Oxygen sensor chip testing mechanism and testing equipment

Abstract

The present invention relates to the field of sensor testing technology, discloses an oxygen sensor chip testing mechanism, and discloses a test device having an oxygen sensor chip testing mechanism, including a bottom plate, a front fixing plate, a rear fixing plate, a carrier plate and a plurality of transfer structures, the front fixing plate and the rear fixing plate are both sleeved on the guide member on the bottom plate, the transfer structure includes a test plate, an external connection plate, a plurality of spring terminals and a plurality of probe assemblies, the spring terminals and the probe assemblies are electrically connected to the test machine in sequence, a plurality of test plates can be detachably arranged on the rear side of the front fixing plate and the front side of the rear fixing plate, a plurality of external connection plates can be detachably arranged on the front side of the front fixing plate and the rear side of the rear fixing plate, and a plurality of first jacks for limiting chips are arranged on the carrier plate. The test plate and the front fixing plate and the rear fixing plate, as well as the external connection plate and the front fixing plate and the rear fixing plate are all connected in a detachable manner, so that the effect of the transfer structure can be quickly replaced and repaired.

Description

Technical Field

[0001] The present invention relates to the technical field of sensor testing, and in particular to an oxygen sensor chip testing mechanism and testing equipment. Background Art

[0002] The definition of a sensor is a device or apparatus that can sense the specified measured quantity and convert it into a usable signal according to a certain rule. It is usually composed of a sensitive element and a conversion element. The sensor can sense the measured information and convert the sensed information into an electrical signal or other required form of information output according to a certain rule to meet the requirements of information transmission, processing, storage, display, recording and control. It is the primary link in realizing automatic detection and automatic control.

[0003] The oxygen sensor is a sensor that detects the oxygen content in the engine exhaust. It analyzes the combustion of the engine by detecting the oxygen content in the exhaust. The key components of the oxygen sensor include the chip. After the chip is manufactured, it is necessary to test whether the performance of the chip meets the standard before it can be used. The test equipment is connected (electrically connected) to multiple ports on both sides of the chip to test the chip's signal, resistance, and current. In the current testing institutions, multiple probes are generally placed vertically against multiple ports on both sides of the chip. During frequent testing, the probes are easily damaged and have a short lifespan. In addition, due to the complex structure of the fixed probe, it is not easy to replace and repair. The probe and the structure of the fixed probe need to be replaced as a whole, resulting in a waste of resources and increased costs. Summary of the invention

[0004] The present invention aims to solve at least one of the technical problems existing in the prior art. To this end, the present invention provides an oxygen sensor chip testing mechanism, which has a long service life and is easy to repair and replace.

[0005] The present invention also provides a testing device having the above oxygen sensor chip testing mechanism.

[0006] According to an embodiment of the first aspect of the present invention, an oxygen sensor chip testing mechanism comprises a base plate, a front fixing plate, a rear fixing plate, a carrier plate and a plurality of adapter structures, wherein a driving mechanism and a plurality of guide members with a front-to-back direction are provided on the base plate; the front fixing plate and the rear fixing plate are both sleeved on the guide members, and the front fixing plate and the rear fixing plate are both provided with a plurality of adapter structures, wherein the adapter structures comprise a test plate, an external connection plate, a plurality of spring terminals arranged on the test plate and a plurality of probe assemblies arranged on the external connection plate, one end of the plurality of spring terminals are respectively electrically connected to one end of the plurality of probe assemblies, and the other end of the plurality of probe assemblies is used for electrical connection to the test machine, and the plurality of test plates can be detachably connected. The plurality of external connection plates are separately arranged on the rear side surface of the front fixing plate and the front side surface of the rear fixing plate, and the plurality of external connection plates can be detachably arranged on the front side surface of the front fixing plate and the rear side surface of the rear fixing plate; the carrier plate is arranged across the front fixing plate and the rear fixing plate, and the carrier plate is provided with a plurality of first sockets for limiting the chip, and the first sockets correspond to the area between the front fixing plate and the rear fixing plate, so that the port of the chip is located below the carrier plate and in the area between the front fixing plate and the rear fixing plate, and the driving mechanism is used to drive the front fixing plate and the rear fixing plate to open and close, so that the spring terminals on the front and rear test boards are electrically connected to the ports on the front and rear sides of the chip respectively.

[0007] At least the following beneficial effects are achieved:

[0008] When the driving mechanism drives the front fixing plate and the rear fixing plate to approach each other, the spring terminals on the front and rear test plates are electrically connected to the ports on the front and rear sides of the chip respectively, and the spring terminals are electrically connected to the test machine through the probe assembly, and the test machine can test the performance of the chip. When the performance test of the chip is completed, the front fixing plate and the rear fixing plate are separated from each other, and the spring terminals on the front and rear test plates are separated from the chip, so that the chip can be easily removed. Since the front fixing plate, the rear fixing plate and the bottom plate are connected by the guide member, the front fixing plate and the rear fixing plate can be easily installed on the bottom plate, and the front fixing plate and the rear fixing plate can also be easily removed from the bottom plate. And because the spring terminal is arranged on the test board and the probe assembly is arranged on the external connection board, the test board and the front fixing plate / the rear fixing plate are connected in a detachable manner, and the external connection board and the front fixing plate / the rear fixing plate are connected in a detachable manner, the spring terminal can be quickly replaced and repaired by disassembling and assembling the test board, and the probe assembly can be quickly replaced and repaired by disassembling and assembling the external connection board, thereby achieving the effect of being able to quickly replace and repair the adapter structure.

[0009] According to some embodiments of the present invention, the front fixing plate and the rear fixing plate are both provided with a plurality of first avoidance holes, and the first avoidance holes are used for allowing one end of the spring terminal and one end of the probe assembly to extend therein, so as to electrically connect one end of the spring terminal and one end of the probe assembly.

[0010] According to some embodiments of the present invention, a positioning rib is provided on the lower surface of the carrier board, and the positioning rib is inserted between the front fixing plate and the rear fixing plate. The positioning rib is provided with a through hole in the area corresponding to the first plug hole, and the through hole passes through the front and rear side surfaces of the positioning rib and is connected to the first plug hole. The bottom wall of the through hole is used to support the lower end surface of the chip so that the ports on the front and rear side surfaces of the chip are exposed and can be respectively connected to the spring terminals on the front and rear test boards.

[0011] According to some embodiments of the present invention, the left and right ends of the front fixing plate and the rear fixing plate are provided with protruding stops, the left end surface of the carrier plate abuts against the two protruding stops on the left, and the right end surface of the carrier plate abuts against the two protruding stops on the right, so as to limit the left and right positions of the carrier plate.

[0012] According to some embodiments of the present invention, an elastic pad is provided on the carrier board, a plurality of second holes are opened on the elastic pad, the plurality of second holes and the plurality of first holes are arranged in one-to-one correspondence, and the second holes and the first holes are used for allowing the chip to pass through in sequence to limit the chip.

[0013] According to some embodiments of the present invention, several of the guide members are arranged on the base plate through a left support plate, and several of the guide members are arranged on the base plate through a right support plate, the left support plate supports the left ends of the front fixed plate and the rear fixed plate, and the right support plate supports the right ends of the front fixed plate and the rear fixed plate.

[0014] According to some embodiments of the present invention, the driving mechanism includes a linear driving mechanism and a driving block, the driving block is provided with two front-to-rear symmetrical inclined surfaces, the front fixed plate and the rear fixed plate are both provided with rotating wheels with axial directions in the left and right directions, the two rotating wheels are respectively against the two inclined surfaces, the linear driving mechanism is connected to the base plate, the output end of the linear driving mechanism is connected to the driving block, and the linear driving mechanism drives the driving block to rise and fall, so that the driving block drives the front fixed plate and the rear fixed plate to move away from each other.

[0015] According to some embodiments of the present invention, the spring terminal includes a connecting part, a contact part, a folding part and two limiting parts, the connecting part is used to be connected to the test board, the upper end of the connecting part is connected to the upper end of the contact part, the contact part gradually moves away from the connecting part from top to bottom, the lower end of the contact part is connected to one end of the folding part, guide blocks are provided on the left and right sides of the other end of the folding part, the two limiting parts are provided on the left and right sides of the lower end of the connecting part, the two limiting parts are provided with guide holes whose length direction is the up and down direction, and the two guide blocks are respectively passed through the two guide holes.

[0016] According to some embodiments of the present invention, it also includes a lifting drive mechanism and a sealing cover, the output end of the lifting drive mechanism is connected to the sealing cover, the sealing cover cooperates with the carrier plate to form a sealed cavity for accommodating the chip, and the sealing cover is provided with a joint, which is used to transport protective gas into the cavity.

[0017] The testing device according to the second aspect of the present invention comprises an oxygen sensor chip testing mechanism according to the first aspect of the present invention, and also comprises a frame and a testing machine, wherein the oxygen sensor chip testing mechanism and the testing machine are both arranged on the frame, and the other ends of the plurality of probe assemblies are electrically connected to the testing machine.

[0018] At least the following beneficial effects are achieved:

[0019] The testing device has all the beneficial effects brought by the oxygen sensor chip testing mechanism of the above embodiment, which will not be described again.

[0020] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] The present invention will be further described below with reference to the accompanying drawings and embodiments, wherein:

[0022] Figure 1 It is a structural schematic diagram of an embodiment of the present invention;

[0023] Figure 2 This is a schematic diagram of the structure of an embodiment of the present invention after the U-shaped bracket, the lifting drive mechanism and the sealing cover are hidden;

[0024] Figure 3 It is a structural schematic diagram of a carrier plate, an elastic pad, a front fixing plate, a rear fixing plate, a guide member and a transition structure according to an embodiment of the present invention;

[0025] Figure 4 It is a schematic diagram of the exploded structure of the rear fixing plate and the transition structure of an embodiment of the present invention;

[0026] Figure 5 A schematic diagram of the structure of a spring terminal according to an embodiment of the present invention;

[0027] Figure Number:

[0028] Chip 10;

[0029] Front fixing plate 100;

[0030] Rear fixing plate 200; first avoidance hole 210; positioning column 220; rotating wheel 230; convex stop 240;

[0031] Adaptation structure 300; test board 310; spring terminal 320; connection portion 321; contact portion 322; folding portion 323; stopper portion 324; guide block 325; guide hole 326; external connection plate 330; probe assembly 340; adapter plate 350; electrode 351; mounting plate 360;

[0032] Carrier 400; first plug hole 410; positioning rib plate 420; through hole 421; elastic pad 430; second plug hole 431; limiting groove 440;

[0033] Bottom plate 500; left support plate 510; right support plate 520; guide member 530; third fastener 531; fourth fastener 532; U-shaped bracket 540;

[0034] Linear drive mechanism 600; T-block 610;

[0035] Driving block 700; inclined surface 710;

[0036] Lifting drive mechanism 800;

[0037] Sealing cover 900. DETAILED DESCRIPTION

[0038] Embodiments of the present invention are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0039] In the description of the present invention, it should be understood that descriptions involving orientations, such as up, down, front, back, left, right, etc., and orientations or positional relationships indicated are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0040] In the description of the present invention, "a plurality" means more than two. If there is a description of "first" or "second", it is only used for the purpose of distinguishing technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.

[0041] In the description of the present invention, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in the present invention based on the specific content of the technical solution.

[0042] It can be known that the chip 10 is in a plate shape, and has a front side and a rear side. The lower ends of the front side and the rear side of the chip 10 are both provided with a plurality of ports.

[0043] Reference Figures 1 to 4 The present invention discloses an oxygen sensor chip testing mechanism, including a base plate 500 , a front fixing plate 100 , a rear fixing plate 200 , a carrier plate 400 and a plurality of transfer structures 300 .

[0044] A driving mechanism and a plurality of guide members 530 with the guiding direction being the front-to-back direction are provided on the bottom plate 500; the front fixing plate 100 and the rear fixing plate 200 are both mounted on the guide members 530, so that the front fixing plate 100 and the rear fixing plate 200 can both move along the front-to-back direction on the bottom plate 500, the front fixing plate 100 and the rear fixing plate 200 can approach each other or move away from each other, a plurality of adapter structures 300 are provided on the front fixing plate 100 and the rear fixing plate 200, when the front fixing plate 100 and the rear fixing plate 200 can approach each other, the adapter structure 300 on the front fixing plate 100 and the adapter structure 300 on the rear fixing plate 200 respectively abut against the ports on the front and rear sides of the same chip 10, the adapter structure 300 is used to electrically connect the ports of the chip 10 and the test machine, so that the test machine can test the performance of the chip 10.

[0045] The adapter structure 300 includes a test board 310, an external connection board 330, a plurality of spring terminals 320 arranged on the test board 310 and a plurality of probe assemblies 340 arranged on the external connection board 330, one end of the plurality of spring terminals 320 is electrically connected to one end of the plurality of probe assemblies 340 respectively, the other end of the plurality of probe assemblies 340 is used to be electrically connected to the test machine, the other end of the plurality of spring terminals 320 is used to rest on the port of the chip 10, the plurality of test boards 310 can be detachably arranged on the rear side surface of the front fixed plate 100 and the front side surface of the rear fixed plate 200, the plurality of external connection plates 330 can be detachably arranged on the front side surface of the front fixed plate 100 and the rear side surface of the rear fixed plate 200, the front fixed plate 100 drives the spring terminals 320 and the probe assemblies 340 thereon to move in the front-to-back direction, and the rear fixed plate 200 drives the spring terminals 320 and the probe assemblies 340 thereon to move in the front-to-back direction.

[0046] The carrier plate 400 is arranged across the front fixing plate 100 and the rear fixing plate 200. The carrier plate 400 is provided with a plurality of first plug holes 410 for limiting the chip 10, and the first plug holes 410 correspond to the area between the front fixing plate 100 and the rear fixing plate 200, so that the port of the chip 10 is located below the carrier plate 400 and in the area between the front fixing plate 100 and the rear fixing plate 200, and the spring-type terminals 320 on the front fixing plate 100 and the spring-type terminals 320 on the rear fixing plate 200 are distributed front and back. The front fixing plate 100 and the rear fixing plate 200 play the role of supporting the carrier plate 400, and the carrier plate 400 plays the role of supporting and limiting the chip 10.

[0047] The driving mechanism is used to drive the front fixing plate 100 and the rear fixing plate 200 to open and close, that is, to drive the front fixing plate 100 and the rear fixing plate 200 to move away from each other, and to drive the front fixing plate 100 and the rear fixing plate 200 to move closer to each other. When the front fixing plate 100 and the rear fixing plate 200 move closer to each other, the spring terminal 320 on the front test board 310 is electrically connected to the port on the front side of the chip 10, and the spring terminal 320 on the rear test board 310 is electrically connected to the port on the rear side of the chip 10. The spring terminal 320 is electrically connected to the test machine through the probe assembly 340, and the test machine can test the performance of the chip 10. When the performance test of the chip 10 is completed, the front fixing plate 100 and the rear fixing plate 200 move away from each other, and the spring terminals 320 on the front and rear test boards 310 are detached from the chip 10, so that the chip 10 can be easily removed.

[0048] The spring terminal 320 is electrically connected to the port of the chip 10, and elastic deformation occurs in the spring terminal 320. During the contact between the port of the chip 10 and the spring terminal 320, the contact area between the port of the chip 10 and the spring terminal 320 gradually increases, so that the impact between the spring terminal 320 and the chip 10 is very small, thereby ensuring the service life of the spring terminal 320 and the reliability of the contact between the port of the chip 10 and the spring terminal 320.

[0049] Since the front fixing plate 100, the rear fixing plate 200 and the bottom plate 500 are connected by the guide member 530, the front fixing plate 100 and the rear fixing plate 200 can be conveniently installed on the bottom plate 500, and the front fixing plate 100 and the rear fixing plate 200 can also be conveniently removed from the bottom plate 500. In addition, since the spring terminal 320 is arranged on the test plate 310, and the probe assembly 340 is arranged on the external connection plate 330, the test plate 310 and the front fixing plate 100 / the rear fixing plate 200 are connected in a detachable manner, and the external connection plate 330 and the front fixing plate 100 / the rear fixing plate 200 are connected in a detachable manner, the spring terminal 320 can be quickly replaced and repaired by disassembling the test plate 310, and the probe assembly 340 can be quickly replaced and repaired by disassembling the external connection plate 330, thereby achieving the effect of being able to quickly replace and repair the transfer structure / oxygen sensor chip test mechanism.

[0050] Reference Figure 4 , the number of the spring terminals 320 on the transfer structure 300 is equal to the number of the probe assemblies 340 on the external connection plate 330. In this embodiment, the number of the spring terminals 320 on the transfer structure 300 is three.

[0051] It can be understood that the spring terminal 320 has an inclined contact area, the contact area of ​​the spring terminal 320 on the front fixing plate 100 is inclined forward, and the contact area of ​​the spring terminal 320 on the rear fixing plate 200 is inclined backward, and the front and rear contact areas form an angle, and the opening of the angle faces upward. When the chip 10 moves from top to bottom, the lower end of the chip 10 opens two contact areas distributed in the front and rear, and never makes the front and rear spring terminals 320 respectively abut against the ports on the front and rear sides of the chip 10.

[0052] The spring terminal 320 is connected to the front fixing plate 100 / rear fixing plate 200 through the test board 310, and the probe assembly 340 is connected to the front fixing plate 100 / rear fixing plate 200 through the external connection plate 330. The test board 310 and multiple spring terminals 320 are part of the adapter structure 300, and the external connection plate 330 and multiple probe assemblies 340 are another part of the adapter structure 300. The test board 310 and the external connection plate 330 are split structures.

[0053] The test plate 310 is connected to the rear side of the front fixing plate 100 / the front side of the rear fixing plate 200 through a plurality of first fasteners, and the external connection plate 330 is connected to the front side of the front fixing plate 100 / the rear side of the rear fixing plate 200 through a plurality of second fasteners. The first fastener is a first screw or a first screw, and the second fastener is a second screw or a second screw.

[0054] Reference Figure 4The transfer structure 300 further includes a mounting plate 360. The mounting plate 360 ​​and the external connection plate 330 are both provided with mounting holes. The second fastener passes through the mounting holes of the mounting plate 360 ​​and the mounting holes of the external connection plate 330 in sequence, and then is threadedly connected with the front fixing plate 100 / rear fixing plate 200. The mounting plate 360 ​​presses the external connection plate 330 onto the front fixing plate 100 / rear fixing plate 200.

[0055] In some of the embodiments, a plurality of first avoidance holes 210 are provided on the front fixing plate 100 and the rear fixing plate 200, and the first avoidance holes 210 are used for allowing one end of the spring terminal 320 and one end of the probe assembly 340 to extend therein, so that one end of the spring terminal 320 and one end of the probe assembly 340 are electrically connected.

[0056] The setting of the first avoidance hole 210 makes the connection path between one end of the spring terminal 320 and one end of the probe assembly 340 the shortest, and the connection mechanism between one end of the spring terminal 320 and one end of the probe assembly 340 is accommodated in the first avoidance hole 210.

[0057] Reference Figure 4 The adapter structure 300 further includes an adapter plate 350 , on which a plurality of electrodes 351 are disposed, and one end of the spring terminal 320 and one end of the probe assembly 340 are electrically connected via the electrode 351 .

[0058] The electrode 351 penetrates the front and rear sides of the adapter plate 350. The distribution position of the electrode 351 near the spring terminal 320 is the same as the distribution position of the corresponding spring terminal 320. The distribution position of the electrode 351 near the probe assembly 340 is adapted to the distribution position of the probe assembly 340. The distribution mode of the probe assembly 340 can be one vertical column, one horizontal column, and multiple vertical and horizontal columns. The setting of the adapter plate 350 and the electrode 351 can realize the diversified setting of the position of the probe assembly 340, thereby facilitating the wiring to electrically connect the probe assembly 340 and the test machine.

[0059] In this embodiment, three spring terminals 320 are disposed on the test board 310 . The three spring terminals 320 on the test board 310 are distributed in a triangle, and the three probe assemblies 340 on the external connection board 330 are distributed in a vertical column.

[0060] Reference Figure 4 A plurality of positioning posts 220 are provided on the front fixing plate 100 and the rear fixing plate 200. The positioning posts 220 penetrate the front fixing plate 100 / the rear fixing plate 200, and extend to the front and rear of the front fixing plate 100 / the front and rear of the rear fixing plate 200. Positioning holes are provided on the test plate 310 and the external connecting plate 330. Through the cooperation of the positioning posts 220 and the positioning holes, the test plate 310 and the external connecting plate 330 can be quickly positioned and installed, thereby ensuring the installation accuracy of the test plate 310 and the external connecting plate 330.

[0061] Reference Figure 3 In some of the embodiments, a positioning rib 420 is provided on the lower surface of the carrier 400, and the positioning rib 420 is inserted between the front fixing plate 100 and the rear fixing plate 200. A through hole 421 is provided on the positioning rib 420 in an area corresponding to the first plug hole 410. The through hole 421 passes through the front and rear side surfaces of the positioning rib 420, and the through hole 421 is connected to the first plug hole 410. The lower part of the side wall of the through hole 421 is the bottom wall, and the chip 10 can be inserted into the first plug hole 410 and the through hole 421 in sequence from top to bottom until the lower end surface of the chip 10 abuts against the bottom wall of the through hole 421.

[0062] The bottom wall of the through hole 421 is used to hold up the lower end surface of the chip 10. At this time, the lower end of the chip 10 is in the through hole 421, so that the ports on the front and rear sides of the chip 10 are exposed. When the carrier 400 is placed on the front fixing plate 100 and the rear fixing plate 200, and the positioning rib plate 420 is inserted between the front fixing plate 100 and the rear fixing plate 200, the positions of the ports on the front and rear sides of the chip 10 correspond to the positions of the spring terminals 320 on the front and rear test boards 310, and the ports on the front and rear sides of the chip 10 are connected to the spring terminals 320 on the front and rear test boards 310, respectively.

[0063] There are two ways to load the chip 10. The first is to first insert the lower end of the chip 10 into the first plug hole 410 and the through hole 421 of the carrier 400, and then insert the positioning rib plate 420 into the area between the front fixing plate 100 and the rear fixing plate 200 until the carrier 400 rests on the front fixing plate 100 and the rear fixing plate 200; the second is to first insert the positioning rib plate 420 into the area between the front fixing plate 100 and the rear fixing plate 200, the carrier 400 rests on the front fixing plate 100 and the rear fixing plate 200, and then insert the lower end of the chip 10 into the first plug hole 410 and the through hole 421 of the carrier 400.

[0064] It can be imagined that the positioning rib plate 420 is arranged on the lower surface of the carrier plate 400, and the carrier plate 400 and the positioning rib plate 420 are both symmetrical structures in the front and rear directions, and the symmetric plane of the carrier plate 400 and the symmetric plane of the positioning rib plate 420 are on the same vertical plane. The positioning rib plate 420 divides the lower surface of the carrier plate 400 into a front part and a rear part, and the front part and the rear part are respectively used to abut against the upper surface of the front fixing plate 100 and the upper surface of the rear fixing plate 200. The positioning rib plate 420 and the carrier plate 400 adopt an integrally formed structure.

[0065] The thickness of the positioning rib 420 in the front-to-back direction is greater than or equal to the thickness of the chip 10 , so that the chip 10 is completely received in the through hole 421 , thereby preventing the chip 10 from being damaged by the front fixing plate 100 and the rear fixing plate 200 .

[0066] When the oxygen sensor chip test mechanism is working, the front fixing plate 100 and the rear fixing plate 200 can be driven to approach each other first, and then the chip 10 can be inserted from top to bottom between the front and rear spring terminals 320. The process of the chip 10 moving down is also the process of the front and rear spring terminals 320 being stretched open. Alternatively, the port of the chip 10 can be moved down to the area relative to the front and rear spring terminals 320, and then the front fixing plate 100 and the rear fixing plate 200 can be driven to approach each other. The process of driving the front fixing plate 100 and the rear fixing plate 200 to approach each other is also the process of the front and rear spring terminals 320 approaching each other and abutting against the port of the chip 10.

[0067] Reference Figures 2 to 4 In some embodiments, the left and right ends of the front fixing plate 100 and the rear fixing plate 200 are both provided with convex stops 240, the left end surface of the carrier plate 400 abuts against the two convex stops 240 on the left, and the right end surface of the carrier plate 400 abuts against the two convex stops 240 on the right, and the four convex stops 240 limit the left and right positions of the carrier plate 400. When the carrier plate 400 is placed on the front fixing plate 100 and the rear fixing plate 200 and the lower end of the chip 10 is in the through hole 421, that is, when the chip 10 is loaded, it can ensure that the front and rear spring terminals 320 are aligned with the left and right positions of the ports on the front and rear sides of the chip 10, and the spring terminals 320 just abut against the ports of the chip 10.

[0068] Reference Figure 2 and Figure 4 In some of the embodiments, an elastic pad 430 is provided on the carrier 400, and a plurality of second holes 431 are opened on the elastic pad 430. The plurality of second holes 431 and the plurality of first holes 410 are arranged in one-to-one correspondence, and the second holes 431 and the first holes 410 are used for allowing the chip 10 to pass through in sequence to limit the chip 10.

[0069] The elastic pad 430 itself has elastic deformation, which makes it easy for the lower end of the chip 10 to pass through the second hole 431. The side wall of the second hole 431 will not scratch or damage the chip 10. When the chip 10 is inserted into the second hole 431, the side wall of the second hole 431 can be stably wrapped around the chip 10, thereby stabilizing the chip 10.

[0070] It is conceivable that the cross section of the first plug hole 410 is larger than the cross section of the chip 10 , and the cross section of the first plug hole 410 is larger than the cross section of the second plug hole 431 , and the second plug hole 431 is interference fit with the chip 10 .

[0071] The cross section of the first plug hole 410 is larger than the cross section of the chip 10. When the chip 10 passes through the first plug hole 410, the side wall of the first plug hole 410 can avoid scratching or bruising the chip 10. The chip 10 is clamped and stabilized by the side wall of the second plug hole 431, that is, by the elastic pad 430, and the chip 10 can deflect in the first plug hole 410. When the spring terminal 320 is against the port of the chip 10, the chip 10 is subjected to a reaction force, and the chip 10 will deflect to a certain extent. Since the chip 10 is clamped and stabilized by the elastic pad 430, the chip 10 can deflect in the first plug hole 410, and the chip 10 can be prevented from being bruised by the force of the spring terminal 320.

[0072] Reference Figure 3 The upper surface of the carrier 400 is provided with a limiting groove 440, and the elastic pad 430 is arranged in the limiting groove 440. The limiting groove 440 plays a role in limiting the elastic pad 430 on the carrier 400. The first plug hole 410 is opened at the bottom of the limiting groove 440. The elastic pad 430 is made of silicone material.

[0073] Reference Figure 2 and Figure 3 In some embodiments, a plurality of guide members 530 are disposed on the bottom plate 500 through a left support plate 510, and a plurality of guide members 530 are disposed on the bottom plate 500 through a right support plate 520. The left support plate 510 supports the left ends of the front fixing plate 100 and the rear fixing plate 200, and the right support plate 520 supports the right ends of the front fixing plate 100 and the rear fixing plate 200. The left support plate 510 and the right support plate 520 play the role of supporting the guide members 530, the front fixing plate 100, and the rear fixing plate 200.

[0074] There are two left support plates 510 and two right support plates 520. The two left support plates 510 are arranged at the left end of the bottom plate 500, and the two left support plates 510 are distributed one after the other. The two right support plates 520 are arranged at the right end of the bottom plate 500, and the two right support plates 520 are distributed one after the other.

[0075] The guide member 530 is a guide rod. Two first guide holes are arranged vertically on the two left support plates 510. The axial directions of all the first guide holes are in the front-to-back direction. The four first guide holes are located on two vertically distributed straight lines. The left end of the front fixing plate 100 and the left end of the rear fixing plate 200 are arranged with two second guide holes distributed vertically. The rear ends of the two guide rods are arranged with first flanges. The front fixing plate 100 is sleeved on the two guide rods through the two second guide holes, and the rear fixing plate 200 is sleeved on the two guide rods through the two second guide holes. The first flange abuts against the rear side surface of the left support plate 510 at the rear, the front end surfaces of the two guide rods are connected with the third fastener 531, the third fastener 531 abuts against the front side surface of the left support plate 510 at the front, the first flange and the third fastener 531 define the guide rods on the two left support plates 510, the two guide rods support the left end of the front fixing plate 100 and the left end of the rear fixing plate 200, and the front fixing plate 100 and the rear fixing plate 200 can move in the front and rear directions on the two guide rods.

[0076] The third fastener 531 is a third screw or a third screw. By installing and removing the third fastener 531, the guide rod, the front fixing plate 100 and the rear fixing plate 200 can be easily and quickly installed on the two left support plates 510, and the guide rod, the front fixing plate 100 and the rear fixing plate 200 can be removed from the two left support plates 510.

[0077] Two third guide holes distributed vertically are provided on the two right support plates 520, and the axial directions of all the third guide holes are in the front-to-back direction. The four third guide holes are located on two straight lines distributed vertically. The right end of the front fixing plate 100 and the right end of the rear fixing plate 200 are provided with two fourth guide holes distributed vertically. The rear ends of the other two guide rods are provided with second flanges. The front fixing plate 100 is sleeved on the other two guide rods through the two fourth guide holes, and the rear fixing plate 200 is sleeved on the other two guide rods through the two fourth guide holes. The second flanges abut against the rear side surface of the right support plate 520 at the rear, and the front end surfaces of the other two guide rods are connected to the fourth fastener 532. The fourth fastener 532 abuts against the front side surface of the right support plate 520 at the front. The second flange and the fourth fastener 532 define the other guide rods on the two right support plates 520. The other two guide rods support the right left end of the front fixing plate 100 and the right end of the rear fixing plate 200, and the front fixing plate 100 and the rear fixing plate 200 can move in the front and rear directions on the other two guide rods.

[0078] The fourth fastener 532 is a fourth screw or a fourth screw. By installing and removing the fourth fastener 532, the guide rod, the front fixing plate 100 and the rear fixing plate 200 can be easily and quickly installed on the two right support plates 520, and the guide rod, the front fixing plate 100 and the rear fixing plate 200 can be removed from the two right support plates 520.

[0079] Reference Figure 2 In some embodiments, the driving mechanism includes a linear driving mechanism 600 and a driving block 700. The driving block 700 is provided with two front-to-back symmetrical inclined surfaces 710. The front fixing plate 100 and the rear fixing plate 200 are both provided with rotating wheels 230 with the axial direction being left and right. The two rotating wheels 230 can only move along the front-to-back direction with the front fixing plate 100 and the rear fixing plate 200 respectively. The two rotating wheels 230 are respectively against the two inclined surfaces 710. The linear driving mechanism 600 is connected to the bottom plate 500. The output end of the linear driving mechanism 600 is connected to the driving block 700. The linear driving mechanism 600 drives the driving block 700 to rise and fall. The two inclined surfaces 710 push the two rotating wheels 230. Since the front fixing plate 100, the rear fixing plate 200 and the two rotating wheels 230 can only move along the front-to-back direction, the driving block 700 will drive the two rotating wheels 230 to move forward and backward respectively. The two rotating wheels 230 make the front fixing plate 100 and the rear fixing plate 200 move away from each other.

[0080] It is understandable that an elastic member is provided between the front fixing plate 100 and the rear fixing plate 200. In the initial state, the elastic member forces the front fixing plate 100 and the rear fixing plate 200 to move away from each other. The elastic member is an outer spring, and the spring is sleeved on the guide member 530. The two ends of the spring are respectively against the rear side surface of the front fixing plate 100 and the front side surface of the rear fixing plate 200.

[0081] Reference Figure 2 The driving block 700 is U-shaped, and the two inclined surfaces 710 are the two inner walls of the driving block 700. The opening of the angle formed by the two inclined surfaces 710 faces upward. A T-shaped hole is provided on the lower surface of the driving block 700. The T-shaped hole penetrates the left and right sides of the driving block 700. The output end of the linear driving mechanism 600 is connected to the T-shaped block 610. The T-shaped block 610 can be inserted into the T-shaped hole in the left and right directions, thereby realizing the connection between the output end of the linear driving mechanism 600 and the driving block 700.

[0082] There are two linear drive mechanisms 600 and two drive blocks 700, and the two linear drive mechanisms 600 and the two drive blocks 700 are matched one by one. One drive block 700 is arranged between the two left support plates 510, and the left end surfaces of the front fixing plate 100 and the rear fixing plate 200 are both provided with a rotating wheel 230, and the two inclined surfaces 710 of one drive block 700 are respectively in contact with the rotating wheel 230 on the left end surface of the front fixing plate 100 and the rotating wheel 230 on the left end surface of the rear fixing plate 200. Another drive block 700 is arranged between the two right support plates 520, and the right end surfaces of the front fixing plate 100 and the rear fixing plate 200 are both provided with a rotating wheel 230, and the two inclined surfaces 710 of the other drive block 700 are respectively in contact with the rotating wheel 230 on the right end surface of the front fixing plate 100 and the rotating wheel 230 on the right end surface of the rear fixing plate 200.

[0083] The right side surface of the right support plate 520 at the front is connected to the limiting plate through the fifth fastener, and the limiting plate is connected to the right side surface of the right support plate 520 at the rear through another fifth fastener, and the two right support plates 520 and the limiting plate form a guide cavity for guiding the lifting and lowering of the driving block 700. Similarly, the left side surface of the left support plate 510 at the front is connected to another limiting plate through the sixth fastener, and the other limiting plate is connected to the left side surface of the left support plate 510 at the rear through another sixth fastener, and the two left support plates 510 and the other limiting plate form another guide cavity for guiding the lifting and lowering of another driving block 700.

[0084] The linear drive mechanism 600 is a cylinder. A second avoidance hole is provided on the bottom plate 500, and the second avoidance hole penetrates the upper and lower surfaces of the bottom plate 500. The cylinder is arranged below the bottom plate 500, and the piston rod of the cylinder is the output end, and the piston rod of the cylinder is passed through the second avoidance hole and connected to the T-shaped block 610.

[0085] The bottom plate 500 is provided with a third avoidance hole in the area corresponding to the front fixing plate 100 and the rear fixing plate 200. The other ends of the plurality of probe assemblies 340 are electrically connected to the test machine through a wire harness, and the third avoidance hole allows the wire harness to pass through.

[0086] Reference Figure 5 In some embodiments, the spring terminal 320 includes a connecting portion 321, a contact portion 322, a folding portion 323 and two limiting portions 324. The connecting portion 321 is used to connect to the test board 310. The upper end of the connecting portion 321 is connected to the upper end of the contact portion 322. The contact portion 322 gradually moves away from the connecting portion 321 from top to bottom. The lower end of the contact portion 322 is connected to one end of the folding portion 323. Guide blocks 325 are provided on the left and right sides of the other end of the folding portion 323. The two limiting portions 324 are respectively arranged on the left and right sides of the lower end of the connecting portion 321. The two limiting portions 324 are provided with guide holes 326 whose length direction is the up and down direction. The two guide blocks 325 are respectively penetrated through the two guide holes 326.

[0087] When the contact portion 322 abuts against the port of the chip 10, the chip 10 will push the contact portion 322 to undergo elastic deformation and move closer to the connecting portion 321. The folding portion 323 drives the guide block 325 to slide in the guide hole 326. The setting of the guide block 325 and the guide hole 326 serves to guide the contact portion 322 and the folding portion 323 to deform closer to or away from the connecting portion 321, which is beneficial to ensuring the stability of the overall shape of the spring terminal 320.

[0088] It can be understood that the upper end of the connecting portion 321 is connected to the upper end of the contact portion 322 through the first bend, the lower end of the contact portion 322 is connected to one end of the folding portion 323 through the second bend, and reinforcing ribs are provided on the contact portion 322 and the second bend.

[0089] Reference Figure 1 In some of the embodiments, the oxygen sensor chip testing mechanism further includes a lifting drive mechanism 800 and a sealing cover 900. The output end of the lifting drive mechanism 800 is connected to the sealing cover 900. The sealing cover 900 cooperates with the carrier plate 400 to form a sealed cavity for accommodating the chip 10. The sealing cover 900 is provided with a connector for delivering protective gas to the cavity.

[0090] A U-shaped bracket 540 is provided on the bottom plate 500, and a lifting drive mechanism 800 is provided on the U-shaped bracket 540. The output end of the lifting drive mechanism 800 faces and is connected to the sealing cover 900, and the cover opening of the sealing cover 900 faces downward. The lifting drive mechanism 800 drives the sealing cover 900 to rise and fall. When the lifting drive mechanism 800 drives the sealing cover 900 to descend, the sealing cover 900 abuts against the carrier plate 400 / elastic pad 430, thereby forming a sealed cavity. The lifting drive mechanism 800 is also a cylinder.

[0091] The present invention discloses a testing device, including a frame, a testing machine and the above-mentioned oxygen sensor chip testing mechanism, all of which are arranged on the frame. The other ends of the plurality of probe assemblies 340 are electrically connected to the testing machine.

[0092] The testing device has all the beneficial effects brought by the oxygen sensor chip testing mechanism of the above embodiment, which will not be described again.

[0093] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0094] Of course, the present invention is not limited to the above-mentioned embodiments, and those skilled in the art may make equivalent modifications or substitutions without violating the spirit of the present invention, and these equivalent modifications or substitutions are all included in the scope defined by the claims of this application.

Claims

1. An oxygen sensor chip testing mechanism, characterized in that: include: A bottom plate (500) is provided with a driving mechanism and a plurality of guide members (530) whose guiding directions are front-to-back directions; A front fixing plate (100) and a rear fixing plate (200), wherein the front fixing plate (100) and the rear fixing plate (200) are both sleeved on the guide member (530), and the front fixing plate (100) and the rear fixing plate (200) are both provided with a plurality of transition structures (300), wherein the transition structures (300) include a test plate (310), an external connection plate (330), a plurality of spring terminals (320) provided on the test plate (310), and a plurality of probe assemblies (320) provided on the external connection plate (330). 40), one end of the plurality of spring terminals (320) is electrically connected to one end of the plurality of probe assemblies (340) respectively, the other end of the plurality of probe assemblies (340) is used to be electrically connected to a test machine, the plurality of test boards (310) are detachably arranged on the rear side of the front fixing plate (100) and the front side of the rear fixing plate (200), and the plurality of external connection plates (330) are detachably arranged on the front side of the front fixing plate (100) and the rear side of the rear fixing plate (200); a carrier plate (400), the carrier plate (400) being arranged across the front fixing plate (100) and the rear fixing plate (200), the carrier plate (400) being provided with a plurality of first plug holes (410) for limiting the chip (10), and the first plug holes (410) corresponding to the area between the front fixing plate (100) and the rear fixing plate (200), so that the port of the chip (10) is located below the carrier plate (400) and in the area between the front fixing plate (100) and the rear fixing plate (200), and the driving mechanism is used to drive the front fixing plate (100) and the rear fixing plate (200) to open and close, so that the spring terminals (320) on the front and rear test plates (310) are respectively electrically connected to the ports on the front and rear side surfaces of the chip (10); The front fixing plate (100) and the rear fixing plate (200) are both provided with a plurality of first avoidance holes (210), wherein the first avoidance holes (210) are used for allowing one end of the spring terminal (320) and one end of the probe assembly (340) to extend therein, so that one end of the spring terminal (320) and one end of the probe assembly (340) are electrically connected; A positioning rib plate (420) is provided on the lower surface of the carrier plate (400), and the positioning rib plate (420) is inserted between the front fixing plate (100) and the rear fixing plate (200). A through hole (421) is provided on the positioning rib plate (420) in an area corresponding to the first plug hole (410). The through hole (421) passes through the front and rear side surfaces of the positioning rib plate (420) and is connected to the first plug hole (410). The bottom wall of the through hole (421) is used to support the lower portion of the chip (10). end surfaces, so that the ports on the front and rear side surfaces of the chip (10) are exposed and can respectively dock with the spring terminals (320) on the front and rear test boards (310), the left and right ends of the front fixing plate (100) and the rear fixing plate (200) are both provided with convex stops (240), the left end surface of the carrier plate (400) abuts against the two convex stops (240) on the left, and the right end surface of the carrier plate (400) abuts against the two convex stops (240) on the right, so as to limit the left and right positions of the carrier plate (400); The spring terminal (320) comprises a connecting portion (321), a contact portion (322), a folding portion (323) and two limiting portions (324); the connecting portion (321) is used to connect to the test board (310); the upper end of the connecting portion (321) is connected to the upper end of the contact portion (322); the contact portion (322) gradually moves away from the connecting portion (321) from top to bottom; the lower end of the contact portion (322) is connected to one end of the folding portion (323); guide blocks (325) are provided on the left and right sides of the other end of the folding portion (323); the two limiting portions (324) are respectively provided on the left and right sides of the lower end of the connecting portion (321); the two limiting portions (324) are provided with guide holes (326) whose length direction is in the up-down direction; and the two guide blocks (325) are respectively penetrated through the two guide holes (326).

2. The oxygen sensor chip testing mechanism according to claim 1, characterized in that: An elastic pad (430) is provided on the carrier board (400), and a plurality of second plug holes (431) are provided on the elastic pad (430). The plurality of second plug holes (431) and the plurality of first plug holes (410) are arranged in a one-to-one correspondence, and the second plug holes (431) and the first plug holes (410) are used for allowing the chip (10) to pass through in sequence to limit the chip (10).

3. The oxygen sensor chip testing mechanism according to claim 1, characterized in that: A plurality of the guide members (530) are arranged on the bottom plate (500) via a left support plate (510), and a plurality of the guide members (530) are arranged on the bottom plate (500) via a right support plate (520). The left support plate (510) supports the left ends of the front fixing plate (100) and the rear fixing plate (200), and the right support plate (520) supports the right ends of the front fixing plate (100) and the rear fixing plate (200).

4. An oxygen sensor chip testing mechanism according to claim 1 or 3, characterized in that: The driving mechanism comprises a linear driving mechanism (600) and a driving block (700); the driving block (700) is provided with two front-to-rear symmetrical inclined surfaces (710); the front fixing plate (100) and the rear fixing plate (200) are both provided with rotating wheels (230) with axial directions in the left-right direction; the two rotating wheels (230) respectively abut against the two inclined surfaces (710); the linear driving mechanism (600) is connected to the bottom plate (500); the output end of the linear driving mechanism (600) is connected to the driving block (700); the linear driving mechanism (600) drives the driving block (700) to rise and fall, so that the driving block (700) drives the front fixing plate (100) and the rear fixing plate (200) to move away from each other.

5. The oxygen sensor chip testing mechanism according to claim 1, characterized in that: It also includes a lifting drive mechanism (800) and a sealing cover (900), wherein the output end of the lifting drive mechanism (800) is connected to the sealing cover (900), and the sealing cover (900) cooperates with the carrier plate (400) to form a cavity for sealingly accommodating the chip (10), and a joint is provided on the sealing cover (900), and the joint is used to transport protective gas into the cavity.

6. Testing equipment, characterized in that, It includes a rack and a test machine and a According to the oxygen sensor chip testing mechanism according to any one of claims 1 to 5, the other ends of the plurality of probe assemblies (340) are electrically connected to the testing machine.

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