High-temperature-resistant stacked magnetic flux probe ring for magnetic confinement fusion

Abstract

The invention discloses a high-temperature-resistant stacked magnetic flux probe ring for magnetic confinement fusion, and relates to the technical field of magnetic flux probe rings, the magnetic flux probe ring comprises at least one ceramic circuit board, and the front and back surfaces of the ceramic circuit board form a closed loop through circuit board wiring. The ceramic circuit board is also provided with a front and back via hole for conducting one end of the front middle circuit board wire with one end of the back middle circuit board wire in a penetrating manner; the other end of the front middle circuit board wire and the other end of the back middle circuit board wire are provided with inter-board conduction surfaces, and form positive and negative electrodes of the ceramic circuit board respectively; in the aspect of high-temperature plasma measurement in the field of magnetic confinement fusion, the probe ring can be stably and reliably used in extreme working conditions such as high frequency response, high signal-to-noise ratio, high temperature resistance, high vacuum and low deflation.

Description

Technical Field

[0001] The invention relates to the technical field of magnetic flux probes, and more specifically, to a high temperature resistant stacked magnetic flux probe for magnetic confinement fusion. Background Art

[0002] In the field of magnetic confinement fusion related to high temperature plasma, such as in tokamaks, stellarators, pinch devices and magnetic mirror devices, a magnetic flux pickup coil based on the principle of electromagnetic induction is usually used to measure the magnetic flux and magnetic field at the location of the pickup coil. The magnetic flux pickup coil can measure both the magnetic field B(t) and the disturbance of the magnetic field dB(t) / dt. Therefore, it is widely used in the field of magnetic confinement nuclear fusion, which uses magnetic field as a plasma confinement method, for the detection and control of magnetic information. Figure 1 The figure shows the approximate position of the magnetic flux probe on the magnetic confinement device, which is usually arranged near the plasma, inside or outside the vacuum chamber; in the field of magnetic confinement fusion, the magnetic flux probe using the principle of electromagnetic induction often needs to be placed at the edge of the plasma or in the vacuum chamber. In particular, as the parameters of the magnetic confinement fusion device (or magnetic confinement experimental device) gradually increase and gradually move towards the experimental and engineering research stage at the near-fusion core level, the magnetic flux probe faces the biggest problem, which is that it needs to withstand huge thermal load shocks for a long time and needs to work continuously and stably under high temperature and high vacuum environment. It is not allowed to have a large amount of outgassing of the magnetic flux probe material due to the increase in temperature, which affects the performance of the main vacuum (inside the vacuum chamber where the magnetic flux probe is located) of the device.

[0003] At present, in order to ensure that the magnetic flux detector can work normally under high temperature and high vacuum conditions, the following solutions have been adopted at home and abroad:

[0004] ①. The use of enameled wire (such as polyester, polyurethane, polyesterimide, polyimide) to wind the flux probe coil can fully meet the production of flux probe coils used in high vacuum environments within a temperature of 220°C, and its frequency response and insulation are also quite excellent. However, in an environment of 300°C and above, these enameled materials, as organic materials, will degas and carbonize, and the insulation of the probe coil will be damaged and fail, and it will also affect the vacuum performance in the vacuum chamber.

[0005] ②. Use armored insulated wire to wind the flux probe coil. The armored insulated wire is a special wire with a stainless steel armor shell, a good conductor wire in the inner core, and ceramic powder (such as magnesium oxide) filled in the middle. The advantages of this armored insulated wire are: the temperature resistance can reach 600℃ or even higher; the core of the cable is covered with armor, and there is no need to worry about the probe coil being damaged by plasma coating and causing the insulation of the winding. The disadvantages are: the bending of armored stainless steel is more difficult, the cable is generally thicker, and the winding density cannot be increased. The flux probe coil made by this technical route is generally larger in size and has poor spatial resolution; and the outer shell is stainless steel armor, which shields the measured signal, resulting in the generally low frequency response of the flux probe coil made by this technical route. For example, the flux probe coil wound with enameled wire of the same outer diameter has a frequency response of up to 100kHz, while the probe coil wound with armored insulated wire has a frequency response of only 1kHz, which cannot fully meet the real-time measurement and control requirements of plasma in the magnetic confinement device. In addition, both ends of the armored insulated wire need to be sealed with insulating materials to prevent outgassing and moisture absorption from causing a decrease in insulation between the core and the armor, but the technical difficulty of sealing the ends is relatively high and the cost is high.

[0006] ③. Ceramic grooving technology route: Etch a double-layer winding groove on the ceramic, wind the bare wire (without enameling) in the inner groove, and then wind it to the outer groove when returning the wire to prevent overlapping short circuits between the inner and outer grooves. The probe coil wound in this way has extremely high temperature resistance, which is only related to the temperature resistance of the ceramic and winding materials, and has a high frequency response. It has been applied to multiple tokamak devices such as ITER, KSTAR, and HL-2A, and can be used stably. However, in order to prevent short circuits, the skeleton can generally only sparsely etch two layers of grooves, and excessive groove density will cause the ceramic to break, so its winding density is greatly reduced, and the effective area nA value of the wound probe coil is difficult to increase, resulting in difficulty in improving the signal-to-noise ratio. In addition, due to the use of bare copper wire, a tightly sealed protective cover needs to be designed to prevent plasma coating.

[0007] ④. Laser engraving technology route: Use cylindrical (other shapes are also acceptable) ceramics as the skeleton, make a conductor coating on the surface of the skeleton (using coating, deposition and other processes), and then use laser etching technology to etch the cylindrical surface into a probe circle.

[0008] The advantages of this process are high temperature resistance and high frequency response. The disadvantage is that the winding density is extremely low, and the current technology can only produce one layer.

[0009] The signal-to-noise ratio is very low; it is impossible to detect the loop, which will introduce unwanted stray flux signals.

[0010] The above-mentioned four types of flux detection coils developed by the main technical routes currently available all have obvious advantages and disadvantages. It is difficult to take into account multiple aspects such as high temperature resistance, high vacuum and low outgassing, high frequency response, winding density and signal-to-noise ratio, and protection processing. In view of this, the present invention patent is specially proposed. Summary of the invention

[0011] The object of the present invention is to provide a high temperature resistant stacked flux probe coil for magnetic confinement fusion to solve the problems existing in the above-mentioned background technology.

[0012] The above technical objectives of the present invention are achieved through the following technical solutions:

[0013] In the first aspect, the present application provides a high-temperature resistant stacked flux probe coil for magnetic confinement fusion, the flux probe coil comprising at least one ceramic circuit board, the front and back sides of the ceramic circuit board forming a closed loop through the circuit board routing, the ceramic circuit board also penetrates with front and back side conductive holes for connecting one end of the circuit board routing on the front side with one end of the circuit board routing on the back side; the other end of the circuit board routing on the front side and the other end of the circuit board routing on the back side are both provided with inter-board conductive surfaces, and respectively form the positive and negative poles of the ceramic circuit board.

[0014] Based on the above technical solution, the present invention can also be improved as follows.

[0015] Furthermore, the ceramic circuit board is penetrated by a plurality of fixing holes.

[0016] Furthermore, the plurality of fixing holes are symmetrically arranged on both sides of the ceramic circuit board.

[0017] Furthermore, one of the fixing holes passes through the inter-board conductive surface.

[0018] Furthermore, when the above-mentioned magnetic flux detection coil includes multiple ceramic circuit boards, the multiple ceramic circuit boards are stacked in sequence, and the circuits of adjacent ceramic circuit boards are connected through the inter-board conductive surface; the inter-board conductive surface on the front side of the ceramic circuit board located at the top and the inter-board conductive surface on the back side of the ceramic circuit board located at the bottom respectively form the positive and negative poles of the magnetic flux detection coil.

[0019] Furthermore, the above-mentioned multiple ceramic circuit boards are fixed by ceramic fastening bolts penetrating through the respective fixing holes and ceramic fastening nuts adapted to the ceramic fastening bolts.

[0020] Furthermore, the ceramic fastening bolts arranged in the fixing holes penetrating the conductive surfaces between the boards are sleeved with a plurality of limiting rings and a plurality of conductive rings, the number of the limiting rings and the number of the conductive rings correspond, and each limiting ring and each conductive ring are respectively located between adjacent ceramic circuit boards.

[0021] Furthermore, the above-mentioned limiting ring is located inside the conducting ring and plays an insulating role, and the height of the limiting ring cannot exceed the height of the conducting ring.

[0022] Furthermore, the above also includes a ceramic protective cover, which is provided with a probe ring placement groove for accommodating the magnetic flux probe ring, and the port edge of the probe ring placement groove extends outward to form a mounting portion, and the mounting portion is penetrated by a fixing hole.

[0023] In a second aspect, the present application provides an application of a high temperature resistant stacked flux probe coil for magnetic confinement fusion as described in any one of the first aspects in measuring magnetic flux or measuring magnetic field.

[0024] Compared with the prior art, the present invention has at least the following beneficial effects:

[0025] In this application, the high temperature resistant stacked flux probe ring provided has the following advantages: 1. Temperature resistance: it can achieve high temperature up to 600°C and high vacuum (1×10 -5 1. It can work continuously in an environment of 0.40 Pa; 2. Vacuum performance, i.e., deflation: there is no need to worry about the risk of deflation or leakage; 3. Frequency response: it is not affected by shielding such as armor and protective shells, and the frequency response is fast; 4. Signal-to-noise ratio: the winding density of the probe coil is relatively high, which can ensure a high signal-to-noise ratio; 5. Size and spatial resolution: the size of the probe coil can be flexibly designed according to the needs, and the size and wiring size of the ceramic circuit board can be designed to ensure high spatial resolution; 6. Reliability: The probe coil is formed into an integrated structure through the designed ceramic box body, which not only protects the probe from mechanical damage, but also prevents the insulation damage caused by plasma coating, and can achieve the frequency response without affecting the probe coil at all; 7. Design flexibility: according to the use requirements (frequency response, size, signal-to-noise ratio), the user can stack different numbers of layers to meet the parameter requirements required by the use scenario. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] The drawings described herein are used to provide a further understanding of the embodiments of the present invention, constitute a part of this application, and do not constitute a limitation of the embodiments of the present invention. In the drawings:

[0027] Figure 1 It is a schematic diagram of the arrangement of the magnetic flux detection coil on the main unit of the magnetic confinement device in an embodiment of the present invention;

[0028] Figure 2 It is a schematic diagram of the structure of a single-chip ceramic circuit board in a magnetic flux detection coil in an embodiment of the present invention;

[0029] Figure 3 It is a connection diagram of a magnetic flux detection coil in an embodiment of the present invention;

[0030] Figure 4 This is a schematic diagram of the structure of a ceramic protective cover in an embodiment of the present invention;

[0031] Figure 5 It is a signal comparison diagram of the magnetic flux probe coil in the embodiment of the present invention and the traditional winding probe coil in measuring the magnetic field and magnetic disturbance. DETAILED DESCRIPTION

[0032] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0033] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0034] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0035] In the description of the embodiments of the present invention, it should be noted that if the terms "up", "down", "left", "right", "vertical", "horizontal", "inside", "outside", etc. appear, the orientation or position relationship indicated is based on the orientation or position relationship shown in the accompanying drawings, or is the orientation or position relationship in which the product of the invention is usually placed when used. It is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0036] In addition, the terms "horizontal", "vertical", "overhanging" and the like do not mean that the components must be absolutely horizontal or overhanging, but can be slightly tilted. For example, "horizontal" only means that its direction is more horizontal than "vertical", and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0037] In the description of the embodiments of the present invention, "plurality" means at least 2.

[0038] In the description of the embodiments of the present invention, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal connection of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0039] Embodiment 1: This embodiment provides a high-temperature resistant stacked flux probe coil for magnetic confinement fusion, the flux probe coil includes at least one ceramic circuit board, the front and back sides of the ceramic circuit board form a closed loop through the circuit board routing, the ceramic circuit board is also penetrated by a front and back conductive hole for connecting one end of the circuit board routing on the front side with one end of the circuit board routing on the back side; the other end of the circuit board routing on the front side and the other end of the circuit board routing on the back side are both provided with inter-board conductive surfaces, and respectively form the positive and negative poles of the ceramic circuit board.

[0040] Optionally, the ceramic circuit board is also penetrated with a plurality of fixing holes, such as Figure 2 and Figure 3 As shown, the above-mentioned multiple fixing holes are symmetrically arranged on both sides of the ceramic circuit board; see Figure 2 and Figure 3 , one of the above-mentioned fixing holes passes through the inter-board conductive surface.

[0041] Optionally, when the magnetic flux probe coil comprises a plurality of ceramic circuit boards, as Figure 3 As shown, multiple ceramic circuit boards are stacked in sequence, and the circuits of adjacent ceramic circuit boards are connected through the inter-board conductive surface; the inter-board conductive surface on the front side of the ceramic circuit board at the top and the inter-board conductive surface on the back side of the ceramic circuit board at the bottom form the positive and negative poles of the magnetic flux detection circle respectively.

[0042] Optionally, the plurality of ceramic circuit boards are fixed by ceramic fastening bolts penetrating through the respective fixing holes and ceramic fastening nuts adapted to the ceramic fastening bolts, such as Figure 3 shown.

[0043] Optionally, the ceramic fastening bolts arranged in the fixing holes passing through the inter-board conductive surfaces are sleeved with a plurality of limiting rings and a plurality of conductive rings, the number of limiting rings and conductive rings corresponds to the number of conductive rings, and each limiting ring and each conductive ring is respectively located between adjacent ceramic circuit boards; Figure 3 As shown, the above-mentioned limiting ring is located inside the conducting ring and plays an insulating role, and the height of the limiting ring cannot exceed the height of the conducting ring.

[0044] Optionally, the above also includes a ceramic protective cover, such as Figure 4 As shown, the ceramic protective cover is provided with a probe ring placement groove for accommodating a magnetic flux probe ring, and the edge of the port of the probe ring placement groove extends outward to form a mounting portion, and the mounting portion is penetrated by a fixing hole.

[0045] Embodiment 2: This embodiment provides a ceramic circuit board stacked electromagnetic induction non-contact magnetic flux probe coil, which mainly solves the high-temperature plasma measurement in the field of magnetic confinement fusion, and at the same time solves the technical problems of the probe coil in high frequency response, high signal-to-noise ratio, and stable and reliable use under extreme working conditions such as high temperature resistance, high vacuum and low outgassing; the magnetic flux probe coil is used in the field of magnetic confinement fusion to measure magnetic flux, magnetic field, and magnetic disturbance; in order to be able to quickly detect magnetic flux, it can survive in extremely harsh environments (high temperature, thermal load shock, high vacuum, large electromagnetic force) and can stably provide measurement signals. This embodiment adopts the method of stacking ceramic circuit boards to realize the "winding" of the probe coil; and adopts a ceramic circuit routing method, which can realize multi-layer stacking of ceramic circuit boards, and the number of stacking layers is not limited, which is completely determined according to the measurement requirements.

[0046] Specifically, Figure 2 The stacked magnetic flux probe coil in this embodiment is shown. The stacked module used is a single-chip magnetic flux probe coil ceramic circuit board, referred to as a ceramic circuit board; the ceramic circuit board includes: ceramic is used as the support and insulation frame of the probe coil; generally, the thickness of the ceramic sheet is selected from 0.2mm-1mm, and other thicknesses can also be selected according to specific usage scenarios; the ceramic circuit board is divided into a front side and a back side (the front side and the back side are completely consistent), and circuits are arranged on both sides, and the circuits are completely consistent; including:

[0047] 1. Circuit board routing: Form an effective area surrounded by a magnetic flux probe circle in order to measure the magnetic flux value enclosed in the circuit board. The circuit board routing can be adopted as follows Figure 2 In the annular winding method shown, one end of the wire on the front and back sides is connected through the front and back conductive holes opened in the middle of the ceramic circuit board, and the other end of the wire on the front and back sides extends to the edge of the ceramic circuit board, which is used to achieve the connection of the wires between the ceramic circuit boards.

[0048] 2. Front and back side conduction holes: This conduction hole connects the circuits on the front and back sides of the ceramic sheet, so that the "inter-board conduction surface" on the front side and the "inter-board conduction surface" on the back side form the positive and negative poles of the probe circle.

[0049] 3. Conductive surface between plates: If a ceramic sheet is used as an independent magnetic flux probe coil, the "conductive surface between plates" on the front and back sides of the ceramic sheet are the positive and negative poles of the magnetic flux probe coil; if multiple ceramic sheets are stacked and used, the "conductive surface between plates" is the contact area between the ceramic sheet and the adjacent ceramic sheet, and the contact area requires good conductivity.

[0050] 4. Fixing holes: holes used for positioning and fastening when stacking multiple ceramic circuit boards, and must not intersect with circuit traces.

[0051] Furthermore, when a stacked magnetic flux probe coil is formed by multiple ceramic circuit boards, Figure 3As shown in the figure, a flux probe coil is formed by stacking multiple ceramic sheets. The number of stacking layers is determined according to the measurement requirements and size. The main functions of each component are:

[0052] 1. Multiple ceramic circuit boards: The most important unit of the stacked flux probe coil, which has been described in detail above and will not be repeated here.

[0053] 2. Limiting ring: In order to avoid short circuit and dislocation between adjacent ceramic sheets, a ring-shaped limit ring is made of ceramic material and arranged between each layer of ceramic circuit boards to play a limiting and insulating role.

[0054] 3. Conductive ring: A structure that connects the "inter-board conductive surfaces" of two adjacent ceramic circuit boards to form good contact; generally, the thickness of the conductive ring is slightly thicker than the "limiting ring" so that good inter-board contact can be achieved by tightening the bolts.

[0055] 4. Fastening bolts and nuts: The bolts used to stack and fasten multiple ceramic circuit boards should preferably be made of ceramic materials; if conductive metal materials are used, the "limiting ring" will play the role of insulation between the "conductive surface between boards" and the "fastening bolts". If the fastening bolts are made of ceramic materials, the "limiting ring" does not need to play an insulating role, but only needs to provide a limiting role.

[0056] Furthermore, since the winding circuit of the stacked flux probe coil is exposed, it is easy to be coated and cause the circuit to be broken when placed in a high-temperature plasma environment, causing the insulation of the probe coil to decrease or be damaged, and thus making the probe coil unable to work normally; therefore, a protective cover needs to be made for it, such as Figure 4 As shown, the protective cover can cover the stacked probe ring tightly to prevent external impact and plasma coating, and at the same time, it is required not to affect the frequency response of the probe ring. Therefore, it is advisable to select a ceramic material to make the protective cover. The ceramic protective cover is specifically:

[0057] 1. Probe ring placement groove: The stacked probe rings are placed in this groove to avoid direct bombardment of plasma.

[0058] 2. Covering surface: The covering surface is the front of the ceramic protective cover, which is the surface directly facing the plasma bombardment. The covering surface should be flat and have rounded corners to prevent the covering surface from forming tip discharge with the plasma after being coated with a conductive film.

[0059] 3. Fixing hole: The ceramic protective cover protects the stacking probe ring in the placement groove and is fixed to the bottom plate below through the fixing hole (the bottom plate can be made of ceramic, stainless steel and other materials).

[0060] Specifically, if the area enclosed by a single ceramic circuit board is A (including the front and back sides), the effective area of ​​the magnetic flux detection coil formed after stacking n layers is nA; the positive and negative poles of the stacked magnetic flux detection coil are the "inter-board conductive surface" on the back of the first layer of ceramic circuit board and the "inter-board conductive surface" on the front of the last layer of ceramic circuit board. The two contacts are respectively led out through twisted pair of wires, and it can be used as a magnetic flux detection coil for measuring magnetic flux, magnetic field and magnetic disturbance.

[0061] The high temperature resistant stacked magnetic flux probe coil provided in this embodiment can simultaneously realize the measurement of magnetic flux, magnetic field and magnetic disturbance without outgassing, high frequency response and high signal-to-noise ratio under high temperature, high vacuum and strong electromagnetic force environment; it can achieve temperature resistance up to 600°C and can be used in high vacuum (1×10 -5 It can work stably in an environment of the order of Pa) and achieve a frequency response of 100kHz or even MHz (depending on the inductance of the probe coil, which is related to the number of turns, the area of ​​a single turn, and the density of winding turns). It can also provide Gaussian (Gs, 1Gs=0.0001Tesla) level pulse magnetic field measurement. The ring-shaped ceramic circuit routing method can realize the stacking of any number of ceramic layers for applications in different usage scenarios, and has strong scalability.

[0062] Specifically, the comparison of the magnetic flux probe coil provided in this embodiment and the traditional winding probe coil in measuring the magnetic field and magnetic disturbance is shown in FIG. Figure 5 , Figure 5 The induced voltage output by the flux probe provided in this embodiment and the traditional winding probe when measuring the same magnetic field is Figure 5 It can be seen that compared with the traditional mature solution of winding probe coil, the stacked ceramic probe coil has a similar geometric size (about 30mm long × 20mm wide × 10mm high), and the measured signal amplitude is of the same order of magnitude (about 70% of the same size of winding probe coil), and the signal-to-noise ratio is high.

[0063] Example 3: This embodiment of the present application provides an application of a high-temperature resistant stacked flux probe coil for magnetic confinement fusion as in any one of Example 1 or Example 2 in measuring magnetic flux or measuring magnetic field.

[0064] The specific implementation methods described above further illustrate the objectives, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above description is only a specific implementation method of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A high temperature resistant stacked magnetic flux probe ring for magnetic confinement fusion, characterized in that: The magnetic flux detection coil includes at least one ceramic circuit board, and the front and back sides of the ceramic circuit board form a closed loop through the circuit board routing. The ceramic circuit board also has a front and back conductive hole that is used to conduct one end of the circuit board routing in the front side with one end of the circuit board routing in the back side; the other end of the circuit board routing in the front side and the other end of the circuit board routing in the back side are both provided with inter-board conductive surfaces, and respectively form the positive and negative poles of the ceramic circuit board.

2. The high temperature resistant stacked magnetic flux probe ring for magnetic confinement fusion according to claim 1, characterized in that: The ceramic circuit board is also penetrated by a plurality of fixing holes.

3. The high temperature resistant stacked magnetic flux probe ring for magnetic confinement fusion according to claim 2, characterized in that: The plurality of fixing holes are symmetrically arranged on both sides of the ceramic circuit board.

4. The high temperature resistant stacked magnetic flux probe ring for magnetic confinement fusion according to claim 2, characterized in that: One of the fixing holes penetrates the inter-board conductive surface.

5. The high temperature resistant stacked magnetic flux probe ring for magnetic confinement fusion according to claim 4, characterized in that: When the magnetic flux detection coil includes multiple ceramic circuit boards, the multiple ceramic circuit boards are stacked in sequence, and the circuits of adjacent ceramic circuit boards are connected through the inter-board conductive surface; the inter-board conductive surface on the front side of the ceramic circuit board located at the top and the inter-board conductive surface on the back side of the ceramic circuit board located at the bottom form the positive and negative poles of the magnetic flux detection coil respectively.

6. The high temperature resistant stacked magnetic flux probe ring for magnetic confinement fusion according to claim 5, characterized in that: The plurality of ceramic circuit boards are fixed by ceramic fastening bolts penetrating through the respective fixing holes and ceramic fastening nuts matched with the ceramic fastening bolts.

7. The high temperature resistant stacked magnetic flux probe ring for magnetic confinement fusion according to claim 6, characterized in that: The ceramic fastening bolts arranged in the fixing holes penetrating the inter-board conductive surfaces are sleeved with a plurality of limiting rings and a plurality of conductive rings, the number of the limiting rings and the number of the conductive rings correspond, and each limiting ring and each conductive ring are respectively located between adjacent ceramic circuit boards.

8. The high temperature resistant stacked flux probe ring for magnetic confinement fusion according to claim 7, characterized in that: The limiting ring is located inside the conducting ring and plays an insulating role, and the height of the limiting ring cannot exceed the height of the conducting ring.

9. The high temperature resistant stacked magnetic flux probe ring for magnetic confinement fusion according to claim 1, characterized in that: It also includes a ceramic protective cover, which is provided with a probe ring placement groove for accommodating the magnetic flux probe ring, and the port edge of the probe ring placement groove extends outward to form a mounting portion, and the mounting portion is penetrated by a fixing hole.

10. Use of a high temperature resistant stacked flux probe coil for magnetic confinement fusion according to any one of claims 1 to 9 in measuring magnetic flux or magnetic field.

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