Testing device and testing method of photovoltaic module, data processing device and related equipment

Abstract

The embodiment of the invention provides a photovoltaic module testing device, a photovoltaic module testing method, a data processing device and related equipment. The testing device of the photovoltaic module comprises a power supply module, wherein the first end of the power supply module is electrically connected with the input end of the photovoltaic module; the output end of the current loading module is electrically connected with the second end of the power supply module, and the input end of the current loading module is electrically connected with the output end of the photovoltaic module; the current loading module selectively outputs a first current and a second current, and the second current is smaller than the first current; the voltage monitoring module is connected with the photovoltaic module in parallel; and the shooting module is used for shooting an electroluminescent image of the photovoltaic module under the condition that the current loading module outputs the first current. According to the embodiment of the invention, the photovoltaic module is tested through a two-step method, so that the condition of missing detection due to diode breakdown during electroluminescence testing can be avoided; in addition, whether the photovoltaic module is subjected to diode breakdown or not can be tested after the photovoltaic module is loaded with the first current.

Description

Technical Field

[0001] The present application relates to the technical field of photovoltaic cells and the technical field of testing photovoltaic modules, and in particular to a testing device, a testing method, a data processing device and related equipment for a photovoltaic module. Background Art

[0002] After the production of photovoltaic modules is completed, they need to be subjected to EL testing and IV testing to avoid problems such as hidden cracks, black films, and diode breakdown short circuits in the photovoltaic modules.

[0003] At present, most EL tests use a stabilized power supply to power the photovoltaic module, so that the cell emits light under the action of the current, and the light-emitting image of the cell is captured by a camera to determine the quality of the cell.

[0004] In the above test process, the photovoltaic module needs a large current to generate electroluminescence, and in the process of electroluminescence, each battery string unit is photographed one by one. When the power is turned on for the second and third time to take pictures, if the diode corresponding to the battery string photographed in the previous test is short-circuited, no black string will appear in the EL image, and there will be a missed detection. In addition, there is no guarantee that the photovoltaic module still has good quality after electroluminescence.

[0005] It should be noted that the above content is not necessarily prior art, nor is it intended to limit the scope of patent protection of this application. Summary of the invention

[0006] The embodiments of the present application provide a photovoltaic module testing device, a testing method, a data processing device and related equipment to solve or alleviate one or more of the technical problems mentioned above.

[0007] As a first aspect of an embodiment of the present application, an embodiment of the present application provides a testing device for a photovoltaic module, comprising: A power supply module, a first end of the power supply module is electrically connected to an input end of the photovoltaic module; A current loading module, wherein the output end of the current loading module is electrically connected to the second end of the power supply module, and the input end of the current loading module is electrically connected to the output end of the photovoltaic module; the current loading module selectively outputs a first current and a second current, and the second current is smaller than the first current; A voltage monitoring module, the voltage monitoring module is connected in parallel with the photovoltaic module; The shooting module is used to shoot the electroluminescent image of the photovoltaic component when the current loading module outputs the first current.

[0008] In one implementation, the current loading module includes a resistor and a first switch element, and the resistor and the first switch element are connected in parallel.

[0009] In one embodiment, the current loading module further includes a second switch element, and the second switch element is connected in series with the resistor.

[0010] In one implementation, the second current is 1 / 100-1 / 10 of the first current; the resistor is a fixed-value resistor, and the resistance of the fixed-value resistor is 2-99 ohms.

[0011] In one embodiment, the power supply module is a constant voltage and current regulated power supply, and the output voltage of the constant voltage and current regulated power supply is 30-60V.

[0012] In one embodiment, an anti-oscillation module is further included. The anti-oscillation module includes at least one capacitor. The at least one capacitor is electrically connected to the input end and / or the output end of the photovoltaic component.

[0013] In one embodiment, the shooting module includes at least three shooting devices, one shooting device shoots a corresponding battery string unit, and the battery string unit includes at least one battery string electrically connected to the same diode in the photovoltaic assembly.

[0014] In one embodiment, a data processing module is further included, and the data processing module is communicatively connected to one or more of the power supply module, the shooting module, the voltage monitoring module, the first switch element, and the second switch element.

[0015] As a second aspect of an embodiment of the present application, an embodiment of the present application provides a method for testing a photovoltaic module, comprising: Loading a first current to the photovoltaic module to be tested, and acquiring an electroluminescent image of the photovoltaic module to be tested; Determine a first test result of the photovoltaic module to be tested based on the electroluminescent image; When the first test result is normal, a second current is applied to the photovoltaic component to be tested, and a voltage test value is obtained; the second current is smaller than the first current; The voltage test value is compared with the voltage standard value, and a second test result of the photovoltaic assembly to be tested is determined based on the comparison result, wherein the voltage standard value is a voltage value measured by a standard photovoltaic assembly at a second current.

[0016] In one embodiment, the second current is 1 / 100-1 / 10 of the first current.

[0017] In one embodiment, the voltage test value is compared with the voltage standard value, and a second test result of the photovoltaic component to be tested is determined based on the comparison result, including: when the voltage test value is 0.9 to 1.1 times the voltage standard value, the second test result is that the photovoltaic component to be tested is normal.

[0018] As a third aspect of an embodiment of the present application, an embodiment of the present application provides a data processing device, including: A first current loading module, used for loading a first current on the photovoltaic assembly to be tested, and acquiring an electroluminescent image of the photovoltaic assembly to be tested; A first result acquisition module, used to determine a first test result of the photovoltaic component to be tested based on the electroluminescent image; A second current loading module is used to load a second current to the photovoltaic component to be tested and obtain a voltage test value when the first test result is normal; the second current is smaller than the first current; The second result acquisition module is used to compare the voltage test value with the voltage standard value, and determine the second test result of the photovoltaic component to be tested based on the comparison result.

[0019] As a fourth aspect of the embodiments of the present application, the embodiments of the present application provide an electronic device, including: at least one processor; and a memory communicatively coupled to at least one processor; wherein: The memory stores instructions that can be executed by at least one processor, and the instructions are executed by at least one processor so that the at least one processor can execute the testing method of any implementation aspect of the above-mentioned embodiment.

[0020] As the fifth aspect of the embodiments of the present application, the embodiments of the present application provide a computer-readable storage medium, in which computer instructions are stored. When the computer instructions are executed by a processor, a test method for implementing any implementation aspect of the above embodiments is implemented.

[0021] As a sixth aspect of an embodiment of the present application, an embodiment of the present application provides a computer program product, including a computer program, which, when executed by a processor, implements the steps of the testing method of any implementation aspect of the above-mentioned embodiment.

[0022] The embodiment of the present application tests the quality of the solar cell based on the electroluminescence phenomenon by loading a first current on the photovoltaic module; when the test result is normal, a second current smaller than the first current value is loaded to determine whether there is a diode breakdown based on the voltage value of the photovoltaic module; the two-step method for testing the photovoltaic module can avoid the situation where the diode breakdown is missed during the electroluminescence test; in addition, the photovoltaic module can be tested to see whether it suffers from diode breakdown or the like after being loaded with the first current. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In the accompanying drawings, unless otherwise specified, the same reference numerals throughout the multiple drawings represent the same or similar parts or elements. These drawings are not necessarily drawn to scale. It should be understood that these drawings only depict some embodiments disclosed in the present application and should not be regarded as limiting the scope of the present application.

[0024] Figure 1 A schematic structural block diagram of a photovoltaic module testing device provided in an embodiment of the present application is shown.

[0025] Figure 2 A schematic structural circuit diagram of a photovoltaic module testing device provided in one embodiment of the present application is shown.

[0026] Figure 3 A schematic structural circuit diagram of a photovoltaic module testing device provided in another embodiment of the present application is shown.

[0027] Figure 4 A schematic flow chart showing a photovoltaic module testing method provided in one embodiment of the present application.

[0028] Figure 5 A schematic structural block diagram of a data processing device provided in one embodiment of the present application is shown.

[0029] Figure 6 A schematic structural block diagram of an electronic device provided according to an embodiment of the present application is shown. DETAILED DESCRIPTION

[0030] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be noted that the embodiments and features in the embodiments of the present application can be combined with each other in the absence of conflict. The present application will be described in detail below with reference to the accompanying drawings and in conjunction with the embodiments.

[0031] It should be noted that the terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the terms used in this way can be interchangeable where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein, for example. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0032] In the present application, when it comes to a numerical interval (i.e., a numerical range), unless otherwise specified, the distribution of the optional numerical values ​​in the numerical interval is considered to be continuous, and includes the two numerical endpoints (i.e., the minimum and maximum values) of the numerical interval, and each numerical value between the two numerical endpoints. Unless otherwise specified, when the numerical interval only refers to an integer in the numerical interval, it includes the two endpoint integers of the numerical range, and each integer between the two endpoints, which is equivalent to directly listing each integer. When multiple numerical ranges are provided to describe features or characteristics, these numerical ranges can be merged. In other words, unless otherwise specified, the numerical range disclosed in the present application should be understood to include any and all sub-ranges included therein. The "numerical value" in the numerical interval can be any quantitative value, such as a number, a percentage, a ratio, etc. "Numerical interval" allows for broadly including quantitative intervals such as percentage intervals, ratio intervals, and ratio intervals.

[0033] Hereinafter, exemplary embodiments according to the present application will be described in more detail with reference to the accompanying drawings. It should be noted that these exemplary embodiments can be implemented in many different forms and should not be construed as being limited to the embodiments described herein.

[0034] The present application provides a photovoltaic module testing device. Figure 1 A schematic structural block diagram of a photovoltaic module testing device provided in an embodiment of the present application is shown. Figure 2 A schematic structural circuit diagram of a photovoltaic module testing device provided in one embodiment of the present application is shown. Figure 3 FIG. 2 is a schematic structural circuit diagram of a photovoltaic module testing device provided by another embodiment of the present application. Figures 1 to 3 As shown, the testing device includes a power supply module 100, a current loading module 200, a voltage monitoring module 400 and a shooting module.

[0035] The power supply module 100 is used to provide power 101 for the photovoltaic module. The first end of the power supply module 100 is electrically connected to the input end of the photovoltaic module. The current loading module 200 is used to selectively load currents of different sizes to the photovoltaic module, the output end of the current loading module 200 is electrically connected to the second end of the power supply module 100, and the input end of the current loading module 200 is electrically connected to the output end of the photovoltaic module; in the embodiment of the present application, the current loading module 200 selectively outputs a first current and a second current, and the second current is less than the first current. The voltage monitoring module 400 is connected in parallel with the photovoltaic module, and the voltage monitoring module 400 is used to monitor and obtain the voltage value of the photovoltaic module under the first current or the second current.

[0036] The shooting module is used to shoot the electroluminescent image of the photovoltaic component when the current loading module 200 outputs the first current. The first current is a current value that can cause the photovoltaic component to generate an electroluminescent phenomenon.

[0037] In an embodiment of the present application, an electroluminescent image of the photovoltaic module is captured while loading the photovoltaic module with a first current. Based on the electroluminescent image, it can be determined whether the cell of the photovoltaic module has quality problems such as dark spots and hidden cracks. In addition, it can also be preliminarily determined whether the diode 302 in the photovoltaic module has a short circuit breakdown problem.

[0038] The photovoltaic assembly includes a plurality of diodes 302 and a plurality of battery strings, and the plurality of battery strings are electrically connected to the corresponding diodes 302, respectively, so as to conduct the output current through the corresponding diodes 302 to power the external device. In the process of performing the EL test, the shooting device 500 is usually used to shoot one by one, and the battery string corresponding to one diode 302 is shot at a time. In the subsequent shooting process, if the diode 302 that has been shot is short-circuited, it will not be detected. Therefore, after the electroluminescent image of the photovoltaic assembly is shot multiple times or once, the embodiment of the present application loads the second current to the photovoltaic assembly, and tests the voltage of the photovoltaic assembly under the second current condition to determine whether the plurality of diodes 302 in the photovoltaic assembly have a breakdown short-circuit condition based on the voltage. The second current is less than the first current. When the second current is loaded, it is not necessary to make the photovoltaic assembly generate electroluminescence, so its current value can be small. In the case of a small current, the photovoltaic assembly and the diode 302 in the photovoltaic assembly will not be damaged, so the quality reliability of the photovoltaic assembly after the test can be ensured.

[0039] The embodiment of the present application tests the quality of the solar cell based on the electroluminescence phenomenon by loading a first current on the photovoltaic module 300 to be tested; when the test result is normal, a second current smaller than the first current value is loaded to determine whether there is a breakdown of the diode 302 based on the voltage value of the photovoltaic module; this can avoid the situation where the diode 302 breaks down and is missed during the electroluminescence test; in addition, after the photovoltaic module is loaded with the first current, it can also be tested whether it suffers from the breakdown of the diode 302.

[0040] The voltage monitoring module 400 may be a voltmeter 401 .

[0041] In one example, the performance of the photovoltaic component 300 to be tested is sensitive to changes in temperature. Therefore, a temperature sensor 700 can be electrically connected to the photovoltaic component 300 to monitor the temperature of the photovoltaic component 300 to be tested, so that during the testing process of the photovoltaic component 300 to be tested, the temperature can be maintained at an appropriate temperature: 23°C~28°C, for example, 23°C, 25°C or 28°C.

[0042] In one embodiment, if Figure 2 As shown, the current loading module 200 includes a resistor 201 and a first switch element 202 , and the resistor 201 and the first switch element 202 are connected in parallel.

[0043] When the first switch 202 is disconnected, the power source 101 passes through the resistor 201 and then reaches the photovoltaic module, and the current is the second current. When the first switch 202 is closed, the power source 101 passes through the first switch 202 and reaches the photovoltaic module, and the current is the first current. The first current is greater than the second current, and the value of the first current is determined based on the output voltage of the power source 101 module; the value of the second current is determined based on the output voltage of the power source 101 module and the resistance value of the resistor 201.

[0044] In one embodiment, if Figure 3 As shown, the current loading module 200 further includes a second switch element 203 , and the second switch element 203 is connected in series with the resistor 201 .

[0045] When the first switch 202 is disconnected and the second switch 203 is closed, the power supply 101 passes through the resistor 201 to the photovoltaic module, and the current is the second current. When the first switch 202 is closed and the second switch 203 is disconnected, the power supply 101 passes through the first switch 202 to the photovoltaic module, and the current is the first current. This method of current loading module 200 can avoid short circuit of resistor 201, so that the test process is more stable, the test results are more accurate, etc. Similarly, in this method, the first current is greater than the second current, and the value of the first current is determined based on the output voltage of the power supply 101 module; the value of the second current is determined based on the output voltage of the power supply 101 module and the resistance value of resistor 201.

[0046] As described above, both the first switch element 202 and the second switch element 203 can be elastic switches or relays.

[0047] In one implementation, the second current is 1 / 100-1 / 10 of the first current; the resistor 201 is a fixed-value resistor, and the resistance of the fixed-value resistor is 2-99 ohms.

[0048] When testing whether the diode 302 in the photovoltaic module is broken down, the second current value that needs to be loaded is relatively small. As long as there is current, there will be voltage at the photovoltaic module. By loading the second current, the voltage test value of the photovoltaic module is obtained and compared with the voltage standard value of the standard photovoltaic module under the second current condition, it can be determined whether the diode 302 in the photovoltaic module 300 to be tested is broken down. Therefore, when the second current is too small, the voltage value is too small, and the accuracy of the voltage value comparison will be slightly weaker. Therefore, in order to ensure the test accuracy, the second current is limited to be greater than 1 / 100 of the first current.

[0049] In addition, the second current value does not need to be too large. If it is too large, it is unnecessary. If the second current value is too large, it may cause the diode 302 in the photovoltaic module to be damaged, causing breakdown or damage, affecting the service life of the diode 302, and further affecting the service life of the photovoltaic module. Therefore, by limiting the second current to not more than 1 / 10 of the first current, the product quality of the photovoltaic module can be guaranteed.

[0050] As an example, the second current may be 1 / 100, 1 / 50, or 1 / 10 of the first current.

[0051] Based on the definition of the ratio between the second current and the first current, the resistance value of the resistor 201 can be determined based on the output voltage of the voltage module and the target second current value.

[0052] The resistor 201 is a fixed resistor 201 with a stable value. Thus, when the photovoltaic component is the photovoltaic component 300 to be tested or a standard photovoltaic component, the second current is the same. In this case, the comparison result between the voltage test value and the voltage standard value has a higher accuracy.

[0053] In one implementation, the power supply module 100 is a constant voltage and current regulated power supply 101, and the output voltage of the constant voltage and current regulated power supply 101 is 30-60V.

[0054] Based on the requirement of the first current, the output voltage of the power supply 101 is determined to be 30-60V, for example, 30V, 50V or 50V.

[0055] The power supply 101 module is a constant voltage and current regulated power supply 101, so that the circuit has a stable current, thereby ensuring the test accuracy.

[0056] In one embodiment, an anti-oscillation module is further included. The anti-oscillation module includes at least one capacitor 801. The at least one capacitor 801 is electrically connected to the input end and / or the output end of the photovoltaic component.

[0057] In one example, if Figure 3 As shown, capacitors 801 are provided at both the input and output ends of the photovoltaic module to avoid current oscillation or voltage oscillation at both ends of the photovoltaic module, so as to stabilize the voltage value at both ends of the photovoltaic module, facilitate the comparison of the voltage test value with the voltage standard value, and further improve the test accuracy.

[0058] In one embodiment, the shooting module includes at least three shooting devices 500 , and one shooting device 500 shoots a corresponding battery string unit 301 . The battery string unit 301 includes at least one battery string electrically connected to the same diode 302 in the photovoltaic module.

[0059] In one example, a photovoltaic module generally includes 6 battery strings, and a diode 302 is electrically connected to two battery strings. Then, a battery string unit 301 includes two battery strings, and the number of diodes 302 in the photovoltaic module is 3. The shooting device 500 needs to shoot the three battery string units 301 respectively. If one shooting device 500 is used to shoot the battery string units 301 one by one, three shots are required. In addition, when shooting the first battery string unit 301, the detection result is normal. However, in the process of shooting the second battery string unit 301, if the first battery string unit 301 is damaged at this time, and the diode 302 is damaged and broken down, it will be missed, that is, the diode 302 is broken down, but it is not tested out, resulting in the determination that the photovoltaic module is normal, affecting the user experience. By setting at least three shooting devices 500, the three shooting devices 500 can respectively shoot and judge the corresponding battery string units 301 synchronously, so it is not easy to miss the detection.

[0060] In addition, in order to prevent the photovoltaic module from being damaged during the first current and affecting the quality of the battery string or the diode 302, a smaller second current is applied to the photovoltaic module and further tested by comparing the voltage values ​​to ensure that the photovoltaic module still has a high quality.

[0061] In one embodiment, a data processing module 601 is further included, and the data processing module 601 is communicatively connected to one or more of the power supply module 100 , the shooting module, the voltage monitoring module 400 , the first switch element 202 , and the second switch element 203 .

[0062] The data processing module 601 can be loaded into a computer device or a console. The data processing module 601 is connected to the power supply module 100 in communication, and can control the power supply module 100 to adjust the output voltage of the power supply module 100, so that in the absence of the current loading module 200, different currents can be selectively loaded for the photovoltaic module.

[0063] The data processing module 601 is connected to the shooting module in communication, and can adjust the shooting action of the shooting module to start shooting at a specific time. In addition, it can also receive the image obtained by the shooting module to perform analysis and processing based on the obtained image.

[0064] The data processing module 601 is connected to the voltage monitoring module 400 for communication, and can obtain the voltage value monitored by the voltage monitoring module 400, and obtain the test result based on the voltage value analysis and processing.

[0065] The data processing module 601 is in communication connection with the first switch element 202 and / or the second switch element 203 and can control the closing / closing operation of the first switch element 202 and / or the second switch element 203 based on the test process to realize automated testing.

[0066] The present application provides a method for testing a photovoltaic module. Figure 4 As shown, the test method includes: S210 , applying a first current to the photovoltaic assembly 300 to be tested, and acquiring an electroluminescent image of the photovoltaic assembly 300 to be tested.

[0067] The step of loading the first current to the photovoltaic module 300 to be tested can be achieved by controlling the on and off of the first switch 202 / the second switch 203 in the current loading module 200. The electroluminescent image of the photovoltaic module 300 to be tested can be obtained by shooting with the shooting device 500.

[0068] S220 , determining a first test result of the photovoltaic assembly 300 to be tested based on the electroluminescent image.

[0069] The first test result includes whether there are dark patches or cracks in the battery string unit 301 in the photovoltaic module, whether the corresponding diode 302 is broken down, etc.

[0070] S230, when the first test result is normal, load a second current to the photovoltaic assembly 300 to be tested, and obtain a voltage test value; the second current is smaller than the first current.

[0071] If the first test result is abnormal, it means that the quality of the PV module does not meet the requirements and is eliminated without further testing.

[0072] When the first test result is normal, the current test method considers that the photovoltaic module is of reliable quality and can be put into use. However, it may be because the diode 302 is broken down during the process of loading the first current on the photovoltaic module, and it is difficult for the photovoltaic module to output a voltage with normal efficiency during use, affecting the customer's experience. Therefore, by loading the second current again, it is further confirmed that the diode 302 is normal in this case. The photovoltaic module is then used to make the test result more reliable.

[0073] S240, comparing the voltage test value with the voltage standard value, and determining a second test result of the photovoltaic assembly 300 to be tested based on the comparison result.

[0074] When the second current is loaded, the second test result is determined by comparing the voltage test value of the photovoltaic assembly 300 to be tested with the voltage standard value.

[0075] The voltage standard value is a voltage value of a standard photovoltaic module measured in a testing device for the photovoltaic module under a second current condition.

[0076] The embodiment of the present application tests the photovoltaic modules in a two-step test method. In the second test, it can ensure that the quality of the photovoltaic modules is normal, and there will be no missed inspections, which will not easily lead to photovoltaic modules of poor quality entering the market, thereby improving the user experience.

[0077] In one embodiment, the second current is 1 / 100-1 / 10 of the first current.

[0078] As mentioned above, the second current may be 1 / 100, 1 / 50 or 1 / 10 of the first current.

[0079] In one embodiment, the standard voltage value is a voltage value measured by a standard photovoltaic module at the second current.

[0080] In the process of obtaining the voltage standard value, only the second current may be loaded on the standard photovoltaic assembly without loading the first current. The diode 302 has not been damaged by the first current, so the result of the second test process can be accurate.

[0081] In one embodiment, step S240 includes: when the voltage test value is 0.9 to 1.1 times the voltage standard value, the second test result is that the photovoltaic assembly 300 to be tested is normal.

[0082] In one example, the photovoltaic module includes three diodes 302. When one diode 302 breaks down, the resistance 201 at that location is close to 0. When the resistance 201 decreases, the corresponding voltage value decreases. Therefore, by limiting the voltage test value to 0.9 to 1.1 times the voltage standard value, the second test result is determined to be that the photovoltaic module 300 to be tested is normal. If the voltage test value is too small or too large compared to the voltage standard value, it may be caused by the damage suffered by the battery string.

[0083] If the voltage test value is less than or equal to 0.9 times the voltage standard value, it can be determined that the diode 302 in the photovoltaic assembly 300 to be tested has broken down.

[0084] The present application embodiment also provides a data processing device to implement the functions of the above-mentioned data processing module 601. Figure 5 As shown, the data processing device 600 includes a first current loading module 610 , a first result acquisition module 620 , a second current loading module 630 and a second result acquisition module 640 .

[0085] The first current loading module 610 is used to load a first current to the photovoltaic assembly 300 to be tested, and obtain an electroluminescent image of the photovoltaic assembly 300 to be tested; The first result acquisition module 620 is used to determine a first test result of the photovoltaic assembly 300 to be tested based on the electroluminescent image; The second current loading module 630 is used to load a second current to the photovoltaic assembly 300 to be tested and obtain a voltage test value when the first test result is normal; the second current is smaller than the first current; The second result acquisition module 640 is used to compare the voltage test value with the voltage standard value, and determine the second test result of the photovoltaic assembly 300 to be tested based on the comparison result. The voltage standard value is the voltage value measured by the standard photovoltaic assembly under the condition of the second current.

[0086] Figure 6 The schematic diagram of the hardware architecture of the electronic device 10000 suitable for implementing the testing method of photovoltaic modules according to the third embodiment of the present application is schematically shown. In some embodiments, the electronic device 10000 can be a terminal device such as a smart phone, a wearable device, a tablet computer, a personal computer, a vehicle terminal, a game console, a virtual device, a workbench, a digital assistant, a set-top box, a robot, etc. In other embodiments, the electronic device 10000 can be a rack server, a blade server, a tower server or a cabinet server (including an independent server, or a server cluster composed of multiple servers), etc. Figure 6 As shown, the electronic device 10000 includes but is not limited to: a memory 10010, a processor 10020, and a network interface 10030 that can communicate with each other through a system bus. Among them: The memory 10010 includes at least one type of computer-readable storage medium, and the readable storage medium includes a flash memory, a hard disk, a multimedia card, a card-type memory (such as an SD or DX memory), a random access memory (RAM), a static random access memory (SRAM), a read-only memory (ROM), an electrically erasable programmable read-only memory (EEPROM), a programmable read-only memory (PROM), a magnetic memory, a magnetic disk, an optical disk, etc. In some embodiments, the memory 10010 may be an internal storage module of the electronic device 10000, such as a hard disk or a memory of the electronic device 10000. In other embodiments, the memory 10010 may also be an external storage device of the electronic device 10000, such as a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), etc. equipped on the electronic device 10000. Of course, the memory 10010 may also include both the internal storage module of the electronic device 10000 and its external storage device. In this embodiment, the memory 10010 is generally used to store an operating system and various application software installed in the electronic device 10000, such as program codes of a photovoltaic module testing method, etc. In addition, the memory 10010 can also be used to temporarily store various data that have been output or will be output.

[0087] In some embodiments, the processor 10020 may be a central processing unit (CPU), a controller, a microcontroller, a microprocessor, or other chips. The processor 10020 is generally used to control the overall operation of the electronic device 10000, such as performing control and processing related to data interaction or communication with the electronic device 10000. In this embodiment, the processor 10020 is used to run the program code stored in the memory 10010 or process data.

[0088] The network interface 10030 may include a wireless network interface or a wired network interface, and the network interface 10030 is generally used to establish a communication link between the electronic device 10000 and other electronic devices. For example, the network interface 10030 is used to connect the electronic device 10000 to an external terminal through a network, and to establish a data transmission channel and a communication link between the electronic device 10000 and the external terminal. The network may be a wireless or wired network such as an intranet, the Internet, the Global System of Mobile communication (GSM), Wideband Code Division Multiple Access (WCDMA), 4G network, 5G network, Bluetooth, Wi-Fi, etc.

[0089] It should be pointed out that Figure 6 Only an electronic device having components 10010 - 10030 is shown, but it should be understood that implementation of all of the components shown is not a requirement, and more or fewer components may alternatively be implemented.

[0090] In this embodiment, the photovoltaic component testing method stored in the memory 10010 may also be divided into one or more program modules and executed by one or more processors (such as the processor 10020) to complete the embodiment of the present application.

[0091] An embodiment of the present application further provides a computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed by a processor, the steps of the photovoltaic component testing method in the embodiment are implemented.

[0092] In this embodiment, the computer-readable storage medium includes flash memory, hard disk, multimedia card, card-type memory (for example, SD or DX memory, etc.), random access memory (RAM), static random access memory (SRAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), programmable read-only memory (PROM), magnetic memory, disk, optical disk, etc. In some embodiments, the computer-readable storage medium may be an internal storage unit of an electronic device, such as a hard disk or memory of the electronic device. In other embodiments, the computer-readable storage medium may also be an external storage device of an electronic device, such as a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), etc. equipped on the electronic device. Of course, the computer-readable storage medium may also include both the internal storage unit of the electronic device and its external storage device. In this embodiment, the computer-readable storage medium is generally used to store an operating system and various application software installed in the electronic device, such as the program code of the method in the embodiment. In addition, the computer-readable storage medium may also be used to temporarily store various types of data that have been output or are to be output.

[0093] An embodiment of the present application also provides a computer program product, including a computer program, which implements the method in the above embodiment when executed by a processor.

[0094] Obviously, those skilled in the art should understand that the modules or steps of the above-mentioned embodiments of the present application can be implemented with general electronic devices, they can be concentrated on a single electronic device, or distributed on a network composed of multiple electronic devices, and optionally, they can be implemented with program codes executable by electronic devices, so that they can be stored in a storage device and executed by the electronic device, and in some cases, the steps shown or described can be executed in a different order from that herein, or they can be made into individual integrated circuit modules, or multiple modules or steps therein can be made into a single integrated circuit module for implementation. In this way, the embodiments of the present application are not limited to any specific combination of hardware and software.

[0095] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprising" and / or "including" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0096] For the convenience of description, the orientation or position relationship indicated by directional words such as "front, back, up, down, left, right", "lateral, vertical, vertical, horizontal" and "top, bottom" is usually based on the orientation or position relationship shown in the drawings, and is only for the convenience of describing the present application and simplifying the description. Unless otherwise stated, these directional words do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the scope of protection of the present application; the directional words "inside and outside" refer to the inside and outside relative to the outline of each component itself. For example, if the device in the drawings is inverted, the device described as "above other devices or structures" or "above other devices or structures" will be positioned as "below other devices or structures" or "below other devices or structures". Therefore, the exemplary term "above..." can include both "above..." and "below..." orientations. The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used here are interpreted accordingly.

[0097] Unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection, an electrical connection, or a communication; it can be a direct connection, or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0098] Unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include the first and second features being in direct contact, or may include the first and second features not being in direct contact but being in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes the first feature being directly above and obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes the first feature being directly above and obliquely above the second feature, or simply means that the first feature is lower in level than the second feature.

[0099] Unless otherwise specifically stated, the relative arrangement, numerical expressions and numerical values ​​of the parts and steps set forth in these embodiments do not limit the scope of the present application. At the same time, it should be understood that, for ease of description, the sizes of the various parts shown in the accompanying drawings are not drawn according to the actual proportional relationship. The technology, method and equipment known to those of ordinary skill in the relevant field may not be discussed in detail, but in appropriate cases, the technology, method and equipment should be considered as a part of the authorization specification. In all examples shown and discussed here, any specific value should be interpreted as being merely exemplary, rather than as a limitation. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters represent similar items in the following drawings, so that once a certain item is defined in an accompanying drawing, it does not need to be further discussed in subsequent drawings.

[0100] It should also be noted that "one embodiment", "another embodiment", "embodiment", etc. mentioned in this specification refer to the specific features, structures or characteristics described in conjunction with the embodiment included in at least one embodiment generally described in this application. The same expression appearing in multiple places in the specification does not necessarily refer to the same embodiment. Further, when describing a specific feature, structure or characteristic in conjunction with any embodiment, it is claimed that the realization of such feature, structure or characteristic in conjunction with other embodiments also falls within the scope of this application.

[0101] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0102] It should also be noted that the above are only preferred embodiments of the present application, and the patent protection scope of the present application is not limited thereto. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A photovoltaic module testing device, characterized in that: include: A power supply module, a first end of the power supply module is electrically connected to an input end of the photovoltaic assembly; A current loading module, wherein the output end of the current loading module is electrically connected to the second end of the power supply module, and the input end of the current loading module is electrically connected to the output end of the photovoltaic module; the current loading module selectively outputs a first current and a second current, wherein the second current is smaller than the first current; A voltage monitoring module, the voltage monitoring module is connected in parallel with the photovoltaic module; A shooting module is used to shoot an electroluminescent image of the photovoltaic component when the current loading module outputs the first current.

2. The testing device according to claim 1, characterized in that: The current loading module includes a resistor and a first switch element, and the resistor and the first switch element are connected in parallel.

3. The testing device according to claim 2, characterized in that: The current loading module further includes a second switch element, which is connected in series with the resistor.

4. The testing device according to claim 2 or 3, characterized in that: The second current is 1 / 100-1 / 10 of the first current; the resistor is a fixed-value resistor, and the resistance of the fixed-value resistor is 2-99 ohms.

5. The testing device according to claim 1, characterized in that: The power supply module is a constant voltage and current stabilizing power supply, and the output voltage of the constant voltage and current stabilizing power supply is 30-60V.

6. The testing device according to claim 1, characterized in that: It also includes an anti-oscillation module, which includes at least one capacitor, and at least one of the capacitors is electrically connected to the input end and / or the output end of the photovoltaic component.

7. The testing device according to claim 1, characterized in that: The shooting module includes at least three shooting devices, each of which shoots a corresponding battery string unit, and the battery string unit includes at least one battery string electrically connected to the same diode in the photovoltaic assembly.

8. The testing device according to claim 3, characterized in that: It also includes a data processing module, which is communicatively connected with one or more of the power supply module, the shooting module, the voltage monitoring module, the first switch component and the second switch component.

9. A method for testing a photovoltaic module, characterized in that: include: Loading a first current to the photovoltaic component to be tested, and acquiring an electroluminescent image of the photovoltaic component to be tested; Determining a first test result of the photovoltaic assembly to be tested based on the electroluminescent image; When the first test result is normal, a second current is applied to the photovoltaic assembly to be tested, and a voltage test value is obtained; The second current is smaller than the first current; The voltage test value is compared with the voltage standard value, and a second test result of the photovoltaic component to be tested is determined based on the comparison result; wherein the voltage standard value is a voltage value measured by a standard photovoltaic component under the second current.

10. The testing method according to claim 9, characterized in that: The second current is 1 / 100-1 / 10 of the first current.

11. The testing method according to claim 9, characterized in that: The comparing the voltage test value with the voltage standard value and determining a second test result of the photovoltaic component to be tested based on the comparison result includes: when the voltage test value is 0.9 to 1.1 times the voltage standard value, the second test result is that the photovoltaic component to be tested is normal.

12. A data processing device, characterized in that: include: A first current loading module, used for loading a first current to the photovoltaic assembly to be tested, and obtaining an electroluminescent image of the photovoltaic assembly to be tested; A first result acquisition module, used to determine a first test result of the photovoltaic assembly to be tested based on the electroluminescent image; A second current loading module, used for loading a second current for the photovoltaic assembly to be tested and obtaining a voltage test value when the first test result is normal; The second current is smaller than the first current; The second result acquisition module is used to compare the voltage test value with the voltage standard value, and determine a second test result of the photovoltaic component to be tested based on the comparison result, wherein the voltage standard value is a voltage value measured by a standard photovoltaic component under the second current.

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