Test control system and test control method

Abstract

The invention provides a test control system and a test control method, and belongs to the technical field of testing. The system comprises a data storage device, a data writing device, a testing device and a connection switching device, each communication end of the data storage device is connected with each first end of the connection switching device; each second end of the connection switching device is connected with each communication end of the data writing device, and each third end of the connection switching device is connected with each test end of the test device; the connection switching device is used for connecting the data storage device with the data writing device or connecting the data storage device with the testing device; the data writing device is used for writing the to-be-tested configuration file into the data storage device; the testing device is used for reading and testing the configuration file to be tested stored in the data storage device. According to the invention, the test process can be simplified, the probability of misoperation and device damage can be reduced, and the effect of improving the test efficiency and safety can be achieved.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and in particular to a testing control system and a testing control method. Background Art

[0002] In order to enable the chip to implement different functions, different configuration files are generally written into the chip to enable the chip to implement different functions. In addition, these configuration files often need to be tested to verify their functionality and feasibility.

[0003] In the related art, the related technicians will first burn the configuration file to be tested into the corresponding flash memory (Flash Memory, referred to as Flash) through a burner, then place the Flash into the card slot of the corresponding test board, connect the test board to the host computer through the corresponding interface, and then operate the host computer to control the test board to power on for testing. After the test is completed, if other configuration files need to be tested, the related technicians need to remove the Flash from the test board, connect the Flash and the burner to re-burn the new configuration file into the Flash.

[0004] It can be seen that when multiple configuration files need to be tested, the solution testing process of the related technology is relatively cumbersome and prone to problems such as misoperation and damage to devices. Summary of the invention

[0005] The purpose of the present application is to provide a test control system and a test control method, which can simplify the test process, reduce the probability of misoperation and damage to the device, and thus achieve the effect of improving test efficiency and safety.

[0006] The embodiment of the present application is implemented as follows:

[0007] In a first aspect of an embodiment of the present application, a test control system is provided, the system comprising: a data storage device, a data writing device, a test device, and a connection switching device;

[0008] Each communication end of the data storage device is respectively connected to each first end of the connection switching device; the data storage device is used to store the configuration file to be tested;

[0009] The second ends of the connection switching device are respectively connected to the communication ends of the data writing device, and the third ends of the connection switching device are respectively connected to the test ends of the test device; the connection switching device is used to connect the data storage device to the data writing device, or to connect the data storage device to the test device;

[0010] The data writing device is used for writing the configuration file to be tested into the data storage device when the data storage device is connected to the data writing device;

[0011] The testing device is used to read and test the configuration file to be tested stored in the data storage device when the testing device is connected to the data writing device.

[0012] Optionally, the system further comprises: a switching control device;

[0013] The switching control device is connected to the connection switching device; the switching control device is used to output a control signal to the connection switching device, and the control signal is used to control the action of the connection switching device to switch the connection object of the data storage device;

[0014] The connection switching device is specifically used to connect the data storage device with the data writing device or connect the data storage device with the testing device under the action of the control signal.

[0015] Optionally, the connection switching device includes: a first connection module and a second connection module;

[0016] The input ends of the first connection module are respectively connected to the output ends of the switching control device, the first connection ends of the first connection module are respectively connected to the communication ends of the data storage device, and the second connection ends of the first connection module are respectively connected to the communication ends of the data writing device; the first connection module is used to connect the data storage device to the data writing device when the switching control device outputs the control signal to the first connection module;

[0017] The input ends of the second connection module are respectively connected to the output ends of the switching control device, the first connection ends of the second connection module are respectively connected to the communication ends of the data storage device, and the second connection ends of the second connection module are respectively connected to the test ends of the test device; the second connection module is used to connect the data storage device with the test device when the switching control device outputs the control signal to the second connection module.

[0018] Optionally, the first connection module includes a plurality of first connection units;

[0019] The first control end of each of the first connecting units is respectively used to input the control signal, and the second control end of each of the first connecting units is respectively grounded;

[0020] The first connection end of each of the first connecting units is connected to each communication end of the data storage device, and the second connection end of each of the first connecting units is connected to each communication end of the data writing device;

[0021] The first connecting unit is used to connect the first connecting end and the second connecting end of the first connecting unit under the action of the control signal.

[0022] Optionally, the second connection module includes a plurality of second connection units;

[0023] The first control end of each of the second connection units is respectively used to input the control signal, and the second control end of each of the second connection units is respectively grounded;

[0024] The first connection end of each second connection unit is connected to each communication end of the data storage device, and the second connection end of each second connection unit is connected to each test end of the test device.

[0025] The second connecting unit is used to connect the first connecting end and the second connecting end of the second connecting unit under the action of the control signal.

[0026] Optionally, the connection switching device further includes an inverter;

[0027] The input end of the inverter is respectively connected to the output end of the switching control device and the input ends of the first connection module, and the output end of the inverter is respectively connected to the input ends of the second connection module; or,

[0028] The input end of the inverter is respectively connected to the output end of the switching control device and the input ends of the second connection module, and the output end of the inverter is respectively connected to the input ends of the first connection module;

[0029] The inverter is used to adjust the level of the control signal.

[0030] Optionally, the system further comprises: a control device;

[0031] The control device is respectively connected to the data writing device, the testing device and the switching control device;

[0032] The control device is used to control the data writing device to write the configuration file to be tested into the data storage device, control the testing device to read and test the configuration file to be tested stored in the data storage device, and control the switching control device to output the control signal.

[0033] A second aspect of the embodiments of the present application provides a test control method, the method comprising:

[0034] Constructing a test control system, wherein the test control system is any of the test control systems provided in the first aspect, and the test control system at least comprises a connection switching device, a data storage device, a data writing device and a test device;

[0035] Controlling the connection switching device to perform a first switching action so that the data storage device is connected to the data writing device;

[0036] Controlling the data writing device to write the configuration file to be tested into the data storage device;

[0037] Controlling the connection switching device to perform a second switching action so that the test device is connected to the data storage device;

[0038] The testing device is controlled to read and test the configuration file to be tested stored in the data storage device.

[0039] Optionally, controlling the connection switching device to perform a first switching action so that the data storage device is connected to the data writing device includes:

[0040] Controlling the switching control device to output a control signal to a first connection module in the connection switching device, so that the data storage device is connected to the data writing device through the first connection module;

[0041] The controlling the connection switching device to perform a second switching action so that the test device is connected to the data storage device includes:

[0042] The switching control device is controlled to output a control signal to a second connection module in the connection switching device, so that the data storage device is connected to the test device through the second connection module.

[0043] A third aspect of an embodiment of the present application provides a computer device, comprising: a memory, a processor, and a computer program stored on the memory, characterized in that the processor executes the computer program to implement any step of the test control method provided in the second aspect above.

[0044] According to a fourth aspect of an embodiment of the present application, a computer-readable storage medium is provided, in which a computer program / instruction is stored. When the computer program / instruction is executed by a processor, the steps of any one of the test control methods provided in the second aspect are implemented.

[0045] The beneficial effects of the embodiments of the present application include:

[0046] The test control system provided by the embodiment of the present application is provided with a data storage device, a connection switching device, a data writing device, and a test device, and each communication end of the data storage device is respectively connected to each first end of the connection switching device. Each second end of the connection switching device is respectively connected to each communication end of the data writing device, and each third end of the connection switching device is respectively connected to each test end of the test device.

[0047] Among them, the data storage device can be connected to the data writing device or the testing device through a connection switching device, and, when the data storage device is connected to the data writing device, the data writing device can write the configuration file to be tested into the data storage device; when the testing device is connected to the data writing device, the testing device can read and test the configuration file to be tested stored in the data storage device.

[0048] In this way, the purpose of writing the configuration file to be tested into the data storage device and testing the configuration file to be tested can be achieved. Moreover, when it is necessary to test multiple different configuration files to be tested, it is only necessary to adjust the connection relationship between the data storage device and the test device and the data writing device through the connection switching device to achieve the function of writing a new configuration file to be tested and testing the new configuration file to be tested.

[0049] It can be seen that the test control system does not require the relevant technicians to repeatedly perform manual operations such as plugging and unplugging the data storage device, which can simplify the test process and reduce the probability of misoperation and damage to the device. In this way, the effect of improving test efficiency and safety can be achieved. BRIEF DESCRIPTION OF THE DRAWINGS

[0050] It should be understood that the following drawings only illustrate certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying any creative work.

[0051] Figure 1 A schematic diagram of the structure of a first test control system provided in an embodiment of the present application;

[0052] Figure 2 A schematic diagram of the structure of a second test control system provided in an embodiment of the present application;

[0053] Figure 3 A schematic diagram of the structure of a third test control system provided in an embodiment of the present application;

[0054] Figure 4 A schematic diagram of the structure of a fourth test control system provided in an embodiment of the present application;

[0055] Figure 5A schematic diagram of the structure of a fifth test control system provided in an embodiment of the present application;

[0056] Figure 6 A schematic diagram of the structure of a sixth test control system provided in an embodiment of the present application;

[0057] Figure 7 A schematic diagram of the structure of a seventh test control system provided in an embodiment of the present application;

[0058] Figure 8 A flow chart of a test control method provided in an embodiment of the present application;

[0059] Fig. 9 A schematic diagram of the structure of a computer device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0060] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0061] The terms "first", "second", etc. in the specification and claims of this application are used to distinguish similar objects, and are not used to describe a specific order or sequence. It should be understood that the data used in this way can be interchangeable under appropriate circumstances, so that the embodiments of the present application can be implemented in an order other than those illustrated or described here, and the objects distinguished by "first", "second", etc. are generally of one type, and the number of objects is not limited. For example, the first object can be one or more. In addition, "and / or" in the specification and claims represents at least one of the connected objects, and the character " / " generally indicates that the objects associated before and after are in an "or" relationship.

[0062] In the related art, the related technicians will first burn the configuration file to be tested into the corresponding Flash through a burner, then place the Flash into the card slot of the corresponding test board, connect the test board to the host computer through the corresponding interface, and then operate the host computer to control the test board to power on for testing. After the test is completed, if other configuration files need to be tested, the related technicians need to remove the Flash from the test board, connect the Flash and the burner to re-burn the new configuration file into the Flash.

[0063] When multiple configuration files need to be tested, technicians need to perform a lot of manual operations to repeatedly plug and unplug the Flash between the burner and the test board. Therefore, it is easy for the Flash to be damaged due to problems such as the technician putting the Flash in the wrong place, the technician carrying static electricity, or operating the test board without completely powering off.

[0064] It can be seen that in this case, the solution testing process of the related technology is relatively cumbersome, and it is easy to have problems such as misoperation and damage to devices.

[0065] To this end, the embodiment of the present application provides a test control system, which is provided by setting a data storage device, a data writing device, a test device, and a connection switching device, and each communication end of the data storage device is respectively connected to each first end of the connection switching device, each second end of the connection switching device is respectively connected to each communication end of the data writing device, and each third end of the connection switching device is respectively connected to each test end of the test device. Among them, the data storage device is used to store the configuration file to be tested, the connection switching device is used to connect the data storage device to the data writing device, or to connect the data storage device to the test device, the data writing device is used to write the configuration file to be tested to the data storage device when the data storage device is connected to the data writing device; the test device is used to read and test the configuration file to be tested stored in the data storage device when the test device is connected to the data writing device. It can simplify the test process, reduce the probability of misoperation and damage to the device, and thus achieve the effect of improving test efficiency and safety.

[0066] The embodiment of the present application is described by taking the application of the test control system to the test of the configuration file as an example, but it does not mean that the test control system of the embodiment of the present application can only be applied to the test configuration file.

[0067] The test control system provided in the embodiment of the present application is explained in detail below.

[0068] Figure 1 This is a schematic diagram of the structure of a test control system provided by this application. Figure 1 An embodiment of the present application provides a test control system, which includes: a data storage device 101, a connection switching device 102, a data writing device 103, and a test device 104.

[0069] Each communication terminal of the data storage device 101 is connected to each first terminal of the connection switching device 102 respectively.

[0070] The second terminals of the connection switching device 102 are respectively connected to the communication terminals of the data writing device 103 , and the third terminals of the connection switching device 102 are respectively connected to the test terminals of the test device 104 .

[0071] The data storage device 101 is used to store the configuration file to be tested.

[0072] The connection switching device 102 is used to connect the data storage device 101 with the data writing device 103 , or to connect the data storage device 101 with the testing device 104 .

[0073] The data writing device 103 is used to write the configuration file to be tested into the data storage device 101 when the data storage device 101 is connected to the data writing device 103 .

[0074] The testing device 104 is used to read and test the configuration file to be tested stored in the data storage device 101 when the testing device 104 is connected to the data writing device 103.

[0075] Optionally, the data storage device 101 may refer to any non-volatile memory that can be erased or written multiple times. For example, the data storage device 101 may be Flash. This embodiment of the present application does not limit this.

[0076] Optionally, the data writing device 103 may refer to a device capable of writing data into the data storage device 101 and erasing data stored in the data storage device 101. For example, the data writing device 103 may be a burner. This embodiment of the present application does not limit this.

[0077] Optionally, the testing device 104 may refer to a device capable of reading the configuration file to be tested stored in the data storage device 101 and performing a corresponding testing process based on the configuration file to be tested.

[0078] For example, the test device 104 may be a test board set by relevant technicians according to actual needs. Generally, the test device 104 may include any possible functional units such as a power supply unit, a communication unit, and an execution unit. In addition, the execution unit may be a field programmable gate array (FPGA) or any other device with functions such as reading, computing, processing, controlling, and executing, which is not limited in the embodiments of the present application.

[0079] Optionally, the configuration file to be tested can be used to indicate a specific test process and / or test operation. Exemplarily, relevant technicians can design corresponding register transfer level (RTL) code according to the content to be tested, and then generate the corresponding configuration file to be tested based on the RTL code.

[0080] In some embodiments, when the data writing device 103 needs to write the configuration file to be tested into the data storage device 101, if other data and / or configuration files are stored in the data storage device 101, the data writing device 103 may first erase the data and / or configuration files stored in the data storage device 101, and then write the configuration file to be tested into the data storage device 101.

[0081] It can be understood that since multiple pins of the data storage device 101 (that is, the communication ends of the data storage device 101) may be used when performing operations such as reading, writing, and erasing on the data storage device 101, the multiple communication ends of the data storage device 101 can be respectively connected to the connection switching device 102, so that the multiple communication ends of the data storage device 101 can be respectively connected to the multiple communication ends of the data writing device 103 or the multiple test ends of the test device 104 through the connection switching device 102.

[0082] It should be noted that at the same time, the connection switching device 102 will only connect the data storage device 101 to the data writing device 103, or connect the data storage device 101 to the test device 104. Generally, the connection switching device 102 will not connect the data storage device 101 to the data writing device 103 and the test device 104 at the same time. In this way, the problem of direct connection between the data writing device 103 and the test device 104, which may lead to damage to the data writing device 103 and / or the test device 104, can be avoided.

[0083] Furthermore, the data writing device 103 and / or the testing device 104 can also be connected to other external devices so that relevant technicians can send instructions to the data writing device 103 and / or the testing device 104 through the external devices, thereby controlling the data writing device 103 and / or the testing device 104 to interact with the data storage device 101.

[0084] When the data storage device 101 is connected to the data writing device 103, the data writing device 103 can automatically perform erase and write operations on the data storage device 101. The data writing device 103 can also perform erase and write operations on the data storage device 101 under the control of the external device. For example, when the data writing device 103 receives an erase operation instruction sent by the external device, the data stored in the data storage device 101 can be erased; when the data writing device 103 receives a write operation instruction sent by the external device, the data can be written into the data storage device 101. The embodiments of the present application do not limit this.

[0085] When the test device 104 is connected to the data writing device 103, the test device 104 can automatically read the configuration file to be tested stored in the data storage device 101 and test the configuration file to be tested. The test device 104 can also read the configuration file to be tested stored in the data storage device 101 under the control of the external device. This embodiment of the application is not limited to this.

[0086] It is worth noting that the specific working principle of the test control system provided in the embodiment of the present application is described as follows:

[0087] When the system is in a sleep state or a power-off state, the data storage device 101, the connection switching device 102, the data writing device 103 and the testing device 104 are all in a sleep state. At this time, the data storage device 101 is not connected to the data writing device 103 and the testing device 104, and there is no need to perform operations such as reading, erasing and writing on the data storage device 101.

[0088] When the system is in working state or powered-on state for the first time, the connection switching device 102 may first connect the data storage device 101 with the data writing device 103, and the data writing device 103 may write the configuration file to be tested into the data storage device 101. Then, after the configuration file to be tested is written, the connection switching device 102 may disconnect the data storage device 101 from the data writing device 103, and connect the data storage device 101 with the test device 104, and the test device 104 may read the configuration file to be tested from the data storage device 101, and the test device 104 may perform corresponding test operations and / or test procedures according to the configuration file to be tested.

[0089] After the test device 104 completes the test of the configuration file to be tested, the connection switching device 102 can disconnect the data storage device 101 from the test device 104, and reconnect the data storage device 101 to the data writing device 103, and the data writing device 103 erases the configuration file to be tested previously written into the data storage device 101, and rewrites a new configuration file to be tested. Then, the data storage device 101 can be connected to the test device 104 again through the connection switching device 102, and the new configuration file to be tested can be tested.

[0090] In this way, the purpose of writing the configuration file to be tested into the data storage device 101 and testing the configuration file to be tested can be achieved. Moreover, when it is necessary to test a plurality of different configuration files to be tested, it is only necessary to adjust the connection relationship between the data storage device 101 and the test device 104 and the data writing device 103 through the connection switching device 102, so that a new configuration file to be tested can be written into the data storage device 101, without the need for the relevant technicians to repeatedly plug and unplug the data storage device 101.

[0091] In the embodiment of the present application, a data storage device 101, a connection switching device 102, a data writing device 103, and a testing device 104 are provided, and each communication end of the data storage device 101 is respectively connected to each first end of the connection switching device 102. Each second end of the connection switching device 102 is respectively connected to each communication end of the data writing device 103, and each third end of the connection switching device 102 is respectively connected to each test end of the testing device 104.

[0092] Among them, the data storage device 101 can be connected to the data writing device 103 or the testing device 104 through the connection switching device 102, and, when the data storage device 101 is connected to the data writing device 103, the data writing device 103 can write the configuration file to be tested into the data storage device 101; when the testing device 104 is connected to the data writing device 103, the testing device 104 can read and test the configuration file to be tested stored in the data storage device 101.

[0093] In this way, the purpose of writing the configuration file to be tested into the data storage device 101 and testing the configuration file to be tested can be achieved. Moreover, when it is necessary to test a plurality of different configuration files to be tested, it is only necessary to adjust the connection relationship between the data storage device 101 and the test device 104 and the data writing device 103 through the connection switching device 102 to achieve the function of writing a new configuration file to be tested and testing the new configuration file to be tested.

[0094] It can be seen that the test control system does not require the relevant technicians to repeatedly perform manual operations such as plugging and unplugging the data storage device 101, which can simplify the test process and reduce the probability of misoperation and damage to the device. In this way, the effect of improving test efficiency and safety can be achieved.

[0095] For a possible implementation, see Figure 2 The system also includes: a switching control device 105.

[0096] The switching control device 105 is connected to the connection switching device 102 .

[0097] Optionally, the switching control device 105 is used to output a control signal to the connection switching device 102 .

[0098] Specifically, the control signal may be a voltage signal, such as a 3.3V voltage signal output by a power management system. The control signal may be used to control the connection switching device 102 to switch the connection object of the data storage device 101. This embodiment of the application does not limit this.

[0099] Optionally, the connection switching device 102 is specifically used to connect the data storage device 101 with the data writing device 103 or connect the data storage device 101 with the testing device 104 under the action of the control signal.

[0100] In one embodiment, when the switching control device 105 outputs the control signal to the connection switching device 102, the connection switching device 102 can connect the data storage device 101 with the data writing device 103, and disconnect the data storage device 101 from the test device 104. When the switching control device 105 does not output the control signal to the connection switching device 102, the connection switching device 102 can disconnect the data storage device 101 from the data writing device 103, and connect the data storage device 101 to the test device 104.

[0101] In another embodiment, when the switching control device 105 outputs the control signal to the connection switching device 102, the connection switching device 102 can disconnect the data storage device 101 from the data writing device 103, and connect the data storage device 101 to the test device 104. When the switching control device 105 does not output the control signal to the connection switching device 102, the connection switching device 102 can connect the data storage device 101 to the data writing device 103, and disconnect the data storage device 101 from the test device 104. The specific storage can be set according to actual needs, and the embodiment of the present application is not limited to this.

[0102] In another embodiment, the switching control device 105 can output different control signals to the connection switching device 102 to respectively control the connection relationship between the connection switching device 102 and the data writing device 103 and the connection relationship between the connection switching device 102 and the testing device 104 .

[0103] In addition, the switching control module 105 may also be connected to the above-mentioned external device so that relevant technicians can send corresponding instructions to the switching control module 105 through the external device, which is not limited in the embodiment of the present application.

[0104] It is worth noting that, in this way, the control signal can be sent to the connection switching device 102 through the switching control module 105 to automatically control the connection switching device 102, thereby achieving the purpose of automatically controlling the connection between the data storage device 101 and the data writing device 103 or the test device 104. In other words, the manual operation of relevant technicians can be further reduced, the test process can be further simplified, and the test safety can be improved.

[0105] For a possible implementation, see Figure 3 The connection switching device 102 includes: a first connection module 1021 and a second connection module 1022.

[0106] The input terminals of the first connection module 1021 are respectively connected to the output terminals of the switching control device 105 , the first connection terminals of the first connection module 1021 are respectively connected to the communication terminals of the data storage device 101 , and the second connection terminals of the first connection module 1021 are respectively connected to the communication terminals of the data writing device 103 .

[0107] The input terminals of the second connection module 1022 are respectively connected to the output terminals of the switching control device 105, the first connection terminals of the second connection module 1022 are respectively connected to the communication terminals of the data storage device 101, and the second connection terminals of the second connection module 1022 are respectively connected to the test terminals of the test device 104.

[0108] Optionally, the first connection module 1021 is configured to connect the data storage device 101 to the data writing device 103 when the switching control device 105 outputs the control signal to the first connection module 1021 .

[0109] Optionally, the second connection module 1022 is used to connect the data storage device 101 to the test device 104 when the switching control device 105 outputs the control signal to the second connection module 1022 .

[0110] It is understandable that at the same time, only one of the first connection module 1021 and the second connection module 1022 can receive a valid control signal to ensure that the first connection module 1021 and the second connection module 1022 are not turned on at the same time.

[0111] Furthermore, in order to simplify the control strategy of the test control system, the first connection module 1021 and the second connection module 1022 may generally be configured to have the same circuit structure.

[0112] It is worth noting that the control signal output by the switching control device 105 to the first connection module 1021 may be the same as the control signal output by the second connection module 1022, and the control signal output by the switching control device 105 to the first connection module 1021 may also be different from the control signal output by the second connection module 1022. In addition, the switching control device 105 may output the control signal to the first connection module 1021 and the second connection module 1022 through the same port, or may output the control signal to the first connection module 1021 and the second connection module 1022 through different ports. This embodiment of the present application is not limited to this.

[0113] In this way, the control signal can be output to the first connection module 1021 or the second connection module 1022 through the switching control module 105 to achieve the purpose of automatically controlling the connection between the data storage device 101 and the data writing device 103 or the testing device 104.

[0114] For a possible implementation, see Figure 4 The first connection module 1021 includes a plurality of first connection units L1.

[0115] The first control end of each first connecting unit L1 is used to input the control signal, and the second control end of each first connecting unit L1 is grounded.

[0116] The first connection ends of the first connectivity units L1 are respectively connected to the communication ends of the data storage device 101 , and the second connection ends of the first connectivity units L1 are respectively connected to the communication ends of the data writing device 103 .

[0117] The first connecting unit L1 is used to connect the first connecting end and the second connecting end of the first connecting unit L1 under the action of the control signal.

[0118] Specifically, see Figure 4 It can be seen that the output end of the switching control device 105 is connected to the first control end of each first connected unit L1 (such as Figure 4 1, 3, 5, and 7) shown in FIG. 1 , the second control end (such as the pin 1, pin 3, pin 5, and pin 7) of each first connection unit L1 is connected. Figure 4The pins 2, 4, 6, and 8 shown in FIG. 1 are grounded, and each communication terminal of the data storage device 101 is respectively connected to the first connection terminal of each first connectivity unit L1 (such as Figure 4 9, pin 11, pin 13, pin 15), each communication end of the data writing device 103 is respectively connected to the second connection end of each first connecting unit L1 (such as Figure 4 10, 12, 14, 16) connections as shown in FIG.

[0119] Exemplarily, a light emitting diode is connected between the first control end and the second control end of the first connectivity unit L1, and a photosensitive device is connected between the first connection end and the second connection end of the first connectivity unit L1.

[0120] by Figure 4 Take the first connection unit L1 at the top of the first connection module 1021 as an example for explanation. When the switching control device 105 outputs the control signal, the light-emitting diode connected between pin 1 and pin 2 emits light, so that the photosensitive device connected between pin 15 and pin 16 is turned on, so that pin 15 and pin 16 are turned on and connected. In this way, the communication end of the data storage device 101 connected to pin 15 can be connected to the communication end of the data writing device 103 connected to pin 16.

[0121] It is understandable that, when the first connection module 1021 includes a plurality of first connection units L1, the first connection module 1021 may be a photorelay, which is not limited in the embodiment of the present application.

[0122] In this way, the control signal can be output to each first connection unit L1 through the switching control device 105, so that each first connection end of each first connection unit L1 is connected with the corresponding second connection end, thereby realizing corresponding connection between each communication end of the data writing device 103 and each communication end of the data storage device 101. In this way, the purpose of controlling the data storage device 101 to be disconnected or connected with the data writing device 103 can be achieved.

[0123] For a possible implementation, see Figure 5 The second connection module 1022 includes a plurality of second connection units L2.

[0124] The first control end of each second connectivity unit L2 is used to input the control signal, and the second control end of each second connectivity unit L2 is grounded.

[0125] The first connection end of each second connectivity unit L2 is connected to each communication end of the data storage device 101, and the second connection end of each second connectivity unit L2 is connected to each test end of the test device 104.

[0126] The second connecting unit L2 is used to connect the first connecting end and the second connecting end of the second connecting unit L2 under the action of the control signal.

[0127] Specifically, see Figure 5 It can be seen that the output end of the switching control device 105 is connected to the first control end of each second connected unit L2 (such as Figure 5 1, 3, 5, and 7) shown in FIG. 1 , and the second control end (such as the pin 1, pin 3, pin 5, and pin 7) of each second connection unit L2 is connected. Figure 5 The pins 2, 4, 6, and 8 shown in FIG. 1 are grounded, and each communication end of the data storage device 101 is respectively connected to the first connection end of each second connectivity unit L2 (such as Figure 5 9, pin 11, pin 13, pin 15), each test end of the test device 104 is respectively connected to the second connection end of each second connection unit L2 (such as Figure 5 10, 12, 14, 16) connections as shown in FIG.

[0128] Exemplarily, a light emitting diode is connected between the first control end and the second control end of the second connectivity unit L2, and a photosensitive device is connected between the first connection end and the second connection end of the second connectivity unit L2.

[0129] by Figure 5 Take the second connection unit L2 at the top of the second connection module 1022 as an example for explanation, when the switching control device 105 outputs the control signal, the light-emitting diode connected between pin 1 and pin 2 emits light, so that the photosensitive device connected between pin 15 and pin 16 is turned on, and pin 15 and pin 16 are turned on and connected. In this way, the communication end of the data storage device 101 connected to pin 15 can be connected to the test end of the test device 104 connected to pin 16.

[0130] It is understandable that, when the second connection module 1022 includes a plurality of second connection units L2, the second connection module 1022 may be a photorelay, which is not limited in the embodiment of the present application.

[0131] In this way, the control signal can be output to each second connection unit L2 through the switching control device 105, so that each first connection end of each second connection unit L2 is connected with the corresponding second connection end, thereby realizing corresponding connection between each test end of the test device 104 and each communication end of the data storage device 101. In this way, the purpose of controlling the data storage device 101 to be disconnected or connected with the test device 104 can be achieved.

[0132] Since the switching control device 105 may also need to output signals to other modules or units, in order to save pin resources or port resources of the switching control device 105, the embodiment of the present application also provides a possible implementation method, see Figure 6 , the connection switching device 102 also includes an inverter I.

[0133] The input end of the inverter 1 is connected to the output end of the switching control device 105 and the input ends of the first connection module 1021 respectively, and the output end of the inverter 1 is connected to the input ends of the second connection module 1022 respectively.

[0134] Optionally, the inverter 1 is used to adjust the level of the control signal. The inverter 1 can be specifically used to adjust a low level to a high level, and adjust a high level to a low level.

[0135] In addition, the corresponding operating voltage may be provided to the inverter 1 in any possible manner, which is not limited in the embodiment of the present application.

[0136] Exemplarily, assuming that when a high level is input to the first connection module 1021, the first connection module 1021 connects the data storage device 101 to the data writing device 103, and when a low level is input to the first connection module 1021, the first connection module 1021 disconnects the data storage device 101 from the data writing device 103. Similarly, when a high level is input to the second connection module 1022, the second connection module 1022 connects the data storage device 101 to the test device 104, and when a low level is input to the second connection module 1022, the second connection module 1022 disconnects the data storage device 101 from the test device 104.

[0137] If the control signal is high level valid, then, in the case where the switching control device 105 outputs the control signal, the control signal is directly output to the first connection module 1021, and the first connection module 1021 connects the data storage device 101 with the data writing device 103. At this time, the inverter 1 converts the control signal into a low level signal and outputs it to the second connection module 1022, and the second connection module 1022 disconnects the data storage device 101 from the test device 104. In this way, the purpose of connecting the data storage device 101 with the data writing device 103 can be achieved.

[0138] If the control signal is high level valid, then, in the case where the switching control device 105 does not output the control signal, the control signal is directly output to the first connection module 1021, and the first connection module 1021 disconnects the data storage device 101 from the data writing device 103. At this time, the inverter 1 converts the control signal into a high level signal and outputs it to the second connection module 1022, and the second connection module 1022 connects the data storage device 101 to the test device 104. In this way, the purpose of connecting the data storage device 101 to the test device 104 can be achieved.

[0139] In another possible manner, the input end of the inverter I is respectively connected to the output end of the switching control device 105 and each input end of the second connection module 1022, and the output end of the inverter I is respectively connected to each input end of the first connection module 1021.

[0140] It is worth noting that in this manner, the function, principle and effect of the inverter I are the same as those in the above embodiment. For details, please refer to the description of the above embodiment, and the embodiments of the present application will not be repeated here.

[0141] It is worth noting that, by setting the inverter I, it is possible to achieve the purpose of occupying only one port of the switching control device 105 to output the control signal to the connection switching device 102 to control the connection between the data storage device 101 and the test device 104, or the connection between the data storage device 101 and the data writing device 103, and it is also possible to ensure that the first connection module 1021 and the second connection module 1022 are not turned on at the same time. In this way, not only can the pin resources or port resources of the switching control device 105 be saved, but also the safety of the test control system can be improved.

[0142] For a possible implementation, see Figure 7 The system also includes: a control device 106.

[0143] The control device 106 is connected to the data writing device 103 , the testing device 104 and the switching control device 105 respectively.

[0144] The control device 106 is used to control the data writing device 103 to write the configuration file to be tested into the data storage device 101, control the testing device 104 to read and test the configuration file to be tested stored in the data storage device 101, and control the switching control device 105 to output the control signal.

[0145] Optionally, the control device 106 may be any possible terminal device, such as a computer, a smart phone, a tablet computer, etc., which is not limited in the embodiments of the present application.

[0146] Specifically, the control device 106 can respond to the trigger operation input by the relevant technician to send corresponding instructions to the data writing device 103, the testing device 104 and / or the switching control device 105 respectively, thereby controlling the data writing device 103, the testing device 104 and / or the switching control device 105 to perform different operations. The embodiments of the present application are not limited to this.

[0147] It is worth noting that the relevant technicians can control the data writing device 103, the test device 104 and the switching control device 105 by operating the control device 106. In this way, the relevant technicians do not need to touch the data writing device 103, the test device 104 and the switching control device 105 during the test process, so as to avoid the problems of the relevant technicians putting the Flash in reverse, the relevant technicians carrying static electricity, and operating the test board before the power is completely turned off. In this way, the automation and safety of the test control system can be greatly improved.

[0148] The following describes the test control method, computer equipment, and computer-readable storage medium provided in the present application. The specific implementation process and technical effects are described above and will not be described in detail below.

[0149] Figure 8 A flow chart of a test control method provided by this application. Figure 8 , an embodiment of the present application provides a test control method, the method comprising:

[0150] Step 201: Construct a test control system.

[0151] Optionally, the test control system is any test control system provided in the above embodiments.

[0152] Optionally, the test control system includes at least a connection switching device, a data storage device, a data writing device and a testing device.

[0153] In addition, the test control system may also include the above-mentioned switching control device, control equipment, etc., which can be specifically configured according to actual needs, and the embodiments of the present application do not limit this.

[0154] Step 202: Control the connection switching device to perform a first switching action so that the data storage device is connected to the data writing device.

[0155] Optionally, the first switching action may refer to an operation of disconnecting the test device from the data storage device and connecting the data storage device to a data writing device.

[0156] In this way, the data storage device can interact with the data writing device, which is convenient for performing subsequent operations. In addition, it can be ensured that the test device and the data writing device will not be connected to the data storage device at the same time, avoiding the problem of the test device being damaged when the data writing device writes data to the data storage device.

[0157] Step 203: Control the data writing device to write the configuration file to be tested into the data storage device.

[0158] Optionally, before writing the configuration file to be tested, the data and / or other configuration files previously stored in the data storage device may be erased, which is not limited in this embodiment of the present application.

[0159] Step 204: Control the connection switching device to perform a second switching action, so that the test device is connected to the data storage device.

[0160] Optionally, the second switching action may refer to an operation of disconnecting the data writing device from the data storage device and connecting the data storage device to the testing device.

[0161] In this way, the data storage device can interact with the test device to facilitate subsequent operations, and it can be ensured that the test device and the data writing device will not be connected to the data storage device at the same time.

[0162] Step 205: Control the test device to read and test the configuration file to be tested stored in the data storage device.

[0163] It is worth noting that when it is necessary to test multiple different configuration files to be tested, it is only necessary to control the connection switching device to perform the first switching action or the second switching action to adjust the connection relationship between the data storage device and the test device and the data writing device, so as to realize the function of the data writing device writing a new configuration file to be tested into the data storage device, and the test device reading and testing the new configuration file to be tested in the data storage device.

[0164] It can be seen that in this way, when conducting a test, the relevant technicians do not need to repeatedly perform manual operations such as plugging and unplugging the data storage device, which can simplify the test process and reduce the probability of misoperation and damage to the device. In this way, the effect of improving test efficiency and safety can be achieved.

[0165] If the connection switching device includes the first connection module and the second connection module provided in the above embodiment, the embodiment of the present application also provides a possible implementation method. Controlling the connection switching device to perform a first switching action so that the data storage device is connected to the data writing device includes:

[0166] The switching control device is controlled to output a control signal to the first connection module in the connection switching device, so that the data storage device is connected to the data writing device through the first connection module.

[0167] In addition, controlling the connection switching device to perform a second switching action so that the test device is connected to the data storage device includes:

[0168] The switching control device is controlled to output a control signal to the second connection module in the connection switching device, so that the data storage device is connected to the test device through the second connection module.

[0169] Specifically, the switching control device may output the control signal to the first connection module and the second connection module through one port, and the switching control device may also output the control signal to the first connection module and the second connection module through different ports.

[0170] Furthermore, the control signal can be either low level effective or high level effective, which can be adjusted according to actual needs, and the embodiment of the present application does not limit this.

[0171] It can be understood that the test control method provided in the embodiment of the present application may also include any other possible steps to implement any function that the above-mentioned test control system can achieve, and the embodiment of the present application does not limit this.

[0172] Fig. 9 is a schematic diagram of the structure of a computer device provided in an embodiment of the present application. Fig. 9 The computer device includes: a memory 301, a processor 302, and a computer program stored in the memory 301, and the processor 302 executes the computer program to implement the steps in any of the above method embodiments.

[0173] An embodiment of the present application further provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments can be implemented.

[0174] Optionally, the present application also provides a program product, such as a computer-readable storage medium, including a program, which is used to execute any of the above-mentioned test control method embodiments when executed by a processor.

[0175] In the several embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0176] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0177] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of hardware plus software functional units.

[0178] The integrated unit implemented in the form of the above-mentioned software functional unit can be stored in a computer-readable storage medium. The above-mentioned software functional unit is stored in a storage medium, including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) or a processor (English: processor) to perform some steps of the methods of each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (English: Read-Only Memory, abbreviated: ROM), random access memory (English: Random Access Memory, abbreviated: RAM), disk or optical disk and other media that can store program codes.

[0179] The embodiments of the present application are described above in conjunction with the accompanying drawings, but the present application is not limited to the above-mentioned specific implementation methods. The above-mentioned specific implementation methods are merely illustrative and not restrictive. Under the guidance of the present application, ordinary technicians in this field can also make many forms without departing from the purpose of the present application and the scope of protection of the claims, all of which are within the protection of the present application.

Claims

1. A test control system, characterized in that: The system comprises: a data storage device, a data writing device, a testing device, and a connection switching device; Each communication end of the data storage device is respectively connected to each first end of the connection switching device; the data storage device is used to store the configuration file to be tested; The second ends of the connection switching device are respectively connected to the communication ends of the data writing device, and the third ends of the connection switching device are respectively connected to the test ends of the test device; the connection switching device is used to connect the data storage device to the data writing device, or to connect the data storage device to the test device; The data writing device is used for writing the configuration file to be tested into the data storage device when the data storage device is connected to the data writing device; The testing device is used to read and test the configuration file to be tested stored in the data storage device when the testing device is connected to the data writing device.

2. The test control system according to claim 1, characterized in that: The system further comprises: a switching control device; The switching control device is connected to the connection switching device; the switching control device is used to output a control signal to the connection switching device, and the control signal is used to control the action of the connection switching device to switch the connection object of the data storage device; The connection switching device is specifically used to connect the data storage device with the data writing device or connect the data storage device with the testing device under the action of the control signal.

3. The test control system according to claim 2, characterized in that: The connection switching device comprises: a first connection module and a second connection module; The input ends of the first connection module are respectively connected to the output ends of the switching control device, the first connection ends of the first connection module are respectively connected to the communication ends of the data storage device, and the second connection ends of the first connection module are respectively connected to the communication ends of the data writing device; the first connection module is used to connect the data storage device to the data writing device when the switching control device outputs the control signal to the first connection module; The input ends of the second connection module are respectively connected to the output ends of the switching control device, the first connection ends of the second connection module are respectively connected to the communication ends of the data storage device, and the second connection ends of the second connection module are respectively connected to the test ends of the test device; the second connection module is used to connect the data storage device with the test device when the switching control device outputs the control signal to the second connection module.

4. The test control system according to claim 3, characterized in that: The first connection module includes a plurality of first connection units; The first control end of each of the first connecting units is respectively used to input the control signal, and the second control end of each of the first connecting units is respectively grounded; The first connection end of each of the first connecting units is connected to each communication end of the data storage device, and the second connection end of each of the first connecting units is connected to each communication end of the data writing device; The first connecting unit is used to connect the first connecting end and the second connecting end of the first connecting unit under the action of the control signal.

5. The test control system according to claim 3, characterized in that: The second connection module includes a plurality of second connection units; The first control end of each of the second connection units is respectively used to input the control signal, and the second control end of each of the second connection units is respectively grounded; The first connection end of each second connection unit is connected to each communication end of the data storage device, and the second connection end of each second connection unit is connected to each test end of the test device. The second connecting unit is used to connect the first connecting end and the second connecting end of the second connecting unit under the action of the control signal.

6. The test control system according to claim 3, characterized in that: The connection switching device also includes an inverter; The input end of the inverter is respectively connected to the output end of the switching control device and the input ends of the first connection module, and the output end of the inverter is respectively connected to the input ends of the second connection module; or, The input end of the inverter is respectively connected to the output end of the switching control device and the input ends of the second connection module, and the output end of the inverter is respectively connected to the input ends of the first connection module; The inverter is used to adjust the level of the control signal.

7. The test control system according to claim 2, characterized in that: The system further comprises: a control device; The control device is respectively connected to the data writing device, the testing device and the switching control device; The control device is used to control the data writing device to write the configuration file to be tested into the data storage device, control the testing device to read and test the configuration file to be tested stored in the data storage device, and control the switching control device to output the control signal.

8. A test control method, characterized in that: The method comprises: Constructing a test control system, wherein the test control system is the test control system according to any one of claims 1 to 7, and the test control system at least comprises a connection switching device, a data storage device, a data writing device and a test device; Controlling the connection switching device to perform a first switching action so that the data storage device is connected to the data writing device; Controlling the data writing device to write the configuration file to be tested into the data storage device; Controlling the connection switching device to perform a second switching action so that the test device is connected to the data storage device; The testing device is controlled to read and test the configuration file to be tested stored in the data storage device.

9. The test control method according to claim 8, characterized in that: The controlling the connection switching device to perform a first switching action so that the data storage device is connected to the data writing device includes: Controlling the switching control device to output a control signal to a first connection module in the connection switching device, so that the data storage device is connected to the data writing device through the first connection module; The controlling the connection switching device to perform a second switching action so that the test device is connected to the data storage device includes: The switching control device is controlled to output a control signal to a second connection module in the connection switching device, so that the data storage device is connected to the test device through the second connection module.

10. A computer device comprising: A memory, a processor, and a computer program stored in the memory, wherein the processor executes the computer program to implement the steps of the method described in any one of claims 8 or 9.

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