Chip pin type automatic identification method and system, and storage medium

Abstract

The invention relates to the technical field of chip pin identification, and discloses a chip pin type automatic identification method and system and a storage medium, and the method comprises the steps: a to-be-tested chip pin is connected with an array circuit in sequence; sequentially controlling the on-off of the array circuits connected with the chip pins, and collecting corresponding current signals passing through the chip pins; analyzing the voltage of the collected current signal, and determining the type of the chip pin; according to the method, the pins of different chips are tested, the types of the pins are determined, automatic identification can be carried out only by connecting the pins of the chips, the operation is simple, and the applicability is high.

Description

Technical Field

[0001] The present invention relates to the technical field of chip pin identification, and in particular to a chip pin type automatic identification method, system and storage medium. Background Art

[0002] Existing chip pin identification methods mainly rely on appearance feature recognition, reference pin numbers, reference specific marks, and physical identification observation. The chip pin testing methods include offline testing, that is, using a multimeter to measure the positive and reverse voltage tests between each pin and the ground pin; online testing, that is, using a multimeter to detect the DC resistance of each IC pin in the circuit, the AC and DC voltage to ground, and the total working current; frequency testing, testing the output frequency of the chip's specified pins, common ones include oscillation end, test end, COM pin, SEG pin output frequency tests; coplanarity testing, involving the detection of vertical height deviation of surface mounted component pins, that is, the vertical distance between the horizontal plane formed by the highest pin sole and the horizontal plane formed by the lowest pin sole, and its value is generally not greater than the pin thickness; pin conductivity testing, including pin voltage testing, pin resistance testing, pin capacitance testing, pin switch testing, etc. These test steps need to be performed manually in sequence, and the test results need to be repeatedly and carefully checked, which is inefficient. Summary of the invention

[0003] In view of the deficiencies in the prior art, the present invention aims to provide a method, system and storage medium for automatically identifying chip pin types.

[0004] In order to achieve the above object, the present invention provides the following technical solutions: A method for automatically identifying chip pin types, comprising the steps of: The pins of the chip to be tested are connected to the array circuit in sequence; Control the on and off of the array circuits connected to the chip pins in sequence, and collect the corresponding current signals passing through each chip pin; The voltage of the collected current signal is analyzed to determine the type of chip pin.

[0005] In the present invention, preferably, when controlling the array circuit to be turned on and off, only the array circuit corresponding to the chip pin currently being tested is turned on, and the remaining array circuits are grounded.

[0006] In the present invention, preferably, the specific analysis includes: When the received feedback voltage is less than 0.1V, determine the pin type is GND or GDD; When the received feedback voltage range is within 0.1V-1V, the pin type is further determined; When the received feedback voltage is greater than 1V, the pin type is determined to be an NC pin.

[0007] In the present invention, preferably, when the feedback voltage is in the range of 0.1V-1V, the remaining pins are grouped into two, current is passed through and voltage values ​​are collected, and the pin type is further determined based on the voltage values.

[0008] In the present invention, preferably, the pins of the chip to be tested are connected to the array circuit in sequence, and the corresponding relationship between the chip pin numbers and the serial numbers of the array circuits is determined.

[0009] In the present invention, preferably, before controlling the on and off of the array circuit connected to the chip pin, a reaction time is set, and the voltage feedback signal is collected according to the set reaction time.

[0010] A chip pin type automatic identification system includes a PMU chip and an array circuit that are communicatively connected. The array circuit includes a plurality of acquisition branches, wherein one of the acquisition branches includes a bidirectional switch. One side of the bidirectional switch is respectively connected to the PMU chip and a ground terminal, and the other side is connected together for connecting a pin of a chip to be tested.

[0011] In the present invention, preferably, the PMU chip includes a controller, a collector and a discriminator, the controller is used to control the opening and closing state of the bidirectional switch, the collector is used to collect the current signal in the corresponding chip pin, the discriminator determines the corresponding chip pin type according to the voltage value of the collected current signal, the discriminator returns the determined pin type to the controller, and the controller records the pin type under the label of the corresponding pin.

[0012] Compared with the prior art, the present invention has the following beneficial effects: The present invention tests the pins of different chips and determines the types of the pins. The chip pins only need to be connected for automatic identification. The operation is simple and the applicability is strong. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 The present invention is a flowchart of a method for automatically identifying chip pin types.

[0014] Figure 2 It is a partial structural schematic diagram of the array circuit described in the present invention. DETAILED DESCRIPTION

[0015] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0016] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which the present invention belongs. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0017] See also Figure 1 A preferred embodiment of the present invention provides a chip pin type automatic identification method, which is mainly used to test the pins of different chips and determine the pin types. It only needs to connect the chip pins to perform automatic identification. The operation is simple and the applicability is strong. Specifically, the steps include: The pins of the chip to be tested are connected to the array circuit in sequence; Control the on and off of the array circuits connected to the chip pins in sequence, and collect the corresponding current signals passing through each chip pin; The voltage of the collected current signal is analyzed to determine the type of chip pin.

[0018] In this embodiment, when controlling the on and off of the array circuit, only the array circuit corresponding to the chip pin currently being tested is turned on, and the remaining array circuits are grounded.

[0019] In this embodiment, the specific analysis includes: When the received feedback voltage is less than 0.1V, determine the pin type is GND or GDD; When the received feedback voltage range is within 0.1V-1V, the pin type is further determined; When the received feedback voltage is greater than 1V, the pin type is determined to be an NC pin.

[0020] When the feedback voltage is within the range of 0.1V-1V, current is passed through the remaining pins in groups of two and the voltage values ​​are collected, and the pin type is further determined based on the voltage values.

[0021] Specifically, the remaining two pins are divided into a group, with one pin FIMV and the other pin grounded. When the received feedback voltage is less than 0.1V, the two pins are determined to be the same group; when the received feedback voltage is greater than 1V, the two pins are determined to be independent IO pins.

[0022] In this embodiment, the pins of the chip to be tested are connected to the array circuit in sequence, and the corresponding relationship between the chip pin numbers and the serial numbers of the array circuits is determined.

[0023] In this embodiment, before controlling the on and off of the array circuit connected to the chip pin, a reaction time is set, and the voltage feedback signal is collected according to the set reaction time.

[0024] See also Figure 2 Another preferred embodiment of the present invention provides a chip pin type automatic identification system, including a PMU chip and an array circuit that are communicatively connected, wherein the array circuit includes a plurality of acquisition branches, wherein one of the acquisition branches includes a bidirectional switch, wherein one side of the bidirectional switch is respectively connected to the PMU chip and the ground terminal, and the other side is connected together for connecting to a pin of the chip to be tested.

[0025] In this embodiment, the PMU chip includes a controller, a collector and a discriminator. The controller is used to control the opening and closing state of the bidirectional switch. The collector is used to collect the current signal in the corresponding chip pin. The discriminator determines the corresponding chip pin type based on the voltage value of the collected current signal. The discriminator returns the determined pin type to the controller, and the controller records the pin type under the label of the corresponding pin.

[0026] In some other preferred embodiments of the present invention, a computer-readable storage medium is provided, storing a computer program. When the computer program is executed by a processor, the processor executes the steps of the method described in the above embodiment.

[0027] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc., which can store program codes.

[0028] The above description is a detailed description of the preferred feasible embodiments of the present invention, but the embodiments are not intended to limit the scope of the patent application of the present invention. All equivalent changes or modified changes completed under the technical spirit suggested by the present invention should fall within the patent scope covered by the present invention.

Claims

1. A method for automatically identifying chip pin types, characterized in that: Includes steps: The pins of the chip to be tested are connected to the array circuit in sequence; Control the on and off of the array circuits connected to the chip pins in sequence, and collect the corresponding current signals passing through each chip pin; The voltage of the collected current signal is analyzed to determine the type of chip pin.

2. A chip pin type automatic identification method according to claim 1, characterized in that: When controlling the on and off of the array circuit, only the array circuit corresponding to the chip pin currently being tested is turned on, and the remaining array circuits are grounded.

3. A chip pin type automatic identification method according to claim 2, characterized in that: The specific analysis includes: When the received feedback voltage is less than 0.1V, determine the pin type is GND or GDD; When the received feedback voltage range is within 0.1V-1V, the pin type is further determined; When the received feedback voltage is greater than 1V, the pin type is determined to be an NC pin.

4. The method for automatically identifying chip pin types according to claim 1, characterized in that: When the feedback voltage is within the range of 0.1V-1V, current is passed through the remaining pins in groups of two and the voltage values ​​are collected, and the pin type is further determined based on the voltage values.

5. A chip pin type automatic identification method according to claim 4, characterized in that: The pins of the chip to be tested are connected to the array circuit in sequence, and the corresponding relationship between the chip pin numbers and the serial numbers of the array circuits is determined.

6. The method for automatically identifying chip pin types according to claim 1, characterized in that: Before controlling the on and off of the array circuit connected to the chip pin, a reaction time is set, and the voltage feedback signal is collected according to the set reaction time.

7. A system for implementing the chip pin type automatic identification method according to any one of claims 1 to 6, characterized in that: It includes a PMU chip and an array circuit that are communicatively connected. The array circuit includes a plurality of acquisition branches, wherein one of the acquisition branches includes a bidirectional switch. One side of the bidirectional switch is respectively connected to the PMU chip and the ground terminal, and the other side is connected together for connecting a pin of the chip to be tested.

8. The chip pin type automatic identification system according to claim 7, characterized in that: The PMU chip includes a controller, a collector and a discriminator. The controller is used to control the on and off state of the bidirectional switch. The collector is used to collect the current signal in the corresponding chip pin. The discriminator determines the corresponding chip pin type based on the voltage value of the collected current signal. The discriminator returns the determined pin type to the controller, and the controller records the pin type under the label of the corresponding pin.

9. A storage medium, characterized in that: A computer program is stored, and when the computer program is executed by a processor, the processor executes the steps of a chip pin type automatic identification method as described in any one of claims 1 to 6.

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