Charging test method, device, test equipment, medium and system

Abstract

The invention relates to a charging test method and device, test equipment, a medium and a system, which are applied to a test process of the test equipment on terminal equipment, and the charging test method comprises the following steps: obtaining a current temperature parameter of the terminal equipment; and if the current temperature parameter and the target reference temperature in the reference temperature set meet the preset condition, performing a charging test on the terminal equipment at the target reference temperature. According to the invention, the current temperature parameter of the terminal equipment and the expected target reference temperature in the test process can be ensured to keep good consistency, the automation of the charging test can be realized, and the accuracy and the test efficiency of the charging test can be improved.

Description

Technical Field

[0001] The present disclosure relates to the field of terminal equipment, and in particular to a charging test method, device, test equipment, medium and system. Background Art

[0002] Before the terminal device leaves the factory, it is necessary to conduct a charging scenario test on the terminal device. The charging scenario test covers multiple charging temperature setting standards and needs to be tested under each charging temperature setting standard. After the charging test of the terminal device is completed, it is discharged. After the discharge is completed, it needs to be cooled down before the next test can be carried out.

[0003] At present, during the test process, it is easy for the temperature of the terminal device to be too low or too high after the terminal device cools down. If the charging scenario test is performed on the terminal device under such circumstances, it is easy for the temperature of the terminal device during the test to deviate from the charging temperature setting standard, and thus the test reliability and the accuracy of the test results cannot be guaranteed. Summary of the invention

[0004] In order to overcome the problems existing in the related art, the present disclosure provides a charging test method, device, test equipment, medium and system.

[0005] According to a first aspect of an embodiment of the present disclosure, a charging test method is provided, which is applied to a test process of a test device on a terminal device. The charging test method includes:

[0006] Acquire a current temperature parameter of the terminal device, where the current temperature parameter is used to characterize a current temperature value of the terminal device;

[0007] If the current temperature parameter and the target reference temperature in the reference temperature set meet a preset condition, a charging test is performed on the terminal device at the target reference temperature, wherein the reference temperature set includes multiple reference temperatures, the target reference temperature is a temperature value selected from the multiple reference temperatures to be tested for charging, and the preset condition means that the difference between the target reference temperature and the current temperature parameter is within a preset threshold.

[0008] In some exemplary embodiments of the present disclosure, the charging test method further includes:

[0009] If the current temperature parameter and the target reference temperature do not satisfy a preset condition, the temperature adjustment device is controlled to adjust the temperature of the terminal device so that the current temperature parameter and the target reference temperature satisfy a preset condition.

[0010] In some exemplary embodiments of the present disclosure, the temperature adjustment device includes an airflow driving device, and controlling the temperature adjustment device to adjust the temperature of the terminal device includes:

[0011] Based on the difference between the current temperature parameter and the target reference temperature, obtaining a target control parameter of the airflow driving device;

[0012] Based on the target control parameter, the airflow driving device is controlled to drive the airflow to flow toward the terminal device.

[0013] In some exemplary embodiments of the present disclosure, a collection time is set at a preset time interval, and a current temperature parameter of the terminal device is obtained at the collection time. The target control parameter of the airflow driving device is obtained based on the difference between the current temperature parameter and the target reference temperature, including:

[0014] Obtaining a first temperature parameter obtained at a collection moment before the current moment, and a second temperature parameter obtained at a collection moment before the previous collection moment;

[0015] A target control parameter of the airflow driving device is determined based on the first temperature parameter, the second temperature parameter, the current temperature parameter, and the target reference temperature.

[0016] In some exemplary embodiments of the present disclosure, determining a target control parameter of the airflow driving device based on the first temperature parameter, the second temperature parameter, the current temperature parameter and the target reference temperature includes:

[0017] Determining a parameter change amount based on the first temperature parameter, the second temperature parameter, the current temperature parameter, and the target reference temperature;

[0018] The target control parameter is determined based on the current control parameter of the airflow driving device and the parameter change.

[0019] In some exemplary embodiments of the present disclosure, the performing a charging test on the terminal device at the target reference temperature includes:

[0020] Controlling the charging path between the charger and the terminal device to be connected;

[0021] The test data is collected during the charging test at the target reference temperature.

[0022] In some exemplary embodiments of the present disclosure, the performing a charging test on the terminal device at the target reference temperature further includes:

[0023] Stop the charging test based on the received first instruction information sent by the terminal device.

[0024] In some exemplary embodiments of the present disclosure, the performing a charging test on the terminal device at the target reference temperature further includes:

[0025] After the charging path is turned on, a first prompt message is sent out, wherein the first prompt message is used to prompt that a charging test is being performed.

[0026] In some exemplary embodiments of the present disclosure, the performing a charging test on the terminal device at the target reference temperature further includes:

[0027] Based on the first instruction information, a second prompt information is issued, where the second prompt information is used to prompt that the charging test is completed.

[0028] According to a second aspect of an embodiment of the present disclosure, a charging test device is provided, which is applied to a test process of a test device on a terminal device. The charging test device includes:

[0029] An acquisition module, used for acquiring a current temperature parameter of the terminal device, wherein the current temperature parameter is used for representing a current temperature value of the terminal device;

[0030] A control module, configured to perform a charging test on the terminal device at a target reference temperature in a reference temperature set if a preset condition is satisfied between the current temperature parameter and the target reference temperature in the reference temperature set, wherein the reference temperature set includes multiple reference temperatures, the target reference temperature is a temperature value selected from the multiple reference temperatures to be tested for charging, and the preset condition means that the difference between the target reference temperature and the current temperature parameter is within a preset threshold.

[0031] According to a third aspect of an embodiment of the present disclosure, a testing device is provided, the testing device comprising:

[0032] processor;

[0033] a memory for storing processor-executable instructions;

[0034] The processor is configured to execute executable instructions in the memory to implement the charging test method provided in the first aspect of the present disclosure.

[0035] According to a fourth aspect of an embodiment of the present disclosure, a non-temporary computer-readable storage medium is provided, on which executable instructions are stored. When the executable instructions are executed by a processor, the charging test method provided by the first aspect of the present disclosure is implemented.

[0036] According to a fifth aspect of an embodiment of the present disclosure, a charging test system is provided, the charging test system comprising a test device, the test device comprising a main control chip and a communication device, the test device further comprising a switch arranged in a charging path, the switch being electrically connected to the main control chip;

[0037] The main control chip is connected to the terminal device through the communication device, and the main control chip obtains the current temperature parameter of the terminal device, and the current temperature parameter is used to represent the current temperature value of the terminal device;

[0038] The main control chip is used to determine whether the current temperature parameter and the target reference temperature in the reference temperature set meet a preset condition. If the current temperature parameter and the target reference temperature in the reference temperature set meet the preset condition, the main control chip controls the switch to connect the charging path to perform a charging test on the terminal device at the target reference temperature;

[0039] Among them, the reference temperature set includes multiple reference temperatures, the target reference temperature is a temperature value selected from the multiple reference temperatures for charging test, and the preset condition means that the difference between the target reference temperature and the current temperature parameter is within a preset threshold.

[0040] In some exemplary embodiments of the present disclosure, the charging test system further includes a temperature regulating device, and the temperature regulating device is electrically connected to the main control chip;

[0041] When the main control chip determines that the current temperature parameter and the target reference temperature do not satisfy a preset condition, the main control chip controls the temperature adjustment device to adjust the temperature of the terminal device so that the current temperature parameter and the target reference temperature satisfy the preset condition.

[0042] The above method disclosed in the present invention has the following beneficial effects: the test device disclosed in the present invention obtains the current temperature parameters of the terminal device. If the current temperature parameters and the target reference temperature meet the preset conditions, the charging test of the terminal device at the target reference temperature is started. This can ensure that the current temperature parameters of the terminal device maintain good consistency with the target reference temperature expected during the test, which is conducive to realizing the automation of the charging test and improving the accuracy and efficiency of the charging test.

[0043] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present disclosure. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0045] Figure 1 is a flow chart of a charging test method according to an exemplary embodiment.

[0046] Figure 2 It is a scene diagram of a charging test method according to an exemplary embodiment.

[0047] Figure 3 is a flow chart of a charging test method according to an exemplary embodiment.

[0048] Figure 4 is a flow chart of a charging test method according to an exemplary embodiment.

[0049] Figure 5 is a flow chart of a charging test method according to an exemplary embodiment.

[0050] Figure 6 is a flow chart of a charging test method according to an exemplary embodiment.

[0051] Figure 7 is a flow chart of a charging test method according to an exemplary embodiment.

[0052] Figure 8 is a flow chart of a charging test method according to an exemplary embodiment.

[0053] Fig. 9 is a block diagram of a charging test device according to an exemplary embodiment.

[0054] Fig.10 is a block diagram of a charging test system according to an exemplary embodiment.

[0055] Fig.11 is a block diagram of a testing device according to an exemplary embodiment. DETAILED DESCRIPTION

[0056] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. Instead, they are merely examples of devices and methods consistent with some aspects of the present disclosure as detailed in the appended claims.

[0057] Before the terminal device leaves the factory, it is necessary to conduct a charging scenario test on the terminal device. The charging scenario test covers multiple charging temperature setting standards and needs to be tested under each charging temperature setting standard. After the charging test of the terminal device is completed, it is discharged. After the discharge is completed, it needs to be cooled down before the next test can be carried out.

[0058] At present, during the charging test of the terminal device, it is impossible to realize automated testing, and it is impossible to ensure the consistency between the current temperature parameters of the terminal device and the target reference temperature (that is, the charging temperature setting standard) during the charging test, resulting in poor reliability of the test results. In addition, if the current temperature parameters deviate greatly from the target reference temperature, the charging test needs to be repeated, resulting in low test efficiency.

[0059] In order to solve the above problems, the present disclosure provides a charging test method, which is applied to the testing process of a terminal device by a testing device. The testing device obtains the current temperature parameters of the terminal device. If the current temperature parameters and the target reference temperature meet the preset conditions, the charging test of the terminal device at the target reference temperature is started. This can ensure that the current temperature parameters of the terminal device maintain good consistency with the target reference temperature expected during the testing process, which is conducive to realizing the automation of the charging test and improving the accuracy and efficiency of the charging test.

[0060] The exemplary embodiment of the present disclosure provides a charging test method, which is applied to a test process of a test device on a terminal device. Figure 2 The scene diagram of the charging test method is shown in FIG. 2 . The terminal device 21 maintains a communication connection with the test device 22, and the test device 22 performs a charging test on the terminal device 21, wherein the terminal device 21 may be a smart electronic device powered by a battery, such as a mobile phone, a tablet computer, a smart robot, a smart wearable device, etc. The test device 22 includes a main control chip, a power supply, a switch, a communication device, an indicator light, etc. (described in detail later), wherein the main control chip is used to control each component; the communication device is used to transmit and communicate data with the terminal device to obtain relevant setting information and temperature parameters of the terminal device; the switch is used to control the connection between the charger of the test device and the charging path of the terminal device; the indicator light is used to control the brightness of the indicator light of the test device to prompt the progress and completion of the charging test, and different test processes can also be indicated by changing the color of the indicator light.

[0061] like Figure 1 As shown, the charging test method shown in the present disclosure includes:

[0062] S101, obtaining the current temperature parameter of the terminal device;

[0063] S102: If the current temperature parameter and the target reference temperature in the reference temperature set meet a preset condition, a charging test is performed on the terminal device at the target reference temperature.

[0064] In step S101, the current temperature parameter is used to characterize the current temperature value of the terminal device. The current temperature parameter is collected by temperature measuring components such as built-in temperature sensors of the terminal device. The test equipment can maintain a communication connection with the terminal device through communication devices such as wifi modules and Bluetooth modules to obtain the current temperature value of the terminal device. The terminal device can transmit the current temperature value in real time or at a certain interval, such as 2ms, 5ms, etc.

[0065] In addition, the test equipment can also be provided with an independent temperature detection unit. During the charging test, the temperature detection unit is connected to the terminal device, directly detects the current temperature value of the terminal device and transmits it to the main control chip of the test equipment as the current temperature parameter of the terminal device.

[0066] In step S102, the test device may pre-store a reference temperature set, or obtain the reference temperature set through the host computer during the test process. Among them, the reference temperature set includes multiple reference temperatures, and the temperature value to be charged and tested is selected from the multiple reference temperatures as the target reference temperature. At least one reference temperature in the reference temperature set is used as the target reference temperature to test the terminal device. It can be understood that in order to ensure that the terminal device can maintain a good charging effect under various environments, multiple reference temperatures or all reference temperatures in the reference temperature set can be used as target reference temperatures to test the terminal device. For example, the reference temperature set includes 5 reference temperatures, wherein the 5 reference temperatures are -10°, 0°, 25°, 35°, and 45°, respectively. The terminal device is placed in a test incubator. If the current temperature value set to the test incubator is 0°, 0° is selected as the target reference temperature. If the current temperature value set to the test incubator is 25°, 25° is selected as the target reference temperature. For another example, the terminal device is placed in a test box, and the temperature in the test box is adjusted by a temperature control device, so that the temperature of the terminal device is lowered or raised to each of the five reference temperatures mentioned above for charging testing, so as to test the charging process of the terminal device in a variety of charging test scenarios, thereby improving the test reliability and thus enhancing the competitiveness of the product.

[0067] The test equipment may also pre-store a preset threshold value, which is the threshold value of the difference between the target reference temperature and the current temperature parameter. If the difference between the target reference temperature and the current temperature parameter is within the preset threshold value, it can be determined that the preset condition is met, that is, in the charging test scenario, the charging test of the terminal device does not deviate from the charging temperature setting standard, which can ensure that the terminal device can perform charging tests under the charging temperature setting standard to obtain more accurate test data, ensure the test reliability of the terminal device, promptly discover problematic terminal devices, and enhance the market competitiveness of the product. Among them, the preset threshold value can be set according to the battery performance of the terminal device. If the battery charging speed of the terminal device is greatly affected by the temperature, a smaller preset threshold value can be set. If the battery charging speed of the terminal device is less affected by the temperature, a larger preset threshold value can be set. For example, the target reference temperature is 25°, the current temperature parameter is 25.3°, and the difference between the target reference temperature and the current temperature parameter is 0.3. If the preset threshold value stored in the test device is [-0.3, 0.3], since the difference between the target reference temperature and the current temperature parameter is within the preset threshold value, the current temperature parameter and the target reference temperature meet the preset condition; if the preset threshold value stored in the test device is [-0.2, 0.2], since the difference between the target reference temperature and the current temperature parameter is not within the preset threshold value, the current temperature parameter and the target reference temperature do not meet the preset condition.

[0068] If the current temperature parameter meets the preset conditions with the target reference temperature in the reference temperature set, that is, the charging test condition of the terminal device is consistent with the charging temperature setting standard, and the current temperature value of the terminal device does not deviate too much from the target reference temperature during the test, there is no need to adjust the current temperature value of the terminal device. The test device performs a charging test on the terminal device at the target reference temperature to obtain relevant data during the charging process of the terminal device.

[0069] In the present disclosure, the testing device obtains the current temperature parameters of the terminal device. If the current temperature parameters and the target reference temperature meet the preset conditions, the charging test of the terminal device at the target reference temperature is started. This can ensure that the current temperature parameters of the terminal device maintain good consistency with the target reference temperature expected during the test, which is conducive to the automation of the charging test and improves the accuracy and efficiency of the charging test.

[0070] According to an exemplary embodiment, Figure 3 As shown, the charging test method in this embodiment includes:

[0071] S301, obtaining the current temperature parameter of the terminal device;

[0072] S302, determining whether the current temperature parameter and the target reference temperature in the reference temperature set meet a preset condition, if so, executing step S303; if not, executing step S304;

[0073] S303, performing a charging test on the terminal device at a target reference temperature;

[0074] S304: Control the temperature adjustment device to adjust the temperature of the terminal device so that the current temperature parameter and the target reference temperature meet the preset conditions.

[0075] Among them, steps S301 and S303 are the same as those in the above embodiment and will not be described again.

[0076] In step S302, the test device determines whether the current temperature parameter and the target reference temperature in the reference temperature set meet the preset conditions. If the current temperature parameter and the target reference temperature in the reference temperature set meet the preset conditions, it means that the charging test situation of the terminal device is consistent with the charging temperature setting standard, and there is no need to adjust the temperature of the terminal device. If the current temperature parameter and the target reference temperature in the reference temperature set do not meet the preset conditions, it means that the current temperature parameter of the terminal device deviates from the target reference temperature during the test, which means that the current temperature value of the terminal device and the target reference temperature are quite different. If the terminal device maintains the current temperature value at the target reference temperature for charging test, it is impossible to obtain accurate charging test data of the terminal device at the target reference temperature, which results in inaccurate test results. Therefore, step S304 needs to be executed.

[0077] In step S304, the test device controls the temperature adjustment device to adjust the temperature of the terminal device, and changes the current temperature parameter of the terminal device so that the difference between the current temperature parameter and the target reference temperature is within a preset threshold value and meets the preset condition.

[0078] The function of the temperature regulating device can be to lower the temperature of the terminal device or to raise the temperature of the terminal device. For example, when the room temperature is 25°C, the terminal device needs to be tested in a test scenario with a target reference temperature of 45°C. The terminal device can be placed in a test incubator, and the terminal device is heated by the test incubator to increase the temperature of the terminal device so that the difference between the current temperature parameter of the terminal device and the target parameter meets the preset conditions. For another example, when the room temperature is 25°C, the terminal device needs to be tested in a test scenario with a target reference temperature of -10°C. The terminal device can be cooled by an airflow driving device such as a fan or air conditioner so that the difference between the current temperature parameter of the terminal device and the target parameter meets the preset conditions.

[0079] In this embodiment, if the current temperature parameters and the target reference temperature do not meet the preset conditions, the temperature adjustment device is controlled to increase or decrease the temperature of the terminal device so that the current temperature parameters and the target reference temperature meet the preset conditions, thereby ensuring that the current temperature parameters of the terminal device are consistent with the target reference temperature and improving the reliability of the charging test.

[0080] According to an exemplary embodiment, Figure 4 As shown, the charging test method in this embodiment includes:

[0081] S401, obtaining the current temperature parameter of the terminal device;

[0082] S402, determining whether the current temperature parameter and the target reference temperature in the reference temperature set meet a preset condition, if so, executing step S403; if not, executing step S404;

[0083] S403, performing a charging test on the terminal device at a target reference temperature;

[0084] S404, obtaining a target control parameter of the airflow driving device based on a difference between the current temperature parameter and the target reference temperature;

[0085] S405. Based on the target control parameter, control the airflow driving device to drive the airflow toward the terminal device so that the current temperature parameter and the target reference temperature meet the preset condition.

[0086] Among them, steps S401-S403 are the same as those in the above embodiment and will not be repeated here.

[0087] In step S404, the temperature adjustment device may include an airflow drive device and a controller, wherein the airflow drive device may be a heat dissipation component such as a fan, and the controller may be a PID controller (proportional-integral-derivative control), the PID controller adopts a discrete incremental PID control algorithm, and uses the difference deviation data between the current temperature parameter and the target reference temperature as a control factor. Therefore, the current temperature parameter and the target reference temperature are input into the PID controller, and after calculation by the PID controller, the target control parameters of the airflow drive device can be obtained, and the target control parameters include the driving power, driving time, duty cycle (pulse width modulation, PWM) and other data of the airflow drive device during the control process, so as to control the working process of the airflow drive device, the cooling efficiency and the cooling amplitude, etc.

[0088] In step S405, the test equipment controls the driving power and driving time of the airflow driving device based on the target control parameters. During the driving process of the airflow driving device, the airflow generated by the airflow driving device flows toward the terminal device to adjust the current temperature value of the terminal device so that the current temperature parameter and the target reference temperature meet the preset conditions. After the test equipment determines that the current temperature parameter and the target reference temperature meet the preset conditions, step S403 is executed to perform a charging test on the terminal device at the target reference temperature.

[0089] In the related art, before testing the charging performance of the terminal device, the terminal device is mainly discharged using discharge software. Since the terminal device generates severe heat after discharge, a fan is usually used to cool the terminal device. Although the fan can effectively reduce the temperature of the terminal device, due to the lack of closed-loop control, the fan power and heat dissipation time cannot be effectively controlled, so the charging test situation cannot be consistent with the charging temperature setting standard. In addition, due to the lack of charging test reminders and automated testing functions, the charging test still needs to be manually started after the terminal device cools down, and the automated testing process cannot be realized. It is easy for the terminal device to be too hot or too cold. If the tester performs a charging test under this circumstance, the charging test situation of the terminal device will deviate from the charging temperature setting standard, and accurate test results cannot be obtained.

[0090] In this embodiment, based on the difference between the current temperature parameter and the target reference temperature, calculations are performed automatically to obtain the target control parameters of the airflow driving device. The airflow driving device is driven based on the target control parameters. This can not only effectively reduce the current temperature value of the terminal device, but also ensure that the current temperature parameter is consistent with the target reference temperature (that is, the charging temperature setting standard), so that the charging test is performed when the current temperature parameter is closest to the target reference temperature, thereby improving the accuracy and efficiency of the charging test.

[0091] According to an exemplary embodiment, Figure 5 As shown, the charging test method in this embodiment includes:

[0092] S501, obtaining the current temperature parameter of the terminal device;

[0093] S502, determining whether the current temperature parameter and the target reference temperature in the reference temperature set meet a preset condition, if so, executing step S503; if not, executing step S504;

[0094] S503, performing a charging test on the terminal device at a target reference temperature;

[0095] S504, obtaining a first temperature parameter obtained at a collection time before the current time, and a second temperature parameter obtained at a collection time before the previous collection time;

[0096] S505, determining a target control parameter of the airflow driving device based on the first temperature parameter, the second temperature parameter, the current temperature parameter and the target reference temperature;

[0097] S506. Based on the target control parameter, control the airflow driving device to drive the airflow toward the terminal device so that the current temperature parameter and the target reference temperature meet a preset condition.

[0098] Among them, steps S501-S503 and S506 are the same as those in the above embodiment and will not be repeated here.

[0099] In step S504, the test device is set with a collection time, and the current temperature parameters of the terminal device are obtained at each collection time with a preset time interval. The test device also obtains the temperature value of the terminal device at the previous collection time before the current time, and the temperature value of the terminal device at the collection time before the previous collection time, and uses the former temperature value as the first temperature parameter and the latter temperature value as the second temperature parameter.

[0100] In step S505, the testing device inputs the acquired first temperature parameter, second temperature parameter, current temperature parameter and target reference temperature into the PID controller, and determines the target control parameter of the airflow driving device through the PID control algorithm.

[0101] In some embodiments, determining a target control parameter of the airflow driving device based on the first temperature parameter, the second temperature parameter, the current temperature parameter and the target reference temperature includes:

[0102] Determining a parameter change amount based on the first temperature parameter, the second temperature parameter, the current temperature parameter, and the target reference temperature;

[0103] Based on the current control parameters and parameter changes of the airflow driving device, the target control parameters are determined.

[0104] The test equipment uses the difference between the current temperature parameter and the target reference temperature as e k The difference between the first temperature parameter and the target reference temperature is represented by e k-1 The difference between the second temperature parameter and the target reference temperature is represented by e k-2 The parameter change is represented by Δu, where the proportion k in the PID controller is p , integral k i , differential k d is the data value used to change the parameter according to the experience value or the scenario of the charging test process, and the ratio kp , integral k i , differential k d It can be pre-stored in a PID controller, and the PID controller can be a part of a main control chip.

[0105] Therefore, e k 、e k-1 、e k-2 The three values ​​are input into the PID controller, and the parameter change Δu can be obtained by the following formula:

[0106] Δu=k D (e k -e k-1 )+k d (e k -2·e k-1 +e k-2 )+k i ·e k

[0107] Use u to set the current control parameters last Indicates that the current control parameter is the target control parameter obtained by the PID control algorithm at the last acquisition time of the terminal device at the current time. The target control parameter is represented by u. The target control parameter u at the current time can be obtained by the following formula:

[0108] u=u last +Δu

[0109] After obtaining the target control parameter u, the parameter can be used to control the airflow driving device such as the fan to realize the automated cooling process, which can make the cooling process more efficient and accurate.

[0110] In this embodiment, if the current temperature parameter is greater than the target reference temperature, the PID controller is used to determine the target control parameter of the airflow driving device, and the airflow driving device is controlled based on the target control parameter to reduce the current temperature value of the terminal device so that the current temperature parameter of the terminal device and the target reference temperature meet the preset conditions, thereby realizing closed-loop control. There is no need to manually start the charging test, which is conducive to the automation of the charging test.

[0111] According to an exemplary embodiment, Figure 6 As shown, the charging test method in this embodiment includes:

[0112] S601, obtaining the current temperature parameter of the terminal device;

[0113] S602, determining whether the current temperature parameter and the target reference temperature in the reference temperature set meet a preset condition, if so, executing step S603; if not, executing step S605;

[0114] S603, controlling the charging path between the charger and the terminal device to be connected;

[0115] S604, collecting test data during the charging test at the target reference temperature;

[0116] S605, obtaining a first temperature parameter obtained at a collection time before the current time, and a second temperature parameter obtained at a collection time before the previous collection time;

[0117] S606, determining a target control parameter of the airflow driving device based on the first temperature parameter, the second temperature parameter, the current temperature parameter and the target reference temperature;

[0118] S607. Based on the target control parameter, control the airflow driving device to drive the airflow toward the terminal device so that the current temperature parameter and the target reference temperature meet a preset condition.

[0119] Among them, steps S601, S602, S605-S607 are the same as those in the above embodiment and will not be repeated here.

[0120] In step S603, if the current temperature parameter meets the preset condition with the target reference temperature in the reference temperature set, the test device can perform a charging test on the terminal device at the target reference temperature. The switch of the test device turns on the charging path between the charger and the terminal device, ensuring that the charger can charge the terminal device even if the USB interface of the terminal device and the USB interface of the charger are in a conductive state. Among them, the USB interface of the terminal device can be connected to the USB interface of the test device, and the power supply of the test device is used as a charger to supply power to the terminal device; the USB interface of the terminal device can also be connected to the USB interface of an independent power supply device, and the power supply device is used as a charger to provide the terminal device with the power required for the charging test.

[0121] In step S604, the charging test is performed after the charging path between the charger and the terminal device is connected, and the test device collects test data during the charging test of the terminal device at the target reference temperature. The test device saves all test data collected when multiple reference temperatures in the reference temperature set are selected as the target reference temperature. After the charging test is completed, the test device analyzes these test data to obtain the charging performance of the battery of the terminal device. Since the test data is obtained when the current temperature parameter and the target reference temperature meet the preset conditions, the situation where there is a large deviation between the temperature of the terminal device itself and the target reference temperature is avoided, and the accuracy of the test data is effectively guaranteed.

[0122] According to an exemplary embodiment, Figure 7 As shown, the charging test method in this embodiment includes:

[0123] S701, obtaining the current temperature parameter of the terminal device;

[0124] S702, determining whether the current temperature parameter and the target reference temperature in the reference temperature set meet a preset condition, if so, executing step S703; if not, executing step S705;

[0125] S703, controlling the charging path between the charger and the terminal device to be connected;

[0126] S704, collecting test data during the charging test at the target reference temperature;

[0127] S705, obtaining a first temperature parameter obtained at a collection time before the current time, and a second temperature parameter obtained at a collection time before the previous collection time;

[0128] S706, determining a target control parameter of the airflow driving device based on the first temperature parameter, the second temperature parameter, the current temperature parameter and the target reference temperature;

[0129] S707, based on the target control parameter, controlling the airflow driving device to drive the airflow toward the terminal device so that the current temperature parameter and the target reference temperature meet the preset condition;

[0130] S708, determining whether the first instruction information sent by the terminal device is received, if the first instruction information sent by the terminal device is received, executing step S709; if the first instruction information sent by the terminal device is not received, executing step S704;

[0131] S709: Stop the charging test based on the first instruction information received from the terminal device.

[0132] Among them, steps S701-S707 are the same as those in the above embodiment and will not be repeated here.

[0133] In step S708, while the test device performs a charging test on the terminal device, it also receives instruction information sent by the terminal device, wherein the first prompt information is used to indicate that the charging test process is completed. If the test device receives the first instruction information sent by the terminal device, it indicates that the charging test process is completed, and step S709 is executed to stop the charging test. If the test device does not receive the first instruction information sent by the terminal device, it indicates that the charging test process has not been completed, and the terminal device is still in the charging process. The test device continues to execute step S704 to collect test data during the charging test process at the target reference temperature.

[0134] Since the test device and the terminal device always maintain a communication connection, in addition to the command information sent by the terminal device, the terminal device will also receive other command information sent by the test device. For example, when the test device determines that the current temperature parameter and the target reference temperature in the reference temperature set meet the preset conditions and can start charging test on the terminal device, the test device will send a second command information to the terminal device to inform the terminal device that the charging test is about to start. It can also be understood that the second command information is used to establish a communication handshake process with the terminal device to ensure that the subsequent test device performs an accurate and reliable charging test process on the terminal device.

[0135] In some embodiments, after the charging path is turned on, a first prompt message is issued, the first prompt message is used to prompt that a charging test is in progress; and / or, based on the first instruction message, a second prompt message is issued, the second prompt message is used to prompt that the charging test is completed.

[0136] When the current temperature parameter meets the preset condition with the target reference temperature, the switch of the test device turns on the charging path between the charger and the terminal device, and the test device sends a first prompt message to prompt the terminal device that the charging test is in progress. In addition, when the test device receives the first instruction message sent by the terminal device, the test device may also send a second prompt message to prompt that the charging test is complete. The first prompt message and the second prompt message may be in the form of an indicator light, or in the form of text, sound, vibration, etc., to achieve a prompt effect for the tester.

[0137] For example, when the first prompt information and the second prompt information exist in the form of an indicator light, if the test device has only one indicator light, the indicator light of the test device can control the indicator light of the test device to flash red to indicate that the charging test is in progress, and control the indicator light of the test device to flash green to indicate that the charging test is completed; if the test device has two indicator lights, a test indicator light and a completion indicator light, after the charging path is connected, the test indicator light is turned on and the completion indicator light is turned off to issue the first prompt information, and when the first instruction information is received, the completion indicator light is turned on and the test indicator light is turned off to issue the second prompt information. When the first prompt information and the second prompt information exist in the form of text, the text "charging test in progress" and "charging test completed" can be displayed on the display screen of the test device or the terminal device to prompt the terminal device that the charging test is in progress and the charging test is completed. When the first prompt information and the second prompt information exist in the form of sound, after the charging path is connected, the test device emits a soothing prompt sound, and when the first instruction information is received, the test device emits a rapid prompt sound. In addition, since charging tests are usually performed separately at multiple target reference temperatures during the charging test of the terminal device, the indicator lights can be set to different colors to indicate at which target reference temperature the charging test is being performed.

[0138] According to an exemplary embodiment, Figure 8 As shown, the charging test method in this embodiment includes:

[0139] S801. The main control chip determines whether the terminal device is connected to the test device through the communication device. If the terminal device is connected to the test device through the communication device, execute step S802; if the terminal device is not connected to the test device through the communication device, return to S801.

[0140] Among them, if the terminal device is connected to the test device through the communication device, it means that the handshake between the terminal device and the test device has been successful, and a stable communication connection has been established. The test device can control a separately set charger or a charger belonging to the test device to charge the terminal device for testing; and after the test device and the terminal device establish a stable communication connection, communication signals can be transmitted between the two to facilitate the collection of test parameters of the terminal device.

[0141] S802, starting the charging test process of the terminal device;

[0142] S803, the main control chip obtains the initial temperature parameters of the terminal device;

[0143] The initial temperature obtained in this step can be used as a reference to understand the temperature value of the terminal device before the test begins, so that when charging tests need to be performed at multiple different target reference temperatures in the future, it can be decided whether the terminal device with the initial temperature parameters needs to be heated or cooled.

[0144] S804, the main control chip obtains the current temperature parameter of the terminal device;

[0145] After heating or cooling in step S808, it is necessary to continuously detect the temperature of the terminal device, that is, to obtain the current temperature parameters, so that the main control chip can decide whether to start the charging test.

[0146] S805, the main control chip determines whether the current temperature parameter and the target reference temperature in the reference temperature set meet the preset condition. If the preset condition is met, step S809 is executed; if the preset condition is not met, step S806 is executed;

[0147] S806. The main control chip obtains a first temperature parameter of the terminal device at a previous collection time before the current time, and a second temperature parameter of the collection time before the previous collection time;

[0148] S807, the main control chip inputs the first temperature parameter, the second temperature parameter, the current temperature parameter and the target reference temperature into the PID controller to determine the target control parameter of the airflow driving device;

[0149] The implementation method of calculating the target control parameters involved in this step has been described in detail above and will not be repeated here.

[0150] S808, the main control chip controls the airflow driving device to drive the airflow toward the terminal device based on the target control parameter;

[0151] In this embodiment, an example is given in which an airflow driving device drives airflow to cool a terminal device. It is understandable that when the terminal device needs to be heated, other heating devices may also be controlled to heat the terminal device.

[0152] S809, the main control chip sends second instruction information to the terminal device through the communication device;

[0153] S810, the main control chip controls the switch to conduct the charging path between the charger and the terminal device;

[0154] S811, the main control chip controls the indicator light to send out a first prompt message;

[0155] S812, the main control chip determines whether the first instruction information sent by the terminal device is received, if the first instruction information sent by the terminal device is received, step S813 is executed; if the first instruction information sent by the terminal device is not received, step S811 is executed;

[0156] S813: The main control chip controls the indicator light to send out a second prompt message.

[0157] In step S801, the main control chip of the test device determines whether the terminal device has established a communication connection with the test device through the communication device of the test device. Only after the communication connection is established can the test device obtain various parameter information and instruction information of the terminal device and start the charging test process of the terminal device in step S802. If the terminal device does not establish a communication connection with the test device through the communication device, step S802 cannot be executed.

[0158] After the charging test process of the terminal device is started in step S802, the main control chip obtains the initial temperature parameter of the terminal device in step S803, that is, the temperature value of the terminal device when the terminal device is connected to the test device. In step S804, the main control chip obtains the current temperature parameter of the terminal device, that is, the temperature value of the terminal device at the current moment. In step S805, the main control chip determines whether the current temperature parameter of the terminal device and the target reference temperature in the reference temperature set meet the preset conditions. If the preset conditions are not met, step S806 is executed, and the main control chip obtains the first temperature parameter of the last acquisition moment of the terminal device at the current moment, and the second temperature parameter of the previous acquisition moment before the last acquisition moment. In step S807, the main control chip inputs the first temperature parameter, the second temperature parameter, the current temperature parameter and the target reference temperature into the PID controller, and obtains the target control parameter of the airflow driving device through the PID control algorithm, so that the main control chip can control the airflow driving device to drive the airflow toward the terminal device based on the target control parameter in step S808, and adjust the temperature of the terminal device so that the current temperature parameter of the terminal device and the target reference temperature meet the preset conditions.

[0159] If in step S805 the main control chip determines that the current temperature parameter of the terminal device meets the preset condition with the target reference temperature in the reference temperature set, then step S809 is executed and the main control chip sends a second instruction message to the terminal device through the communication device, wherein the second instruction message is to inform the terminal device that a charging test is about to begin. In step S810, the main control chip controls the switch to be turned on so that the charging path between the charger and the terminal device is turned on, ensuring that the test equipment can perform a charging test on the terminal device. In step S811, the main control chip controls the indicator light to send a first prompt message to indicate that a charging test is in progress. If in step S812 the main control chip receives the first instruction message sent by the terminal device indicating that the charging test process is completed, then step S813 is executed and the main control chip controls the indicator light to send a second prompt message to indicate that the charging test process is completed, thereby ending the entire charging test process.

[0160] The exemplary embodiment of the present disclosure provides a charging test device, which is applied to the testing process of a testing device on a terminal device. Fig. 9 , a block diagram of a charging test device shown in the present disclosure. The charging test device in this embodiment is integrated on a main control chip of a test device.

[0161] The charging test device includes an acquisition module 91 and a control module 92. The acquisition module 91 is used to acquire the current temperature parameter of the terminal device, and the current temperature parameter is used to characterize the current temperature value of the terminal device; the control module 92 is used to perform a charging test on the terminal device at the target reference temperature if the current temperature parameter meets a preset condition with a target reference temperature in a reference temperature set, wherein the reference temperature set includes multiple reference temperatures, the target reference temperature is a temperature value selected from multiple reference temperatures to be tested for charging, and the preset condition means that the difference between the target reference temperature and the current temperature parameter is within a preset threshold.

[0162] In an exemplary embodiment of the present disclosure, the control module 92 is also used to: if the current temperature parameter and the target reference temperature do not meet the preset conditions, control the temperature adjustment device to adjust the temperature of the terminal device so that the current temperature parameter and the target reference temperature meet the preset conditions.

[0163] In an exemplary embodiment of the present disclosure, the control module 92 is further configured to: obtain a target control parameter of the airflow driving device based on a difference between the current temperature parameter and the target reference temperature;

[0164] Based on the target control parameter, the airflow driving device is controlled to drive the airflow to flow toward the terminal device.

[0165] In an exemplary embodiment of the present disclosure, a collection moment is set at a preset time interval, and the current temperature parameters of the terminal device are obtained at the collection moment. The control module 92 is also used to: obtain a first temperature parameter obtained at a collection moment before the current moment, and a second temperature parameter obtained at a collection moment before the previous collection moment; determine the target control parameters of the airflow drive device based on the first temperature parameter, the second temperature parameter, the current temperature parameter and the target reference temperature.

[0166] In an exemplary embodiment of the present disclosure, the control module 92 is also used to: determine the parameter change based on the first temperature parameter, the second temperature parameter, the current temperature parameter and the target reference temperature; determine the target control parameter based on the current control parameter and the parameter change of the airflow drive device.

[0167] In an exemplary embodiment of the present disclosure, the control module 92 is further used to: control the charging path between the charger and the terminal device to be connected; and collect test data during the charging test at the target reference temperature.

[0168] In an exemplary embodiment of the present disclosure, the control module 92 is further configured to stop the charging test based on the received first instruction information sent by the terminal device.

[0169] In an exemplary embodiment of the present disclosure, the control module 92 is further configured to: after the charging path is turned on, issue a first prompt message, wherein the first prompt message is used to prompt that a charging test is being performed.

[0170] In an exemplary embodiment of the present disclosure, the control module 92 is further configured to: issue a second prompt message based on the first instruction message, where the second prompt message is used to prompt that the charging test is completed.

[0171] Regarding the charging test device in the above embodiment, the manner in which each module performs operations has been described in detail in the embodiment of the method, and will not be elaborated here.

[0172] The exemplary embodiment of the present disclosure provides a charging test system, such as Fig.10 As shown, a block diagram of a charging test system shown in the present disclosure includes: a terminal device 21, a test device 22, and a temperature adjustment device 23.

[0173] The charging test system includes a test device 22, which includes a main control chip 221 and a communication device 222. The main control chip 221 is connected to the terminal device 21 and the temperature adjustment device 23 through the communication device 222 to obtain various parameter information and instruction information of the terminal device 21 and control the temperature adjustment device 23.

[0174] The test device 22 also includes a switch 223 disposed in the charging path, the switch 223 is electrically connected to the main control chip 221, and the switch 223 can control the charging path to be connected or disconnected according to the control of the main control chip 221. When the charging path is connected, the terminal device 21 can be charged to perform a charging test. The switch 223 can be, for example, a relay.

[0175] The main control chip 221 is used to determine whether the current temperature parameters and the target reference temperature in the reference temperature set meet the preset conditions. If the current temperature parameters and the target reference temperature meet the preset conditions, the main control chip controls the switch 223 to connect the charging path to perform a charging test on the terminal device 21 at the target reference temperature.

[0176] The charging test system also includes a temperature regulating device 23, which is electrically connected to the main control chip 221. If the main control chip 221 determines that the current temperature parameters and the target reference temperature in the reference temperature set do not meet the preset conditions, the main control chip 221 controls the temperature regulating device 23 after calculating the target control parameters to cool down or heat up the terminal device 21 so that the current temperature parameters of the terminal device 21 and the target reference temperature meet the preset conditions.

[0177] In the exemplary embodiment of the present disclosure, the test device 22 also includes a power supply 224, an indicator light 225, and a USB interface 226. The power supply 224 is electrically connected to the main control chip 221, and the power supply 224 provides power to the test device 22 to ensure the charging test process. The test device 22 uses the communication device 222 to maintain a communication connection with the terminal device 21, and communication signals can be transmitted between the two. The test device 22 can obtain parameter information such as the initial temperature parameters and current temperature parameters of the terminal device 21, and the terminal device 21 can also send instruction information to the test device 22. If the main control chip 221 determines that the current temperature parameter of the terminal device 21 and the target reference temperature do not meet the preset conditions, the main control chip 221 obtains the first temperature parameter of the previous acquisition moment of the current moment of the terminal device 21, and the second temperature parameter of the previous acquisition moment before the previous acquisition moment. The main control chip inputs the first temperature parameter, the second temperature parameter, the current temperature parameter and the target reference temperature into the PID controller, and uses the PID control algorithm to determine the target control parameter of the temperature adjustment device 23. The main control chip 221 controls the temperature adjustment device 23 to adjust the temperature of the terminal device 21 according to the target control parameter. If the current temperature parameter is much larger than the target reference temperature, the temperature adjustment device 23 is used to reduce the current temperature value of the terminal device 21. If the current temperature parameter is much smaller than the target reference temperature, the temperature adjustment device 23 is used to increase the current temperature value of the terminal device 21. If the main control chip 221 determines that the current temperature parameters of the terminal device 21 and the target reference temperature meet the preset conditions, the test device 22 sends a second instruction message to start the charging test to the terminal device 21 through the communication device 222, and the main control chip 221 controls the switch 223 to connect the USB interface 226 of the test device 22 with the charging path of the terminal device 21, and the terminal device 21 starts the charging test. At the same time, the main control chip 221 controls the indicator light 225 to turn on to send out a first prompt message to indicate that the charging test is in progress. During the charging test, the test device 22 can obtain the test data during the charging test of the terminal device 21 through the communication device 222. After the terminal device 21 completes the charging test, it sends the first instruction message of the test completion to the test device 22. After the main control chip 221 receives the first instruction message, the main control chip 221 controls the switch 223 to disconnect the USB interface 226 and the charging path of the terminal device 21, and controls the indicator light 225 to turn off, and sends out a second prompt message.

[0178] Fig.11 1 is a block diagram of a test device 1100 according to an exemplary embodiment. For example, the test device 1100 may be a mobile phone, a computer, a digital broadcast terminal, a messaging device, a game console, a tablet device, a medical device, a fitness device, a personal digital assistant, etc.

[0179] Reference Fig.11The test device 1100 may include one or more of the following components: a processing component 1102 , a memory 1104 , a power component 1106 , a multimedia component 1108 , an audio component 1110 , an input / output (I / O) interface 1112 , a sensor component 1114 , and a communication component 1116 .

[0180] The processing component 1102 generally controls the overall operation of the test device 1100, such as operations associated with display, phone calls, data communications, camera operations, and recording operations. The processing component 1102 may include one or more processors 1120 to execute instructions to perform all or part of the steps of the above-described method. In addition, the processing component 1102 may include one or more modules to facilitate interaction between the processing component 1102 and other components. For example, the processing component 1102 may include a multimedia module to facilitate interaction between the multimedia component 1108 and the processing component 1102.

[0181] The memory 1104 is configured to store various types of data to support operations on the test device 1100. Examples of such data include instructions for any application or method operating on the test device 1100, contact data, phone book data, messages, pictures, videos, etc. The memory 1104 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk.

[0182] The power supply component 1106 provides power to various components of the test device 1100. The power supply component 1106 may include a power management system, one or more power supplies, and other components associated with generating, managing, and distributing power to the test device 1100.

[0183] The multimedia component 1108 includes a screen that provides an output interface between the test device 1100 and the user. In some embodiments, the screen may include a liquid crystal display (LCD) and a touch panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive input signals from the user. The touch panel includes one or more touch sensors to sense touch, slide, and gestures on the touch panel. The touch sensor may not only sense the boundaries of the touch or slide action, but also detect the duration and pressure associated with the touch or slide operation. In some embodiments, the multimedia component 1108 includes a front camera and / or a rear camera. When the test device 1100 is in an operating mode, such as a shooting mode or a video mode, the front camera and / or the rear camera may receive external multimedia data. Each front camera and the rear camera may be a fixed optical lens system or have a focal length and optical zoom capability.

[0184] The audio component 1110 is configured to output and / or input audio signals. For example, the audio component 1110 includes a microphone (MIC), and when the test device 1100 is in an operation mode, such as a call mode, a recording mode, and a speech recognition mode, the microphone is configured to receive an external audio signal. The received audio signal can be further stored in the memory 1104 or sent via the communication component 1116. In some embodiments, the audio component 1110 also includes a speaker for outputting audio signals.

[0185] I / O interface 1112 provides an interface between processing component 1102 and peripheral interface modules, which may be keyboards, click wheels, buttons, etc. These buttons may include but are not limited to: a home button, a volume button, a start button, and a lock button.

[0186] The sensor assembly 1114 includes one or more sensors for providing various aspects of status assessment for the test device 1100. For example, the sensor assembly 1114 can detect the open / closed state of the test device 1100, the relative positioning of components, such as the display and keypad of the test device 1100, the sensor assembly 1114 can also detect the position change of the test device 1100 or a component of the test device 1100, the presence or absence of user contact with the test device 1100, the orientation or acceleration / deceleration of the test device 1100, and the temperature change of the test device 1100. The sensor assembly 1114 may include a proximity sensor configured to detect the presence of a nearby object without any physical contact. The sensor assembly 1114 may also include an optical sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, the sensor assembly 1114 may also include an accelerometer, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.

[0187] The communication component 1116 is configured to facilitate wired or wireless communication between the test device 1100 and other devices. The test device 1100 can access a wireless network based on a communication standard, such as WiFi, 2G or 3G, or a combination thereof. In an exemplary embodiment, the communication component 1116 receives a broadcast signal or broadcast-related information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communication component 1116 also includes a near field communication (NFC) module to facilitate short-range communication. For example, the NFC module can be implemented based on radio frequency identification (RFID) technology, infrared data association (IrDA) technology, ultra-wideband (UWB) technology, Bluetooth (BT) technology and other technologies.

[0188] In an exemplary embodiment, the test device 1100 can be implemented by one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components to perform the above methods.

[0189] In an exemplary embodiment, a non-transitory computer-readable storage medium including instructions is also provided, such as a memory 1104 including instructions, and the instructions can be executed by a processor 1120 of the test device 1100 to complete the above charging test method. For example, the non-transitory computer-readable storage medium can be a ROM, a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, etc.

[0190] A non-transitory computer-readable storage medium, when instructions in the storage medium are executed by a processor of a terminal device, enables a processing device of the terminal device to execute a charging test method provided by an exemplary embodiment of the present disclosure.

[0191] Those skilled in the art will readily appreciate other embodiments of the present disclosure after considering the specification and practicing the disclosure disclosed herein. The present disclosure is intended to cover any variations, uses, or adaptations of the present disclosure that follow the general principles of the present disclosure and include common knowledge or customary techniques in the art that are not disclosed in the present disclosure. The description and examples are to be considered exemplary only, and the true scope and spirit of the present disclosure are indicated by the following claims.

[0192] It should be understood that the present disclosure is not limited to the exact structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims

1. A charging test method, characterized in that: Applied to the testing process of the test device on the terminal device, the charging test method includes: Acquire a current temperature parameter of the terminal device, where the current temperature parameter is used to characterize a current temperature value of the terminal device; If the current temperature parameter and the target reference temperature in the reference temperature set meet a preset condition, a charging test is performed on the terminal device at the target reference temperature, wherein the reference temperature set includes multiple reference temperatures, the target reference temperature is a temperature value selected from the multiple reference temperatures to be tested for charging, and the preset condition means that the difference between the target reference temperature and the current temperature parameter is within a preset threshold.

2. The charging test method according to claim 1, characterized in that: The charging test method further includes: If the current temperature parameter and the target reference temperature do not satisfy a preset condition, the temperature adjustment device is controlled to adjust the temperature of the terminal device so that the current temperature parameter and the target reference temperature satisfy a preset condition.

3. The charging test method according to claim 2, characterized in that: The temperature adjustment device includes an airflow driving device, and the temperature adjustment device is controlled to adjust the temperature of the terminal device, including: Based on the difference between the current temperature parameter and the target reference temperature, obtaining a target control parameter of the airflow driving device; Based on the target control parameter, the airflow driving device is controlled to drive the airflow to flow toward the terminal device.

4. The charging test method according to claim 3, characterized in that: Setting a collection time at each preset time interval, obtaining a current temperature parameter of the terminal device at the collection time, and obtaining a target control parameter of the airflow driving device based on a difference between the current temperature parameter and the target reference temperature, including: Obtaining a first temperature parameter obtained at a collection moment before the current moment, and a second temperature parameter obtained at a collection moment before the previous collection moment; A target control parameter of the airflow driving device is determined based on the first temperature parameter, the second temperature parameter, the current temperature parameter, and the target reference temperature.

5. The charging test method according to claim 4, characterized in that: Determining a target control parameter of the airflow driving device based on the first temperature parameter, the second temperature parameter, the current temperature parameter and the target reference temperature includes: Determining a parameter change amount based on the first temperature parameter, the second temperature parameter, the current temperature parameter, and the target reference temperature; The target control parameter is determined based on the current control parameter of the airflow driving device and the parameter change.

6. The charging test method according to any one of claims 1 to 5, characterized in that: The performing a charging test on the terminal device at the target reference temperature includes: Controlling the charging path between the charger and the terminal device to be connected; The test data is collected during the charging test at the target reference temperature.

7. The charging test method according to claim 6, characterized in that: The performing a charging test on the terminal device at the target reference temperature further includes: Stop the charging test based on the received first instruction information sent by the terminal device.

8. The charging test method according to claim 7, characterized in that: The performing a charging test on the terminal device at the target reference temperature further includes: After the charging path is turned on, a first prompt message is sent out, wherein the first prompt message is used to prompt that a charging test is being performed.

9. The charging test method according to claim 7, characterized in that: The performing a charging test on the terminal device at the target reference temperature further includes: Based on the first instruction information, a second prompt information is issued, where the second prompt information is used to prompt that the charging test is completed.

10. A charging test device, characterized in that: Applicable to the testing process of the test equipment on the terminal equipment, the charging test device comprises: An acquisition module, used for acquiring a current temperature parameter of the terminal device, wherein the current temperature parameter is used for representing a current temperature value of the terminal device; A control module, configured to perform a charging test on the terminal device at a target reference temperature in a reference temperature set if a preset condition is satisfied between the current temperature parameter and the target reference temperature in the reference temperature set, wherein the reference temperature set includes multiple reference temperatures, the target reference temperature is a temperature value selected from the multiple reference temperatures to be tested for charging, and the preset condition means that the difference between the target reference temperature and the current temperature parameter is within a preset threshold.

11. A testing device, characterized in that: The test equipment includes: processor; a memory for storing processor-executable instructions; The processor is configured to execute executable instructions in the memory to implement the charging test method according to any one of claims 1 to 9.

12. A non-transitory computer-readable storage medium having executable instructions stored thereon, characterized in that: When the executable instruction is executed by the processor, the charging test method according to any one of claims 1 to 9 is implemented.

13. A charging test system, characterized in that: The charging test system includes a test device, the test device includes a main control chip and a communication device, and the test device also includes a switch arranged in the charging path, the switch is electrically connected to the main control chip; The main control chip is connected to the terminal device through the communication device, and the main control chip obtains the current temperature parameter of the terminal device, and the current temperature parameter is used to represent the current temperature value of the terminal device; The main control chip is used to determine whether the current temperature parameter and the target reference temperature in the reference temperature set meet a preset condition. If the current temperature parameter and the target reference temperature in the reference temperature set meet the preset condition, the main control chip controls the switch to connect the charging path to perform a charging test on the terminal device at the target reference temperature; Among them, the reference temperature set includes multiple reference temperatures, the target reference temperature is a temperature value selected from the multiple reference temperatures for charging test, and the preset condition means that the difference between the target reference temperature and the current temperature parameter is within a preset threshold.

14. The charging test system according to claim 13, characterized in that: The charging test system further includes a temperature regulating device, wherein the temperature regulating device is electrically connected to the main control chip; When the main control chip determines that the current temperature parameter and the target reference temperature do not satisfy a preset condition, the main control chip controls the temperature adjustment device to adjust the temperature of the terminal device so that the current temperature parameter and the target reference temperature satisfy the preset condition.

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