High and low temperature testing device and testing method for infrared detector
By designing a high and low temperature alternating humidity and heat test chamber, the instability of infrared detectors in high and low temperature environments is solved, and reliable testing and cost reduction of infrared detector performance is achieved, improving the realistic and repeatable tests of the test sex.
Patent Information
- Application Number
- CN202411295299.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-17
- Publication Date
- 2024-12-27
AI Technical Summary
The test of existing infrared detectors in high and low temperature environments is difficult to simulate the real target scene, and the field test is greatly affected by the external environment, resulting in unstable imaging effects and difficult to maintain consistency in the test conditions.
A high and low temperature alternating humidity and heat test chamber is designed, which includes two alternating humidity and heat test chambers and observation channels. The infrared detector to be tested and the target object is detected. The sealed light window and the thermal vacuum glass observation window are achieved. Simulation and repeatability tests for low temperature environments.
It realizes reliable testing of infrared detector performance in high and low temperature environments, reduces cooling capacity loss, reduces test costs, and improves test realisticity and repeatability.
Smart Images
Figure CN119197786A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of infrared detectors, and in particular to a high and low temperature testing device and a testing method for infrared detectors. Background Art
[0002] Infrared imaging technology has been widely used in both military and civilian fields, and is a key technology for modern reconnaissance, surveillance, fire control, guidance and other equipment. The amount of thermal radiation energy of the target is directly related to the temperature of the target surface. Infrared imaging actually reflects the radiation temperature distribution on the target surface. Therefore, the infrared detector is constrained by the temperature of the target during infrared imaging. During target recognition, the temperature difference between the background and the target has a greater impact on the imaging effect. The infrared detector itself is affected by the ambient temperature, and its performance parameters change to a certain extent, thus affecting the imaging results.
[0003] When examining the detection capability of infrared detectors for targets of different temperatures, it is inefficient to collect targets that meet multiple conditions. This is usually achieved by observing black bodies instead of actual targets, or through field tests. Although black bodies can simulate the surface temperature of actual objects, they have problems such as uniform background and single material. Field tests are significantly affected by the external environment due to the openness of outdoor venues, and it is difficult to maintain consistent test conditions for multiple verifications. Summary of the invention
[0004] The technical solution adopted by the present invention to solve the technical problem is: a high and low temperature testing device and testing method for infrared detectors, including a high and low temperature alternating humidity and heat test box 1, a high and low temperature alternating humidity and heat test box 2 is arranged on one side of the high and low temperature alternating humidity and heat test box 1, an observation channel is fixedly arranged between the high and low temperature alternating humidity and heat test box 1 and the high and low temperature alternating humidity and heat test box 2, observation windows are symmetrically arranged on the observation channel, a sealed light window is arranged at the center of the observation channel, an infrared detector to be tested is placed inside the high and low temperature alternating humidity and heat test box 1, and a detection target object is placed inside the high and low temperature alternating humidity and heat test box 2.
[0005] As a preferred technical solution of the present invention, the interior of the second high and low temperature alternating humidity test chamber is divided into storage spaces of different sizes by grids.
[0006] As a preferred technical solution of the present invention, the material of the sealed light window is germanium, and a heat-insulating vacuum layer is provided in the central interlayer of the sealed light window.
[0007] As a preferred technical solution of the present invention, the outer layer of the observation channel is a stainless steel structure, the inner layer is black pearl cotton, and the seams are filled with silicone rubber.
[0008] As a preferred technical solution of the present invention, the observation window is thermally conductive vacuum glass.
[0009] As a preferred technical solution of the present invention, a high and low temperature test device and test method for infrared detectors, the specific steps of which are as follows: T1, placing the detection target inside the high and low temperature alternating damp heat test chamber II, and placing the infrared detector to be tested in the high and low temperature alternating damp heat test chamber I;
[0010] T2, then start the infrared detector to be tested, high and low temperature alternating humidity test chamber 1 and high and low temperature alternating humidity test chamber 2;
[0011] T3. Observe the status of the test samples in the high and low temperature boxes at both ends through the observation windows.
[0012] The present invention has the following advantages: 1. While satisfying the adaptability of infrared detectors in high and low temperature environments, it simulates the detection of different high and low temperature targets, realistically and repeatably reproduces the changes in the target infrared field, so as to assess the performance of the infrared detector under test, adapt to different test requirements, and has a lower cost than the existing test system on the market;
[0013] 2. While reducing the loss of cooling capacity, the status of the test samples in the high and low temperature boxes at both ends can be observed at any time; BRIEF DESCRIPTION OF THE DRAWINGS
[0014] Figure 1 It is a schematic diagram of the three-dimensional structure of a preferred embodiment of the present invention.
[0015] Explanation of the accompanying reference numerals: 1. High and low temperature alternating humidity and heat test chamber 1; 2. High and low temperature alternating humidity and heat test chamber 2; 3. Observation channel; 4. Observation window; 5. Sealed light window. DETAILED DESCRIPTION
[0016] The present invention will be further described below in conjunction with the accompanying drawings.
[0017] Embodiment 1
[0018] Please refer to Figure 1 The present invention discloses a high and low temperature testing device and a testing method for an infrared detector, comprising a high and low temperature alternating humidity and heat test chamber 1, a high and low temperature alternating humidity and heat test chamber 2 2 is arranged on one side of the high and low temperature alternating humidity and heat test chamber 1, an observation channel 3 is fixedly arranged between the high and low temperature alternating humidity and heat test chamber 1 and the high and low temperature alternating humidity and heat test chamber 2 2, observation windows 4 are symmetrically arranged on the observation channel 3, and a sealed light window 5 is arranged at the center of the observation channel 3, an infrared detector to be tested is placed inside the high and low temperature alternating humidity and heat test chamber 1, and a detection target is placed inside the high and low temperature alternating humidity and heat test chamber 2 2, the high and low temperature alternating humidity and heat test chamber 1 and the high and low temperature alternating humidity and heat test chamber 2 2 are modified on existing equipment, and the detection targets used include variable temperature heat sources, various materials and objects of different volumes.
[0019] The interior of the high and low temperature alternating humidity test chamber 2 is divided into storage spaces of different sizes by grids, which can test multiple objects at one time.
[0020] The material of the sealed light window 5 is germanium, and a heat-insulating vacuum layer is provided in the center interlayer of the sealed light window 5, which can effectively prevent the heat from diffusing at both ends and affecting the detection result.
[0021] The outer layer of the observation channel 3 is made of stainless steel, the inner layer is black pearl cotton, and the joints are filled with silicone rubber to reduce heat loss. The observation window 4 is heat-conducting vacuum glass;
[0022] The specific steps are as follows:
[0023] T1. Place the detection target in the high and low temperature alternating damp heat test chamber 2, and place the infrared detector to be tested in the high and low temperature alternating damp heat test chamber 1;
[0024] T2, then start the infrared detector to be tested, high and low temperature alternating humidity test chamber 1 and high and low temperature alternating humidity test chamber 2;
[0025] T3. Observe the status of the test samples in the high and low temperature boxes at both ends through the observation window 4.
[0026] The above are only preferred embodiments of the present invention. It should be pointed out that, for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present invention. These improvements and modifications should also be regarded as the scope of protection of the present invention.
[0027] Other parts of the present invention not described in detail belong to the prior art and will not be described in detail here.
[0028] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.
Claims
1. A high and low temperature test device for an infrared detector, comprising a high and low temperature alternating damp heat test chamber (1), characterized in that: A high and low temperature alternating humidity and heat test chamber 2 (2) is arranged on one side of the high and low temperature alternating humidity and heat test chamber 1 (1), an observation channel (3) is fixedly arranged between the high and low temperature alternating humidity and heat test chamber 1 (1) and the high and low temperature alternating humidity and heat test chamber 2 (2), observation windows (4) are symmetrically arranged on the observation channel (3), and a sealed light window (5) is arranged at the center of the observation channel (3), an infrared detector to be tested is placed inside the high and low temperature alternating humidity and heat test chamber 1 (1), and a detection target is placed inside the high and low temperature alternating humidity and heat test chamber 2 (2).
2. A high and low temperature testing device for infrared detectors as claimed in claim 1, characterized in that: The interior of the high and low temperature alternating humidity and heat test box 2 (2) is divided into storage spaces of different sizes by grids.
3. A high and low temperature testing device for infrared detectors as claimed in claim 1, characterized in that: The material of the sealed light window (5) is germanium, and a heat-insulating vacuum layer is provided in the central interlayer of the sealed light window (5).
4. A high and low temperature testing device for infrared detectors as claimed in claim 1, characterized in that: The outer layer of the observation channel (3) is a stainless steel structure, the inner layer is black pearl cotton, and the joints are filled with silicone rubber.
5. A high and low temperature testing device for infrared detectors as claimed in claim 1, characterized in that: The observation window (4) is heat-conducting vacuum glass.
6. A high and low temperature test device and test method for an infrared detector, using the high and low temperature test device for an infrared detector as described in claim 1, and the specific steps are as follows: T1. Place the detection target in the high-low temperature alternating humidity test chamber 2 (2), and place the infrared detector to be tested in the high-low temperature alternating humidity test chamber 1 (1); T2, then start the infrared detector to be tested, the high and low temperature alternating humidity test chamber 1 (1) and the high and low temperature alternating humidity test chamber 2 (2); T3. Observe the status of the test samples in the high and low temperature boxes at both ends through the observation window (4).