VCSEL chip relaxation oscillation frequency estimation method, device, equipment, medium and program product

Abstract

The invention relates to a VCSEL (Vertical Cavity Surface Emitting Laser) chip relaxation oscillation frequency estimation method, device and equipment, a medium and a program product. The method comprises the following steps: acquiring RIN test data of a VCSEL chip; obtaining a frequency response curve graph based on a data point set representing the RIN intensity under each frequency in the RIN test data; the horizontal axis of the frequency response curve graph represents the frequency and the vertical axis represents the RIN intensity; performing differential processing on the frequency response curve graph to obtain a first-order derivative curve graph; and taking the frequency corresponding to the zero point in the first-order derivative curve graph as the theoretical relaxation oscillation frequency of the VCSEL chip. By adopting the method, the theoretical relaxation oscillation frequency of the VCSEL chip can be determined by using the existing RIN test data of the VCSEL chip, and the data utilization rate in the test process of the VCSEL chip is improved.

Description

Technical Field

[0001] The present application relates to the field of chip testing technology, and in particular to a method, device, equipment, medium and program product for estimating the relaxation oscillation frequency of a VCSEL chip. Background Art

[0002] Vertical Cavity Surface Emitting Laser (VCSEL) is a semiconductor laser widely used in the field of optical communications. Due to its complex manufacturing process and working principle, VCSEL usually requires a variety of performance test items during the production process, including RIN test, S parameter test, etc. These performance test items are crucial to ensure the performance and quality of VCSEL.

[0003] With the rapid development of the optical communication field, the market has also put forward higher requirements for the production efficiency of VCSEL. However, in the current production process of VCSEL, it is impossible to effectively use the existing test data of VCSEL when testing VCSEL, resulting in the need for comprehensive performance testing of each VCSEL chip, which in turn causes the VCSEL testing process to be not only very cumbersome but also consumes a lot of time and labor costs. Obviously, the production method of the prior art that cannot effectively use the existing test data of VCSEL is not conducive to improving the production efficiency of VCSEL in large-scale production. Summary of the invention

[0004] Based on this, it is necessary to provide a VCSEL chip relaxation oscillation frequency estimation method, device, computer equipment, computer readable storage medium and computer program product that can improve the VCSEL chip testing efficiency in response to the above technical problems.

[0005] In a first aspect, the present application provides a method for estimating the relaxation oscillation frequency of a VCSEL chip, comprising:

[0006] Obtain RIN test data of VCSEL chips;

[0007] Based on the data point set representing the RIN intensity at each frequency in the RIN test data, a frequency response curve is obtained; the horizontal axis of the frequency response curve represents the frequency magnitude and the vertical axis represents the RIN intensity magnitude;

[0008] Perform differentiation processing on the frequency response curve to obtain a first-order derivative curve;

[0009] The frequency corresponding to the zero point in the first-order derivative curve is taken as the theoretical relaxation oscillation frequency of the VCSEL chip.

[0010] In a second aspect, the present application also provides a VCSEL chip relaxation oscillation frequency estimation device, comprising:

[0011] An acquisition module is used to obtain the RIN test data of the VCSEL chip;

[0012] A response module, for obtaining a frequency response curve graph based on a data point set representing the RIN intensity at each frequency in the RIN test data; the horizontal axis of the frequency response curve graph represents the frequency magnitude and the vertical axis represents the RIN intensity magnitude;

[0013] A differential module is used to perform differential processing on the frequency response curve to obtain a first-order derivative curve;

[0014] The estimation module is used to use the frequency corresponding to the zero point in the first-order derivative curve as the theoretical relaxation oscillation frequency of the VCSEL chip.

[0015] In a third aspect, the present application further provides a computer device, which includes a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, it implements some or all of the steps described in any method of the first aspect of the present application.

[0016] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements some or all of the steps described in any method of the first aspect of the present application.

[0017] In a fifth aspect, the present application further provides a computer program product, which includes a computer program, and when the computer program is executed by a processor, it implements part or all of the steps described in any method of the first aspect of the embodiment of the present application.

[0018] The above-mentioned VCSEL chip relaxation oscillation frequency estimation method, device, computer equipment, computer-readable storage medium and computer program product obtain the RIN test data of the VCSEL chip; based on the data point set characterizing the RIN intensity at each frequency in the RIN test data, a frequency response curve graph is obtained; the horizontal axis of the frequency response curve graph represents the frequency magnitude and the vertical axis represents the RIN intensity magnitude; the frequency response curve graph is differentiated to obtain a first-order derivative curve graph; based on the frequency corresponding to the zero point in the first-order derivative curve graph, the theoretical relaxation oscillation frequency of the VCSEL chip is used. The VCSEL chip relaxation oscillation frequency estimation method provided by the present application can determine the theoretical relaxation oscillation frequency of the VCSEL chip by using the existing RIN test data of the VCSEL chip, thereby improving the data utilization rate of the VCSEL chip testing process, thereby improving the VCSEL chip testing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the drawings required for use in the embodiments of the present application or related technical descriptions will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0020] FIG1 is a diagram showing an application environment of a method for estimating relaxation oscillation frequency of a VCSEL chip in one embodiment;

[0021] FIG2 is a schematic diagram of a flow chart of a method for estimating relaxation oscillation frequency of a VCSEL chip in one embodiment;

[0022] FIG3 is a schematic diagram of an initial response curve before filtering and a frequency response curve after filtering in one embodiment;

[0023] FIG4 is a schematic diagram of a first-order derivative curve obtained in one embodiment;

[0024] FIG5 is a structural block diagram of a VCSEL chip relaxation oscillation frequency estimation device in one embodiment;

[0025] FIG6 is a diagram showing the internal structure of a computer device in one embodiment;

[0026] FIG. 7 is a diagram showing the internal structure of a computer device in another embodiment. DETAILED DESCRIPTION

[0027] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0028] The VCSEL chip relaxation oscillation frequency estimation method provided in the embodiment of the present application can be applied to the application environment as shown in Figure 1. Among them, the terminal 102 communicates with the measuring device 104 through the network. The data storage system can store the data that the measuring device 104 needs to process. The data storage system can be integrated on the measuring device 104, or it can be placed on the cloud or other network servers. Among them, the terminal 102 can be, but is not limited to, various personal computers, laptops, smart phones and tablet computers.

[0029] In an exemplary embodiment, as shown in FIG2 , a method for estimating the relaxation oscillation frequency of a VCSEL chip is provided, which is described by taking the method applied to the terminal in FIG1 as an example, and includes the following steps 202 to 208. Among them:

[0030] Step 202, obtaining RIN test data of the VCSEL chip.

[0031] RIN stands for Relative Intensity Noise. RIN test data refers to a set of test data used to characterize the light intensity fluctuation characteristics in the test of lasers or other light sources. RIN test data is usually measured in decibel Hertz (dB / Hz), indicating the amplitude of light intensity fluctuation at a specific frequency.

[0032] Specifically, the optical signal output by the VCSEL is obtained through a photodetector and converted into an electrical signal, and the electrical signal is input into a measuring device so that the measuring device outputs the RIN test data of the VCSEL chip under preset test conditions, and the terminal obtains the RIN test data of the VCSEL chip output by the measuring device.

[0033] Optionally, the measuring device may be ANRITSU MS2728C or other device capable of outputting RIN test data of the VCSEL chip; the preset test conditions may include a test environment, a test frequency range, and a test current; the test environment may be a normal temperature and pressure environment, the test frequency range may be 10 MHz to 40 GHz, and the test current may be 6-11 mA.

[0034] Step 204, based on the data point set representing the RIN strength at each frequency in the RIN test data, a frequency response curve is obtained; the horizontal axis of the frequency response curve represents the frequency magnitude and the vertical axis represents the RIN strength magnitude.

[0035] Among them, the data point set in the RIN test data includes multiple data points within a certain frequency range that represent the corresponding relationship between the frequency size and the RIN intensity size. The frequency range corresponding to the data point set is determined by the test frequency range corresponding to when the RIN test data is obtained.

[0036] Optionally, the unit of the frequency magnitude represented by the horizontal axis of the frequency response curve graph is GHz; the unit of the RIN intensity magnitude represented by the vertical axis of the frequency response curve graph is dB / Hz.

[0037] Optionally, the frequency response curve graph may be obtained based on a programming language with a graph drawing function and a data point set representing the RIN intensity at each frequency in the RIN test data. Optionally, the programming language with a graph drawing function may be MATLAB, PYTHON or other programming languages.

[0038] Step 206: perform differentiation processing on the frequency response curve graph to obtain a first-order derivative curve graph.

[0039] Among them, the first-order derivative curve is used to intuitively display the rate at which the RIN intensity changes with frequency. It is easy to understand that the first-order derivative curve has a smaller amount of data than the frequency response curve, because in the first-order derivative curve, only the rate of change of the RIN intensity needs to be paid attention to, and no longer the absolute value of the RIN intensity needs to be paid attention to.

[0040] Optionally, the frequency response curve graph may be differentiated based on MATLAB, PYTHON or other programming languages ​​to obtain a first-order derivative curve graph.

[0041] Step 208: taking the frequency corresponding to the zero point in the first-order derivative curve as the theoretical relaxation oscillation frequency of the VCSEL chip.

[0042] Among them, the theoretical relaxation oscillation frequency is unique in the first-order derivative curve diagram, and because the first-order derivative curve diagram is obtained based on the RIN test data, it can also be understood that the theoretical relaxation oscillation frequency is unique in the RIN test data, that is, only one theoretical relaxation oscillation frequency can be determined based on the RIN test data.

[0043] Specifically, since the first-order derivative curve represents the rate at which the RIN intensity changes with frequency, it is easy to understand that the zero point in the first-order derivative curve can represent the RIN intensity peak within the local frequency range. Usually, the VCSEL chip also has a corresponding RIN intensity peak at the relaxation oscillation frequency. Therefore, the frequency corresponding to the zero point in the first-order derivative curve can be determined as the theoretical relaxation oscillation frequency of the VCSEL chip.

[0044] In the above-mentioned VCSEL chip relaxation oscillation frequency estimation method, the RIN test data of the VCSEL chip is obtained; based on the data point set that characterizes the RIN intensity at each frequency in the RIN test data, a frequency response curve is obtained; the horizontal axis of the frequency response curve represents the frequency magnitude and the vertical axis represents the RIN intensity magnitude; the frequency response curve is differentiated to obtain a first-order derivative curve; the frequency corresponding to the zero point in the first-order derivative curve is used as the theoretical relaxation oscillation frequency of the VCSEL chip. The VCSEL chip relaxation oscillation frequency estimation method provided by the present application can determine the theoretical relaxation oscillation frequency of the VCSEL chip by using the existing RIN test data of the VCSEL chip, thereby improving the data utilization rate of the VCSEL chip testing process, thereby improving the VCSEL chip testing efficiency.

[0045] In an exemplary embodiment, the method further includes:

[0046] Obtain the measured relaxation oscillation frequency of the VCSEL chip;

[0047] Determine the match between the theoretical relaxation oscillation frequency and the measured relaxation oscillation frequency;

[0048] When the matching result meets the preset matching condition, the S parameter test is not performed on the VCSEL chip.

[0049] The measured relaxation oscillation frequency is the known relaxation oscillation frequency of the VCSEL chip, that is, the VCSEL chip in the embodiment of the present application has a known measured relaxation oscillation frequency.

[0050] Optionally, the measured relaxation oscillation frequency of the VCSEL chip can be obtained by light intensity modulation, phase noise measurement, etc., or can be provided by the manufacturer of the VCSEL chip, as long as it is not obtained through a first-order derivative curve graph, and the embodiments of the present application are not limited here.

[0051] Optionally, the matching result between the theoretical relaxation oscillation frequency and the measured relaxation oscillation frequency may be an error range between the theoretical relaxation oscillation frequency and the measured relaxation oscillation frequency. Based on this, further optionally, the preset matching condition may be that the error range corresponding to the matching result is within a preset error range.

[0052] S parameter testing, also known as scattering parameter testing, is a common test method for evaluating the performance of RF and microwave devices. One purpose of S parameter testing is to extract the relaxation oscillation frequency of VCSEL chips. Therefore, if the theoretical relaxation oscillation frequency with accuracy can be extracted through the RIN test data of VCSEL chips, the VCSEL chips can be exempted from the S parameter test, thereby significantly improving the testing efficiency of VCSEL chips.

[0053] In this embodiment, the RIN test data of the VCSEL chip and the measured relaxation oscillation frequency known in advance are obtained, and after the theoretical relaxation oscillation frequency is obtained through the RIN test data, the theoretical relaxation oscillation frequency is matched with the measured relaxation oscillation frequency, so that, when the matching result meets the preset matching conditions, it is determined that the theoretical relaxation oscillation frequency obtained through the existing RIN test data has accuracy and credibility, and therefore, the VCSEL chip does not need to perform subsequent S parameter testing links that can be used to extract the relaxation oscillation frequency, that is, the VCSEL chip is not subjected to S parameter testing. It can be seen that this embodiment improves the data utilization rate of the VCSEL chip testing process, and thus, can improve the VCSEL chip testing efficiency.

[0054] In an exemplary embodiment, the frequency response curve diagram obtained by the data point set representing the RIN intensity at each frequency in the RIN test data includes:

[0055] Based on the data point set representing the RIN intensity at each frequency in the RIN test data, an initial response curve graph is obtained;

[0056] A denoising process is performed on at least one data point included in the data point set in the initial response curve graph to obtain a frequency response curve graph.

[0057] The initial response curve is a curve that is obtained by drawing a data point set representing the RIN intensity at each frequency in the RIN test data and has not yet been denoised.

[0058] Specifically, since the frequency response curve graph is obtained by denoising the initial response curve graph, the frequency response curve graph has a greater curve smoothness than the initial response curve graph.

[0059] Optionally, at least one data point included in the data point set in the initial response curve graph is subjected to denoising, which may be the case where the peak data point included in the data point set in the initial response curve graph is subjected to denoising, thereby obtaining a frequency response curve graph; or the initial response curve graph is subjected to differentiation processing, and then the peak data point included in the data point set in the initial response curve graph after the differentiation processing is subjected to denoising, thereby obtaining a frequency response curve graph.

[0060] In this embodiment, an initial response curve graph is obtained based on a data point set representing the RIN intensity at each frequency in the RIN test data, and then at least one data point included in the data point set in the initial response curve graph is denoised to obtain a frequency response curve graph. Thus, the data point set in the frequency response curve graph can better reflect the data characteristics of the RIN test data. At the same time, the data quality of the frequency response curve graph can be improved so that the subsequently obtained theoretical relaxation oscillation frequency can be more accurate and reliable.

[0061] In an exemplary embodiment, performing denoising on at least one data point included in the data point set in the initial response curve graph to obtain a frequency response curve graph includes:

[0062] Performing denoising processing on at least one data point included in the data point set in the initial response curve graph based on a Gaussian filter to obtain a first intermediate response curve graph;

[0063] Performing a first-order differentiation on the first intermediate response curve graph to obtain a second intermediate response curve graph;

[0064] At least one extreme value data point in the data point set in the second intermediate response curve graph is truncated to obtain a frequency response curve graph.

[0065] Optionally, the window size of the Gaussian filter can be set to 5 and the threshold size can be set to 3.

[0066] In an exemplary embodiment, the above-mentioned truncating at least one extreme data point in the data point set in the second intermediate response curve graph to obtain the frequency response curve graph includes: truncating at least one extreme data point in the data point set in the second intermediate response curve graph based on MATLAB or Python to obtain the frequency response curve graph.

[0067] In an exemplary embodiment, the above-mentioned truncating at least one extreme data point in the data point set in the second intermediate response curve graph to obtain the frequency response curve graph includes: truncating at least one extreme data point in the data point set in the second intermediate response curve graph, and integrating the second intermediate response curve graph from which the at least one extreme data point is truncated to obtain the frequency response curve graph.

[0068] Exemplarily, assuming that the frequency range is 0 to 40 GHz, the RIN intensity range is -15 to 15 dB / Hz, the horizontal axis represents the frequency and the vertical axis represents the RIN intensity. As shown in FIG3 , the blue curve and the orange curve are the initial response curve before filtering and the frequency response curve after filtering, respectively. It can be seen that the curve smoothness of the frequency response curve after filtering is significantly greater than that of the initial response curve before filtering.

[0069] In this embodiment, a denoising process is performed on at least one data point included in the data point set in the initial response curve graph. First, a denoising process is performed on at least one data point included in the data point set in the initial response curve graph based on a Gaussian filter, and then a first-order differential is performed on the first intermediate response curve graph obtained after the Gaussian denoising process. At least one extreme data point in the data point set in the second intermediate response curve graph obtained after the first-order differential is truncated to obtain a frequency response curve graph. Thus, through two-step denoising processing, the data point set in the frequency response curve graph can better reflect the data characteristics of the RIN test data. At the same time, the data quality of the frequency response curve graph can be improved to further make the subsequently obtained theoretical relaxation oscillation frequency more accurate and reliable.

[0070] In an exemplary embodiment, the frequency corresponding to the zero point in the first-order derivative curve graph is used as the theoretical relaxation oscillation frequency of the VCSEL chip, including:

[0071] Determining a first target frequency range according to the bandwidth of the VCSEL chip;

[0072] Determining a zero point in a first-order derivative curve graph within a first target frequency range;

[0073] The frequency corresponding to the zero point in the first-order derivative curve is determined as the theoretical relaxation oscillation frequency of the VCSEL chip.

[0074] In which, because the relaxation oscillation frequency of the VCSEL chip is usually located near the bandwidth frequency, the first target frequency range can be determined according to the bandwidth frequency of the VCSEL chip.

[0075] There is a corresponding data point set in the first-order derivative curve diagram, and the corresponding data point set in the first-order derivative curve diagram includes multiple data points in the same frequency range as the frequency response curve that represent the corresponding relationship between the frequency size and the RIN intensity change rate size.

[0076] Exemplarily, the first target frequency range may be a frequency range including the bandwidth frequency of the VCSEL chip; optionally, the first target frequency range is within a first preset value units of the bandwidth frequency of the VCSEL chip, that is, the first target frequency range = bandwidth frequency of the VCSEL chip ± a first preset value units.

[0077] Exemplarily, the first preset value may be 10 or other values, and thus, the first target frequency range may be the bandwidth frequency of the VCSEL chip ±10 GHz; further exemplarily, assuming that the bandwidth frequency of the VCSEL chip is 25 and the unit is GHz, then the first target frequency range is 25 GHz ±10 GHz, that is, the first target frequency range may be 15 to 35 GHz.

[0078] In an exemplary embodiment, the first target frequency range is within ±10 GHz of the bandwidth of the VCSEL chip.

[0079] In an exemplary embodiment, the method further includes:

[0080] Determining whether the number of zero points determined within the first target frequency range is unique;

[0081] In response to the fact that the number of zero points within the first target frequency range is unique, the frequency corresponding to the zero point in the first-order derivative curve graph is used as the theoretical relaxation oscillation frequency of the VCSEL chip.

[0082] In an exemplary embodiment, the method further includes:

[0083] In response to the number of zero points within the first target frequency range not being unique, determining whether each determined zero point satisfies a preset zero point condition;

[0084] The frequency corresponding to the zero point that meets the preset zero point condition in the first-order derivative curve diagram is taken as the theoretical relaxation oscillation frequency of the VCSEL chip.

[0085] The preset zero point condition should make the determined theoretical relaxation oscillation frequency unique in the RIN test data. Optionally, the preset zero point condition may mean that the frequency corresponding to the zero point is within a specified frequency range, or that the zero point is the only zero point within the specified frequency range.

[0086] In an exemplary embodiment, the preset zero point condition is that the RIN intensity change rate within a certain frequency range on the left side of the zero point is greater than 0, and the RIN intensity change rate within a certain frequency range on the right side of the zero point is less than 0.

[0087] It is easy to understand that since the first-order derivative graph corresponds to the frequency response graph and the vertical axis of the frequency response graph represents the RIN intensity, the vertical axis of the first-order derivative graph represents the RIN intensity change rate.

[0088] Specifically, the preset zero point condition is that the RIN intensity change rate within a certain frequency range to the left of the zero point is greater than 0, and the RIN intensity change rate within a certain frequency range to the right of the zero point is less than 0, representing that the frequency of the zero point corresponds to the maximum value of the RIN intensity within a certain frequency range to the left of the zero point and within a certain frequency range to the right of the zero point.

[0089] Optionally, the certain frequency range is within a second preset value units of the frequency corresponding to the zero point that meets the preset zero point condition, that is, the certain frequency range = the zero point that meets the preset zero point condition ± the second preset value units.

[0090] Exemplarily, the second preset value can be 5 or other values, so that the certain frequency range can be the frequency corresponding to the zero point that meets the preset zero point condition ±5 GHz; further exemplarily, when the frequency corresponding to the zero point that meets the preset zero point condition is 20 units in GHz, then the certain frequency range on the left side of the zero point is 15-20 GHz, and the certain frequency range on the right side of the zero point is 20-25 GHz.

[0091] In an exemplary embodiment, the certain frequency range is within a range of ±5 GHz of the frequency corresponding to the zero point.

[0092] In an exemplary embodiment, the preset zero point condition indicates that there is only one zero point that meets the preset zero point condition within the first target frequency range.

[0093] Specifically, the size of a certain frequency range can be obtained by testing multiple VCSEL chips in advance. The size of a certain frequency range should satisfy the condition that the zero point that meets the preset zero point condition is unique, that is, there cannot be multiple zero points that meet the preset zero point condition within the first target frequency range.

[0094] For example, after the filtered frequency response curve shown in FIG3 is differentiated, the first-order derivative curve is shown in FIG4. Assuming that the range of the rate of change of the RIN intensity after the differentiation is -0.08 to 0.06, and the frequency range is still 0 to 40 GHz, the horizontal axis represents the frequency and the vertical axis represents the rate of change of the RIN intensity. Assuming that the first target frequency range is 15 to 35 GHz, it can be seen from FIG4 that within the first target frequency range corresponding to the red box, there is a frequency of 20 GHz. zero point, and there is only this one zero point in the first target frequency range. At the same time, the preset zero point condition is that the RIN intensity change rate in the frequency range of -5 GHz on the left side of the zero point is greater than 0, and the RIN intensity change rate in the frequency range of +5 GHz on the right side of the zero point is less than 0. That is to say, the RIN intensity change rate is greater than 0 at 15 to 20 GHz and is less than 0 at 20 to 25 GHz. Therefore, the zero point at a frequency of 20 GHz meets the preset zero point condition. Therefore, the theoretical relaxation oscillation frequency of the VCSEL chip is estimated to be 20 GHz.

[0095] In this embodiment, the setting of the preset zero point condition avoids the undesirable situation that the theoretical relaxation oscillation frequency of the VCSEL chip cannot be specifically determined due to the existence of multiple zero points in the first target frequency range, and emphasizes the preset zero point condition of the change rate of the specific RIN intensity. In fact, it also characterizes that the zero point that meets the preset zero point condition has a maximum peak value within a certain frequency range on the left side of the zero point and a certain frequency range on the right side of the zero point. Therefore, the zero point that meets the preset zero point condition determined in the data point set of the first-order derivative curve diagram can determine the theoretical relaxation oscillation frequency with accuracy and credibility.

[0096] The application process of the above-mentioned VCSEL chip relaxation oscillation frequency estimation method is described below in conjunction with a detailed embodiment, as follows:

[0097] (1) VCSEL chip data acquisition process

[0098] The terminal obtains the RIN test data and measured relaxation oscillation frequency of the VCSEL chip;

[0099] (2) Process of obtaining the frequency response curve

[0100] The terminal obtains an initial response curve graph based on a data point set representing the RIN strength at each frequency in the RIN test data; performs denoising processing on at least one data point included in the data point set in the initial response curve graph based on a Gaussian filter to obtain a first intermediate response curve graph; performs a first-order differential on the first intermediate response curve graph to obtain a second intermediate response curve graph; cuts off at least one extreme value data point in the data point set in the second intermediate response curve graph to obtain a frequency response curve graph; the horizontal axis of the frequency response curve graph represents the frequency size and the vertical axis represents the RIN strength size;

[0101] (3) The process of obtaining the first-order derivative curve

[0102] The terminal performs differentiation processing on the frequency response curve graph to obtain a first-order derivative curve graph;

[0103] (4) Determination process of theoretical relaxation oscillation frequency

[0104] The terminal determines a first target frequency range according to the bandwidth of the VCSEL chip; determines whether the number of zero points determined within the first target frequency range is unique; in response to the number of zero points within the first target frequency range being unique, uses the frequency corresponding to the zero point in the first-order derivative curve graph as the theoretical relaxation oscillation frequency of the VCSEL chip; in response to the number of zero points within the first target frequency range being not unique, determines whether each determined zero point meets a preset zero point condition; uses the frequency corresponding to the zero point that meets the preset zero point condition in the first-order derivative curve graph as the theoretical relaxation oscillation frequency of the VCSEL chip; specifically, the preset zero point condition is that the RIN intensity change rate within the -5 GHz frequency range to the left of the zero point is greater than 0, and the RIN intensity change rate within the +5 GHz frequency range to the right of the zero point is less than 0.

[0105] (5) Determination process of S parameter test results

[0106] The terminal determines a matching result between a theoretical relaxation oscillation frequency and an actually measured relaxation oscillation frequency; when the matching result meets a preset matching condition, the S parameter test of the VCSEL chip is not performed.

[0107] In this embodiment, by acquiring the existing data of the VCSEL chip: RIN test data and the measured relaxation oscillation frequency, a first-order derivative curve graph characterizing the rate at which the RIN intensity changes with frequency is obtained based on the RIN test data after denoising and differentiation processing. In the first target frequency range including the frequency range near the bandwidth frequency of the VCSEL chip, it is further determined that there are no other zero points in the frequency range near the corresponding frequency and the zero point of the RIN intensity with the maximum peak value at the corresponding frequency is used as the theoretical relaxation oscillation frequency of the VCSEL chip. It can be seen that this embodiment uses the existing RIN test data of the VCSEL chip to determine the theoretical relaxation oscillation frequency that is located near the VCSEL bandwidth frequency and corresponds to the maximum RIN intensity. Furthermore, by matching the theoretical relaxation oscillation frequency with the existing measured relaxation oscillation frequency of the VCSEL, when the matching result meets the preset matching conditions, it can be shown that the determined theoretical relaxation oscillation frequency has accuracy and credibility. Therefore, the subsequent S parameter test that can also be used to determine the relaxation oscillation frequency of the VCSEL chip can be avoided. Based on this, the test efficiency of the VCSEL chip is significantly improved, and the test cost of the VCSEL chip is greatly saved.

[0108] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0109] Based on the same inventive concept, the embodiment of the present application also provides a VCSEL chip relaxation oscillation frequency estimation device for implementing the VCSEL chip relaxation oscillation frequency estimation method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more VCSEL chip relaxation oscillation frequency estimation device embodiments provided below can refer to the limitations of the VCSEL chip relaxation oscillation frequency estimation method above, and will not be repeated here.

[0110] In an exemplary embodiment, as shown in FIG5 , a VCSEL chip relaxation oscillation frequency estimation device is provided, comprising: an acquisition module 502 , a response module 504 , a differentiation module 506 and an estimation module 508 , wherein:

[0111] The acquisition module 502 is used to acquire the RIN test data of the VCSEL chip.

[0112] The response module 504 is used to obtain a frequency response curve based on a data point set representing the RIN strength at each frequency in the RIN test data; the horizontal axis of the frequency response curve represents the frequency magnitude and the vertical axis represents the RIN strength magnitude.

[0113] The differentiation module 506 is used to perform differentiation processing on the frequency response curve graph to obtain a first-order derivative curve graph.

[0114] The estimation module 508 is used to use the frequency corresponding to the zero point in the first-order derivative curve as the theoretical relaxation oscillation frequency of the VCSEL chip.

[0115] In an exemplary embodiment, the acquisition module 502 is further used to acquire the measured relaxation oscillation frequency of the VCSEL chip; determine the matching result between the theoretical relaxation oscillation frequency and the measured relaxation oscillation frequency; and if the matching result meets the preset matching condition, then the S parameter test of the VCSEL chip is not performed.

[0116] In an exemplary embodiment, the response module 504 is also used to obtain an initial response curve graph based on a data point set representing the RIN intensity at each frequency in the RIN test data; and to perform denoising on at least one data point included in the data point set in the initial response curve graph to obtain a frequency response curve graph.

[0117] In an exemplary embodiment, the response module 504 is further used to perform denoising processing on at least one data point included in the data point set in the initial response curve graph based on a Gaussian filter to obtain a first intermediate response curve graph; perform first-order differentiation on the intermediate response curve graph to obtain a second intermediate response curve graph; and truncate at least one extreme value data point in the data point set in the second intermediate response curve graph to obtain a frequency response curve graph.

[0118] In an exemplary embodiment, the estimation module 508 is further used to determine a first target frequency range according to the bandwidth of the VCSEL chip; within the first target frequency range, determine a zero point in the first-order derivative curve graph; and determine the frequency corresponding to the zero point in the first-order derivative curve graph as the theoretical relaxation oscillation frequency of the VCSEL chip.

[0119] In an exemplary embodiment, the first target frequency range is within ±10 GHz of the bandwidth of the VCSEL chip.

[0120] In an exemplary embodiment, the estimation module 508 is also used to determine whether the number of zero points determined within the first target frequency range is unique; in response to the number of zero points within the first target frequency range being unique, the frequency corresponding to the zero point in the first-order derivative curve graph is used as the theoretical relaxation oscillation frequency of the VCSEL chip.

[0121] In an exemplary embodiment, the estimation module 508 is also used to determine whether each determined zero point satisfies a preset zero point condition in response to the number of zero points within the first target frequency range being not unique; and use the frequency corresponding to the zero point that meets the preset zero point condition in the first-order derivative curve graph as the theoretical relaxation oscillation frequency of the VCSEL chip.

[0122] In an exemplary embodiment, the preset zero point condition is that the RIN intensity change rate within a certain frequency range on the left side of the zero point is greater than 0, and the RIN intensity change rate within a certain frequency range on the right side of the zero point is less than 0.

[0123] In an exemplary embodiment, the certain frequency range is within a range of ±5 GHz of the frequency corresponding to the zero point.

[0124] Each module in the above-mentioned VCSEL chip relaxation oscillation frequency estimation device can be implemented in whole or in part by software, hardware and a combination thereof. Each of the above-mentioned modules can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute the operations corresponding to each of the above modules.

[0125] In an exemplary embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be shown in FIG6. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. Among them, the processor, the memory and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store RIN test data. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a method for estimating the relaxation oscillation frequency of a VCSEL chip is implemented.

[0126] In an exemplary embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be shown in FIG7. The computer device includes a processor, a memory, an input / output interface, a communication interface, a display unit, and an input device. The processor, the memory, and the input / output interface are connected via a system bus, and the communication interface, the display unit, and the input device are connected to the system bus via the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner may be implemented through WIFI, a mobile cellular network, near field communication (NFC) or other technologies. When the computer program is executed by the processor, a relaxation oscillation frequency method is implemented. The display unit of the computer device is used to form a visually visible picture, which may be a display screen, a projection device, or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covering the display screen, or a button, trackball or touchpad set on the computer device shell, or an external keyboard, touchpad or mouse.

[0127] Those skilled in the art will understand that the structure shown in FIG. 7 is merely a block diagram of a partial structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different arrangement of components.

[0128] In an exemplary embodiment, a computer device is further provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above-mentioned method embodiments when executing the computer program.

[0129] In an exemplary embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0130] In an exemplary embodiment, a computer program product is provided, including a computer program, and when the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0131] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0132] A person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment method can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, an artificial intelligence (AI) processor, etc., but are not limited to this.

[0133] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0134] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A method for estimating relaxation oscillation frequency of a VCSEL chip, characterized in that: The method comprises: Obtain RIN test data of VCSEL chips; Based on a data point set representing the RIN intensity at each frequency in the RIN test data, a frequency response curve graph is obtained; the horizontal axis of the frequency response curve graph represents the frequency and the vertical axis represents the RIN intensity; Performing differentiation processing on the frequency response curve graph to obtain a first-order derivative curve graph; The frequency corresponding to the zero point in the first-order derivative curve is used as the theoretical relaxation oscillation frequency of the VCSEL chip.

2. The method according to claim 1, characterized in that The method further comprises: Obtaining a measured relaxation oscillation frequency of the VCSEL chip; Determining a matching result between the theoretical relaxation oscillation frequency and the measured relaxation oscillation frequency; When the matching result meets the preset matching condition, the S parameter test is not performed on the VCSEL chip.

3. The method according to claim 1, characterized in that The obtaining of a frequency response curve graph based on a data point set representing the RIN intensity at each frequency in the RIN test data comprises: Based on a data point set representing the RIN intensity at each frequency in the RIN test data, an initial response curve graph is obtained; A denoising process is performed on at least one data point included in the data point set in the initial response curve graph to obtain the frequency response curve graph.

4. The method according to claim 3, characterized in that: The step of performing denoising on at least one data point included in the data point set in the initial response curve graph to obtain the frequency response curve graph comprises: Performing denoising processing on at least one data point included in the data point set in the initial response curve graph based on a Gaussian filter to obtain a first intermediate response curve graph; Performing a first-order differentiation on the first intermediate response curve graph to obtain a second intermediate response curve graph; At least one extreme value data point in the data point set in the second intermediate response curve graph is truncated to obtain the frequency response curve graph.

5. The method according to claim 1, characterized in that The method of using the frequency corresponding to the zero point in the first-order derivative curve as the theoretical relaxation oscillation frequency of the VCSEL chip includes: Determining a first target frequency range according to the bandwidth of the VCSEL chip; Determining a zero point in the first-order derivative curve graph within the first target frequency range; The frequency corresponding to the zero point in the first-order derivative curve graph is determined as the theoretical relaxation oscillation frequency of the VCSEL chip.

6. The method according to claim 5, characterized in that The first target frequency range is within ±10 GHz of the bandwidth of the VCSEL chip.

7. The method according to claim 5, characterized in that The method further comprises: Determining whether the number of zero points determined within the first target frequency range is unique; In response to the fact that the number of zero points within the first target frequency range is unique, the frequency corresponding to the zero point in the first-order derivative curve graph is used as the theoretical relaxation oscillation frequency of the VCSEL chip.

8. The method according to claim 7, characterized in that The method further comprises: In response to the number of zero points within the first target frequency range not being unique, determining whether each determined zero point satisfies a preset zero point condition; The frequency corresponding to the zero point that meets the preset zero point condition in the first-order derivative curve graph is used as the theoretical relaxation oscillation frequency of the VCSEL chip.

9. The method according to claim 8, characterized in that The preset zero point condition is that the RIN intensity change rate within a certain frequency range on the left side of the zero point is greater than 0, and the RIN intensity change rate within a certain frequency range on the right side of the zero point is less than 0.

10. The method according to claim 9, characterized in that The certain frequency range is within a range of ±5 GHz of the frequency corresponding to the zero point.

11. A VCSEL chip relaxation oscillation frequency estimation device, characterized in that: The device comprises: An acquisition module is used to obtain the RIN test data of the VCSEL chip; A response module, configured to obtain a frequency response curve graph based on a data point set representing the RIN intensity at each frequency in the RIN test data; the horizontal axis of the frequency response curve graph represents the frequency magnitude and the vertical axis represents the RIN intensity magnitude; A differentiation module, used for performing differentiation processing on the frequency response curve graph to obtain a first-order derivative curve graph; The estimation module is used to use the frequency corresponding to the zero point in the first-order derivative curve as the theoretical relaxation oscillation frequency of the VCSEL chip.

12. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 10 are implemented.

13. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 10 are implemented.

14. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 10 are implemented.

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