second grayscale value, the ambient temperature and the second temperature according to the following formula:

[0087] k = (T2-T1) / (Y2-Y1)

[0088] b=T1-k×Y1

[0089] Wherein, k is gain, b is bias, T1 is ambient temperature, T2 is second temperature, Y1 is first grayscale value, and Y2 is second grayscale value.

[0090] In one embodiment, step 403 may include:

[0091] The estimated temperature of the detector device's response to the infrared standard black body is determined based on the third-category gray value, gain, and bias according to the following formula:

[0092] Tr=Z×k+b

[0093] Where Tr is the estimated temperature, Z is the third type gray value, k is the gain, and b is the bias.

[0094] In one embodiment, the preset formula can be expressed as follows:

[0095]

[0096] Where Ta is the transmittance of the optical lens to be tested at temperature Tu, ε is the emissivity of the infrared standard black body, Tr is the estimated temperature, Tu is the temperature value, and n is a parameter determined according to the detector response band.

[0097] In one embodiment, after step 404, the method may further include:

[0098] A curve of the transmittance of the optical lens to be tested changing with temperature is generated, and the curve is used for factory temperature calibration of an infrared thermometer, wherein the infrared thermometer includes the optical lens to be tested.

[0099] The embodiment of the present invention also provides an infrared lens transmittance testing device using the above infrared lens transmittance testing system, as described in the following embodiment. Since the principle of solving the problem by the device is similar to that of the infrared lens transmittance testing method, the implementation of the device can refer to the implementation of the infrared lens transmittance testing method, and the repeated parts will not be repeated.

[0100] Figure 5 Schematic diagram of an infrared lens transmittance testing device according to an embodiment of the present invention. Figure 5 As shown, the device comprises:

[0101] A data acquisition module 501 is used to acquire a first type of grayscale value, a second type of grayscale value, a plurality of third type of grayscale values ​​and a plurality of temperature values;

[0102] A gain offset determination module 502, for determining the gain and offset of the detector device according to the first type of grayscale value, the second type of grayscale value, the ambient temperature and the second temperature; the gain reflects the effect of temperature change on grayscale value change, and the offset is determined according to the gain;

[0103] The estimated temperature determination module 503 is used to determine a plurality of estimated temperatures of the detector device in response to the infrared standard black body according to a plurality of third-category gray values, gain and bias;

[0104] The transmittance determination module 504 is used to determine the transmittance of the optical lens to be tested at each temperature value using a preset formula, multiple estimated temperatures and multiple temperature values. The preset formula is established based on Planck's blackbody radiation law and Stefan-Boltzmann law.

[0105] In one embodiment, the gain offset determination module 502 is specifically configured to:

[0106] The gain and bias of the detector device are determined according to the first grayscale value, the second grayscale value, the ambient temperature and the second temperature according to the following formula:

[0107] k = (T2-T1) / (Y2-Y1)

[0108] b=T1-k×Y1

[0109] Wherein, k is gain, b is bias, T1 is ambient temperature, T2 is second temperature, Y1 is first grayscale value, and Y2 is second grayscale value.

[0110] In one embodiment, the estimated temperature determination module 503 is specifically used to:

[0111] The estimated temperature of the detector device's response to the infrared standard black body is determined based on the third-category gray value, gain, and bias according to the following formula:

[0112] Tr=Z×k+b

[0113] Where Tr is the estimated temperature, Z is the third type gray value, k is the gain, and b is the bias.

[0114] In one embodiment, the preset formula can be expressed as follows:

[0115]

[0116] Where Ta is the transmittance of the optical lens to be tested at temperature Tu, ε is the emissivity of the infrared standard black body, Tr is the estimated temperature, Tu is the temperature value, and n is a parameter determined according to the detector response band.

[0117] In one embodiment, the device may further include:

[0118] The curve generating module is used to generate a curve showing the variation of the transmittance of the optical lens to be tested with temperature after the transmittance determining module 504 determines the transmittance of the optical lens to be tested at each temperature value using a preset formula, multiple estimated temperatures and multiple temperature values. The curve is used for the factory temperature calibration of the infrared thermometer, which includes the optical lens to be tested.

[0119] Figure 6 Schematic diagram of a computer device in an embodiment of the present invention. Figure 6 As shown, an embodiment of the present invention further provides a computer device 600, including a processor 601, a memory 602, and a computer program 603 stored in the memory 602 and executable on the processor 601, and the processor 601 implements the above-mentioned infrared lens transmittance test method when executing the computer program 603.

[0120] An embodiment of the present invention further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the above-mentioned infrared lens transmittance testing method is implemented.

[0121] An embodiment of the present invention further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the above-mentioned infrared lens transmittance testing method is implemented.

[0122] In the embodiment of the present invention, the infrared lens transmittance test system includes a data acquisition module and a data calculation module. The data acquisition module can perform high-temperature baking on the optical lens to be tested, and test the optical lens to be tested that has been baked in a high-temperature box, and measure a series of data, including lens temperature, the grayscale value of the detector's response to the optical lens to be tested and the optical lens not to be tested, etc., and during the test, the detector and the high-temperature box are respectively set with appropriate temperatures, and finally a series of valid data is obtained. The data calculation module uses a series of valid data to calculate gain, bias, estimated temperature, etc., and finally obtains the transmittance of the optical lens to be tested at each temperature value. Compared with the Fourier transform method in the prior art, the embodiment of the present invention avoids expensive equipment and reduces the cost of infrared lens transmittance testing. In addition, the embodiment of the present invention can adjust the temperature of the infrared lens to be tested to achieve transmittance testing of infrared lenses at different temperatures. The method is simple and efficient.

[0123] It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Furthermore, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0124] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0125] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0126] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0127] The specific embodiments described above further illustrate the objectives, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above description is only a specific embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. An infrared lens transmittance testing system, characterized in that: include: Data acquisition module, data calculation module; The data acquisition module includes: infrared standard black body, detector equipment, lens fixing module, temperature measuring equipment, and high temperature box; The light window of the detector device is aligned with the infrared standard black body, and the detector device is used to detect the radiation emitted by the infrared standard black body and output a gray value signal; the lens fixing module is used to install the optical lens to be tested, and is arranged between the infrared standard black body and the detector device; the high temperature box is used to bake the optical lens to be tested at a third temperature, and the temperature measuring device is used to measure multiple temperature values ​​of the optical lens to be tested baked in the high temperature box at preset interval time points; Wherein, the gray value signal includes a first type of gray value, a second type of gray value, and a plurality of third type of gray values; The first type of grayscale value and the second type of grayscale value are: when the optical lens to be tested is not installed in the lens fixing module, and the infrared standard black body is set at the ambient temperature and the second temperature respectively, the grayscale value signal output by the detector device; the third temperature is higher than the second temperature, and the second temperature is higher than the ambient temperature; The third type of grayscale value is: when the optical lens to be tested is baked in a high-temperature box and installed in the lens fixing module, and the infrared standard black body is set at the ambient temperature, the detector device outputs the grayscale value signal at the preset interval time point; The data calculation module is used to obtain a first-class grayscale value, a second-class grayscale value, multiple third-class grayscale values ​​and multiple temperature values; determine the gain and bias of the detector device according to the first-class grayscale value, the second-class grayscale value, the ambient temperature and the second temperature; the gain reflects the influence of temperature change on grayscale value change, and the bias is determined according to the gain; determine multiple inferred temperatures of the detector device's response to an infrared standard black body according to multiple third-class grayscale values, gain and bias; use a preset formula, multiple inferred temperatures and multiple temperature values ​​to determine the transmittance of the optical lens to be tested at each temperature value, and the preset formula is established based on Planck's blackbody radiation law and Stefan-Boltzmann law.

2. The infrared lens transmittance testing system according to claim 1, characterized in that: The detector device includes a detector body and a processing circuit; The optical window of the detector body is aligned with the infrared standard black body, and the detector body is used to obtain the original signal responding to the infrared standard black body; the processing circuit is connected to the detector body, and the processing circuit is used to perform photoelectric signal processing on the original signal and output a gray value signal; The system also includes a constant temperature device, which is used to dissipate heat for the detector body and the processing circuit.

3. The infrared lens transmittance testing system according to claim 1, characterized in that: The data calculation module is specifically used for: The gain and bias of the detector device are determined according to the first grayscale value, the second grayscale value, the ambient temperature and the second temperature according to the following formula: k = (T2-T1) / (Y2-Y1) b=T1-k×Y1 Wherein, k is gain, b is bias, T1 is ambient temperature, T2 is second temperature, Y1 is first grayscale value, and Y2 is second grayscale value.

4. The infrared lens transmittance testing system as claimed in claim 3, characterized in that: The data calculation module is specifically used for: The estimated temperature of the detector device's response to the infrared standard black body is determined based on the third-category gray value, gain, and bias according to the following formula: Tr=Z×k+b Where Tr is the estimated temperature, Z is the third type gray value, k is the gain, and b is the bias.

5. The infrared lens transmittance testing system as claimed in claim 3, characterized in that: The preset formula is as follows: ； Where Ta is the transmittance of the optical lens to be tested at temperature Tu, ε is the emissivity of the infrared standard black body, Tr is the estimated temperature, Tu is the temperature value, and n is a parameter determined according to the detector response band.

6. An infrared lens transmittance testing method using the infrared lens transmittance testing system according to any one of claims 1 to 5, characterized in that: include: Obtaining a first-category grayscale value, a second-category grayscale value, a plurality of third-category grayscale values, and a plurality of temperature values; Determine the gain and bias of the detector device according to the first type of grayscale value, the second type of grayscale value, the ambient temperature and the second temperature; the gain reflects the influence of temperature change on the change of grayscale value, and the bias is determined according to the gain; Determining a plurality of inferred temperatures of the detector device's response to an infrared standard black body based on a plurality of third-category grayscale values, a gain, and an offset; The transmittance of the optical lens to be tested at each temperature value is determined using a preset formula, multiple estimated temperatures and multiple temperature values, wherein the preset formula is established based on Planck's blackbody radiation law and Stefan-Boltzmann law.

7. An infrared lens transmittance testing device using the infrared lens transmittance testing system according to any one of claims 1 to 5, characterized in that: include: A data acquisition module, used for acquiring a first type of grayscale value, a second type of grayscale value, a plurality of third type of grayscale values ​​and a plurality of temperature values; A gain offset determination module, for determining a gain and an offset of a detector device according to a first type of grayscale value, a second type of grayscale value, an ambient temperature, and a second temperature; The gain reflects the influence of temperature change on gray value change, and the bias is determined according to the gain; An inferred temperature determination module, for determining a plurality of inferred temperatures of the detector device in response to an infrared standard black body according to a plurality of third-category grayscale values, gain and bias; The transmittance determination module is used to determine the transmittance of the optical lens to be tested at each temperature value using a preset formula, multiple estimated temperatures and multiple temperature values, wherein the preset formula is established based on Planck's blackbody radiation law and Stefan-Boltzmann law.

8. A computer device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the infrared lens transmittance testing method of claim 6 is implemented.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the infrared lens transmittance testing method of claim 6 is implemented.

10. A computer program product, characterized in that The computer program product includes a computer program, and when the computer program is executed by a processor, the infrared lens transmittance testing method according to claim 6 is implemented.

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