Parameter determination method and parameter model for noise matching transformer

Abstract

The present invention provides a parameter determination method and parameter model for a noise matching transformer, which can be applied to the field of transformer technology. The parameter determination method for a noise matching transformer includes: when the secondary winding is in a predetermined state, using an impedance analyzer to measure multiple input impedances at both ends of the primary winding and multiple phases at both ends of the primary winding, the multiple input impedances include multiple first input impedances corresponding to the open circuit state and multiple second input impedances corresponding to the short circuit state; based on the test frequency corresponding to the first phase and multiple frequency ranges, according to multiple preset frequencies, the first input impedance corresponding to the preset frequency and at least one of the DC resistance, determine the excitation inductance of the primary winding, the equivalent capacitance of the secondary winding or the equivalent resistance of the magnetic core loss; based on the test frequency corresponding to the second phase and multiple frequency ranges, determine the leakage inductance of the primary winding and the leakage inductance of the k-segment secondary winding.

Description

Technical Field

[0001] The present invention relates to the technical field of transformers, and in particular to a parameter determination method and a parameter model for a noise matching transformer. Background Art

[0002] As electronic devices move toward higher frequencies, noise matching transformers can also operate at higher frequencies. In order to achieve the needs of portability and compact space, noise matching transformers are also reducing size and weight while maintaining performance.

[0003] In the process of realizing the concept of the present invention, it was found through research that the coupling degree between parameters in the design process of the noise matching transformer in the related technology is low, resulting in low efficiency in determining the parameters of the noise matching transformer, and further resulting in high R&D costs of the noise matching transformer. Summary of the invention

[0004] In view of the above problems, the present invention provides a parameter determination method and a parameter model for a noise matching transformer.

[0005] According to a first aspect of the present invention, a method for determining parameters of a noise matching transformer is provided, wherein the noise matching transformer comprises a primary winding and k-segment secondary windings, wherein k is a positive integer; the method comprises: when the secondary winding is in a predetermined state, using an impedance analyzer to measure a plurality of input impedances at both ends of the primary winding and a plurality of phases at both ends of the primary winding, wherein the plurality of input impedances and the phases correspond to a plurality of test frequencies of the impedance analyzer, the predetermined state comprises an open circuit state and a short circuit state, the plurality of input impedances comprise a plurality of first input impedances corresponding to the open circuit state and a plurality of second input impedances corresponding to the short circuit state, and the plurality of phases comprise a plurality of first input impedances corresponding to the open circuit state and a plurality of second input impedances corresponding to the short circuit state, Corresponding multiple first phases and multiple second phases corresponding to the above-mentioned short-circuit state; based on the test frequency corresponding to the above-mentioned first phase and multiple frequency ranges, according to multiple preset frequencies, the first input impedance corresponding to the above-mentioned preset frequency and at least one of the DC resistances, determine the excitation inductance of the above-mentioned primary winding, the equivalent capacitance of the above-mentioned secondary winding or the equivalent resistance of the core loss; wherein the above-mentioned DC resistance includes at least one of the DC resistance of the above-mentioned primary winding, the k DC resistances of the above-mentioned k-segment secondary windings and the total DC resistance of the above-mentioned k-segment secondary windings measured by a multimeter; based on the test frequency corresponding to the above-mentioned second phase and the above-mentioned multiple frequency ranges, determine the leakage inductance of the above-mentioned primary winding and the leakage inductance of the above-mentioned k-segment secondary windings.

[0006] According to an embodiment of the present invention, the above-mentioned multiple frequency ranges include a first frequency range, a second frequency range and a third frequency range; wherein, based on the test frequency corresponding to the above-mentioned first phase and the multiple frequency ranges, according to multiple preset frequencies, the first input impedance corresponding to the above-mentioned preset frequency and at least one of the DC resistance, the magnetizing inductance of the above-mentioned primary winding, the equivalent capacitance of the above-mentioned secondary winding or the core loss equivalent resistance is determined, including: when the test frequency corresponding to the above-mentioned first phase satisfies the first frequency range, according to the first preset frequency, the second preset frequency, the first input impedance corresponding to the above-mentioned first preset frequency and the first input impedance corresponding to the above-mentioned second preset frequency, the magnetizing inductance of the above-mentioned primary winding is determined, wherein the above-mentioned second preset frequency is greater than or equal to 0. At the above-mentioned first preset frequency, and the above-mentioned first preset frequency and the above-mentioned second preset frequency both satisfy the first frequency range; when the test frequency corresponding to the above-mentioned first phase satisfies the second frequency range, the equivalent capacitance of the above-mentioned secondary winding is determined according to the third preset frequency, the fourth preset frequency, the first input impedance corresponding to the above-mentioned third preset frequency, and the first input impedance corresponding to the above-mentioned fourth preset frequency, wherein the above-mentioned fourth preset frequency is greater than the above-mentioned third preset frequency, and the above-mentioned third preset frequency and the above-mentioned fourth preset frequency both satisfy the second frequency range; when the test frequency corresponding to the above-mentioned first phase satisfies the third frequency range, the above-mentioned core loss equivalent resistance is determined according to the DC resistance of the above-mentioned primary winding and the first input impedance corresponding to the above-mentioned test frequency.

[0007] According to an embodiment of the present invention, the leakage inductance of the primary winding and the leakage inductance of the k-segment secondary winding are determined based on the test frequency corresponding to the second phase and the multiple frequency ranges, including: when the test frequency corresponding to the second phase satisfies the first frequency range, the leakage inductance of the primary winding is determined according to the fifth preset frequency, the sixth preset frequency, the second input impedance corresponding to the fifth preset frequency and the second input impedance corresponding to the sixth preset frequency, wherein the sixth preset frequency is greater than the fifth preset frequency, and both the fifth preset frequency and the sixth preset frequency satisfy the first frequency range; the leakage inductance of the k-segment secondary winding is determined according to the leakage inductance of the primary winding and the first objective function.

[0008] According to an embodiment of the present invention, when the test frequency corresponding to the second phase satisfies the first frequency range, the leakage inductance of the primary winding is determined according to the fifth preset frequency, the sixth preset frequency, the second input impedance corresponding to the fifth preset frequency, and the second input impedance corresponding to the sixth preset frequency, including: based on the second objective function, the leakage inductance of the primary winding is determined according to the fifth preset frequency, the sixth preset frequency, the second input impedance corresponding to the fifth preset frequency, and the second input impedance corresponding to the sixth preset frequency.

[0009] According to an embodiment of the present invention, the above-mentioned second objective function is constructed in the following manner: constructing a first sub-function based on the above-mentioned second input impedance corresponding to the fifth preset frequency and the above-mentioned second input impedance corresponding to the sixth preset frequency; constructing a second sub-function based on the above-mentioned fifth preset frequency and the above-mentioned sixth preset frequency; constructing the above-mentioned second objective function based on the above-mentioned first sub-function and the above-mentioned second sub-function.

[0010] According to an embodiment of the present invention, the leakage inductance of the k-segment secondary winding is determined based on the leakage inductance of the primary winding and the first objective function, including: determining the ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding based on the number of turns of the primary winding and the total number of turns of the k-segment secondary winding; determining the first objective function based on the number of segments of the secondary winding and the ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding; determining the leakage inductance of the k-segment secondary winding based on the product of the leakage inductance of the primary winding and the first objective function.

[0011] According to an embodiment of the present invention, the first objective function is determined based on the ratio of the number of segments of the primary winding and the total number of turns of the k-segment secondary winding to the number of turns of the primary winding, including: constructing a third sub-function based on the ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding; determining the first objective function based on the ratio of the third sub-function to the number of segments of the secondary winding.

[0012] According to an embodiment of the present invention, when the test frequency corresponding to the first phase satisfies the third frequency range, the core loss equivalent resistance is determined according to the DC resistance of the primary winding and the first input impedance corresponding to the test frequency, including: determining the target input impedance from the multiple first input impedances, wherein the target input impedance is greater than the other first input impedances except the target input impedance; at the test frequency corresponding to the target input impedance, determining the core loss equivalent resistance according to the DC resistance of the primary winding and the target input impedance, wherein the test frequency corresponding to the target input impedance satisfies the third frequency range.

[0013] According to an embodiment of the present invention, the accuracy of the multimeter is greater than or equal to six and a half digits.

[0014] The second aspect of the present invention provides a noise matching transformer parameter model, the parameter model includes the DC resistance of the primary winding, the magnetizing inductance of the primary winding, the leakage inductance of the primary winding, the core loss equivalent resistance, an ideal transformer, the DC resistance of the secondary winding, the leakage inductance of the secondary winding, and the equivalent capacitance of the secondary winding determined by the parameter determination method for the noise matching transformer.

[0015] According to the parameter determination method and parameter model for a noise matching transformer provided by the present invention, multiple input impedances at both ends of the primary winding and multiple phases at both ends of the primary winding can be measured by an impedance analyzer. Based on the test frequency and multiple frequency ranges corresponding to the first phase, the magnetizing inductance of the primary winding, the equivalent capacitance of the secondary winding or the core loss equivalent resistance can be determined according to multiple preset frequencies, the first input impedance corresponding to the preset frequency, and at least one of the DC resistances. Based on the test frequency and multiple frequency ranges corresponding to the second phase, the leakage inductance of the primary winding and the leakage inductance of k-segment secondary windings can be determined, thereby realizing the determination of the magnetizing inductance of the primary winding, the equivalent capacitance of the secondary winding, the core loss equivalent resistance, the leakage inductance of the primary winding, the leakage inductance of the k-segment secondary winding, the DC resistance of the primary winding, the k DC resistances of the k-segment secondary winding, and the total DC resistance of the k-segment secondary winding, thereby improving the efficiency of determining multiple non-ideal parameters, improving the design efficiency of the noise matching transformer, and reducing the research and development cost of the noise matching transformer. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The above and other objects, features and advantages of the present invention will become more apparent through the following description of the embodiments of the present invention with reference to the accompanying drawings, in which:

[0017] Figure 1 A flow chart of a method for determining parameters of a noise matching transformer according to an embodiment of the present invention is shown;

[0018] Figure 2 A flow chart of a method for determining parameters of a noise matching transformer according to another embodiment of the present invention is shown;

[0019] Figure 3 A circuit diagram of a noise matching transformer parameter model according to an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0020] Below, embodiments of the present invention will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are exemplary only and are not intended to limit the scope of the present invention. In the following detailed description, for ease of explanation, many specific details are set forth to provide a comprehensive understanding of embodiments of the present invention. However, it is apparent that one or more embodiments may also be implemented without these specific details. In addition, in the following description, descriptions of known structures and technologies are omitted to avoid unnecessary confusion of concepts of the present invention.

[0021] The terms used herein are only for describing specific embodiments and are not intended to limit the present invention. The terms "comprise", "include", etc. used herein indicate the existence of the features, steps, operations and / or components, but do not exclude the existence or addition of one or more other features, steps, operations or components.

[0022] All terms (including technical and scientific terms) used herein have the meanings commonly understood by those skilled in the art unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification and should not be interpreted in an idealized or overly rigid manner.

[0023] When using expressions such as "at least one of A, B, and C, etc.", they should generally be interpreted according to the meaning of the expression commonly understood by those skilled in the art (for example, "a system having at least one of A, B, and C" should include but is not limited to a system having A alone, B alone, C alone, A and B, A and C, B and C, and / or A, B, C, etc.).

[0024] The noise matching transformer can be a typical noise matching network for low impedance sources. In the field of physical measurement, transformer coupling technology is widely used in ultra-low noise amplification applications. When the signal source has extremely low impedance and low voltage level, for example, the signal source impedance is less than 1Ω and the signal source voltage is in the nanovolt level, the noise factor of the conventional direct-coupled active low noise amplifier generally exceeds 20dB. The transformer coupling technology can increase the signal in proportion to the turns ratio without adding any additional noise, and increase the signal source resistance in proportion to the square of the turns ratio, thereby achieving the noise matching state of the subsequent active amplifier and achieving better noise performance.

[0025] In the process of implementing the present invention, it is found that there are multiple non-ideal parameters in the noise matching transformer in the related art, including leakage inductance, distributed capacitance and loss resistance, and multiple non-ideal parameters are distributed parameters. The coupling degree between the multiple non-ideal parameters is low, which affects the noise matching effect of the noise matching transformer. Therefore, in the design process of the noise matching transformer, determining multiple non-ideal parameters requires more manpower and material resources, resulting in low efficiency in determining the non-ideal parameters.

[0026] In view of this, an embodiment of the present invention provides a parameter determination method for a noise matching transformer, wherein the noise matching transformer comprises a primary winding and k-segment secondary windings, wherein k is a positive integer; the parameter determination method for the noise matching transformer comprises: when the secondary winding is in a predetermined state, using an impedance analyzer to measure a plurality of input impedances at both ends of the primary winding and a plurality of phases at both ends of the primary winding, wherein the plurality of input impedances and phases correspond to a plurality of test frequencies of the impedance analyzer, the predetermined state comprises an open circuit state and a short circuit state, the plurality of input impedances comprise a plurality of first input impedances corresponding to the open circuit state and a plurality of second input impedances corresponding to the short circuit state, and the plurality of phases It includes multiple first phases corresponding to the open circuit state and multiple second phases corresponding to the short circuit state; based on the test frequency corresponding to the first phase and multiple frequency ranges, according to multiple preset frequencies, the first input impedance corresponding to the preset frequency and at least one of the DC resistances, the excitation inductance of the primary winding, the equivalent capacitance of the secondary winding or the equivalent resistance of the core loss is determined; wherein the DC resistance includes at least one of the DC resistance of the primary winding measured by a multimeter, k DC resistances of k-segment secondary windings and the total DC resistance of the k-segment secondary windings; based on the test frequency corresponding to the second phase and multiple frequency ranges, the leakage inductance of the primary winding and the leakage inductance of the k-segment secondary winding are determined.

[0027] Figure 1 A flow chart of a method for determining parameters of a noise matching transformer according to an embodiment of the present invention is shown.

[0028] like Figure 1 As shown, the parameter determination method 100 for a noise matching transformer of this embodiment includes operations S110 to S130.

[0029] In operation S110, a plurality of input impedances across the primary winding and a plurality of phases across the primary winding are measured using an impedance analyzer while the secondary winding is in a predetermined state.

[0030] In operation S120, based on the test frequency corresponding to the first phase and multiple frequency ranges, the magnetizing inductance of the primary winding, the equivalent capacitance of the secondary winding, or the core loss equivalent resistance is determined according to multiple preset frequencies, the first input impedance corresponding to the preset frequency, and at least one of the DC resistance.

[0031] In operation S130 , a leakage inductance of the primary winding and a leakage inductance of the k-segment secondary winding are determined based on a test frequency corresponding to the second phase and a plurality of frequency ranges.

[0032] According to an embodiment of the present invention, the noise matching transformer may include a primary winding and k segments of secondary windings. For example, the noise matching transformer may include a primary winding and 1 segment of secondary winding. For another example, the noise matching transformer may include a primary winding and 2 segments of secondary windings.

[0033] According to an embodiment of the present invention, an impedance analyzer can characterize an electronic instrument that measures the change of complex impedance with test frequency. The impedance analyzer can measure multiple input impedances at both ends of the primary winding and multiple phases at both ends of the primary winding. The multiple input impedances and phases correspond to multiple test frequencies of the impedance analyzer. Each test frequency can correspond to an impedance and a phase.

[0034] According to an embodiment of the present invention, the predetermined state may include an open circuit state and a short circuit state, that is, the secondary winding may be in an open circuit state or the secondary winding may be in a short circuit state. The multiple input impedances may include a plurality of first input impedances corresponding to the open circuit state and a plurality of second input impedances corresponding to the short circuit state. The multiple phases may include a plurality of first phases corresponding to the open circuit state and a plurality of second phases corresponding to the short circuit state.

[0035] According to an embodiment of the present invention, the test frequency corresponding to the first phase may include multiple test frequencies, and the multiple test frequencies may belong to different test ranges. For example, the multiple frequency ranges may include 3, namely, a first frequency range, a second frequency range, and a third frequency range. The DC resistance includes at least one of the DC resistance of the primary winding measured by a multimeter, the k DC resistances of the k-segment secondary winding, and the total DC resistance of the k-segment secondary winding.

[0036] According to an embodiment of the present invention, a first target frequency range may be determined based on a test frequency corresponding to a first phase and a plurality of frequency ranges. Based on the first target frequency range, the magnetizing inductance of the primary winding, the equivalent capacitance of the secondary winding, or the core loss equivalent resistance may be determined according to at least one of a plurality of preset frequencies, a first input impedance corresponding to the preset frequency, and a DC resistance.

[0037] According to an embodiment of the present invention, a second target frequency range can be determined based on a test frequency corresponding to a second phase and a plurality of frequency ranges, and a leakage inductance of a primary winding and a leakage inductance of k-segment secondary windings can be determined based on the second target frequency range. The first target frequency range can be equal to the second target frequency range, or the first target frequency range can be unequal to the second target frequency range.

[0038] According to an embodiment of the present invention, multiple input impedances at both ends of the primary winding and multiple phases at both ends of the primary winding can be measured by an impedance analyzer. Based on the test frequency and multiple frequency ranges corresponding to the first phase, the magnetizing inductance of the primary winding, the equivalent capacitance of the secondary winding or the core loss equivalent resistance can be determined according to multiple preset frequencies, the first input impedance corresponding to the preset frequency, and at least one of the DC resistances. Based on the test frequency and multiple frequency ranges corresponding to the second phase, the leakage inductance of the primary winding and the leakage inductance of k-segments of secondary windings can be determined, thereby realizing the determination of the magnetizing inductance of the primary winding, the equivalent capacitance of the secondary winding, the core loss equivalent resistance, the leakage inductance of the primary winding, the leakage inductance of the k-segments of secondary windings, the DC resistance of the primary winding, the k DC resistances of the k-segments of secondary windings, and the total DC resistance of the k-segments of secondary windings, thereby improving the efficiency of determining multiple non-ideal parameters, improving the design efficiency of the noise matching transformer, and reducing the research and development cost of the noise matching transformer.

[0039] According to an embodiment of the present invention, based on a test frequency corresponding to a first phase and a plurality of frequency ranges, the magnetizing inductance of a primary winding, the equivalent capacitance of a secondary winding, or the equivalent resistance of a core loss is determined according to at least one of a plurality of preset frequencies, a first input impedance corresponding to the preset frequency, and a DC resistance, including: when the test frequency corresponding to the first phase satisfies the first frequency range, the magnetizing inductance of the primary winding is determined according to the first preset frequency, the second preset frequency, the first input impedance corresponding to the first preset frequency, and the first input impedance corresponding to the second preset frequency. When the test frequency corresponding to the first phase satisfies the second frequency range, the equivalent capacitance of the secondary winding is determined according to the third preset frequency, the fourth preset frequency, the first input impedance corresponding to the third preset frequency, and the first input impedance corresponding to the fourth preset frequency. When the test frequency corresponding to the first phase satisfies the third frequency range, the equivalent resistance of a core loss is determined according to the DC resistance of the primary winding and the first input impedance corresponding to the test frequency.

[0040] According to an embodiment of the present invention, a plurality of frequency ranges may include a first frequency range, a second frequency range, and a third frequency range. The first frequency range may include a range of frequencies corresponding to when the first phase or the second phase is between 85 and 90 degrees. The second frequency range may include a range of frequencies corresponding to when the first phase or the second phase is between -85 and -90 degrees. The third frequency range may include a range of frequencies corresponding to when the first input impedance reaches a maximum value.

[0041] According to an embodiment of the present invention, the second preset frequency may be greater than the first preset frequency, and both the first preset frequency and the second preset frequency satisfy the first frequency range. For example, the first preset frequency is 60 Hz, and the second preset frequency is 80 Hz.

[0042] According to an embodiment of the present invention, the magnetizing inductance can characterize the ability of the primary winding current in the AC circuit to generate a magnetic field. When the frequency corresponding to the first phase satisfies the first frequency range, the magnetizing inductance of the primary winding can be determined based on the first preset frequency, the second preset frequency, the first input impedance corresponding to the first preset frequency, and the first input impedance corresponding to the second preset frequency. For example, when the phase corresponding to the first frequency range is 85 to 90 degrees and the first phase is at 88 degrees, the magnetizing inductance of the primary winding can be obtained based on the first preset frequency, the second preset frequency, the first input impedance corresponding to the first preset frequency, and the first input impedance corresponding to the second preset frequency.

[0043] According to an embodiment of the present invention, the magnetizing inductance of the primary winding is calculated as follows: Formula (1).

[0044] (1)

[0045] in, represents the magnetizing inductance of the primary winding, Indicates the first preset frequency, Indicates the second preset frequency, represents a first input impedance corresponding to a first preset frequency, represents a first input impedance corresponding to a second preset frequency.

[0046] According to an embodiment of the present invention, the first input impedance corresponding to the second preset frequency is greater than the first input impedance corresponding to the first preset frequency.

[0047] According to an embodiment of the present invention, the fourth preset frequency may be greater than the third preset frequency, and both the third preset frequency and the fourth preset frequency satisfy the second frequency range. For example, the third preset frequency is 8 kHz, and the fourth preset frequency is 10 kHz.

[0048] According to an embodiment of the present invention, the equivalent capacitance of the secondary winding can characterize the capacitance generated by the capacitance effect between the coils in the secondary winding. When the test frequency corresponding to the first phase satisfies the second frequency range, the equivalent capacitance of the secondary winding can be determined according to the third preset frequency, the fourth preset frequency, the first input impedance corresponding to the third preset frequency, and the first input impedance corresponding to the fourth preset frequency. For example, when the phase corresponding to the second frequency range is -85~-90 degrees and the first phase is at -86 degrees, the equivalent capacitance of the secondary winding can be determined according to the third preset frequency, the fourth preset frequency, the first input impedance corresponding to the third preset frequency, the first input impedance corresponding to the fourth preset frequency, and the ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding.

[0049] According to an embodiment of the present invention, the equivalent capacitance of the secondary winding is calculated as follows: Formula (2).

[0050] (2)

[0051] in, represents the equivalent capacitance of the secondary winding, Indicates the third preset frequency, Indicates the fourth preset frequency, represents a first input impedance corresponding to a third preset frequency, represents a first input impedance corresponding to a fourth preset frequency, and n represents a ratio of a total number of turns of the k-segment secondary winding to the number of turns of the primary winding.

[0052] According to an embodiment of the present invention, the first input impedance corresponding to the third preset frequency is greater than the first input impedance corresponding to the fourth preset frequency.

[0053] According to an embodiment of the present invention, the multimeter can measure the DC resistance of the primary winding, k DC resistances of the k-segment secondary windings, and the total DC resistance of the k-segment secondary windings. The DC resistance may include at least one of the DC resistance of the primary winding, the k DC resistances of the k-segment secondary windings, and the total DC resistance of the k-segment secondary windings.

[0054] According to an embodiment of the present invention, the third frequency range may include a test frequency corresponding to a maximum input impedance among a plurality of first input impedances. The frequency corresponding to the maximum input impedance may also correspond to a first phase. At the test frequency corresponding to the maximum input impedance, the core loss equivalent resistance may be determined based on the DC resistance of the primary winding and the first input impedance corresponding to the test frequency.

[0055] According to an embodiment of the present invention, the calculation of the equivalent resistance of the core loss is as follows: Formula (3).

[0056] (3)

[0057] in, represents the core loss equivalent resistance, represents the maximum input impedance, Represents the DC resistance of the primary winding.

[0058] According to an embodiment of the present invention, by determining the frequency range satisfied by the test frequency corresponding to the first phase, the magnetizing inductance of the primary winding, the equivalent capacitance of the secondary winding or the equivalent resistance of the core loss can be determined, thereby improving the efficiency of determining the magnetizing inductance of the primary winding, the equivalent capacitance of the secondary winding or the equivalent resistance of the core loss of non-ideal parameters.

[0059] Figure 2A flow chart of a method for determining parameters of a noise matching transformer according to yet another embodiment of the present invention is shown.

[0060] like Figure 2 As shown, the parameter determination method 200 for a noise matching transformer of this embodiment includes operations S210 to S250.

[0061] In operation S210, a plurality of input impedances across the primary winding and a plurality of phases across the primary winding are measured using an impedance analyzer while the secondary winding is in a predetermined state.

[0062] In operation S220, when the test frequency corresponding to the first phase satisfies the first frequency range, the magnetizing inductance of the primary winding is determined according to the first preset frequency, the second preset frequency, the first input impedance corresponding to the first preset frequency, and the first input impedance corresponding to the second preset frequency.

[0063] In operation S230, when the test frequency corresponding to the first phase satisfies the second frequency range, the equivalent capacitance of the secondary winding is determined according to the third preset frequency, the fourth preset frequency, the first input impedance corresponding to the third preset frequency, and the first input impedance corresponding to the fourth preset frequency.

[0064] In operation S240, when the test frequency corresponding to the first phase satisfies the third frequency range, a core loss equivalent resistance is determined according to the DC resistance of the primary winding and the first input impedance corresponding to the test frequency.

[0065] In operation S250 , a leakage inductance of the primary winding and a leakage inductance of the k-segment secondary winding are determined based on a test frequency corresponding to the second phase and a plurality of frequency ranges.

[0066] According to an embodiment of the present invention, the magnetizing inductance of the primary winding, the equivalent capacitance of the secondary winding or the core loss equivalent resistance can be determined according to that the test frequency corresponding to the first phase meets different frequency ranges, and the leakage inductance of the primary winding and the leakage inductance of the k-point secondary winding can be determined according to that the test frequency corresponding to the second phase meets the first frequency range. The DC resistance of the primary winding, k DC resistances of k-segment secondary windings and the total DC resistance of k-segment secondary windings can be measured by a multimeter, so that the non-ideal parameters of the noise matching transformer can be quickly determined, the efficiency of determining the non-ideal parameters is improved, the design of the noise matching transformer is simplified, and the research and development cost of the noise matching transformer is reduced.

[0067] According to an embodiment of the present invention, based on the test frequency corresponding to the second phase and multiple frequency ranges, determining the leakage inductance of the primary winding and the leakage inductance of the k-segment secondary windings includes: when the test frequency corresponding to the second phase satisfies the first frequency range, determining the leakage inductance of the primary winding according to the fifth preset frequency, the sixth preset frequency, the second input impedance corresponding to the fifth preset frequency, and the second input impedance corresponding to the sixth preset frequency. Determine the leakage inductance of the k-segment secondary windings according to the leakage inductance of the primary winding and the first objective function.

[0068] According to an embodiment of the present invention, the first frequency range may include a frequency range corresponding to a second phase of 85 to 90 degrees. The sixth preset frequency may be greater than the fifth preset frequency, and both the fifth preset frequency and the sixth preset frequency satisfy the first frequency range. For example, the fifth preset frequency is 80 kHz, and the sixth preset frequency is 100 kHz.

[0069] According to an embodiment of the present invention, when the test frequency corresponding to the second phase satisfies the first frequency range, the leakage inductance of the primary winding can be determined based on the fifth preset frequency, the sixth preset frequency, the second input impedance corresponding to the fifth preset frequency, and the second input impedance corresponding to the sixth preset frequency.

[0070] According to an embodiment of the present invention, the leakage inductance of the primary winding is calculated as follows: Formula (4).

[0071] (4)

[0072] in, represents the leakage inductance of the primary winding, Indicates the fifth preset frequency, Indicates the fourth preset frequency, represents a second input impedance corresponding to the fifth preset frequency, represents a second input impedance corresponding to a sixth preset frequency.

[0073] According to an embodiment of the present invention, the second input impedance corresponding to the sixth preset frequency is greater than the second input impedance corresponding to the fifth preset frequency.

[0074] According to an embodiment of the present invention, the leakage inductance of the k-segment secondary winding may be determined according to the leakage inductance of the primary winding and the first objective function, as shown in the following formula (5).

[0075] (5)

[0076] in, It represents the leakage inductance of the k-segment secondary winding, k represents the number of segments of the secondary winding, and n represents the ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding.

[0077] According to an embodiment of the present invention, the leakage inductance of the primary winding can be determined when the test frequency corresponding to the second phase satisfies the first frequency range, and the leakage inductance of k-segment secondary windings can be determined based on the leakage inductance of the primary winding and the first objective function, thereby improving the efficiency of determining the leakage inductance of the non-ideal parameter primary winding and the leakage inductance of the k-segment secondary winding.

[0078] According to an embodiment of the present invention, when the test frequency corresponding to the second phase satisfies the first frequency range, the leakage inductance of the primary winding is determined according to the fifth preset frequency, the sixth preset frequency, the second input impedance corresponding to the fifth preset frequency, and the second input impedance corresponding to the sixth preset frequency, including: based on the second objective function, determining the leakage inductance of the primary winding according to the fifth preset frequency, the sixth preset frequency, the second input impedance corresponding to the fifth preset frequency, and the second input impedance corresponding to the sixth preset frequency.

[0079] According to an embodiment of the present invention, the leakage inductance of the primary winding can be determined based on the second objective function shown in the above formula (4) according to the fifth preset frequency, the sixth preset frequency, the second input impedance corresponding to the fifth preset frequency, and the second input impedance corresponding to the sixth preset frequency. That is, when determining the fifth preset frequency and the sixth preset frequency In the case of the fifth preset frequency, the second input impedance corresponding to the fifth preset frequency can be determined. and a second input impedance corresponding to a sixth preset frequency , so that the leakage inductance of the primary winding can be obtained .

[0080] According to the embodiment of the present invention, based on the second objective function, the leakage inductance of the primary winding can be quickly calculated, thereby improving the efficiency of determining the leakage inductance of the primary winding with non-ideal parameters.

[0081] According to an embodiment of the present invention, the second objective function is constructed in the following manner: a first sub-function is constructed based on a second input impedance corresponding to a fifth preset frequency and a second input impedance corresponding to a sixth preset frequency; a second sub-function is constructed based on the fifth preset frequency and the sixth preset frequency; and a second objective function is constructed based on the first sub-function and the second sub-function.

[0082] According to an embodiment of the present invention, a first sub-function may be constructed according to the second input impedance corresponding to the fifth preset frequency and the second input impedance corresponding to the sixth preset frequency. , as shown in formula (6); the second sub-function can be constructed according to the fifth preset frequency and the sixth preset frequency, as shown in formula (7); according to the first sub-function and the second subfunction , a second objective function can be constructed, and the constructed second objective function is as shown in the above formula (4).

[0083] (6)

[0084] (7)

[0085] According to an embodiment of the present invention, a second objective function may be constructed based on the first sub-function and the second sub-function, and then the leakage inductance of the primary winding may be determined based on the second objective function, thereby improving the efficiency of determining the leakage inductance of the primary winding with non-ideal parameters.

[0086] According to an embodiment of the present invention, the leakage inductance of the k-segment secondary winding is determined according to the leakage inductance of the primary winding and the first objective function, including: determining the ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding according to the number of turns of the primary winding and the total number of turns of the k-segment secondary winding; determining the first objective function according to the number of segments of the secondary winding and the ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding; determining the leakage inductance of the k-segment secondary winding based on the product of the leakage inductance of the primary winding and the first objective function.

[0087] According to an embodiment of the present invention, the ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding can be determined based on the number of turns of the primary winding and the total number of turns of the k-segment secondary winding. The first objective function can be determined based on the number of segments of the secondary winding and the ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding, as shown in the following formula (8).

[0088] (8)

[0089] in, represents the first objective function, and n represents the ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding.

[0090] According to an embodiment of the present invention, when the leakage inductance of the primary winding and the first objective function are determined, based on the above formula (5), the leakage inductance of the k-segment secondary winding can be obtained by multiplying the leakage inductance of the primary winding and the first objective function.

[0091] According to an embodiment of the present invention, the leakage inductance of the k-segment secondary winding can be determined based on the leakage inductance of the primary winding and the first objective function, thereby achieving coupling between the leakage inductance of the non-ideal parameter primary winding and the leakage inductance of the k-segment secondary winding, and improving the efficiency of determining the leakage inductance of the non-ideal parameter k-segment secondary winding.

[0092] According to an embodiment of the present invention, a first objective function is determined based on the number of segments of the primary winding and the ratio of the total number of turns of k-segment secondary windings to the number of turns of the primary winding, including: constructing a third sub-function based on the ratio of the total number of turns of k-segment secondary windings to the number of turns of the primary winding; determining the first objective function based on the ratio of the third sub-function to the number of segments of the secondary winding.

[0093] According to an embodiment of the present invention, a third sub-function may be constructed according to the ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding, as shown in the following formula (9).

[0094] (9)

[0095] in, Represents the third subfunction.

[0096] According to an embodiment of the present invention, the first objective function, that is, the above formula (8), can be determined according to the ratio of the third sub-function to the number of segments of the secondary winding.

[0097] According to an embodiment of the present invention, when the test frequency corresponding to the first phase satisfies the third frequency range, the core loss equivalent resistance is determined according to the DC resistance of the primary winding and the first input impedance corresponding to the test frequency, including: determining the target input impedance from multiple first input impedances; and determining the core loss equivalent resistance according to the DC resistance of the primary winding and the target input impedance at the test frequency corresponding to the target input impedance.

[0098] According to an embodiment of the present invention, the target input impedance may be greater than other first input impedances except the target input impedance. The target input impedance may be determined from the plurality of first input impedances according to the magnitudes of the plurality of first input impedances.

[0099] According to an embodiment of the present invention, the test frequency corresponding to the target input impedance satisfies the third frequency range. At the test frequency corresponding to the target input impedance, the core loss equivalent resistance can be determined based on the DC resistance of the primary winding and the target input impedance based on the above formula (3).

[0100] According to an embodiment of the present invention, at a test frequency corresponding to a target input impedance, a core loss equivalent resistance can be determined based on the DC resistance of the primary winding and the target input impedance, thereby improving the efficiency of determining a core loss equivalent resistance with non-ideal parameters.

[0101] According to an embodiment of the present invention, the accuracy of the multimeter is greater than or equal to six and a half digits.

[0102] According to an embodiment of the present invention, when the accuracy of the multimeter is greater than or equal to six and a half digits, the DC resistance of the primary winding, k DC resistances of k-segment secondary windings and the total DC resistance of the k-segment secondary windings can be obtained with higher accuracy, thereby improving the accuracy of the determined non-ideal parameters.

[0103] Based on the above parameter determination method for a noise matching transformer, the present invention also provides a noise matching transformer parameter model.

[0104] According to an embodiment of the present invention, a noise matching transformer parameter model may include the DC resistance of the primary winding, the magnetizing inductance of the primary winding, the leakage inductance of the primary winding, the core loss equivalent resistance, an ideal transformer, the DC resistance of the secondary winding, the leakage inductance of the secondary winding, and the equivalent capacitance of the secondary winding determined using a parameter determination method for a noise matching transformer.

[0105] Figure 3 A circuit diagram of a noise matching transformer parameter model according to an embodiment of the present invention is shown.

[0106] like Figure 3 As shown, the noise matching transformer parameter model of this embodiment includes the DC resistance of the primary winding , the magnetizing inductance of the primary winding , leakage inductance of the primary winding , core loss equivalent resistance 、Ideal transformer , DC resistance of the first secondary winding , DC resistance of the secondary winding at the second end , leakage inductance of the first secondary winding , leakage inductance of the second secondary winding , the equivalent capacitance of the secondary winding .

[0107] According to an embodiment of the present invention, the noise matching transformer may include two sections of secondary windings, namely a first section of secondary winding and a second section of secondary winding.

[0108] According to an embodiment of the present invention, based on the noise matching transformer parameter model, distributed parameters can be modeled as lumped parameters, thereby improving the efficiency of determining multiple non-ideal parameters in the noise matching transformer, simplifying the design of the noise matching transformer, and reducing the research and development cost of the noise matching transformer.

[0109] The flow chart and block diagram in the accompanying drawings illustrate the possible architecture, function and operation of the system, method and computer program product according to various embodiments of the present invention. In this regard, each box in the flow chart or block diagram can represent a module, a program segment, or a part of a code, and the above-mentioned module, program segment, or a part of a code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram or flow chart, and the combination of the boxes in the block diagram or flow chart can be implemented with a dedicated hardware-based system that performs a specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0110] It will be appreciated by those skilled in the art that the features described in the various embodiments and / or claims of the present invention may be combined and / or combined in various ways, even if such combinations and / or combinations are not explicitly described in the present invention. In particular, the features described in the various embodiments and / or claims of the present invention may be combined and / or combined in various ways without departing from the spirit and teachings of the present invention. All of these combinations and / or combinations fall within the scope of the present invention.

[0111] The embodiments of the present invention are described above. However, these embodiments are only for the purpose of illustration, and are not intended to limit the scope of the present invention. Although each embodiment is described above, it does not mean that the measures in each embodiment cannot be used in combination. The scope of the present invention is defined by the attached claims and their equivalents. Without departing from the scope of the present invention, those skilled in the art may make various substitutions and modifications, which should all fall within the scope of the present invention.

Claims

1. A method for determining parameters of a noise matching transformer, characterized in that: The noise matching transformer comprises a primary winding and k-segment secondary windings, wherein k is a positive integer; the method comprises: When the secondary winding is in a predetermined state, a plurality of input impedances at both ends of the primary winding and a plurality of phases at both ends of the primary winding are measured by using an impedance analyzer, wherein the plurality of input impedances and the phases correspond to a plurality of test frequencies of the impedance analyzer, the predetermined state includes an open circuit state and a short circuit state, the plurality of input impedances include a plurality of first input impedances corresponding to the open circuit state and a plurality of second input impedances corresponding to the short circuit state, and the plurality of phases include a plurality of first phases corresponding to the open circuit state and a plurality of second phases corresponding to the short circuit state; Based on the test frequency corresponding to the first phase and multiple frequency ranges, according to multiple preset frequencies, the first input impedance corresponding to the preset frequency, and at least one of the DC resistances, the magnetizing inductance of the primary winding, the equivalent capacitance of the secondary winding, or the core loss equivalent resistance is determined; wherein the DC resistance includes at least one of the DC resistance of the primary winding measured by a multimeter, the k DC resistances of the k-segment secondary windings, and the total DC resistance of the k-segment secondary windings; Based on the test frequency corresponding to the second phase and the multiple frequency ranges, the leakage inductance of the primary winding and the leakage inductance of the k-segment secondary winding are determined.

2. The method according to claim 1, characterized in that The plurality of frequency ranges include a first frequency range, a second frequency range, and a third frequency range; The method of determining the magnetizing inductance of the primary winding, the equivalent capacitance of the secondary winding or the core loss equivalent resistance based on the test frequency corresponding to the first phase and the multiple frequency ranges according to multiple preset frequencies, the first input impedance corresponding to the preset frequencies, and at least one of the DC resistances includes: When the test frequency corresponding to the first phase satisfies the first frequency range, the magnetizing inductance of the primary winding is determined according to the first preset frequency, the second preset frequency, the first input impedance corresponding to the first preset frequency, and the first input impedance corresponding to the second preset frequency, wherein the second preset frequency is greater than the first preset frequency, and both the first preset frequency and the second preset frequency satisfy the first frequency range; When the test frequency corresponding to the first phase satisfies the second frequency range, determining the equivalent capacitance of the secondary winding according to a third preset frequency, a fourth preset frequency, a first input impedance corresponding to the third preset frequency, and a first input impedance corresponding to the fourth preset frequency, wherein the fourth preset frequency is greater than the third preset frequency, and both the third preset frequency and the fourth preset frequency satisfy the second frequency range; When the test frequency corresponding to the first phase satisfies a third frequency range, the core loss equivalent resistance is determined according to the DC resistance of the primary winding and the first input impedance corresponding to the test frequency.

3. The method according to claim 2, characterized in that The determining, based on the test frequency corresponding to the second phase and the multiple frequency ranges, the leakage inductance of the primary winding and the leakage inductance of the k-segment secondary windings comprises: When the test frequency corresponding to the second phase satisfies the first frequency range, the leakage inductance of the primary winding is determined according to a fifth preset frequency, a sixth preset frequency, a second input impedance corresponding to the fifth preset frequency, and a second input impedance corresponding to the sixth preset frequency, wherein the sixth preset frequency is greater than the fifth preset frequency, and both the fifth preset frequency and the sixth preset frequency satisfy the first frequency range; The leakage inductance of the k-segment secondary winding is determined according to the leakage inductance of the primary winding and a first objective function.

4. The method according to claim 3, characterized in that The determining of the leakage inductance of the primary winding according to a fifth preset frequency, a sixth preset frequency, a second input impedance corresponding to the fifth preset frequency, and a second input impedance corresponding to the sixth preset frequency when the test frequency corresponding to the second phase satisfies the first frequency range includes: Based on the second objective function, the leakage inductance of the primary winding is determined according to a fifth preset frequency, a sixth preset frequency, a second input impedance corresponding to the fifth preset frequency, and a second input impedance corresponding to the sixth preset frequency.

5. The method according to claim 4, characterized in that The second objective function is constructed as follows: constructing a first sub-function according to the second input impedance corresponding to the fifth preset frequency and the second input impedance corresponding to the sixth preset frequency; constructing a second sub-function according to the fifth preset frequency and the sixth preset frequency; The second objective function is constructed according to the first sub-function and the second sub-function.

6. The method according to claim 3, characterized in that The determining the leakage inductance of the k-segment secondary winding according to the leakage inductance of the primary winding and the first objective function includes: Determine a ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding according to the number of turns of the primary winding and the total number of turns of the k-segment secondary winding; Determining the first objective function according to the number of segments of the secondary winding and the ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding; The leakage inductance of the k-segment secondary winding is determined based on the product of the leakage inductance of the primary winding and the first objective function.

7. The method according to claim 6, characterized in that Determining the first objective function according to the number of segments of the primary winding and the ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding includes: Constructing a third sub-function according to the ratio of the total number of turns of the k-segment secondary winding to the number of turns of the primary winding; The first objective function is determined according to the ratio of the third sub-function to the number of segments of the secondary winding.

8. The method according to claim 2, characterized in that: When the test frequency corresponding to the first phase satisfies the third frequency range, determining the core loss equivalent resistance according to the DC resistance of the primary winding and the first input impedance corresponding to the test frequency includes: Determine a target input impedance from the plurality of first input impedances, wherein the target input impedance is greater than other first input impedances except the target input impedance; At a test frequency corresponding to the target input impedance, the core loss equivalent resistance is determined according to the DC resistance of the primary winding and the target input impedance, wherein the test frequency corresponding to the target input impedance satisfies a third frequency range.

9. The method according to claim 1, characterized in that: The accuracy of the multimeter is greater than or equal to six and a half digits.

10. A noise matching transformer parameter model, characterized in that: The parameter model includes the DC resistance of the primary winding, the magnetizing inductance of the primary winding, the leakage inductance of the primary winding, the core loss equivalent resistance, the ideal transformer, the DC resistance of the secondary winding, the leakage inductance of the secondary winding, and the equivalent capacitance of the secondary winding determined by the method described in any one of claims 1 to 9.

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