Storage system aging test method and device, electronic equipment and storage medium

Abstract

The invention provides a storage system aging test method and device, electronic equipment and a storage medium, and the method comprises the steps: obtaining a target aging test factor library and a target aging test factor mutual exclusion library from a plurality of aging test factor libraries and a plurality of aging test factor mutual exclusion libraries according to the structure information of a to-be-tested storage system; obtaining a target test factor set corresponding to the to-be-tested storage system according to the target number of test factors needing to be executed by the to-be-tested storage system, the target aging test factor library and the target aging test factor mutual exclusion library; and performing an aging test on the to-be-tested storage system according to the target number of to-be-executed test factors in the target test factor set to obtain an aging test result of the to-be-tested storage system. According to the method, performance degradation and potential faults of the storage system in the whole life cycle are effectively predicted and identified, the defects of the storage system are exposed in advance, the service life of the storage system is effectively prolonged, and then the reliability of the storage system is improved.

Description

Technical Field

[0001] The present invention relates to the field of computer technology, and in particular to a storage system aging test method, device, electronic equipment and storage medium. Background Art

[0002] In the current Internet environment and in the fields of finance, trade, etc., most storage systems are required to provide services to the outside world uninterruptedly throughout the day. After a long period of uninterrupted operation, the storage system will continue to age, which will lead to an increase in the failure rate of the storage system and a decrease in operating efficiency. Therefore, how to effectively identify the performance degradation and potential failures of the storage system throughout its life cycle is an important issue that the industry needs to solve urgently.

[0003] In the related technology, usually only the corresponding tests are carried out for the functions and performance of the storage system, while the testing methods for the aging of the storage system are insufficient, resulting in that the problems related to the aging of the software and hardware of the storage system are usually difficult to identify and eliminate. The only way is to rely on manual periodic inspection of the storage system during long-term operation to detect the performance degradation and potential failures of the storage system during its entire life cycle. As a result, it is impossible to timely and accurately detect the performance degradation and potential failures of the storage system during its entire life cycle, and it is difficult to ensure the reliability of the storage system. Summary of the invention

[0004] The present invention provides a storage system aging test method, device, electronic device and storage medium, which are used to solve the defects in the prior art that the storage system is periodically tested by manual labor during long-term operation, and the performance degradation and potential failures of the storage system cannot be discovered in a timely and accurate manner throughout the life cycle, and the reliability of the storage system is difficult to ensure. The method can achieve timely and accurate prediction and identification of the performance degradation and potential failures of the storage system throughout the life cycle, thereby improving the reliability of the storage system.

[0005] The present invention provides a storage system aging test method, comprising: According to the structural information of the storage system to be tested, a target aging test factor library and a target aging test factor mutually exclusive library corresponding to the storage system to be tested are obtained from multiple aging test factor libraries and multiple aging test factor mutually exclusive libraries; the target aging test factor library includes multiple executable test factors, and the target aging test factor mutually exclusive library includes multiple pairs of mutually exclusive first test factor pairs; According to the target number of test factors to be executed by the storage system to be tested, the target aging test factor library and the target aging test factor mutually exclusive library, a target test factor set corresponding to the storage system to be tested is obtained; the target test factor set includes the target number of test factors to be executed; According to the target number of test factors to be executed, an aging test is performed on the storage system to be tested to obtain an aging test result of the storage system to be tested.

[0006] According to a storage system aging test method provided by the present invention, each aging test factor library is constructed based on the following steps: According to the structural information of each storage system, an aging mode library of each storage system is obtained; each aging mode library includes aging information of each software and each hardware in each storage system; Acquire an aging test library of each storage system according to the aging information; According to the aging factor type of each storage system, the aging test cases in the aging test library are split to obtain a plurality of sub-test libraries with different aging factor types; According to the component type and aging test content of each storage system, the aging test cases in each sub-test library are split to obtain multiple executable test factors corresponding to each storage system; According to the plurality of executable test factors corresponding to each of the storage systems, each of the aging test factor libraries is constructed.

[0007] According to a storage system aging test method provided by the present invention, the method further includes: Determine whether the aging test result of the storage system to be tested meets the aging test requirement of the storage system to be tested, and obtain a first determination result; When it is determined that the aging test result does not meet the aging test requirement, the aging test library of the storage system to be tested is updated according to the first determination result.

[0008] According to a storage system aging test method provided by the present invention, each aging test factor mutually exclusive library is constructed based on the following steps: According to the configuration information of each test factor in each pair of test factor pairs in each aging test factor library, conflict check is performed on each pair of test factor pairs; the test factor pairs are factor pairs formed by combining every two test factors; According to the conflict check result, from the plurality of test factor pairs in each of the aging test factor libraries, a test factor pair having conflicting items in the configuration information is obtained as a first test factor pair; According to the plurality of pairs of first test factor pairs, mutually exclusive libraries of aging test factors corresponding to the aging test factor libraries are constructed.

[0009] According to a storage system aging test method provided by the present invention, the target number of test factors required to be executed by the storage system to be tested, the target aging test factor library and the target aging test factor mutually exclusive library are used to obtain a target test factor set corresponding to the storage system to be tested, including: According to the target quantity, obtaining a plurality of different test factor sets in the target aging test factor library; the test factor sets include the target quantity of test factors; Combining every two test factors in each group of the test factor set to obtain multiple pairs of second test factor pairs in each group of the test factor set; De-duplicate each pair of second test factor pairs in each group of the test factor set and each pair of first test factor pairs in the target aging test factor mutually exclusive library; According to the rearrangement result, determining whether there is a second test factor pair in each group of the test factor set that is repeated with any first test factor pair in the target aging test factor mutually exclusive library, and obtaining a second determination result; According to the second judgment result, obtaining at least one candidate test factor set in which the second test factor pair does not exist from the multiple test factor sets; A set of test factor sets is randomly selected from at least one set of the candidate test factor sets to construct the target test factor set.

[0010] According to a storage system aging test method provided by the present invention, performing an aging test on the storage system to be tested according to the target number of test factors to be executed to obtain an aging test result of the storage system to be tested includes: Decoupling the target number of test factors to be executed to obtain a plurality of independent first test cases, and performing aging tests on the storage systems to be tested according to the first test cases to obtain first aging test branch results; The target number of test factors to be executed are coupled to obtain a second test case, and according to the second test case, an aging test is performed on the storage system to be tested as a whole to obtain a second aging test branch result; An aging test result of the storage system to be tested is obtained according to the first aging test branch result and the second aging test branch result.

[0011] According to a storage system aging test method provided by the present invention, the method further includes: Fitting the correlation between the execution information of each of the first test cases and the first aging test branch result according to the spline interpolation function to obtain a first performance fitting function of the storage system to be tested; Fitting the correlation between the execution information of the second test case and the result of the second aging test branch according to the spline interpolation function to obtain a second performance fitting function of the storage system to be tested; Performance change information of the storage system to be tested is obtained according to the first performance fitting function and the second performance fitting function.

[0012] The present invention also provides a storage system aging test device, comprising: An acquisition module, used for acquiring, according to the structural information of the storage system to be tested, a target aging test factor library and a target aging test factor mutually exclusive library corresponding to the storage system to be tested from multiple aging test factor libraries and multiple aging test factor mutually exclusive libraries; the target aging test factor library includes multiple executable test factors, and the target aging test factor mutually exclusive library includes multiple pairs of mutually exclusive first test factor pairs; A random calling module, used for acquiring a target test factor set corresponding to the storage system to be tested according to the target number of test factors to be executed by the storage system to be tested, the target aging test factor library and the target aging test factor mutually exclusive library; the target test factor set includes the target number of test factors to be executed; The execution module is used to perform an aging test on the storage system to be tested according to the target number of test factors to be executed, and obtain an aging test result of the storage system to be tested.

[0013] The present invention also provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, any of the above-mentioned storage system aging test methods is implemented.

[0014] The present invention also provides a non-transitory computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the storage system aging test method described in any one of the above methods is implemented.

[0015] The present invention also provides a computer program product, comprising a computer program, wherein when the computer program is executed by a processor, the computer program implements any of the above-mentioned storage system aging test methods.

[0016] The storage system aging test method, device, electronic device and storage medium provided by the present invention obtain a target aging test factor library and a target aging test factor mutually exclusive library corresponding to the storage system to be tested by association according to the structural information of the storage system to be tested, and optimize the selection of the target number of test factors to be executed by combining the target number of test factors to be executed by the storage system to be tested, the target aging test factor library and the target aging test factor mutually exclusive library, so as to perform aging test on the storage system based on the optimized selected target number of test factors to be executed, so as to effectively predict and identify performance degradation and potential failures of the storage system during its entire life cycle, expose storage system defects in advance, predict and improve the service life of the storage system, and thereby improve the reliability of the storage system. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0018] Figure 1 This is one of the flow charts of the storage system aging test method provided by the present invention.

[0019] Figure 2 This is the second flow chart of the storage system aging test method provided by the present invention.

[0020] Figure 3 This is the third flow chart of the storage system aging test method provided by the present invention.

[0021] Figure 4 It is a structural schematic diagram of the storage system aging test device provided by the present invention.

[0022] Figure 5 A schematic structural diagram of an electronic device provided by the invention. DETAILED DESCRIPTION

[0023] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the drawings of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0024] In the current Internet environment and in the fields of finance, trade, etc., most storage systems are required to provide services to the outside world uninterruptedly throughout the day. Long-term uninterrupted operation leads to continuous aging of storage systems. Aging occurs after the storage system has been running for a long time, and the failure rate increases and the operating efficiency decreases. Therefore, how to effectively identify the performance degradation and potential failures of the storage system throughout its life cycle is an important issue that the industry needs to solve urgently.

[0025] During the development and testing phase, under the existing testing model, conventional software testing does not have a corresponding test type for this phenomenon, and the corresponding tests are mainly carried out on the functions and performance of the storage system.

[0026] For example, in some test modes, the reliability of metadata stored in the storage system is tested by automatically creating, deleting, reading, updating, intercepting, and merging storage file directories, and concurrent operations of multiple modules are supported. However, this technical solution can only test one aspect of the massive functional characteristics of storage, which is a functional test. It does not take into account the system risks brought about by long-term uninterrupted operation of storage, and it is difficult to perform global aging tests on the storage system.

[0027] For example, in some test modes, the host remotely accesses the storage system through the Secure Shell (SSH) or socket to execute various commands, and returns the execution results of the storage commands to the host log. The test result check module is used to check whether the operation results of the storage system meet expectations. This is a semi-automated test method; and this technical solution is a test tool, which is an automated script development of an existing test method, and requires manual input of expected test results, and does not involve the aging test design of the storage system.

[0028] For example, in some test modes, one or more test cases are pre-input to obtain the test factors of the pre-input test cases, and different arrangements and combinations are made on the basic test factors to output preferred test cases that are different from the input test cases, so as to perform system vulnerability testing on the storage system based on the preferred test cases; this scheme mainly tests the functions of the storage system, and the preferred test cases combine the test factors of different test cases, and do not provide a test scheme for specific functions; secondly, this technical scheme does not take into account the mutual exclusivity of the basic test factors of the pre-input storage system. Blindly combining the basic test factors may lead to the paralysis of the storage system or even cause irreversible damage to the storage system; moreover, the compatibility of test cases between different storage systems or system versions is not taken into account. The characteristics and environmental variables of different storage systems or system versions are often very different, and their basic test factors are also different. The generated preferred test cases may not find the test focus, wasting a lot of time.

[0029] In summary, in the related technologies, only the corresponding tests are usually carried out for the functions and performance of the storage system, while the test methods for the aging of the storage system are insufficient, resulting in that the problems related to the aging of the software and hardware of the storage system are usually difficult to identify and eliminate. It can only rely on manual periodic detection of the storage system during long-term operation to discover the performance degradation and potential failures of the storage system during the entire life cycle, resulting in the inability to timely and accurately discover the performance degradation and potential failures of the storage system during the entire life cycle, and thus it is difficult to ensure the reliability of the storage system. According to the law of increasing defect costs, the later the defects related to the storage system are discovered, the greater the cost of maintenance and repair, which increases exponentially. This not only increases the cost of technical support, but also may have a negative impact on user experience and may also lead to customer loss. Therefore, it is an important issue that the industry needs to solve urgently to conduct effective aging tests on the aging phenomenon of the storage system during the entire life cycle to effectively identify the performance degradation and potential failures of the storage system during the entire life cycle.

[0030] In response to the above problems, the present embodiment provides a storage system aging test method, which optimizes the selection of a target number of test factors to be executed through a target aging test factor library and a target aging test factor mutually exclusive library corresponding to the storage system to be tested, and performs aging test on the storage system based on the optimized selected target number of test factors to be executed, so as to effectively predict and identify performance degradation and potential failures of the storage system throughout its life cycle, expose storage system defects in advance, predict and improve the service life of the storage system, and thereby improve the reliability of the storage system.

[0031] Figure 1This is one of the flow diagrams of the storage system aging test method provided by the present invention; the method can be applied to the storage system test scenario under the computer system; the computer system includes three parts: a host, a storage system aging test device and a storage system to be tested. The host uses a switch to connect to the storage system to be tested through communication methods such as the Internet Small Computer System Interface (ISCSI) protocol, the Fibre Channel Small Computer System Interface (FC-SCSI) protocol, and the Fibre Channel Non-Volatile Memory express (FC-NVME) protocol to form a storage area network (SAN) system, and uses SSH access to execute instructions on the back-end storage system; the storage system to be tested provides various data storage functions and provides services to the front-end host in the form of blocks or files; the storage system aging test device performs accelerated aging tests on the storage system to be tested under the entire storage area network system to effectively predict and identify performance degradation and potential failures of the storage system during its entire life cycle, expose storage system defects in advance, predict and improve the service life of the storage system, and thus improve the reliability of the storage system.

[0032] like Figure 1 As shown, the storage system aging test method is implemented by the storage system aging test device executing steps 110, 120 and 130 to perform an accelerated aging test on the storage system to be tested in the entire storage area network system.

[0033] Step 110, based on the structural information of the storage system to be tested, obtain a target aging test factor library and a target aging test factor mutually exclusive library corresponding to the storage system to be tested from multiple aging test factor libraries and multiple aging test factor mutually exclusive libraries; the target aging test factor library includes multiple executable test factors, and the target aging test factor mutually exclusive library includes multiple pairs of mutually exclusive first test factor pairs.

[0034] Among them, the storage system to be tested is a storage system in a computer system that needs to undergo aging testing; the structural information of the storage system to be tested includes but is not limited to software and hardware structural design information, interface design information, firmware version information, etc., which is not specifically limited in this embodiment.

[0035] Multiple aging test factor libraries are pre-constructed based on the structural information of different storage systems, including multiple minimum executable test factors. Multiple aging test factor mutually exclusive libraries are pre-constructed based on the structural information of different storage systems, including multiple first test factor pairs formed by combining two minimum executable mutually exclusive test factors.

[0036] Optionally, when it is necessary to test the storage system to be tested, the aging test factor library associated with the structural information of the storage system to be tested may be obtained from multiple aging test factor libraries based on the association relationship between the structural information of the storage system to be tested and the aging test factor library, as the target aging test factor library corresponding to the storage system to be tested, so as to obtain multiple executable test factors of the storage system to be tested. Furthermore, based on the association relationship between the structural information of the storage system to be tested and the aging test factor mutually exclusive library, the aging test factor mutually exclusive library associated with the structural information of the storage system to be tested may be obtained from multiple aging test factor mutually exclusive libraries, as the target aging test factor mutually exclusive library corresponding to the storage system to be tested, so as to obtain multiple pairs of mutually exclusive first test factor pairs among the multiple executable test factors of the storage system to be tested.

[0037] Step 120, obtaining a target test factor set corresponding to the storage system to be tested according to the target number of test factors required to be executed by the storage system to be tested, the target aging test factor library and the target aging test factor mutually exclusive library; the target test factor set includes the target number of test factors to be executed.

[0038] Optionally, according to a test requirement of the storage system to be tested, a target number of test factors required to be executed by the storage system to be tested is obtained.

[0039] Combine the target number of test factors to be executed, the target aging test factor library and the target aging test factor mutually exclusive library to obtain the target number of test factors to be executed that are executable by the storage system to be tested and have no mutually exclusive relationship between them, so as to obtain the target test factor set.

[0040] Here, the target test factor set can be obtained by multi-layer logical judgment or by pre-trained recognition model recognition. Specifically, it can be adaptively selected and determined according to the computing performance of the storage system aging test device to optimize the use of the resources of the storage system aging test device, improve the test efficiency and ensure the test quality. For example, for multi-layer logical judgment, the target aging test factor library and the target aging test factor mutually exclusive library can be randomly orthogonalized and deduplicated according to the number of targets to obtain a random aging test method pattern library for the storage system; the random aging test method pattern library for the storage system includes a plurality of minimum executable test factor superposition combinations of aging patterns that can be orthogonally superimposed; then, a target test factor set is constructed by randomly fuzzily randomly extracting a test factor superposition combination from the minimum executable test factor superposition combinations of multiple aging patterns that can be orthogonally superimposed, so as to achieve the superposition test effect of random aging tests in the actual user environment. For another example, a large number of sample quantities, sample aging test factor libraries, sample aging test factor mutually exclusive libraries, and corresponding sample test factor sets are collected, and the sample quantity, sample aging test factor library, and sample aging test factor mutually exclusive library are used as inputs, and the corresponding sample test factor sets are used as labels to train the neural network model to obtain an identification model that can obtain the corresponding orthogonally superimposed test factor set based on the quantity, aging test factor library, and aging test factor mutually exclusive library; then, the target quantity, target aging test factor library, and target aging test factor mutually exclusive library are input into the identification model to obtain the target test factor set corresponding to the storage system to be tested.

[0041] Step 130 : performing an aging test on the storage system to be tested according to the target number of test factors to be executed, and obtaining an aging test result of the storage system to be tested.

[0042] Optionally, after obtaining the target number of test factors to be executed that can be orthogonally superimposed, the target number of test factors to be executed can be decoupled, and the independent accelerated aging test steps and key points of each minimum executable test factor to be executed can be analyzed, thereby forming test cases corresponding to each test factor to be executed, so that the storage system to be tested can be aged based on the independent test cases corresponding to each test factor to be executed. This can more accurately control the test conditions, avoid mutual influence between different factors, and improve the pertinence and accuracy of the aging test; and / or, the target number of test factors to be executed can be coupled to combine the independent accelerated aging test steps and key points of each minimum executable test factor to be executed, thereby forming overall test cases corresponding to all test factors to be executed, so that the storage system to be tested can be aged based on the overall test cases corresponding to all test factors to be executed, so as to more comprehensively evaluate the overall performance and stability of the storage system. Accordingly, the final aging test results of the storage system to be tested can be obtained based on the test results formed by a separate aging test and / or the test results formed by an overall aging test, so that by decoupling and / or coupling tests on multiple test factors to be executed, the defects of the storage system throughout its life cycle can be more comprehensively and accurately exposed, the life of the storage system can be predicted and improved, and the reliability of the storage system can be improved.

[0043] The method provided in this embodiment obtains a target aging test factor library and a target aging test factor mutually exclusive library corresponding to the storage system to be tested by association according to the structural information of the storage system to be tested, and optimizes the selection of the target number of test factors to be executed by the storage system to be tested, the target aging test factor library and the target aging test factor mutually exclusive library, so as to perform aging test on the storage system based on the optimized target number of test factors to be executed, so as to effectively predict and identify performance degradation and potential failures of the storage system during its entire life cycle, expose defects of the storage system in advance, predict and improve the service life of the storage system, and thereby improve the reliability of the storage system.

[0044] In some embodiments, each of the aging test factor libraries is constructed based on the following steps: According to the structural information of each storage system, an aging mode library of each storage system is obtained; each aging mode library includes aging information of each software and each hardware in each storage system; Acquire an aging test library of each storage system according to the aging information; According to the aging factor type of each storage system, the aging test cases in the aging test library are split to obtain a plurality of sub-test libraries with different aging factor types; According to the component type and aging test content of each storage system, the aging test cases in each sub-test library are split to obtain multiple executable test factors corresponding to each storage system; According to the plurality of executable test factors corresponding to each of the storage systems, each of the aging test factor libraries is constructed.

[0045] Figure 2 FIG. 2 is a flow chart of the storage system aging test method provided by the present invention; Figure 2 As shown, the steps for constructing each aging test factor library include: First, according to the structural information of each storage system, an aging pattern library of the storage system is obtained and output; wherein the aging pattern library includes aging information of each software and each hardware in the storage system.

[0046] Then, according to the aging information of each software and each hardware in the aging mode library, the aging test library of the storage system is obtained and output, and the aging test library of the storage system is split according to the aging factor type of the storage system to obtain multiple sub-test libraries of different aging factor types.

[0047] For example, the aging factor types of the storage system include hardware aging factor type, memory leakage factor type, resource exhaustion factor type, storage system scale efficiency impact factor type, variable accumulation factor type, and fault injection factor type. Correspondingly, sub-test libraries of multiple different aging factor types include hardware aging sub-test library, memory leakage sub-test library, resource consumption sub-test library, storage system scale efficiency impact sub-test library, variable accumulation sub-test library, and fault injection sub-test library.

[0048] Furthermore, according to the component type and aging test content of the storage system, the sub-test library of each aging factor type is split into the smallest executable factors, so that each sub-test library is further split into multiple executable test factors.

[0049] For example, the hardware aging sub-test library contains multiple executable test factors, including hard disk aging test factors, external card aging test factors, aging test factors of various printed circuit boards (Printed Circuit Board, PCB), aging test factors of power supply units (Power Supply Unit, PSU), etc. This embodiment does not make specific limitations on this.

[0050] The memory leak sub-test library contains multiple executable test factors, including memory release test factors after long-term use of modules such as cache (CASH), read / write cache (Read / Write Cache, RC), logical volume cache (Logical Cache, LC), serial storage architecture (Serial Storage Architecture, SSA), and redundant array of independent disks (Redundant Array Of Independent Disks, RAID). This embodiment does not make specific limitations on this.

[0051] The resource consumption sub-test library contains multiple executable test factors, including overwrite test factors for resources such as drives (DRIVE), RAID, resource pools (POOL), virtual disks (Virtual Disk, VDISK), and exhaustion test factors of physical devices such as central processing units (CPU), memory, and bandwidth under high pressure, etc. This embodiment does not make specific limitations on this.

[0052] The storage system scale efficiency affects the multiple executable test factors contained in the sub-test library, including the full-specification hard disk quantity raid test factor, the full-specification raid quantity test factor, the full-specification VDISK test factor, the full-specification Local Copy Map (LCMAP) test factor, the full-specification Remote Copy Map (RCMAP) test factor, the full-specification multi-target snapshot test factor, the cascade snapshot test factor, etc. This embodiment does not make specific limitations on this.

[0053] The variable accumulation sub-test library includes multiple executable test factors, including resource pool expansion test factors, VDISK expansion test factors, etc., which are not specifically limited in this embodiment.

[0054] The fault injection sub-test library contains multiple executable test factors, including raid member disk failure test factor, node failure test factor, whole machine power failure test factor, switch failure test factor, PSU failure test factor, etc. This embodiment does not specifically limit this.

[0055] Subsequently, multiple minimum executable test factors formed by splitting each sub-test library under the aging test library of the storage system are extracted to construct and output the aging test factor library of the storage system.

[0056] The method provided in this embodiment establishes an aging test library with different aging characteristics according to the structural information of each storage system, so as to guide the accelerated aging test of storage systems with different structures, thereby accelerating the exposure of defects in the entire life cycle of the storage system, predicting and improving the life of the storage system, and thus improving the reliability of the storage system.

[0057] In some embodiments, the method further comprises: Determine whether the aging test result of the storage system to be tested meets the aging test requirement of the storage system to be tested, and obtain a first determination result; When it is determined that the aging test result does not meet the aging test requirement, the aging test library of the storage system to be tested is updated according to the first determination result.

[0058] like Figure 2 As shown, after each test of the storage system to be tested is completed, the aging test results of the storage system to be tested may be collected, and it may be determined whether the storage system to be tested fails to meet the aging test requirements during the test of each test factor to be executed, such as whether an abnormal assertion detection result (or abnormal assert), unexpected alarm, etc. occurs. If so, it indicates that the test effect is not good. At this time, it is necessary to update the aging test library of the storage system to be tested according to the first judgment result to fix the abnormal test problem, and then rebuild a new aging test factor library based on the updated aging test library, so that in the subsequent aging test process, the aging test of the storage system to be tested can be performed based on the new aging test factor library, thereby improving the stability and reliability of the aging test.

[0059] If there is no situation where the aging test requirements are not met, it means that the test performance is good, and the target number of test factors to be executed can be pooled and stored in the random aging test method pattern library of the storage system, so that the next time the test is conducted, the target number of test factors to be executed can be directly extracted from the random aging test method pattern library for testing, thereby improving the test efficiency.

[0060] In some embodiments, each of the aging test factor mutually exclusive libraries is constructed based on the following steps: According to the configuration information of each test factor in each pair of test factor pairs in each aging test factor library, conflict check is performed on each pair of test factor pairs; the test factor pairs are factor pairs formed by combining every two test factors; According to the conflict check result, from the plurality of test factor pairs in each of the aging test factor libraries, a test factor pair having conflicting items in the configuration information is obtained as a first test factor pair; According to the plurality of pairs of first test factor pairs, mutually exclusive libraries of aging test factors corresponding to the aging test factor libraries are constructed.

[0061] Figure 3 FIG. 3 is a flow chart of the storage system aging test method provided by the present invention. Figure 3 As shown, the steps of constructing each aging test factor mutually exclusive library can be implemented by the mutual exclusion module in the storage system aging test device executing the following steps: The configuration information of each test factor of each aging test factor library is obtained in the configuration module; the configuration information here includes information such as nodes, input / output (IO) groups, modules, occupied resources, etc. on which each minimum executable test factor depends, and this embodiment does not make specific limitations on this.

[0062] For each aging test factor library, perform the following steps iteratively: In the aging test factor library, any minimum executable test factor is selected as the basic item of the mutually exclusive library, for example, the hard disk aging test factor is selected, and the other minimum executable test factors are sequentially retrieved and their configuration information is retrieved. When the configuration information of any other minimum executable test factor is retrieved and conflicts with the configuration information of the hard disk aging test factor, it is considered that the other minimum executable test factor and the hard disk aging test factor are mutually exclusive items. The other minimum executable test factor and the hard disk aging test factor that are mutually exclusive are combined to form a test factor pair with conflicting items in the configuration information as the first test factor pair. The first test factor pair is updated to the corresponding aging test factor mutually exclusive library until the hard disk aging test completes the mutually exclusive comparison with all other minimum executable factors, and then returns to the step of selecting any minimum executable test factor as the basic item of the mutually exclusive library, and performs a mutually exclusive check on the second minimum executable test factor until all executable test factors complete the mutually exclusive check between each other, thereby obtaining the aging test factor mutually exclusive library corresponding to the aging test factor library.

[0063] The method provided in this embodiment constructs a mutually exclusive library of aging test factors for storage systems with different aging performances based on different structural information, so that when aging tests are subsequently performed on different storage systems, effective test factor combinations can be quickly determined based on the information in the corresponding mutually exclusive library, thereby avoiding duplication of work and waste of resources and improving the reliability of test results.

[0064] In some embodiments, the step 120 of obtaining a target test factor set corresponding to the storage system to be tested according to the target number of test factors required to be executed by the storage system to be tested, the target aging test factor library, and the target aging test factor mutually exclusive library includes: According to the target quantity, obtaining a plurality of different test factor sets in the target aging test factor library; the test factor sets include the target quantity of test factors; Combining every two test factors in each group of the test factor set to obtain multiple pairs of second test factor pairs in each group of the test factor set; De-duplicate each pair of second test factor pairs in each group of the test factor set and each pair of first test factor pairs in the target aging test factor mutually exclusive library; According to the rearrangement result, determining whether there is a second test factor pair in each group of the test factor set that is repeated with any first test factor pair in the target aging test factor mutually exclusive library, and obtaining a second determination result; According to the second judgment result, obtaining at least one candidate test factor set in which the second test factor pair does not exist from the multiple test factor sets; A set of test factor sets is randomly selected from at least one set of the candidate test factor sets to construct the target test factor set.

[0065] like Figure 3 As shown, the target test factor set can be obtained by the random call module in the storage system aging test device by executing the following steps: According to the target number n of test factors to be executed, in the target aging test factor library, n items of the minimum executable test factors are called through a random function to form a test factor set including n minimum executable test factors.

[0066] Every two test factors in each group of test factor sets are combined to obtain multiple pairs of binomial subsets in each group of test factor sets, namely, second test factor pairs, and all second test factor pairs in each group of test factor sets are deduplicated with each pair of first test factor pairs in the target aging test factor mutually exclusive library.

[0067] If, based on the deduplication results, it is determined that the second test factor pair in any test factor set is repeated with the first test factor in the target aging test factor mutually exclusive library, it indicates that there are mutually exclusive test factor pairs in the test factor set. At this time, the test factor set is placed in the random aging test factor discard library of the storage system to be tested to discard the test factor set. It should be noted that the discard library can verify whether the discarded test factor set is reasonable through manual review. If it is reasonable, the test factor set will be deleted. If it is unreasonable, the test factor set will be deduplicated again.

[0068] If it is determined based on the deduplication result that the second test factor pair in the test factor set does not repeat the first test factor in the target aging test factor mutually exclusive library, then it indicates that there are no mutually exclusive test factor pairs in the test factor set. At this time, it can be input as a candidate test factor set into the random aging test method pattern library of the storage system to be tested, so that when testing the storage system to be tested, a random function can be called to select a group of test factor sets from multiple groups of candidate test factor sets stored in the random aging test method pattern library to construct a target test factor set for aging test of the storage system to be tested.

[0069] The method provided in this embodiment effectively avoids duplication of conflicting items in the mutually exclusive library of target aging test factors by systematically optimizing and screening the combined test factor set, thereby constructing a conflict-free and compliant target test factor set, significantly improving the accuracy and efficiency of the aging test, and ensuring that the storage system to be tested can undergo a comprehensive and effective aging performance test in an environment without mutual interference, providing solid data support for the stability and reliability evaluation of the storage system.

[0070] In some embodiments, performing an aging test on the storage system to be tested according to the target number of test factors to be executed to obtain an aging test result of the storage system to be tested includes: Decoupling the target number of test factors to be executed to obtain a plurality of independent first test cases, and performing aging tests on the storage systems to be tested according to the first test cases to obtain first aging test branch results; The target number of test factors to be executed are coupled to obtain a second test case, and according to the second test case, an aging test is performed on the storage system to be tested as a whole to obtain a second aging test branch result; An aging test result of the storage system to be tested is obtained according to the first aging test branch result and the second aging test branch result.

[0071] like Figure 3 As shown, the aging test result can be achieved by the execution module in the storage system aging test device executing the following steps: Decoupling is performed on the target number of test factors to be executed in the randomly retrieved target test factor set, so that the test steps and key points of each test factor to be executed are processed independently to form independent first test cases. Based on the independent first test cases, aging tests are performed on the storage systems to be tested to obtain the first aging test branch results.

[0072] For example, the target test factor set is composed of three test factor sets, namely, the hard disk aging test factor in the hardware aging sub-test library, the thin pool module memory leakage test factor in the memory leakage sub-test library, and the RAID member disk fault injection test factor in the fault injection sub-test library. First, the three test factor sets are decoupled, and the independent accelerated aging test steps and key points of each minimum executable test factor to be executed are analyzed separately to form independent test cases, so as to perform their corresponding test tasks respectively and obtain the branch results of independent tests.

[0073] For the hard disk aging test task, the hard disk reading and writing is not global reading and writing, and there are high-frequency reading and writing of local physical data blocks. Through the logical block address (Logical Block Address, LBA) directional addressing method, by controlling the load to define the hard disk physical address range as range = (nM-n+1M), directional addressing can be achieved. Select 100 1M physical addresses at different locations on one or several hard disks, use the vdbench read and write tool to perform repeated write tests on 1M data blocks and record the number of erases and writes until vdbench returns an input and output error (IOERROR), reaching the limit of the physical address erase and write times. Through continuous erase and write, the hard disk hardware aging is accelerated and the life cycle process is accelerated.

[0074] For the thin pool module memory leak test task: the thin pool module memory resources mainly include metadata bitmap, block ownership, garbage collection invalid block statistics, block allocation bitmap, and log memory. The test implementation steps include creating a 512T large-capacity thin pool thin volume, using vdbench to read and write continuously. During the reading and writing process, the metadata bitmap and block allocation bitmap memory allocation resources continue to grow. In order to better trigger garbage collection, it is necessary to construct inefficient used blocks. Therefore, the IO model adopts random small block reading and writing, and the data block size is set to 1k. When the thin pool usage capacity reaches the garbage collection start water level, the storage system garbage collection invalid block statistics module occupies memory and continuously records it. Stop IO reading and writing to observe and determine whether its occupied memory continues to decrease. When the 512T volume is full, delete the volume to trigger space recovery, obtain and record the metadata bitmap and block allocation bitmap memory resource occupancy, and when the space is recovered to the pool capacity of zero, its memory occupancy should also be zero, otherwise it will be judged as a memory leak. Repeat this test process several times to accelerate the aging process of the storage system.

[0075] For the RAID member disk fault injection test task: first execute the command to obtain the identification (ID) and redundancy of the RAID member disk. The redundancy of the RAID member disk is the maximum number of member disk failures. Kick out the two ports of the RAID member disk through the command line interface (CLI) or graphical user interface (GUI). Specifically, set the port status to offline to make the RAID member disk offline and trigger RAID reconstruction; then, execute the command to obtain the RAID reconstruction speed and reconstruction completion time. After the reconstruction is completed, set the RAID member disk to online to trigger the RAID data copyback process. At the same time, monitor the copyback speed and completion time. After the copyback is completed, repeat the above operations for other RAID member disks. Monitor the port status of the RAID during the entire test process. If the RAID is offline, it is determined that the fault test has found an unexpected error.

[0076] In addition, the target number of test factors to be executed are coupled to analyze the test intersections of the target number of test factors to be executed, and a second test case integrating the key points of the target number of test factors to be executed is obtained, and based on the second test case, a coupling test is performed on the entire storage system to be tested to obtain branch results of the coupling test.

[0077] For example, the target test factor set is a set of three test factors, namely, the hard disk aging test factor in the hardware aging sub-test library, the thin pool module memory leakage test factor in the memory leakage sub-test library, and the RAID member disk fault injection test factor in the fault injection sub-test library. First, a thin pool is constructed and RAID is configured in it. Subsequently, the hard disks planned for hard disk aging test are marked as unfailable hard disks to ensure that these hard disks can be automatically excluded by the system when faults are injected into RAID member disks, thereby ensuring the effective execution of the aging test task of the hard disk.

[0078] Next, create a thin volume with a capacity of 512TB in the thin pool, and use the thin pool module memory leak test in the independent accelerated aging test step in the minimum executable test factor to be executed, start the read, write and delete operations of the 512TB volume, and record the data volume and required time of the read and write operations in detail. In addition, select the logical block address (Logical Block Address, LBA) of the hard disk used for the aging test, and perform continuous overwrite operations on it, accurately recording the number of overwrites and the required time. At the same time, modify the marks of the RAID member disks that cannot be injected with fault marks in turn, and record the disk positions and times of faults in detail after injecting faults.

[0079] Subsequently, the first aging test branch result formed by the combined decoupling test and the second aging test branch result formed by the coupling test are used to obtain the final aging test results of the storage system to be tested, so as to more comprehensively and accurately accelerate the exposure of defects in the entire life cycle of the storage system, predict and improve the life of the storage system, and thus improve the reliability of the storage system.

[0080] In some embodiments, the correlation between the execution information of each of the first test cases and the first aging test branch result is fitted according to a spline interpolation function to obtain a first performance fitting function of the storage system to be tested; Fitting the correlation between the execution information of the second test case and the result of the second aging test branch according to the spline interpolation function to obtain a second performance fitting function of the storage system to be tested; Performance change information of the storage system to be tested is obtained according to the first performance fitting function and the second performance fitting function.

[0081] like Figure 3 As shown, during the execution of each test case, it is necessary not only to collect the execution information of each test case, but also to periodically collect the aging test branch results formed by the execution of each test case; the period here can be a preset duration as a period, such as 1 hour as a period, which can be adaptively set according to the test requirements. The aging test branch results here include but are not limited to the performance characterization information and alarm information of the storage system to be tested during the test process, which is not specifically limited in this embodiment. The execution information here includes but is not limited to the number of executions and the execution duration, etc., which is not specifically limited in this embodiment.

[0082] After receiving the execution information of each test case and the aging test branch result formed by the execution of each test case, a spline interpolation function can be used to fit the correlation between the execution information of each test case and the corresponding aging test branch result, so as to fit the corresponding functional relationship between the performance of the storage system and the selected minimum executable test factor to be executed, and then obtain the performance change information of the storage system to be tested under different test cases. This not only accurately reflects the complex relationship between test execution and performance degradation, but also can quickly and accurately obtain the performance change information of the storage system under different test conditions, so as to effectively evaluate and optimize the long-term stability and performance of the storage system, so as to repair faults and optimize the performance of the storage system.

[0083] The so-called spline interpolation function can be realized by pre-configuring the number of terms of the function polynomial, such as setting it to a spline interpolation function of a cubic polynomial; it can also be obtained by optimizing and selecting from multiple spline interpolation functions with different numbers of terms using an optimization algorithm, which is not specifically limited in this embodiment.

[0084] The storage system aging test device provided by the present invention is described below. The storage system aging test device described below and the storage system aging test method described above can be referred to each other.

[0085] Figure 4 Schematic diagram of the structure of the storage system aging test device provided by the present invention; Figure 4 As shown, the device includes an acquisition module 410, a random calling module 420, and an execution module 430.

[0086] The acquisition module 410 is used to acquire, according to the structural information of the storage system to be tested, a target aging test factor library and a target aging test factor mutually exclusive library corresponding to the storage system to be tested from multiple aging test factor libraries and multiple aging test factor mutually exclusive libraries; the target aging test factor library includes multiple executable test factors, and the target aging test factor mutually exclusive library includes multiple pairs of mutually exclusive first test factor pairs.

[0087] The random calling module 420 is used to obtain a target test factor set corresponding to the storage system to be tested according to the target number of test factors required to be executed by the storage system to be tested, the target aging test factor library and the target aging test factor mutually exclusive library; the target test factor set includes the target number of test factors to be executed.

[0088] The execution module 430 is used to perform an aging test on the storage system to be tested according to the target number of test factors to be executed, and obtain an aging test result of the storage system to be tested.

[0089] In addition, the device also includes a configuration module for encoding and storing configuration information of each test factor. The device also includes a mutual exclusion module for performing mutual exclusion testing to construct a mutual exclusion library of aging test factors. For details, please refer to the description of the above embodiments, which will not be repeated here.

[0090] The device provided in this embodiment obtains a target aging test factor library and a target aging test factor mutually exclusive library corresponding to the storage system to be tested by association according to the structural information of the storage system to be tested, and optimizes the selection of the target number of test factors to be executed by the storage system to be tested, the target aging test factor library and the target aging test factor mutually exclusive library, so as to perform an aging test on the storage system based on the optimally selected target number of test factors to be executed, so as to effectively predict and identify performance degradation and potential failures of the storage system throughout its life cycle, expose storage system defects in advance, predict and improve the service life of the storage system, and thereby improve the reliability of the storage system.

[0091] The device provided by the present invention is used to execute the above-mentioned method embodiments. Please refer to the above-mentioned embodiments for the specific processes and detailed contents, which will not be repeated here.

[0092] Figure 5 An example of a physical structure diagram of an electronic device is shown in FIG. Figure 5 As shown, the electronic device may include: a processor (processor) 510, a communication interface (Communications Interface) 520, a memory (memory) 530 and a communication bus 540, wherein the processor 510, the communication interface 520, and the memory 530 communicate with each other through the communication bus 540. The processor 510 can call the logic instructions in the memory 530 to execute the storage system aging test method, which includes: according to the structural information of the storage system to be tested, obtain a target aging test factor library and a target aging test factor mutually exclusive library corresponding to the storage system to be tested from multiple aging test factor libraries and multiple aging test factor mutually exclusive libraries; the target aging test factor library includes multiple executable test factors, and the target aging test factor mutually exclusive library includes multiple pairs of mutually exclusive first test factor pairs; according to the target number of test factors required to be executed by the storage system to be tested, the target aging test factor library and the target aging test factor mutually exclusive library, obtain the target test factor set corresponding to the storage system to be tested; the target test factor set includes the target number of test factors to be executed; according to the target number of test factors to be executed, perform aging test on the storage system to be tested to obtain the aging test result of the storage system to be tested.

[0093] In addition, the logic instructions in the above-mentioned memory 530 can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when it is sold or used as an independent product. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0094] On the other hand, the present invention also provides a computer program product, which includes a computer program. The computer program can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer can execute the storage system aging test method provided by the above-mentioned methods, the method including: according to the structural information of the storage system to be tested, from multiple aging test factor libraries and multiple aging test factor mutually exclusive libraries, obtaining a target aging test factor library and a target aging test factor mutually exclusive library corresponding to the storage system to be tested; the target aging test factor library includes multiple executable test factors, and the target aging test factor mutually exclusive library includes multiple pairs of mutually exclusive first test factor pairs; according to the target number of test factors required to be executed by the storage system to be tested, the target aging test factor library and the target aging test factor mutually exclusive library, obtaining a target test factor set corresponding to the storage system to be tested; the target test factor set includes the target number of test factors to be executed; according to the target number of test factors to be executed, performing an aging test on the storage system to be tested to obtain an aging test result of the storage system to be tested.

[0095] On the other hand, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, is implemented to execute the storage system aging test method provided by the above-mentioned methods, the method comprising: according to the structural information of the storage system to be tested, obtaining a target aging test factor library and a target aging test factor mutually exclusive library corresponding to the storage system to be tested from multiple aging test factor libraries and multiple aging test factor mutually exclusive libraries; the target aging test factor library includes multiple executable test factors, and the target aging test factor mutually exclusive library includes multiple pairs of mutually exclusive first test factor pairs; according to the target number of test factors required to be executed by the storage system to be tested, the target aging test factor library and the target aging test factor mutually exclusive library, obtaining a target test factor set corresponding to the storage system to be tested; the target test factor set includes the target number of test factors to be executed; according to the target number of test factors to be executed, performing an aging test on the storage system to be tested to obtain an aging test result of the storage system to be tested.

[0096] The device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Ordinary technicians in this field can understand and implement it without paying creative labor.

[0097] Through the description of the above implementation methods, those skilled in the art can clearly understand that each implementation method can be implemented by means of software plus a necessary general hardware platform, and of course, can also be implemented by hardware. Based on this understanding, the above technical solution is essentially or the part that contributes to the prior art can be embodied in the form of a software product, and the computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a disk, an optical disk, etc., including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0098] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A storage system aging test method, characterized in that: include: According to the structural information of the storage system to be tested, a target aging test factor library and a target aging test factor mutually exclusive library corresponding to the storage system to be tested are obtained from multiple aging test factor libraries and multiple aging test factor mutually exclusive libraries; the target aging test factor library includes multiple executable test factors, and the target aging test factor mutually exclusive library includes multiple pairs of mutually exclusive first test factor pairs; Acquire a target test factor set corresponding to the storage system to be tested according to the target number of test factors required to be executed by the storage system to be tested, the target aging test factor library and the target aging test factor mutually exclusive library; The target test factor set includes the target number of test factors to be executed; According to the target number of test factors to be executed, an aging test is performed on the storage system to be tested to obtain an aging test result of the storage system to be tested.

2. The storage system aging test method according to claim 1, characterized in that: Each of the aging test factor libraries is constructed based on the following steps: According to the structural information of each storage system, an aging mode library of each storage system is obtained; each aging mode library includes aging information of each software and each hardware in each storage system; Acquire an aging test library of each storage system according to the aging information; According to the aging factor type of each storage system, the aging test cases in the aging test library are split to obtain a plurality of sub-test libraries with different aging factor types; According to the component type and aging test content of each storage system, the aging test cases in each sub-test library are split to obtain multiple executable test factors corresponding to each storage system; According to the plurality of executable test factors corresponding to each of the storage systems, each of the aging test factor libraries is constructed.

3. The storage system aging test method according to claim 2, characterized in that: The method further comprises: Determine whether the aging test result of the storage system to be tested meets the aging test requirement of the storage system to be tested, and obtain a first determination result; When it is determined that the aging test result does not meet the aging test requirement, the aging test library of the storage system to be tested is updated according to the first determination result.

4. The storage system aging test method according to any one of claims 1 to 3, characterized in that: Each of the aging test factor mutually exclusive libraries is constructed based on the following steps: According to the configuration information of each test factor in each pair of test factor pairs in each aging test factor library, performing a conflict check on each pair of the test factor pairs; The test factor pairs are factor pairs formed by combining every two test factors; According to the conflict check result, from the plurality of test factor pairs in each of the aging test factor libraries, a test factor pair having conflicting items in the configuration information is obtained as a first test factor pair; According to the plurality of pairs of first test factor pairs, mutually exclusive libraries of aging test factors corresponding to the aging test factor libraries are constructed.

5. The storage system aging test method according to any one of claims 1 to 3, characterized in that: The step of acquiring a target test factor set corresponding to the storage system to be tested according to the target number of test factors required to be executed by the storage system to be tested, the target aging test factor library, and the target aging test factor mutually exclusive library comprises: According to the target quantity, obtaining a plurality of different test factor sets in the target aging test factor library; the test factor sets include the target quantity of test factors; Combining every two test factors in each group of the test factor set to obtain multiple pairs of second test factor pairs in each group of the test factor set; De-duplicate each pair of second test factor pairs in each group of the test factor set and each pair of first test factor pairs in the target aging test factor mutually exclusive library; According to the rearrangement result, determining whether there is a second test factor pair in each group of the test factor set that is repeated with any first test factor pair in the target aging test factor mutually exclusive library, and obtaining a second determination result; According to the second judgment result, obtaining at least one candidate test factor set in which the second test factor pair does not exist from the multiple test factor sets; A set of test factor sets is randomly selected from at least one set of the candidate test factor sets to construct the target test factor set.

6. The storage system aging test method according to any one of claims 1 to 3, characterized in that: The step of performing an aging test on the storage system to be tested according to the target number of test factors to be executed to obtain an aging test result of the storage system to be tested includes: Decoupling the target number of test factors to be executed to obtain a plurality of independent first test cases, and performing aging tests on the storage systems to be tested according to the first test cases to obtain first aging test branch results; The target number of test factors to be executed are coupled to obtain a second test case, and according to the second test case, an aging test is performed on the storage system to be tested as a whole to obtain a second aging test branch result; An aging test result of the storage system to be tested is obtained according to the first aging test branch result and the second aging test branch result.

7. The storage system aging test method according to claim 6, characterized in that: The method further comprises: Fitting the correlation between the execution information of each of the first test cases and the first aging test branch result according to the spline interpolation function to obtain a first performance fitting function of the storage system to be tested; Fitting the correlation between the execution information of the second test case and the result of the second aging test branch according to the spline interpolation function to obtain a second performance fitting function of the storage system to be tested; Performance change information of the storage system to be tested is obtained according to the first performance fitting function and the second performance fitting function.

8. A storage system aging test device, characterized in that: include: An acquisition module, used for acquiring, according to the structural information of the storage system to be tested, a target aging test factor library and a target aging test factor mutually exclusive library corresponding to the storage system to be tested from multiple aging test factor libraries and multiple aging test factor mutually exclusive libraries; the target aging test factor library includes multiple executable test factors, and the target aging test factor mutually exclusive library includes multiple pairs of mutually exclusive first test factor pairs; A random calling module, used for acquiring a target test factor set corresponding to the storage system to be tested according to the target number of test factors required to be executed by the storage system to be tested, the target aging test factor library and the target aging test factor mutually exclusive library; The target test factor set includes the target number of test factors to be executed; The execution module is used to perform an aging test on the storage system to be tested according to the target number of test factors to be executed, and obtain an aging test result of the storage system to be tested.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the program, the storage system aging test method according to any one of claims 1 to 7 is implemented.

10. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the storage system aging test method according to any one of claims 1 to 7 is implemented.

Images