Control method, device, electronic equipment and test instrument for optical signal acquisition

Abstract

The present application belongs to the field of display panel testing and specifically discloses a control method, device, electronic device, and test instrument for optical signal acquisition. The method includes: controlling a first current integration conversion circuit to operate in an integration state during an integration period in a first sampling cycle, and controlling a second current integration conversion circuit to operate in an integration state during another integration period in the first sampling cycle; controlling the first current integration conversion circuit to operate in a conversion state during a conversion period in the first sampling cycle, and controlling the second current integration conversion circuit to operate in a conversion state during another conversion period in the first sampling cycle, wherein the duration of the integration period is shorter than the duration of the conversion period. By separating the integration period and the conversion period, the present application can avoid limiting the maximum measurable current value from the time required for analog-to-digital conversion, and by shortening the duration of the integration period, improve the range of the display panel test instrument.

Description

Technical Field

[0001] The present application belongs to the field of display panel testing, and more specifically, relates to a control method, device, electronic equipment and testing instrument for optical signal acquisition. Background Art

[0002] Organic Light-Emitting Diodes (OLED) screens, as a display panel, have been widely used in communications, computers, industry and other fields due to their excellent image quality, response speed, energy saving and plasticity.

[0003] As technology evolves, higher requirements are placed on display panels (such as OLED screens), requiring better performance in key indicators such as brightness, contrast, color accuracy, color saturation, color temperature, response time, viewing angle, and uniformity. Therefore, display panel test instruments need to have a wide test range, highly precise measurement capabilities, and fast response speeds to ensure a comprehensive and accurate evaluation of screen performance. Improving the measurement range of display panel test instruments is a technical problem that urgently needs to be solved in this field. Summary of the Invention

[0004] In view of the shortcomings of the prior art, the purpose of this application is to improve the measuring range of a display panel test instrument.

[0005] To achieve the above objectives, in a first aspect, the present application provides a control method for optical signal acquisition, comprising:

[0006] During an integration period in the first sampling cycle, the first current integration conversion circuit is controlled to operate in an integration state, and during another integration period in the first sampling cycle, the second current integration conversion circuit is controlled to operate in an integration state;

[0007] During a conversion period in the first sampling cycle, the first current integration conversion circuit is controlled to operate in a conversion state, and during another conversion period in the first sampling cycle, the second current integration conversion circuit is controlled to operate in a conversion state;

[0008] The first sampling period includes two adjacent integration periods and two adjacent conversion periods. The integration period is located before the conversion period. The duration of the integration period is shorter than the duration of the conversion period. The current integration conversion circuit is used to collect optical signals.

[0009] In a possible implementation, the method further includes:

[0010] A current sampling result of a first sampling period is determined based on a first current sampling value provided by the first current integration conversion circuit and a second current sampling value provided by the second current integration conversion circuit.

[0011] In one possible implementation, determining a current sampling result of a first sampling period includes:

[0012] A current sampling result is determined by calculating a current sampling mean based on the first current sampling value and the second current sampling value.

[0013] In a possible implementation, the current sampling result of the first sampling period includes a first current sampling value and a second current sampling value.

[0014] In a possible implementation, the method further includes:

[0015] Determining the size between the photocurrent and the test range corresponding to the second sampling period, the second sampling period includes a first integral conversion period and a second integral conversion period, the duration of the first integral conversion period is equal to the duration of the second integral conversion period, during the first integral conversion period, the first current integral conversion circuit operates in an integrating state, and the second current integral conversion circuit operates in a converting state, and during the second integral conversion period, the second current integral conversion circuit operates in an integrating state, and the first current integral conversion circuit operates in a converting state;

[0016] If the photocurrent is greater than or equal to the test range corresponding to the second sampling period, it is determined to use the first sampling period for current sampling;

[0017] If the photocurrent is less than the test range corresponding to the second sampling period, it is determined that the second sampling period is used for current sampling.

[0018] In a possible implementation, the method further includes:

[0019] For the periodic optical signal, N rounds of current sampling are performed to obtain the current sampling results corresponding to each round. Each round of current sampling adopts the first sampling period. The angles of the sampling points in different rounds in the polar coordinate system are different. The number of rounds N is a positive integer.

[0020] In a possible implementation, the method further includes:

[0021] The number of rounds N is determined based on the sampling rate and the frequency of the periodic optical signal.

[0022] In a second aspect, the present application provides a control device for optical signal acquisition, comprising:

[0023] a first control module, configured to control the first current integration conversion circuit to operate in an integration state during an integration period in a first sampling cycle, and to control the second current integration conversion circuit to operate in an integration state during another integration period in the first sampling cycle;

[0024] a second control module, configured to control the first current integration conversion circuit to operate in a conversion state during a conversion period in the first sampling cycle, and to control the second current integration conversion circuit to operate in a conversion state during another conversion period in the first sampling cycle;

[0025] The first sampling period includes two adjacent integration periods and two adjacent conversion periods. The integration period is located before the conversion period. The duration of the integration period is shorter than the duration of the conversion period. The current integration conversion circuit is used to collect optical signals.

[0026] In a third aspect, the present application provides an electronic device comprising: at least one memory for storing programs; and at least one processor for executing the programs stored in the memory. When the program stored in the memory is executed, the processor is used to execute the method described in the first aspect or any possible implementation of the first aspect.

[0027] In a fourth aspect, the present application provides a display panel testing instrument, comprising: a first current integration conversion circuit, a second current integration conversion circuit and a controller, wherein the controller applies the method described in the first aspect or any possible implementation of the first aspect.

[0028] In general, the above technical solutions conceived by this application have the following beneficial effects compared with the existing technologies:

[0029] (1) In the non-equal interval sampling mode, by separating the integration period and the conversion period, the maximum measurable current can be prevented from being limited by the time required for analog-to-digital conversion. By shortening the duration of the integration period, the maximum measurable current can be effectively increased, thereby improving the range of the display panel test instrument and supporting the acquisition of light signals from high-brightness display panels (such as OLED screens).

[0030] (2) According to the size between the photocurrent and the test range corresponding to the second sampling period (equally spaced sampling period), the sampling rate and test range are adaptively adjusted. The sampling rate is reduced in exchange for a wider test range, or the test range is shortened in exchange for a higher sampling rate, which can effectively improve the test flexibility of the instrument.

[0031] (3) Through multiple rounds of current sampling, current sampling results corresponding to multiple sampling points are obtained. Different sampling points have different angles in the polar coordinate system, and different sampling points correspond to light signals at different times within a cycle (the cycle of the light signal). Therefore, using the current sampling results corresponding to multiple sampling points, it is possible to more completely characterize (restore) high-frequency periodic light signals and collect and restore light signals for high-brightness and high-frequency display panels (such as OLED screens). BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1 This is a schematic diagram of optical signal acquisition through a current integration conversion circuit provided by an embodiment of the present application;

[0033] Figure 2 This is a schematic diagram of optical signal acquisition using two current integration conversion circuits provided in an embodiment of the present application;

[0034] Figure 3 This is a schematic diagram of the sampling principle of the equally spaced sampling mode provided in an embodiment of the present application;

[0035] Figure 4 1 is a flow chart of a control method for optical signal acquisition provided in an embodiment of the present application;

[0036] Figure 5 This is one of the sampling principle diagrams of the non-uniformly spaced sampling mode provided in the embodiment of the present application;

[0037] Figure 6 This is the second schematic diagram of the sampling principle of the non-uniformly spaced sampling mode provided in the embodiment of the present application;

[0038] Figure 7 This is one of the schematic diagrams of the sampling principle of multiple rounds of current sampling provided in the embodiments of the present application;

[0039] Figure 8 This is the second schematic diagram of the sampling principle of multiple rounds of current sampling provided in an embodiment of the present application;

[0040] Figure 9 Schematic diagram of the structure of the control device for optical signal acquisition provided in an embodiment of the present application;

[0041] Figure 10 It is a structural diagram of an electronic device provided in an embodiment of the present application.

[0042] Throughout the drawings, the same reference numerals are used to denote the same elements or structures, wherein:

[0043] 10: Photoelectric sensor; 20: Current integration conversion circuit; 21: Integration switch; 22: Integration circuit; 221: Integration capacitor; 222: Operational amplifier; 23: Conversion switch; 24: Conversion circuit; 30: First control module; 40: Second control module. DETAILED DESCRIPTION

[0044] In order to facilitate a clearer understanding of the various embodiments of the present application, some relevant background knowledge is first introduced as follows.

[0045] Typically, when testing a display panel (such as an OLED screen), the panel's light signal first passes through an optical system and is converted into a current signal by a photosensor. This photocurrent is then measured, completing the display panel's screen test. The photocurrent detection analog front-end circuit is based on a current-integrating circuit, with a capacitive transimpedance amplifier (C-TIA) as its core circuit.

[0046] Figure 1 FIG is a schematic diagram of collecting optical signals through a current integration conversion circuit provided in an embodiment of the present application, such as Figure 1 As shown, a photoelectric sensor 10 is provided before the current integration conversion circuit 20 . The photoelectric sensor 10 converts a light signal into a current signal and inputs the current signal into the current integration conversion circuit 20 . The current integration conversion circuit 20 performs integration conversion on the received current signal.

[0047] like Figure 1 As shown, the current integration conversion circuit 20 includes an integration switch 21, an integration circuit 22, a conversion switch 23, and a conversion circuit 24. The integration circuit 22 includes an integration capacitor 221 and an operational amplifier 222.

[0048] When the circuit is working, it will be in two states: integration (int) and conversion (conv). When in the integration state, the integration switch (S int ) is turned on, the switch (S conv ) is disconnected. Photocurrent (I) is the capacitance (C int ) integration, so that the capacitor voltage changes, the integration time (T int ), the capacitance voltage change (ΔV), the accumulated charge (ΔQ) and the photocurrent to be measured are shown in the following formula.

[0049]

[0050] After integration is complete, the integration switch is turned off and the transfer switch is turned on, placing the instrument in the conversion state. The change in capacitor voltage is measured (converted to a digital signal) by the conversion circuit, and combined with the integration time and integration capacitance, photocurrent measurement is achieved. It should be understood that the conversion state described here includes the capacitor voltage analog-to-digital conversion (A / D Convert), capacitor discharge reset (Reset), and standby mode (Wait) for the next round of integration.

[0051] Figure 2 Schematic diagram of optical signal acquisition by two current integration conversion circuits provided in an embodiment of the present application, such as Figure 2As shown, the current output end of the photoelectric sensor is connected to two current integration conversion circuits, namely the first current integration conversion circuit (abbreviated as A circuit) and the second current integration conversion circuit (abbreviated as B circuit).

[0052] In order to ensure the continuous measurement of photocurrent, the instrument is designed to contain two identical structures, A and B. Figure 2 When channel A is operating in the integration mode, channel B is performing voltage conversion. Conversely, when channel A is performing voltage conversion, channel B is operating in the current integration mode. This mode is called the instrument's equal-interval sampling mode.

[0053] Figure 3 This is a schematic diagram of the sampling principle of the equal-interval sampling mode provided in the embodiment of the present application. The test effect and control timing of the equal-interval sampling mode are as follows: Figure 3 As shown in the figure, P1-P6 are sampling points. An equally spaced sampling period (i.e., the second sampling period) includes a first integral conversion period and a second integral conversion period, and the duration of these two periods is equal. During the first integral conversion period, channel A operates in the integrating state and channel B operates in the converting state. During the second integral conversion period, channel B operates in the integrating state and channel A operates in the converting state.

[0054] When the integral capacitance and the reference voltage (maximum integral voltage) are determined, there is an upper limit to the maximum integral charge. In the equally spaced sampling mode, the time length of the integration process and the conversion process is the same. In the integral conversion process of the current integral conversion circuit, the duration required for analog-to-digital conversion is the longest. Since the minimum conversion duration is limited by the duration required for analog-to-digital conversion, the integral duration is limited by the conversion duration. In the case where the maximum integral charge is determined, the maximum measurable current value depends on the minimum integral duration. It can be seen that in the equally spaced sampling mode, the maximum measurable current value (range) is limited by the duration required for analog-to-digital conversion. This is described with specific numerical values, and it should be understood that the data cited here are only for explanation and are not intended to limit this application.

[0055] Assume that the integrating capacitor C int The minimum conversion time (conversion time T in equal interval sampling mode) is 100pF. conv and integral time T int equal) is 400μs, the maximum measurable voltage ΔV max If the voltage is 4V, the maximum charge and maximum current are derived as shown in the following formula. int,min Indicates the minimum integration time, I max Indicates the maximum measurable current.

[0056]

[0057] It can be seen that when the brightness of the display panel increases, the photocurrent signal will exceed this limit.

[0058] To overcome the above-mentioned drawbacks, the present application provides a control method, device, electronic device, and test instrument for optical signal acquisition. To ensure that the integration time is no longer limited by the conversion time, the control sequence separates the integration period and the conversion period. This means that the integration duration is no longer limited by the conversion duration, thus preventing the maximum measurable current from being limited by the duration required for analog-to-digital conversion. Specifically, two short-time integrations are performed based on the range requirements, followed by a long-time digital-to-analog conversion, which is non-equally spaced sampling. This state is called the non-equally spaced sampling operating mode of the instrument, and can increase the photocurrent test range.

[0059] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0060] In the specification and claims herein, the terms "first" and "second" are used to distinguish different objects, rather than to describe a specific order of objects. For example, the terms "first sampling period" and "second sampling period" are used to distinguish different sampling periods, rather than to describe a specific order of sampling periods.

[0061] In the embodiments of this application, words such as "exemplary" or "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of this application should not be interpreted as being preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary" or "for example" is intended to present the relevant concepts in a concrete manner.

[0062] In the description of the embodiments of the present application, unless otherwise specified, "multiple" means two or more, for example, multiple processing units means two or more processing units, etc.; multiple elements means two or more elements, etc.

[0063] The embodiments of the present application are described below in conjunction with the drawings in the embodiments of the present application.

[0064] Figure 4 FIG. 1 is a flow chart of a control method for optical signal acquisition provided in an embodiment of the present application. Figure 4 As shown, the method includes the following steps S101 and S102.

[0065] In step S101, during an integration period in the first sampling cycle, the first current integration conversion circuit is controlled to operate in an integration state (at this time, path B is in a stopped working state, that is, the integration switch and the transfer switch of path B are both disconnected), and during another integration period in the first sampling cycle, the second current integration conversion circuit is controlled to operate in an integration state (here, path A is in a stopped working state, that is, the integration switch and the transfer switch of path A are both disconnected).

[0066] Step S102 , controlling the first current integration conversion circuit to operate in a conversion state during a conversion period in the first sampling cycle, and controlling the second current integration conversion circuit to operate in a conversion state during another conversion period in the first sampling cycle.

[0067] Among them, the first sampling period includes two adjacent integration periods and two adjacent conversion periods. The integration period is located before the conversion period, and the length of the integration period is less than the length of the conversion period. The current integration conversion circuit is used to collect the optical signal (integrate and convert the current corresponding to the optical signal to obtain the current sampling value).

[0068] Specifically, the process of the current integration conversion circuit (the first current integration conversion circuit or the second current integration conversion circuit) collecting the optical signal includes: integrating the current corresponding to the optical signal in the integration state to obtain a voltage change, and performing analog-to-digital conversion on the voltage change in the conversion state to obtain a current sampling value.

[0069] The duration of the integration period in the first sampling cycle is not equal to the duration of the conversion period. The sampling method using the first sampling cycle can be called a non-uniform sampling mode.

[0070] The first sampling period includes two adjacent integration periods and two adjacent conversion periods, where the two adjacent integration periods are located before the two adjacent conversion periods. Of the two adjacent integration periods, the preceding integration period may be referred to as the first integration period, and the succeeding integration period may be referred to as the second integration period. Of the two adjacent conversion periods, the preceding conversion period may be referred to as the first conversion period, and the succeeding conversion period may be referred to as the second conversion period.

[0071] During the first integration period of the first sampling cycle, the first current integrating conversion circuit is controlled to operate in an integrating state, and during the second integration period of the first sampling cycle, the second current integrating conversion circuit is controlled to operate in an integrating state. Furthermore, during the first conversion period of the first sampling cycle, the first current integrating conversion circuit is controlled to operate in a converting state, and during the second conversion period of the first sampling cycle, the second current integrating conversion circuit is controlled to operate in a converting state. After the conversion is completed, the current sampling value provided by the first current integrating conversion circuit and the current sampling value provided by the second current integrating conversion circuit can be obtained. By combining the current sampling values ​​provided by the two current integrating conversion circuits, optical signals can be collected.

[0072] It can be understood that in the equal-interval sampling mode, the integration period of one current integration conversion circuit coincides with the conversion period of another current integration conversion circuit, and the time length required for the integration process of the current integration conversion circuit is equal to the time length required for the conversion process of the current integration conversion circuit (including the duration of analog-to-digital conversion). In the integration conversion process of the current integration conversion circuit, the duration required for analog-to-digital conversion is the longest. Since the minimum conversion duration is limited by the duration required for analog-to-digital conversion, the integration duration is limited by the conversion duration. In the case where the maximum integrated charge is determined, the maximum measurable current value depends on the minimum integration duration. It can be seen that in the equal-interval sampling mode, the maximum measurable current value (range) is limited by the duration required for analog-to-digital conversion.

[0073] The first sampling period provided in the embodiment of the present application includes two adjacent integration periods and two adjacent conversion periods, wherein the integration period precedes the conversion period and the duration of the integration period is shorter than the duration of the conversion period. In the non-uniform sampling mode, by separating the integration period and the conversion period, it is possible to avoid the maximum measurable current being limited by the duration required for analog-to-digital conversion, and by shortening the duration of the integration period, it is possible to effectively increase the maximum measurable current, thereby increasing the range of the display panel test instrument and supporting the acquisition of optical signals from high-brightness display panels (such as OLED screens).

[0074] In a possible implementation, the method further includes:

[0075] A current sampling result of a first sampling period is determined based on a first current sampling value provided by the first current integration conversion circuit and a second current sampling value provided by the second current integration conversion circuit.

[0076] In a possible implementation, determining the current sampling result of the first sampling period includes:

[0077] A current sampling result is determined by calculating a current sampling mean based on the first current sampling value and the second current sampling value.

[0078] It is understood that in this implementation, the average of the current samples of channels A and B is used as the current sampling result for a sampling cycle. During a sampling cycle, a current sampling result corresponding to a sampling point can be obtained. This sampling point can be the optical signal at a specified time. The specified time can be the end time of the first integration period or the start time of the second integration period. By calculating the average of the two current sampling values ​​to determine the current sampling result, random errors can be reduced and the accuracy of the current sampling result can be improved.

[0079] Figure 5 This is one of the sampling principle diagrams of the non-uniformly spaced sampling mode provided in the embodiment of the present application, such as Figure 5 As shown, P1 is a sampling point. A non-uniform sampling period (i.e., the first sampling period) includes: a first integration period, a second integration period, a first conversion period, and a second conversion period. The duration of the integration period is not equal to the duration of the conversion period, and the duration of the integration period is less than the duration of the conversion period. Figure 5 As shown, the current sampling average of channel A and channel B is used as the current sampling result of a sampling period. P1 can be the optical signal at a specified time, and the specified time can be the end time of the first integration period or the start time of the second integration period.

[0080] In a possible implementation, the current sampling result of the first sampling period includes a first current sampling value and a second current sampling value.

[0081] It is understandable that in this implementation, the current sampling values ​​of channel A and channel B are used as current sampling results. In one sampling cycle, current sampling results corresponding to two sampling points can be obtained. One sampling point can be the optical signal at the middle moment of the first integration period, and the other sampling point can be the optical signal at the middle moment of the second integration period. Compared with the above-mentioned implementation method of calculating the average, this implementation method can improve sampling efficiency.

[0082] Figure 6 This is the second schematic diagram of the sampling principle of the non-uniformly spaced sampling mode provided in the embodiment of the present application, such as Figure 6 As shown in , P1 and P2 are two sampling points. Figure 6 As shown, the current sampling values ​​of path A and path B are respectively used as current sampling results, P1 may be the optical signal at the middle moment of the first integration period, and P2 may be the optical signal at the middle moment of the second integration period.

[0083] In a possible implementation, the method further includes:

[0084] Determine the size between the photocurrent (the current sampling result of the most recent sampling period can be determined as the photocurrent) and the test range corresponding to the second sampling period, the second sampling period includes a first integral conversion period and a second integral conversion period, the length of the first integral conversion period is equal to the length of the second integral conversion period, during the first integral conversion period, the first current integral conversion circuit operates in an integral state, and the second current integral conversion circuit operates in a conversion state, and during the second integral conversion period, the second current integral conversion circuit operates in an integral state, and the first current integral conversion circuit operates in a conversion state;

[0085] If the photocurrent is greater than or equal to the test range corresponding to the second sampling period, it is determined to use the first sampling period for current sampling;

[0086] If the photocurrent is less than the test range corresponding to the second sampling period, it is determined that the second sampling period is used for current sampling.

[0087] It can be understood that the second sampling period includes a first integral conversion period and a second integral conversion period, the length of the first integral conversion period is equal to the length of the second integral conversion period, in the first integral conversion period the first current integral conversion circuit operates in an integral state, and the second current integral conversion circuit operates in a conversion state, in the second integral conversion period the second current integral conversion circuit operates in an integral state, and the first current integral conversion circuit operates in a conversion state, therefore, in the second sampling period, the length of the integral period of the current integral conversion circuit is equal to the length of the conversion period of the current integral conversion circuit, and the method of sampling using the second sampling period can be called an equal-interval sampling mode.

[0088] As previously mentioned, the maximum measurable current (range) in the equal-interval sampling mode is limited by the time required for analog-to-digital conversion. The current range in the equal-interval sampling mode, i.e., the test range corresponding to the second sampling period, can be determined based on the required analog-to-digital conversion time. The test range corresponding to the first sampling period is wider than the test range corresponding to the second sampling period, while the sampling rate for sampling using the first sampling period is lower than the sampling rate for sampling using the second sampling period.

[0089] If the photocurrent is greater than or equal to the test range corresponding to the second sampling period, it indicates that the test range corresponding to the second sampling period cannot adapt to the current photocurrent. In this case, it can be determined to use the first sampling period for current sampling.

[0090] If the photocurrent is smaller than the test range corresponding to the second sampling period, it indicates that the test range corresponding to the second sampling period can adapt to the current photocurrent. In this case, the second sampling period is determined to be used for current sampling, and a higher sampling rate is maintained.

[0091] For example, for OLED screen testing, when the OLED brightness does not exceed the instrument's normal range, the instrument uses a conventional equidistant sampling mode to complete the OLED signal measurement. When the OLED brightness exceeds the instrument's range, the instrument is operated in a non-equidistant sampling mode by adjusting the control timing. At this time, the circuit integration time is less than the conversion time limit, thereby increasing the instrument's range. When the frequency of the OLED signal to be measured is higher than the instrument's sampling rate, multiple rounds of current sampling are used, and high-frequency periodic signal restoration is completed based on equivalent time sampling (multiple rounds of sampling results can effectively restore high-frequency periodic signals).

[0092] Therefore, the sampling rate and test range can be adaptively adjusted according to the size between the photocurrent and the test range corresponding to the second sampling period. The sampling rate can be reduced in exchange for a wider test range, or the test range can be shortened in exchange for a higher sampling rate, which can effectively improve the test flexibility of the instrument.

[0093] It is worth noting that when the instrument is in non-equally spaced sampling mode, the total sampling period (the sum of two short-time integrations and two long-time conversion times) is greater than that in the equally spaced sampling mode. Therefore, the non-equally spaced sampling mode will reduce the sampling rate of the instrument. In order to support the acquisition and restoration of optical signals for high-frequency display panels in non-equally spaced sampling mode, this application also proposes a data acquisition and processing method based on equivalent time sampling, which restores high-frequency periodic signals through multiple rounds of testing. Equivalent time sampling means that the sampling results of multiple rounds of testing can effectively restore high-frequency periodic signals. The implementation method of multiple rounds of testing is described below.

[0094] In a possible implementation, the method further includes:

[0095] For the periodic optical signal, N rounds of current sampling are performed to obtain the current sampling results corresponding to each round. Each round of current sampling adopts the first sampling period. The angles of the sampling points in different rounds in the polar coordinate system are different. The number of rounds N is a positive integer.

[0096] For example, when the frequency of the periodic optical signal is relatively low (for example, the frequency of the periodic optical signal is lower than the sampling rate), if the sampling requirements can be met by one round of current sampling (the sampling points obtained by one round of current sampling can represent the periodic optical signal), then one round of current sampling can be performed using a first sampling period (in this case, N=1). The current sampling process of one round can be a continuous multiple first sampling periods (generally, the total duration of the multiple first sampling periods is shorter than the duration of one period of the optical signal). After multiple first sampling periods, current sampling results corresponding to multiple sampling points can be obtained. Different sampling points have different angles in the polar coordinate system, and different sampling points correspond to optical signals at different times within one period (the period of the optical signal). Therefore, using the current sampling results corresponding to multiple sampling points, the periodic optical signal with a relatively low frequency can be more completely characterized (restored).

[0097] For example, when the frequency of the periodic optical signal is high (for example, the frequency of the periodic optical signal is higher than the sampling rate), if one round of current sampling cannot meet the sampling requirements (the sampling points obtained by one round of current sampling cannot fully represent the periodic optical signal), then multiple rounds of current sampling can be performed using a first sampling period (in this case, N>1). One round of current sampling process can be a first sampling period or multiple consecutive first sampling periods, and the angles of the sampling points in different rounds in the polar coordinate system are controlled to be different (to avoid repeated sampling between different rounds). After multiple rounds of current sampling, current sampling results corresponding to multiple sampling points can be obtained. The angles of different sampling points in the polar coordinate system are different, and different sampling points correspond to optical signals at different times within one period (the period of the optical signal). Therefore, using the current sampling results corresponding to multiple sampling points, it is possible to more completely characterize (restore) the periodic optical signal with a higher frequency, and it is possible to collect and restore the optical signal for a high-brightness and high-frequency display panel (for example, an OLED screen).

[0098] In order to ensure that the angles of sampling points in different rounds are different in the polar coordinate system, the current sampling of the next round can be started after a specified delay after the current sampling of one round is completed.

[0099] Figure 7 This is one of the schematic diagrams of the sampling principle of multiple rounds of current sampling provided in the embodiment of the present application, such as Figure 7 As shown, P1-P6 are 6 sampling points. Taking three rounds of data acquisition as an example, the process of restoring high-frequency periodic signals by adjusting the control clock is described. For conventional photocurrent signals, the equal interval sampling mode can be used directly for sampling. Figure 7 When the photocurrent is greater than the test range of the equal interval sampling mode, the instrument enters the non-equal interval sampling mode, such as Figure 7 As shown in the figure, the average value of the test results of Route A and Route B is used as the measured value of the sampling point (the average value of the current sampling of Route A and Route B is used as the current sampling result of one sampling period). In one round, P1 and P4 can be collected; and so on. In the second round, P2 and P5 are collected, and in the third round, P3 and P6 are collected. Through three rounds of collection, the data test of 6 sampling points is completed.

[0100] Figure 8 It is the second schematic diagram of the sampling principle of multi-round current sampling provided by the embodiment of the present application. As Figure 8 shown, P1 - P12 are 12 sampling points. Taking three rounds of data collection as an example, the process of realizing the restoration of high-frequency periodic signals by adjusting the control clock is described. For conventional photocurrent signals, an equally spaced sampling mode can be directly used for sampling, and the data information of P1 - P12 in Figure 8 is collected. When the photocurrent is greater than the test range of the equally spaced sampling mode, the instrument enters the non-equally spaced sampling mode, as Figure 8 shown. Taking Route A and Route B as independent test results (the current sampling values of Route A and Route B are used as the current sampling results respectively), in one round, P1, P2, P7, and P8 can be collected; and so on. In the second round, P3, P4, P9, and P10 are collected, and in the third round, P5, P6, P11, and P12 are collected. Through three rounds of collection, the data test of 12 sampling points is realized.

[0101] In a possible implementation manner, it further includes:

[0102] Determine the number of rounds N based on the sampling rate and the frequency of the periodic optical signal.

[0103] Here, the sampling rate is explained. The number of samples (sampling points) that can be collected per second can be analyzed according to the sampling period (such as the first sampling period or the second sampling period mentioned in the text), and this number of samples is the sampling rate.

[0104] Exemplarily, according to a preset proportional coefficient K (0 < K ≤ 1), calculate the product between K and the sampling rate, and compare the size between this product and the frequency of the periodic optical signal. If this product is greater than or equal to the frequency of the periodic optical signal, it indicates that the frequency of the periodic optical signal is relatively low. In this case, N = 1 can be set. If this product is less than the frequency of the periodic optical signal, it indicates that the frequency of the periodic optical signal is relatively high. In this case, N > 1 can be set. Further, if this product is less than the frequency of the periodic optical signal, the frequency of the periodic optical signal can be divided by the sampling rate to obtain the ratio between the two, and N is determined according to the ratio. The larger the ratio, the larger the value of N, and the smaller the ratio, the smaller the value of N.

[0105] Therefore, the control method for optical signal acquisition provided in the embodiment of the present application can increase the instrument range by only adjusting the control timing without any device changes; when the frequency of the optical signal to be measured is higher than the instrument sampling rate, multiple rounds of acquisition are used to complete the high-frequency periodic signal restoration based on equivalent time sampling.

[0106] The control device for optical signal acquisition provided in the present application is described below. The control device for optical signal acquisition described below and the control method for optical signal acquisition described above can refer to each other.

[0107] Figure 9 Schematic diagram of the structure of the control device for optical signal acquisition provided by the embodiment of the present application. Figure 9 As shown, the device includes: a first control module 30 and a second control module 40.

[0108] A first control module 30 is configured to control the first current integration conversion circuit to operate in an integration state during one integration period in the first sampling cycle, and to control the second current integration conversion circuit to operate in an integration state during another integration period in the first sampling cycle;

[0109] A second control module 40 is configured to control the first current integration conversion circuit to operate in a conversion state during a conversion period in the first sampling cycle, and to control the second current integration conversion circuit to operate in a conversion state during another conversion period in the first sampling cycle;

[0110] The first sampling period includes two adjacent integration periods and two adjacent conversion periods. The integration period is located before the conversion period. The duration of the integration period is shorter than the duration of the conversion period. The current integration conversion circuit is used to collect optical signals.

[0111] It is understandable that the detailed functional implementation of each of the above units / modules can be found in the introduction of the aforementioned method embodiment, and will not be repeated here.

[0112] It should be understood that the above-mentioned device is used to execute the method in the above-mentioned embodiment. The implementation principle and technical effect of the corresponding program module in the device are similar to those described in the above-mentioned method. The working process of the device can refer to the corresponding process in the above-mentioned method and will not be repeated here.

[0113] Based on the method in the above embodiment, the embodiment of the present application provides an electronic device Figure 10 is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application, such as Figure 10As shown, the electronic device may include: a processor (Processor) 810, a communication interface (Communications Interface) 820, a memory (Memory) 830 and a communication bus 840, wherein the processor 810, the communication interface 820, and the memory 830 communicate with each other via the communication bus 840. The processor 810 can call the logic instructions in the memory 830 to execute the method in the above embodiment.

[0114] In addition, the logic instructions in the above-mentioned memory 830 can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when sold or used as an independent product. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or the part of the technical solution can be embodied in the form of a software product, which is stored in a storage medium and includes a number of instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application.

[0115] Based on the method in the above embodiment, an embodiment of the present application provides a computer-readable storage medium, which stores a computer program. When the computer program runs on a processor, the processor executes the method in the above embodiment.

[0116] Based on the method in the above embodiment, an embodiment of the present application provides a computer program product. When the computer program product runs on a processor, the processor executes the method in the above embodiment.

[0117] It is understood that the processor in the embodiments of the present application may be a central processing unit (CPU), or may be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field programmable gate arrays (FPGA), or other programmable logic devices, transistor logic devices, hardware components, or any combination thereof. The general-purpose processor may be a microprocessor or any conventional processor.

[0118] The method steps in the embodiments of the present application can be implemented by hardware or by a processor executing software instructions. The software instructions can be composed of corresponding software modules, and the software modules can be stored in random access memory (RAM), flash memory, read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), registers, hard disks, mobile hard disks, CD-ROMs or any other form of storage medium well known in the art. An exemplary storage medium is coupled to the processor so that the processor can read information from the storage medium and write information to the storage medium. Of course, the storage medium can also be a component of the processor. The processor and the storage medium can be located in an ASIC.

[0119] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When implemented using software, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted via the computer-readable storage medium. The computer instructions can be transmitted from one website, computer, server or data center to another website, computer, server or data center via a wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) method. The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that includes one or more available media integrations. The available medium can be a magnetic medium (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid-state drive (SSD)).

[0120] It will be understood that the various numerical numbers involved in the embodiments of the present application are merely distinctions for the convenience of description and are not intended to limit the scope of the embodiments of the present application.

[0121] It is easy for those skilled in the art to understand that the above is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A control method for optical signal acquisition, characterized in that: include: During an integration period in a first sampling cycle, the first current integration conversion circuit is controlled to operate in an integration state, and during another integration period in the first sampling cycle, the second current integration conversion circuit is controlled to operate in an integration state; During a conversion period in the first sampling cycle, the first current integration conversion circuit is controlled to operate in a conversion state, and during another conversion period in the first sampling cycle, the second current integration conversion circuit is controlled to operate in a conversion state; The first sampling period includes two adjacent integration periods and two adjacent conversion periods, the integration period is located before the conversion period, the duration of the integration period is shorter than the duration of the conversion period, and the current integration conversion circuit is used to collect optical signals.

2. The control method for optical signal acquisition according to claim 1, characterized in that: Also includes: A current sampling result of the first sampling period is determined based on a first current sampling value provided by the first current integration conversion circuit and a second current sampling value provided by the second current integration conversion circuit.

3. The control method for optical signal acquisition according to claim 2, characterized in that: The determining of the current sampling result of the first sampling period includes: The current sampling result is determined by calculating a current sampling mean based on the first current sampling value and the second current sampling value.

4. The control method for optical signal acquisition according to claim 2, characterized in that: The current sampling result of the first sampling period includes the first current sampling value and the second current sampling value.

5. The control method for optical signal acquisition according to claim 1, characterized in that: Also includes: Determining a difference between the photocurrent and a test range corresponding to a second sampling period, where the second sampling period includes a first integral conversion period and a second integral conversion period, the length of the first integral conversion period being equal to the length of the second integral conversion period, the first current integral conversion circuit operating in an integrating state and the second current integral conversion circuit operating in a converting state during the first integral conversion period, and the second current integral conversion circuit operating in an integrating state and the first current integral conversion circuit operating in a converting state during the second integral conversion period; If the photocurrent is greater than or equal to the test range corresponding to the second sampling period, determining to use the first sampling period for current sampling; If the photocurrent is smaller than the test range corresponding to the second sampling period, it is determined that the second sampling period is used for current sampling.

6. The control method for optical signal acquisition according to any one of claims 1 to 5, characterized in that: Also includes: For the periodic optical signal, N rounds of current sampling are performed to obtain the current sampling results corresponding to each round. Each round of current sampling adopts the first sampling period. The angles of the sampling points in different rounds in the polar coordinate system are different. The number of rounds N is a positive integer.

7. The control method for optical signal acquisition according to claim 6, characterized in that: Also includes: The number of rounds N is determined based on the sampling rate and the frequency of the periodic optical signal.

8. A control device for optical signal acquisition, characterized in that: include: a first control module, configured to control the first current integration conversion circuit to operate in an integration state during an integration period in a first sampling cycle, and to control the second current integration conversion circuit to operate in an integration state during another integration period in the first sampling cycle; a second control module, configured to control the first current integration conversion circuit to operate in a conversion state during a conversion period in the first sampling cycle, and to control the second current integration conversion circuit to operate in a conversion state during another conversion period in the first sampling cycle; The first sampling period includes two adjacent integration periods and two adjacent conversion periods, the integration period is located before the conversion period, the duration of the integration period is shorter than the duration of the conversion period, and the current integration conversion circuit is used to collect optical signals.

9. An electronic device, characterized in that: include: at least one memory for storing a computer program; At least one processor is used to execute the program stored in the memory. When the program stored in the memory is executed, the processor is used to execute the method according to any one of claims 1 to 7.

10. A display panel testing instrument, characterized in that: include: A first current integration conversion circuit, a second current integration conversion circuit and a controller, wherein the controller applies the control method for optical signal acquisition according to any one of claims 1 to 7.

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