Set top box voltage test system and test method

Abstract

The invention discloses a voltage test system and test method for a set top box, and relates to the technical field of voltage test.A voltage test terminal is arranged to measure the voltage of each test point in the set top box, and a test feedback module matches the voltage of each test point with a corresponding preset standard voltage evaluation interval; voltage feedback data of the set top box is obtained based on a matching result, and a feedback interaction module receives the voltage feedback data of the set top box and then obtains a plurality of granulation feature codes subjected to multiple superposition mapping in combination with a system interaction matrix constructed by 16 binary numbers; according to a plurality of granulation feature codes, the voltage feedback data is converted to obtain feedback interaction data of the set top box, and the feedback interaction data is received, restored and stored by the cloud test management module, so that on one hand, the problem of potential safety hazards caused by dependence on a secret key in the conversion process of the feedback interaction data of the set top box is solved; and on the other hand, maintenance and management resources for data security encryption are reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of voltage testing, and in particular to a voltage testing system and a testing method for a set-top box. Background Art

[0002] With the continuous development of science and technology, set-top boxes play an increasingly important role in people's daily lives, providing users with rich multimedia content and services. However, in the development, production and maintenance of set-top boxes, accurate testing of their internal voltage is crucial. Accurate voltage test data can not only reflect the working status and performance of the set-top box, but also has important significance for product quality control, fault diagnosis and troubleshooting, and subsequent optimization and improvement.

[0003] In the current technological environment, the protection of set-top box voltage test data has not received enough attention. These voltage data contain key information of the internal circuit of the set-top box, such as the stability of the power module and the working status of the chip. Once leaked, they may be obtained and analyzed by competitors, thus posing a serious threat to the company's technological advantages and market competitiveness.

[0004] The existing voltage test system has many deficiencies in data protection. Among them, the method of mainly relying on keys for data encryption has obvious security risks. On the one hand, the management and storage of keys are prone to loopholes. Once the keys are stolen or cracked, the entire encryption system will be useless. On the other hand, the encryption method that relies solely on keys is relatively weak in the face of complex network attacks and data theft methods, and it is difficult to provide sufficient security.

[0005] In order to solve the above problems, the present invention proposes a solution. Summary of the invention

[0006] The purpose of the present invention is to provide a voltage testing system and a testing method for a set-top box, in order to solve the problems raised in the above background technology.

[0007] The purpose of the present invention can be achieved through the following technical solutions:

[0008] A voltage test system for a set-top box, including a test feedback module and a feedback interaction module;

[0009] The test feedback module is used to determine the voltage value of each test point in the set-top box under different working conditions to obtain voltage feedback data of the set-top box, wherein the determination results are divided into normal and abnormal;

[0010] A feedback interaction module is used to generate a 16*4 matrix according to two binary numbers of 0 to 15 after receiving the voltage feedback data, transpose the matrix to obtain a base interaction matrix, and then number each row in the base interaction matrix starting from 1 and continuing thereafter;

[0011] For each column of elements in the base interactive matrix, the elements in the same column are concatenated to obtain 16 groups of base matrix sequences. For all elements in each group of base matrix sequences, non-zero determination is performed in turn, and the digital numbers corresponding to the rows where the non-zero elements are located in the base interactive matrix are extracted to obtain the number codes of each group of base matrix sequences.

[0012] Based on the character length of each group of binary matrix sequence number codes, the number codes with the same character length are classified into the same list to obtain one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists, wherein the character lengths of the number codes in the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists are 1, 2, 3 and 4 respectively;

[0013] Associate and map the binary numbers 00, 01, 10, and 11 with the one-dimensional, two-dimensional, three-dimensional, and four-dimensional feature lists respectively;

[0014] Then, several granulation lists based on the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists are constructed respectively based on the total number of elements in the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists, and the granulation feature codes of each element in all granulation lists are obtained according to the binary numbers corresponding to the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists and the subscripts and number codes of the elements in the corresponding granulation lists;

[0015] Several groups of feedback conversion codes obtained by dividing the voltage feedback data of the set-top box in binary format are matched with each element in all granular lists in turn for consistency, and the granular conversion codes of the consistent elements are obtained to obtain the dimensional feature code of each group of feedback conversion codes. The dimensional feature codes of all groups of feedback conversion codes are spliced ​​to obtain the feedback interaction data of the set-top box.

[0016] Furthermore, it also includes a voltage test terminal for measuring the voltage value of each test point in the set-top box under different preset working conditions.

[0017] Furthermore, different working states include a power-on state, a standby state, and a state of running a specific function.

[0018] The voltage testing method of the set-top box comprises the following steps:

[0019] Step 1: The voltage test terminal measures the voltage values ​​of various test points in the set-top box under different preset working conditions to obtain voltage measurement data of the set-top box;

[0020] Step 2: The test feedback module determines the voltage values ​​of each test point in the set-top box under different working states contained in the received voltage measurement data of the set-top box to obtain the voltage feedback data of the set-top box;

[0021] Step 3: After receiving the voltage feedback data, the feedback interaction module is used to first generate a 16*4 matrix according to the two-bit binary numbers of 0 to 15, transpose the matrix to obtain a base interaction matrix, and then number each row in the base interaction matrix starting from 1 and continuing thereafter;

[0022] Step 4: Based on the character length of each group of binary matrix sequence code, the code with the same character length is classified into the same list to obtain one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists, and the binary numbers 00, 01, 10, 11 are associated with the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists respectively;

[0023] Step 5: construct several granulation lists based on the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists respectively based on the total number of elements in the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists, and obtain the granulation feature code of each element in all granulation lists according to the binary numbers corresponding to the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists and the subscripts and number codes of the elements in the corresponding granulation lists;

[0024] Step 6: The feedback conversion codes obtained by dividing the voltage feedback data of the set-top box in binary format are matched with each element in all granular lists in turn, and the granular conversion codes of the consistent elements are obtained to obtain the dimensional feature code of each group of feedback conversion codes, and the dimensional feature codes of all groups of feedback conversion codes are spliced ​​to obtain the feedback interaction data of the set-top box;

[0025] Step 7: The cloud test management module receives and restores the feedback interaction data of the set-top box, obtains the voltage feedback data of the set-top box, and stores the voltage feedback data.

[0026] Beneficial effects of the present invention:

[0027] (1) The present invention measures the voltage of each test point in the set-top box by setting a voltage test terminal, and the test feedback module matches the voltage of each test point with its corresponding preset standard voltage evaluation interval, and obtains the voltage feedback data of the set-top box based on the matching result. After receiving the voltage feedback data of the set-top box, the feedback interaction module combines the base interaction matrix constructed by 16 binary numbers to obtain a number of granular feature codes after multiple superposition mappings, and converts the voltage feedback data according to the number of granular feature codes to obtain feedback interaction data of the set-top box, which is received, restored and stored by the cloud test management module. In this way, on the one hand, the conversion process of the feedback interaction data of the set-top box is free from the problem of security risks caused by relying on keys, and on the other hand, the maintenance and management resources used for data security encryption are reduced;

[0028] (2) In the process of obtaining a plurality of granular feature codes, the present invention first obtains 16 binary numbers corresponding to each row in the binary interactive matrix, and obtains the corresponding binary matrix sequence based on each row, performs non-zero determination on all elements in the binary matrix sequence, extracts the digital numbers corresponding to the rows where the non-zero elements are located in the binary interactive matrix, and obtains the numbering code of each group of binary matrix sequences. Based on this, a mapping is completed, and then based on the character length of the numbering code of each group of binary matrix sequences, the numbering codes with the same character length are classified into the same list to obtain one-, two-, three-, and four-dimensional feature lists, and are combined with the two-digit binary numbers 00, 01, 10, and 11 for mapping. Associative mapping is performed to complete the second mapping. Then, for each dimensional feature list, several granular lists of each dimensional feature list are constructed based on the total number of elements in the list. The number of elements in the granular list is at most 2 and at least 1. The granular feature code of each element is constructed based on the subscript of the element in the granular list and the dimensional feature list from which the granular list comes to complete the third mapping. The superposition of these three mappings increases the complexity and security of the feedback interaction data conversion logic, and increases the difficulty of cracking. On the other hand, encryption logic is used instead of keys to provide sufficient security for feedback interaction data in the face of complex network attacks and data theft methods. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] The present invention will be further described below in conjunction with the accompanying drawings.

[0030] Figure 1 is a system block diagram of the present invention;

[0031] Figure 2 It is a flow chart of the working method of the feedback interaction module in the present invention. DETAILED DESCRIPTION

[0032] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0033] like Figure 1 , 2 As shown, a voltage test system and test method for a set-top box include a voltage test terminal, a test feedback module, a feedback interaction module and a cloud test management terminal;

[0034] The voltage test terminal is used to test the voltage of each test point in the set-top box;

[0035] At the current moment, the voltage test terminal measures the voltage value of each test point in the set-top box under different preset working states to obtain voltage measurement data of the set-top box, wherein the voltage measurement data includes the voltage value of each test point in the set-top box under different working states;

[0036] In this embodiment, each test point in the set-top box is selected by the tester according to the circuit design and technical implementation inside the set-top box;

[0037] In this embodiment, different working states include a power-on state, a standby state, and a state of running a specific function, wherein the specific function is a number of functions involved in the voltage test defined by the tester based on the performance and technical implementation of the set-top box;

[0038] The voltage test terminal transmits the voltage measurement data of the set-top box to the test feedback module, which is used to feed back the voltage test result of the set-top box. The test feedback module pre-stores the preset standard voltage evaluation intervals of each test point of the set-top box under different working conditions;

[0039] After receiving the voltage measurement data transmitted to the set-top box, the test feedback module matches the voltage value of each test point in the set-top box under different working conditions with the corresponding standard voltage evaluation interval;

[0040] For the voltage value of any test point in a certain working state, if the voltage value is within the corresponding standard voltage evaluation interval, it is determined that the voltage value of the test point in the working state is normal; otherwise, it is determined that the voltage value of the test point in the working state is abnormal;

[0041] Generate result feedback data of the test point in the working state according to the determination result and the voltage value of the test point in the working state;

[0042] Based on the above, voltage feedback data of the set-top box is generated according to the determination result data of each test point in the set-top box under different working conditions;

[0043] Transmitting the voltage feedback data of the set-top box to a feedback interaction module;

[0044] The feedback interaction module is used to transmit the voltage feedback data of the set-top box to the cloud management terminal for storage;

[0045] After receiving the transmitted voltage feedback data of the set-top box, the feedback interaction module interacts the voltage feedback data of the set-top box according to a preset data interaction rule. The data interaction rule is as follows:

[0046] S11: generating a 16×4 matrix according to the two-digit binary numbers of the 16 numbers 0 to 15, that is, the number of rows of the matrix is ​​16 and the number of columns is 4, and in the matrix, from top to bottom, the 1st, 2nd, ..., 16th rows are filled with all the characters constituting the two-digit binary numbers of the numbers 0, 1, ..., 15 in sequence;

[0047] The elements filled in the first row are the characters of the 1st, 2nd, 3rd and 4th digits of the two-bit binary number constituting the number 0 from left to right, where the 1st, 2nd, 3rd and 4th digits of the two-bit binary number are described in order from left to right. Similarly, the elements filled in the second, third, ..., 16th rows are the characters of the 1st, 2nd, 3rd and 4th digits of the two-bit binary number constituting the number 1, 2, ..., 15;

[0048] S12: Transpose the matrix to obtain a new matrix, and mark the obtained new matrix as a base interaction matrix;

[0049] S13: Based on the binary interaction matrix, each row in the binary interaction matrix is ​​numbered from top to bottom, and the numbering starts from 1 and goes on. At this time, the numbering of the 1st, 2nd, 3rd, and 4th rows in the binary interaction matrix is ​​1, 2, 3, and 4, respectively;

[0050] S14: Based on the base interaction matrix, 16 base matrix sequences and their number codes are obtained according to a preset acquisition rule. The acquisition rule is as follows:

[0051] S141: Obtain all elements in the first column of the base interaction matrix in order from top to bottom, and concatenate all the obtained elements in the order of obtaining to obtain a set of base matrix sequences based on the base interaction matrix, wherein the first column is described in order from left to right;

[0052] S142: in S141, each time an element located in the first column of the binary interactive matrix is ​​obtained, the element is judged to be non-zero. If the element is non-zero, a digital number corresponding to the row number of the element in the binary interactive matrix is ​​obtained, and the digital number is used as the basic number of the element. Otherwise, no processing is performed;

[0053] After all elements in the first column of the binary interactive matrix are obtained, the basic numbers of all non-zero elements are concatenated in the order of acquisition to obtain the number code of the binary matrix sequence in S141;

[0054] S143: according to S141 to S142, all elements located in the 2nd, 3rd, ..., 16th columns of all the binary interactive matrices are obtained in sequence to obtain 15 groups of binary matrix sequences and their number codes;

[0055] S15: Traverse the number codes of the 16-group binary matrix sequence and obtain one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists based on the binary matrix sequence according to the preset classification rules based on the character length of the number code. The classification rules are as follows:

[0056] S151: Create four empty lists, which are marked as a one-dimensional feature list, a two-dimensional feature list, a three-dimensional feature list, and a four-dimensional feature list in sequence;

[0057] S152: according to the order in which each group of base matrix sequences is obtained, the number codes of all groups of base matrix sequences are traversed in turn, and each time the number code of a group of base matrix sequences is traversed, the character length is determined, and if the character length is 1, it is added to the one-dimensional feature list, if the character length is 2, it is added to the two-dimensional feature list, if the character length is 3, it is added to the three-dimensional feature list, and if the character length is 4, it is added to the four-dimensional feature list;

[0058] S153: After all the number codes of the binary matrix sequences are added, based on the two-digit binary numbers 00, 01, 10, and 11, in the order of the two-digit binary numbers 00, 01, 10, and 11, the two-digit binary number 00 is associated with the one-dimensional feature list, the two-digit binary number 01 is associated with the two-dimensional feature list, the two-digit binary number 10 is associated with the three-dimensional feature list, and the two-digit binary number 11 is associated with the four-dimensional feature list;

[0059] Sequentially associate and map the two-digit binary numbers 00, 01, 10, and 11 with the one-dimensional, two-dimensional, three-dimensional, and four-dimensional feature lists;

[0060] S16: constructing several granulation lists based on the one-dimensional feature list, and obtaining the granulation feature code of each element in the granulation list according to a preset mapping rule, as follows:

[0061] S161: using the formula A1=ceil(6 / 2) to create A1 empty lists based on the one-dimensional feature list. In this embodiment, A1=3. The lists are used as granulated lists based on the one-dimensional feature list and are marked as B1, B2 and B3 respectively. The value 6 in the formula is the total number of elements in the one-dimensional feature list, and ceil() is a round-up function.

[0062] S162: extract all elements in the one-dimensional feature list from left to right, and mark them as B1, B2, ..., Ba, and classify every two elements into a granulation list based on the one-dimensional feature list in the order of B1, B2, ..., Ba. The order in which the granulation list is classified is B1, B2, B3.

[0063] According to the order of binary numbers 00, 01, 10, 11, the granulation lists B1, B2 and B3 are associated with the binary numbers 00, 01, 10 in turn;

[0064] S163: After the association mapping in S162 is established, first obtain all elements in the granulation list B1, and concatenate the subscript of each element in the granulation list and the binary number 00 that establishes the association mapping with the granulation list B1 to obtain the granulation code of each element in the granulation list B1. It should be noted that in the granulation code concatenation process, the binary number 00 comes first and the element subscript comes later;

[0065] S164: concatenating the granulation code of each element in the granulation list B1 and the binary number corresponding to the one-dimensional feature list to obtain the granulation feature code of each element in the granulation list B1;

[0066] It should be noted here that in the splicing process, the binary data corresponding to the one-dimensional feature list is spliced ​​first, and the granulation code of the element is spliced ​​later;

[0067] S165: According to S163 to S164, the granulation feature code of each element in the granulation lists B2 and B3 is obtained in turn;

[0068] S17: constructing several granulation lists based on the two-dimensional, three-dimensional, and four-dimensional feature lists in sequence according to S16, and obtaining a granulation feature code of each element in the several granulation lists based on each dimensional feature list, wherein each dimensional feature list refers to a two-dimensional, three-dimensional, and four-dimensional feature list;

[0069] It should be noted here that the concatenation of the granulation feature codes of all elements in several granulation lists based on the two-dimensional, three-dimensional, and four-dimensional feature lists is based on the binary numbers corresponding to the two-dimensional, three-dimensional, and four-dimensional feature lists, respectively;

[0070] S18: performing binary conversion on the voltage feedback data of the set-top box, and recalibrating the converted data as feedback conversion data of the set-top box;

[0071] In order from left to right, all characters constituting the feedback conversion data are in order from left to right, with every four characters as a group of feedback conversion codes, to obtain a plurality of groups of feedback conversion codes, and in accordance with the order of each group of feedback conversion codes in the feedback conversion data, all groups of feedback conversion codes are marked in sequence as C1, C2, ..., Cc, where c≥1;

[0072] S19: Search and obtain the dimension feature codes of the feedback conversion codes C1, C2, ..., Cc according to the preset search rules. The search rules are as follows:

[0073] S191: Compare the feedback conversion code C1 with the 16-group binary matrix sequence for consistency, obtain the number code corresponding to the binary matrix sequence consistent with the feedback conversion code C1, find the granular feature code corresponding to the element consistent with the number code in several granular lists of the D1 dimensional feature list based on the character length D1 of the coded code, and use the granular feature code as the dimensional feature code of the feedback conversion code C1;

[0074] S192: According to S191, dimensional feature codes of feedback conversion codes C2, C3, ..., Cc are obtained in sequence;

[0075] According to the order of feedback conversion codes C2, C3, ..., Cc, their dimensional feature codes are spliced ​​to obtain feedback interaction data of the set-top box, and the feedback interaction module transmits the test interaction data of the set-top box to the cloud test management terminal;

[0076] A cloud test management terminal is used to manage the voltage feedback data of the set-top box. After receiving the transmitted test interaction data of the set-top box, the cloud test management terminal restores the test interaction data of the set-top box to obtain the voltage feedback data of the set-top box, and stores the voltage feedback data.

[0077] In the description of the specification, the description with reference to the terms "one embodiment", "example", "specific example", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0078] The above contents are merely examples and explanations of the present invention. Those skilled in the art may make various modifications or additions to the specific embodiments described or replace them in a similar manner. As long as they do not deviate from the invention or exceed the scope defined by the claims, they shall all fall within the protection scope of the present invention.

[0079] The above is a detailed description of an embodiment of the present invention, but the content is only a preferred embodiment of the present invention and cannot be considered to limit the scope of implementation of the present invention. All equivalent changes and improvements made within the scope of the present invention should still fall within the scope of the patent coverage of the present invention.

Claims

1. The voltage test system of the set-top box is characterized by: Including test feedback module and feedback interaction module; The test feedback module is used to determine the voltage value of each test point in the set-top box under different working conditions to obtain voltage feedback data of the set-top box, wherein the determination results are divided into normal and abnormal; A feedback interaction module is used to generate a 16*4 matrix according to two binary numbers of 0 to 15 after receiving the voltage feedback data, transpose the matrix to obtain a base interaction matrix, and then number each row in the base interaction matrix starting from 1 and continuing thereafter; For each column of elements in the base interactive matrix, the elements in the same column are concatenated to obtain 16 groups of base matrix sequences. For all elements in each group of base matrix sequences, non-zero determination is performed in turn, and the digital numbers corresponding to the rows where the non-zero elements are located in the base interactive matrix are extracted to obtain the number codes of each group of base matrix sequences. Based on the character length of each group of binary matrix sequence number codes, the number codes with the same character length are classified into the same list to obtain one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists, wherein the character lengths of the number codes in the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists are 1, 2, 3 and 4 respectively; Associate and map the binary numbers 00, 01, 10, and 11 with the one-dimensional, two-dimensional, three-dimensional, and four-dimensional feature lists respectively; Then, several granulation lists based on the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists are constructed respectively based on the total number of elements in the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists, and the granulation feature codes of each element in all granulation lists are obtained according to the binary numbers corresponding to the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists and the subscripts and number codes of the elements in the corresponding granulation lists; Several groups of feedback conversion codes obtained by dividing the voltage feedback data of the set-top box in binary format are matched with each element in all granular lists in turn for consistency, and the granular conversion codes of the consistent elements are obtained to obtain the dimensional feature code of each group of feedback conversion codes. The dimensional feature codes of all groups of feedback conversion codes are spliced ​​to obtain the feedback interaction data of the set-top box.

2. The voltage test system for a set-top box according to claim 1, characterized in that: It also includes a voltage test terminal for measuring the voltage value of each test point in the set-top box under different preset working conditions.

3. The voltage test system for a set-top box according to claim 1, characterized in that: Different working states include power-on state, standby state and specific function running state.

4. The voltage test system for a set-top box according to claim 1, characterized in that: The steps to obtain the 16-base matrix sequence and its number code are as follows: S13: Based on the binary interaction matrix, number each row in the binary interaction matrix in order from top to bottom, and the numbering starts from 1 and goes on. At this time, the numbering of the 1st, 2nd, 3rd, and 4th rows in the binary interaction matrix is ​​1, 2, 3, and 4 respectively; S14: Based on the base interaction matrix, 16 base matrix sequences and their number codes are obtained according to a preset acquisition rule. The acquisition rule is as follows: S141: Obtain all elements in the first column of the base interaction matrix in order from top to bottom, and concatenate all the obtained elements in the order of obtaining to obtain a set of base matrix sequences based on the base interaction matrix, wherein the first column is described in order from left to right; S142: in S141, each time an element located in the first column of the binary interactive matrix is ​​obtained, the element is judged to be non-zero. If the element is non-zero, a digital number corresponding to the row number of the element in the binary interactive matrix is ​​obtained, and the digital number is used as the basic number of the element. Otherwise, no processing is performed; After all elements in the first column of the binary interactive matrix are obtained, the basic numbers of all non-zero elements are concatenated in the order of acquisition to obtain the number code of the binary matrix sequence in S141; S143: According to S141 to S142, all elements located in the 2nd, 3rd, ..., 16th columns of all the base interactive matrices are obtained in sequence to obtain 15 groups of base matrix sequences and their number codes.

5. The voltage test system for a set-top box according to claim 4, characterized in that: The steps to get one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists are as follows: S151: Create four empty lists, which are marked as a one-dimensional feature list, a two-dimensional feature list, a three-dimensional feature list, and a four-dimensional feature list in sequence; S152: according to the order in which each group of base matrix sequences is obtained, the number codes of all groups of base matrix sequences are traversed in turn, and each time the number code of a group of base matrix sequences is traversed, the character length is determined, and if the character length is 1, it is added to the one-dimensional feature list, if the character length is 2, it is added to the two-dimensional feature list, if the character length is 3, it is added to the three-dimensional feature list, and if the character length is 4, it is added to the four-dimensional feature list; S153: After all the number codes of the binary matrix sequences are added, based on the two-digit binary numbers 00, 01, 10, 11, in the order of the two-digit binary numbers 00, 01, 10, 11, the two-dimensional, two-dimensional, three-dimensional, and four-dimensional feature lists are sequentially associated and mapped.

6. The voltage test system for a set-top box according to claim 5, characterized in that: The steps to obtain the granulation feature code of each element in all granulation lists are as follows: S16: constructing several granulation lists based on the one-dimensional feature list, and obtaining the granulation feature code of each element in the granulation list according to a preset mapping rule, as follows: S161: using the formula A1=ceil(6 / 2) to create A1 empty lists based on the one-dimensional feature list, and using the lists as granulated lists based on the one-dimensional feature list, and marking them as B1, B2 and B3 respectively, the value 6 in the formula is the total number of elements in the one-dimensional feature list, and ceil() is a round-up function; S162: extract all elements in the one-dimensional feature list from left to right, and mark them as B1, B2, ..., Ba, and classify every two elements into a granulation list based on the one-dimensional feature list in the order of B1, B2, ..., Ba. The order in which the granulation list is classified is B1, B2, B3. According to the order of binary numbers 00, 01, 10, 11, the granulation lists B1, B2 and B3 are associated with the binary numbers 00, 01, 10 in turn; S163: After the association mapping in S162 is established, first obtain all elements in the granulation list B1, concatenate the subscript of each element in the granulation list and the binary number 00 established for the association mapping of the granulation list B1, and obtain the granulation code of each element in the granulation list B1; S164: concatenating the granulation code of each element in the granulation list B1 and the binary number corresponding to the one-dimensional feature list to obtain the granulation feature code of each element in the granulation list B1; S165: According to S163 to S164, the granulation feature code of each element in the granulation lists B2 and B3 is obtained in turn; S17: According to S16, several granulation lists based on two-dimensional, three-dimensional, and four-dimensional feature lists are constructed in sequence, and the granulation feature code of each element in the several granulation lists based on each dimensional feature list is obtained, wherein each dimensional feature list refers to a two-dimensional, three-dimensional, and four-dimensional feature list.

7. The voltage test system for a set-top box according to claim 6, characterized in that: The steps to obtain the feedback interaction data of the set-top box are as follows: S18: performing binary conversion on the voltage feedback data of the set-top box, and recalibrating the converted data as feedback conversion data of the set-top box; In order from left to right, all characters constituting the feedback conversion data are in order from left to right, with every four characters as a group of feedback conversion codes, to obtain a plurality of groups of feedback conversion codes, and in accordance with the order of each group of feedback conversion codes in the feedback conversion data, all groups of feedback conversion codes are marked in sequence as C1, C2, ..., Cc, where c≥1; S19: Search and obtain the dimension feature codes of the feedback conversion codes C1, C2, ..., Cc according to the preset search rules. The search rules are as follows: S191: Compare the feedback conversion code C1 with the 16-group binary matrix sequence for consistency, obtain the number code corresponding to the binary matrix sequence consistent with the feedback conversion code C1, find the granular feature code corresponding to the element consistent with the number code in several granular lists of the D1 dimensional feature list based on the character length D1 of the coded code, and use the granular feature code as the dimensional feature code of the feedback conversion code C1; S192: According to S191, dimensional feature codes of feedback conversion codes C2, C3, ..., Cc are obtained in sequence; In the order of the feedback conversion codes C2, C3, ..., Cc, their dimensional feature codes are concatenated to obtain the feedback interaction data of the set-top box.

8. The voltage testing system for a set-top box according to claim 1, characterized in that: It also includes a cloud test management module for restoring and storing feedback interaction data of the set-top box.

9. A voltage testing method for a set-top box, characterized in that: The following steps are involved: Step 1: The voltage test terminal measures the voltage values ​​of various test points in the set-top box under different preset working conditions to obtain voltage measurement data of the set-top box; Step 2: The test feedback module determines the voltage values ​​of each test point in the set-top box under different working states contained in the received voltage measurement data of the set-top box to obtain the voltage feedback data of the set-top box; Step 3: After receiving the voltage feedback data, the feedback interaction module is used to first generate a 16*4 matrix according to the two-bit binary numbers of 0 to 15, transpose the matrix to obtain a base interaction matrix, and then number each row in the base interaction matrix starting from 1 and continuing thereafter; Step 4: Based on the character length of each group of binary matrix sequence code, the code with the same character length is classified into the same list to obtain one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists, and the binary numbers 00, 01, 10, 11 are associated with the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists respectively; Step 5: construct several granulation lists based on the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists respectively based on the total number of elements in the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists, and obtain the granulation feature code of each element in all granulation lists according to the binary numbers corresponding to the one-dimensional, two-dimensional, three-dimensional and four-dimensional feature lists and the subscripts and number codes of the elements in the corresponding granulation lists; Step 6: The feedback conversion codes obtained by dividing the voltage feedback data of the set-top box in binary format are matched with each element in all granular lists in turn, and the granular conversion codes of the consistent elements are obtained to obtain the dimensional feature code of each group of feedback conversion codes, and the dimensional feature codes of all groups of feedback conversion codes are spliced ​​to obtain the feedback interaction data of the set-top box; Step 7: The cloud test management module receives and restores the feedback interaction data of the set-top box, obtains the voltage feedback data of the set-top box, and stores the voltage feedback data.

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