Capacitor defect identification and detection method, system, equipment and medium

Abstract

The invention relates to the technical field of electronic components, in particular to a capacitor defect identification and detection method, system and device and a medium, and the capacitor defect identification and detection method comprises the steps: obtaining test environment data and to-be-detected capacitor information, and determining test parameters based on the test environment data and the to-be-detected capacitor information; obtaining ultrasonic data according to the test parameters, and obtaining capacitance detection data based on the ultrasonic data; generating a capacitance analysis image based on the capacitance detection data, and inputting the capacitance analysis image into a preset image analysis model to obtain capacitance defect data; and generating a capacitance detection report according to the capacitance defect data, and sending the capacitance detection report to a client terminal. The method has the advantages that the capacitor defect recognition precision is improved in the underwater environment, real-time visual feedback is achieved, and the overall detection work efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic components, and in particular to a capacitor defect identification and detection method, system, equipment and medium. Background Art

[0002] Traditional capacitor inspection methods mostly rely on manual visual inspection or simple electrical testing, which makes it difficult to detect tiny defects inside the capacitor. For non-destructive testing of capacitors in underwater environments, traditional ultrasonic or magnetic particle testing methods are also often used. Although this method has certain practicality, it has obvious deficiencies in positioning accuracy, visual presentation, and batch inspection efficiency, and is difficult to meet the high-quality and high-efficiency requirements of modern industrial production.

[0003] Existing underwater capacitor inspection mainly relies on a single ultrasonic reflection technology, which determines whether there are internal defects by analyzing the reflected echo.

[0004] However, this method is affected by the small differences in the internal material properties of the capacitor, and it is difficult to accurately distinguish tiny defects. It is also unable to display the defect situation in real time, making it difficult for operators to make quick judgments. In addition, the lack of an effective batch inspection mechanism leads to low inspection efficiency, which seriously affects production progress and cost-effectiveness. Therefore, there is room for improvement. Summary of the invention

[0005] In order to improve the accuracy of capacitor defect identification in an underwater environment, realize real-time visual feedback, and improve the overall detection efficiency, the present application provides a capacitor defect identification detection method, system, equipment and medium.

[0006] The above-mentioned invention objective of the present application is achieved through the following technical solutions: A capacitor defect identification and detection method, the capacitor defect identification and detection method comprising the steps of: Acquire test environment data and information about the capacitor to be tested, and determine test parameters based on the test environment data and information about the capacitor to be tested; Acquire ultrasonic data according to the test parameters, and acquire capacitance detection data based on the ultrasonic data; Generate a capacitance analysis image based on the capacitance detection data, and input the capacitance analysis image into a preset image analysis model to obtain capacitance defect data; A capacitor detection report is generated according to the capacitor defect data, and the capacitor detection report is sent to a customer terminal.

[0007] By adopting the above technical scheme, during the underwater detection of the capacitor, the capacitor to be tested is placed in the test waters, in which an ultrasonic sensor matrix, a high-definition camera and a water environment monitoring sensor are pre-set, and the water environment monitoring sensors, such as temperature sensors, pressure sensors and water flow rate sensors, are used to obtain the test environment data in real time. The test environment data refers to the water temperature, water pressure, water flow rate, direction and other data in the test waters. The high-definition camera can be used to obtain the capacitor information to be tested in real time. The capacitor information to be tested refers to the actual geometric shape and material characteristics of the capacitor to be tested. The test parameters are determined according to the test environment data and the capacitor information to be tested. The test parameters refer to the specific setting parameters of the ultrasonic sensor matrix, which can dynamically adjust the ultrasonic sensor matrix according to the current test environment and the characteristics of the capacitor to be tested. The test parameters of the ultrasonic sensor can improve the accuracy of the test results. According to the set test parameters, the ultrasonic sensor matrix will emit an ultrasonic beam to the capacitor to be tested, obtain the reflected ultrasonic data, form capacitor detection data, and generate a corresponding capacitor analysis image based on the capacitor detection data. The obtained capacitor analysis image is input into the preset image analysis model, and the generated capacitor detection image is analyzed by the image analysis model to extract the capacitor defect data. The capacitor defect data refers to the location and specific information of the defects in the capacitor to be tested. A capacitor detection report is generated based on the obtained capacitor defect data and sent to the customer terminal, so that the tester can intuitively check the capacitor detection report, improve the accuracy of capacitor defect recognition in an underwater environment, realize real-time visual feedback, and improve the overall detection work efficiency.

[0008] In a preferred example, the present application may be further configured as follows: the acquiring of the test environment data and the capacitance information to be measured, and determining the test parameters based on the test environment data and the capacitance information to be measured specifically include: Inputting the test environment data into a preset wave velocity relationship model to obtain a wave velocity correction value; Acquire an ultrasonic direction correction value according to the capacitance information to be measured; The test parameters are determined based on the wave velocity correction value and the ultrasonic direction correction value.

[0009] By adopting the above technical scheme, in the acquired test environment data, a preset wave speed relationship model is used to obtain a wave speed correction value according to the test environment data. The wave speed relationship model refers to an analysis model used to correct the propagation speed of ultrasonic waves according to the test environment data. The ultrasonic direction correction value is determined according to the capacitance information to be tested, and the test parameters are determined according to the wave speed correction value and the ultrasonic direction correction value. The test parameters of the ultrasonic sensor matrix are automatically adjusted according to the capacitance to be tested and the test environment, which is beneficial to improving the underwater detection accuracy of capacitance.

[0010] In a preferred example, the present application can be further configured as follows: the test environment data is input into a preset wave velocity relationship model to obtain a wave velocity correction value, specifically including: Acquire water temperature data and water pressure data based on the test environment data, input the water temperature data into a preset temperature-velocity relationship model, and generate a first wave velocity correction value; Inputting the water pressure data into a preset water pressure-wave speed relationship model to generate a second wave speed correction value; A wave speed correction value is determined based on the first wave speed correction value and the second wave speed correction value.

[0011] By adopting the above technical scheme, water temperature data and water pressure data are extracted from the test environment data, the water temperature data refers to the water temperature in the test water area, the water pressure data refers to the water pressure in the test water area, the temperature-velocity relationship model refers to a model used to correct the propagation velocity of ultrasonic waves at the water temperature according to the difference in water temperature, and the water pressure-velocity relationship model refers to a model used to correct the propagation velocity of ultrasonic waves according to the change in water pressure in the water area. The water temperature data and the water pressure data are respectively input into the temperature-velocity relationship model and the water pressure-velocity relationship model, and a first wave velocity correction value under the water temperature data and a second wave velocity correction value under the water pressure data are obtained. The wave velocity correction value is determined according to the first wave velocity correction value and the second wave velocity correction value, so as to realize the function of automatically adjusting the wave velocity of ultrasonic waves according to the water temperature and the water pressure.

[0012] In a preferred example, the present application may be further configured as follows: before acquiring capacitance detection data based on the ultrasonic data, the capacitor defect recognition and detection method further includes: After receiving the ultrasonic reflection signal, ultrasonic data is formed, and the ultrasonic data is subjected to denoising and filtering processing to form processed ultrasonic data; Capacitance detection data is generated based on the processed ultrasonic data.

[0013] By adopting the above technical solution, after receiving the ultrasonic signal after the ultrasonic wave emitted by the ultrasonic sensor matrix is ​​reflected by the capacitor to be tested and the ultrasonic data is formed, the ultrasonic data is subjected to denoising and filtering processing, and the interference data generated by the noise in the ultrasonic signal can be removed. Usually, the propagation of ultrasonic waves in the test water area will cause different degrees of interference due to the water quality of the test water area. Therefore, after receiving the ultrasonic reflection signal, the generated ultrasonic data is immediately subjected to denoising and filtering processing, which can eliminate the influence of the water quality in the current test water area on the ultrasonic propagation. The processed ultrasonic data is used to generate the corresponding capacitance detection data, which can improve the accuracy of the results of the capacitance detection in water.

[0014] In a preferred example, the present application may be further configured as follows: the step of acquiring ultrasonic data according to the test parameters and acquiring capacitance detection data based on the ultrasonic data specifically includes: Acquire a plurality of path angle data based on the capacitance information to be measured, and calculate a plurality of ultrasonic data according to the plurality of path angle data and test parameters; The plurality of ultrasonic data are averaged to obtain capacitance detection data.

[0015] By adopting the above technical solution, in the process of detecting capacitance in water, multi-path ultrasonic emission detection will be performed on the capacitance to be tested, that is, the ultrasonic sensor matrix will emit ultrasonic signals at different angles according to the geometric shape of the capacitance to be tested to form multiple different ultrasonic propagation paths, and multiple path angle data will be determined according to the capacitance information to be tested. The path angle data refers to the sound channel angle of the ultrasonic wave during the propagation process. Using each path angle data and test parameters, multiple ultrasonic data are calculated, and the multiple ultrasonic data are averaged to obtain capacitance detection data. Multi-path detection is used to further improve the accuracy of the capacitance detection result.

[0016] In a preferred example, the present application may be further configured as follows: generating a capacitance analysis image based on the capacitance detection data, inputting the capacitance analysis image into a preset image analysis model, and obtaining capacitance defect data, specifically including: Performing digital-to-analog conversion on the capacitance detection data to obtain a capacitance analysis image corresponding to the capacitance to be measured; The capacitance analysis image is input into a preset image analysis model, hot spot information in the capacitance analysis image is identified, and the hot spot information is used as capacitance defect data.

[0017] By adopting the above technical solution, after receiving the reflected ultrasonic wave and forming the corresponding capacitance detection data, the capacitance detection data is converted into digital-to-analog mode to generate a capacitance analysis image corresponding to the capacitor to be tested, and the capacitance analysis image is input into a preset image analysis model. Because the capacitance detection data generated by the reflection formed by the ultrasonic wave at the defective part of the capacitor is different from that at the normal part, the image analysis model is used to distinguish the thermal values ​​in the formed capacitance analysis image, that is, the hot spot mark is made for the abnormal data part in the capacitance detection image to form hot spot information, and all the hot spot information is used as capacitance defect data to realize the function of capacitance defect detection and analysis.

[0018] The second object of the invention is achieved by the following technical solutions: A capacitor defect recognition and detection system, the capacitor defect recognition and detection system comprising: A test parameter determination module, used to obtain test environment data and capacitor information to be measured, and determine test parameters based on the test environment data and capacitor information to be measured; A capacitance detection data acquisition module, used to acquire ultrasonic data according to the test parameters, and acquire capacitance detection data based on the ultrasonic data; A capacitor defect analysis module, used to generate a capacitor analysis image based on the capacitor detection data, and input the capacitor analysis image into a preset image analysis model to obtain capacitor defect data; The detection report generating module is used to generate a capacitor detection report according to the capacitor defect data, and send the capacitor detection report to the client terminal.

[0019] By adopting the above technical scheme, during the underwater detection of the capacitor, the capacitor to be tested is placed in the test waters, in which an ultrasonic sensor matrix, a high-definition camera and a water environment monitoring sensor are pre-set, and the water environment monitoring sensors, such as temperature sensors, pressure sensors and water flow rate sensors, are used to obtain the test environment data in real time. The test environment data refers to the water temperature, water pressure, water flow rate, direction and other data in the test waters. The high-definition camera can be used to obtain the capacitor information to be tested in real time. The capacitor information to be tested refers to the actual geometric shape and material characteristics of the capacitor to be tested. The test parameters are determined according to the test environment data and the capacitor information to be tested. The test parameters refer to the specific setting parameters of the ultrasonic sensor matrix, which can dynamically adjust the ultrasonic sensor matrix according to the current test environment and the characteristics of the capacitor to be tested. The test parameters of the ultrasonic sensor can improve the accuracy of the test results. According to the set test parameters, the ultrasonic sensor matrix will emit an ultrasonic beam to the capacitor to be tested, obtain the reflected ultrasonic data, form capacitor detection data, and generate a corresponding capacitor analysis image based on the capacitor detection data. The obtained capacitor analysis image is input into the preset image analysis model, and the generated capacitor detection image is analyzed by the image analysis model to extract the capacitor defect data. The capacitor defect data refers to the location and specific information of the defects in the capacitor to be tested. A capacitor detection report is generated based on the obtained capacitor defect data and sent to the customer terminal, so that the tester can intuitively check the capacitor detection report, improve the accuracy of capacitor defect recognition in an underwater environment, realize real-time visual feedback, and improve the overall detection work efficiency.

[0020] The third objective of the present application is achieved through the following technical solutions: A computer device comprises a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above capacitor defect identification and detection method when executing the computer program.

[0021] The fourth objective of the present application is achieved through the following technical solutions: A computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the above-mentioned capacitor defect identification and detection method are implemented.

[0022] In summary, the present application includes at least one of the following beneficial technical effects: 1. During the underwater inspection of capacitors, the capacitor to be tested is placed in the test waters. The test waters are pre-set with ultrasonic sensor matrices, high-definition cameras and water environment monitoring sensors. Water environment monitoring sensors such as temperature sensors, pressure sensors and water flow rate sensors are used to obtain test environment data in real time. Test environment data refers to water temperature, water pressure, water flow rate, direction and other data in the test waters. High-definition cameras can be used to obtain the capacitor information to be tested in real time. The capacitor information to be tested refers to the actual geometric shape and material characteristics of the capacitor to be tested. Test parameters are determined based on the test environment data and the capacitor information to be tested. Test parameters refer to the specific setting parameters of the ultrasonic sensor matrix, which can dynamically adjust the ultrasonic sensor according to the current test environment and the characteristics of the capacitor to be tested. Test parameters, improve the accuracy of test results. According to the set test parameters, the ultrasonic sensor matrix will emit an ultrasonic beam to the capacitor to be tested, obtain the reflected ultrasonic data, form capacitor detection data, generate a corresponding capacitor analysis image according to the capacitor detection data, input the obtained capacitor analysis image into the preset image analysis model, use the image analysis model to analyze the generated capacitor detection image, and extract the capacitor defect data. The capacitor defect data refers to the location and specific information of the defect in the capacitor to be tested. A capacitor detection report is generated based on the obtained capacitor defect data and sent to the customer terminal, so that the tester can intuitively check the capacitor detection report, improve the accuracy of capacitor defect recognition in an underwater environment, realize real-time visual feedback, and improve the overall detection work efficiency; 2. In the acquired test environment data, a wave velocity correction value is obtained according to the test environment data using a preset wave velocity relationship model. The wave velocity relationship model refers to an analysis model used to correct the propagation speed of the ultrasonic wave according to the test environment data. The ultrasonic direction correction value is determined according to the capacitance information to be tested. The test parameters are determined according to the wave velocity correction value and the ultrasonic direction correction value. The test parameters of the ultrasonic sensor matrix are automatically adjusted according to the capacitance to be tested and the test environment, which is conducive to improving the underwater detection accuracy of the capacitance. 3. After receiving the ultrasonic signal emitted by the ultrasonic sensor matrix and reflected by the capacitor to be tested to form ultrasonic data, the ultrasonic data is subjected to denoising and filtering processing to remove the interference data generated by the noise in the ultrasonic signal. Usually, the propagation of ultrasonic waves in the test water area will cause different degrees of interference due to the water quality of the test water area. Therefore, after receiving the ultrasonic reflection signal, the generated ultrasonic data is immediately subjected to denoising and filtering processing to eliminate the influence of the water quality in the current test water area on the propagation of ultrasonic waves. The corresponding capacitance detection data is generated by using the processed ultrasonic data, which can improve the accuracy of the results of the detection of capacitance in water; 4. In the process of detecting capacitance in water, multi-path ultrasonic emission detection will be performed on the capacitance to be tested, that is, the ultrasonic sensor matrix will emit ultrasonic signals at different angles according to the geometric shape of the capacitance to be tested to form multiple different ultrasonic propagation paths, and multiple path angle data will be determined according to the capacitance information to be tested. The path angle data refers to the sound channel angle of the ultrasonic wave during the propagation process. Using each path angle data and test parameters, multiple ultrasonic data are calculated, and the multiple ultrasonic data are averaged to obtain capacitance detection data. Multi-path detection is used to further improve the accuracy of the capacitance detection results. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 is a flow chart of a capacitor defect identification and detection method in one embodiment of the present application; Figure 2 is a flowchart for implementing step S10 in the capacitor defect identification and detection method in one embodiment of the present application; Figure 3 is a flowchart for implementing step S11 in a capacitor defect identification and detection method in one embodiment of the present application; Figure 4 is another implementation flow chart of the capacitor defect identification and detection method in one embodiment of the present application; Figure 5 is a flowchart for implementing step S20 in the capacitor defect identification and detection method in one embodiment of the present application; Figure 6 is a flowchart for implementing step S30 in the capacitor defect identification and detection method in one embodiment of the present application; Figure 7 This is a principle block diagram of a capacitor defect identification and detection system in one embodiment of the present application; Figure 8 It is a schematic diagram of a computer device in one embodiment of the present application. DETAILED DESCRIPTION

[0024] The present application is further described in detail below in conjunction with the accompanying drawings.

[0025] In one embodiment, if Figure 1 As shown, the present application discloses a capacitor defect identification and detection method, which specifically includes the following steps: S10: Acquire test environment data and information about the capacitor to be measured, and determine test parameters based on the test environment data and information about the capacitor to be measured.

[0026] In this embodiment, the test environment data refers to data such as water temperature, water pressure, water flow rate, direction, etc. in the test water area, and the capacitance information to be tested refers to information such as the actual geometric shape and material characteristics of the capacitor to be tested.

[0027] Specifically, during the underwater inspection of the capacitor, the capacitor to be tested is placed in the test waters, in which an ultrasonic sensor matrix, a high-definition camera and a water environment monitoring sensor are pre-installed. The water environment monitoring sensors, such as temperature sensors, pressure sensors and water flow rate sensors, are used to obtain real-time data such as water temperature, water pressure, water flow rate, direction, etc. in the test waters.

[0028] Furthermore, by using a high-definition camera to obtain information such as the actual geometric shape and material properties of the capacitor to be tested in real time, the test parameters of the ultrasonic sensor can be dynamically adjusted according to the current test environment and the characteristics of the capacitor to be tested, thereby improving the accuracy of the test results.

[0029] S20: Acquire ultrasonic data according to the test parameters, and acquire capacitance detection data based on the ultrasonic data Specifically, according to the set test parameters, the ultrasonic sensor matrix will emit an ultrasonic beam to the capacitor to be tested, obtain the reflected ultrasonic data, and form capacitance detection data.

[0030] S30: generating a capacitance analysis image based on the capacitance detection data, and inputting the capacitance analysis image into a preset image analysis model to obtain capacitance defect data.

[0031] In this embodiment, the capacitor defect data refers to the location and specific information of the defect in the capacitor to be tested.

[0032] Specifically, a corresponding capacitance analysis image is generated according to the capacitance detection data, the acquired capacitance analysis image is input into a preset image analysis model, the generated capacitance detection image is analyzed using the image analysis model, and the capacitance defect data is extracted.

[0033] S40: Generate a capacitor detection report according to the capacitor defect data, and send the capacitor detection report to a customer terminal.

[0034] Specifically, a capacitor detection report is generated according to the obtained capacitor defect data and sent to the client terminal, so that the tester can intuitively check the capacitor detection report.

[0035] In this embodiment, during the underwater detection of the capacitor, the capacitor to be tested is placed in a test water area, in which an ultrasonic sensor matrix, a high-definition camera and a water environment monitoring sensor are pre-set. The water environment monitoring sensors, such as a temperature sensor, a pressure sensor and a water flow rate sensor, are used to obtain test environment data in real time. The test environment data refers to the water temperature, water pressure, water flow rate, direction and other data in the test water area. The high-definition camera can be used to obtain the capacitor information to be tested in real time. The capacitor information to be tested refers to the actual geometric shape and material characteristics of the capacitor to be tested. The test parameters are determined according to the test environment data and the capacitor information to be tested. The test parameters refer to the specific setting parameters of the ultrasonic sensor matrix, which can dynamically adjust the ultrasonic sensor matrix according to the current test environment and the characteristics of the capacitor to be tested. The ultrasonic sensor matrix transmits ultrasonic beams to the capacitor to be tested according to the set test parameters, obtains the reflected ultrasonic data, forms capacitor detection data, generates corresponding capacitor analysis images according to the capacitor detection data, inputs the obtained capacitor analysis images into the preset image analysis model, uses the image analysis model to analyze the generated capacitor detection images, and extracts capacitor defect data. The capacitor defect data refers to the location and specific information of defects in the capacitor to be tested. A capacitor detection report is generated according to the obtained capacitor defect data and sent to the customer terminal, so that the test personnel can intuitively check the capacitor detection report, improve the accuracy of capacitor defect recognition in underwater environment, realize real-time visual feedback, and improve the overall detection work efficiency.

[0036] In one embodiment, if Figure 2 As shown, in step S10, the test environment data and the capacitance information to be measured are obtained, and the test parameters are determined based on the test environment data and the capacitance information to be measured, which specifically includes: S11: Input the test environment data into a preset wave speed relationship model to obtain a wave speed correction value.

[0037] Specifically, in the acquired test environment data, a wave velocity correction value is obtained according to the test environment data using a preset wave velocity relationship model. The wave velocity relationship model refers to an analysis model for correcting the propagation velocity of ultrasonic waves according to the test environment data.

[0038] S12: Obtaining an ultrasonic direction correction value according to the capacitance information to be measured.

[0039] Specifically, according to the geometric shape and material of the capacitor to be tested, the correction data of the ultrasonic direction, that is, the direction and angle of the ultrasonic sensor emitting the ultrasonic wave, etc. are determined.

[0040] S13: Determine test parameters based on the wave velocity correction value and the ultrasonic direction correction value.

[0041] Specifically, the test parameters are determined according to the wave velocity correction value and the ultrasonic direction correction value, so that the test parameters of the ultrasonic sensor matrix can be automatically adjusted according to the capacitance to be tested and the test environment, which is beneficial to improving the underwater detection accuracy of the capacitance.

[0042] In one embodiment, if Figure 3 As shown, in step S11, the test environment data is input into a preset wave velocity relationship model to obtain a wave velocity correction value, which specifically includes: S111: Acquire water temperature data and water pressure data based on the test environment data, input the water temperature data into a preset temperature-velocity relationship model, and generate a first wave velocity correction value.

[0043] S112: Inputting the water pressure data into a preset water pressure-wave speed relationship model to generate a second wave speed correction value.

[0044] S113: Determine a wave speed correction value based on the first wave speed correction value and the second wave speed correction value.

[0045] Specifically, water temperature data and water pressure data are extracted from the test environment data, the water temperature data refers to the water temperature in the test water area, the water pressure data refers to the water pressure in the test water area, the temperature-velocity relationship model refers to a model used to correct the propagation velocity of ultrasonic waves at the water temperature according to the difference in water temperature, and the water pressure-velocity relationship model refers to a model used to correct the propagation velocity of ultrasonic waves according to the change in water pressure in the water area. The water temperature data and the water pressure data are respectively input into the temperature-velocity relationship model and the water pressure-velocity relationship model, and a first wave velocity correction value under the water temperature data and a second wave velocity correction value under the water pressure data are obtained. The wave velocity correction value is determined according to the first wave velocity correction value and the second wave velocity correction value, so as to realize the function of automatically adjusting the wave velocity of ultrasonic waves according to the water temperature and the water pressure.

[0046] In one embodiment, if Figure 4 As shown, before step S20, that is, before obtaining capacitance detection data based on the ultrasonic data, the capacitor defect recognition and detection method further includes: S201: After receiving the ultrasonic reflection signal, ultrasonic data is formed, and the ultrasonic data is subjected to denoising and filtering processing to form processed ultrasonic data.

[0047] S202: Generate capacitance detection data based on the processed ultrasonic data.

[0048] Specifically, after receiving the ultrasonic signal after the ultrasonic wave emitted by the ultrasonic sensor matrix is ​​reflected by the capacitor to be tested and forming ultrasonic data, the ultrasonic data is subjected to denoising and filtering processing, which can remove the interference data generated by the noise in the ultrasonic signal. Usually, the propagation of ultrasonic waves in the test water area will cause different degrees of interference due to the water quality of the test water area. Therefore, after receiving the ultrasonic reflection signal, the generated ultrasonic data is immediately subjected to denoising and filtering processing, which can eliminate the influence of the water quality in the current test water area on the propagation of ultrasonic waves. The processed ultrasonic data is used to generate the corresponding capacitance detection data, which can improve the accuracy of the results of the capacitance detection in water.

[0049] In one embodiment, if Figure 5 As shown, in step S20, ultrasonic data is acquired according to the test parameters, and capacitance detection data is acquired based on the ultrasonic data, which specifically includes: S21: Acquire a plurality of path angle data based on the capacitance information to be measured, and calculate a plurality of ultrasonic data according to the plurality of path angle data and test parameters.

[0050] S22: performing mean processing on the plurality of ultrasonic data to obtain capacitance detection data.

[0051] Specifically, in the process of detecting capacitance in water, multi-path ultrasonic emission detection will be performed on the capacitance to be tested, that is, the ultrasonic sensor matrix will emit ultrasonic signals at different angles according to the geometric shape of the capacitance to be tested to form multiple different ultrasonic propagation paths, and multiple path angle data will be determined according to the capacitance information to be tested. The path angle data refers to the sound channel angle of the ultrasonic wave during the propagation process. Using each path angle data and test parameters, multiple ultrasonic data are calculated, and the multiple ultrasonic data are averaged to obtain capacitance detection data. Multi-path detection is used to further improve the accuracy of the capacitance detection results.

[0052] In one embodiment, if Figure 6 As shown, in step S30, a capacitance analysis image is generated based on the capacitance detection data, and the capacitance analysis image is input into a preset image analysis model to obtain capacitance defect data, which specifically includes: S31: performing digital-to-analog conversion on the capacitance detection data to obtain a capacitance analysis image corresponding to the capacitance to be measured.

[0053] S32: Inputting the capacitance analysis image into a preset image analysis model, identifying hot spot information in the capacitance analysis image, and using the hot spot information as capacitance defect data.

[0054] Specifically, after receiving the reflected ultrasonic wave and forming the corresponding capacitance detection data, the capacitance detection data is converted into digital-to-analog format to generate a capacitance analysis image corresponding to the capacitor to be tested, and the capacitance analysis image is input into a preset image analysis model. Because the capacitance detection data generated by the reflection formed by the ultrasonic wave at the defective part of the capacitor is different from that at the normal part, the image analysis model is used to distinguish the thermal values ​​in the formed capacitance analysis image, that is, the hot spots of the abnormal data are marked in the capacitance detection image to form hot spot information, and all the hot spot information is used as capacitance defect data to realize the function of capacitance defect detection and analysis.

[0055] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0056] In one embodiment, a capacitor defect recognition and detection system is provided, and the capacitor defect recognition and detection system corresponds one-to-one to the capacitor defect recognition and detection method in the above embodiment. Figure 7 As shown, the capacitor defect identification and detection system includes a test parameter determination module, a capacitor detection data acquisition module, a capacitor defect analysis module and a detection report generation module. The detailed description of each functional module is as follows: A test parameter determination module, used to obtain test environment data and capacitor information to be measured, and determine test parameters based on the test environment data and capacitor information to be measured; A capacitance detection data acquisition module, used to acquire ultrasonic data according to the test parameters, and acquire capacitance detection data based on the ultrasonic data; A capacitor defect analysis module, used to generate a capacitor analysis image based on the capacitor detection data, and input the capacitor analysis image into a preset image analysis model to obtain capacitor defect data; The detection report generating module is used to generate a capacitor detection report according to the capacitor defect data, and send the capacitor detection report to the client terminal.

[0057] Optionally, the test parameter determination module includes: A wave speed correction submodule, used for inputting the test environment data into a preset wave speed relationship model to obtain a wave speed correction value; An ultrasonic direction correction submodule, used for obtaining an ultrasonic direction correction value according to the capacitance information to be measured; The parameter generation submodule is used to determine the test parameters based on the wave speed correction value and the ultrasonic direction correction value.

[0058] For the specific definition of the capacitor defect identification and detection system, please refer to the definition of the capacitor defect identification and detection method above, which will not be repeated here. Each module in the above-mentioned capacitor defect identification and detection system can be implemented in whole or in part by software, hardware and a combination thereof. The above-mentioned modules can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory of the computer device in the form of software, so that the processor can call and execute the operations corresponding to the above modules.

[0059] In one embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be as follows: Figure 8 As shown. The computer device includes a processor, a memory, a network interface and a database connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store capacitor water detection data. The network interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a capacitor defect identification and detection method is implemented.

[0060] In one embodiment, a computer device is provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the following steps when executing the computer program: Acquire test environment data and information about the capacitor to be tested, and determine test parameters based on the test environment data and information about the capacitor to be tested; Acquire ultrasonic data according to the test parameters, and acquire capacitance detection data based on the ultrasonic data; Generate a capacitance analysis image based on the capacitance detection data, and input the capacitance analysis image into a preset image analysis model to obtain capacitance defect data; A capacitor detection report is generated according to the capacitor defect data, and the capacitor detection report is sent to a customer terminal.

[0061] In one embodiment, a computer readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented: Acquire test environment data and information about the capacitor to be tested, and determine test parameters based on the test environment data and information about the capacitor to be tested; Acquire ultrasonic data according to the test parameters, and acquire capacitance detection data based on the ultrasonic data; Generate a capacitance analysis image based on the capacitance detection data, and input the capacitance analysis image into a preset image analysis model to obtain capacitance defect data; A capacitor detection report is generated according to the capacitor defect data, and the capacitor detection report is sent to a customer terminal.

[0062] Those of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be implemented by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application may include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

[0063] Those skilled in the art can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example. In actual applications, the above-mentioned functions can be distributed and completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above.

[0064] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A capacitor defect identification and detection method, characterized in that: The capacitor defect identification and detection method comprises the steps of: Acquire test environment data and information about the capacitor to be tested, and determine test parameters based on the test environment data and information about the capacitor to be tested; Acquire ultrasonic data according to the test parameters, and acquire capacitance detection data based on the ultrasonic data; Generate a capacitance analysis image based on the capacitance detection data, and input the capacitance analysis image into a preset image analysis model to obtain capacitance defect data; A capacitor detection report is generated according to the capacitor defect data, and the capacitor detection report is sent to a customer terminal.

2. The capacitor defect detection method according to claim 1, characterized in that: The acquiring of the test environment data and the capacitance information to be measured, and determining the test parameters based on the test environment data and the capacitance information to be measured specifically includes: Inputting the test environment data into a preset wave velocity relationship model to obtain a wave velocity correction value; Acquire an ultrasonic direction correction value according to the capacitance information to be measured; The test parameters are determined based on the wave velocity correction value and the ultrasonic direction correction value.

3. The capacitor defect identification and detection method according to claim 2, characterized in that: The step of inputting the test environment data into a preset wave velocity relationship model to obtain a wave velocity correction value specifically includes: Acquire water temperature data and water pressure data based on the test environment data, input the water temperature data into a preset temperature-velocity relationship model, and generate a first wave velocity correction value; Inputting the water pressure data into a preset water pressure-wave speed relationship model to generate a second wave speed correction value; A wave speed correction value is determined based on the first wave speed correction value and the second wave speed correction value.

4. The capacitor defect identification and detection method according to claim 1, characterized in that: Before acquiring capacitance detection data based on the ultrasonic data, the capacitor defect recognition and detection method further includes: After receiving the ultrasonic reflection signal, ultrasonic data is formed, and the ultrasonic data is subjected to denoising and filtering processing to form processed ultrasonic data; Capacitance detection data is generated based on the processed ultrasonic data.

5. The capacitor defect identification and detection method according to claim 1, characterized in that: The step of acquiring ultrasonic data according to the test parameters and acquiring capacitance detection data based on the ultrasonic data specifically includes: Acquire a plurality of path angle data based on the capacitance information to be measured, and calculate a plurality of ultrasonic data according to the plurality of path angle data and test parameters; The plurality of ultrasonic data are averaged to obtain capacitance detection data.

6. The capacitor defect identification and detection method according to claim 1, characterized in that: Generating a capacitance analysis image based on the capacitance detection data, and inputting the capacitance analysis image into a preset image analysis model to obtain capacitance defect data specifically includes: Performing digital-to-analog conversion on the capacitance detection data to obtain a capacitance analysis image corresponding to the capacitance to be measured; The capacitance analysis image is input into a preset image analysis model, hot spot information in the capacitance analysis image is identified, and the hot spot information is used as capacitance defect data.

7. A capacitor defect identification and detection system, characterized in that: The capacitor defect identification and detection system comprises: A test parameter determination module, used to obtain test environment data and capacitor information to be measured, and determine test parameters based on the test environment data and capacitor information to be measured; A capacitance detection data acquisition module, used to acquire ultrasonic data according to the test parameters, and acquire capacitance detection data based on the ultrasonic data; A capacitor defect analysis module, used to generate a capacitor analysis image based on the capacitor detection data, and input the capacitor analysis image into a preset image analysis model to obtain capacitor defect data; The detection report generating module is used to generate a capacitor detection report according to the capacitor defect data, and send the capacitor detection report to the client terminal.

8. The capacitor defect identification and detection system according to claim 7, characterized in that: The test parameter determination module comprises: A wave speed correction submodule, used for inputting the test environment data into a preset wave speed relationship model to obtain a wave speed correction value; An ultrasonic direction correction submodule, used for obtaining an ultrasonic direction correction value according to the capacitance information to be measured; The parameter generation submodule is used to determine the test parameters based on the wave speed correction value and the ultrasonic direction correction value.

9. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the capacitor defect identification and detection method as described in any one of claims 1 to 6 are implemented.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the steps of a capacitor defect identification and detection method as described in any one of claims 1 to 6 are implemented.

Images