Manual sample grinding tool capable of monitoring thickness of ion thinning sample and sample grinding method

Abstract

The invention discloses a manual sample grinding tool capable of monitoring the thickness of an ion thinning sample and a sample grinding method. The sample grinding tool comprises a grinding screw rod, a sleeve and a grinding disc, the sample grinding method comprises the following steps: cutting a sample, measuring the coarse thickness of the to-be-measured sample, grinding the double surfaces of the to-be-measured sample, and measuring the fine thickness of the to-be-measured sample. Compared with the prior art, the grinding screw rod is matched with the sleeve integrated with thickness measurement, so that high-precision control of the thickness of the transmission sample is realized, the defects of existing sample grinding equipment are effectively overcome, the preparation efficiency and quality of the transmission electron microscope sample are improved, and the efficient development of the transmission electron microscope technology is promoted.

Description

Technical Field

[0001] The invention relates to the technical field of transmission electron microscope sample preparation, and in particular to a manual sample grinding tool and a sample grinding method capable of monitoring the thickness of an ion-thinned sample. Background Art

[0002] Transmission Electron Microscopy (TEM) is a sophisticated microscopic analysis tool that captures images by penetrating a sample with an electron beam, with atomic-level spatial resolution. This technology enables users to observe the microscopic world of materials, including details such as the internal structure of the material, microscopic defects, and interface characteristics, providing a powerful analytical tool in the field of materials science.

[0003] The thickness of the TEM sample is a key parameter. The electron detector is located below the sample. If the detector wants to get enough signal for good imaging, the sample must be thin enough. Typically, the thickness of the TEM sample should be between 50 and 200 nanometers, depending on the acceleration voltage used and the density of the material. In addition, try to avoid introducing mechanical damage or thermal damage during sample preparation, which will change the microstructure and properties of the material, thereby affecting the results of the analysis.

[0004] At present, there are three methods for preparing transmission electron microscope samples of bulk materials, including focused ion beam processing, ion thinning and electrolytic double spraying. Among them, focused ion beam processing requires the purchase of an expensive focused ion beam-electron beam dual-beam electron microscope. The preparation time of a single sample is 3 to 5 hours, and the consumables are expensive. The cost of preparing a single sample is about 3,000 yuan; however, ion thinning and electrolytic double spraying are lower in cost, so they are more common in the preparation of transmission electron microscope samples of bulk materials. In the pre-steps of ion thinning and electrolytic double spraying, the sample needs to be pre-ground to 80 microns or even thinner (within 50 microns). Today's high-precision manual grinding equipment is expensive and has high maintenance costs, while the lower-cost manual grinding equipment is a simple sleeve structure that cannot perform accurate thickness measurements and has low grinding efficiency, resulting in a low success rate for samples. In view of the above problems, it is urgent to obtain a low-cost, high-precision manual grinding sample preparation device. Summary of the invention

[0005] Purpose of the invention: To solve the above-mentioned problems, the present invention provides a manual sample grinding tool and a sample grinding method that can monitor the thickness of ion-thinned samples. By cooperating with the grinding screw and the sleeve with integrated thickness measurement, high-precision control of the thickness of the transmission sample is achieved, which effectively solves the shortcomings of the existing sample grinding equipment and improves the efficiency and quality of transmission electron microscopy sample preparation.

[0006] Technical solution: To achieve the above-mentioned purpose, the manual grinding tool for monitoring the thickness of ion-thinned samples described in the present invention includes a grinding screw with an indicating scale, a sleeve arranged below the grinding screw, and a grinding disk arranged below the sleeve; the sleeve is provided with a thread matching the grinding screw, and a space for accommodating the grinding disk, and the upper surface of the sleeve is provided with a circle of fine measurement scales and a longitudinal coarse measurement scale; when the grinding screw is rotated downward until the lower surface of the nut is aligned with the 0 scale line of the coarse measurement scale, the indicating scale points to the 0 scale line of the fine measurement scale.

[0007] Furthermore, the indicating scale is arranged on the nut of the grinding screw.

[0008] Furthermore, the grinding disc is made of anti-corrosion material.

[0009] Furthermore, the grinding screw rotates one circle for 500 microns, the coarse measurement scale is 5 microns per scale, and the fine measurement scale is 500 microns per scale.

[0010] The sample grinding method of the manual sample grinding tool capable of monitoring the thickness of the ion-thinned sample of the present invention comprises the following steps:

[0011] S1. Cut the sample into a cylindrical sample with a thickness of less than 3 mm and a diameter of less than 6 mm or a rectangular sample with a thickness of less than 3 mm and a diagonal of less than 6 mm;

[0012] S2. Heat the grinding disc to 90°C and fix it to the sample to be measured. After cooling, insert the grinding disc into the sleeve from the bottom and screw the grinding screw into the sleeve until the grinding disc is pushed. At this time, read the coarse thickness of the sample to be measured through the coarse measurement scale.

[0013] S3. Grind one side of the sample to be measured using sandpaper of different mesh sizes according to the figure-8 trajectory;

[0014] S4. After grinding one side of the sample to be measured, turn the sample to be measured over, repeat S2, read the precise thickness of the sample to be measured by the indicator scale, and repeat S3 to obtain a double-sided smooth sample to be measured.

[0015] Furthermore, in S1, the cutting of samples is performed by wire cutting.

[0016] Furthermore, in S1, the sample is a metal or ceramic material.

[0017] Further, in S3, the sandpapers with different mesh sizes include 1500 mesh, 2000 mesh and 5000 mesh, and the sandpapers with mesh sizes from low to high are used in sequence to grind the sample to be measured.

[0018] Further, in S4, the error of the precision thickness is 0 to 10 microns.

[0019] Furthermore, in S4, the double-sided smooth sample to be measured has a thickness of 50 to 80 microns.

[0020] Beneficial effects: Compared with the prior art, the present invention has the following significant effects: by cooperating the grinding screw with the sleeve with integrated thickness measurement, the grinding screw with the indicator scale is rotated, and the reading of the dial on the sleeve is observed to adjust the sample at the lower end of the grinding disk; the sample and the grinding medium are pressed tightly by relying on the weight of the entire grinding system, and the excess parts are ground away in turn, and the grinding screw is adjusted during use to control the final thickness to the required thickness. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 It is a three-dimensional schematic diagram of the grinding tool structure of the present invention.

[0022] Figure 2 It is a structural schematic diagram of the calibration state of the present invention.

[0023] Figure 3 It is a top view of the grinding tool structure of the present invention. DETAILED DESCRIPTION

[0024] The present invention discloses a manual sample grinding tool and a sample grinding method capable of monitoring the thickness of ion-thinned samples. Figure 1As shown, the manual sample grinding tool for monitoring the thickness of ion-thinned samples provided by the present invention is further described in detail below: The manual sample grinding tool for monitoring the thickness of ion-thinned samples includes a grinding screw 1 provided with an indicator scale 6, a sleeve 2 arranged below the grinding screw 1, and a grinding disc 3 arranged below the sleeve 2. Among them, the sleeve 2 is provided with a thread that matches the grinding screw 1, and is also provided with a space for accommodating the grinding disc 3, and the upper surface of the sleeve 2 is provided with a circle of fine measurement scales 4 and a longitudinal coarse measurement scale 5. The process of one circle of the grinding screw 1 is 500 microns, the coarse measurement scale 5 is 5 microns per scale, and the fine measurement scale 4 is 500 microns per scale. When the grinding screw 1 rotates downward until the lower surface of the nut is aligned with the 0 scale line of the coarse measurement scale 5, the indicator scale 6 points to the 0 scale line of the fine measurement scale 4, and it is in the calibration state at this time. The grinding disc 3 is a special anti-corrosion grinding disc, which is used to load the cut sample. The anti-corrosion grinding disc and the sleeve are closely matched to ensure the stability of the sample during the preparation process. The indicator scale 6 is arranged on the nut of the grinding screw 1, and the grinding platform is made of high-strength material, which can maintain stability in long-term use and reduce the accuracy loss caused by wear; the thickness measurement system consists of a precision-controlled grinding screw and an integrated thickness measurement sleeve, which monitors and adjusts the sample thickness in real time to ensure accurate control of the grinding process; the thickness measurement system is made of stainless steel material, which is known for its excellent corrosion resistance, strength and high temperature resistance, ensuring that the performance during use is not affected and maintaining cost-effectiveness and durability.

[0025] The following is a further detailed description of the sample grinding method using a manual sample grinding tool capable of monitoring the thickness of a sample thinned by ions provided by the present invention: The sample grinding method using a manual sample grinding tool capable of monitoring the thickness of a sample thinned by ions comprises the following steps:

[0026] The first step: Cut the sample into a cylindrical sample with a thickness of less than 3 mm and a diameter of less than 6 mm or a rectangular sample with a thickness of less than 3 mm and a diagonal of less than 6 mm. The cutting sample is made of metal or ceramic material by wire cutting.

[0027] Step 2: Heat the grinding disc 3 to 90°C and fix it to the sample to be measured. After cooling, insert the grinding disc 3 into the sleeve 2 from the bottom. At the same time, screw the grinding screw 1 into the sleeve 2 until the grinding disc 3 is pushed. At this time, read the rough thickness of the sample to be measured through the rough measurement scale 5.

[0028] Step 3: Use sandpaper of different meshes to grind one side of the sample to be measured according to the "8"-shaped track. The sandpapers of different meshes include 1500 mesh, 2000 mesh and 5000 mesh. Use sandpaper of low to high meshes to grind the sample to be measured. Use special grinding fluid during the grinding process to reduce equipment corrosion and extend the service life of the tool.

[0029] Step 4: After grinding one side of the sample to be measured, turn the sample to be measured over, repeat step 2, read the precise thickness of the sample to be measured by the indicator scale 6, and repeat step 3 to obtain a double-sided smooth sample to be measured. The error of the precise thickness is 0 to 10 microns, and the thickness of the double-sided smooth sample to be measured is 50 to 80 microns.

[0030] The present invention adopts modular design and simplified operation steps to make the grinding process more intuitive and efficient, reduce human errors, and improve the quality and success rate of sample preparation; by cooperating with a grinding screw and a sleeve with integrated thickness measurement, the grinding screw with an indicating scale is rotated, and the reading of the scale dial on the sleeve is observed to adjust the sample at the lower end of the grinding disk; relying on the weight of the entire grinding system, the sample and the grinding medium are pressed tightly, and the excess parts are ground and removed in sequence, and the grinding screw is adjusted during use to control the final thickness to a required thickness, thereby realizing high-precision control of the thickness of the transmission sample, meeting the requirements of high-resolution observation of the transmission electron microscope, effectively solving the shortcomings of the existing sample grinding equipment, and improving the efficiency and quality of the transmission electron microscope sample preparation, thereby promoting the efficient development of the transmission electron microscope technology and meeting more scientific research and industrial requirements.

Claims

1. A manual sample grinding tool capable of monitoring the thickness of an ion-thinned sample, characterized in that: The invention comprises a grinding screw (1) provided with an indicating scale (6), a sleeve (2) arranged below the grinding screw (1), and a grinding disc (3) arranged below the sleeve (2); the sleeve (2) is provided with a thread matched with the grinding screw (1) and a space for accommodating the grinding disc (3); and the upper surface of the sleeve (2) is provided with a circle of fine measurement scales (4) and a longitudinal coarse measurement scale (5); when the grinding screw (1) is rotated downward until the lower surface of the nut is aligned with the 0 scale line of the coarse measurement scale (5), the indicating scale (6) points to the 0 scale line of the fine measurement scale (4).

2. The manual sample grinding tool capable of monitoring the thickness of ion-thinned samples according to claim 1, characterized in that: The indicating scale (6) is arranged on the nut of the grinding screw (1).

3. The manual sample grinding tool capable of monitoring the thickness of ion-thinned samples according to claim 1, characterized in that: The grinding disc (3) is made of corrosion-resistant material.

4. The manual sample grinding tool capable of monitoring the thickness of ion-thinned samples according to claim 1, characterized in that: The grinding screw (1) rotates one circle for a distance of 500 microns, the coarse measurement scale (5) is 5 microns per scale, and the fine measurement scale (4) is 500 microns per scale.

5. A method for grinding a sample using the manual grinding tool capable of monitoring the thickness of an ion-thinned sample as claimed in any one of claims 1 to 4, characterized in that: The following steps are involved: S1. Cut the sample into a cylindrical sample with a thickness of less than 3 mm and a diameter of less than 6 mm or a rectangular sample with a thickness of less than 3 mm and a diagonal of less than 6 mm; S2. After heating the grinding disc (3) to 90°C, fix it to the sample to be measured. After cooling, insert the grinding disc (3) into the sleeve (2) from the bottom, and screw the grinding screw (1) into the sleeve (2) until the grinding disc (3) is pushed. At this time, read the coarse thickness of the sample to be measured through the coarse measurement scale (5); S3. Grind one side of the sample to be measured using sandpaper of different mesh sizes according to the "8"-shaped trajectory; S4. After grinding one side of the sample to be measured, turn the sample to be measured over, repeat S2, read the precise thickness of the sample to be measured using the indicator scale (6), and repeat S3 to obtain a double-sided smooth sample to be measured.

6. The method for grinding samples using a manual grinding tool capable of monitoring the thickness of ion-thinned samples according to claim 5, characterized in that: In S1, the cutting sample is performed by wire cutting.

7. The method for grinding samples using a manual grinding tool capable of monitoring the thickness of ion-thinned samples according to claim 5, characterized in that: In S1, the sample is a metal or ceramic material.

8. The method for grinding samples using a manual grinding tool capable of monitoring the thickness of ion-thinned samples according to claim 5, characterized in that: In S3, the sandpapers with different mesh sizes include 1500 mesh, 2000 mesh and 5000 mesh, and the sandpapers with different mesh sizes from low to high are used in sequence to grind the sample to be measured.

9. The method for grinding samples using a manual grinding tool capable of monitoring the thickness of ion-thinned samples according to claim 5, characterized in that: In S4, the error of the precise thickness is 0 to 10 microns.

10. The method for grinding samples using a manual grinding tool capable of monitoring the thickness of ion-thinned samples according to claim 5, characterized in that: In S4, the thickness of the double-sided smooth sample to be measured is 50 to 80 microns.

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