Probe tip structure wrapped with two-dimensional material and preparation method thereof

Abstract

The invention provides a probe tip structure wrapped with a two-dimensional material and a preparation method of the probe tip structure. The preparation method comprises the following steps: stripping a blocky two-dimensional material to obtain a single-layer two-dimensional material; performing ultrasonic dispersion treatment on the single-layer two-dimensional material to obtain a two-dimensional material suspension; the probe tip is soaked in the two-dimensional material suspension, and a two-dimensional material sheet layer is formed on the surface of the probe tip. The method is simpler and more convenient to operate, complex high-temperature and high-vacuum conditions are not needed, the equipment and operation cost is reduced, the high-quality two-dimensional material suspension can be obtained, the coverage uniformity and the material stability of the probe tip are ensured, and the method has higher adaptability and can flexibly process probe tips of different shapes and sizes.

Description

Technical Field

[0001] The present application belongs to the technical field of high-performance probe modification technology, and specifically, relates to a probe tip structure wrapped with a two-dimensional material and a preparation method thereof. Background Art

[0002] In the field of nanotechnology and materials science, high-resolution probe technologies such as scanning near-field optical microscopy (SNOM) and atomic force microscopy (AFM) play a vital role. These technologies can not only perform surface imaging and measurement at the nanoscale, but also reveal the subtle relationship between material structure and properties, thus promoting the development and application of micro-nanotechnology.

[0003] As a non-contact optical microscopy technique, SNOM uses the interaction between the probe tip and the sample surface at a very close distance to surpass the traditional optical resolution limit and achieve ultra-high-resolution optical imaging. It is widely used in the biomedical field, such as direct observation and analysis of the structure and function of biomolecules, cells and biological tissues, providing important support for disease diagnosis and drug development. AFM is well-known for its force measurement capabilities at the atomic scale. By detecting the tiny force interactions on the sample surface at the probe tip, AFM can achieve high-resolution surface imaging, force spectroscopy and surface force measurement, providing an irreplaceable means for materials science research and nanostructure preparation. In the field of materials science, AFM is widely used in surface morphology analysis, surface mechanical property measurement, preparation and characterization of thin films and nanostructures, and plays a key role in the development and optimization of new materials.

[0004] Two-dimensional materials have unique advantages and potential for the fields of nanotechnology and materials science, especially in the application of probe technology. Two-dimensional materials, such as graphene, boron nitride (h-BN), transition metal dichalcogenides (TMDs), etc., are ideal candidates for probe tip materials due to their monolayer structure, high specific surface area, and excellent electrical, optical, and mechanical properties. First, the monolayer structure of two-dimensional materials gives them excellent mechanical flexibility and strong mechanical properties, which enables them to adapt to the complex shape and size requirements of the probe tip while maintaining stable performance. Compared with traditional materials, the high surface area to volume ratio of two-dimensional materials enables them to show higher sensitivity and response speed in contact and sensing applications, which is crucial for high-resolution imaging and measurement. Second, two-dimensional materials have excellent optical and electrical properties, which enable ultra-high-resolution optical microscopy and electron microscopy imaging, such as through SNOM and AFM techniques. The optical transparency and electrical conductivity of these materials make them have broad application prospects in the fields of nanoelectronics and optoelectronics, such as as key components of optical sensors and electronic devices. In addition, the chemical stability and surface activity of two-dimensional materials also provide a reliable basis for their application in probe technology. They can resist oxidation, chemical corrosion and thermal decay, ensuring the long-term stability and reliability of the probe tip. In summary, two-dimensional materials as coating materials for probe tips can not only improve the resolution and sensitivity of probe technology, but also expand its application potential in nanoelectronics, biomedicine and materials science.

[0005] However, with the increasing requirements for accuracy and resolution, the shortcomings of existing probe tip preparation technologies have begun to emerge. Traditional methods, including electron beam exposure, focused ion beam etching, and chemical vapor deposition (CVD), although effective in specific cases, face many challenges in practical applications. For example, the CVD method may damage the probe tip due to high temperature and has high transfer costs. Moreover, these techniques usually require expensive equipment and complex operating procedures, limiting their popularity in conventional laboratories. In addition, they have difficulties in achieving uniform coverage over large areas, which may lead to inconsistencies in probe tip performance, thereby affecting the accuracy and repeatability of measurements.

[0006] Existing technologies also face challenges in preparing probe tips with specific shapes or sizes, making it difficult to meet the precise requirements of specific applications. The wear resistance and stability of the probe tip are not sufficient to cope with long-term and intensive use, which is particularly evident in complex environments and high-intensity operations. Insufficient mechanical strength, especially in the face of mechanical stress or vibration, may limit the reliability and life of the probe tip. In addition, existing probe tips typically have fixed sizes and shapes, which are difficult to customize and optimize according to specific needs. Surface properties, such as roughness and chemical properties, may not be ideal, which may affect the interaction between the probe tip and the sample surface and the accuracy of the measurement results.

[0007] In view of these challenges, it is particularly important to develop new probe tip preparation technologies. Such new technologies will improve the durability, mechanical strength, shape customization, surface property optimization and application diversity of probe tips. This will not only address the limitations of existing technologies, but will also promote the widespread application and further development of probe technology in the fields of nanotechnology and materials science to meet the growing demand for high precision and high resolution. Summary of the invention

[0008] The technical problem solved by the present application is: how to provide a method for preparing a probe tip structure wrapped with a two-dimensional material which is easy to operate, has uniform coverage, and can adapt to tips of different shapes.

[0009] The present application provides a method for preparing a probe tip structure wrapped with a two-dimensional material, the preparation method comprising:

[0010] Exfoliation from bulk 2D materials to obtain single-layer 2D materials;

[0011] Performing ultrasonic dispersion treatment on the single-layer two-dimensional material to obtain a two-dimensional material suspension;

[0012] The probe tip is immersed in the two-dimensional material suspension to form a two-dimensional material thin layer on the surface of the probe tip.

[0013] Optionally, the method of stripping a single-layer two-dimensional material from a bulk two-dimensional material is to strip a single-layer two-dimensional material from a bulk two-dimensional material using an electrochemical stripping method.

[0014] Optionally, the method of performing ultrasonic dispersion treatment on the single-layer two-dimensional material to obtain a two-dimensional material suspension comprises:

[0015] The single-layer two-dimensional material is added into a predetermined solvent and subjected to ultrasonic treatment to obtain a two-dimensional material suspension.

[0016] Optionally, the preparation method further comprises:

[0017] The probe tip is taken out from the two-dimensional material suspension and dried.

[0018] Optionally, the drying method comprises:

[0019] The probe tip removed from the two-dimensional material suspension is dried using a nitrogen gun with a predetermined gas flow rate.

[0020] The present application also provides a probe tip structure wrapped with a two-dimensional material, and the probe tip structure wrapped with a two-dimensional material is prepared according to the above-mentioned preparation method.

[0021] The present application provides a method for preparing a probe tip structure wrapped with a two-dimensional material and a method for preparing the same, which have the following technical effects:

[0022] This method is easier to operate and does not require complex high temperature and high vacuum conditions, thus reducing equipment and operating costs. Secondly, through electrochemical stripping and ultrasonic dispersion technology, high-quality two-dimensional material suspensions can be obtained to ensure uniform coverage and material stability at the probe tip. Thirdly, this method has high adaptability and can flexibly handle probe tips of different shapes and sizes to meet the requirements of specific applications. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 A flowchart of a method for preparing a probe tip structure wrapped with a two-dimensional material according to one or more embodiments;

[0024] Figure 2 A schematic diagram of obtaining a single-layer two-dimensional material by electrochemical exfoliation according to one or more embodiments;

[0025] Figure 3 A schematic diagram of obtaining a two-dimensional material suspension by ultrasonic dispersion treatment according to one or more embodiments;

[0026] Figure 4 Schematic diagram of forming a thin layer of two-dimensional material at the tip of a probe according to one or more embodiments. DETAILED DESCRIPTION

[0027] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0028] Before describing the various embodiments of the present application in detail, the technical concept of the present application is briefly described first: the current probe tip preparation method has the problems of complex operation process, difficulty in achieving uniform coverage of a large area, and inability to adapt to tips of different shapes. To this end, the probe tip structure and preparation method of the two-dimensional material provided in the present embodiment are ultrasonically dispersed after peeling off the obtained single-layer two-dimensional material to obtain a two-dimensional material suspension, and then the probe tip is immersed in the two-dimensional material suspension to form a two-dimensional material thin layer on the surface of the probe tip. The operation process of this method is simple, and it can ensure that the two-dimensional material thin layer is uniformly covered on the tip surface, and the immersion method can adapt to tips of different sizes and shapes. The innovation of this method is to use liquid phase two-dimensional thin film technology to improve the uniformity and stability of coverage, while simplifying the preparation process and reducing costs. This technology can not only adapt to the shape and size requirements of various probe tips, but also has the advantages of high efficiency and high precision. Through the probe tip prepared by this method, the two-dimensional material can be uniformly and stably attached to the probe surface, significantly improving the resolution and sensitivity of the probe, and meeting the needs of high-resolution imaging and measurement. The specific principle of the preparation method of the probe tip structure of the two-dimensional material wrapped in the present application is described in combination with more embodiments.

[0029] Specifically, Figure 1 As shown, the method for preparing the probe tip structure wrapped with a two-dimensional material provided in the first embodiment includes the following steps:

[0030] Step S10: peeling off from the bulk two-dimensional material to obtain a single layer of two-dimensional material.

[0031] Step S20: performing ultrasonic dispersion treatment on the single-layer two-dimensional material to obtain a two-dimensional material suspension.

[0032] Step S30: immersing the probe tip in a two-dimensional material suspension to form a two-dimensional material thin layer on the surface of the probe tip;

[0033] Step S40: taking the probe tip out of the two-dimensional material suspension and performing a drying process.

[0034] In one or more embodiments, the method of stripping a single layer of two-dimensional material from a bulk two-dimensional material in step S10 is to strip a single layer of two-dimensional material from a bulk two-dimensional material using an electrochemical stripping method. Figure 2 As shown, a bulk two-dimensional material (such as hBN) is placed in an electrolyte solution, an appropriate potential and current density are set, the electrochemical stripping process is started, and the stripping time and conditions are controlled until a single layer of two-dimensional material is successfully stripped from the bulk two-dimensional material.

[0035] For example, when the single-layer two-dimensional material is subjected to ultrasonic dispersion treatment to obtain a two-dimensional material suspension in step S20, a solvent and an ultrasonic dispersion device are first prepared: a suitable solvent, such as deionized water or ethanol, is selected to ensure that it is compatible with the peeled two-dimensional material. An ultrasonic disperser is prepared, and appropriate frequency and power parameters are set. Then, an ultrasonic dispersion process is performed: Figure 3 As shown, the single-layer two-dimensional material obtained by electrochemical exfoliation is added to the selected solvent. The ultrasonic disperser is started to ultrasonically treat the solution to ensure that the ultrasonic wave can effectively disperse the single-layer two-dimensional material into a uniform and stable two-dimensional material suspension. Usually, the treatment time is 20-30 minutes.

[0036] For example, Figure 4 As shown, in step S30, the probe tip is immersed in the prepared two-dimensional material suspension. Ensure that the probe tip is completely immersed in the suspension, and the immersion time is usually 20-30 minutes to ensure that the two-dimensional material flakes can be evenly attached to the probe tip.

[0037] In one or more embodiments, the drying method of step S40 includes: drying the probe tip taken out from the two-dimensional material suspension using a nitrogen gun with a predetermined gas flow rate, wherein the predetermined gas flow rate is a very low flow rate to ensure that the two-dimensional material sheet at the probe tip is stable and dried evenly.

[0038] The application process of the above preparation method is described below with two specific examples.

[0039] Example 1: Preparation of graphene-coated AFM probe

[0040] Step 1: Preparation

[0041] Prepare the working electrode (graphite block) and electrolyte solution (0.1 M sulfuric acid solution) required for electrochemical stripping. Clean and handle all experimental equipment and reagents to ensure no contamination.

[0042] Step 2: Electrochemical Stripping

[0043] Place the graphite block in a 0.1M sulfuric acid solution. Fix the graphite block as the cathode on a platinum clip and the platinum sheet as the anode. Set the appropriate potential (usually between 2 and 3V) and current density (usually between 0.1 and 0.5mA / cm 2 The electrochemical stripping process begins, which generally takes tens of minutes to several hours (determined by the specific current density potential). The stripping time and conditions are controlled until the desired graphene monolayer is successfully stripped.

[0044] Step 3: Preparation of stable suspension by ultrasonic dispersion

[0045] Select deionized water as the solvent. Prepare an ultrasonic disperser and set appropriate frequency and power parameters. Add the graphene sheets obtained by electrochemical exfoliation to deionized water. Start the ultrasonic disperser and ultrasonicate the solution for 30 minutes to ensure that the graphene is evenly dispersed into a stable suspension.

[0046] Step 4: Soaking the probe tip

[0047] Soak the probe tip: Soak the AFM tip in the prepared graphene suspension. Make sure the probe tip is completely immersed in the suspension and let it sit for 20-30 minutes to ensure that the graphene flakes can evenly adhere to the probe tip.

[0048] Step 5: Drying of Nanoprobes

[0049] Dry the probe: Take out the soaked probe and dry it with a nitrogen gun at a very low gas flow rate to ensure that the graphene flake covering the probe tip is stable and dried evenly.

[0050] Example 2: Preparation of MoS2-coated SNOM probe

[0051] Step 1: Preparation

[0052] Electrode and electrolyte solution preparation: Prepare the working electrode and electrolyte solution required for electrochemical stripping. Dissolve tetrabutylammonium tetrafluoroborate (TBABF4) in propylene carbonate (PC) to prepare an electrolyte solution with a concentration of 0.05 M. Ensure that all experimental equipment and reagents are thoroughly cleaned and handled to avoid any contamination.

[0053] Step 2: Electrochemical Stripping

[0054] Bulk stripping: Place the MoS2 bulk in an electrolyte solution. Use the MoS2 bulk as the cathode and fix it on a platinum clip, with the platinum sheet as the anode. Set appropriate potential (generally -5 to 10 V) and current density (generally 0.1 to 10 mA / cm 2 ), the electrochemical stripping process begins, which generally takes tens of minutes or hours. The stripping time and conditions are controlled until the desired MoS2 flakes are successfully stripped.

[0055] Step 3: Preparation of stable suspension by ultrasonic dispersion

[0056] Select ethanol as the solvent. Prepare an ultrasonic disperser and set appropriate frequency and power parameters. Add the MoS2 flakes obtained by electrochemical exfoliation to ethanol. Start the ultrasonic disperser and sonicate the solution for 30 minutes to ensure that the MoS2 is evenly dispersed into a stable suspension.

[0057] Step 4: Soaking the probe tip

[0058] Soak the probe tip: Soak the SNOM tip in the prepared MoS2 suspension. Make sure the probe tip is completely immersed in the suspension for 20-30 minutes to ensure that the MoS2 flakes can be evenly attached to the probe tip.

[0059] Step 5: Drying of Nanoprobes

[0060] Dry the probe: Take out the soaked probe and dry it with a nitrogen gun at a very low gas flow rate to ensure that the MoS2 cover on the probe tip is stable and dried evenly.

[0061] The probe tip structure wrapped with two-dimensional materials and the preparation method thereof provided in this embodiment have the following technical effects: First, the liquid phase method has obvious advantages over traditional vapor deposition (such as chemical vapor deposition, CVD), because it does not require high temperature or high vacuum conditions, is easier to operate, and has lower equipment costs, thereby reducing initial investment and operating costs and improving the convenience of operation. Secondly, through electrochemical stripping and ultrasonic dispersion technology, a high-quality two-dimensional material suspension can be obtained to ensure the coverage uniformity and material stability of the probe tip. Thirdly, the method has high adaptability and can flexibly handle probe tips of different shapes and sizes to meet the requirements of specific applications. Finally, the simplified preparation process makes the method more economical and operational, and is expected to promote the further development of probe technology in nanoscale measurement and application, and bring new possibilities for scientific research and industrial applications.

[0062] The specific implementation methods of the present application are described in detail above. Although some embodiments have been shown and described, those skilled in the art should understand that these embodiments can be modified and improved without departing from the principles and spirit of the present application whose scope is defined by the claims and their equivalents. These modifications and improvements should also be within the scope of protection of the present application.

Claims

1. A method for preparing a probe tip structure wrapped with a two-dimensional material, characterized in that: The preparation method comprises: Exfoliation from bulk 2D materials to obtain single-layer 2D materials; Performing ultrasonic dispersion treatment on the single-layer two-dimensional material to obtain a two-dimensional material suspension; The probe tip is immersed in the two-dimensional material suspension to form a two-dimensional material thin layer on the surface of the probe tip.

2. The method for preparing a probe tip structure wrapped with a two-dimensional material according to claim 1, characterized in that: The method for obtaining a single-layer two-dimensional material by stripping from a bulk two-dimensional material is to obtain a single-layer two-dimensional material by stripping from a bulk two-dimensional material using an electrochemical stripping method.

3. The method for preparing a probe tip structure wrapped with a two-dimensional material according to claim 1, characterized in that: The method of performing ultrasonic dispersion treatment on the single-layer two-dimensional material to obtain a two-dimensional material suspension comprises: The single-layer two-dimensional material is added into a predetermined solvent and subjected to ultrasonic treatment to obtain a two-dimensional material suspension.

4. The method for preparing a probe tip structure wrapped with a two-dimensional material according to claim 1, characterized in that: The preparation method further comprises: The probe tip is taken out from the two-dimensional material suspension and dried.

5. The method for preparing a probe tip structure wrapped with a two-dimensional material according to claim 4, characterized in that: The drying method comprises: The probe tip removed from the two-dimensional material suspension is dried using a nitrogen gun with a predetermined gas flow rate.

6. A probe tip structure wrapped with a two-dimensional material, characterized in that: The probe tip structure wrapped with a two-dimensional material is prepared by the preparation method according to any one of claims 1 to 5.

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