A transfer tool for high temperature test of microwave module

Abstract

The present invention relates to the technical field of microwave module test equipment, and specifically discloses a transfer tooling for microwave module to perform high temperature test, including a base, a protective plate installed on one side of the top of the base, a limiting groove is provided on the top of the base located on the side of the protective plate, a test cabinet is rotatably installed inside the limiting groove, a glass plate is rotatably installed on the side of the inside of the test cabinet away from the protective plate, a top plate is rotatably installed on the top of the inside of the test cabinet, a plurality of C-shaped placement racks are installed on the inner wall of the test cabinet, a partition is installed at the middle end of the inner bottom of the test cabinet, storage cavities are provided at both ends of the partition, a plurality of exhaust holes are provided on both sides of the storage cavity, and a side of the partition close to the protective plate is simultaneously in contact with the placement rack and the test cabinet. According to the use situation, the staff of the present invention can simultaneously test and detect the working status of a plurality of microwave modules at different ambient temperatures.

Description

Technical Field

[0001] The invention relates to the technical field of microwave module testing equipment, and in particular to a switching tool used for performing a high temperature test on a microwave module. Background Art

[0002] The microwave module is a power device that combines the advantages of vacuum electronic devices and semiconductor devices. The microwave power module realizes the advantages of high power and high efficiency of vacuum electronic devices and low noise and small size of semiconductor devices in one device. The main purpose of high and low temperature testing of microwave modules is to verify the performance and reliability of microwave modules in extreme temperature environments. By simulating high and low temperature environments, it is ensured that the microwave module can still work normally under various temperature conditions, thereby ensuring its stability and durability in actual use. The microwave module test adapter is used to test microwave module equipment, and is used to connect and test various electrical and physical parameters of microwave modules.

[0003] When common transfer tooling is used to test and inspect microwave modules, most of them can only be used to test a single or a small number of microwave modules. The detection efficiency of the microwave modules is low during use, and the detection equipment can only be used to perform low-temperature environment tests or high-temperature tests on the microwave modules. It is not convenient for workers to quickly understand the degree of influence of the temperature difference of different usage conditions of the microwave modules in low-temperature and high-temperature environments on the working status of the microwave modules by comparing them. Summary of the invention

[0004] The purpose of the present invention is to solve the shortcomings of the prior art and to propose a transfer tool for performing a high temperature test on a microwave module.

[0005] In order to achieve the above object, the present invention adopts the following technical solutions:

[0006] A transfer tooling for performing a high temperature test on a microwave module comprises a base, a protective plate is installed on one side of the top of the base, a limiting groove is provided on the top of the base located on the side of the protective plate, a test cabinet is rotatably installed inside the limiting groove, a glass plate is rotatably installed on the side of the inside of the test cabinet away from the protective plate, a top plate is rotatably installed on the top of the inside of the test cabinet, a plurality of C-shaped placement racks are installed on the inner wall of the test cabinet, a partition is installed at the middle end of the inner bottom of the test cabinet, storage cavities are provided at both ends of the partition, a plurality of exhaust holes are provided on both sides of the storage cavity, and a side of the partition close to the protective plate is in contact with the placement rack and the test cabinet at the same time.

[0007] Preferably, a C-shaped mounting groove is provided on the inner wall of the placement rack, a C-shaped rubber sheet is installed on the inner top and inner bottom of the mounting groove, a plurality of sockets are installed on the inner wall of the mounting groove, a plurality of slide grooves matching the sockets are provided on the bottom of the placement rack, a sliding plate is slidably installed inside the slide groove, and the end of the sliding plate away from the inner wall of the test cabinet passes through the slide groove.

[0008] Preferably, a support block is installed on the top of the sliding plate away from the inner wall of the test cabinet, the top of the partition and the top of the placement rack at the top are both in contact with the top plate, and nozzles are installed on both sides of the partition at the end away from the storage cavity where the exhaust hole is located.

[0009] Preferably, two connecting holes are opened at the inner bottom of the limiting groove, and two second connecting blocks are installed at the bottom of the test cabinet, the second connecting blocks are located inside the connecting holes, and conveying holes are opened at the inner bottom of the two storage cavities, and the two second connecting blocks are respectively connected to the two conveying holes.

[0010] Preferably, a first connecting plate is installed on the side of the base, and the first connecting plate is interconnected with the two connecting holes. A mounting shaft is installed at a corner position of the bottom end of the test cabinet away from the protective plate. One end of the mounting shaft is rotatably mounted on the inner wall of the limit groove, and the other end of the mounting shaft passes through the base and is connected to a motor through a coupling. The motor is installed on the side of the base away from the first connecting plate.

[0011] Preferably, the inner bottom of the test cabinet is provided with grooves on both sides of the partition, an electric shaft is rotatably mounted on the inner bottom of the groove, a protective frame is rotatably mounted on the top of the electric shaft, and the protective frame is mounted on the inner wall of the groove.

[0012] Preferably, a mounting sleeve is installed on the outer wall of the electric shaft, and a plurality of fan blades are installed on the outer wall of the mounting sleeve, and the plurality of fan blades are all located below the protective frame. First connecting blocks are installed at both ends of the test cabinet, and the first connecting blocks are interconnected with the interior of the test cabinet.

[0013] Preferably, a plurality of connecting grooves are provided on the side of the test cabinet close to the protective plate, a plurality of second connecting plates matching the connecting grooves are installed on the side of the protective plate close to the test cabinet, the second connecting plates are located inside the connecting grooves, a display screen is installed on the side of the protective plate away from the test cabinet, and the display screens are electrically connected to each other through the second connecting plates and the sockets inside the plurality of placement racks.

[0014] Preferably, a first support rod is rotatably mounted on one end of the top plate close to the protective plate, and both ends of the first support rod are respectively mounted on the inner walls on both sides of the test cabinet; a second support rod is rotatably mounted on the bottom end of the glass plate, and both ends of the second support rod are respectively rotatably mounted on the inner walls on both sides of the test cabinet.

[0015] Preferably, a slot is provided on the top of the glass plate in the length direction, a card plate is installed at the bottom of one end of the top plate close to the glass plate, the card plate is located inside the slot, and lighting rings are installed at both ends of the bottom of the top plate.

[0016] Compared with the prior art, the present invention has the following beneficial effects:

[0017] In the present invention, the staff can discharge the high-temperature gas and low-temperature gas inside the two storage chambers into the spaces on both sides of the partition inside the test cabinet through the multiple nozzles and exhaust holes on both sides of the partition according to the usage situation. When in use, the multiple microwave modules located on both sides of the partition can be used in low-temperature and high-temperature environments respectively. When in use, the multiple microwave modules can be tested and inspected at the same time, and the usage of the multiple microwave modules in a high-temperature environment can be tested at the same time according to the usage situation, or the usage of the multiple microwave modules in a low-temperature environment can be tested at the same time, or the usage of the multiple microwave modules in a high-temperature and low-temperature environment can be tested at the same time, so that the staff can understand the influence of temperature on the use of the microwave modules and make a comparison. The display screen can view, compare and understand the usage of the multiple microwave modules located on both sides of the partition under different temperature environments, and understand and record the influence of the temperature difference on the working state of the microwave modules on the use of the microwave modules.

[0018] In the present invention, when the high-temperature gas inside the two storage chambers in the partition and the low-temperature gas inside the test cabinet are respectively discharged to different spaces on both sides of the partition inside the test cabinet, the electric rotating shaft can drive a plurality of fan blades to rotate through the mounting sleeve, so that the fan blades blow the gas inside the test cabinet to flow inside the test cabinet when rotating, so that the high-temperature gas and the low-temperature gas are respectively evenly diffused into the internal space of the test cabinet, so that the ambient temperature of a plurality of microwave modules located in the high-temperature gas inside the test cabinet is the same, and the ambient temperature of the microwave modules used in the low-temperature environment is also the same, which can facilitate the staff to better test and detect a plurality of microwave modules and improve the accuracy of the test and detection results.

[0019] In the present invention, the staff connects the first connecting blocks at both ends of the test cabinet to the external vacuum pump through the connecting pipe, which makes it convenient for the staff to extract the high-temperature gas and low-temperature gas inside the test cabinet through the vacuum pump when in use, and convenient for the staff to control the temperature inside the test cabinet. At the same time, when in use, the staff can partially extract the air inside the test cabinet through the vacuum pump to increase the air pressure inside the test cabinet, which is convenient for the staff to understand the usage of the microwave module under different temperatures and different air pressures.

[0020] In the present invention, the connector on the microwave module is connected to the socket on the mounting groove, and when in use, two rubber sheets located on the inner walls on both sides of the mounting groove clamp the end of the microwave module close to the inside of the mounting groove, so that the connection between the microwave module and the socket is more stable during test and detection, and there will be no position movement. The sliding plate can support the end of the microwave module away from the socket through the support block, so as to prevent the end of the microwave module away from the socket from shaking due to the vibration of the base during use. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 A three-dimensional diagram of a transfer tool for performing a high temperature test on a microwave module proposed by the present invention;

[0022] Figure 2 A schematic diagram of the structure of a protective plate of a transfer tooling for performing a high temperature test on a microwave module proposed by the present invention;

[0023] Figure 3 A schematic diagram of the base structure of a transfer tooling for performing a high temperature test on a microwave module proposed by the present invention;

[0024] Figure 4 This is a schematic diagram of the installation structure of the second connection block of a transfer tooling for performing a high temperature test on a microwave module proposed by the present invention;

[0025] Figure 5 This is a schematic diagram of a glass plate installation structure of a transfer tooling for a microwave module to perform a high temperature test, as proposed by the present invention;

[0026] Figure 6 A schematic diagram of a partition structure of a transfer tooling for performing a high temperature test on a microwave module proposed by the present invention;

[0027] Figure 7 A cross-sectional view of a test cabinet of a transfer tooling for performing a high temperature test on a microwave module proposed by the present invention;

[0028] Figure 8 The present invention is a schematic diagram of a placement rack structure of a transfer tooling for performing a high temperature test on a microwave module.

[0029] In the figure: 1. base; 2. protective plate; 3. test cabinet; 4. glass plate; 5. top plate; 6. limit groove; 7. motor; 8. first connecting block; 9. display screen; 10. first connecting plate; 11. second connecting plate; 12. connecting hole; 13. second connecting block; 14. mounting shaft; 15. first support rod; 16. partition; 17. placement rack; 18. slot; 19. card plate; 20. groove; 21. storage chamber; 22. conveying hole; 23. exhaust hole; 24. jet head; 25. electric shaft; 26. mounting sleeve; 27. fan blade; 28. mounting groove; 29. ​​rubber sheet; 30. slide groove; 31. sliding plate; 32. support block; 33. connecting groove; 34. protective frame; 35. second support rod. DETAILED DESCRIPTION

[0030] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.

[0031] In the description of the present invention, it is necessary to understand that the terms "upper", "lower", "front", "back", "left", "right", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0032] Reference Figure 1-Figure 8 A transfer tooling for performing a high temperature test on a microwave module comprises a base 1, a protective plate 2 is installed on one side of the top of the base 1, a limiting groove 6 is provided on the top of the base 1 located on the side of the protective plate 2, a test cabinet 3 is rotatably installed inside the limiting groove 6, a glass plate 4 is rotatably installed on the side of the inside of the test cabinet 3 away from the protective plate 2, a top plate 5 is rotatably installed on the top of the inside of the test cabinet 3, a plurality of C-shaped placement racks 17 are installed on the inner wall of the test cabinet 3, a partition 16 is installed at the middle end of the inner bottom of the test cabinet 3, storage cavities 21 are provided at both ends of the partition 16, a plurality of exhaust holes 23 are provided on both sides of the storage cavity 21, and a side of the partition 16 close to the protective plate 2 is abutted against the placement rack 17 and the test cabinet 3 at the same time.

[0033] As a technical optimization scheme of the present invention, a C-shaped installation groove 28 is opened on the inner wall of the placement rack 17, and a C-shaped rubber sheet 29 is installed on the inner top and inner bottom of the installation groove 28. A plurality of sockets are installed on the inner wall of the installation groove 28, and a plurality of slide grooves 30 matching the sockets are opened on the bottom of the placement rack 17. A sliding plate 31 is slidably installed inside the slide groove 30, and one end of the sliding plate 31 away from the inner wall of the test cabinet 3 passes through the slide groove 30; when in use, the staff can telescopically move the sliding plate 31 so that one end of the sliding plate 31 moves to the bottom of the microwave module, which can provide better protection for the microwave module.

[0034] As a technical optimization scheme of the present invention, a support block 32 is installed on the top of the end of the sliding plate 31 away from the inner wall of the test cabinet 3, the top of the partition 16 and the top of the placement rack 17 located at the top are both in contact with the top plate 5, and nozzles 24 are installed on both sides of the partition 16 at the end away from the storage cavity 21 of the exhaust hole 23; the partition 16 can separate the interior of the test cabinet 3, so that the staff can perform high temperature and low temperature detection on several microwave modules at both ends of the interior of the test cabinet 3 at the same time.

[0035] As a technical optimization scheme of the present invention, two connecting holes 12 are provided at the inner bottom of the limiting groove 6, and two second connecting blocks 13 are installed at the bottom of the test cabinet 3, the second connecting blocks 13 are located inside the connecting holes 12, and the inner bottoms of the two storage cavities 21 are provided with conveying holes 22, and the two second connecting blocks 13 are respectively connected to the two conveying holes 22; the two second connecting blocks 13 can respectively convey high-temperature gas and low-temperature gas to the inside of the two storage cavities 21 through the two conveying holes 22.

[0036] As a technical optimization scheme of the present invention, a first connecting plate 10 is installed on the side of the base 1, and the first connecting plate 10 is interconnected with the two connecting holes 12. A mounting shaft 14 is installed at the corner position of the bottom end of the test cabinet 3 away from the protective plate 2. One end of the mounting shaft 14 is rotatably mounted on the inner wall of the limit groove 6, and the other end of the mounting shaft 14 passes through the base 1 and is connected to the motor 7 through a coupling. The motor 7 is installed on the side of the base 1 away from the first connecting plate 10; the two ends of one side of the first connecting plate 10 are respectively interconnected with the conveying pipes for conveying cold air and hot air.

[0037] As a technical optimization solution of the present invention, the inner bottom of the test cabinet 3 is provided with grooves 20 on both sides of the partition 16, and an electric shaft 25 is rotatably installed on the inner bottom of the groove 20, and a protective frame 34 is rotatably installed on the top of the electric shaft 25, and the protective frame 34 is installed on the inner wall of the groove 20; when in use, the electric shaft 25 can drive a plurality of fan blades 27 to rotate, so that the cold air and high-temperature gas inside the test cabinet 3 are evenly diffused to the interior of the test cabinet 3.

[0038] As a technical optimization solution of the present invention, a mounting sleeve 26 is installed on the outer wall of the electric rotating shaft 25, and a plurality of fan blades 27 are installed on the outer wall of the mounting sleeve 26. The plurality of fan blades 27 are all located below the protective frame 34. First connecting blocks 8 are installed at both ends of the test cabinet 3, and the first connecting blocks 8 are interconnected with the interior of the test cabinet 3. The protective frame 34 can provide better protection for the plurality of fan blades 27 when in use.

[0039] As a technical optimization scheme of the present invention, a plurality of connecting grooves 33 are opened on the side of the test cabinet 3 close to the protective plate 2, a plurality of second connecting plates 11 matching the connecting grooves 33 are installed on the side of the protective plate 2 close to the test cabinet 3, the second connecting plates 11 are located inside the connecting grooves 33, a display screen 9 is installed on the side of the protective plate 2 away from the test cabinet 3, the display screen 9 is electrically connected to each other through the second connecting plate 11 and the sockets inside the plurality of placement racks 17; the display screen 9 can simultaneously display the usage status of a plurality of microwave modules at different temperatures, making it convenient for the staff to understand.

[0040] As a technical optimization scheme of the present invention, a first support rod 15 is rotatably mounted on one end of the top plate 5 close to the protective plate 2, and both ends of the first support rod 15 are respectively mounted on the inner walls on both sides of the test cabinet 3, and a second support rod 35 is rotatably mounted on the bottom end of the glass plate 4, and both ends of the second support rod 35 are respectively rotatably mounted on the inner walls on both sides of the test cabinet 3; when in use, the staff can take and install the microwave module by rotating the top plate 5 and the glass plate 4.

[0041] As a technical optimization solution of the present invention, a card slot 18 is opened at the top of the glass plate 4 in the length direction, and a card plate 19 is installed at the bottom of one end of the top plate 5 close to the glass plate 4. The card plate 19 is located inside the card slot 18, and lighting lamp rings are installed at both ends of the bottom of the top plate 5; when in use, the top plate 5 can better fix the top of the glass plate 4 through the card plate 19.

[0042] When the present invention is in use, the staff inserts several microwave modules with test detection into the interior of the installation slots 28 on several placement racks 17 on the inner wall of the test cabinet 3 respectively and in sequence. When in use, the end of the microwave module close to the connector is inserted into the interior of the installation slot 28 from the direction of the inner wall of the placement rack 17, so that the connector on the microwave module is connected to the socket on the installation slot 28. When in use, two rubber sheets 29 located on the inner walls on both sides of the installation slot 28 clamp the end of the microwave module close to the interior of the installation slot 28, so that the connection between the microwave module and the socket during the test detection is more stable and there will be no position movement.

[0043] The staff pulls the support block 32 located below the microwave module, so that the support block 32 drives the sliding plate 31 located inside the sliding groove 30 at the bottom of the placement rack 17 to move in the direction away from the inner wall of the test cabinet 3, until the support block 32 moves to the bottom of the end of the microwave module away from the socket. When in use, the sliding plate 31 can support the end of the microwave module away from the socket through the support block 32 to prevent the end of the microwave module away from the socket from shaking due to the vibration of the base 1 during use. When in use, the connecting groove 33 on the side of the test cabinet 3 is electrically connected to the display screen 9 on the side of the protective plate 2 through the second connecting plate 11, and the connecting groove 33 is connected to several microwave modules through the socket. When in use, the microwave module can be powered on and the situation of the microwave module in use can be understood through the display screen 9.

[0044] When in use, the two second connection blocks 13 at the bottom of the test cabinet 3 are connected to the two connection holes 12 at the bottom of the limiting groove 6, and the connection holes 12 are connected to the first connection plate 10, and the two second connection blocks 13 are connected to the two delivery holes 22 at the bottom of the two storage chambers 21 of the partition 16. When in use, the staff can connect the delivery pipe used to deliver cold air and high-temperature gas from the outside to the two ends of the first connection plate 10, and communicate with the inside of the two storage chambers 21 through the first connection plate 10, the second connection block 13 and the two delivery holes 22, so that the staff can deliver cold air and high-temperature gas to the inside of the two storage chambers 21 respectively when in use.

[0045] When in use, the staff can discharge the high-temperature gas and low-temperature gas in the two storage chambers 21 into the spaces on both sides of the partition 16 through the several nozzles 24 and the exhaust holes 23 on both sides of the partition 16 according to the use situation. When in use, the several microwave modules on both sides of the partition 16 can be used in low-temperature and high-temperature environments respectively, and the staff installs temperature sensors on the inner walls at both ends of the test cabinet 3, which is convenient for the staff to monitor the temperature of the space on both sides of the partition 16 inside the test cabinet 3 in real time. When in use, the display screen 9 can view, compare and understand the use of the several microwave modules on both sides of the partition 16 under different temperature environments, and understand and record the degree of influence of the temperature difference on both sides of the partition 16 on the working state of the microwave modules.

[0046] When the high-temperature gas and the low-temperature gas inside the two storage chambers 21 in the partition 16 are respectively discharged to different spaces on both sides of the partition 16 inside the test cabinet 3, the electric rotating shaft 25 inside the groove 20 on both sides of the bottom partition 16 in the test cabinet 3 can drive a plurality of fan blades 27 to rotate through the mounting sleeve 26, so that the fan blades 27 blow the gas inside the test cabinet 3 to flow inside the test cabinet 3 when rotating, so that the high-temperature gas and the low-temperature gas are respectively evenly diffused into the internal space of the test cabinet 3, so that the ambient temperature of the several microwave modules located in the high-temperature gas inside the test cabinet 3 is the same, and the ambient temperature of the microwave modules used in the low-temperature environment is also the same, which can facilitate the staff to better test and detect the several microwave modules and improve the accuracy of the test and detection results.

[0047] When in use, the staff connects the first connecting blocks 8 at both ends of the test cabinet 3 to the external vacuum pump through the connecting pipe, which makes it convenient for the staff to extract the high-temperature gas and low-temperature gas inside the test cabinet 3 through the vacuum pump, and convenient for the staff to control the temperature inside the test cabinet 3. At the same time, when in use, the staff can partially extract the air inside the test cabinet 3 through the vacuum pump to increase the air pressure inside the test cabinet 3, so as to facilitate the staff to understand the usage of the microwave module under different temperatures and different air pressures.

[0048] When the staff needs to take the microwave module that has been tested, the staff can first rotate the top plate 5 at the top of the test cabinet 3 away from one end of the protective plate 2, so that the card plate 19 at the bottom of the top plate 5 close to the glass plate 4 is moved out of the card slot 18 at the top of the glass plate 4, and the high-temperature gas and low-temperature gas on both sides of the partition 16 inside the test cabinet 3 are discharged to the outside. When in use, the top of the test cabinet 3 is first opened, which is more convenient for the high-temperature and low-temperature gas inside the test cabinet 3 to be quickly discharged from the top, and when in use, the fan blades 27 can blow the high-temperature gas and low-temperature gas upward, so that the inside of the test cabinet 3 can begin to return to normal temperature. When the inside of the test cabinet 3 returns to normal temperature, the staff can rotate the top of the glass plate 4 so that the top and side of the test cabinet 3 are in an open state, and the staff can pull the microwave modules inside the mounting slots 28 on the several placement racks 17 from the side of the test cabinet 3 to disconnect the microwave modules from the inner wall sockets of the mounting slots 28.

[0049] When the staff has taken the microwave modules that have been tested, the remaining microwave modules to be tested can be inserted into the installation slot 28 for testing. During use, several microwave modules can be tested at the same time, and according to the use conditions, several microwave modules can be tested in a high temperature environment at the same time, or several microwave modules can be tested in a low temperature environment at the same time, or several microwave modules can be tested in high and low temperature environments at the same time, so that the staff can understand the influence of temperature on the use of microwave modules and make comparisons.

[0050] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical scheme and inventive concept of the present invention within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A transfer tool for performing a high temperature test on a microwave module, comprising a base (1), characterized in that: A protective plate (2) is installed on one side of the top of the base (1); a limiting groove (6) is provided on the top of the base (1) on the side of the protective plate (2); a test cabinet (3) is rotatably installed inside the limiting groove (6); a glass plate (4) is rotatably installed on the side of the inside of the test cabinet (3) away from the protective plate (2); a top plate (5) is rotatably installed on the top of the inside of the test cabinet (3); a plurality of C-shaped placement racks (17) are installed on the inner wall of the test cabinet (3); a partition (16) is installed at the middle end of the inner bottom of the test cabinet (3); storage cavities (21) are provided at both ends of the partition (16); a plurality of exhaust holes (23) are provided on both sides of the storage cavity (21); and a side of the partition (16) close to the protective plate (2) is abutted against the placement rack (17) and the test cabinet (3) at the same time; The inner wall of the placement rack (17) is provided with a C-shaped installation groove (28), the inner top and inner bottom of the installation groove (28) are both provided with C-shaped rubber sheets (29), the inner wall of the installation groove (28) is provided with a plurality of sockets, the bottom of the placement rack (17) is provided with a plurality of slide grooves (30) matching the sockets, a sliding plate (31) is slidably installed inside the slide groove (30), and one end of the slide plate (31) away from the inner wall of the test cabinet (3) passes through the slide groove (30); A support block (32) is installed at the top of one end of the sliding plate (31) away from the inner wall of the test cabinet (3), the top of the partition (16) and the top of the placement rack (17) located at the top are both in contact with the top plate (5), and nozzles (24) are installed at both sides of the partition (16) at one end of the exhaust hole (23) away from the storage chamber (21); The inner bottom of the limiting groove (6) is provided with two connection holes (12); the bottom of the test cabinet (3) is provided with two second connection blocks (13); the second connection blocks (13) are located inside the connection holes (12); the inner bottoms of the two storage chambers (21) are provided with conveying holes (22); the two second connection blocks (13) are respectively connected to the two conveying holes (22); The two second connecting blocks (13) respectively transport high-temperature gas and low-temperature gas to the interior of the two storage chambers (21) through the two transport holes (22), and a plurality of nozzles (24) and exhaust holes (23) on both sides of the partition (16) discharge the high-temperature gas and low-temperature gas in the two storage chambers (21) into the interior of the test cabinet (3) and into the spaces on both sides of the partition (16).

2. The adapter for performing a high temperature test on a microwave module according to claim 1, characterized in that: A first connecting plate (10) is installed on the side of the base (1), and the first connecting plate (10) is connected to the two connecting holes (12). A mounting shaft (14) is installed at a corner position of the bottom end of the test cabinet (3) away from the protective plate (2). One end of the mounting shaft (14) is rotatably mounted on the inner wall of the limiting groove (6), and the other end of the mounting shaft (14) passes through the base (1) and is connected to a motor (7) via a coupling. The motor (7) is installed on the side of the base (1) away from the first connecting plate (10).

3. The adapter for performing a high temperature test on a microwave module according to claim 1, characterized in that: The inner bottom of the test cabinet (3) is provided with grooves (20) on both sides of the partition (16), an electric shaft (25) is rotatably mounted on the inner bottom of the groove (20), a protective frame (34) is rotatably mounted on the top of the electric shaft (25), and the protective frame (34) is mounted on the inner wall of the groove (20).

4. The adapter for performing a high temperature test on a microwave module according to claim 3, characterized in that: A mounting sleeve (26) is mounted on the outer wall of the electric rotating shaft (25), a plurality of fan blades (27) are mounted on the outer wall of the mounting sleeve (26), and the plurality of fan blades (27) are all located below the protective frame (34). First connecting blocks (8) are mounted on both ends of the test cabinet (3), and the first connecting blocks (8) are in communication with the interior of the test cabinet (3).

5. The adapter for performing a high temperature test on a microwave module according to claim 1, characterized in that: The test cabinet (3) is provided with a plurality of connection grooves (33) on a side close to the protective plate (2); a plurality of second connection plates (11) matching the connection grooves (33) are installed on a side close to the test cabinet (3) of the protective plate (2); the second connection plates (11) are located inside the connection grooves (33); a display screen (9) is installed on a side of the protective plate (2) away from the test cabinet (3); the display screen (9) is electrically connected to each other through the second connection plates (11) and the sockets inside the plurality of placement racks (17).

6. The adapter for performing a high temperature test on a microwave module according to claim 1, characterized in that: A first support rod (15) is rotatably mounted on one end of the top plate (5) close to the protective plate (2), and two ends of the first support rod (15) are respectively mounted on two inner walls of the test cabinet (3). A second support rod (35) is rotatably mounted on the bottom end of the glass plate (4), and two ends of the second support rod (35) are respectively rotatably mounted on two inner walls of the test cabinet (3).

7. The adapter for performing a high temperature test on a microwave module according to claim 6, characterized in that: The top of the glass plate (4) is provided with a slot (18) in the length direction, a slot plate (19) is installed at the bottom of one end of the top plate (5) close to the glass plate (4), the slot plate (19) is located inside the slot (18), and lighting rings are installed at both ends of the bottom of the top plate (5).

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