Wavelength measurement method and device, storage medium and computer program product

Abstract

The invention discloses a wavelength measurement method and device, a storage medium and a computer program product, and relates to the technical field of photoelectricity, the wavelength measurement device comprises a light beam lead-in port, a light beam collimation tube lens, a pinhole placement tube lens and a photoelectric detection part which are sequentially arranged along a light path, the photoelectric detection part is in communication connection with a main control part, and a light source to be detected is arranged. Light emitted by a light source to be detected sequentially passes through the light beam leading-in port, the light beam collimating tube lens and the pinhole placement tube lens to be diffracted; collecting a diffraction pattern generated by the to-be-detected light source through a photoelectric detection part; and inputting the diffraction pattern into a target wavelength measurement model to obtain wavelength information output by the target wavelength measurement model. According to the invention, the technical effects of simplifying the structure of wavelength measurement equipment and improving the convenience of wavelength measurement are realized.

Description

Technical Field

[0001] The present invention relates to the field of optoelectronic technology, and in particular to a wavelength measurement method, device, storage medium and computer program product. Background Art

[0002] With the development of science and technology, wavelength detection is a technology often used in scientific research, industrial applications and education. At present, the mainstream wavelength detection equipment mainly includes spectrometers, wavelength meters and other equipment. These devices can provide high detection accuracy, but these devices are very complex in structure, relatively difficult to operate, and expensive, which makes them difficult to be widely used in industrial applications and education.

[0003] The main advantage of existing products is their extremely high accuracy, but many usage scenarios do not require very high accuracy, such as the measurement of the main wavelength of display devices, teaching demonstrations, etc., so there is an urgent need for a wavelength detection device that is inexpensive, easy to operate and easy to carry while meeting a certain measurement accuracy. Summary of the invention

[0004] The main purpose of the present invention is to provide a wavelength measurement method, device, storage medium and computer program product, aiming to solve the technical problems of high cost and inconvenient portability of existing products, and to improve the applicability in scenarios such as main wavelength measurement of display devices and teaching demonstration.

[0005] To achieve the above object, the present invention proposes a wavelength measurement method, which is applied to a wavelength measurement device, wherein the wavelength measurement device comprises a beam introduction port, a beam collimating lens, a pinhole placement lens, and a photoelectric detection component which are sequentially arranged along an optical path, wherein the photoelectric detection component is communicatively connected with a main control component, and the method comprises: Setting a light source to be tested so that the light emitted by the light source to be tested passes through the light beam introduction port, the light beam collimating lens and the pinhole placement lens in sequence to cause diffraction; Collecting the diffraction pattern generated by the light source to be detected by the photoelectric detection component; The diffraction pattern is input into a target wavelength measurement model to obtain wavelength information output by the target wavelength measurement model.

[0006] In one embodiment, the wavelength measurement device further includes a correction device, and the light source to be tested is set so that the light emitted by the light source to be tested passes through the light beam introduction port, the light beam collimating lens and the pinhole placement lens in sequence, and before the diffraction step occurs, the following steps are included: Connecting the photoelectric detection component to the light outlet of the correction device; The correction device is controlled to emit a uniform surface light source, the photoelectric detection component responds to the light emitted by the surface light source, and the photoelectric detection component is corrected according to the response value of each detector in the photoelectric detection component.

[0007] In one embodiment, before the step of inputting the diffraction pattern into a target wavelength measurement model to obtain the wavelength information output by the target wavelength measurement model, the step further includes: Obtaining a sample image, inputting the sample image into a convolutional neural network model, and obtaining a predicted value output by the convolutional neural network model; Calculating a loss value between the predicted value and the label of the sample image; The convolutional neural network model is iteratively optimized according to the loss value until the loss value converges to obtain a target wavelength measurement model.

[0008] In addition, to achieve the above object, the present invention also provides a wavelength measurement device, comprising: A beam introduction port, a beam collimating lens, a pinhole placement lens, and a photoelectric detection component are sequentially arranged along the optical path, and the photoelectric detection component is communicatively connected with the main control component; The main control component includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program is configured to implement the steps of the wavelength measurement method described above.

[0009] In one embodiment, the wavelength measurement device further comprises a correction device, wherein the correction device comprises: A housing, wherein a light outlet is provided on the housing; A polytetrafluoroethylene spherical liner, wherein the polytetrafluoroethylene spherical liner is located inside the outer shell; A correction light source, the correction light source is arranged on two opposite sides of the housing; A Mie scattering plate, wherein the Mie scattering plate is located outside the light outlet; The light emitted by the correction light source is incident on the polytetrafluoroethylene spherical liner and is reflected multiple times before being emitted from the light outlet and passing through the Mie scattering plate to obtain a uniform surface light source.

[0010] In one embodiment, the calibration light source is an LED, a halogen tungsten lamp, a xenon lamp or a deuterium lamp; and / or the Mie scattering plate is made of fused quartz or frosted glass.

[0011] In one embodiment, the photoelectric detection component is a planar array response device or a linear array response device.

[0012] In one embodiment, the light beam inlet is a fiber optic adapter, a point light source inlet, a parallel light inlet, or an integrating sphere light source inlet.

[0013] In addition, to achieve the above-mentioned purpose, the present invention also proposes a storage medium, which is a computer-readable storage medium, and stores a computer program on the storage medium. When the computer program is executed by a processor, the steps of the wavelength measurement method described above are implemented.

[0014] In addition, to achieve the above object, the present invention further provides a computer program product, wherein the computer program product comprises a computer program, and when the computer program is executed by a processor, the steps of the wavelength measurement method described above are implemented.

[0015] One or more technical solutions proposed by the present invention are based on a wavelength measurement device. The wavelength measurement device includes a beam introduction port, a beam collimating lens, a pinhole placement lens, and a photoelectric detection component which are sequentially arranged along an optical path. In the wavelength measurement process, a light source to be tested is firstly arranged so that the light emitted by the light source to be tested passes through the beam introduction port, the beam collimating lens, and the pinhole placement lens in sequence to cause diffraction. The beam introduction port introduces the light emitted by the light source to be tested into the optical path of the wavelength measurement device. The beam collimating lens causes the introduced light beam to irradiate the pinhole placement lens in the form of parallel light. The light is diffracted in the pinhole placement lens. The diffraction pattern generated by the light source to be tested is collected by the photoelectric detection component. The photoelectric detection component is located behind the pinhole placement lens and collects the diffraction pattern generated by the diffraction phenomenon. The diffraction pattern is input into a target wavelength measurement model to obtain wavelength information output by the target wavelength measurement model, thereby achieving the purpose of measuring the wavelength of the light source to be tested. That is, the embodiment of the present invention combines a wavelength measurement device with a simple structure with an artificial intelligence model, sets the optical path in the wavelength measurement device based on the diffraction principle of light, takes the diffraction pattern generated by the light source to be tested as input, and predicts the wavelength of the light source to be tested through the target wavelength measurement model. Compared with the existing method of measuring wavelength using precision equipment such as a Michelson interferometer, the structure of the wavelength measurement device is greatly simplified. At the same time, the accuracy of the wavelength measurement can meet the requirements of teaching demonstrations and other scenarios, thereby improving the portability of the wavelength measurement device. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0017] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0018] Figure 1A schematic diagram of the structure of a wavelength measurement device according to an embodiment of the present invention; Figure 2 This is a schematic diagram of the structure of a correction device according to an embodiment of the present invention; Figure 3 A schematic diagram of a diffraction pattern received by a planar array response device provided in an embodiment of the present invention; Figure 4 A schematic diagram of a one-dimensional distribution of a diffraction pattern received by a linear array response device provided in an embodiment of the present invention; Figure 5 A schematic diagram of the structure of a convolutional neural network model provided by an embodiment of the present invention; Figure 6 Schematic diagram of the device structure of the hardware operating environment involved in the wavelength measurement method in an embodiment of the present invention.

[0019] Description of Figure Numbers: 100, beam introduction port; 200, beam collimating tube lens; 300, pinhole placement tube lens; 400, photoelectric detection component; 500, main control component; 600, light source to be detected; 700, calibration device; 701, housing; 702, light outlet; 703, polytetrafluoroethylene spherical liner; 704, calibration light source; 705, Mie scattering plate.

[0020] The purpose, features and advantages of the present invention will be further described with reference to the accompanying drawings in conjunction with the embodiments. DETAILED DESCRIPTION

[0021] It should be understood that the specific embodiments described herein are only used to explain the technical solution of the present invention and are not used to limit the present invention. In order to better understand the technical solution of the present invention, the following will be described in detail in conjunction with the accompanying drawings and specific implementation methods.

[0022] The embodiment of the present invention provides a wavelength measurement device, referring to Figure 1 , Figure 1The structure diagram of a wavelength measurement device according to an embodiment of the present invention is shown in FIG. 1 , which includes: a beam introduction port 100, a beam collimating lens 200, a pinhole placement lens 300, and a photoelectric detection component 400, which are sequentially arranged along the optical path. The photoelectric detection component 400 is connected to the main control component 500 for communication. The light source 600 to be tested is the light source of the wavelength to be measured. The light emitted by the light source 600 to be tested propagates to the beam introduction port 100, is introduced into the optical path in the wavelength measurement device by the beam introduction port 100, reaches the beam collimating lens 200, and reaches the pinhole placement lens 300 after collimation, and diffracts. The photoelectric detection component 400 collects the diffraction pattern, and sends the data of the diffraction pattern to the main control component 500, which performs analysis and processing to obtain the wavelength of the light source 600 to be tested and information related to the wavelength.

[0023] The light beam inlet 100 is used to introduce the light of the light source 600 to be tested into the optical path of the wavelength measurement device. The light beam inlet 100 can be a fiber optic adapter, a point light source inlet, a parallel light inlet, or an integrating sphere light source inlet.

[0024] The beam collimating tube lens 200 is used to make the introduced light beam illuminate the pinhole placement tube lens 300 in the form of parallel light. The pinhole placement tube lens 300 may include an adapter and a pinhole device. The adapter may install the pinhole device in the optical path, and the pinhole device may cause the light to diffract. It is understood that the diffraction pattern is related to the aperture size of the pinhole device, the wavelength of the light source, the distance of the light source, and the distance of the projection screen. For collimated light, the light source may be considered to be at infinity, and the same structure in the wavelength measurement device ensures the consistency of the projection screen distance and the aperture, so that the difference between the diffraction patterns generated after the energy of the light source is normalized is completely determined by the wavelength of the light source.

[0025] The photoelectric detection component 400 is used to collect the generated diffraction pattern. According to the detection principle of the wavelength measurement device of this embodiment, the photoelectric detection component 400 can be a planar array response device and a linear array response device, both of which can realize the detection function. Specifically, the planar array response device can be a CMOS device or a CCD device.

[0026] The main control component 500 is mainly used for storing and analyzing data. The main control component 500 is connected to the photoelectric detection component 400 for communication to receive the diffraction pattern collected by the photoelectric detection component 400, analyze the diffraction pattern, and obtain the wavelength measurement result.

[0027] In a feasible implementation manner, the wavelength measurement device further includes a calibration device 700, referring to Figure 2 , Figure 2 : is a schematic diagram of the structure of the calibration device 700 in this embodiment, the calibration device 700 includes: A housing 701, wherein a light outlet 702 is provided on the housing 701; A polytetrafluoroethylene spherical liner 703, the polytetrafluoroethylene spherical liner 703 is located inside the shell 701; A correction light source 704, which is disposed on two opposite sides of the housing 701; A Mie scatter plate 705, which is located outside the light outlet 702; The light emitted by the correction light source 704 is incident on the polytetrafluoroethylene spherical liner 703 and is reflected multiple times before being emitted from the light outlet 702 and passing through the Mie scattering plate 705 to obtain a uniform surface light source.

[0028] It is understandable that, in order to ensure the fidelity of the diffraction pattern collection, the photoelectric detection component 400 can be subjected to a corresponding consistency calibration before the wavelength measurement. During the calibration process, the light outlet 702 of the calibration device 700 is connected to the photoelectric detection component 400, and the calibration device 700 emits a uniform surface light source from the Mie scattering plate 705 at the light outlet 702, and performs consistency calibration according to the response value of the photoelectric detection component 400 to the surface light source.

[0029] In a feasible implementation, the calibration light source 704 may be an LED, a halogen tungsten lamp, a xenon lamp, a deuterium lamp, etc. The material of the Mie scattering plate 705 may be fused quartz or frosted glass.

[0030] The wavelength measurement device of this embodiment serves as the basis for wavelength measurement. The optical path in the wavelength measurement device is set based on the diffraction principle of light. By controlling the diffraction aperture size, the light source distance and the projection screen distance, and performing energy normalization, the wavelength measurement is uniquely related to the difference in the diffraction pattern. Therefore, the diffraction pattern generated by the light source to be tested can be used as input, and the wavelength of the light source to be tested can be predicted in combination with the target wavelength measurement model. Compared with the existing method of measuring wavelength using precision equipment such as a Michelson interferometer, the structure of the wavelength measurement device has been greatly simplified. At the same time, the accuracy of the wavelength measurement can meet the requirements of teaching and demonstration scenarios, thereby improving the portability of the wavelength measurement device.

[0031] The embodiment of the present invention further provides a wavelength measurement method. In this embodiment, the wavelength measurement method is applied to the wavelength measurement device of the above embodiment. Figure 1 The wavelength measurement device includes: a beam introduction port 100, a beam collimating lens 200, a pinhole placement lens 300, and a photoelectric detection component 400 arranged in sequence along the optical path. The photoelectric detection component 400 is connected to the main control component 500 for communication. The wavelength measurement method of this embodiment includes steps S10 to S30: Step S10, setting the light source to be tested so that the light emitted by the light source to be tested passes through the light beam introduction port, the light beam collimating lens and the pinhole placement lens in sequence, and diffracts; It is understandable that the light source 600 to be tested is a light source for wavelength measurement, and in different measurement scenarios, the light source 600 to be tested can be of different types. After the wavelength measurement device is assembled, its internal structure will not change substantially, so the parameters such as the aperture size, the light source distance, and the projection screen distance related to diffraction can be kept constant. The light source 600 to be tested is placed on the introduction side of the light beam introduction port 100, and the light beam introduction port 100 can introduce the light emitted by the light source 600 to be tested into the light beam collimating tube lens 200, and then the light is incident in the form of parallel light into the pinhole device of the pinhole placement tube lens 300, and diffraction occurs.

[0032] Step S20, collecting the diffraction pattern generated by the light source to be detected through the photoelectric detection component; The light emitted by the light source 600 to be detected is diffracted after passing through the pinhole device and projected onto the surface of the photoelectric detection component 400, so the diffraction pattern can be collected by the photoelectric detection component 400. The photoelectric detection component 400 can be a linear array response device or a planar array response device.

[0033] Figure 3 This is a schematic diagram of the diffraction pattern received by the planar array response device. Figure 3 The diffraction patterns with wavelengths of 765nm, 773nm, and 781nm are shown in FIG. It can be seen that the use of the area array response device can collect annular diffraction patterns, and there are certain differences between the diffraction patterns of different wavelengths. The use of the area array response device as the photoelectric detection component 400 can collect richer data and can avoid the one-dimensional distribution of the diffraction pattern from being affected by noise and system errors, thereby reducing the accuracy of the model.

[0034] For circular hole diffraction, the diffraction pattern is a circular ring distribution, so generally speaking, the one-dimensional direction can also summarize its distribution characteristics, so a linear array response device can be used as the photoelectric detection component 400. Figure 4 The one-dimensional distribution diagram of the diffraction pattern received by the linear array response device is shown in Figure 2. Figure 4 It can be seen that the center line light intensity is the strongest and most concentrated. The storage space required by the linear array response device to detect a wavelength is only one thousandth of that of the planar array response device, which greatly reduces the required storage space and storage costs, and also simplifies the amount of data for model training.

[0035] Step S30: input the diffraction pattern into a target wavelength measurement model to obtain wavelength information output by the target wavelength measurement model.

[0036] The target wavelength measurement model refers to a model for predicting the wavelength corresponding to the diffraction pattern. It is understandable that the target wavelength measurement model of this embodiment can use a convolutional neural network model, using a test data set of a standard wavelength at different powers to construct a neural network model with a diffraction pattern as input and a wavelength as output, so that after setting the light source 600 to be tested, its wavelength can be directly obtained through the target wavelength measurement model.

[0037] It can be understood that, from the diffraction mechanism, for the diffraction of an ideal single-wavelength light beam, the difference in wavelengths will result in different diameters of different light and dark rings in the diffraction pattern. In addition to the diameter difference, the diffraction rings also have differences in the arc spacing of the rings, and this parameter is greatly affected by the bandwidth of the incident light. In this embodiment, the diffraction pattern can also be used as input and the bandwidth as output to establish a model, so that the bandwidth of the light can be determined by identifying the diffraction pattern. Based on a similar mechanism, the output parameters can also be extended to wavelength-related parameters such as color purity.

[0038] The present embodiment provides a wavelength measurement method, which is based on a wavelength measurement device. The wavelength measurement device includes a light beam introduction port 100, a light beam collimating lens 200, a pinhole placement lens 300, and a photoelectric detection component 400, which are sequentially arranged along the optical path. In the wavelength measurement process, a light source to be tested 600 is first arranged, so that the light emitted by the light source to be tested 600 passes through the light beam introduction port 100, the light beam collimating lens 200, and the pinhole placement lens 300 in sequence, and diffraction occurs. The light beam introduction port 100 guides the light emitted by the light source to be tested 600 into the wavelength measurement device. In the optical path of the measuring device, the beam collimating tube lens 200 allows the introduced light beam to be irradiated into the pinhole placement tube lens 300 in the form of parallel light, and the light is diffracted in the pinhole placement tube lens 300. The diffraction pattern generated by the light source 600 to be tested is collected by the photoelectric detection component 400. The photoelectric detection component 400 is located behind the pinhole placement tube lens 300 to collect the diffraction pattern generated by the diffraction phenomenon; the diffraction pattern is input into the target wavelength measurement model to obtain the wavelength information output by the target wavelength measurement model, thereby achieving the purpose of measuring the wavelength of the light source to be tested. That is, the embodiment of the present invention combines a wavelength measurement device with a simple structure with an artificial intelligence model, sets the optical path in the wavelength measurement device based on the diffraction principle of light, takes the diffraction pattern generated by the light source 600 to be tested as input, and predicts the wavelength of the light source to be tested through the target wavelength measurement model. Compared with the existing method of measuring wavelength using precision equipment such as Michelson interferometer, the structure of the wavelength measurement device has been greatly simplified. At the same time, the accuracy of wavelength measurement can meet the requirements of teaching and demonstration scenarios, and the portability of the wavelength measurement device is improved.

[0039] Based on the first embodiment of the present invention, in the second embodiment of the present invention, the same or similar contents as those in the first embodiment can be referred to the above introduction, and will not be described in detail later. The wavelength measurement device also includes a calibration device 700, referring to Figure 2 On this basis, before step S10, the wavelength measurement method further includes steps A10 to A20: Step A10, connecting the photoelectric detection component to the light outlet of the correction device; It is understandable that the calibration device 700 can refer to Figure 2 According to the structure shown in FIG. 1 , the photoelectric detection component 400 is connected to the light outlet 702 of the correction device 700 , and the light emitted by the correction device 700 can be received and responded by the photoelectric detection component 400 .

[0040] Step A20, controlling the correction device to emit a uniform surface light source, the photoelectric detection component responds to the light emitted by the surface light source, and correcting the photoelectric detection component according to the response value of each detector in the photoelectric detection component.

[0041] Turn on the calibration light source 704 of the calibration device 700. The light emitted by the calibration light source 704 is reflected multiple times by the highly Lambertian and highly reflective polytetrafluoroethylene spherical liner 703, and then emitted from the light outlet 702. After being scattered by the Mie scattering plate 705, a uniform surface light source is formed. The photoelectric detection component 400 responds to the uniform light source. In theory, the response values ​​of different detectors should be consistent. In the case of inconsistency in the actual measured values, the maximum value (tested at the maximum response without overexposure) is normalized to obtain the correction coefficient, and the correction coefficient is used to calibrate the photoelectric detection component.

[0042] In this embodiment, the photoelectric detection component 400 is calibrated using the calibration device 700, so as to improve the fidelity of the diffraction pattern and further improve the accuracy of the wavelength measurement.

[0043] Based on the above embodiments of the present invention, in the third embodiment of the present invention, the same or similar contents as those in the above embodiments can be referred to the above introduction, and will not be repeated hereafter. On this basis, before step S30, the wavelength measurement method further includes steps B10 to B30: Step B10, obtaining a sample image, inputting the sample image into a convolutional neural network model, and obtaining a predicted value output by the convolutional neural network model; The sample image refers to the image data used for model training. The diffraction pattern of the known luminescence wavelength can be used as the sample image, and the known wavelength is used as the label of the sample image. The convolutional neural network model built in this embodiment can be a VGG16 model. Figure 5 Schematic diagram of the structure of the convolutional neural network model in this embodiment. Figure 5As shown in the figure, the convolutional neural network model includes different hierarchical structures. The input sample image is processed by the convolution layer and the downsampling layer to form a series of feature maps of different scales. At the end of the model, the two-dimensional features are converted into one-dimensional vectors through the fully connected layer, and then connected to the output layer through the fully connected layer to complete the wavelength numerical regression of the image.

[0044] It is understandable that the resolution of the input sample image can be set to 1280×1024. During the preprocessing process, the image size is uniformly scaled to 224×224 to reduce the amount of calculation and increase the calculation speed. After a series of convolutional layers and maximum pooling layers, image features are extracted and the number of parameters is reduced, overfitting is prevented, and translation invariance is ensured. The final output prediction value is obtained through the fully connected layer and output node.

[0045] Step B20, calculating a loss value between the predicted value and the label of the sample image; The loss function used in this embodiment may be a MSE (Mean Square Error) function, where the label is used as the true value, and the predicted value and the true value are input into the MSE calculation function to obtain a loss value. The error between the predicted value and the true value can be determined by the loss value.

[0046] Step B30, iteratively optimizing the convolutional neural network model according to the loss value until the loss value converges to obtain a target wavelength measurement model.

[0047] The stochastic gradient descent method can be used as the optimizer. During the training process, a sample is randomly selected from all samples to calculate the gradient of the loss function, and the weight is updated along the negative gradient direction. The loss function value is minimized through multiple iterations to obtain the optimal weight, and the trained target wavelength measurement model is obtained using the optimal weight.

[0048] Table 1 below shows the regression accuracy of the target wavelength measurement model of this embodiment. From Table 1, it can be seen that the accuracy of judging the wavelength of the diffraction pattern reaches 94%, which shows that the wavelength measurement method of this embodiment has the feasibility of reading the incident wavelength according to the diffraction pattern.

[0049] Table 1

[0050] In this embodiment, the convolutional neural network model of the VGG16 architecture is trained using sample images to obtain a target wavelength measurement model. The target wavelength measurement model can be run in the main control component 500, so as to be combined with a simple wavelength measurement device to obtain a measurement result with a certain accuracy, thereby meeting the wavelength measurement needs in industrial or teaching scenarios and greatly improving convenience.

[0051] It should be noted that the above examples are only used to understand the present invention and do not constitute a limitation on the wavelength measurement method of the present invention. More simple transformations based on this technical concept are all within the protection scope of the present invention.

[0052] The present invention also provides a main control component 500 in a wavelength measurement device, the main control component 500 includes: at least one processor; and a memory connected to the at least one processor in communication; wherein the memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the wavelength measurement method in the above embodiment.

[0053] Reference below Figure 6 , which shows a schematic diagram of the structure of the main control component 500 suitable for implementing the embodiment of the present invention. The main control component 500 in the embodiment of the present invention may include but is not limited to mobile terminals such as mobile phones, notebook computers, digital broadcast receivers, PDAs (Personal Digital Assistants), PADs (Portable Application Descriptions), PMPs (Portable Media Players), vehicle-mounted terminals (such as vehicle-mounted navigation terminals), etc., and fixed terminals such as digital TVs, desktop computers, etc. Figure 5 The main control component 500 shown is only an example and should not bring any limitation to the functions and scope of use of the embodiments of the present invention.

[0054] like Figure 5As shown, the main control component 500 may include a processing device 1001 (such as a central processing unit, a graphics processor, etc.), which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM: Read Only Memory) 1002 or a program loaded from a storage device 1003 to a random access memory (RAM: Random Access Memory) 1004. In the RAM 1004, various programs and data required for the operation of the main control component 500 are also stored. The processing device 1001, the ROM 1002, and the RAM 1004 are connected to each other through a bus 1005. An input / output (I / O) interface 1006 is also connected to the bus. Typically, the following systems can be connected to the I / O interface 1006: input devices 1007 including, for example, a touch screen, a touchpad, a keyboard, a mouse, an image sensor, a microphone, an accelerometer, a gyroscope, etc.; output devices 1008 including, for example, a liquid crystal display (LCD), a speaker, a vibrator, etc.; storage devices 1003 including, for example, a magnetic tape, a hard disk, etc.; and communication devices 1009. The communication device 1009 can allow the main control component 500 to communicate with other devices wirelessly or by wire to exchange data. Although the main control component 500 with various systems is shown in the figure, it should be understood that it is not required to implement or have all the systems shown. More or fewer systems can be implemented or have alternatively.

[0055] In particular, according to the embodiments disclosed in the present invention, the process described above with reference to the flowchart can be implemented as a computer software program. For example, the embodiments disclosed in the present invention include a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program contains program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from the network through a communication device, or installed from the storage device 1003, or installed from the ROM 1002. When the computer program is executed by the processing device 1001, the above-mentioned functions defined in the method of the embodiment disclosed in the present invention are executed.

[0056] The main control component 500 provided by the present invention adopts the wavelength measurement method in the above embodiment, which can solve the technical problems of the existing products being expensive and inconvenient to carry. Compared with the prior art, the beneficial effects of the main control component 500 provided by the present invention are the same as the beneficial effects of the wavelength measurement method provided by the above embodiment, and other technical features in the main control component 500 are the same as the features disclosed in the method of the previous embodiment, which will not be repeated here.

[0057] It should be understood that the various parts disclosed in the present invention can be implemented by hardware, software, firmware or a combination thereof. In the description of the above embodiments, specific features, structures, materials or characteristics can be combined in any one or more embodiments or examples in a suitable manner.

[0058] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

[0059] The present invention provides a computer-readable storage medium having computer-readable program instructions (ie, computer programs) stored thereon, and the computer-readable program instructions are used to execute the wavelength measurement method in the above embodiment.

[0060] The computer-readable storage medium provided by the present invention may be, for example, a USB flash drive, but is not limited to electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems or devices, or any combination thereof. More specific examples of computer-readable storage media may include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM: Random Access Memory), a read-only memory (ROM: Read Only Memory), an erasable programmable read-only memory (EPROM: Erasable Programmable Read Only Memory or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM: CD-Read Only Memory), an optical storage device, a magnetic storage device, or any suitable combination thereof. In this embodiment, the computer-readable storage medium may be any tangible medium containing or storing a program, which may be used by or in combination with an instruction execution system or device. The program code contained on the computer-readable storage medium may be transmitted using any appropriate medium, including but not limited to: wires, optical cables, RF (Radio Frequency: Radio Frequency), etc., or any suitable combination thereof.

[0061] The computer-readable storage medium may be included in the main control component 500 ; or may exist independently without being assembled into the main control component 500 .

[0062] Computer program code for performing the operations of the present invention may be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, C++, and conventional procedural programming languages ​​such as "C" or similar programming languages. The program code may be executed entirely on the user's computer, partially on the user's computer, as a separate software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computer (e.g., through the Internet using an Internet service provider).

[0063] The flow chart and block diagram in the accompanying drawings illustrate the possible architecture, function and operation of the system, method and computer program product according to various embodiments of the present invention. In this regard, each square box in the flow chart or block diagram can represent a module, a program segment or a part of a code, and the module, the program segment or a part of the code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the square box can also occur in a sequence different from that marked in the accompanying drawings. For example, two square boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each square box in the block diagram and / or flow chart, and the combination of the square boxes in the block diagram and / or flow chart can be implemented with a dedicated hardware-based system that performs the specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0064] The modules involved in the embodiments of the present invention may be implemented by software or hardware, wherein the name of the module does not limit the unit itself in some cases.

[0065] The readable storage medium provided by the present invention is a computer-readable storage medium, which stores computer-readable program instructions (i.e., computer programs) for executing the above-mentioned wavelength measurement method, and can solve the technical problems of high cost and inconvenience in carrying of existing products. Compared with the prior art, the beneficial effects of the computer-readable storage medium provided by the present invention are the same as the beneficial effects of the wavelength measurement method provided by the above-mentioned embodiment, and will not be described in detail here.

[0066] The present invention also provides a computer program product, comprising a computer program, wherein when the computer program is executed by a processor, the steps of the wavelength measurement method as described above are implemented.

[0067] The computer program product provided by the present invention can solve the technical problems of the existing products being expensive and inconvenient to carry. Compared with the prior art, the beneficial effects of the computer program product provided by the present invention are the same as those of the wavelength measurement method provided by the above embodiment, which will not be described in detail here.

[0068] The above descriptions are only some embodiments of the present invention, and are not intended to limit the patent scope of the present invention. All equivalent structural changes made using the contents of the present invention's specification and drawings under the technical concept of the present invention, or directly / indirectly applied in other related technical fields, are included in the patent protection scope of the present invention.

Claims

1. A wavelength measurement method, characterized in that: Applied to a wavelength measurement device, the wavelength measurement device comprises a beam introduction port, a beam collimating lens, a pinhole placement lens, and a photoelectric detection component arranged in sequence along the optical path, the photoelectric detection component is communicatively connected with a main control component, and the wavelength measurement method comprises: Setting a light source to be tested so that the light emitted by the light source to be tested passes through the light beam introduction port, the light beam collimating lens and the pinhole placement lens in sequence to cause diffraction; Collecting the diffraction pattern generated by the light source to be detected by the photoelectric detection component; The diffraction pattern is input into a target wavelength measurement model to obtain wavelength information output by the target wavelength measurement model.

2. The wavelength measurement method according to claim 1, characterized in that: The wavelength measurement device further includes a correction device, and the light source to be tested is arranged so that the light emitted by the light source to be tested passes through the light beam introduction port, the light beam collimating lens and the pinhole placement lens in sequence, and before the diffraction step occurs, the following steps are included: Connecting the photoelectric detection component to the light outlet of the correction device; The correction device is controlled to emit a uniform surface light source, the photoelectric detection component responds to the light emitted by the surface light source, and the photoelectric detection component is corrected according to the response value of each detector in the photoelectric detection component.

3. The wavelength measurement method according to claim 1, characterized in that: Before the step of inputting the diffraction pattern into a target wavelength measurement model to obtain wavelength information output by the target wavelength measurement model, the step further includes: Obtaining a sample image, inputting the sample image into a convolutional neural network model, and obtaining a predicted value output by the convolutional neural network model; Calculating a loss value between the predicted value and the label of the sample image; The convolutional neural network model is iteratively optimized according to the loss value until the loss value converges to obtain a target wavelength measurement model.

4. A wavelength measurement device, characterized in that: The wavelength measurement device comprises: A beam introduction port, a beam collimating lens, a pinhole placement lens, and a photoelectric detection component are sequentially arranged along the optical path, and the photoelectric detection component is communicatively connected with the main control component; The main control component includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program is configured to implement the steps of the wavelength measurement method according to any one of claims 1 to 3.

5. The wavelength measurement device according to claim 4, characterized in that The wavelength measurement device also includes a correction device, which includes: A housing, wherein a light outlet is provided on the housing; A polytetrafluoroethylene spherical liner, wherein the polytetrafluoroethylene spherical liner is located inside the outer shell; A correction light source, the correction light source is arranged on two opposite sides of the housing; A Mie scattering plate, wherein the Mie scattering plate is located outside the light outlet; The light emitted by the correction light source is incident on the polytetrafluoroethylene spherical liner and is reflected multiple times before being emitted from the light outlet and passing through the Mie scattering plate to obtain a uniform surface light source.

6. The wavelength measurement device according to claim 5, characterized in that The correction light source is an LED, a halogen tungsten lamp, a xenon lamp or a deuterium lamp; and / or the Mie scattering plate is made of fused quartz or frosted glass.

7. The wavelength measurement device according to claim 4, characterized in that: The photoelectric detection component is a planar array response device or a linear array response device.

8. The wavelength measurement device according to claim 4, characterized in that: The light beam introduction port is an optical fiber adapter port, a point light source introduction port, a parallel light introduction port or an integrating sphere light source introduction port.

9. A storage medium, characterized in that: The storage medium is a computer-readable storage medium, and a computer program is stored on the storage medium. When the computer program is executed by a processor, the steps of the wavelength measurement method according to any one of claims 1 to 3 are implemented.

10. A computer program product, characterized in that The computer program product comprises a computer program, and when the computer program is executed by a processor, the steps of the wavelength measurement method according to any one of claims 1 to 3 are implemented.

Images