Method and device for checking sundries in rubber

Abstract

The invention provides a method and device for checking sundries in rubber, and relates to the technical field of rubber calendering manufacturing. Firstly, a thin product output by a calender is made to move in a Z shape; respectively measuring the thin product at the two Z-shaped bent parts by adopting a range finder to obtain the surface flatness condition of the thin product; then obtaining the movement condition of the thin product; analyzing whether sundries exist on the surface of the thin product or not based on the surface flatness condition of the thin product; and finally, if the sundries exist on the surface of the thin product, marking the sundries on the surface of the thin product based on the moving condition of the thin product. The rubber compound can be comprehensively checked, and the positions of sundries are accurately marked.

Description

Technical Field

[0001] The invention relates to the technical field of rubber calendering manufacturing, and in particular to a method and a device for inspecting foreign matter in rubber. Background Art

[0002] A tire is an automotive component made of rubber, carbon black, sulfur, steel wire, fiber cord, etc. In the tire production process, there is a process called calendering. Its raw materials are mixed rubber, fiber, steel cord, etc. that have been fused with various ingredients. The mixed rubber or mixed rubber and fiber (steel wire) cord are pressed into thin products of standard thickness through a calender with rollers as the main component. These products are then sent to the next process for further processing and finally made into tires or other rubber products.

[0003] Among them, there may be wood chips, stones, iron filings and other debris in the rubber mix. In particular, natural rubber is collected from trees, which is easy to contain debris, which will also cause debris in thin products after rolling. Therefore, in order to remove the debris, the traditional method is to use a metal detector to detect and remove larger metal debris when using the rubber mix, or to use rubber filtering (let the rubber pass through a sieve of a certain specification), but neither method can effectively remove tiny debris, so that the debris causes hidden dangers to product quality;

[0004] In addition, based on the rubber calender with the publication number CN109501103A, the rubber supply device capable of automatically removing metal impurities is used, and the rubber with metal parts detected is cut off by a cutter, but this method will cause the mixed rubber without impurities to be lost, thereby resulting in material waste;

[0005] Therefore, we propose a method and device that can comprehensively inspect the rubber mix and accurately mark the location of the debris. Summary of the invention

[0006] The object of the present invention is to provide a method and device for inspecting foreign matter in rubber, which can comprehensively inspect the mixed rubber and accurately mark the position of the foreign matter.

[0007] The present invention is achieved through the following technical solutions:

[0008] A method for inspecting foreign matter in rubber, comprising:

[0009] Make the thin products output by the calendering machine move in a Z shape;

[0010] Use a distance meter to measure the thin product at the two Z-shaped bends to obtain the surface flatness of the thin product;

[0011] Obtain the movement of thin products;

[0012] Based on the surface flatness of thin products, analyze whether there are debris on the surface of thin products;

[0013] If there are foreign objects on the surface of the thin product, the foreign objects on the surface of the thin product are marked based on the movement of the thin product.

[0014] Furthermore, the sundries on the surface of the thin product are marked by spot tracking irradiation marking or liquid spray marking.

[0015] Further, the analysis steps of the impurities on the surface of thin products include:

[0016] Receive the distance data output by the distance meter and the movement of the thin product;

[0017] Clean the distance data to obtain accurate distance data between the distance meter and the corresponding surface of the thin product;

[0018] Analyze the accurate distance data to determine whether there are foreign objects on the front and back surfaces of the thin product;

[0019] According to the analysis results and the movement of the thin product, the location information of the debris is determined.

[0020] Further, the accurate distance data of the thin product surface analyzed as debris is sent to the database, and a corresponding label or classification identifier is assigned to each sample in the database.

[0021] Furthermore, the analysis step of the accurate distance data includes:

[0022] The distance data collected by the rangefinder in the width direction of the thin product forms a data queue a;

[0023] As the thin product moves in the length direction, the data queue a at each time t forms a time-sharing set b;

[0024] Use the moving average method to calculate the range of data queue a, select the first five points with the largest range as suspected debris points, and record the lateral positions of these points and their corresponding range values ​​d;

[0025] At the same time, the data queue a is expanded analytically using the Fourier series;

[0026] Calculate the main amplitude of each level of waves, and compare the wave amplitude of the specific skeleton line corresponding to the order with the existing experience database to obtain the correction coefficient k1;

[0027] Find the wavelengths of the three harmonics with the largest amplitudes and compare them with the database to obtain the harmonic factor K2;

[0028] Perform iterative analysis on the parameters of each data queue a in the time-sharing set b, namely, the range d, the correction coefficient k1 and the harmonic factor K2, to obtain the shape factor m and the position factor n;

[0029] The shape factor m and the position factor n are compared with the data in the database to determine the probability that the uneven part of the thin product is debris.

[0030] A rubber internal debris inspection device comprises: a calender, a shaping roller, a distance meter, a central processing unit and a marker, wherein the calender is used to continuously output a thin product of 0.4 to 0.8 mm by adjusting working parameters;

[0031] There are two shaping rollers, and the thin product is conveyed in a Z shape after passing through the two shaping rollers in sequence, and the shaping rollers are provided with angle sensors;

[0032] A distance meter is respectively arranged on the outer side of the two shaping rollers, the measuring end of the first distance meter faces the back side of the thin product, and the measuring end of the second distance meter faces the front side of the thin product;

[0033] The central processor is used to receive the data signals from the angle sensor and the two rangefinders, obtain the position of the debris on the surface of the thin product after calculation and processing, and transmit it to the marker;

[0034] The marker is used for marking sundries on the surface of thin products.

[0035] Furthermore, the rangefinder is an acoustic rangefinder or a grating rangefinder.

[0036] Further, the central processing unit includes: a data interface, a distance measurement data cleaning unit, a distance measurement data analysis unit, a position data processing unit and an instruction output unit, and the data interface is used to receive data;

[0037] The distance measurement data cleaning unit is used to clean the distance data output by the rangefinder;

[0038] The data analysis unit is used to determine whether there are debris on the surface of the thin product based on the distance data after cleaning;

[0039] The position data processing unit is used to process the position data output by the angle sensor and calculate the position information of the debris when it is determined that there is debris on the surface of the thin product;

[0040] The instruction output unit is used to send a marking instruction to the marker according to the position information of the debris.

[0041] Furthermore, the central processor also includes: a database, which is used to store the distance data type when there are debris on the surface of the thin product, and each data type has a corresponding label or classification identifier.

[0042] Furthermore, the data analysis unit is composed of a range analysis module, a reproducibility analysis module and a harmonic analysis module.

[0043] The technical solution of the present invention has at least the following advantages and beneficial effects:

[0044] The present invention allows the thin product to bend and deform when moving in a Z shape. Since the strain characteristics of rubber and debris are significantly different, when the debris passes through the Z-shaped bend, the deformation amount is inconsistent with that of the rubber, and a boundary protruding from the rubber surface is generated, so that the debris can be effectively observed and judged, thereby realizing accurate detection of the debris.

[0045] In addition, due to the continuous movement of the thin product and the ability of the two rangefinders to simultaneously detect the front and back sides of the thin product, comprehensive detection of debris can also be ensured. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0047] Figure 1 A schematic diagram of a method flow chart provided in Example 1 of the present invention;

[0048] Figure 2 A schematic diagram of the structure of a device provided in Example 3 of the present invention;

[0049] Figure 3 A schematic diagram of the structure of a central processing unit provided in Example 4 of the present invention.

[0050] Icons: 1. Calender; 2. Shaping roller; 3. Distance meter; 4. Central processing unit; 41. Data interface; 42. Distance measurement data cleaning unit; 43. Distance measurement data analysis unit; 431. Range analysis module; 432. Reproducibility analysis module; 433. Harmonic analysis module; 44. Position data processing unit; 45. Command output unit; 46. Database; 5. Marker; 6. Thin products. DETAILED DESCRIPTION

[0051] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0052] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0053] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0054] In the description of the present invention, it should be noted that if the terms "center", "up", "down", "left", "right", "vertical", "horizontal", "inside", "outside" and the like appear, the orientation or position relationship indicated is based on the orientation or position relationship shown in the accompanying drawings, or is the orientation or position relationship in which the product of the application is usually placed when used. It is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0055] In the description of the present invention, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0056] Example 1

[0057] Combined with Figure 1 A method for inspecting foreign matter in rubber, comprising:

[0058] S1. The thin product 6 outputted by the calender is moved in a Z shape, wherein the thin product 6 is moved in a Z shape by using two shaping rollers 2 to change the moving direction of the thin product 6;

[0059] S2. The rangefinder 3 is used to measure the thin product 6 at the two Z-shaped bends to obtain the surface flatness of the thin product 6;

[0060] When the thin product 6 moves in a Z shape, the thin product 6 will undergo two bending deformations at the two bending parts of the Z shape. In the two complete deformations, the thin product 6 in the thin product 6 can be stretched evenly to become thinner, but the debris in the thin product 6 cannot be stretched and thinned, so that the debris protrudes from the surface of the thin product 6. Then, the distance measurement of the surface of the thin product 6 is performed comprehensively and continuously using the distance meter 3. When there is debris passing through, the distance value measured by the distance meter 3 will change and is no longer a uniform value. At this time, it means that the surface of the thin product 6 is uneven. When there is no debris passing through, the distance value measured by the distance meter 3 does not change much, and the flatness of the surface of the thin product 6 can be preliminarily judged.

[0061] S3. Obtain the movement of the thin product 6. Since the thin product 6 is continuously output, an angle sensor or encoder is provided on the shaping roller 2 to detect the number of rotations of the shaping roller 2. According to the number of rotations and the surface circumference of the shaping roller 2, the movement distance of the thin product 6 can be calculated to obtain the movement of the thin product 6;

[0062] S4. Based on the surface flatness of the thin product 6, analyze whether there are foreign objects on the surface of the thin product 6. Because the thin product 6 also contains materials such as fibers and steel cords, which may also produce boundaries during the Z-shaped movement of the thin product 6 and affect the surface flatness of the thin product 6, but they should not be identified as foreign objects. Therefore, it is necessary to analyze and determine whether there are foreign objects when the surface of the thin product 6 is uneven;

[0063] S5. If there are debris on the surface of the thin product 6, the debris on the surface of the thin product 6 is marked based on the movement of the thin product 6; this facilitates the subsequent accurate removal of the debris without causing waste of rubber material;

[0064] In addition, the impurities on the surface of the thin product 6 are marked by spot tracking irradiation marking or liquid spray marking; both marking methods can effectively expose the impurities on the surface of the thin product 6, thereby facilitating the subsequent removal of the impurities.

[0065] Example 2

[0066] The steps for analyzing the impurities on the surface of the thin product 6 include:

[0067] S41 receives the distance data output by the rangefinder 3, and the movement of the thin product 6;

[0068] S42. Clean the distance data to obtain accurate distance data between the rangefinder 3 and the corresponding surface;

[0069] The data cleaning steps include:

[0070] S421.De-duplicate: Detect and remove duplicate observations in a data set.

[0071] S422. Filling missing values: For missing data points, interpolation, mean filling, median filling and other methods can be used to fill them.

[0072] S423. Outlier detection and processing: Identify points that deviate significantly from other observations and decide whether to delete or correct them.

[0073] S424.Consistency check: Ensure logical consistency between all data items, such as consistency of date format, etc.

[0074] S43 analyzes the accurate distance data to determine whether there are debris on the front and back surfaces of the thin product 6;

[0075] S44. Determine the position information of the debris based on the analysis results and the movement of the thin product 6.

[0076] In addition, the accurate distance data of the surface analyzed as debris is sent to the database 46, and a corresponding label or classification identifier is assigned to each sample in the database 46.

[0077] As required, the analysis steps of the accurate distance data include:

[0078] S431. The distance data collected by the rangefinder 3 in the width direction of the thin product 6 forms a data queue a;

[0079] S432. As the thin product 6 moves in the length direction, the data queue a at each time t forms a time-sharing set b;

[0080] S433. Calculate the range of data queue a using the moving average method, select the first five points with the largest range as suspected debris points, and record the lateral positions of these points and their corresponding range values ​​d;

[0081] S434. At the same time, the data queue a is expanded by Fourier series analysis, and the number of expansions is determined by two factors: width and skeleton line density;

[0082] S435. Calculate the main amplitude of each level of waves, and compare the wave amplitude of the specific skeleton line corresponding to the number with the existing experience database 46 to obtain the correction coefficient k1;

[0083] S436. Find the wavelengths of the three harmonics with the largest amplitudes and compare them with the database 46 to obtain the harmonic factor K2;

[0084] S437. Perform an iterative analysis on the parameters of each data queue a in the time-sharing set b, namely, the range d, the correction coefficient k1 and the harmonic factor K2, to obtain the shape factor m and the position factor n;

[0085] S438. Compare the shape factor m and the position factor n with the data in the database 46 to determine the probability that the uneven portion of the thin product 6 is debris.

[0086] Example 3

[0087] Combined with Figure 2 A rubber internal debris inspection device comprises: a calender 1, a shaping roller 2, a distance meter 3, a central processing unit 4 and a marker 5, wherein the calender 1 is used to continuously output a thin product 6 of 0.4 to 0.8 mm by adjusting working parameters;

[0088] There are two shaping rollers 2, and the thin product 6 is conveyed in a Z shape after passing through the two shaping rollers 2 in sequence. The shaping rollers 2 are provided with angle sensors. The angle sensors detect the number of rotations of the shaping rollers 2. According to the number of rotations and the surface circumference of the shaping rollers 2, the moving distance of the thin product 6 can be calculated, and the movement of the thin product 6 can be obtained.

[0089] A distance meter 3 is respectively arranged on the outer side of the two shaping rollers 2, the measuring end of the first distance meter 3 faces the reverse side of the thin product 6, and the measuring end of the second distance meter 3 faces the front side of the thin product 6; the two distance meters 3 are respectively used to detect the surface flatness of the front side and the back side of the thin product 6;

[0090] In particular, the distance meter 3 adopts an acoustic distance meter or a grating distance meter, both of which can accurately detect the flatness of the surface of the thin product 6;

[0091] The central processor 4 is used to receive the data signals of the angle sensor and the two rangefinders 3, obtain the position of the debris on the surface of the thin product 6 after calculation and processing, and transmit it to the marker 5, and process it using the debris inspection method S4;

[0092] The marker 5 is used to mark the debris on the surface of the thin product 6; when the central processor determines that there is debris on the surface of the thin product, the central processor 4 will calculate the moving distance of the debris, and when the debris moves to the position of the marker 5, it will send a start command to the marker 5 to allow the marker 5 to mark the debris on the surface of the thin product.

[0093] Example 4

[0094] Further, the central processor 4 includes: a data interface 41, a distance measurement data cleaning unit 42, a distance measurement data analysis unit 43, a position data processing unit 44 and an instruction output unit 45, and the data interface 41 is used to receive data;

[0095] The distance measurement data cleaning unit 42 is used to clean the distance data output by the distance meter 3;

[0096] The data analysis unit 43 is used to determine whether there are debris on the surface of the thin product 6 according to the distance data after cleaning;

[0097] The position data processing unit 44 is used to process the position data output by the angle sensor and calculate the position information of the debris when it is determined that there is debris on the surface of the thin product 6;

[0098] The instruction output unit 45 is used to send a marking instruction to the marker 5 according to the position information of the debris.

[0099] Furthermore, the central processor 4 further comprises: a database 46, which is used to store the distance data type when there are debris on the surface of the thin product 6, that is, the result output by the data analysis unit 43, that is, the historical data of the debris; and each data type has a corresponding label or classification identifier;

[0100] It should be noted that the database 46 can also be called when the data analysis unit 43 calculates the correction coefficients K1 and K2, so as to make the judgment result of the debris more accurate.

[0101] Furthermore, the data analysis unit 43 is composed of a range analysis module 431, a reproducibility analysis module 432 and a harmonic analysis module 433; wherein the range analysis module 431 is used to calculate the range of distance data; the reproducibility analysis module 432 is used to verify the consistency and reliability of the detection results; and the harmonic analysis module 433 is used to enhance the detection capability.

[0102] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A method for inspecting foreign matter in rubber, characterized in that: include: Allowing the thin product (6) outputted from the calender to move in a Z shape; A distance meter (3) is used to measure the thin product (6) at two Z-shaped bends respectively to obtain the surface flatness of the thin product (6); Obtaining the movement status of the thin product (6); Based on the surface flatness of the thin product (6), analyzing whether there are foreign objects on the surface of the thin product (6); If there are foreign objects on the surface of the thin product (6), the foreign objects on the surface of the thin product (6) are marked based on the movement of the thin product (6).

2. The method for inspecting foreign matter in rubber according to claim 1, characterized in that: The sundries on the surface of the thin product (6) are marked by light spot tracking irradiation marking or liquid spray marking.

3. The method for inspecting foreign matter in rubber according to claim 1, characterized in that: The steps for analyzing the surface impurities of the thin product (6) include: receiving distance data output by a distance meter (3) and movement status of a thin product (6); Cleaning the distance data to obtain accurate distance data between the distance meter (3) and the corresponding surface of the thin product (6); Analyzing the accurate distance data to determine whether there are foreign objects on the front and back surfaces of the thin product (6); According to the analysis results and the movement of the thin product (6), the position information of the debris is determined.

4. The method for inspecting foreign matter in rubber according to claim 3, characterized in that: The accurate distance data of the thin product (6) analyzed as the surface of the debris is sent to the database (46), and a corresponding label or classification identifier is assigned to each sample in the database (46).

5. The method for inspecting foreign matter in rubber according to claim 3, characterized in that: The analysis steps of the accurate distance data include: The distance data collected by the distance meter (3) in the width direction of the thin product (6) forms a data queue a; As the thin product (6) moves in the length direction, the data queue a at each time t forms a time-sharing set b; Use the moving average method to calculate the range of data queue a, select the first five points with the largest range as suspected debris points, and record the lateral positions of these points and their corresponding range values ​​d; At the same time, the data queue a is expanded analytically using the Fourier series; Calculate the main amplitude of each wave, and compare the wave amplitude of the specific skeleton line corresponding to the order with the existing empirical database (46) to obtain the correction coefficient k1; Find the wavelengths of the three harmonics with the largest amplitudes and compare them with the database (46) to obtain the harmonic factor K2; Iterate the analysis of the parameters of the range d, correction coefficient k1 and harmonic factor K2 of each data queue a in the time-sharing set b to obtain the shape factor m and location factor n; The shape factor m and the position factor n are compared with the data in the database (46) to determine the probability that the uneven part of the thin product (6) is a foreign object.

6. A device for inspecting debris in rubber, comprising: A calender (1), a shaping roller (2), a distance meter (3), a central processing unit (4) and a marker (5), wherein the calender (1) is used to continuously output a thin product (6) of 0.4 to 0.8 mm by adjusting working parameters; There are two shaping rollers (2), and the thin product (6) is conveyed in a Z shape after passing through the two shaping rollers (2) in sequence, and the shaping rollers (2) are provided with angle sensors; A distance meter (3) is respectively provided on the outer side of the two shaping rollers (2), the measuring end of the first distance meter (3) faces the back side of the thin product (6), and the measuring end of the second distance meter (3) faces the front side of the thin product (6); The central processor (4) is used to receive data signals from the angle sensor and the two rangefinders (3), obtain the position of debris on the surface of the thin product (6) after calculation and processing, and transmit it to the marker (5); The marker (5) is used to mark debris on the surface of a thin product (6).

7. The rubber internal debris inspection device according to claim 6, characterized in that: The distance meter (3) is a sonic distance meter or a grating distance meter.

8. The rubber internal debris inspection device according to claim 6, characterized in that: The central processing unit (4) comprises: a data interface (41), a distance measurement data cleaning unit (42), a distance measurement data analysis unit (43), a position data processing unit (44) and an instruction output unit (45), wherein the data interface (41) is used to receive data; The distance measurement data cleaning unit (42) is used to clean the distance data output by the distance meter (3); The data analysis unit (43) is used to determine whether there are foreign objects on the surface of the thin product (6) based on the distance data after cleaning; The position data processing unit (44) is used to process the position data output by the angle sensor and calculate the position information of the debris when it is determined that debris exists on the surface of the thin product (6); The instruction output unit (45) is used to send a marking instruction to the marker (5) according to the position information of the debris.

9. The rubber internal debris inspection device according to claim 8, characterized in that: The central processor (4) also includes: a database (46), wherein the database (46) is used to store distance data types when there are debris on the surface of the thin product (6), and each data type has a corresponding label or classification identifier.

10. The rubber internal debris inspection device according to claim 8, characterized in that: The data analysis unit (43) is composed of a range analysis module (431), a reproducibility analysis module (432) and a harmonic analysis module (433).

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