Aging test system for LED lighting lamp

Abstract

The invention belongs to the field of lamp aging test, relates to a data analysis technology, is used for solving the problem that optimization decision analysis cannot be carried out when a basic test result is unqualified in the prior art, and particularly relates to an LED lighting lamp aging test system which comprises a basic test module, a basic feedback module, an adaptive analysis module and a storage module, the basic test module is in communication connection with the basic feedback module and the adaptation analysis module, the storage module is in communication connection with the basic test module, the basic feedback module and the adaptation analysis module, and the basic test module is used for carrying out basic aging test analysis on the LED lighting lamp; according to the invention, feedback analysis can be carried out on the basic optimization direction of the LED lighting lamp, when the overall basic test result is unqualified, the key influence factors of the unqualified overall basic test result are marked through the aging influence coefficient, and the corresponding production line optimization signal is generated, so that the optimization efficiency of the LED lighting lamp production line is improved.

Description

Technical Field

[0001] The invention belongs to the field of lamp aging test, relates to data analysis technology, and specifically is an aging test system for LED lighting lamps. Background Art

[0002] LED lamps may be affected by various factors during the production process, such as material quality, manufacturing process, etc. These factors may cause the product to become unstable in the early stage of use. Through aging testing, these problems can be discovered and solved before the product leaves the factory, avoiding users from encountering failures during use.

[0003] The invention patent with announcement number CN104142481B discloses a method for testing accelerated aging and life estimation of lamps. The test method sets photometric and chromaticity sensors on the lamp holder; the control device includes a main control unit, a photoelectric parameter analysis unit, a spectrometer and a switch control unit to complete the automated test of accelerated aging and life estimation of LED lamps; however, the method cannot perform optimization decision analysis when the basic test results are unqualified, resulting in low optimization efficiency of the LED lamp production line.

[0004] In view of the above technical problems, this application proposes a solution. Summary of the invention

[0005] The purpose of the present invention is to provide an aging test system for LED lighting fixtures, which is used to solve the problem that the prior art cannot perform optimized decision analysis when the basic test results are unqualified;

[0006] The technical problem to be solved by the present invention is: how to provide an aging test system for LED lighting fixtures that can perform optimized decision analysis when basic test results are unqualified.

[0007] The purpose of the present invention can be achieved through the following technical solutions:

[0008] A system for testing aging of LED lighting fixtures, comprising a basic test module, a basic feedback module, an adaptive analysis module and a storage module, wherein the basic test module is communicatively connected to the basic feedback module and the adaptive analysis module, and the storage module is communicatively connected to the basic test module, the basic feedback module and the adaptive analysis module;

[0009] The basic test module is used to perform basic aging test analysis on LED lighting fixtures: select several LED lighting fixtures from the samples undergoing aging test as basic test objects, retrieve the benchmark parameters of the basic test objects, set the test environment according to the benchmark parameters, and then connect the basic test objects to the test power supply, generate a basic test cycle with a duration of L1 hours, and divide the basic test cycle into several basic test time periods with a duration of L2 seconds, and obtain the basic coefficient JC of the basic test object at the end of the basic test time period; after the basic test cycle ends, sum and average the basic coefficients JC of the basic test object in all basic test time periods to obtain the basic performance value of the basic test object, and perform variance calculation on the basic coefficients JC of the basic test object in all basic test time periods to obtain the basic fluctuation value; and determine whether the overall basic test results of the batch of samples are qualified based on the basic performance value and the basic fluctuation value;

[0010] The basic feedback module is used to perform feedback analysis on the basic optimization direction of the LED lighting fixture and obtain an aging influence coefficient, and generate a performance optimization signal or an aging influence signal through the aging influence coefficient and send it to the mobile phone terminal of the manager;

[0011] The adaptability analysis module is used to analyze the adaptability performance of the LED lighting fixture.

[0012] Furthermore, the specific process of setting the test environment according to the basic parameters includes: the benchmark parameters include an applicable temperature range, an applicable humidity range, a standard brightness value and a standard color temperature value; the average value of the maximum value and the minimum value of the applicable temperature range is marked as the basic temperature value, and the average value of the maximum value and the minimum value of the applicable humidity range is marked as the basic humidity value; the air temperature value and the air humidity value in the test environment of the basic test object are set according to the basic temperature value and the basic humidity value.

[0013] Furthermore, the basic test period is composed of a test sub-period and an intermittent sub-period. The test power of the basic test object is turned on at the beginning of the test sub-period, and is disconnected at the beginning of the intermittent sub-period. At the end of the basic test period, the brightness deviation data LP and the color deviation data SP of the basic test object are obtained. The process of obtaining the brightness deviation data includes: obtaining the average brightness value of the basic test object in the test sub-period, and marking the absolute value of the difference between the average brightness value and the standard brightness value as the brightness deviation data LP; the process of obtaining the color deviation data SP includes: obtaining the average color temperature value of the basic test object in the test sub-period, and marking the absolute value of the difference between the average color temperature value and the standard color temperature value as the color deviation data SP; and numerically calculating the brightness deviation data LP and the color deviation data SP to obtain the basic coefficient JC.

[0014] Furthermore, the specific process of determining whether the overall basic test results of the batch of samples are qualified includes: marking the basic test objects as basic qualified objects or basic unqualified objects through the basic performance value and the basic fluctuation value; marking the ratio of the number of basic qualified objects to the number of basic test objects as a qualified coefficient, obtaining the qualified threshold through the storage module, and comparing the qualified coefficient with the qualified threshold: if the qualified coefficient is less than the qualified threshold, then the overall basic test results of the batch of samples are determined to be unqualified, a feedback analysis signal is generated and the feedback analysis signal is sent to the basic feedback module; if the qualified coefficient is greater than or equal to the qualified threshold, then the overall basic test results of the batch of samples are determined to be qualified, an adaptive analysis signal is generated and the adaptive analysis signal is sent to the adaptive analysis module.

[0015] Furthermore, the process of obtaining the aging influence coefficient includes: arranging all basic test time periods within the basic test cycle corresponding to the basic unqualified objects in order from small to large according to the basic coefficient JC value to obtain a basic sequence, marking the absolute value of the difference between the sequence number of the basic test time period in the basic sequence and the sequence number in the basic test cycle as the aging overlap value of the basic test time period, summing and averaging the aging overlap values ​​of all basic test time periods to obtain the aging overlap coefficient, marking the basic unqualified objects as aging-affected objects or performance-affected objects through the aging overlap coefficient; and marking the ratio of the number of aging-affected objects to the number of basic unqualified objects as the aging influence coefficient.

[0016] Furthermore, the specific process of marking a basic unqualified object as an aging-affected object or a performance-affected object includes: obtaining an aging overlap threshold through a storage module, and comparing an aging overlap coefficient with the aging overlap threshold: if the aging overlap coefficient is less than the aging overlap threshold, the corresponding basic unqualified object is marked as an aging-affected object; if the aging overlap coefficient is greater than or equal to the aging overlap threshold, the corresponding basic unqualified object is marked as a performance-affected object.

[0017] Furthermore, the specific process of the adaptation analysis module analyzing the adaptability performance of LED lighting fixtures includes: reselecting a number of LED lighting fixtures from the samples undergoing aging tests as adaptation test objects, randomly generating test environment parameters for the adaptation test objects, the test environment parameters including test temperature values ​​and test humidity values, the test temperature values ​​and test humidity values ​​being randomly selected from the applicable temperature range and the applicable humidity range, respectively; setting the air temperature value and the air humidity value in the test environment of the adaptation test object according to the test temperature value and the test humidity value, and then obtaining the basic coefficient JC of the adaptation test object in the same manner as the basic test process, performing variance calculation on the basic coefficients JC of all adaptation analysis objects to obtain an adaptation performance value, obtaining an adaptation performance threshold value through the storage module, comparing the adaptation performance value with the adaptation performance threshold value, and judging whether the overall adaptation test results of the batch of samples meet the requirements through the comparison results.

[0018] The present invention has the following beneficial effects:

[0019] 1. The basic test module can be used to perform aging test analysis on LED lighting fixtures. The basic coefficients of the basic test objects in all basic test periods are calculated in a periodic test manner. Then, the basic coefficients of all basic test periods are comprehensively analyzed to obtain the basic performance value and basic fluctuation value. According to the basic performance value and basic fluctuation value, the overall basic performance of the batch of samples is fed back, and different in-depth analysis processes are performed according to the overall basic performance judgment results.

[0020] 2. The basic feedback module can be used to conduct feedback analysis on the basic optimization direction of LED lighting fixtures. When the overall basic test results are unqualified, the aging influence coefficient is generated according to the distribution of the basic coefficients of the unqualified basic objects in the basic test cycle. The key influencing factors of the unqualified overall basic test results are marked by the aging influence coefficient, and the corresponding production line optimization signal is generated to improve the optimization efficiency of the LED lighting production line;

[0021] 3. The adaptability analysis module can be used to analyze the adaptability performance of LED lighting fixtures. The basic coefficients obtained by basic tests on all adaptability test objects under different test environments are comprehensively calculated to obtain the adaptability performance value. The overall adaptability performance of the batch of samples is evaluated based on the adaptability performance value. When the samples have quality abnormalities, further factor screening and optimization decision analysis are carried out to ensure the optimization effect of the LED lighting production line. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0023] Figure 1 It is a system block diagram of the present invention. DETAILED DESCRIPTION

[0024] The technical solution of the present invention will be clearly and completely described below in conjunction with the embodiments. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0025] like Figure 1 As shown, a system for testing aging of LED lighting fixtures includes a basic test module, a basic feedback module, an adaptive analysis module and a storage module. The basic test module is communicatively connected to the basic feedback module and the adaptive analysis module, and the storage module is communicatively connected to the basic test module, the basic feedback module and the adaptive analysis module.

[0026] The basic test module is used to perform basic aging test analysis on LED lighting fixtures: select several LED lighting fixtures from the samples undergoing aging test as basic test objects, retrieve benchmark parameters of the basic test objects, the benchmark parameters include applicable temperature range, applicable humidity range, standard brightness value and standard color temperature value; mark the average value of the maximum value and the minimum value of the applicable temperature range as the basic temperature value, mark the average value of the maximum value and the minimum value of the applicable humidity range as the basic humidity value, set the air temperature value and the air humidity value in the test environment of the basic test object according to the basic temperature value and the basic humidity value, and then connect the basic test object to a test power supply.

[0027] A basic test cycle with a duration of L1 hours is generated and divided into several basic test periods with a duration of L2 seconds. The basic test period consists of a test sub-period and an intermittent sub-period. The test power of the basic test object is turned on at the beginning of the test sub-period, and the test power of the basic test object is turned off at the beginning of the intermittent sub-period. At the end of the basic test period, the brightness deviation data LP and the color deviation data SP of the basic test object are obtained. The process of obtaining the brightness deviation data includes: obtaining the average brightness value of the basic test object in the test sub-period, and marking the absolute value of the difference between the average brightness value and the standard brightness value as the brightness deviation data LP; the process of obtaining the color deviation data SP includes: obtaining the average color temperature value of the basic test object in the test sub-period, and marking the absolute value of the difference between the average color temperature value and the standard color temperature value as the color deviation data SP.

[0028] The basic coefficient JC of the basic test object in the basic test period is obtained by the formula JC=k1×LP+k2×SP, wherein k1 and k2 are both proportional coefficients, and k1>k2>1; after the basic test cycle is over, the basic coefficients JC of the basic test object in all basic test periods are summed and averaged to obtain the basic performance value of the basic test object, the variance of the basic coefficients JC of the basic test object in all basic test periods is calculated to obtain the basic fluctuation value, the basic performance threshold and the basic fluctuation threshold are obtained through the database, and the basic performance value and the basic fluctuation value are compared with the basic performance threshold and the basic fluctuation threshold respectively: if the basic performance value is less than the basic performance threshold and the basic fluctuation value is less than the basic fluctuation threshold, it is determined that the basic test result of the basic test object meets the requirements, and the corresponding basic test object is marked as a basic qualified object; otherwise, it is determined that the basic test result of the basic test object does not meet the requirements, and the corresponding basic test object is marked as a basic unqualified object.

[0029] The ratio of the number of basic qualified objects to the number of basic test objects is marked as a qualified coefficient, and the qualified threshold is obtained through the storage module, and the qualified coefficient is compared with the qualified threshold: if the qualified coefficient is less than the qualified threshold, the overall basic test results of the batch of samples are judged to be unqualified, and a feedback analysis signal is generated and sent to the basic feedback module; if the qualified coefficient is greater than or equal to the qualified threshold, the overall basic test results of the batch of samples are judged to be qualified, and an adaptive analysis signal is generated and sent to the adaptive analysis module; the basic coefficients of the basic test objects in all basic test periods are calculated in a periodic testing manner, and then the basic coefficients of all basic test periods are comprehensively analyzed to obtain basic performance values ​​and basic fluctuation values, and feedback is given to the overall basic performance of the batch of samples based on the basic performance values ​​and basic fluctuation values, and different in-depth analysis processes are performed based on the overall basic performance judgment results.

[0030] The basic feedback module is used to perform feedback analysis on the basic optimization direction of LED lighting fixtures: all basic test time periods within the basic test cycle corresponding to the basic unqualified objects are arranged in order from small to large according to the basic coefficient JC value to obtain a basic sequence, the absolute value of the difference between the sequence number of the basic test time period in the basic sequence and the sequence number in the basic test cycle is marked as the aging overlap value of the basic test time period, and the aging overlap values ​​of all basic test time periods are summed and averaged to obtain the aging overlap coefficient.

[0031] The aging overlap threshold is obtained through the storage module, and the aging overlap coefficient is compared with the aging overlap threshold: if the aging overlap coefficient is less than the aging overlap threshold, the corresponding basic unqualified object is marked as an aging-affected object; if the aging overlap coefficient is greater than or equal to the aging overlap threshold, the corresponding basic unqualified object is marked as a performance-affected object; the ratio of the number of aging-affected objects to the number of basic unqualified objects is marked as the aging impact coefficient, and the aging impact threshold is obtained through the storage module, and the aging impact coefficient is compared with the aging impact threshold:

[0032] If the aging impact coefficient is less than the aging impact threshold, a performance optimization signal is generated and sent to the mobile phone terminal of the administrator;

[0033] If the aging impact coefficient is greater than or equal to the aging impact threshold, an aging optimization signal is generated and sent to the manager's mobile terminal; when the overall basic test result is unqualified, the aging impact coefficient is generated according to the distribution of the basic coefficients of the basic unqualified objects in the basic test cycle, and the key influencing factors of the overall unqualified basic test result are marked by the aging impact coefficient, and the corresponding production line optimization signal is generated to improve the optimization efficiency of the LED lamp production line.

[0034] The adaptation analysis module is used to analyze the adaptability performance of LED lighting fixtures: re-select a number of LED lighting fixtures from the samples undergoing aging tests as adaptation test objects, and randomly generate test environment parameters for the adaptation test objects. The test environment parameters include test temperature values ​​and test humidity values, and the test temperature values ​​and test humidity values ​​are randomly selected from the applicable temperature range and the applicable humidity range, respectively.

[0035] The air temperature and humidity values ​​in the test environment of the adaptation test object are set according to the test temperature and humidity values, and then the basic coefficient JC of the adaptation test object is obtained in the same way as the basic test process, and the variance of the basic coefficient JC of all adaptation analysis objects is calculated to obtain the adaptation performance value, and the adaptation performance threshold is obtained through the storage module, and the adaptation performance value is compared with the adaptation performance threshold:

[0036] If the adaptive performance value is less than the adaptive performance threshold, it is determined that the overall adaptive test results of the batch of samples meet the requirements;

[0037] If the adaptation performance value is greater than or equal to the adaptation performance threshold, it is determined that the overall adaptation test results of the batch of samples do not meet the requirements, and an adaptation optimization signal is generated and sent to the mobile phone terminal of the manager; the basic coefficients obtained by basic tests of all adaptation test objects under different test environments are combined to obtain the adaptation performance value through comprehensive calculation, and the overall adaptability performance of the batch of samples is evaluated according to the adaptation performance value. When there are quality abnormalities in the samples, further factor screening and optimization decision analysis are carried out to ensure the optimization effect of the LED lamp production line.

[0038] A system for testing aging of LED lighting fixtures. When in operation, a plurality of LED lighting fixtures are selected from samples undergoing aging tests as basic test objects, a basic test cycle with a duration of L1 hours is generated and the basic test cycle is divided into a plurality of basic test periods with a duration of L2 seconds, a basic performance value and a basic performance threshold are obtained at the end of the basic test cycle, and whether the overall basic test results of the batch of samples are qualified are judged according to the basic performance value and the basic performance threshold; adaptive performance analysis is performed if qualified; and feedback analysis is performed if unqualified.

[0039] The above contents are merely examples and explanations of the structure of the present invention. The technicians in this technical field may make various modifications or additions to the specific embodiments described or replace them in a similar manner. As long as they do not deviate from the structure of the invention or exceed the scope defined by the claims, they should all fall within the protection scope of the present invention.

[0040] The above formulas are obtained by collecting a large amount of data for software simulation and selecting a formula close to the real value. The coefficients in the formula are set by technicians in this field according to the actual situation; for example: formula JC = k1×LP+k2×SP; technicians in this field collect multiple groups of sample data and set corresponding basic coefficients for each group of sample data; substitute the set basic coefficients and the collected sample data into the formula, any two formulas constitute a set of two-variable linear equations, screen the calculated coefficients and take the average, and obtain the values ​​of k1 and k2 as 3.15 and 2.83 respectively;

[0041] The size of the coefficient is to quantify each parameter to obtain a specific value for subsequent comparison. The size of the coefficient depends on the amount of sample data and the preliminary setting of the corresponding basic coefficient for each group of sample data by technical personnel in this field; as long as it does not affect the proportional relationship between the parameter and the quantized value, such as the basic coefficient is proportional to the value of the bright bias data.

[0042] In the description of this specification, the description with reference to the terms "one embodiment", "example", "specific example", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0043] The preferred embodiments of the present invention disclosed above are only used to help explain the present invention. The preferred embodiments do not describe all the details in detail, nor do they limit the invention to only specific implementation methods. Obviously, many modifications and changes can be made according to the content of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that those skilled in the art can understand and use the present invention well. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. A system for testing the aging of LED lighting fixtures, characterized in that: It includes a basic test module, a basic feedback module, an adaptive analysis module and a storage module, wherein the basic test module is communicatively connected with the basic feedback module and the adaptive analysis module, and the storage module is communicatively connected with the basic test module, the basic feedback module and the adaptive analysis module; The basic test module is used to perform basic aging test analysis on LED lighting fixtures: select a number of LED lighting fixtures from the samples to be tested for aging as basic test objects, retrieve the benchmark parameters of the basic test objects, set the test environment according to the benchmark parameters, and then connect the basic test objects to the test power supply, generate a basic test cycle with a duration of L1 hours, and divide the basic test cycle into a number of basic test periods with a duration of L2 seconds, and obtain the basic coefficient JC of the basic test object at the end of the basic test period; After the basic test cycle is completed, the basic coefficient JC of the basic test object in all basic test periods is summed and averaged to obtain the basic performance value of the basic test object, and the basic coefficient JC of the basic test object in all basic test periods is calculated by variance calculation to obtain the basic fluctuation value; the basic performance value and the basic fluctuation value are used to determine whether the overall basic test results of the batch of samples are qualified; The basic feedback module is used to perform feedback analysis on the basic optimization direction of the LED lighting fixture and obtain an aging influence coefficient, and generate a performance optimization signal or an aging influence signal through the aging influence coefficient and send it to the mobile phone terminal of the manager; The adaptability analysis module is used to analyze the adaptability performance of the LED lighting fixture.

2. The LED lighting fixture aging test system according to claim 1, characterized in that: The specific process of setting up the test environment according to the basic parameters includes: the benchmark parameters include the applicable temperature range, the applicable humidity range, the standard brightness value and the standard color temperature value; the average value of the maximum value and the minimum value of the applicable temperature range is marked as the basic temperature value, and the average value of the maximum value and the minimum value of the applicable humidity range is marked as the basic humidity value; the air temperature value and the air humidity value in the test environment of the basic test object are set according to the basic temperature value and the basic humidity value.

3. The LED lighting fixture aging test system according to claim 2, characterized in that: The basic test period is composed of a test sub-period and an intermittent sub-period. The test power supply of the basic test object is turned on at the beginning of the test sub-period, and the test power supply of the basic test object is turned off at the beginning of the intermittent sub-period. At the end of the basic test period, the brightness deviation data LP and the color deviation data SP of the basic test object are obtained. The process of obtaining the brightness deviation data includes: obtaining the average brightness value of the basic test object in the test sub-period, and marking the absolute value of the difference between the average brightness value and the standard brightness value as the brightness deviation data LP; the process of obtaining the color deviation data SP includes: obtaining the average color temperature value of the basic test object in the test sub-period, and marking the absolute value of the difference between the average color temperature value and the standard color temperature value as the color deviation data SP; and performing numerical calculations on the brightness deviation data LP and the color deviation data SP to obtain the basic coefficient JC.

4. The LED lighting fixture aging test system according to claim 3, characterized in that: The specific process of determining whether the overall basic test results of the batch of samples are qualified includes: marking the basic test objects as basic qualified objects or basic unqualified objects through the basic performance value and the basic fluctuation value; marking the ratio of the number of basic qualified objects to the number of basic test objects as the qualified coefficient, obtaining the qualified threshold through the storage module, and comparing the qualified coefficient with the qualified threshold: if the qualified coefficient is less than the qualified threshold, the overall basic test results of the batch of samples are determined to be unqualified, a feedback analysis signal is generated and the feedback analysis signal is sent to the basic feedback module; if the qualified coefficient is greater than or equal to the qualified threshold, the overall basic test results of the batch of samples are determined to be qualified, an adaptive analysis signal is generated and the adaptive analysis signal is sent to the adaptive analysis module.

5. The LED lighting fixture aging test system according to claim 4, characterized in that: The process of obtaining the aging influence coefficient includes: arranging all basic test time periods within the basic test cycle corresponding to the basic unqualified objects in order from small to large according to the basic coefficient JC value to obtain a basic sequence, marking the absolute value of the difference between the sequence number of the basic test time period in the basic sequence and the sequence number in the basic test cycle as the aging overlap value of the basic test time period, summing and averaging the aging overlap values ​​of all basic test time periods to obtain the aging overlap coefficient, marking the basic unqualified objects as aging-influenced objects or performance-influenced objects through the aging overlap coefficient; and marking the ratio of the number of aging-influenced objects to the number of basic unqualified objects as the aging influence coefficient.

6. The LED lighting fixture aging test system according to claim 5, characterized in that: The specific process of marking a basic unqualified object as an aging-affected object or a performance-affected object includes: obtaining an aging overlap threshold through a storage module, and comparing the aging overlap coefficient with the aging overlap threshold: if the aging overlap coefficient is less than the aging overlap threshold, the corresponding basic unqualified object is marked as an aging-affected object; if the aging overlap coefficient is greater than or equal to the aging overlap threshold, the corresponding basic unqualified object is marked as a performance-affected object.

7. The LED lighting fixture aging test system according to claim 6, characterized in that: The specific process of the adaptation analysis module analyzing the adaptability performance of LED lighting fixtures includes: reselecting a number of LED lighting fixtures from the samples undergoing aging tests as adaptation test objects, randomly generating test environment parameters for the adaptation test objects, the test environment parameters including test temperature values ​​and test humidity values, the test temperature values ​​and test humidity values ​​being randomly selected from the applicable temperature range and the applicable humidity range, respectively; setting the air temperature value and air humidity value in the test environment of the adaptation test object according to the test temperature value and the test humidity value, and then obtaining the basic coefficient JC of the adaptation test object in the same manner as the basic test process, performing variance calculation on the basic coefficients JC of all adaptation analysis objects to obtain an adaptation performance value, obtaining an adaptation performance threshold value through the storage module, comparing the adaptation performance value with the adaptation performance threshold value, and judging whether the overall adaptation test results of the batch of samples meet the requirements through the comparison results.

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