Chip taking and observing device of integrated circuit test braider and braider thereof

Abstract

The invention discloses a chip taking observation device of an integrated circuit test braiding machine and the braiding machine thereof, relates to the technical field of test braiding machines, and has the advantage that after a taking observer observes a damaged chip, the damaged chip can be moved out of a packaging tape without manually moving the taking observer. According to the technical scheme, the chip taking device is characterized in that the chip taking device comprises a vertical stand column and a fixing rod which are located on one side of a packaging belt conveying device, the stand column is provided with a taking observer right opposite to a chip on a packaging belt, the fixing rod is provided with a transverse rod, and the transverse rod is provided with an air cylinder located on one side of the taking observer; a piston rod of the air cylinder extends to the lower end of the transverse rod and is connected with a suction cup, and the suction cup is located over the packaging tape chip.

Description

Technical Field

[0001] The invention relates to the technical field of test tape machines, in particular to a chip material taking and observing device of an integrated circuit test tape machine and the tape machine thereof. Background Art

[0002] The IC test tape machine is a device used in the production line of electronic components to perform corresponding inspection, direction change and test operations on electronic components. Chips are a type of electronic components. Chips are a general term for semiconductor component products. After the above operations, the chips are sent into the packaging tape.

[0003] The Chinese patent application number CN202110098561.X discloses a flipping and taping device for an integrated circuit test taping machine: it includes a fuselage, a workbench is obliquely installed on the fuselage, a flipping mechanism is arranged in the middle of the chip conveying track on the workbench, a transverse packaging belt is arranged at the inclined lower end of the workbench, and a cam suction mechanism is arranged at the end of the transverse packaging belt close to the chip conveying track of the workbench, and a material picking and observation device is arranged on the fuselage beside the transverse packaging belt, and the material picking and observation device includes a support column, an optical inspection bracket is slidably connected to the support column, the support column is screwed to the side of the packaging belt conveyor, and a vertical connecting column is slidably connected to the outer end of the optical inspection bracket, and a material picking observer is installed at the bottom of the connecting column, and the moving chip is observed through the material picking observer, and the straight pin shaft is clamped in the longitudinal or transverse groove of the cross slot as needed to realize the removal and movement of the material picking observer at the bottom of the connecting column.

[0004] When the material picking observer observes that a damaged chip is required, it does not disclose how to change the longitudinal or lateral position of the pin shaft in the cross slot. Therefore, if the pin shaft needs to be moved manually and the material picking observer is removed to take out the damaged chip, the production efficiency is affected. Therefore, the present invention provides a solution. Summary of the invention

[0005] In view of the above-mentioned technical deficiencies, the purpose of the present invention is to provide a chip material removal and observation device for an integrated circuit test taping machine and its taping machine, which has the advantage that after a damaged chip is observed by a material removal observer, the damaged chip can be removed from the packaging tape without manually moving the material removal observer.

[0006] In order to solve the above technical problems, the present invention adopts the following technical solutions: The present invention provides a chip material picking and observing device for an integrated circuit test tape machine, comprising a vertical column and a fixed rod located on one side of a packaging tape conveyor, wherein the column is provided with a material picking and observing device facing the chip on the packaging tape, the fixed rod is provided with a cross bar, the cross bar is provided with a cylinder located on one side of the material picking and observing device, the piston rod of the cylinder extends to the lower end of the cross bar and is connected with a suction cup, and the suction cup is located directly above the chip on the packaging tape.

[0007] By adopting the above technical solution, the chips on the packaging belt pass through the material picker observer one by one, and the moving chips are observed by the material picker observer. When it is detected that the chip on the packaging belt is damaged, the packaging belt drives the chip to continue to move directly under the suction cup, so that the cylinder drives the suction cup to remove the damaged chip. The damaged chip can be removed from the packaging belt without manually moving the material picker observer.

[0008] Preferably, the cross bar is provided with an extension rod extending horizontally toward the direction of the material observer, the column is slidably connected with a slider along the vertical direction of the column, the material observer is arranged on the slider, the column is provided with a block located below the slider and limiting the movement of the slider, when the block collides with the slider, the material observer moves to the position of the detection chip, and the extension rod is provided with a driving member for driving the slider to move up and down.

[0009] Preferably, the extension rod is a rectangular rod, the driving member comprises a guide rail 1 arranged on a vertical side surface of the extension rod 1, an L-shaped slide plate 1 is slidably connected to the guide rail 1, the vertical portion of the slide plate 1 is slidably connected to the guide rail 1, the horizontal portion extends in a direction away from the extension rod, and a driving plate extending in the direction of the slider is fixedly provided on the horizontal portion of the slide plate 1, after the slider contacts the block, a block extends from one side of the slider, and the lower end surface of the slider extending out is set as an inclined surface, the higher end of the inclined surface is close to the driving plate, and the driving plate has a boss, and the boss is provided with an inclined driving surface matching the inclined surface; The extension rod is provided with a power part that drives the slide plate to slide on the guide rail. When the boss moves to the lower end of the inclined surface, the material picker observer moves upward to the highest position, and the extension rod is provided with a picking part that picks up the chip facing the material picker observer, and the suction cup and the cylinder are included in the picking part.

[0010] Preferably, the picking up member includes a second guide rail which is arranged on the side wall of the extension rod and is opposite to and parallel to the first guide rail. An L-shaped slide plate is slidably connected to the second guide rail. The vertical portion of the second slide plate is slidably connected to the second guide rail, and the horizontal portion extends away from the extension rod. The horizontal portion of the second slide plate is fixedly provided with a picking up plate extending in the direction of the material picking observer, and the cylinder is arranged at one end of the picking up plate away from the second slide plate.

[0011] Preferably, the power member includes a pulley 1 rotatably arranged on the opposite side walls of the extension rod and located below the guide rail 1 and the guide rail 2, the number of the pulleys 1 is set to two and they are respectively arranged below the guide rail 1 or the guide rail 2, the lower end face of the extension rod is provided with a downwardly extending mounting plate, the mounting plate is rotatably connected to the pulley 2 on the two side surfaces facing each other, two downwardly extending fixing plates are provided below the mounting plate, the two fixing plates are rotatably connected to the pulley 3 on the two side surfaces facing each other, the two pulleys 1 located below the guide rail 1 or the guide rail 2, one pulley 2 and one pulley 3 are connected by an endless belt, the two fixing plates are provided with motors for driving the pulley 3 to rotate, and the lower ends of the vertical parts of the slide plate 1 and the slide plate 2 are fixedly connected to the corresponding endless belts.

[0012] Preferably, the pulley three is rotatably connected to the fixed plate via a rotating shaft, the motor is arranged on the fixed plate and is located on one side of the pulley three, the rotating shaft of the motor passes through the fixed plate and is coaxially fixedly connected to a driving gear at one end thereof, and the rotating shaft is provided with a driven gear meshing with the driving gear.

[0013] Preferably, the two pulleys three are distributed opposite to each other.

[0014] Preferably, one end of the picking plate is rotatably connected to the second slide plate, and the upper end surface of the horizontal portion of the second slide plate is provided with a motor for driving the picking plate to rotate.

[0015] Preferably, a reinforcing rod is provided between the crossbar and the column.

[0016] Another object of the present invention is to provide an integrated circuit test taping machine.

[0017] The beneficial effect of the present invention is that the chips on the packaging belt pass through the material picker observer one by one, and the moving chips are observed by the material picker observer. When it is detected that the chip on the packaging belt is damaged, the packaging belt drives the chip to continue to move directly under the suction cup, so that the cylinder drives the suction cup to remove the damaged chip. The damaged chip can be removed from the packaging belt without manually moving the material picker observer. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0019] Figure 1 It is a structural schematic diagram of this embodiment; Figure 2This is a schematic diagram of the structure of the packaging belt passing under the material taking observer in this embodiment; Figure 3 It is a schematic diagram of the structure of the endless belt in this embodiment.

[0020] Description of reference numerals: In the figure: 1, column; 11, fixed rod; 12, material pick-up observer; 13, cross bar; 131, cylinder; 132, suction cup; 133, extension rod; 134, slider; 135, block; 136, slide plate 1; 137, drive plate; 1371, boss; 1372, drive surface; 138, slide plate 2; 1381, pick-up plate; 14, pulley 1; 141, mounting plate; 142, pulley 2; 143, fixed plate; 144, pulley 3; 145, endless belt; 146, motor; 147, rotating shaft; 148, driven gear; 15, electric motor; 16, reinforcing rod; 2, packaging belt; 21, chip; 22, guide plate; 23, observation slot. DETAILED DESCRIPTION

[0021] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0022] A chip material observation device for an integrated circuit test tape machine, such as Figure 1 and Figure 2 , including a vertical column 1 and a fixing rod 11 located on one side of the packaging tape 2 conveying device, and a material picker 12 facing the chip 21 on the packaging tape 2 is provided on the column 1. The material picker 12 is an existing structure. The Chinese patent application number CN202110098561.X discloses a structure of a material picker in a flipping tape device of an integrated circuit test tape machine. At this time, the column 1 and the fixing rod 11 are arranged in a Chinese patent application number CN202110098561.X discloses a structure of a material picker in a flipping tape device of an integrated circuit test tape machine. On the workbench, a guide plate 22 for the packaging belt 2 to pass through can be set on the workbench. The guide plate 22 is provided with an observation slot 23 facing the material picker observer 12. The observation slot 23 is just convenient for the material picker observer 12 to observe a chip 21 below. A cross bar 13 is provided on the fixed rod 11. The cross bar 13 is provided with a cylinder 131 located on one side of the material picker observer 12. The piston rod of the cylinder 131 extends to the lower end of the cross bar 13 and is connected to a suction cup 132. The suction cup 132 is located directly above the chip 21 of the packaging belt 2. At this time, the packaging belt 2 passes through the material picker observer 12 first and then passes through the suction cup 132.

[0023] like Figure 1 and Figure 2 The chips 21 on the packaging belt 2 pass through the material picker observer 12 one by one in turn, and the moving chips 21 are observed by the material picker observer 12. When it is detected that the chip 21 on the packaging belt 2 is damaged, the packaging belt 2 drives the chip 21 to continue to move directly under the suction cup 132, so that the cylinder 131 drives the suction cup 132 to remove the damaged chip 21. The damaged chip 21 can be removed from the packaging belt 2 without manually moving the material picker observer 12.

[0024] like Figure 1 and Figure 2 The upper end of the column 1 is directly opposite to the observation port of the material observer 12, and the camera device can be an existing camera to transmit the picture taken from the observation port.

[0025] like Figure 1 and Figure 2 Another structure for removing the chip 21 observed by the material picker and observer 12 is as follows: an extension rod 133 extending horizontally toward the material picker and observer 12 is provided on the crossbar 13, a slider 134 is connected to the column 1 in a vertical direction of the column 1, and one end of the extension rod 133 passes through the bottom of the slider 134. At this time, two fixed rods 11 are provided, and the two fixed rods 11 are respectively located on both sides of the column 1, and each fixed rod 11 has a crossbar 13, and the two ends of the extension rod 133 are respectively fixedly connected to the two ends of the two crossbars 13. The material picker and observer 12 is set on the slider 134, and the column 1 is provided with a block 135 located below the slider 134 and limiting the movement of the slider 134. When the block 135 conflicts with the slider 134, the material picker and observer 12 moves to the position of the detection chip 21, and the extension rod 133 is provided with a driving member for driving the slider 134 to move up and down. A reinforcing rod 16 is provided between the crossbar 13 and the column 1 to strengthen the overall structure.

[0026] like Figure 1 and Figure 2 The extension rod 133 is a rectangular rod, and the driving member includes a guide rail 1 (not shown in the figure) arranged on the vertical side of the extension rod 133. The length direction of the guide rail 1 is distributed along the length direction of the extension rod 133. An L-shaped slide plate 136 is slidably connected to the guide rail 1. The vertical part of the slide plate 136 is slidably connected to the guide rail 1, and the horizontal part extends away from the extension rod 133. A driving plate 137 extending toward the direction of the slider 134 is fixedly provided on the horizontal part of the slide plate 136. After the slider 134 contacts the block 135, the block 135 extends from one side of the slider 134, and the lower end surface of the slider 134 is set as an inclined surface, and the higher end of the inclined surface is close to the driving plate 137. The driving plate 137 has a boss 1371, and the boss 1371 is provided with an inclined driving surface 1372 matching the inclined surface. like Figure 1and Figure 2 The extension rod 133 is provided with a power part that drives the slide plate 136 to slide on the guide rail. When the boss 1371 moves to the lower end of the inclined surface, the material observer 12 moves upward to the highest position, and the extension rod 133 is provided with a picking part that picks up the material observer 12 facing the chip 21, and the suction cup 132 and the cylinder 131 are included in the picking part.

[0027] like Figure 1 and Figure 3 The picking up part includes a guide rail 2 (not shown in the figure) which is arranged on the side wall of the extension rod 133 and is opposite to and parallel to the guide rail 1. An L-shaped slide plate 138 is slidably connected to the guide rail 2. The vertical part of the slide plate 138 is slidably connected to the guide rail 2, and the horizontal part extends away from the extension rod 133. The horizontal part of the slide plate 138 is fixed with a picking up plate 1381 extending in the direction of the material picking observer 12, and the cylinder 131 is arranged at one end of the picking up plate 1381 away from the slide plate 138.

[0028] like Figure 1 and Figure 3 The working principle of the driving part is as follows: when the chip 21 observed by the material picking observer 12 is damaged and needs to be removed, the packaging belt 2 does not drive the chips 21 to move out from under the material picking observer 12 one by one, that is, it stops moving, and the power part drives the slide plate 136 to move toward the slider 134 until the driving surface 1372 of the boss 1371 contacts the inclined surface of the slider 134, and then gradually pushes the slider 134 up. At this time, the material picking observer 12 gradually moves upward, so that the material picking observer 12 is away from the chip 21, and then the slide plate 2 138 slides on the guide rail 2, so that the cylinder 131 and the suction cup 132 move to the picking observer. Below the material observer 12, the cylinder 131 drives the suction cup 132 to move downward, thereby removing the chip 21 below the material observer 12, and then the cylinder 131 drives the suction cup 132 to move upward, and the slide plate 138 slides away from the material observer 12, thereby facilitating the suction cup 132 to move the chip 21 out of the packaging belt 2; then the power part drives the slide plate 136 to move away from the slider 134, so that the material observer 12 gradually descends until the slider 134 receives the limit of the block 135, so that the material observer 12 moves to the desired position, which is convenient for continued detection of the chip 21.

[0029] like Figure 1 and Figure 3The power member includes a pulley 14 rotatably arranged on the opposite side walls of the extension rod 133 and located below the guide rail 1 and the guide rail 2. The number of the pulleys 14 under the guide rail 1 or the guide rail 2 is set to two and they are respectively arranged below the guide rail 1 or the guide rail 2. The lower end surface of the extension rod 133 is provided with a downwardly extending mounting plate 141, and the mounting plate 141 is rotatably connected to the pulley 2 142 on the two side surfaces facing away from each other. Two downwardly extending fixing plates 143 are provided below the mounting plate 141, and the two fixing plates 143 are rotatably connected to the pulley 3 144 on the two side surfaces facing away from each other. The two pulleys 14, a pulley 2 142 and a pulley 3 144 located below the guide rail 1 or the guide rail 2 are connected by an annular belt 145. The two fixing plates 143 are provided with a motor 146 for driving the pulley 3 144 to rotate. The lower ends of the vertical parts of the slide plate 136 and the slide plate 2 138 are fixedly connected to the corresponding annular belt 145.

[0030] like Figure 1 and Figure 3 At this time, the motor 146 drives the pulley three 144 to rotate, and the arrangement of the two pulleys 1 14 and the one pulley 2 142 makes the side of the annular belt 145 close to the guide rails 1 and 2 parallel to the guide rails 1 and 2, and then the annular belt 145 drives the slide plate 136 or the slide plate 2 138 to move on the guide rails 1 and 2.

[0031] like Figure 1 and Figure 3 , the pulley 3 144 is rotatably connected to the fixed plate 143 through the rotating shaft 147, the motor 146 is arranged on the fixed plate 143 and is located on one side of the pulley 3 144, the rotating shaft of the motor 146 passes through the fixed plate 143 and is coaxially fixedly connected to a driving gear (not shown in the figure) at the passing end, and the rotating shaft 147 is provided with a driven gear 148 meshing with the driving gear, at this time, there is a gap between the driven gears 148 on the two rotating shafts 147, and there is also a gap between the driving gears on the motors 146 on the two fixed plates 143. Through the cooperation of the driven gear 148 and the driving gear, the motor 146 is placed on one side of the pulley 3 144, saving space.

[0032] like Figure 1 and Figure 3 , the two pulleys 3 144 are relatively distributed. The purpose is to save space.

[0033] like Figure 1 and Figure 3, one end of the picking plate 1381 is rotatably connected with the second slide plate 138, and the upper end surface of the horizontal part of the second slide plate 138 is provided with a motor 15 for driving the picking plate 1381 to rotate. When the picking plate 1381 picks up the chip 21, the length direction is parallel to the length direction of the driving plate 137. After the chip 21 is picked up, the motor 15 drives the picking plate 1381 to rotate 90° to move the damaged chip 21 picked up out of the packaging belt 2. A storage box for storing damaged chips 21 and a placement plate for storing stored chips 21 are placed on the workbench. The placement plate requires the picking plate 1381 to rotate 45° from the direction parallel to the driving plate 137. At this time, it is convenient for the picking part to absorb and place the new chip 21 on the packaging belt 2. At this time, the material picking observer 12 detects the new chip 21. After it is correct, the packaging bag continues to transmit the chip 21 out of the picking observer 12 one by one. At this time, it is ensured that after the damaged chip 21 on the packaging belt 2 is taken down, a new chip 21 can be added.

[0034] Embodiment 2: An integrated circuit test taping machine having the structure of the above-mentioned embodiment 1.

[0035] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

Claims

1. A chip material observation device for an integrated circuit test taping machine, characterized in that: The invention comprises a vertical column (1) and a fixed rod (11) located on one side of a packaging belt (2) conveying device, wherein the column (1) is provided with a material taking and observing device (12) facing the chip (21) on the packaging belt (2), the fixed rod (11) is provided with a cross bar (13), the cross bar (13) is provided with a cylinder (131) located on one side of the material taking and observing device (12), the piston rod of the cylinder (131) extends to the lower end of the cross bar (13) and is connected to a suction cup (132), and the suction cup (132) is located directly above the chip (21) on the packaging belt (2).

2. The chip material taking and observing device of the integrated circuit test taping machine as claimed in claim 1, characterized in that: The cross bar (13) is provided with an extension bar (133) extending horizontally in the direction of the material picking observer (12); the column (1) is slidably connected with a slider (134) along the vertical direction of the column (1); the material picking observer (12) is arranged on the slider (134); the column (1) is provided with a block (135) located below the slider (134) and limiting the movement of the slider (134); when the block (135) contacts the slider (134), the material picking observer (12) moves to the position of the detection chip (21); and the extension bar (133) is provided with a driving member for driving the slider (134) to move up and down.

3. The chip material taking and observing device of the integrated circuit test taping machine as claimed in claim 2, characterized in that: The extension rod (133) is a rectangular rod, and the driving member comprises a guide rail 1 arranged on a vertical side surface of the extension rod (133); an L-shaped slide plate 1 (136) is slidably connected to the guide rail 1; the vertical portion of the slide plate 1 (136) is slidably connected to the guide rail 1, and the horizontal portion extends in a direction away from the extension rod (133); and a driving plate (137) extending in a direction of the slider (134) is fixedly provided on the horizontal portion of the slide plate 1 (136); after the slider (134) contacts the clamping block (135), a clamping block (135) extends from one side of the slider (134); and the lower end surface of the slider (134) extending out is set as an inclined surface, and the higher end of the inclined surface is close to the driving plate (137); and the driving plate (137) has a boss (1371), and the boss (1371) is provided with an inclined driving surface (1372) matching the inclined surface; The extension rod (133) is provided with a power part for driving a slide plate (136) to slide on a guide rail. When the boss (1371) moves to the lower end of the inclined surface, the material picking observer (12) moves upward to the highest position, and the extension rod (133) is provided with a picking part for picking up the material picking observer (12) facing the chip (21). The suction cup (132) and the cylinder (131) are included in the picking part.

4. The chip material taking and observing device of the integrated circuit test taping machine as claimed in claim 3, characterized in that: The picking-up member comprises a second guide rail which is arranged on the side wall of the extension rod (133) and is opposite to and parallel to the first guide rail. The second guide rail is slidably connected to a second L-shaped slide plate (138). The vertical portion of the second slide plate (138) is slidably connected to the second guide rail, and the horizontal portion extends away from the extension rod (133). The horizontal portion of the second slide plate (138) is fixedly provided with a picking-up plate (1381) extending in the direction of the material picking observer (12). The cylinder (131) is arranged at one end of the picking-up plate (1381) away from the second slide plate (138).

5. The chip material taking and observing device of the integrated circuit test taping machine as claimed in claim 4, characterized in that: The power member comprises a pulley 1 (14) rotatably arranged on opposite side walls of the extension rod (133) and located below the guide rail 1 and the guide rail 2. The number of the pulley 1 (14) is set to two and they are respectively arranged below the guide rail 1 or the guide rail 2. The lower end surface of the extension rod (133) is provided with a mounting plate (141) extending downward. The mounting plate (141) is rotatably connected to the pulley 2 (142) on two side surfaces facing each other. Two fixing plates (143) extending downward are provided below the mounting plate (141). The two fixing plates (143) extend downward. The fixed plate (143) is rotatably connected to pulley three (144) on two opposite side surfaces, and two pulleys one (14), a pulley two (142) and a pulley three (144) located below the guide rail one or the guide rail two are connected by an annular belt (145). The two fixed plates (143) are provided with a motor (146) for driving the pulley three (144) to rotate, and the lower ends of the vertical parts of the slide plate one (136) and the slide plate two (138) are fixedly connected to the corresponding annular belt (145).

6. The chip material taking and observing device of the integrated circuit test tape machine as claimed in claim 5, characterized in that: The belt pulley three (144) is rotatably connected to the fixed plate (143) via a rotating shaft (147); the motor (146) is arranged on the fixed plate (143) and is located on one side of the belt pulley three (144); the rotating shaft of the motor (146) passes through the fixed plate (143) and is coaxially fixedly connected to a driving gear at one end of the passing end; and a driven gear (148) meshing with the driving gear is provided on the rotating shaft (147).

7. The chip material taking and observing device of the integrated circuit test tape machine as claimed in claim 6, characterized in that: The two pulleys three (144) are arranged relative to each other.

8. The chip material taking and observing device of the integrated circuit test tape machine as claimed in claim 4, characterized in that: One end of the picking plate (1381) is rotatably connected to the second slide plate (138), and the upper end surface of the horizontal portion of the second slide plate (138) is provided with a motor (15) for driving the picking plate (1381) to rotate.

9. The chip material taking and observing device of the integrated circuit test taping machine as claimed in claim 6 or 7, characterized in that: A reinforcing rod (16) is provided between the crossbar (13) and the upright column (1).

10. An integrated circuit test taping machine, characterized in that: A chip material taking and observing device of an integrated circuit test taping machine according to any one of claims 1 to 9.

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