Ultrahigh vacuum sample holder and sample testing method

Abstract

The invention provides an ultrahigh vacuum sample holder and a sample testing method. The ultrahigh vacuum sample support comprises a connecting piece, a first supporting plate and a second supporting plate, the first supporting plate is connected with the connecting piece, the second supporting plate is rotationally connected with the connecting piece, and the second supporting plate can rotate to be overlapped with the first supporting plate. According to the ultrahigh vacuum sample support, surface modification and performance testing can be rapidly carried out under the condition that a sample is not replaced, the experiment time and cost are greatly saved, and the vacuum environment is prevented from being damaged.

Description

Technical Field

[0001] The invention belongs to the technical field of ultra-high vacuum, and in particular relates to a sample holder suitable for an ultra-high vacuum environment. Background Art

[0002] The background of ultra-high vacuum sample transfer technology is usually closely related to scientific research and industrial production activities carried out in ultra-high vacuum environments. In these activities, it is often necessary to use a vacuum chamber and use internal mechanical devices to transfer and store samples. Ultra-high vacuum environment usually refers to a pressure range of 10 -7 to 10 -12 mbar, such an environment requires that the sample holder inside the chamber must not only ensure structural stability but also facilitate the grabbing, transfer and release of samples.

[0003] Existing vacuum mechanical devices can usually only handle sample holders of one shape, but in actual applications, it may be necessary to use two sample holders of different shapes in one chamber at the same time and transfer them to different experimental equipment for measurement. The shortcomings of existing ultra-high vacuum sample holder technology mainly include the following points: 1. Frequent chamber exposure: In order to replace different types of sample holders, the ultra-high vacuum chamber needs to be exposed to the atmosphere, which not only increases the risk of chamber contamination, but also prolongs the time and cost required to re-establish the vacuum environment. 2. Inefficiency: Due to the above reasons, the sample holder replacement process is time-consuming and inefficient, which directly affects the overall progress of experiments and production. 3. Increased costs: After each cavity exposure, re-vacuuming, baking, degassing and other operations are required, which not only increases time costs, but also increases energy and maintenance costs. Summary of the invention

[0004] The technical problem solved by the present invention is: how to provide an ultra-high vacuum sample holder which can avoid frequent replacement, reduce operating costs and improve efficiency.

[0005] The present application provides an ultra-high vacuum sample holder, the ultra-high vacuum sample holder comprising:

[0006] Connectors;

[0007] a first supporting plate, the first supporting plate being connected to the connecting member;

[0008] The second support plate is rotatably connected to the connecting member, and the second support plate can be rotated to overlap with the first support plate.

[0009] Optionally, the first support plate is detachably connected to the connecting member.

[0010] Optionally, the connector is provided with a slot, and the first support plate is plug-in connected to the slot.

[0011] Optionally, the second supporting plate has a rotating shaft, and the connecting member is provided with two opposite fixing ears, and the rotating shaft is rotatably connected to the fixing ears.

[0012] Optionally, a first operating portion is provided at one end of the first supporting plate away from the connecting member, and the first operating portion is used to connect to a robotic arm.

[0013] Optionally, a second operating portion is provided at one end of the second support plate away from the connecting member, and the second operating portion is used for connecting to a robotic arm.

[0014] The present application also provides a sample testing method for an ultra-high vacuum sample holder, the sample testing method comprising:

[0015] loading the initial sample onto the first tray and the modified sample onto the second tray;

[0016] performing an initial test on the initial sample;

[0017] The second support plate is rotated so that the modified sample overlaps with the initial sample, and a second test is performed.

[0018] The ultra-high vacuum sample holder and sample testing method provided by the present application have the following technical effects:

[0019] The ultra-high vacuum sample holder can realize rapid surface modification and performance testing without changing the sample, greatly saving experimental time and cost and avoiding damage to the vacuum environment. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 is a schematic diagram of an ultra-high vacuum sample holder according to one or more embodiments;

[0021] Figure 2 is a schematic diagram of a connector according to one or more embodiments;

[0022] Figure 3 is a schematic diagram of a second support plate according to one or more embodiments;

[0023] Figure 4 is a schematic diagram of a first tray according to one or more embodiments.

[0024] The corresponding relationship between the reference numerals and the component names is as follows:

[0025] 10-connecting member, 20-first supporting plate, 21-first operating part, 30-second supporting plate, 31-rotating shaft, 32-second operating part. DETAILED DESCRIPTION

[0026] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0027] Before describing the various embodiments of the present application in detail, the technical concept of the present application is first briefly described: At present, there is often a demand for a needle to distinguish the properties of the prepared sample after superposition and compounding with other reagents, which often requires two sample transfers, increasing the risk of exposure to the ultra-high vacuum cavity and reducing operating efficiency. To this end, the present application provides an ultra-high vacuum sample holder and a sample testing method, which uses a first pallet to load an initial sample and a second pallet to load a modified sample. After the initial test, the modified sample is superimposed on the initial sample by rotating the second pallet, and then a secondary test is performed. In this way, there is no need for a secondary sample transfer, which avoids frequent exposure of the ultra-vacuum cavity and improves the test efficiency. The specific principles of the ultra-high vacuum sample holder and sample testing method of the present application are described below in conjunction with more embodiments.

[0028] Specifically, if Figure 1 , Figure 2 , Figure 3 , Figure 4 As shown, the ultra-high vacuum sample holder of the first embodiment includes a connecting member 10, a first support plate 20, and a second support plate 30. The first support plate 20 is connected to the connecting member 10, and the second support plate 30 is rotatably connected to the connecting member 10, and the second support plate 30 can be rotated to overlap with the first support plate 20, that is, the ultra-high vacuum sample holder is an open-and-close sample holder, and different samples are loaded on the two support plates respectively. A composite sample is obtained by overlapping the two support plates, so that other reagents or samples can be directly superimposed in an ultra-high vacuum environment, and the initial test and the secondary test can be completed, thereby improving the operating efficiency.

[0029] In one or more embodiments, the first support plate 20 is detachably connected to the connector 10, so that it is easy to replace and adapt different first support plates 20. Exemplarily, the connector 10 is provided with a card slot 11, and the first support plate 20 is pluggably connected to the card slot 11, and the first support plate 20 adopts a flag-shaped support.

[0030] In one or more embodiments, the second support plate 30 has a rotating shaft 31, and the connecting member 10 is provided with two opposite fixing ears 12. The rotating shaft 31 is rotatably connected to the fixing ears 12 to realize the rotation of the second support plate 30 and maintain the structural stability and operational convenience during the rotation process.

[0031] Further, a first operating portion 21 is provided at one end of the first support plate 20 away from the connecting member 10, and the first operating portion 21 is used to connect to a mechanical arm, so as to facilitate operations such as transporting the first support plate 20. Exemplarily, a second operating portion 32 is provided at one end of the second support plate 30 away from the connecting member, and the second operating portion is used to connect to a mechanical arm, so as to facilitate operations such as rotating the second support plate 30.

[0032] This embodiment also provides a sample testing method based on the above-mentioned ultra-high vacuum sample holder, and the sample testing method includes:

[0033] Step S10: loading the initial sample onto the first support plate 20 and loading the modified sample onto the second support plate 30;

[0034] Step S20: performing an initial test on the initial sample;

[0035] Step S30: rotating the second support plate 30 so that the modified sample overlaps with the initial sample, and performing a secondary test.

[0036] Nanomaterials have shown wide application potential in catalysis, sensing, energy storage and other fields due to their unique size and surface effects. Surface modification is one of the important means to regulate the performance of nanomaterials. The following study will study the effects of different surface modification layers on the electrochemical properties of nanomaterials, such as improving their cycle stability and specific capacity as electrode materials for lithium-ion batteries.

[0037] 1. Preparation of initial samples: First, prepare nanomaterials with certain morphology and size, such as titanium dioxide nanotube arrays, as negative electrode materials for lithium-ion batteries.

[0038] 2. Use of the first support plate 20 : loading the prepared titanium dioxide nanotube array onto the first support plate 20 .

[0039] 3. Surface modification: The modification reagent to be superimposed, such as lithium cobalt oxide (LiCoO2) or lithium iron phosphate (LiFePO4) nanoparticles, is fixed on the lower surface of the second support plate 30 .

[0040] 4. Characterization and testing: First, the surface of the initial titanium dioxide nanotube array is characterized using a VT MEB-STM instrument to analyze its surface morphology and electronic structure. Then, the first support plate 20 and the second support plate 30 are superimposed, and after the modification layer is directly superimposed on the initial sample, the characterization is performed again to study the effect of the modification layer on the surface properties of the nanotubes.

[0041] 5. Performance testing: The modified samples are subjected to electrochemical performance tests, including cyclic voltammetry tests, constant potential charge and discharge tests, etc., to evaluate the improvement effect of the modification layer on the performance of the electrode material.

[0042] 6. Data analysis: By comparing the electrochemical performance data before and after modification, analyze the specific effects of different modification layers on the performance of nanomaterials, such as improving cycle stability and increasing specific capacity.

[0043] Expected results: Through this innovative sample holder design, researchers can quickly perform surface modification and performance testing without changing samples, greatly saving experimental time and cost. At the same time, this continuous characterization and testing process helps to more accurately evaluate the impact of surface modification on the performance of nanomaterials, providing an effective experimental means for the development of high-performance nanomaterials.

[0044] Compared with the traditional sample holder, the ultra-high vacuum sample holder provided in this embodiment has the following significant advantages:

[0045] 1. Improve operational efficiency: This embodiment allows other reagents or samples to be directly superimposed on the initial sample without replacing the sample holder, thereby avoiding frequent sample replacement and sample transfer operations, which greatly reduces the experimental preparation time and improves the overall operational efficiency.

[0046] 2. Reduce damage to the vacuum environment: Since there is no need to frequently expose the ultra-high vacuum chamber to the atmosphere for replacement of the sample holder, this embodiment reduces damage to the vacuum environment, maintains the cleanliness of the chamber, and avoids possible contamination.

[0047] 3. Reduce operating costs: By reducing the number of sample replacements and shortening the time it takes to build a vacuum environment, the sample holder of this embodiment helps reduce operating costs associated with ultra-high vacuum sample transfer.

[0048] 4. Improve sample processing flexibility: The sample holder design of this embodiment allows a variety of sample processing and characterization to be performed on the same sample holder, increasing the flexibility and diversity of the experiment.

[0049] 5. Structural stability: Through the cooperation of the shaft assembly and the slot, the ultra-high vacuum sample holder design of this embodiment ensures structural stability, and can ensure safe and stable transmission of samples even in an ultra-high vacuum environment.

[0050] 6. Continuous characterization capability: By directly stacking other reagents or samples on the sample holder, this embodiment allows continuous characterization and testing of the same sample, which is very useful for studying the dynamic changes and reaction processes of the sample.

[0051] 7. Reduce sample loss: Since there is no need to frequently grab, transfer and release samples, the ultra-high vacuum sample holder of this embodiment helps to reduce sample loss during operation.

[0052] 8. Improve experimental repeatability: By reducing variables in the sample processing process, this embodiment helps to improve the repeatability and reliability of the experiment.

[0053] In general, the ultra-high vacuum sample holder of this embodiment brings significant improvements and advantages to the ultra-high vacuum sample transfer technology by improving operating efficiency, reducing vacuum environment damage, reducing operating costs, and improving sample processing flexibility and structural stability.

[0054] The specific implementation methods of the present invention are described in detail above. Although some embodiments have been shown and described, those skilled in the art should understand that these embodiments can be modified and improved without departing from the principles and spirit of the present invention, the scope of which is defined by the claims and their equivalents. These modifications and improvements should also be within the scope of protection of the present invention.

Claims

1. An ultra-high vacuum sample holder, characterized in that: The ultra-high vacuum sample holder comprises: Connectors; a first supporting plate, the first supporting plate being connected to the connecting member; The second support plate is rotatably connected to the connecting member, and the second support plate can be rotated to overlap with the first support plate.

2. The ultra-high vacuum sample holder according to claim 1, characterized in that: The first supporting plate is detachably connected to the connecting member.

3. The ultra-high vacuum sample holder according to claim 2, characterized in that: The connecting piece is provided with a slot, and the first supporting plate is plug-in connected to the slot.

4. The ultra-high vacuum sample holder according to claim 1, characterized in that: The second supporting plate has a rotating shaft, and the connecting member is provided with two opposite fixing ears, and the rotating shaft is rotatably connected to the fixing ears.

5. The ultra-high vacuum sample holder according to claim 1, characterized in that: A first operating portion is provided at one end of the first supporting plate away from the connecting member, and the first operating portion is used for connecting to a robotic arm.

6. The ultra-high vacuum sample holder according to claim 1, characterized in that: A second operating portion is provided at one end of the second supporting plate away from the connecting member, and the second operating portion is used for connecting to the robot arm.

7. A sample testing method based on the ultra-high vacuum sample holder according to any one of claims 1 to 6, characterized in that: The sample testing method includes: loading the initial sample onto the first tray and the modified sample onto the second tray; performing an initial test on the initial sample; The second support plate is rotated so that the modified sample overlaps with the initial sample, and a second test is performed.

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