Atomic scale deformation field two-gradient decoupling method based on geometric phase analysis

Through geometric phase analysis technology, the displacement field of crystal materials is decomposed, the problem of microscopic defect analysis is solved, the in-depth understanding of the microscopic structure evolution and macroscopic performance regulation of crystal materials is achieved, and the research and development of new high-performance materials is promoted.

CN119273634AActive Publication Date: 2025-01-07INST OF MECHANICS CHINESE ACAD OF SCI
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Patent Information

Application Number
CN202411300739.4
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-09-18
Publication Date
2025-01-07
Estimated Expiration
2044-09-18

AI Technical Summary

Technical Problem

Existing microdefect analysis techniques for crystal materials are difficult to effectively decompose and analyze components of the displacement field, especially at the micro-nanometer scale, and it is impossible to deeply understand the microstructure evolution and macro-performance regulation of materials.

Method used

Using two-term gradient decoupling method of atomic scale deformation field based on geometric phase analysis, the decomposition of displacement fields into first-order affine displacement gradient tensor and second-order non-imitation through Fourier transform and inverse transform of high-resolution transmission electron microscope images The fibre displacement gradient tensor is further decomposed into three basic localized events: body swelling, shearing and rotation, and analyzes the atomic motion pattern.

Benefits of technology

It has achieved an in-depth understanding of the evolution mechanism of microscopic defects in crystal materials, overcomes the analytical difficulties of atomic motion complexity and multiple defect interactions, and provides cross-scale deformation mechanisms to help material design and research and development of new high-performance materials.

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Abstract

The invention provides an atomic scale deformation field two-gradient decoupling method based on geometric phase analysis. The method comprises the following steps: (1) obtaining original data after crystal deformation through a high-resolution transmission electron microscope image; (2) performing Fourier transform on the original data to obtain reciprocal space information, selecting diffraction spots in the reciprocal space information of different crystal orientations to perform inverse Fourier transform to obtain phase information of a local lattice, and obtaining an atomic displacement field in a crystal grain based on the phase information; (3) decomposing the atomic displacement field into a first-order affine displacement gradient tensor and a second-order non-affine displacement gradient tensor, and respectively decomposing the first-order affine displacement gradient tensor and the second-order non-affine displacement gradient tensor to obtain deformation components of respective basic localization events; and (4) defining the participation degree of the atomic scale basic localization event, and analyzing the atomic scale physical mechanism of microdefect evolution. The method is reasonable in conception, and can effectively solve the multi-scale problem of regulation and control of macroscopic performance by a current material microscopic evolution mechanism.
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