Method and device for determining mirror image calibration parameters and computer readable storage medium

Abstract

The invention discloses a method and device for determining mirror image calibration parameters and a computer readable storage medium, and belongs to the technical field of communication. The method comprises the steps of obtaining a test mirror image rejection ratio based on a mirror image calibration parameter in the ith updating process of the mirror image calibration parameter; and if the end condition of the N updating processes is not met, determining a target step length corresponding to the test image rejection ratio according to the first corresponding relation, and updating the image calibration parameter based on the target step length. Wherein the first corresponding relation represents that the step length is in negative correlation with the mirror image rejection ratio, and the change rate of the step length is slowed down along with the increase of the mirror image rejection ratio, so that the proper step length can be quickly selected, and the speed of determining the mirror image calibration parameter is accelerated on the premise of ensuring the test precision.

Description

Technical Field

[0001] The present application relates to the field of communication technology, and in particular to a method, device and computer-readable storage medium for determining mirror calibration parameters. Background Art

[0002] In many wireless communication technologies, the signal to be transmitted is modulated using IQ (I stands for in-phase; Q stands for quadrature) modulation to obtain two signals, I and Q, so as to transmit the two IQ signals. When transmitting such signals, there are high requirements for the orthogonality of the two IQ signals, that is, the amplitudes of the I and Q signals must be consistent and the phases must differ by 90 degrees. Otherwise, the two IQ signals are likely to generate image interference during transmission, thereby deteriorating the performance of the communication system. Based on this, image calibration is required to ensure the performance of the communication system. Summary of the invention

[0003] The present application provides a method, device and computer-readable storage medium for determining mirror calibration parameters, which can improve the efficiency of determining mirror calibration parameters. The technical solution is as follows:

[0004] In one aspect, a method for determining a mirror calibration parameter is provided, the method comprising:

[0005] Perform N update processes on the mirror calibration parameters until the end condition is met;

[0006] The i-th update process in the N update processes includes:

[0007] Based on the image calibration parameters, a test image rejection ratio is obtained;

[0008] If the end condition is not met, then: determining a target step length corresponding to the test image suppression ratio according to the first corresponding relationship, updating the image calibration parameters based on the target step length to obtain updated image calibration parameters, and the updated image calibration parameters are used to obtain the test image suppression ratio in the (i+1)th update process; wherein the first corresponding relationship represents a corresponding relationship between the image suppression ratio and the step length, the step length is negatively correlated with the image suppression ratio, and the rate of change of the step length slows down as the image suppression ratio increases;

[0009] Wherein, N is a positive integer, and i is a positive integer not greater than N.

[0010] In a possible implementation, the first corresponding relationship characterizes the corresponding relationship between the image suppression ratio and the step length, including: the first corresponding relationship includes the corresponding relationship between the image suppression ratio range and the step length;

[0011] The step of determining a target step length corresponding to the test image suppression ratio according to the first corresponding relationship includes:

[0012] Determine a target image rejection ratio range within which the test image rejection ratio lies;

[0013] A target step size corresponding to the target image rejection ratio range is determined.

[0014] In a possible implementation, the image calibration parameters include multiple groups of parameters, different groups of parameters are different, and the test image rejection ratio includes multiple image rejection ratios corresponding to the multiple groups of parameters one by one.

[0015] In a possible implementation manner, determining a target step size corresponding to the test image suppression ratio according to the first corresponding relationship includes:

[0016] The target step length corresponding to the maximum image rejection ratio among the plurality of image rejection ratios is acquired from the first corresponding relationship.

[0017] In a possible implementation manner, updating the mirror calibration parameter based on the target step size includes:

[0018] A group of parameters corresponding to the maximum image suppression ratio among the multiple image suppression ratios is used as parameters to be updated, and the parameters to be updated are updated based on the target step size to obtain the updated image calibration parameters.

[0019] In a possible implementation manner, the termination condition is met, including: a maximum image suppression ratio among the multiple image suppression ratios exceeds a suppression ratio threshold, or i reaches an iteration number threshold.

[0020] In a possible implementation, the method is applied to a processor in a test system, the test system further comprising a compensation device, a signal sending device, an observer, and a memory;

[0021] The step of obtaining a test image suppression ratio based on the image calibration parameters includes:

[0022] The processor writes the multiple sets of parameters into the memory through a software-hardware interaction process, and instructs the observer to sequentially configure the multiple sets of parameters in the memory into the compensation device;

[0023] The processor receives the statistical values ​​corresponding to the multiple groups of parameters reported by the observer through a software-hardware interaction process; wherein the statistical value corresponding to each group of parameters is obtained by the observer performing statistics on the signals collected this time after configuring the parameters of this group, the signals collected this time are the signals transmitted by the signal generating device to the observer after the I-channel test signal and the Q-channel test signal calibrated this time, and the I-channel test signal and the Q-channel test signal calibrated this time are obtained after the compensation device performs mirror calibration on the I-channel test signal and the Q-channel test signal using the parameters of this group;

[0024] The processor determines the plurality of image suppression ratios based on statistical values ​​respectively corresponding to the plurality of groups of parameters.

[0025] In a possible implementation, the method further includes:

[0026] In the process of the processor writing the multiple groups of parameters into the memory through a software and hardware interaction process, the processor also writes the link delay into the memory through this software and hardware interaction process;

[0027] The signal collected this time is collected after the observer configures the group of parameters in the compensation device and waits for the link delay.

[0028] In a possible implementation manner, the link delay includes multiple delays corresponding one-to-one to the multiple groups of parameters.

[0029] In a second aspect, a device for determining a mirror calibration parameter is provided, the device comprising:

[0030] A parameter updating module, used for performing N updating processes on the mirror calibration parameters until an end condition is met;

[0031] The parameter updating module is specifically configured to perform the following steps in the i-th updating process of the N updating processes:

[0032] Based on the image calibration parameters, a test image rejection ratio is obtained;

[0033] If the end condition is not met, then: determining a target step length corresponding to the test image suppression ratio according to the first corresponding relationship, updating the image calibration parameters based on the target step length to obtain updated image calibration parameters, and the updated image calibration parameters are used to obtain the test image suppression ratio in the (i+1)th update process; wherein the first corresponding relationship represents a corresponding relationship between the image suppression ratio and the step length, the step length is negatively correlated with the image suppression ratio, and the rate of change of the step length slows down as the image suppression ratio increases;

[0034] Wherein, N is a positive integer, and i is a positive integer not greater than N.

[0035] In a possible implementation, the first corresponding relationship characterizes the corresponding relationship between the image suppression ratio and the step length, including: the first corresponding relationship includes the corresponding relationship between the image suppression ratio range and the step length;

[0036] The parameter updating module is specifically used for:

[0037] Determine a target image rejection ratio range within which the test image rejection ratio lies;

[0038] A target step size corresponding to the target image rejection ratio range is determined.

[0039] In a possible implementation, the image calibration parameters include multiple groups of parameters, different groups of parameters are different, and the test image rejection ratio includes multiple image rejection ratios corresponding to the multiple groups of parameters one by one.

[0040] In a possible implementation, the parameter updating module is specifically used to:

[0041] The target step length corresponding to the maximum image rejection ratio among the plurality of image rejection ratios is acquired from the first corresponding relationship.

[0042] In a possible implementation, the parameter updating module is specifically used to:

[0043] A group of parameters corresponding to the maximum image suppression ratio among the multiple image suppression ratios is used as parameters to be updated, and the parameters to be updated are updated based on the target step size to obtain the updated image calibration parameters.

[0044] In a possible implementation manner, the termination condition is met, including: a maximum image suppression ratio among the multiple image suppression ratios exceeds a suppression ratio threshold, or i reaches an iteration number threshold.

[0045] In a possible implementation, the device includes a processor in a test system, and the test system further includes a compensation device, a signal sending device, an observer, and a memory; the processor is used to:

[0046] Writing the plurality of sets of parameters into the memory through a software-hardware interaction process, and instructing the observer to sequentially configure the plurality of sets of parameters in the memory into the compensation device;

[0047] Receive the statistical values ​​corresponding to the multiple groups of parameters reported by the observer through a software and hardware interaction process; wherein the statistical value corresponding to each group of parameters is obtained by the observer performing statistics on the signals collected this time after configuring the parameters of this group, the signals collected this time are the signals transmitted by the signal generating device to the observer after the I-channel test signal and the Q-channel test signal calibrated this time, and the I-channel test signal and the Q-channel test signal calibrated this time are obtained after the compensation device performs mirror calibration on the I-channel test signal and the Q-channel test signal using the parameters of this group;

[0048] The plurality of image suppression ratios are determined based on statistical values ​​respectively corresponding to the plurality of groups of parameters.

[0049] In a possible implementation manner, the processor is further configured to:

[0050] In the process of writing the multiple groups of parameters into the memory through a software and hardware interaction process, the link delay is also written into the memory through this software and hardware interaction process;

[0051] The signal collected this time is collected after the observer configures the group of parameters in the compensation device and waits for the link delay.

[0052] In a possible implementation manner, the link delay includes multiple delays corresponding one-to-one to the multiple groups of parameters.

[0053] In a third aspect, there is provided an apparatus for determining a mirror calibration parameter, the apparatus comprising: a processor, and a memory for storing a computer program;

[0054] The processor is configured to execute the computer program to implement part or all of the steps in the method for determining the mirror calibration parameters described in the first aspect above.

[0055] In a possible implementation manner, the device is a chip.

[0056] In a fourth aspect, a test system is provided, the test system comprising a signal processing subsystem and a data processing subsystem;

[0057] The signal processing subsystem is used to generate an I-channel test signal and a Q-channel test signal, and perform mirror calibration on the I-channel test signal and the Q-channel test signal using a mirror calibration parameter;

[0058] The data processing subsystem is used to perform N updating processes on the mirror calibration parameters until an end condition is met; wherein the i-th updating process in the N updating processes includes:

[0059] Obtain a test image suppression ratio corresponding to the image calibration parameter, wherein the test image suppression ratio is an image suppression ratio determined after mirror calibration is performed on the I-channel test signal and the Q-channel test signal using the image calibration parameter; if the end condition is not met, then: determine a target step length corresponding to the test image suppression ratio according to a first corresponding relationship, update the image calibration parameter based on the target step length, and obtain an updated image calibration parameter, wherein the updated image calibration parameter is used to obtain the test image suppression ratio in the (i+1)th updating process; wherein the first corresponding relationship represents a corresponding relationship between the image suppression ratio and the step length, the step length is negatively correlated with the image suppression ratio, and the rate of change of the step length slows down as the image suppression ratio increases.

[0060] In a possible implementation, the image calibration parameters include multiple groups of parameters, different groups of parameters are different, and the test image suppression ratio includes multiple image suppression ratios corresponding to the multiple groups of parameters one by one. The multiple image suppression ratios are determined after image calibration is performed on the I-channel test signal and the Q-channel test signal respectively using the multiple groups of parameters.

[0061] In a possible implementation, the signal processing subsystem includes a compensation device, a signal sending device and an observer; the data processing subsystem includes a processor and a memory;

[0062] The processor is used to write the multiple groups of parameters into the memory through a software and hardware interaction process;

[0063] The observer is used to sequentially configure the multiple sets of parameters in the memory into the compensation device;

[0064] The compensation device is used for performing mirror calibration on the I-channel test signal and the Q-channel test signal by using the currently configured set of parameters each time a set of parameters is configured;

[0065] The signal sending device is used to transmit the calibrated I-channel test signal and Q-channel test signal to the observer;

[0066] The observer is further used to collect the I-channel test signal and the Q-channel test signal received this time, and determine the statistical values ​​of the signals collected this time, obtain the statistical values ​​corresponding to a set of parameters configured this time, and after obtaining the statistical values ​​corresponding to the multiple sets of parameters respectively, report the statistical values ​​corresponding to the multiple sets of parameters respectively to the processor through a software and hardware interaction process;

[0067] The processor is further configured to determine the plurality of image suppression ratios based on statistical values ​​respectively corresponding to the plurality of groups of parameters.

[0068] In a possible implementation, the processor is further configured to, in the process of writing the multiple groups of parameters into the memory through a software-hardware interaction process, write the link delay into the memory through the current software-hardware interaction process;

[0069] The observer is specifically used for configuring a set of parameters in the memory to the compensation device each time, and then starting to execute the step of collecting the I-channel test signal and the Q-channel test signal received this time after waiting for the link delay.

[0070] In a possible implementation manner, the link delay includes multiple delays corresponding one-to-one to the multiple groups of parameters.

[0071] In a fifth aspect, a radio frequency transceiver is provided, wherein the radio frequency transceiver is used to perform mirror calibration on a transmission signal according to the mirror calibration parameters determined by the method for determining the mirror calibration parameters provided in the first aspect.

[0072] In a possible implementation, the RF transceiver is included in a test system, and the test system is the test system provided in the fourth aspect. That is, the RF transceiver includes a signal processing subsystem. In a possible implementation, the RF transceiver also includes a data processing subsystem, wherein the data processing subsystem includes the device for determining the mirror calibration parameters provided in the third aspect.

[0073] In a sixth aspect, a computer-readable storage medium is provided, wherein the storage medium stores a computer program or instructions, and when the computer program or instructions are executed by a processor, the steps of the above-mentioned method for determining mirror calibration parameters are implemented.

[0074] In a seventh aspect, a computer program product is provided, wherein computer instructions are stored in the computer program product, and when the computer instructions are executed by a processor, the steps of the above-mentioned method for determining mirror calibration parameters are implemented.

[0075] The technical solution provided by this application can at least bring the following beneficial effects:

[0076] In the process of determining the image calibration parameters, if the end condition of the N-time update process has not been met, the target step length is selected according to the first corresponding relationship. Since the first corresponding relationship indicates that the step length is negatively correlated with the image suppression ratio, and the rate of change of the step length slows down as the image suppression ratio increases, when the test image suppression ratio is relatively small, the target step length is large and the rate of change is fast, thereby speeding up the iteration of the test image suppression ratio to meet the requirements. Compared with the solution in which the step length is always fixed, this solution can quickly select a suitable step length through the first corresponding relationship, thereby speeding up the determination of the image calibration parameters. When the test image suppression ratio is relatively large, the target step length is small and the rate of change is slow, thereby improving the test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0077] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0078] Figure 1 is a schematic diagram of a test system provided in an embodiment of the present application;

[0079] Figure 2 is a schematic diagram of another test system provided in an embodiment of the present application;

[0080] Figure 3 is a flow chart of a method for determining mirror calibration parameters provided by an embodiment of the present application;

[0081] Figure 4 is a schematic diagram of a mirror calibration method provided in an embodiment of the present application;

[0082] Figure 5 It is a schematic diagram of the principle of a test system provided in an embodiment of the present application;

[0083] Figure 6 is a structural schematic diagram of a device for determining mirror calibration parameters provided in an embodiment of the present application;

[0084] Figure 7 It is a structural schematic diagram of another device for determining mirror calibration parameters provided in an embodiment of the present application. DETAILED DESCRIPTION

[0085] In order to make the objectives, technical solutions and advantages of the embodiments of the present application clearer, the implementation methods of the present application will be further described in detail below in conjunction with the accompanying drawings.

[0086] Before explaining in detail the method for determining mirror calibration parameters provided in the embodiment of the present application, the application scenarios involved in the embodiment of the present application are first introduced.

[0087] At present, many wireless communication technologies use IQ modulation for transmission signals, such as LTE (Long Term Evolution), NR5G (5th-Generation New Radio), WiFi (Wireless Fidelity), Bluetooth and other technologies. When transmitting such signals, there are high requirements for the orthogonality of the IQ signals, that is, the amplitudes of the I and Q signals are required to be consistent, and the phase difference is 90 degrees, otherwise the IQ signals are likely to generate image interference during the transmission process, thereby deteriorating the performance of the communication system. For example, if the communication system uses OFDM (Orthogonal Frequency Division Multiplexing), the IQ signals are required to be strictly orthogonal, otherwise image interference will occur. Based on this, image calibration is required to ensure the performance of the communication system.

[0088] One solution to determine the image calibration parameters in the related art is to use a spectrum analyzer. The additional spectrum analyzer introduced in this solution increases the calibration cost, and the image suppression performance after image calibration is not stable enough. Another solution is to use a feedback channel to search for suitable image calibration parameters by traversal, in which the traversal step size is fixed, resulting in this solution usually taking a lot of search time.

[0089] The embodiment of the present application provides a method for determining mirror calibration parameters, which can effectively improve the speed of determining mirror calibration parameters, reduce time cost, and do not need to introduce instruments (such as spectrum analyzers), thereby reducing economic costs. Collecting the mirror calibration parameters determined by this solution can effectively compensate for the mirror image generated during the IQ signal transmission process, thereby improving the performance of the communication system.

[0090] The method for determining the mirror calibration parameters provided in the embodiment of the present application can be applied to a test system. After the mirror calibration parameters are determined by the test system, the mirror calibration parameters can be applied to any possible radio frequency transceiver to perform mirror calibration on the transmission signal of the radio frequency transceiver. Next, the architecture of the test system provided in the embodiment of the present application is explained in detail.

[0091] Please refer to Figure 1 , Figure 1 1 is a schematic diagram of a test system provided in an embodiment of the present application. The test system includes a signal processing subsystem and a data processing subsystem.

[0092] The signal processing subsystem is used to generate an I-channel test signal and a Q-channel test signal, and uses a mirror calibration parameter to perform mirror calibration on the IQ test signal. In a possible implementation, the signal processing subsystem is also used to transmit the mirror-calibrated IQ test signal, collect the transmitted IQ test signal (which may generate mirror interference), determine the statistical value of the collected IQ test signal, and report the statistical value to the data processing subsystem.

[0093] The data processing subsystem is used to perform N update processes on the mirror calibration parameters until the end condition is met. The i-th update process in the N update processes includes: obtaining a test mirror suppression ratio based on the mirror calibration parameters, such as determining the test mirror suppression ratio based on the received statistical value, and if the end condition is not met, then: determining a target step length corresponding to the test mirror suppression ratio according to a first corresponding relationship; updating the mirror calibration parameters based on the target step length to obtain updated mirror calibration parameters, and the updated mirror calibration parameters are used to obtain the test mirror suppression ratio in the i+1-th update process.

[0094] In one possible implementation, see Figure 2 , Figure 2 1 is a schematic diagram of another test system provided by an embodiment of the present application. The signal processing subsystem in the test system includes a compensation device, a signal sending device and an observer, and the data processing subsystem includes a processor and a memory.

[0095] The compensation device is used to perform mirror calibration on the IQ test signal using the mirror calibration parameter. The signal sending device is used to transmit the mirror-calibrated IQ test signal to the observer. The observer is used to collect the received IQ test signal, determine the statistical value of the collected IQ test signal, and report the statistical value to the processor.

[0096] The processor is used to determine the test image suppression ratio based on the received statistical value, and if the end condition is not met, determine the target step size corresponding to the test image suppression ratio according to the first corresponding relationship; update the image calibration parameter based on the target step size to obtain the updated image calibration parameter. The processor is also used to obtain the image calibration parameter used for the subsequent image calibration of the transmitted signal based on the image calibration parameter obtained in the last update process if the end condition is met. The memory is used to store the image calibration parameter.

[0097] In a possible implementation, the signal processing subsystem further includes a signal generator, which is used to generate an IQ test signal and transmit the generated IQ test signal to the compensation device. The embodiment of the present application does not limit the specific implementation of generating the IQ test signal.

[0098] In one possible implementation, the mirror calibration parameters include multiple groups of parameters, different groups of parameters have different values, and the test mirror suppression ratio includes multiple mirror suppression ratios corresponding to the multiple groups of parameters one by one. The multiple mirror suppression ratios are determined after mirror calibration is performed on the I-channel test signal and the Q-channel test signal respectively using the multiple groups of parameters.

[0099] In a possible implementation, the processor is used to write multiple sets of parameters into a memory through a software-hardware interaction process;

[0100] An observer, for sequentially configuring a plurality of sets of parameters in the memory into the compensation device;

[0101] A compensation device, for each configuration of a set of parameters, using the set of parameters configured this time to perform mirror calibration on an I-channel test signal and a Q-channel test signal;

[0102] A signal sending device, used for transmitting the calibrated I-channel test signal and Q-channel test signal to the observer;

[0103] The observer is further used to collect the I-channel test signal and the Q-channel test signal received this time, determine the statistical value of the signals collected this time, obtain the statistical value corresponding to a set of parameters configured this time, and after obtaining the statistical values ​​corresponding to the multiple sets of parameters respectively, report the statistical values ​​corresponding to the multiple sets of parameters respectively to the processor through a software and hardware interaction process;

[0104] The processor is further configured to determine a plurality of image suppression ratios based on statistical values ​​corresponding to the plurality of groups of parameters.

[0105] In a possible implementation, the processor is further configured to write the link delay into the memory through the software and hardware interaction process during a process of writing the multiple sets of parameters into the memory through the software and hardware interaction process;

[0106] The observer is specifically used to configure a set of parameters in the memory to the compensation device each time, and then start to execute the step of collecting the I-channel test signal and the Q-channel test signal received this time after waiting for the link delay.

[0107] In a possible implementation manner, the link delay includes multiple delays corresponding to multiple groups of parameters in a one-to-one manner.

[0108] The method for determining the image suppression ratio provided in the embodiment of the present application can be specifically applied to a radio frequency transceiver, which includes a device for determining image calibration parameters, and the device includes a processor and a memory.

[0109] In a possible implementation, the processor may be Figure 2 Processors in the test system shown.

[0110] In a possible implementation, the radio frequency transceiver is included in Figure 1 or Figure 2 The test system shown. That is, the RF transceiver includes a signal processing subsystem. In a possible implementation, the RF transceiver also includes a data processing subsystem. The data processing subsystem includes the device for determining the mirror calibration parameters provided in the embodiment of the present application.

[0111] In a possible implementation, the device for determining the image calibration parameters may be a chip, such as a DSP (digital signal processing) chip, or may be a computer device including a processor or a DSP chip.

[0112] It should be noted that the application scenarios and system architectures described in the embodiments of the present application are intended to more clearly illustrate the technical solutions of the embodiments of the present application, and do not constitute a limitation on the technical solutions provided in the embodiments of the present application. A person of ordinary skill in the art can appreciate that with the evolution of application scenarios and system architectures, the technical solutions provided in the embodiments of the present application are equally applicable to similar technical problems.

[0113] Next, the method for determining the mirror calibration parameters provided in the embodiment of the present application is explained in detail.

[0114] Figure 3 is a flow chart of a method for determining mirror calibration parameters provided by an embodiment of the present application. The method is applied to a test system, and some or all steps of the method can be executed by a processor in the test system. Figure 3 The method includes: performing N updating processes on the mirror calibration parameters until the end condition is met. The i-th updating process in the N updating processes includes the following steps.

[0115] Step 301: Obtain a test image rejection ratio based on an image calibration parameter.

[0116] The test image suppression ratio is an image suppression ratio determined after image calibration is performed on an I-channel test signal and a Q-channel test signal using an image calibration parameter.

[0117] In the embodiment of the present application, the image calibration parameter is determined by an IQ test signal, and the IQ test signal includes an I-channel test signal and a Q-channel test signal. The IQ test signal is obtained by performing IQ modulation on the test signal to be transmitted.

[0118] The IQ test signal is mirror-calibrated (also called mirror compensation, or compensation for short) using mirror calibration parameters and then transmitted. The transmitted IQ test signal (which may produce mirror interference) is collected, and the statistical value of the collected IQ test signal is determined, and then the test mirror suppression ratio is determined based on the statistical value.

[0119] It should be understood that the method for determining the mirror calibration parameters provided in the embodiment of the present application is implemented in an iterative manner, that is, N update processes (i.e., N rounds of update processes) are performed on the mirror calibration parameters. Among them, the mirror calibration parameters of the first round can be preset parameters, and the mirror calibration parameters of the non-first round are the mirror calibration parameters updated using this solution.

[0120] In a possible implementation, the first-round mirror calibration parameters include a plurality of pre-configured parameters, and the non-first-round mirror calibration parameters are obtained by updating the plurality of pre-configured parameters of the previous round.

[0121] The update operation is performed based on the target step size, and the update operation includes increasing the target step size and / or subtracting the target step size. Based on this, the updated mirror calibration parameters may include more than one set of parameters, for example, multiple sets of parameters are included, and these multiple sets of parameters are different, for example, one set of parameters is obtained by adding the target step size to the first preconfigured parameters, another set of parameters is obtained by subtracting the target step size from the first preconfigured parameters, another set of parameters is obtained by adding the target step size to the second preconfigured parameters, and another set of parameters is obtained by subtracting the target step size from the second preconfigured parameters.

[0122] Taking the multiple pre-configured parameters including phase compensation parameters (denoted as P) and gain compensation parameters (denoted as G) as an example, after updating P and G, at least one set of parameters is obtained, and the at least one set of parameters is the mirror calibration parameters after this update. Taking one set of parameters as an example, the set of parameters can be [P+step, G+step], [P+step, G], respectively. Taking two sets of parameters as an example, the two sets of parameters can be [P, G+step], [P+step, G], respectively. Taking four sets of parameters as an example, the four sets of parameters can be [P, G+step], [P, G-step], [P+step, G], [P-step, G], respectively. Taking six sets of parameters as an example, the four sets of parameters can be [P, G+step], [P, G-step], [P+step, G], [P-step, G], [P+step, G+step], [P-step, G-step], respectively. Of course, there are many other possibilities for the at least one set of parameters, which are not listed here one by one.

[0123] The mirror calibration parameters in step 301 are mirror calibration parameters in the i-th round (i.e., in the i-th update process), where i is a positive integer not greater than N. The mirror calibration parameters before the N-th round may also be referred to as pre-compensation parameters, and the mirror calibration parameters obtained in the N-th round may also be referred to as compensation parameters or target mirror calibration parameters.

[0124] When i is equal to 1, the mirror calibration parameters of the i-th round include a set of parameters, and the above-mentioned test mirror rejection ratio includes an IRR (Image Rejection Ratio), which is determined after mirror calibration of the I-way test signal and the Q-way test signal using this set of parameters. Of course, in some embodiments, when i is equal to 1, the mirror calibration parameters of the i-th round may also include multiple sets of parameters, and these multiple sets of parameters are multiple sets of pre-configured parameters, that is, multiple sets of parameters are pre-configured for the first round of mirror calibration.

[0125] In some embodiments, when i is greater than 1, the mirror calibration parameters of the i-th round include multiple groups of parameters, different groups of parameters are different, and the above-mentioned test mirror suppression ratio includes multiple IRRs corresponding to the multiple groups of parameters, and the multiple IRRs are determined after mirror calibration is performed on the I-channel test signal and the Q-channel test signal respectively using the multiple groups of parameters. That is, in these embodiments, the mirror calibration parameters of the first round include one group of parameters, and the test mirror suppression ratio of the first round includes one IRR, while the mirror calibration parameters of the non-first round include multiple groups of parameters, and the test mirror suppression ratio of the non-first round includes multiple IRRs.

[0126] In other embodiments, when i is greater than 1, the image calibration parameters of the i-th round include a set of parameters, and the test image rejection ratio includes an IRR, which is determined after the I-channel test signal and the Q-channel test signal are image-calibrated using the set of parameters. That is, in these embodiments, the image calibration parameters of each round include a set of parameters, and the test image rejection ratio of each round also includes an IRR.

[0127] Next, taking the case where the first-round image calibration parameters include one set of parameters and the non-first-round image calibration parameters include multiple sets of parameters as an example, a specific implementation method for obtaining the test image suppression ratio is introduced.

[0128] In a possible implementation, the test system includes a signal processing subsystem and a data processing subsystem, the signal processing subsystem uses the image calibration parameter to perform image calibration on the IQ test signal before transmitting, collects the transmitted IQ test signal (which may generate image interference), determines the statistical value of the collected IQ test signal, and reports the statistical value to the data processing subsystem. The data processing subsystem determines the test image suppression ratio based on the received statistical value.

[0129] Among them, the mirror calibration parameters are the mirror calibration parameters of the i-th round.

[0130] When i is equal to 1, the signal processing subsystem uses a set of parameters included in the image calibration parameters to perform image calibration on the IQ test signal before transmission, collects the transmitted IQ test signal (which may generate image interference), determines the statistical value of the collected IQ test signal (i.e., the statistical value corresponding to this set of parameters), and reports the statistical value to the data processing subsystem. The data processing subsystem determines the test image suppression ratio based on the received statistical value.

[0131] In a possible implementation manner, the statistical value includes at least one of a sum of squares of an I-path test signal, a sum of squares of a Q-path test signal, and a sum of products of I and Q test signals.

[0132] The sum of the squares of the I-channel test signal, the Q-channel test signal, and the product of the IQ test signal are denoted as SUM(I 2 )、SUM(Q 2 ) and SUM(I*Q), in the embodiment of the present application, N represents the number of sampling points, which can also be called the statistical length.

[0133] The data processing subsystem can determine the test image suppression ratio based on the statistical value according to formulas (1) to (3).

[0134]

[0135] When i is greater than 1, the signal processing subsystem uses the multiple groups of parameters included in the image calibration parameters to perform image calibration on the IQ test signal respectively and then transmits it, collects the multiple groups of IQ test signals that have been transmitted, determines the statistical value of each group of IQ test signals collected, obtains the statistical value corresponding to this group of parameters, and reports the statistical value corresponding to each group of parameters to the data processing subsystem. The data processing subsystem determines multiple image suppression ratios included in the test image suppression ratio based on the received multiple groups of statistical values.

[0136] Among them, for each group of parameters in the multiple groups of parameters, the signal processing subsystem determines the corresponding statistical value in the same way as the first-round statistical value, and the data processing subsystem determines the corresponding image suppression ratio based on each group of statistical values ​​in the same way as the first-round image suppression ratio, which will not be repeated here.

[0137] In a possible implementation, the signal processing subsystem includes a compensation device, a signal sending device and an observer, and the data processing subsystem includes a processor and a memory. The compensation device uses an image calibration parameter to perform image calibration on the IQ test signal. The signal sending device transmits the image-calibrated IQ test signal to the observer. The observer collects the received IQ test signal, determines the statistical value of the collected IQ test signal, and reports the statistical value to the processor. The processor determines the test image suppression ratio based on the received statistical value.

[0138] In an embodiment of the present application, some or all of the operations performed by the processor are implemented based on software, while the compensation device, the signal sending device, the observer and the memory are implemented based on hardware, or based on a combination of software and hardware. An embodiment of the present application relates to the interaction between software and hardware between the processor and the observer. For example, the processor stores the image calibration parameters in the memory through the software and hardware interaction process so that the hardware part (such as the observer, the compensation device, etc.) can obtain and use the image calibration parameters. For example, the observer reports the above-mentioned statistical value to the processor through the software and hardware interaction process so that the processor determines the test image suppression ratio based on the statistical value.

[0139] As can be seen from the above, the mirror calibration parameters may include multiple groups of parameters. For example, when i is greater than 1, the mirror calibration parameters of the i-th round include multiple groups of parameters. In order to reduce the software and hardware interaction process and improve the efficiency of determining the mirror calibration parameters, in an embodiment of the present application, the processor writes the multiple groups of parameters into the memory through a software and hardware interaction process, rather than writing a group of parameters in sequence through multiple software and hardware interaction processes.

[0140] Of course, in some other embodiments, the processor may also write a set of parameters in sequence through multiple software and hardware interaction processes. In some other embodiments, the observer may also report the statistical values ​​corresponding to the multiple sets of parameters to the processor through multiple software and hardware interaction processes.

[0141] After the processor writes the multiple groups of parameters into the memory, it instructs the observer to sequentially configure the multiple groups of parameters in the memory in the compensation device. Afterwards, the processor receives the statistical values ​​corresponding to the multiple groups of parameters reported by the observer through a software and hardware interaction process, and determines the multiple image suppression ratios based on the statistical values ​​corresponding to the multiple groups of parameters. Among them, the statistical value corresponding to each group of parameters is obtained by the observer performing statistics on the signal collected this time after configuring this group of parameters. The signal collected this time is the signal that the signal generating device transmits the calibrated I-channel test signal and Q-channel test signal to the observer. The calibrated I-channel test signal and Q-channel test signal are obtained after the compensation device uses this group of parameters to perform mirror calibration on the I-channel test signal and the Q-channel test signal.

[0142] That is, after the processor writes the multiple sets of parameters into the memory, the observer sequentially configures the multiple sets of parameters in the memory into the compensation device. Each time a set of parameters is configured, the compensation device uses the set of parameters configured this time to perform mirror calibration on the I-way test signal and the Q-way test signal, and the signal sending device transmits the calibrated I-way test signal and the Q-way test signal to the observer. The observer collects the I-way test signal and the Q-way test signal received this time, and determines the statistical value of the signal collected this time, and obtains the statistical value corresponding to the set of parameters configured this time. After obtaining the statistical values ​​corresponding to the multiple sets of parameters, the observer reports the statistical values ​​corresponding to the multiple sets of parameters to the processor through a software-hardware interaction process. The processor receives the statistical values ​​corresponding to the multiple sets of parameters reported by the observer through a software-hardware interaction process, and determines multiple mirror suppression ratios based on the statistical values ​​corresponding to the multiple sets of parameters.

[0143] Compared with reporting the statistical values ​​corresponding to the multiple groups of parameters to the processor through multiple software and hardware interaction processes, in an embodiment of the present application, the observer reports the statistical values ​​corresponding to the multiple groups of parameters to the processor through one software and hardware interaction process, which can also reduce the software and hardware interaction process.

[0144] Among them, one implementation method in which the observer sequentially configures multiple groups of parameters in the memory into the compensation device is: after the multiple groups of parameters are written into the memory, the observer sends a configuration instruction to the compensation device once; before the observer obtains the statistical value corresponding to the last group of parameters, the observer sends a configuration instruction to the compensation device once each time it obtains the statistical value corresponding to a group of parameters; each time the compensation device receives a configuration instruction, it configures a group of parameters that have not been configured in the memory into the compensation device.

[0145] In a possible implementation, the signal sending device may continuously send the IQ test signal. Accordingly, the observer may continuously receive the IQ test signal. However, the IQ test signal received by the observer is continuously mirror-calibrated by a certain set of parameters. The observer needs to know which set of parameters is used for the mirror-calibration of the IQ test signal received at that time.

[0146] In an embodiment of the present application, each time the observer configures a set of parameters in the memory to the compensation device, the observer needs to know how long to wait before the collected signal is the signal after the mirror calibration using the mirror calibration parameters configured this time. In order to solve this problem, in the process of the processor writing multiple sets of parameters to the memory through a software and hardware interaction process, the processor also writes the link delay to the memory through this software and hardware interaction process. In this way, each time the observer configures a set of parameters in the memory to the compensation device, it waits for the link delay before starting to execute the steps of collecting the I-channel test signal and the Q-channel test signal received this time. That is, by configuring the link delay, the observer knows how long to wait before the collected signal is the signal after this calibration.

[0147] In a possible implementation, considering that the time for mirror calibration of the IQ test signal and transmission to the observer using different sets of parameters may be different, the link delay in the embodiment of the present application may include multiple delays corresponding to the above multiple sets of parameters. Of course, in some other embodiments, the time for mirror calibration of the IQ test signal and transmission to the observer using different sets of parameters may be similar, then the link delay may also include one delay, that is, multiple sets of parameters correspond to the same link delay.

[0148] Step 302: Determine whether the end condition is met.

[0149] That is, after obtaining the test image rejection ratio, it is determined whether the end condition is satisfied.

[0150] If the end condition is not met, the following steps 303 to 304 are executed. If the end condition is met, and the mirror calibration parameters in this update process include one set of parameters, the target mirror calibration parameters are obtained after step 304 is executed. If the end condition is met, but the mirror calibration parameters in this update process include multiple sets of parameters, step 305 is executed to select one set of parameters as the target mirror calibration parameters. That is, step 305 is a step that can be selected according to actual conditions.

[0151] Wherein, the end condition includes that the test image suppression ratio exceeds the suppression ratio threshold, or i reaches the iteration number threshold. It should be understood that if the suppression ratio threshold is set and the iteration number threshold is not set, the end condition is determined to be satisfied by judging whether the test image suppression ratio exceeds the suppression ratio threshold, that is, when the test image suppression ratio exceeds the suppression ratio threshold, the end condition is determined to be satisfied. If the iteration number threshold is set but the suppression ratio threshold is not set, the end condition is determined to be satisfied by judging whether i reaches the iteration number threshold, that is, when i reaches the iteration number threshold, the end condition is determined to be satisfied. If the iteration number threshold and the suppression ratio threshold are set, if the test image suppression ratio exceeds the suppression ratio threshold before i reaches the iteration number threshold, the end condition is determined to be satisfied, and if the test image suppression ratio still does not exceed the suppression ratio threshold when i reaches the iteration number threshold, the end condition is also determined to be satisfied.

[0152] As can be seen from the above, the tested image suppression ratio may include multiple image suppression ratios. If the tested image suppression ratio includes multiple image suppression ratios, then in a possible implementation, the tested image suppression ratio exceeding the suppression ratio threshold includes: the maximum image suppression ratio among the multiple image suppression ratios exceeds the suppression ratio threshold. The tested image suppression ratio not exceeding the suppression ratio threshold includes: the maximum image suppression ratio among the multiple image suppression ratios does not exceed the suppression ratio threshold.

[0153] The suppression ratio threshold may be a preset threshold, such as 70 dB, 80 dB or other values. In different application scenarios, the suppression ratio threshold may be different, and the setting of the suppression ratio threshold is related to the indicator requirements of the application scenario. For example, the suppression ratio threshold in the LTE (long-term Evolution) terminal scenario may be 40 dB, and the suppression ratio threshold in the base station scenario may be 60 dB.

[0154] Step 303: determining a target step length corresponding to the test image suppression ratio according to the first corresponding relationship; wherein the first corresponding relationship represents a corresponding relationship between the image suppression ratio and the step length, the step length is negatively correlated with the image suppression ratio, and a rate of change of the step length slows down as the image suppression ratio increases.

[0155] Since the step size is negatively correlated with the image suppression ratio in the first corresponding relationship, and the rate of change of the step size slows down as the image suppression ratio increases, when the test image suppression ratio is relatively small, the target step size is large and the rate of change is fast, thereby speeding up the iteration of the test image suppression ratio to meet the requirements. Compared with the scheme in which the step size is always fixed, this scheme can quickly select a suitable step size according to the first corresponding relationship, thereby speeding up the determination of the image calibration parameters. When the test image suppression ratio is relatively large, the target step size is small and the rate of change is slow, thereby improving the test accuracy.

[0156] In a possible implementation, the first corresponding relationship includes a corresponding relationship between an image suppression ratio range and a step length. For example, the first corresponding relationship is a relationship table, and the relationship table includes multiple image suppression ratio ranges and step lengths corresponding to the multiple image suppression ratio ranges. An implementation method for determining a target step length corresponding to a test image suppression ratio according to the first corresponding relationship is: determining a target image suppression ratio range in which the test image suppression ratio is located; and determining a target step length corresponding to the target image suppression ratio range.

[0157] If the tested image suppression ratio includes one image suppression ratio, a target image suppression ratio range in which the image suppression ratio is located is determined from the multiple image suppression ratio ranges. If the tested image suppression ratio includes multiple image suppression ratios, a maximum image suppression ratio among the multiple image suppression ratios is determined, and a target image suppression ratio range in which the maximum image suppression ratio is located is determined from the multiple image suppression ratio ranges.

[0158] Table 1 is a relationship table provided in an embodiment of the present application. The target step length may be selected according to the relationship table shown in Table 1. It should be understood that Table 1 is only used as an example and is not intended to limit the embodiments of the present application.

[0159] Table 1

[0160] IRR / dB Step Length (60,+infinity] 0.001 (56,60] 0.002 (50,56] 0.003 (46,50] 0.006 (40,46] 0.01 (36,40] 0.02 (30,36] 0.03 (27,30] 0.06 (0～27] 0.09

[0161] Step 304: updating the mirror calibration parameters based on the target step length to obtain updated mirror calibration parameters.

[0162] Among them, the mirror calibration parameters are the mirror calibration parameters of the i-th round (i.e., the i-th updating process). When the mirror calibration parameters of the i-th round include multiple groups of parameters, the test mirror suppression ratio includes multiple mirror suppression ratios, and the implementation method of updating the mirror calibration parameters based on the target step size is: a group of parameters corresponding to the maximum mirror suppression ratio among the multiple mirror suppression ratios is used as parameters to be updated, and based on the target step size, the parameters to be updated are updated to obtain updated mirror calibration parameters, i.e., the mirror calibration parameters of the i+1-th round.

[0163] The specific implementation method of updating the parameters to be updated based on the target step size can refer to the relevant introduction of updating multiple pre-configured parameters in step 301, which will not be repeated here.

[0164] After the image calibration parameters are updated, the test image rejection ratio is reacquired using the updated image calibration parameters, that is, step 301 is re-executed until the acquired test image rejection ratio meets the rejection ratio condition.

[0165] Step 305: Obtain target mirror calibration parameters based on the mirror calibration parameters in this update process.

[0166] After the test image suppression ratio obtained based on the image calibration parameters in the current update process (for example, after the last update) meets the suppression ratio condition, the image calibration parameters are obtained based on the image calibration parameters in the current update process.

[0167] If the image calibration parameters in this updating process include a set of parameters, the set of parameters obtained after executing step 304 is the target image calibration parameters. If the image calibration parameters in this updating process include multiple sets of parameters, it means that the tested image suppression ratio includes multiple image suppression ratios, and a set of parameters corresponding to the maximum image suppression ratio is determined as the target image calibration parameters, that is, a set of parameters with the best image suppression performance is selected as the target image calibration parameters.

[0168] It should be understood that if the end condition is satisfied during the first round of updating, the target mirror calibration parameters are obtained based on the mirror calibration parameters of the first round.

[0169] If the first-round image calibration parameters include a set of parameters, then this set of parameters is used as the target image calibration parameters. If the first-round image calibration parameters include multiple sets of parameters, it means that the tested image suppression ratio includes multiple image suppression ratios, then a set of parameters corresponding to the maximum image suppression ratio is determined as the target image calibration parameters, that is, a set of parameters with the best image suppression performance is selected as the target image calibration parameters.

[0170] Next, the method for determining the mirror calibration parameters provided in the embodiment of the present application is explained again in another description manner.

[0171] In an embodiment of the present application, the mirror calibration parameters of the i-th round are used to perform mirror calibration on the I-channel test signal and the Q-channel test signal to be transmitted, where i is an integer greater than 0; based on the transmitted I-channel test signal and the Q-channel test signal of the i-th round, the test mirror suppression ratio of the i-th round is determined; if the i-th round does not meet the end condition, the step length corresponding to the test mirror suppression ratio of the i-th round is determined according to the first corresponding relationship to obtain the target step length, wherein the first corresponding relationship characterizes that the step length is negatively correlated with the mirror suppression ratio, and the rate of change of the step length slows down as the mirror suppression ratio increases; based on the target step length, the mirror calibration parameters of the i-th round are updated to obtain the mirror calibration parameters of the i+1th round; the mirror calibration parameters of the i+1th round are used to continue to perform the step of mirror calibration on the I-channel test signal and the Q-channel test signal to be transmitted; if the i-th round meets the end condition, the target mirror calibration parameters are obtained based on the mirror calibration parameters of the i-th round.

[0172] Among them, when i is 1, the mirror calibration parameters of the i-th round include a set of parameters, which include preset phase compensation parameters and gain compensation parameters. The above-mentioned mirror calibration process includes one calibration, and the mirror suppression ratio of the i-th round includes an mirror suppression ratio.

[0173] In a possible implementation, when i is greater than 1, the mirror calibration parameters of the i-th round include multiple groups of parameters. Taking the pre-configured parameters of the i-1th round including two parameters (such as a phase compensation parameter and a gain compensation parameter) as an example, the multiple groups of parameters may include four groups of parameters, and any one of the four groups of parameters includes an unupdated parameter and an updated parameter, the unupdated parameter is a pre-configured parameter of the i-1th round, and the updated parameter is obtained by updating another pre-configured parameter of the i-1th round, and the update includes adding a target step size or subtracting a target step size.

[0174] In other words, the first group of parameters in the four groups of parameters includes the phase compensation parameters of the i-1th round and the increased gain compensation parameters, the second group of parameters includes the phase compensation parameters of the i-1th round and the reduced gain compensation parameters, the third group of parameters includes the increased phase compensation parameters and the gain compensation parameters of the i-1th round, the fourth group of parameters includes the reduced phase compensation parameters and the gain compensation parameters of the i-1th round, the increased gain compensation parameters are obtained by adding the target step length to the gain compensation parameters of the i-1th round, the reduced gain compensation parameters are obtained by subtracting the target step length from the gain compensation parameters of the i-1th round, the increased phase compensation parameters are obtained by adding the target step length to the phase compensation parameters of the i-1th round, and the reduced phase compensation parameters are obtained by subtracting the target step length from the phase compensation parameters of the i-1th round. Among them, the gain compensation parameters and phase compensation parameters of the i-1th round refer to the mirror calibration parameters of the i-1th round.

[0175] Figure 4 is a schematic diagram of a mirror calibration method provided in an embodiment of the present application. Figure 4 The I-channel test signal and Q-channel test signal to be calibrated are represented by X I and X Q The calibrated I-channel test signal and Q-channel test signal are represented by Z I and Z Q , Z I =X I , Z Q =X I *P+X Q *G.

[0176] Apart from Figure 4 In addition to the mirror calibration method shown, other mirror calibration methods may also be used, and the embodiments of the present application are not limited to this.

[0177] Figure 5 Schematic diagram of a test system provided by an embodiment of the present application. Take the test system including a signal generator, a compensation device, a signal sending device, an observer, a processor and a memory as an example. Figure 5 The signal generator is used to generate a signal. The compensation device is also called a mirror compensator. The mirror compensator is used to pre-compensate the signal of the signal generator and send the pre-compensated signal to the signal sending device. Pre-compensation can be understood as pre-calibrating the signal so that the signal after mirror calibration has a better image suppression ratio. The signal sending device can be recorded as TX (transport). TX sends the signal through the RF (radio frequency) antenna. Figure 5 TX is represented as TX RF in FIG. The signal processed by the signal generator and the image compensator may be a digital signal.

[0178] The observer can be recorded as ORX (observation receiver). ORX is a feedback path, which can adjust the image suppression ratio by obtaining the TX signal. In this case, the TX signal obtained by ORX can also be called an IQ test signal. ORX also sends signals through the RF antenna. Figure 5 ORX includes ORX RF and components for collecting signals and determining statistical values. Figure 5 The signals transmitted by TX RF and ORX RF are analog signals. After the analog signals are converted into digital signals by ADC (analog-to-digital conversion), the ORX statistical device collects the digitized IQ test signals, determines the statistical value of the collected IQ test signals, and reports the statistical value to the processor. The statistical value includes SUM(I 2 )、SUM(Q 2 ) and SUM(I*Q).

[0179] Among them, in the first round of iteration, the mirror calibration parameters include a set of parameters and a set of statistical values. The processor calculates an IRR based on this set of statistical values ​​(this part of the first round of iteration is not shown in the figure). If this IRR does not exceed the target threshold, the processor selects the target step size (denoted as step) based on this IRR through the above-mentioned table lookup method, and updates this set of parameters based on the target step size to obtain the mirror calibration parameters (including four sets of parameters) in the next round of iteration. The updated four sets of parameters will be configured in the mirror compensator in turn for the next round of iteration. These four sets of parameters include P_u, P_d, G_u, and G_d, respectively. Among them, P_u=P+step, P_d=P-step, G_u=G+step, G_d=G+step, P and G are pre-configured parameters in the first round of iteration, that is, a preset set of parameters.

[0180] In the non-first round iteration process, the mirror calibration parameters include multiple sets of parameters, and the statistical values ​​also have multiple sets. Taking four sets of parameters as an example, the processor calculates four IRRs based on the four sets of statistical values: Figure 5 The largest IRR among these four IRRs ( Figure 5 The maximum IRR is denoted as IRR_best) and compared with the target threshold. If the maximum IRR does not exceed the target threshold, the processor selects the target step size (denoted as step) through the above-mentioned table lookup method, and updates a set of parameters corresponding to the maximum IRR based on the target step size to obtain the mirror calibration parameters (also including four sets of parameters) in the next round of iteration. The four sets of parameters obtained after the update will continue to be configured in the mirror compensator for the next round of iteration. The four sets of parameters include P_u, P_d, G_u, and G_d, respectively. Among them, P_u=P+step, P_d=P-step, G_u=G+step, G_d=G+step, P and G are the pre-configured parameters in the previous round of iteration, that is, the optimal set of parameters in the previous round of iteration. This part of the operations performed by the processor mainly includes DSP (digital signal processing), and secondly includes operations such as software and hardware interaction.

[0181] After the last round of iterations is completed, the optimal set of parameters in this round of iterations is configured in the image compensator to be used for image calibration of subsequent signals.

[0182] In a possible implementation, after each acquisition of the test image suppression ratio, when the test image suppression ratio includes a plurality of image suppression ratios, a set of parameters corresponding to the maximum image suppression ratio among the plurality of image suppression ratios is configured to the compensation device (e.g. Figure 5 In the mirror compensator in the compensation device, the processor reads the set of parameters in the compensation device, updates the read set of parameters based on the target step size, and after obtaining the updated multiple sets of parameters, the updated multiple sets of parameters are sequentially configured in the compensation device to perform the next round of iteration. In this way, the compensation device is used to temporarily store the set of parameters with the best performance in this round of iteration, so that the processor can read this set of parameters without the need for additional memory. Of course, in other possible implementations, the processor can also obtain the set of parameters with the best performance from the data cached by the software in this round of iteration. In some other possible implementations, the set of parameters with the best performance in each round can also be stored in any other device, and the embodiments of the present application are not limited to this.

[0183] In an embodiment of the present application, the RF operating frequencies of the signal transmitting device and the observer are different to reduce RF interference. For example, the RF operating frequency of the observer is equal to the RF operating frequency of the signal transmitting device plus or minus the frequency offset. The frequency offset is, for example, 5 MHz (megahertz). Accordingly, in the process of calculating IRR, it is necessary to eliminate the influence of the frequency offset. For example, assuming that the signal received by the observer is y(n), then it is necessary to shift y(n) to 0 intermediate frequency to obtain y new (n), determine y new The statistical value of (n) is obtained and the IRR is calculated based on the statistical value.

[0184] in, f sniff represents frequency offset, Fs represents sampling frequency, n=[0, N-1], and N represents the number of sampling points.

[0185] In summary, in the embodiment of the present application, in the process of determining the mirror calibration parameters, if the end condition of the N-time update process has not been met, the target step length is selected according to the first corresponding relationship. Since the first corresponding relationship indicates that the step length is negatively correlated with the mirror suppression ratio, and the rate of change of the step length slows down as the mirror suppression ratio increases, when the test mirror suppression ratio is relatively small, the target step length is relatively large and the rate of change is relatively fast, thereby speeding up the iteration of the test mirror suppression ratio to meet the requirements. Compared with the solution in which the step length is always fixed, the present solution can quickly select a suitable step length through the first corresponding relationship, thereby speeding up the determination of the mirror calibration parameters. When the test mirror suppression ratio is relatively large, the target step length is relatively small and the rate of change is relatively slow, thereby improving the test accuracy.

[0186] All the above optional technical solutions can be combined in any way to form optional embodiments of the present application, and the embodiments of the present application will not be described in detail one by one.

[0187] Figure 6 600 is a schematic diagram of a structure of a device 600 for determining a mirror calibration parameter provided in an embodiment of the present application. The device 600 can be implemented by software, hardware, or a combination of both to form part or all of a test system. The test system can be Figure 1 or Figure 2 Please refer to the test system shown. Figure 6 , the device 600 includes: a parameter updating module 601.

[0188] A parameter updating module 601 is used to perform N updating processes on the mirror calibration parameters until an end condition is met;

[0189] The parameter updating module 601 is specifically configured to perform the following steps in the ith updating process during the N updating processes:

[0190] Based on the image calibration parameters, a test image rejection ratio is obtained;

[0191] If the end condition is not met, then: determining a target step length corresponding to the test image suppression ratio according to the first corresponding relationship, updating the image calibration parameters based on the target step length, obtaining updated image calibration parameters, and using the updated image calibration parameters to obtain the test image suppression ratio in the (i+1)th update process; wherein the first corresponding relationship represents a corresponding relationship between the image suppression ratio and the step length, the step length is negatively correlated with the image suppression ratio, and the rate of change of the step length slows down as the image suppression ratio increases;

[0192] Wherein, N is a positive integer, and i is a positive integer not greater than N.

[0193] In one possible implementation, see Figure 7 , the parameter updating module 601 includes an acquisition submodule 6011, a step size determination submodule 6012 and a parameter updating submodule 6013;

[0194] An acquisition submodule 6011 is used to acquire a test image suppression ratio based on an image calibration parameter;

[0195] A step length determination submodule 6012 is used to determine a target step length corresponding to the test image suppression ratio according to the first corresponding relationship if the end condition is not met;

[0196] The parameter updating submodule 6013 is used to update the mirror calibration parameters based on the target step length to obtain updated mirror calibration parameters.

[0197] In a possible implementation, the first corresponding relationship characterizes the corresponding relationship between the image suppression ratio and the step length, including: the first corresponding relationship includes the corresponding relationship between the image suppression ratio range and the step length;

[0198] The parameter updating module 601 is specifically used for (for example, the step size determination submodule 6012 is specifically used for):

[0199] Determine a target image rejection ratio range within which the image rejection ratio to be tested lies;

[0200] Determine the target step size corresponding to the target image rejection ratio range.

[0201] In a possible implementation, the image calibration parameters include multiple groups of parameters, different groups of parameters have different parameters, and the image rejection ratio test includes multiple image rejection ratios corresponding to the multiple groups of parameters one by one.

[0202] In a possible implementation, the parameter updating module 601 is specifically used (such as the step size determination submodule 6012 is specifically used):

[0203] A target step length corresponding to a maximum image suppression ratio among the plurality of image suppression ratios is obtained from the first corresponding relationship.

[0204] In a possible implementation, the parameter updating module 601 is specifically used (such as the parameter updating submodule 6013 is specifically used):

[0205] A set of parameters corresponding to the maximum image suppression ratio among the multiple image suppression ratios is used as parameters to be updated, and the parameters to be updated are updated based on the target step size to obtain updated image calibration parameters.

[0206] In a possible implementation manner, the termination condition is met, including: a maximum image suppression ratio among a plurality of image suppression ratios exceeds a suppression ratio threshold, or i reaches an iteration number threshold.

[0207] In a possible implementation, the device 600 includes a processor in a test system, and the test system also includes a compensation device, a signal sending device, an observer, and a memory; the processor is used to:

[0208] Writing multiple sets of parameters into a memory through a software-hardware interaction process, and instructing the observer to sequentially configure the multiple sets of parameters in the memory into the compensation device;

[0209] The statistical values ​​corresponding to the multiple groups of parameters reported by the observer through a software and hardware interaction process are received; wherein the statistical values ​​corresponding to each group of parameters are obtained by the observer performing statistics on the signals collected this time after configuring the parameters of this group, the signals collected this time are the signals transmitted by the signal generating device to the observer after the calibration of the I-channel test signal and the Q-channel test signal, and the calibrated I-channel test signal and the Q-channel test signal are obtained after the compensation device performs mirror calibration on the I-channel test signal and the Q-channel test signal using the parameters of this group;

[0210] A plurality of image suppression ratios are determined based on statistical values ​​respectively corresponding to a plurality of groups of parameters.

[0211] In a possible implementation, the processor includes the above-mentioned parameter updating module 601.

[0212] In a possible implementation, the processor is further configured to:

[0213] In the process of writing multiple sets of parameters into the memory through a software-hardware interaction process, the link delay is also written into the memory through this software-hardware interaction process;

[0214] The signal collected this time is collected after the observer configures this group of parameters in the compensation device and waits for the link delay.

[0215] In a possible implementation manner, the link delay includes multiple delays corresponding to multiple groups of parameters in a one-to-one manner.

[0216] In the embodiment of the present application, in the process of determining the mirror calibration parameters, if the end condition of the N-time update process has not been met, the target step length is selected according to the first corresponding relationship. Since the first corresponding relationship indicates that the step length is negatively correlated with the mirror suppression ratio, and the rate of change of the step length slows down as the mirror suppression ratio increases, when the test mirror suppression ratio is relatively small, the target step length is relatively large and the rate of change is relatively fast, thereby speeding up the iteration of the test mirror suppression ratio to meet the requirements. Compared with the solution in which the step length is always fixed, this solution can quickly select a suitable step length through the first corresponding relationship, thereby speeding up the determination of the mirror calibration parameters. When the test mirror suppression ratio is relatively large, the target step length is relatively small and the rate of change is relatively slow, thereby improving the test accuracy.

[0217] It should be noted that: the device for determining the mirror calibration parameters provided in the above embodiment only uses the division of the above functional modules as an example when determining the mirror calibration parameters. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above. In addition, the device for determining the mirror calibration parameters provided in the above embodiment and the method embodiment for determining the mirror calibration parameters belong to the same concept. The specific implementation process is detailed in the method embodiment and will not be repeated here.

[0218] The embodiment of the present application also provides a device for determining a mirror calibration parameter, the device comprising: a processor, and a memory for storing a computer program;

[0219] The processor is configured to execute a computer program to implement some or all steps in the method embodiment for determining mirror calibration parameters.

[0220] In one possible implementation, the device is a chip, such as a DSP chip or other chips. In another possible implementation, the device is a computer device, which includes a memory, a processor or a DSP chip, etc.

[0221] An embodiment of the present application further provides a radio frequency transceiver, which is used to perform mirror calibration on a transmission signal according to the mirror calibration parameters determined by the method for determining the mirror calibration parameters provided in the above embodiment.

[0222] In a possible implementation, the radio frequency transceiver is included in a test system, wherein the test system can be Figure 1 or Figure 2The test system shown. That is, the radio frequency transceiver includes a signal processing subsystem. In a possible implementation, the radio frequency transceiver also includes a data processing subsystem, wherein the data processing subsystem includes the device for determining the mirror calibration parameter provided in the above embodiment.

[0223] The present application also provides a computer-readable storage medium, which stores a computer program, and when the computer program is executed by the controller, the steps of the method for determining the mirror calibration parameters in the above embodiment are implemented. For example, the computer-readable storage medium can be a ROM (read-only memory), a RAM (random access memory), a CD-ROM (compact disc read-only memory), a magnetic tape, a floppy disk, an optical data storage device, etc.

[0224] It is worth noting that the computer-readable storage medium mentioned in the embodiments of the present application may be a non-volatile storage medium, in other words, a non-transitory storage medium.

[0225] It should be understood that all or part of the steps to implement the above embodiments can be implemented by software, hardware, firmware or any combination thereof. When implemented using software, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. The computer instructions can be stored in the above-mentioned computer readable storage medium.

[0226] That is, in some embodiments, a computer program product is further provided, wherein computer instructions are stored in the computer program product, and when the computer instructions are executed by the controller, the steps of the method for determining the mirror calibration parameters are implemented.

[0227] It should be understood that the "at least one" mentioned herein refers to one or more, and "multiple" refers to two or more. In the description of the embodiments of the present application, unless otherwise specified, " / " means or, for example, A / B can mean A or B; "and / or" in this article is only a description of the association relationship of the associated objects, indicating that there can be three relationships, for example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone. In addition, in order to facilitate the clear description of the technical solutions of the embodiments of the present application, in the embodiments of the present application, the words "first", "second" and the like are used to distinguish the same items or similar items with basically the same functions and effects. Those skilled in the art can understand that the words "first", "second" and the like do not limit the quantity and execution order, and the words "first", "second" and the like do not limit them to be necessarily different.

[0228] It should be noted that the information (including but not limited to user device information, user personal information, etc.), data (including but not limited to data used for analysis, stored data, displayed data, etc.) and signals involved in the embodiments of the present application are all authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data need to comply with relevant laws, regulations and standards of relevant countries and regions.

[0229] The above-mentioned embodiments are provided for the present application and are not intended to limit the present application. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application shall be included in the protection scope of the present application.

Claims

1. A method for determining mirror calibration parameters, characterized in that: The method comprises: Perform N update processes on the mirror calibration parameters until the end condition is met; The i-th update process in the N update processes includes: Based on the image calibration parameters, a test image rejection ratio is obtained; If the end condition is not met, then: determining a target step length corresponding to the test image suppression ratio according to the first corresponding relationship, updating the image calibration parameters based on the target step length to obtain updated image calibration parameters, and the updated image calibration parameters are used to obtain the test image suppression ratio in the (i+1)th update process; wherein the first corresponding relationship represents a corresponding relationship between the image suppression ratio and the step length, the step length is negatively correlated with the image suppression ratio, and the rate of change of the step length slows down as the image suppression ratio increases; Wherein, N is a positive integer, and i is a positive integer not greater than N.

2. The method according to claim 1, characterized in that The first corresponding relationship characterizes the corresponding relationship between the image suppression ratio and the step length, including: the first corresponding relationship includes the corresponding relationship between the image suppression ratio range and the step length; The step of determining a target step length corresponding to the test image suppression ratio according to the first corresponding relationship includes: Determine a target image rejection ratio range within which the test image rejection ratio lies; A target step size corresponding to the target image rejection ratio range is determined.

3. The method according to claim 1, characterized in that The image calibration parameters include multiple groups of parameters, and different groups of parameters have different parameters. The test image suppression ratio includes multiple image suppression ratios corresponding to the multiple groups of parameters one by one.

4. The method according to claim 3, characterized in that The step of determining a target step length corresponding to the test image suppression ratio according to the first corresponding relationship includes: The target step length corresponding to the maximum image rejection ratio among the plurality of image rejection ratios is acquired from the first corresponding relationship.

5. The method according to claim 3, characterized in that The updating of the mirror calibration parameters based on the target step length includes: A group of parameters corresponding to the maximum image suppression ratio among the multiple image suppression ratios is used as parameters to be updated, and the parameters to be updated are updated based on the target step size to obtain the updated image calibration parameters.

6. The method according to any one of claims 3 to 5, characterized in that: The termination condition is met, including: the maximum image suppression ratio among the multiple image suppression ratios exceeds a suppression ratio threshold, or the i reaches an iteration number threshold.

7. The method according to any one of claims 3 to 5, characterized in that: The method is applied to a processor in a test system, the test system also comprising a compensation device, a signal sending device, an observer and a memory; The step of obtaining a test image suppression ratio based on the image calibration parameters includes: The processor writes the multiple sets of parameters into the memory through a software-hardware interaction process, and instructs the observer to sequentially configure the multiple sets of parameters in the memory into the compensation device; The processor receives the statistical values ​​corresponding to the multiple groups of parameters reported by the observer through a software-hardware interaction process; wherein the statistical value corresponding to each group of parameters is obtained by the observer performing statistics on the signals collected this time after configuring the parameters of this group, the signals collected this time are the signals transmitted by the signal generating device to the observer after the I-channel test signal and the Q-channel test signal calibrated this time, and the I-channel test signal and the Q-channel test signal calibrated this time are obtained after the compensation device performs mirror calibration on the I-channel test signal and the Q-channel test signal using the parameters of this group; The processor determines the plurality of image suppression ratios based on statistical values ​​respectively corresponding to the plurality of groups of parameters.

8. The method according to claim 7, characterized in that The method further comprises: In the process of the processor writing the multiple groups of parameters into the memory through a software and hardware interaction process, the processor also writes the link delay into the memory through this software and hardware interaction process; The signal collected this time is collected after the observer configures the group of parameters in the compensation device and waits for the link delay.

9. The method according to claim 8, characterized in that The link delay includes a plurality of delays corresponding one-to-one to the plurality of groups of parameters.

10. A device for determining mirror calibration parameters, characterized in that: The device comprises: A parameter updating module, used for performing N updating processes on the mirror calibration parameters until an end condition is met; The parameter updating module is specifically configured to perform the following steps in the i-th updating process of the N updating processes: Based on the image calibration parameters, a test image rejection ratio is obtained; If the end condition is not met, then: determining a target step length corresponding to the test image suppression ratio according to the first corresponding relationship, updating the image calibration parameters based on the target step length to obtain updated image calibration parameters, and the updated image calibration parameters are used to obtain the test image suppression ratio in the (i+1)th update process; wherein the first corresponding relationship represents a corresponding relationship between the image suppression ratio and the step length, the step length is negatively correlated with the image suppression ratio, and the rate of change of the step length slows down as the image suppression ratio increases; Wherein, N is a positive integer, and i is a positive integer not greater than N.

11. A device for determining mirror calibration parameters, characterized in that: The device comprises a processor and a memory, wherein the memory is used to store a computer program, and the processor is used to execute the computer program to implement the method of any one of claims 1 to 9.

12. The device according to claim 11, characterized in that The device is a chip.

13. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores instructions, and when the instructions are executed by a processor, the method of any one of claims 1 to 9 is implemented.

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