Flexible printed circuit (FPC) nickel sheet and golden finger electric lead-in test module and test machine thereof

Abstract

The invention discloses a flexible FPC nickel sheet and golden finger electric lead-in test module and a test machine thereof. The test module comprises a test driving mechanism and a test mechanism. The testing mechanism is horizontally arranged below the testing driving mechanism; the testing mechanism comprises a testing box, a floating support plate, a nickel sheet testing head, a pre-pressing limiting assembly and a golden finger testing head, and the testing box is horizontally arranged; the floating support plates are arranged at the bottom of the test box at intervals; the number of the nickel sheet testing heads is at least two, and the at least two nickel sheet testing heads are arranged on the floating support plate at intervals; the pre-pressing limiting assembly is arranged on the test box and the floating support plate; the golden finger test head is arranged at one end of the bottom of the test box corresponding to a golden finger of the FPC; the golden finger testing head comprises a supporting assembly, a probe assembly and a sleeve pressing assembly. The device has the functions of conduction pre-pressing, guiding and limit limiting, ensures the position and flatness precision of the FPC belt body and the golden finger before conduction, and reduces the bending deformation of the probe and the damage to the surface of the nickel sheet or the conductive contact sheet in the contact process.

Description

Technical Field

[0001] The invention relates to the field of flexible printed circuit board (FPC) manufacturing equipment, in particular to a flexible FPC nickel sheet and gold finger electrical introduction test module and a test machine thereof. Background Art

[0002] Flexible circuit boards, also known as "FPC soft boards", are printed circuit boards made of flexible insulating substrates. FPC can provide excellent electrical performance, meet the needs of smaller and higher density installation designs, and also help reduce assembly processes and enhance reliability. Flexible circuit boards FPC soft boards can be bent, wound, and folded freely, and can withstand millions of dynamic bends without damaging the wires. They can be arranged arbitrarily according to spatial layout requirements, and can be moved and stretched arbitrarily in three-dimensional space, thereby achieving the integration of component assembly and wire connection; and can greatly reduce the size and weight of electronic products, which is suitable for the development of electronic products towards high density, miniaturization, and high reliability.

[0003] The manufacturing process of flexible FPC involves a testing process. After it is electrically connected to the test circuit, the test circuit is used to simulate and test various electrical performance indicators of the flexible FPC. In the specific test process, it is generally necessary to use multiple probes to independently contact the multiple metal nickel sheets on the side of the flexible FPC belt body, and at the same time, it is necessary to use multiple probes to synchronously contact the multiple conductive contact sheets of the gold fingers at one end of the flexible FPC in order to connect the flexible FPC to the test circuit; based on this test process requirement, during the automated testing of the flexible FPC, it is necessary to simultaneously connect the multiple metal nickel sheets of the flexible FPC and the multiple conductive contact sheets of the gold fingers to the test circuit. Generally, a needle-shaped probe is used as the electrical contact medium. The technical difficulty in the contact process is that the contact position height is difficult to control, and the circuit cannot be turned on if the contact is not complete. If the contact is too much, the circuit will not turn on. If the probe is too far away, it will bend and deform. In addition, since multiple probes are required to contact the multiple contacts of the gold finger synchronously, high requirements are placed on the position accuracy and flatness of the probes and the gold finger. A slight position deviation will result in inaccurate contact, and deviation in flatness will also lead to height differences among the multiple probes. When the height of the conductive contact remains unchanged, the low-positioned probe will be excessively bent, and the high-positioned probe will not be able to contact the conductive contact. In view of this, it is necessary to design an electrical import test module that can simultaneously complete the synchronous access of multiple nickel sheets of the flexible FPC and the gold finger to the test circuit under the premise of solving the above-mentioned technical problems. Summary of the invention

[0004] The technical problem to be solved by the present invention is to provide a flexible FPC nickel sheet and gold finger electrical conduction test module and its test machine for realizing electrical conduction of multiple nickel sheets and gold fingers simultaneously, and having conduction pre-stressing, guiding and limit limiting functions, ensuring the position and flatness accuracy of the FPC belt body and gold fingers before conduction, and realizing flexible contact of the probe, effectively reducing the bending deformation of the probe during the contact process and the damage to the surface of the nickel sheet or the conductive contact sheet.

[0005] The technical solution adopted by the present invention is as follows: a flexible FPC nickel sheet and gold finger electrical introduction test module is arranged in a flexible FPC test machine, and is used to connect the nickel sheet and gold finger of the flexible FPC to the test circuit, including a bracket of a rectangular frame structure suspended above the test platform of the test machine, and also including a test drive mechanism and a test mechanism, wherein the test drive mechanism includes at least two groups, at least two groups of test drive mechanisms are arranged on the bracket at intervals, and output power in the vertical direction; the test mechanism is horizontally arranged below the test drive mechanism and connected to the output end of the test drive mechanism, and is driven by the test drive mechanism to move downward to approach and contact the flexible FPC, so as to introduce the flexible FPC into the test circuit; the test mechanism includes a test box, a floating support plate, a nickel sheet test head, a pre-load limit assembly and a gold finger test head, wherein the test box is horizontally arranged; the floating support plate includes at least two pieces, the floating support plates are arranged at intervals at the bottom of the test box, and are floatingly connected to the test box; the nickel sheet test head includes At least two, at least two nickel sheet test heads corresponding to the nickel sheets of the flexible FPC are arranged at intervals on the floating support plate; the pre-stressing limit assembly is arranged on the test box and the floating support plate, and is used to guide the nickel sheet test head to limit the descent during the test, and pre-stress the flexible FPC during the descent process; the gold finger of the gold finger test head corresponding to the flexible FPC is arranged at one end of the bottom of the test box; the gold finger test head includes a support assembly, a probe assembly and a sleeve pressure assembly, wherein the support assembly is connected to the test box; the probe assembly is connected to the support assembly, and is used to contact the conductive contact on the gold finger downward to connect it to the test circuit; the sleeve pressure assembly is arranged on the support assembly and is located below the probe assembly; the sleeve pressure assembly is elastically connected to the support assembly in the vertical direction, and at least two probe holes are provided corresponding to the probe assembly. During the descent process, the sleeve pressure assembly pre-presses the gold finger, and moves upward relative to the probe assembly during the continued descent, so that the second probe of the probe assembly passes through the probe hole to contact the conductive contact of the gold finger.

[0006] Preferably, the test drive mechanism includes a support plate, a first drive component, a second drive component and a connecting seat, wherein the support plate is horizontally arranged on the bracket; the first drive component is arranged on the support plate and outputs power in the vertical direction; the second drive component is arranged on the output end of the first drive component, and is driven by the first drive component to move up and down, and the second drive component outputs power in the vertical direction; the connecting seat is horizontally arranged below the second drive component, and is connected to the output end of the second drive component, and is driven by the second drive component to move up and down; at least two locking grooves are provided on the connecting seat; the test mechanism is horizontally arranged on the connecting seat, and is fixedly connected to the connecting seat by a locking nut inserted in the locking groove.

[0007] Preferably, the first driving assembly includes a support block, an H-shaped bracket, a first cylinder, a first driving block and a supporting plate, wherein the support block includes two blocks, and the two support blocks are respectively spaced apart on both sides of the mounting groove opened on the support plate; the H-shaped bracket is arranged between the two support blocks and fixedly connected to the support blocks, and the first cylinder is vertically arranged in the H-shaped bracket; the output end of the first cylinder is arranged downward and extends into the mounting groove through the U-shaped bracket; the first driving block is horizontally connected to the output end of the first cylinder; the supporting plate is horizontally connected to the bottom of the first driving block and extends horizontally in the mounting groove.

[0008] Preferably, the second driving assembly includes a second cylinder and a second driving block, wherein the second cylinder is vertically arranged in the mounting groove and is located on the supporting plate, and is supported by the supporting plate, and the output end of the second cylinder extends vertically downward through the supporting plate; the second driving block is connected to the output end of the second cylinder and is connected to the connecting seat so as to drive the connecting seat to move up and down.

[0009] Preferably, the test drive mechanism also includes guide rods and a deadweight cylinder, wherein the guide rods include at least two, at least two guide rods are slidably inserted on the support plate in the vertical direction, and the bottom of the guide rod is connected and fixed on the connecting seat to guide the limit; the deadweight cylinder is vertically arranged on the support plate, and the output end of the deadweight cylinder passes through the support plate and is connected to the connecting seat, so as to provide an upward pulling force to offset the deadweight of the connecting seat and the test mechanism.

[0010] Preferably, the test box is connected to the test drive assembly through a test support arranged on the top of the test box; the floating support plate is spaced below the test box and elastically connected to the test box through an elastic connector so that the first probe of the nickel sheet test head is in elastic contact with the nickel sheet of the flexible FPC; the nickel sheet test head includes a test seat and a first probe, and the test seat is connected to the bottom of the floating support plate through an elastic connector; the first probe is inserted into the test seat, the upper end of which is connected to the test circuit, and the lower end of which extends vertically downward for contacting and conducting the nickel sheet.

[0011] Preferably, the pre-stress limit assembly includes a pre-stress seat, a first limit limit column and a first guide rod, wherein the pre-stress seat is arranged at the bottom of the test box and protrudes downward, and the bottom surface height of the pre-stress seat is lower than the height of the lower end of the first probe, so as to pre-contact and press the flexible FPC during the descent process; the first limit limit column includes at least two, at least two first limit limit columns are vertically arranged on the floating support plate, and their height is lower than the height of the first probe, so as to support the test platform below during the descent process and limit the descent height of the first probe; the first guide rod includes at least two, at least two first guide rods are vertically arranged on the floating support plate, so as to be inserted into the guide hole on the test platform below during the descent process for guiding and limiting.

[0012] Preferably, the support assembly comprises a mounting plate, which is a rectangular plate-shaped structure, and a mounting through hole is provided in the middle thereof and passes through the structure from top to bottom; the mounting plate is fixedly arranged at the bottom of the test box.

[0013] Preferably, the probe assembly includes a support plate, a probe seat, a second probe, a first probe guide seat, a second limit stop column, a second guide rod, a second probe guide seat and an adapter plate, wherein the support plate is horizontally arranged below the mounting plate and connected to the mounting plate; the probe seat is arranged at the bottom of the support plate and protrudes downward; the second probe includes at least two, at least two second probes are vertically inserted on the probe seat, and the upper and lower ends of the second probe extend to the top of the support plate and the bottom of the probe seat respectively; the first probe guide seat and the second probe guide seat are arranged on the support plate from bottom to top through the mounting through hole, and the corresponding The second probes are respectively provided with probe guide holes so that the second probes can pass upward; the adapter plate is horizontally arranged on the second probe guide seat, and the upper end of the second probe is connected to the adapter plate, and is connected to the test circuit through the adapter plate; the second limit limit columns include at least two, at least two second limit limit columns are vertically arranged at the bottom of the support plate, and the bottom surface height of the second limit limit columns is higher than the bottom surface height of the second probe, so as to limit the second probe during the descent process; the second guide rods include at least two, at least two second guide rods are vertically arranged at the bottom of the support plate, and are used to be inserted into the jack of the test platform below during the descent process for guiding and limiting.

[0014] Preferably, the sleeve pressing assembly includes a probe sleeve, a first spring, and a connecting piece, wherein the probe sleeve is arranged at intervals below the support plate and is movably connected to the support plate through at least two connecting pieces; a downwardly protruding cavity is provided at the bottom of the probe sleeve, a movable groove is provided inside the cavity, and the top of the movable groove is open so as to cover the probe seat from below; at least two probe holes are provided in the movable groove corresponding to at least two second probes so as to allow the second probes to pass through; the first spring includes at least two, and at least two first springs are connected to the support plate and the probe sleeve to provide buffering force.

[0015] Preferably, a light hole is provided on the probe cover; the cross-section of the connecting piece is a T-shaped structure, the connecting piece passes through the light hole from bottom to top, and slides freely in the light hole, and supports the probe cover through the cap body at the lower end; the top end of the connecting piece is inserted into the support plate and is threadedly fixed to the support plate; the probe hole includes a first hole body and a second hole body which are interconnected from top to bottom; the inner diameter of the first hole body is larger than the inner diameter of the second hole body, and the connection between the two forms a step blocking surface for blocking and limiting the second probe.

[0016] A testing machine for a flexible FPC nickel sheet and a gold finger electrical introduction testing module.

[0017] The beneficial effects of the present invention are: In view of the defects and shortcomings of the prior art, the present invention independently develops and designs a flexible FPC nickel sheet and gold finger electrical test module and a test machine thereof, which can simultaneously realize the electrical test conduction of multiple nickel sheets and gold fingers, and has conduction pre-pressure, guiding and extreme limiting functions, to ensure the position and flatness accuracy of the FPC belt body and the gold fingers before conduction, and to realize flexible contact of the probe, effectively reducing the bending deformation of the probe during the contact process and the damage to the surface of the nickel sheet or the conductive contact sheet.

[0018] The present invention belongs to a mechanism and automated equipment for testing the electrical parameters of a flexible FPC, and realizes connecting multiple nickel sheets and gold fingers of a flexible FPC to a test circuit at the same time to complete automatic testing of various electrical parameters after it is manufactured. Specifically, the present invention is arranged as a whole above a test platform of a test machine, and a horizontally arranged frame-shaped bracket is used as a support structure. The bracket is provided with multiple groups of test drive mechanisms for providing a driving force in a vertical direction to drive the test mechanism below it to rise and fall, so that the gold finger test head of the test mechanism and multiple groups of nickel sheet test heads contact downwardly multiple nickel sheets and gold fingers of a flexible FPC placed on the test platform to achieve electrical conduction.

[0019] The special feature is that the test drive mechanism of the present invention adopts a connection structure in which the first drive component and the second drive component are connected in series. By arranging the second drive component on the output end of the first drive component, the test descent stroke can be effectively improved, which can be adapted to test scenarios with higher test stroke heights, and the test descent height can be adjusted in real time during the actual test process according to different stroke heights; in addition, the use of two sets of drive component structures can effectively avoid the downtime problem caused by cylinder failure during the actual test process; in addition, based on the inverted structure of the test mechanism and the influence of its own weight, in order to control the test descent stroke with high precision, the self-weight cylinder arranged in the test drive mechanism of the present invention continuously provides an upward pulling force according to the self-weight of the test mechanism to offset its own weight.

[0020] The special feature is that, for the synchronous conduction test of multiple nickel sheets, the present invention uses a floating support plate that is floatingly connected to the bottom of the test box as a bearing plate, and arranges multiple groups of nickel sheet test heads at intervals at the bottom of the floating support plate, and uses the flexible connection of the floating support plate to realize adaptive adjustment of the multiple groups of nickel sheet test heads during the test. That is, in the process of multiple groups of nickel sheet test heads contacting the nickel sheet respectively, if there is inconsistent flatness, the first probe that first contacts the nickel sheet will transmit the reaction force of the nickel sheet to the floating support plate, so that the floating support plate can adaptively adjust its angle or height until the first probes of all nickel sheet test heads contact the nickel sheet to ensure the integrity of the test; in addition, this kind of floating flexible contact has a certain buffering force, which effectively reduces the bending deformation of the first probe due to excessive force; in addition, the test seat of the nickel sheet test head of the present invention is connected to the bottom of the floating support plate through an elastic connector, so that the first probe inserted in the test seat has a flexible buffering force during the contact with the nickel sheet, avoiding the bending deformation of the needle body caused by rigid contact. In addition, in the process of synchronously descending and contacting multiple nickel sheets, the multiple nickel sheet test heads of the present invention are guided and limited by the first guide rod to ensure the synchronization of the descent and the consistency of flatness; at the same time, the pre-pressing seat with a height difference setting is used to pre-press the FPC belt body during the descent process, so as to achieve pre-pressing before the first probe contacts the nickel sheet, effectively ensure the position stability of the FPC belt body, avoid position deviation and the like in the subsequent process of receiving the downward contact force of multiple first probes, and improve the position accuracy; in addition, because the first probe is a bendable needle-shaped structure, in the process of descending and contacting the nickel sheet, if the first probes at different positions are different due to excessive descent or due to the difference in flatness during the descent, the first probes may be bent and deformed due to the upward reaction force, and therefore, the height of the first probe is preset by the first limit limit column and the rigid contact between the first limit limit column and the test platform during descent, so as to limit the descent height of the first probe, effectively control the limit height of its descent, and avoid the bending and deformation of the first probe.

[0021] The special feature is that, in response to the test requirement that the gold finger needs to synchronously contact multiple conductive contact pieces, the gold finger test head of the present invention adopts a sleeve pressure assembly to be arranged below the probe assembly. The probe assembly is in rigid contact with the test box, and when subjected to a downward driving force, the sleeve pressure assembly is driven to descend to complete the synchronous contact and conduction of multiple conductive contact pieces. Specifically, the connecting piece and the first spring are used as the elastic connection structure of the support plate and the probe cover. The connecting piece is inserted into the probe cover from above, and its upper end is fixed to the support plate by a threaded connection, and is movably connected to the probe cover. The cap body inverted at its lower end supports the probe cover. This connection method allows the probe cover to have a certain spacing of free movement space in the vertical direction, and the first spring is used to connect the support plate and the probe cover as an elastic buffer structure. In the initial state, the second probe is located in the probe cover to play a protective role. When the gold finger test head is lowered as a whole, the bottom surface of the probe cover first contacts the gold finger. In the process of the second probe moving downward to contact the conductive contact piece of the gold finger, the gold finger is pre-pressed and fixed to ensure the stability of the gold finger position. The gold finger is precisely controlled and the surface flatness is improved, so that the subsequent multiple second probes can accurately contact the conductive contact piece and maintain a high degree of consistency during the contact process; in the process of the gold finger test head continuing to descend after pre-compression, the probe cover is subjected to an upward reaction force and moves upward close to the support plate, so that the probe seat drives the second probe to move downward relative to the probe cover until the second probe passes through the probe hole and contacts the conductive contact piece, and the gold finger is connected to the test circuit; at the same time, during the upward movement of the probe cover, the first spring is compressed, which can provide a buffer, so that the process of the second probe passing through the probe hole (that is, the process of contacting the conductive contact piece) is a flexible contact, and the elastic force of the first spring acts downward on the probe cover in the opposite direction, so that it continues to press the gold finger during the test process to maintain its position stability and flatness consistency; further, in the process of the second probe contacting the conductive contact piece, compared with the traditional suspended contact method, its outer edge uses the probe hole to guide and protect it, so that it only needs to expose its end to the probe hole to contact the conductive contact piece, which can effectively protect the second probe and greatly reduce the bending deformation caused by excessive force. Furthermore, based on the premise that the lower end of the second probe includes an inner metal layer and an outer coating layer, the probe hole of the probe cover is designed to be a first hole body and a second hole body structure from top to bottom, and the metal layer can extend through the second hole body to the bottom of the probe cover to contact the conductive contact piece during the descent of the second probe by utilizing the step blocking surface between the connection points, and the outer coating layer of the second probe is blocked by the step blocking surface. Through this structure, the descent height of the second probe can be accurately controlled to avoid excessive descent to cause bending and breakage or damage to the conductive contact piece. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 It is one of the three-dimensional structural schematic diagrams of the present invention.

[0023] Figure 2This is the second schematic diagram of the three-dimensional structure of the present invention.

[0024] Figure 3 This is the third schematic diagram of the three-dimensional structure of the present invention.

[0025] Figure 4 This is one of the three-dimensional structural schematic diagrams of the test drive mechanism of the present invention.

[0026] Figure 5 This is the second schematic diagram of the three-dimensional structure of the test drive mechanism of the present invention.

[0027] Figure 6 This is the third schematic diagram of the three-dimensional structure of the test drive mechanism of the present invention.

[0028] Figure 7 This is one of the three-dimensional structural schematic diagrams of the test drive mechanism of the present invention after the components are hidden.

[0029] Figure 8 This is the second schematic diagram of the three-dimensional structure of the test drive mechanism of the present invention behind the hidden components.

[0030] Fig. 9 It is a schematic diagram of the three-dimensional structure of the first driving component of the present invention.

[0031] Fig.10 This is one of the three-dimensional structural schematic diagrams of the testing mechanism of the present invention.

[0032] Fig.11 This is the second schematic diagram of the three-dimensional structure of the testing mechanism of the present invention.

[0033] Fig.12 This is the third schematic diagram of the three-dimensional structure of the testing mechanism of the present invention.

[0034] Fig.13 This is one of the three-dimensional structural schematic diagrams of the adjustment component and the nickel sheet test head of the present invention.

[0035] Fig.14 This is the second schematic diagram of the three-dimensional structure of the adjustment component and the nickel sheet test head of the present invention.

[0036] Fig.15 It is a schematic diagram of the three-dimensional structure of the gold finger test head of the present invention.

[0037] Fig.16 This is one of the schematic diagrams of the component disassembly structure of the gold finger test head of the present invention.

[0038] Fig.17 This is the second schematic diagram of the component disassembly structure of the gold finger test head of the present invention.

[0039] Fig.18 This is the third schematic diagram of the component disassembly structure of the gold finger test head of the present invention.

[0040] Fig.19 This is one of the schematic diagrams of the connection structure between the second probe and the probe cover of the present invention.

[0041] Fig. 20 This is the second schematic diagram of the connection structure between the second probe and the probe cover of the present invention.

[0042] Fig.21 It is a schematic diagram of the local structure of the flexible FPC of the present invention.

[0043] In the figure: 0. Flexible FPC; 01. FPC strip; 02. Gold finger; 03. Conductive contact; 1. Bracket; 2. Test drive mechanism; 3. Test mechanism; 4. Locking nut; 21. Support plate; 22. Support block; 23. H-shaped bracket; 24. First cylinder; 25. First drive block; 26. Loading plate; 27. Second cylinder; 28. Second drive block; 29. ​​Connecting seat; 210. Guide rod; 211. Deadweight cylinder; A. Mounting slot; B. Locking slot; 31. Test support; 32. Test box; 33. Floating support plate; 34. Nickel sheet test head; 35. Preload seat; 36. First limit limit column; 37. First guide rod; 38. Gold finger test head; 39. First adjustment assembly; 310. Second adjustment assembly; 381, mounting plate; 382, ​​adapter plate; 383, support plate; 384, probe seat; 385, second probe; 386, probe cover; 387, first spring; 388, connector; 389, second limit stop column; 3810, second guide rod; 3811, first probe guide seat; 3812, second probe guide seat; 3813, second spring; C, movable groove; D, probe hole; E, mounting through hole; F, light hole; G, probe guide hole; D1, first hole body; D2, second hole body; 391. first regulating cylinder; 392. first mounting seat; 3101. Second regulating cylinder; 3102. Second mounting seat. DETAILED DESCRIPTION

[0044] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0045] It should be noted that all directional indications such as up, down, left, right, front, back, etc. in the embodiments of the present invention are only used to explain the relative position relationship, movement status, etc. between the components in a certain specific posture. If the specific posture changes, the directional indication will also change accordingly.

[0046] In the present invention, unless otherwise clearly specified and limited, the terms "connection", "fixation", etc. should be understood in a broad sense. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances. Example 1

[0047] like Figures 1 to 12 , Figures 15 to 19As shown, the present invention proposes a flexible FPC nickel sheet and gold finger electrical introduction test module, which is arranged in a flexible FPC test machine and is used to connect the nickel sheet and gold finger of the flexible FPC to the test circuit, including a bracket 1 of a rectangular frame structure suspended above the test platform of the test machine, and also including a test drive mechanism 2 and a test mechanism 3, wherein the test drive mechanism 2 includes at least two groups, at least two groups of test drive mechanisms 2 are arranged on the bracket 1 at intervals, and output power in the vertical direction; the test mechanism 3 is horizontally arranged below the test drive mechanism 2 and connected to the output end of the test drive mechanism 2, and is driven by the test drive mechanism 2 to move downward to approach and contact the flexible FPC0, so as to introduce the flexible FPC0 into the test circuit; the test mechanism 3 includes a test box 32, a floating support plate 33, a nickel sheet test head 34, a pre-load limit assembly and a gold finger test head 38, wherein the test box 32 is horizontally arranged; the floating support plate 33 includes at least two pieces, the floating support plate 33 is arranged at intervals at the bottom of the test box 32, and is floatingly connected to the test box 32; the nickel sheet test head includes at least two, At least two nickel sheet test heads 34 are arranged on the floating support plate 33 at intervals corresponding to the nickel sheets of the flexible FPC0; the pre-stressing limit assembly is arranged on the test box 32 and the floating support plate 33, and is used to guide the nickel sheet test head 34 to limit the descent during the test, and pre-stress the flexible FPC0 during the descent process; the gold finger test head 38 is arranged at the bottom end of the test box 32 corresponding to the gold finger 02 of the flexible FPC0; the gold finger test head 38 includes a support assembly, a probe assembly and a sleeve pressure assembly, wherein the support assembly is connected to the test box 32; the probe assembly is connected to the support assembly, and is used to contact the conductive contact 03 on the gold finger 02 downward to connect it to the test circuit; the sleeve pressure assembly is arranged on the support assembly and is located below the probe assembly; the sleeve pressure assembly is elastically connected to the support assembly in the vertical direction, and at least two probe holes D are provided corresponding to the probe assembly. During the descent process, the sleeve pressure assembly pre-presses the gold finger, and moves upward relative to the probe assembly during the continued descent process, so that the second probe 385 of the probe assembly passes through the probe hole D to contact the conductive contact 03 of the gold finger 02.

[0048] like Fig.21As shown, as an embodiment of the present invention, the flexible FPC0 of the present invention includes an FPC belt body 01 and a gold finger 02, wherein the FPC belt body 01 is a flexible belt-shaped structure, and a plurality of nickel sheets are connected at intervals on one side of the FPC belt body 01; the gold finger 02 is connected to one end of the FPC belt body 01, and a plurality of rows of conductive contact sheets 03 are arranged on the surface of the gold finger 02, and each row of conductive contact sheets 03 includes a plurality of sheets. In the actual detection process, the flexible FPC0 is placed as a whole on the test platform of the test machine, and after being clamped and fixed by the test platform, it is gradually moved from top to bottom by the present invention, so that the plurality of nickel sheet test heads 34 synchronously contact the plurality of nickel sheets and introduce them into the test circuit; at the same time, the plurality of second probes 385 of the gold finger test head 38 synchronously contact the plurality of conductive contact sheets 03 and connect them to the test circuit, so as to complete various electrical index tests in the test circuit. Example 2

[0049] like Figures 4 to 9 As shown, as an embodiment of the present invention, the test drive mechanism 2 of the present invention includes a support plate 21, a first drive component, a second drive component and a connecting seat 29, wherein the support plate 21 is horizontally arranged on the bracket 1; the first drive component is arranged on the support plate 21, and outputs power in the vertical direction; the second drive component is arranged on the output end of the first drive component, and is driven by the first drive component to move up and down, and the second drive component outputs power in the vertical direction; the connecting seat 29 is horizontally arranged below the second drive component, and is connected to the output end of the second drive component, and is driven by the second drive component to move up and down; at least two locking grooves B are provided on the connecting seat 29; the test mechanism 3 is horizontally arranged on the connecting seat 29, and is fixedly connected to the connecting seat 29 by a locking nut 4 inserted in the locking groove B.

[0050] The first driving assembly includes a support block 22, an H-shaped bracket 23, a first cylinder 24, a first driving block 25 and a supporting plate 26, wherein the support block 22 includes two blocks, and the two support blocks 22 are respectively spaced apart on both sides of the mounting groove A opened on the support plate 21; the H-shaped bracket 23 is arranged between the two support blocks 22 and fixedly connected to the support blocks 22, and the first cylinder 24 is vertically arranged in the H-shaped bracket 23; the output end of the first cylinder 24 is arranged downward and extends into the mounting groove A through the U-shaped bracket 23; the first driving block 25 is horizontally connected to the output end of the first cylinder 24; the supporting plate 26 is horizontally connected to the bottom of the first driving block 25 and extends horizontally in the mounting groove A.

[0051] The second driving assembly includes a second cylinder 27 and a second driving block 28, wherein the second cylinder 27 is vertically arranged in the mounting groove A and is located on the supporting plate 26. The output end of the second cylinder 27 is supported by the supporting plate 26 and extends vertically downward through the supporting plate 26; the second driving block 28 is connected to the output end of the second cylinder 27 and is connected to the connecting seat 29 so as to drive the connecting seat 29 to move up and down.

[0052] The test drive mechanism 2 also includes a guide rod 210 and a self-weight cylinder 211, wherein the guide rod 210 includes at least two, at least two guide rods 210 are slidably inserted on the support plate 21 in the vertical direction, and the bottom of the guide rod 210 is connected and fixed on the connecting seat 29 to guide the limit; the self-weight cylinder 211 is vertically arranged on the support plate 21, and the output end of the self-weight cylinder 211 passes through the support plate 21 and is connected to the connecting seat 29, which is used to provide an upward pulling force to offset the self-weight of the connecting seat 29 and the test mechanism 3.

[0053] In the present embodiment, the test drive mechanism 2 adopts a series design structure of two sets of drive components. By setting the second drive component on the output end of the first drive component, the test descent stroke can be effectively improved, which can be adapted to test scenarios with higher test stroke heights, and the test descent height can be adjusted in real time during the actual test process according to different stroke heights; in addition, the use of two sets of drive component structures can effectively avoid the downtime problem caused by cylinder failure during the actual test process; in addition, based on the inverted structure of the test mechanism 3 and the influence of its own weight, in order to control the test descent stroke with high precision, the self-weight cylinder 211 provided in the test drive mechanism 2 of the present invention continuously provides an upward pulling force according to the self-weight of the test mechanism 3 to offset its own weight. Example 3

[0054] like Figures 10 to 12 As shown, as an embodiment of the present invention, the test box 31 of the present invention is connected to the test drive assembly 2 through a test support 31 arranged on the top thereof; the floating support plate 33 is spaced below the test box 32 and elastically connected to the test box 32 through an elastic connector, so that the first probe of the nickel sheet test head 34 is in elastic contact with the nickel sheet of the flexible FPC0; the nickel sheet test head 34 includes a test seat and a first probe, and the test seat is connected to the bottom of the floating support plate 33 through an elastic connector; the first probe is inserted into the test seat, the upper end of which is connected to the test circuit, and the lower end of which extends vertically downward for contacting and conducting the nickel sheet.

[0055] The pre-stress limit assembly includes a pre-stress seat 35, a first limit limit column 36 and a first guide rod 37, wherein the pre-stress seat 35 is arranged at the bottom of the test box 2 and protrudes downward, and the bottom surface height of the pre-stress seat 35 is lower than the height of the lower end of the first probe, so as to pre-contact and press the flexible FPC0 during the descent process; the first limit limit column 36 includes at least two, at least two first limit limit columns 36 are vertically arranged on the floating support plate 33, and their height is lower than the height of the first probe, so as to support the test platform below during the descent process and limit the descent height of the first probe; the first guide rod 37 includes at least two, at least two first guide rods 37 are vertically arranged on the floating support plate 33, so as to be inserted into the guide hole on the test platform below during the descent process for guiding and limiting.

[0056] In the process of synchronously descending and contacting multiple nickel sheets, the multiple nickel sheet test heads 34 of the present invention are guided and limited by the first guide rod 37 to ensure the synchronization of the descent and the consistency of flatness; at the same time, the pre-pressing seat 35 with a height difference setting is used to pre-press the FPC belt body 01 during the descent process, so as to achieve pre-pressing before the first probe contacts the nickel sheet, effectively ensure the position stability of the FPC belt body 01, avoid position deviation and the like in the subsequent process of receiving the downward contact force of multiple first probes, and improve the position accuracy; in addition, because the first probe is a bendable needle structure, in the process of descending and contacting the nickel sheet, when the first probes at different positions are over-descended or due to the difference in flatness during the descent process, the first probes may be bent and deformed due to the upward reaction force, so that the preset height of the first limit limit column 36 and the rigid contact between the first limit limit column 36 and the test platform during descent are used to limit the descent height of the first probe, effectively control the limit height of its descent, and avoid the bending and deformation of the first probe. Furthermore, the floating connection between the floating support plate 33 and the test box 32 of the present invention and the floating connection between the nickel sheet test head 34 and the floating support plate 33 can adopt the connection method between the probe seat 386 in the gold finger 38 and the support plate 383, that is, a connection structure in which the first spring 387 and the connecting piece 388 cooperate to achieve a flexible floating connection. Example 4

[0057] like Figures 15 to 18 As shown, as an embodiment of the present invention, the support assembly of the present invention includes a mounting plate 381, which is a rectangular plate-like structure, and a mounting through hole E is opened in the middle thereof and runs through from top to bottom; the mounting plate 381 is fixedly arranged at the bottom of the test box 32.

[0058] The probe assembly includes a support plate 383, a probe seat 384, a second probe 385, a first probe guide seat 3811, a second limit stop column 389, a second guide rod 3810, a second probe guide seat 3812 and an adapter plate 382, ​​wherein the support plate 383 is horizontally arranged below the mounting plate 381 and connected to the mounting plate 381; the probe seat 384 is arranged at the bottom of the support plate 383 and protrudes downward; the second probe 385 includes at least two, at least two second probes 385 are vertically inserted on the probe seat 384, and the upper and lower ends of the second probe 385 extend to the top of the support plate 383 and the bottom of the probe seat 384 respectively; the first probe guide seat 3811 and the second probe guide seat 3812 are arranged on the support plate 383 from bottom to top through the mounting through hole E, and the first probe guide seat 3811 and the second Probe guide holes G are respectively provided on the probe guide seat 3812 corresponding to the second probe 385 so that the second probe 385 can pass upward; the adapter plate 382 is horizontally arranged on the second probe guide seat 3812, and the upper end of the second probe 385 is connected to the adapter plate 382, ​​and is connected to the test circuit through the adapter plate 382; the second limit limit column 389 includes at least two, at least two second limit limit columns 389 are vertically arranged at the bottom of the support plate 383, and the bottom surface height of the second limit limit column 389 is higher than the bottom surface height of the second probe 385, so as to limit the second probe 385 during the descent process; the second guide rod 3810 includes at least two, at least two second guide rods 3810 are vertically arranged at the bottom of the support plate 383, and are used to be inserted into the jack of the lower test platform during the descent process for guiding and limiting.

[0059] This embodiment is similar to the nickel sheet test head 34. The functions of the second limit limit column 389 and the second guide rod 3810 are similar to those of the first limit limit column 36 and the first guide rod 37. The second guide rod 3810 is inserted into the test platform below during the descent of the support plate 383, and is used to guide and limit the support plate 383 to ensure its position accuracy and flatness during the descent. The second limit limit column 389 is designed with a height difference from the second probe 385. During the descent of the second probe 385, it can be in rigid contact with the test platform, and is used to limit the descent height of the second probe 385 to avoid bending and deformation of the second probe due to the reaction force caused by excessive descent.

[0060] The sleeve pressing assembly includes a probe sleeve 386, a first spring 387, and a connecting piece 388, wherein the probe sleeve 386 is spaced below the support plate 383 and is movably connected to the support plate 388 through at least two connecting pieces 388; a downwardly protruding cavity is provided at the bottom of the probe sleeve 386, a movable groove C is provided inside the cavity, and the top of the movable groove C is open so as to cover the probe seat 384 from below; at least two probe holes D are provided in the movable groove C corresponding to at least two second probes 385 so as to allow the second probes 385 to pass through; the first spring 387 includes at least two, and at least two first springs 387 are connected to the support plate 383 and the probe sleeve 386 to provide a buffering force.

[0061] like Fig.19 As shown, as an embodiment of the present invention, a light hole F is provided on the probe cover 386 of the present invention; the cross-section of the connecting piece 388 is a T-shaped structure, the connecting piece 388 passes through the light hole F from bottom to top, and slides freely in the light hole F, and supports the probe cover 386 through the cap body at the lower end; the top end of the connecting piece 388 is inserted into the support plate 383 and is threadedly fixed to the support plate 383; the probe hole D includes a first hole body D1 and a second hole body D2 which are interconnected from top to bottom; the inner diameter of the first hole body D1 is larger than the inner diameter of the second hole body D2, and the connection between the two forms a step blocking surface for blocking and limiting the second probe 385.

[0062] The connector 388 and the first spring 387 are used as the elastic connection structure between the support plate 383 and the probe cover 386. The connector 388 is inserted into the probe cover 386 from above, and its upper end is fixed on the support plate 383 by a threaded connection, and is movably connected with the probe cover 386. The cap body hanging upside down at its lower end supports the probe cover 386. This connection method allows the probe cover 386 to have a certain spacing of free movement space in the vertical direction. At the same time, the first spring 387 is used to connect the support plate 383 and the probe cover 386 as an elastic buffer structure; in the initial state, the second probe 385 is located in the probe cover 386 to play a protective role. When the gold finger test head 38 is lowered as a whole, the bottom surface of the probe cover 386 first contacts the gold finger 02. In the process of the second probe 385 moving downward to contact the conductive contact piece 03 of the gold finger 02, the gold finger 02 is pre-pressed and fixed to ensure that the gold finger 03 The position stability and surface flatness facilitate the subsequent multiple second probes 385 to accurately contact the conductive contact piece 03 and maintain high consistency during the contact process; when the gold finger test head 38 continues to descend after pre-compression, the probe cover 386 is subjected to an upward reaction force and moves upward close to the support plate 383, so that the probe seat 384 drives the second probe 385 to move downward relative to the probe cover 386 until the second probe 385 passes through the probe hole D and contacts the conductive contact piece 03, connecting the gold finger 02 to the test circuit; at the same time, during the upward movement of the probe cover 386, the first spring 387 is compressed and can provide a buffer, so that the process of the second probe 385 passing through the probe hole D (i.e., the process of contacting the conductive contact piece 03) is a flexible contact, and the elastic force of the first spring 387 acts in the reverse downward direction on the probe cover 386, so that it continues to press the gold finger 02 during the test process to maintain its position stability and flatness consistency.

[0063] In addition, based on the premise that the lower end of the second probe 385 includes an inner metal layer and an outer coating layer, the probe hole D of the probe cover 386 is designed to be a top-down structure of a first hole body D1 and a second hole body D2. By utilizing the step blocking surface between the connection between the two, during the descent of the second probe 385, its metal layer can extend through the second hole body D2 to the bottom of the probe cover 386 to contact the conductive contact piece 03, and the outer coating layer of the second probe 385 is blocked by the step blocking surface. Through this structure, the descent height of the second probe 385 can be accurately controlled to prevent it from bending and breaking due to excessive descent or damaging the conductive contact piece 03. Example 5

[0064] like Fig. 20As shown, as an embodiment of the present invention, the present invention replaces the design of Example 4, improves the second spring 387 in Example 4, and sets a third spring 3813 between the bottom of the active groove C of the probe cover 386 and the bottom surface of the probe seat 384 to realize the elastic buffer connection between the probe cover 386 and the probe seat 384. During the test, after the probe seat 386 contacts the surface of the gold finger 02 in advance, the probe seat 386 is subjected to the upward reaction force of the gold finger 02 during the continued descent, and moves upward, so that the third spring 3813 is compressed, and at the same time, the second probe 385 moves downward relatively, passes through the probe hole D to contact the conductive contact piece 03 of the gold finger 02, and realizes electrical conduction; at the same time, the elastic force of the third spring 3813 is used to press the probe cover 386 downward in the reverse direction, so that the probe cover 386 continuously presses down and fixes the gold finger 02, thereby ensuring the position accuracy and flatness stability of the gold finger 02 during the test. Example 6

[0065] like Figure 13 to Figure 14 As shown, as an embodiment of the present invention, the present invention also includes an adjustment component, which is arranged on the test box 32 and is used to carry and adjust the nickel sheet test head 34, so that the position of the nickel sheet test head 34 in the horizontal plane along the longitudinal and transverse directions can be adjusted in real time according to the different nickel sheet positions of different products during the actual test process; specifically, the adjustment component includes a first adjustment component 39 and a second adjustment component 310, the first adjustment component 39 includes a first adjustment cylinder 391 and a first mounting seat 392, the first adjustment cylinder 391 is arranged on the test box 32, and outputs linear power in the transverse direction, the first mounting seat 392 is a U-shaped frame structure, and the first mounting seat 392 It is connected to the output end of the first adjusting cylinder 391, and nickel sheet test heads 34 are respectively provided on both sides of its bottom to drive the nickel sheet test head 34 to move in the lateral direction to adjust its position; the second adjusting component 310 includes a second adjusting cylinder 3101 and a second mounting seat 3102. The second adjusting cylinder 3101 is arranged on the test box 32 and outputs linear power in the longitudinal direction. The second mounting seat 3012 is connected to the output end of the second adjusting cylinder 3101 and is driven by the second adjusting cylinder 3101 to move linearly in the longitudinal direction so as to adjust the position of the second mounting seat 3102 in the longitudinal direction. A nickel sheet test head 34 is provided at the bottom of the second mounting seat 3102. Example 7

[0066] As an embodiment of the present invention, the present invention discloses a testing machine for a flexible FPC nickel sheet and a gold finger electrical introduction testing module.

[0067] Furthermore, the present invention provides a.

[0068] The embodiments of the present invention are only to introduce its specific implementation methods and are not intended to limit its protection scope. The technicians in this industry can make some modifications inspired by this embodiment, so any equivalent changes or modifications made according to the scope of the patent of the present invention are within the scope of the patent claims of the present invention.

Claims

1. A flexible FPC nickel sheet and gold finger electrical introduction test module, arranged in a flexible FPC test machine, for connecting the nickel sheet and gold finger of the flexible FPC to a test circuit, comprising a bracket (1) of a rectangular frame structure suspended above a test platform of the test machine, characterized in that: It also includes a test drive mechanism (2) and a test mechanism (3), wherein: The test drive mechanism (2) comprises at least two groups, and the at least two groups of test drive mechanisms (2) are arranged on the bracket (1) at intervals and output power in a vertical direction; The test mechanism (3) is horizontally arranged below the test drive mechanism (2) and connected to the output end of the test drive mechanism (2). The test mechanism (3) is driven by the test drive mechanism (2) to move downward toward and contact the flexible FPC (0), thereby introducing the flexible FPC (0) into the test circuit. The test mechanism (3) comprises a test box (32), a floating support plate (33), a nickel sheet test head (34), a pre-load limit assembly and a gold finger test head (38), wherein the test box (32) is arranged horizontally; the floating support plates (33) comprise at least two pieces, the floating support plates (33) are arranged at intervals at the bottom of the test box (32), and are floatingly connected to the test box (32); The nickel sheet test heads include at least two, and the at least two nickel sheet test heads (34) are arranged on the floating support plate (33) at intervals corresponding to the nickel sheets of the flexible FPC (0); The pre-pressing and limiting assembly is arranged on the test box (32) and the floating support plate (33), and is used to guide the nickel sheet test head (34) to be limited and lowered during the test, and to pre-press the flexible FPC (0) during the lowering process; The gold finger test head (38) is arranged at one end of the bottom of the test box (32) corresponding to the gold finger (02) of the flexible FPC (0); the gold finger test head (38) comprises a support component, a probe component and a sleeve pressure component, wherein the support component is connected to the test box (32); the probe component is connected to the support component and is used to contact the conductive contact sheet (03) on the gold finger (02) downward to connect it to the test circuit; the sleeve pressure component is arranged on the support component and is located below the probe component; the sleeve pressure component is elastically connected to the support component in the vertical direction, and at least two probe holes (D) are provided corresponding to the probe component. During the descent process, the sleeve pressure component pre-presses the gold finger, and moves upward relative to the probe component during the continued descent process, so that the second probe (385) of the probe component passes through the probe hole (D) to contact the conductive contact sheet (03) of the gold finger (02).

2. A flexible FPC nickel sheet and gold finger electrical introduction test module according to claim 1, characterized in that: The test drive mechanism (2) comprises a support plate (21), a first drive assembly, a second drive assembly and a connecting seat (29), wherein the support plate (21) is horizontally arranged on the bracket (1); the first drive assembly is arranged on the support plate (21) and outputs power in a vertical direction; the second drive assembly is arranged on the output end of the first drive assembly and moves up and down when driven by the first drive assembly, and the second drive assembly outputs power in a vertical direction; the connecting seat (29) is horizontally arranged below the second drive assembly and connected to the output end of the second drive assembly and moves up and down when driven by the second drive assembly; at least two locking grooves (B) are formed on the connecting seat (29); the test mechanism (3) is horizontally arranged on the connecting seat (29) and is fixedly connected to the connecting seat (29) by a locking nut (4) inserted into the locking groove (B).

3. A flexible FPC nickel sheet and gold finger electrical introduction test module according to claim 2, characterized in that: The first driving assembly comprises a support block (22), an H-shaped bracket (23), a first cylinder (24), a first driving block (25) and a bearing plate (26), wherein the support block (22) comprises two blocks, and the two support blocks (22) are respectively arranged at intervals on both sides of a mounting groove (A) opened on the support plate (21); the H-shaped bracket (23) is arranged between the two support blocks (22) and is fixedly connected to the support blocks (22); the first cylinder (24) is vertically arranged in the H-shaped bracket (23); the output end of the first cylinder (24) is arranged downward and passes through the U-shaped bracket (23) to extend into the mounting groove (A); the first driving block (25) is horizontally connected to the output end of the first cylinder (24); the bearing plate (26) is horizontally connected to the bottom of the first driving block (25) and extends horizontally in the mounting groove (A).

4. A flexible FPC nickel sheet and gold finger electrical introduction test module according to claim 3, characterized in that: The second driving assembly comprises a second cylinder (27) and a second driving block (28), wherein the second cylinder (27) is vertically arranged in the mounting groove (A) and is located on the bearing plate (26). The second cylinder (27) is supported by the bearing plate (26), and the output end of the second cylinder (27) passes through the bearing plate (26) and extends vertically downward; the second driving block (28) is connected to the output end of the second cylinder (27) and is connected to the connecting seat (29) so as to drive the connecting seat (29) to move upward and downward.

5. A flexible FPC nickel sheet and gold finger electrical introduction test module according to claim 2, characterized in that: The test drive mechanism (2) further comprises a guide rod (210) and a deadweight cylinder (211), wherein the guide rod (210) comprises at least two guide rods (210), the at least two guide rods (210) are slidably inserted on the support plate (21) in a vertical direction, and the bottom of the guide rod (210) is connected and fixed on the connecting seat (29) to guide and limit; the deadweight cylinder (211) is vertically arranged on the support plate (21), and the output end of the deadweight cylinder (211) passes through the support plate (21) and is connected to the connecting seat (29) to provide an upward pulling force to offset the deadweight of the connecting seat (29) and the test mechanism (3).

6. A flexible FPC nickel sheet and gold finger electrical introduction test module according to claim 1, characterized in that: The test box (31) is connected to the test drive assembly (2) via a test support (31) arranged on the top of the test box (31); the floating support plate (33) is arranged below the test box (32) at intervals and is elastically connected to the test box (32) via an elastic connector, so that a first probe of a nickel sheet test head (34) is in elastic contact with a nickel sheet of a flexible FPC (0); the nickel sheet test head (34) comprises a test seat and a first probe, and the test seat is connected to the bottom of the floating support plate (33) via an elastic connector; the first probe is inserted into the test seat, the upper end of which is connected to the test circuit, and the lower end of which extends vertically downwards, and is used to contact and conduct the nickel sheet.

7. A flexible FPC nickel sheet and gold finger electrical introduction test module according to claim 6, characterized in that: The pre-stressing and limiting assembly comprises a pre-stressing seat (35), a first limit limiting column (36) and a first guide rod (37), wherein the pre-stressing seat (35) is arranged at the bottom of the test box (2) and protrudes downward, and the bottom surface height of the pre-stressing seat (35) is lower than the height of the lower end of the first probe, so as to pre-contact and press the flexible FPC (0) during the descent process; the first limit limiting column (36) comprises at least two, at least two first limit limiting columns (36) are vertically arranged on the floating support plate (33), and their height is lower than the height of the first probe, so as to abut against the test platform below during the descent process and limit the descent height of the first probe; the first guide rod (37) comprises at least two, at least two first guide rods (37) are vertically arranged on the floating support plate (33), so as to be inserted into the guide hole on the test platform below during the descent process to perform guide limiting.

8. A flexible FPC nickel sheet and gold finger electrical introduction test module according to claim 1, characterized in that: The support assembly comprises a mounting plate (381), the mounting plate (381) being a rectangular plate-shaped structure, a mounting through hole (E) being provided in the middle thereof and extending through the top and bottom; the mounting plate (381) is fixedly arranged at the bottom of the test box (32).

9. A flexible FPC nickel sheet and gold finger electrical introduction test module according to claim 8, characterized in that: The probe assembly comprises a support plate (383), a probe seat (384), a second probe (385), a first probe guide seat (3811), a second limit stop column (389), a second guide rod (3810), a second probe guide seat (3812) and an adapter plate (382), wherein the support plate (383) is horizontally arranged below the mounting plate (381) and connected to the mounting plate (381); the probe seat (384) is arranged on the support plate (383); The bottom of the support plate (383) is provided with a protruding bottom; the second probe (385) includes at least two probes, at least two of which are vertically inserted into the probe seat (384), and the upper and lower ends of the second probe (385) extend to the top of the support plate (383) and the bottom of the probe seat (384) respectively; the first probe guide seat (3811) and the second probe guide seat (3812) are arranged on the support plate (383) from bottom to top through the mounting through hole (E), and the first probe guide seat (3811) and the second probe guide seat (3812) are arranged on the support plate (383) from bottom to top through the mounting through hole (E). 811) and the second probe guide seat (3812) are respectively provided with probe guide holes (G) corresponding to the second probe (385) so that the second probe (385) can pass upward; the adapter plate (382) is horizontally arranged on the second probe guide seat (3812), the upper end of the second probe (385) is connected to the adapter plate (382), and is connected to the test circuit through the adapter plate (382); the second limit limit column (389) includes at least two, at least two second limit limit columns (389) are vertically arranged at the bottom of the support plate (383), and the bottom surface height of the second limit limit column (389) is higher than the bottom surface height of the second probe (385), so as to limit the second probe (385) during the descent process; the second guide rod (3810) includes at least two, at least two second guide rods (3810) are vertically arranged at the bottom of the support plate (383), and are used to be inserted into the jack of the lower test platform during the descent process for guiding and limiting.

10. A flexible FPC nickel sheet and gold finger electrical introduction test module according to claim 9, characterized in that: The sleeve pressing assembly comprises a probe sleeve (386), a first spring (387), and a connecting piece (388), wherein the probe sleeve (386) is arranged at intervals below the support plate (383) and is movably connected to the support plate (388) through at least two connecting pieces (388); a downwardly protruding cavity is provided at the bottom of the probe sleeve (386), a movable groove (C) is provided inside the cavity, and the top of the movable groove (C) is open so as to cover the probe seat (384) from below; at least two probe holes (D) are provided in the movable groove (C) corresponding to at least two second probes (385) so as to allow the second probes (385) to pass through; the first spring (387) comprises at least two, and the at least two first springs (387) are connected to the support plate (383) and the probe sleeve (386) to provide a buffering force.

11. A flexible FPC nickel sheet and gold finger electrical introduction test module according to claim 10, characterized in that: The probe sleeve (386) is provided with a light hole (F); the cross-section of the connecting piece (388) is a T-shaped structure, the connecting piece (388) passes through the light hole (F) from bottom to top, and slides freely in the light hole (F), and supports the probe sleeve (386) through the cap body at the lower end; the top end of the connecting piece (388) is inserted into the support plate (383) and is threadedly fixed to the support plate (383); the probe hole (D) includes a first hole body (D1) and a second hole body (D2) which are interconnected from top to bottom; the inner diameter of the first hole body (D1) is larger than the inner diameter of the second hole body (D2), and the connection between the two forms a step blocking surface for blocking and limiting the second probe (385).

12. A testing machine comprising the flexible FPC nickel sheet and gold finger electrical introduction testing module according to any one of claims 1 to 11.

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