Line loss test system and method, electronic equipment and storage medium

Abstract

The invention relates to the technical field of wireless communication testing, and provides a line loss testing system and method, electronic equipment and a storage medium. The line loss test system comprises: a test fixture; the line loss calibration piece is configured on the test fixture and is connected with the receiving port of the test fixture through a test probe of the test fixture; the comprehensive test instrument is connected with the line loss calibration piece through the radio frequency line to be tested, and the comprehensive test instrument is used for sending out or receiving a test signal according to the test instruction; and the PC terminal is in communication connection with the test fixture and the comprehensive test instrument and is used for sending a test instruction to the comprehensive test instrument. Through the line loss test system provided by the embodiment of the invention, the accuracy of line loss detection can be improved, the production test efficiency is effectively improved, and the test cost is saved.

Description

Technical Field

[0001] The present invention relates to the technical field of wireless communication testing, and in particular to a line loss testing system, a line loss testing method, an electronic device and a computer storage medium. Background Art

[0002] When producing wireless communication products, accurate testing and calibration of RF indicators are key, among which the line loss compensation problem from fixtures and equipment to test instruments is particularly prominent.

[0003] Related technologies face problems such as difficulty and low accuracy in calculating line loss, which directly affect the accuracy of product testing and production efficiency. Therefore, how to improve the production efficiency and test consistency of wireless communication products is an urgent problem to be solved. Summary of the invention

[0004] The present invention aims to solve one of the technical problems in the related art to at least a certain extent. To this end, the first purpose of the present invention is to propose a line loss test system. The line loss test system provided by the embodiment of the present invention can improve the accuracy of line loss detection and effectively improve production efficiency. At the same time, its test operation is simple and reduces the manpower input cost.

[0005] The second objective of the present invention is to provide a line loss testing method.

[0006] A third objective of the present invention is to provide an electronic device.

[0007] A fourth object of the present invention is to provide a computer-readable storage medium.

[0008] To achieve the above-mentioned purpose, the first aspect of the present invention proposes a line loss test system, including: a test fixture; a line loss calibration piece configured on the test fixture, the line loss calibration piece is connected to the receiving port of the test fixture through the test probe of the test fixture; an integrated tester, the integrated tester is connected to the line loss calibration piece through the RF line to be tested, and the integrated tester is used to send or receive test signals according to test instructions; a PC end, the PC end is respectively communicated with the test fixture and the integrated tester, and is used to send test instructions to the integrated tester.

[0009] In addition, the line loss test system according to the above embodiment of the present invention may also have the following additional technical features:

[0010] According to some embodiments of the present invention, the line loss test system further includes a power supply, which is connected to the test fixture and is used to supply power to the line loss calibration component.

[0011] According to some embodiments of the present invention, the RF line to be tested includes at least a first RF line to be tested and a second RF line to be tested; the line loss calibration piece includes an open-circuit calibration piece; the open-circuit calibration piece includes at least a first connection port and a second connection port; when the test fixture is configured with the open-circuit calibration piece: the first connection port of the open-circuit calibration piece is connected to the first receiving port of the test fixture through a test probe, the first receiving port of the test fixture is connected to one end of the first RF line to be tested, and the other end of the first RF line to be tested is connected to the first RF port of the comprehensive tester; the second connection port of the open-circuit calibration piece is connected to the second receiving port of the test fixture through the test probe, the second receiving port of the test fixture is connected to one end of the second RF line to be tested, and the other end of the second RF line to be tested is connected to the second RF port of the comprehensive tester; the open-circuit calibration piece is used to detect a first basic line loss between the first RF port of the comprehensive tester and the first connection port of the open-circuit calibration piece in an open-circuit state, and a second basic line loss between the second RF port of the comprehensive tester and the second connection port of the open-circuit calibration piece.

[0012] According to some embodiments of the present invention, the line loss calibration component also includes a short-circuit calibration component; the short-circuit calibration component includes at least a third connection port and a fourth connection port; when the test fixture is configured with the short-circuit calibration component: the third connection port of the short-circuit calibration component is connected to the first receiving port of the test fixture through a test probe, the first receiving port of the test fixture is connected to one end of the first RF line to be tested, and the other end of the first RF line to be tested is connected to the first RF port of the comprehensive tester; the fourth connection port of the short-circuit calibration component is connected to the second receiving port of the test fixture through a test probe, the second receiving port of the test fixture is connected to one end of the second RF line to be tested, and the other end of the second RF line to be tested is connected to the second RF port of the comprehensive tester; the short-circuit calibration component is used to detect the third basic line loss between the first RF port of the comprehensive tester and the third connection port of the open-circuit calibration component in a short-circuit state, and the fourth basic line loss between the second RF port of the comprehensive tester and the fourth connection port of the short-circuit calibration component.

[0013] According to some embodiments of the present invention, the line loss calibration component also includes a load calibration component; the load calibration component includes at least a fifth connection port and a sixth connection port; when the test fixture is configured with the load calibration component: the fifth connection port of the load calibration component is connected to the first receiving port of the test fixture through a test probe, the first receiving port of the test fixture is connected to one end of the first RF line to be tested, and the other end of the first RF line to be tested is connected to the first RF port of the comprehensive tester; the sixth connection port of the load calibration component is connected to the second receiving port of the test fixture through a test probe, the second receiving port of the test fixture is connected to one end of the second RF line to be tested, and the other end of the second RF line to be tested is connected to the second RF port of the comprehensive tester; the fifth connection port of the load calibration component is short-circuited to the sixth connection port of the load calibration component; the load calibration component is used to detect the total line loss between the first RF port of the comprehensive tester and the second RF port of the comprehensive tester under load.

[0014] According to an embodiment of the present invention, the line loss test system includes: a test fixture; a line loss calibration piece configured on the test fixture, the line loss calibration piece is connected to the receiving port of the test fixture through the test probe of the test fixture; a comprehensive tester, the comprehensive tester is connected to the line loss calibration piece through the RF line to be tested, and the comprehensive tester is used to send or receive test signals according to test instructions; a PC end, the PC end is respectively connected to the test fixture and the comprehensive tester for communication, and is used to send test instructions to the comprehensive tester. Therefore, the system tests the line loss compensation from the fixture and the device to the test instrument through different calibration pieces, and uses the calibration values ​​under different calibration states to calculate the line loss compensation, which greatly improves the accuracy of line loss detection, thereby effectively avoiding equipment failure or communication interruption caused by line loss problems, saving test time, and improving the efficiency of line loss testing.

[0015] To achieve the above-mentioned purpose, a second aspect of the present invention proposes a line loss testing method, which is applied to the line loss testing system described in the embodiment of the present invention, including obtaining a first basic line loss between the first RF port of the comprehensive tester and the first connection port of the open-circuit calibration component in the short-circuit state of the line loss testing system, and a second basic line loss between the second RF port of the comprehensive tester and the second connection port of the open-circuit calibration component; obtaining a third basic line loss between the first RF port of the comprehensive tester and the third connection port of the open-circuit calibration component in the open-circuit state of the line loss testing system, and a fourth basic line loss between the second RF port of the comprehensive tester and the fourth connection port of the short-circuit calibration component. Line loss; obtaining the total line loss between the first RF port of the integrated tester and the second RF port of the integrated tester in the load state of the line loss test system; calculating the first target total line loss of the first RF line to be tested and the second target total line loss of the second RF line to be tested according to the first basic line loss, the second basic line loss, the third basic line loss, the fourth basic line loss, the total line loss, the load port line loss and the line loss correction parameter; wherein the load port line loss is the port line loss between the fifth connection port and the sixth connection port of the load calibration component; the line loss correction parameters include the first line loss correction parameter corresponding to the first RF line to be tested and the second line loss correction parameter corresponding to the second RF line to be tested.

[0016] In addition, the line loss testing method according to the above embodiment of the present invention may also have the following additional technical features:

[0017] According to some embodiments of the present invention, a first target total line loss of a first RF line to be tested and a second target total line loss of a second RF line to be tested are calculated based on a first basic line loss, a second basic line loss, a third basic line loss, a fourth basic line loss, a total line loss, a load port line loss and a line loss correction parameter, including: calculating the first target basic line loss of the first RF line to be tested in a short-circuit state and an open-circuit state based on the first basic line loss and the third basic line loss; calculating the second target basic line loss of the first RF line to be tested in a short-circuit state and an open-circuit state based on the second basic line loss and the fourth basic line loss; calculating the first target total line loss of the first RF line to be tested based on the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss and the first line loss correction parameter; calculating the second target total line loss of the second RF line to be tested based on the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss and the second line loss correction parameter.

[0018] According to some embodiments of the present invention, it is characterized in that the first target total line loss of the first RF line to be tested is calculated according to the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss, and the first line loss correction parameter, including:

[0019]

[0020] Among them, P1 _LOSS is the first target bus loss, LOSS 1 The first target basic line loss, LOSS 2 is the second target basic line loss, LOSS(1→2) is the total line loss, K(1→2) is the load port line loss, Y 1 is the first line loss correction parameter.

[0021] According to some embodiments of the present invention, the second target total line loss of the second RF line to be tested is calculated based on the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss, and the second line loss correction parameter, including:

[0022]

[0023] Among them, P 2 _LOSS is the second target bus loss, LOSS 1 The first target basic line loss, LOSS 2 is the second target basic line loss, LOSS(1→2) is the total line loss, K(1→2) is the load port line loss, Y 2 is the second line loss correction parameter.

[0024] A line loss testing method provided in an embodiment of the present invention realizes accurate testing and calibration of radio frequency indicators of wireless communication products, solves the line loss compensation problem, and greatly improves the accuracy of calculating line loss values, thereby effectively avoiding equipment failure or poor communication due to line loss problems, while saving testing time and improving the efficiency of line loss testing.

[0025] To achieve the above-mentioned purpose, the third aspect of the present invention proposes an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the line loss testing method as described above when executing the program.

[0026] In order to achieve the above-mentioned purpose, a fourth aspect of the present invention proposes a computer-readable storage medium, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to enable the computer to execute the above-mentioned line loss testing method.

[0027] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings in the following description are only for the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0029] Figure 1 A schematic diagram of a line loss testing system provided in an embodiment of the present invention.

[0030] Figure 2 A schematic diagram of an open-circuit calibration component test provided in an embodiment of the present invention.

[0031] Figure 3 A schematic diagram of testing a short-circuit calibration component provided in an embodiment of the present invention.

[0032] Figure 4 A schematic diagram of a load calibration component test provided in an embodiment of the present invention.

[0033] Figure 5 A schematic diagram of a line loss testing method flow chart provided in an embodiment of the present invention.

[0034] Figure 6 A schematic diagram of a line loss test process during actual production testing provided by an embodiment of the present invention.

[0035] Figure 7 A more specific schematic diagram of the hardware structure of an electronic device provided by an embodiment of the present invention.

[0036] Figure markings: 100-comprehensive tester, 200-line loss calibration piece, 300-test fixture, 400-PC end, 500-power supply, 110-first RF port, 120-second RF port, 310-first receiving port, 320-second receiving port, 210-open circuit calibration piece, 211-first connection port, 212-second connection port, 220-short circuit calibration piece, 221-third connection port, 222-fourth connection port, 230-load calibration piece, 231-fifth connection port, 232-sixth connection port, 610-first RF line to be tested, 620-second RF line to be tested. DETAILED DESCRIPTION

[0037] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0038] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the present invention should be understood by people with ordinary skills in the field to which the present invention belongs. The "first", "second" and similar words used in the present invention do not indicate any order, quantity or importance, but are only used to distinguish different components. "Include" or "comprise" and similar words mean that the elements or objects appearing before the word include the elements or objects listed after the word and their equivalents, without excluding other elements or objects. "Connect" or "connected" and similar words are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0039] As mentioned in the background technology section, wireless communication technology has provided great convenience to people's lives today. Corresponding to this convenience is the increasing requirements for wireless communication network technology. When transmitting wireless communication signals, the existence of line loss will cause the signal frequency to attenuate, which has a great impact on the production and use of wireless communication. For example, when the frequency attenuates and makes it difficult for other devices to capture the peak value, it may cause erroneous operation, which will have a significant impact or loss on the actual application of wireless communication.

[0040] In the process of implementing the present invention, the applicant found that in the manufacturing process, it is necessary to calculate the line loss value by spot-checking the sending value and receiving value of the gold plate. After the line loss spot check is completed, the production test begins. The gold plate inspected in this way not only has a high production cost, but also affects the life of the gold plate. Since the test method is relatively cumbersome, it is necessary to manually test the signal repeatedly, which consumes a lot of labor costs and time costs.

[0041] Therefore, in order to solve the above problems, an embodiment of the present invention provides a line loss detection system, which can improve the accuracy of line loss detection while simplifying the test operation, reducing the investment in manpower and time costs, and effectively improving production efficiency.

[0042] The technical solution of the present invention is further described in detail below through specific embodiments.

[0043] refer to Figure 1 , is a schematic diagram of a line loss testing system provided in an embodiment of the present invention.

[0044] The line loss test system provided by the embodiment of the present invention includes: a test fixture 300; a line loss calibration piece 200 configured on the test fixture 300, the line loss calibration piece 200 is connected to the receiving port of the test fixture 300 through the test probe of the test fixture 300; an integrated tester 100, the integrated tester 100 is connected to the line loss calibration piece 200 through the RF line to be tested, and the integrated tester 100 is used to send or receive a test signal according to a test instruction; a PC end, the PC end is respectively connected to the test fixture 300 and the integrated tester 100 for communication, and is used to send a test instruction to the integrated tester 100.

[0045] Specifically, the test fixture 300 is used to fix and connect the line loss calibration piece 200 during the test process, and the test fixture 300 is a bridge for signal transmission; the line loss calibration piece 200 is configured on the test fixture 300, and the line loss calibration piece 200 is connected to the receiving port of the test fixture 300 through the test probe of the test fixture 300, and the connection port of the line loss calibration piece 200 corresponds one-to-one to the receiving port of the test fixture 300.

[0046] The comprehensive tester 100 is connected to the test fixture 300 through the RF line to be tested. The comprehensive tester 100 is used to send signals to the test fixture 300 or receive signals returned by the test fixture 300 according to the test instructions; the PC end is respectively connected to the test fixture 300 and the comprehensive tester 100 for communication, and the PC end is used to analyze and process the received signals and data. Generally, the PC end is provided with a calculation program of the line loss test system, and the data obtained by the line loss calibration component 200 after the test needs to be calculated by the PC end to obtain an accurate line loss value.

[0047] As an optional embodiment, the line loss test system further includes a power supply 500 , which is connected to the test fixture 300 and is used to supply power to the line loss calibration component 200 and other electrical components.

[0048] Specifically, the test fixture 300 is used to transmit the signal sent by the comprehensive tester 100 to the line loss calibration component 200. The power supply 500 is connected to the test fixture 300 to supply power to the line loss calibration component 200 and other electrical components on the test fixture 300 to ensure that the line loss calibration component 200 and other electrical components on the test fixture 300 can work normally during the test.

[0049] Among them, the line loss calibration component 200 includes an open circuit calibration component 210, a short circuit calibration component 220 and a load calibration component 230. The open circuit calibration component 210 is also called an Open board, which is used to test the line loss value of the RF line under the open circuit state; the short circuit calibration component 220 is also called a Short board, which is used to test the line loss value of the RF line under the short circuit state; the load calibration component is also called a Load board, which is used to test the line loss value of the RF line under the load state.

[0050] refer to Figure 2 , is a schematic diagram of an open-circuit calibration component testing system provided in an embodiment of the present invention.

[0051] As an optional embodiment, the RF line to be tested includes at least a first RF line to be tested 610 and a second RF line to be tested 620; the line loss calibration component 200 includes an open-circuit calibration component 210; the open-circuit calibration component 210 includes at least a first connection port 211 and a second connection port 212; when the test fixture 300 is configured with the open-circuit calibration component 210: the first connection port 211 of the open-circuit calibration component 210 is connected to the first receiving port 310 of the test fixture 300 through a test probe, the first receiving port 310 of the test fixture 300 is connected to one end of the first RF line to be tested 610, and the other end of the first RF line to be tested 610 is connected to the first RF port 110 of the comprehensive tester 100. Connection; the second connection port 212 of the open circuit calibration component 210 is connected to the second receiving port 320 of the test fixture 300 through a test probe, the second receiving port 320 of the test fixture 300 is connected to one end of the second RF line 620 to be tested, and the other end of the second RF line 620 to be tested is connected to the second RF port 120 of the comprehensive tester 100; the open circuit calibration component 210 is used to detect the first basic line loss between the first RF port 110 of the comprehensive tester 100 and the first connection port 211 of the open circuit calibration component 210 in the open circuit state and the second basic line loss between the second RF port 120 of the comprehensive tester 100 and the second connection port 212 of the open circuit calibration component 210.

[0052] Specifically, the RF line to be tested includes at least a first RF line to be tested 610 and a second RF line to be tested 620. The RF line to be tested will generate line loss when transmitting signals. In an embodiment of the present invention, the number of RF lines to be tested corresponds to the number of connection ports corresponding to the line loss calibration component 200.

[0053] It should be noted that the first RF line to be tested 610 and the second RF line to be tested 620 can be used as a group of RF lines to be tested. During the actual testing process, the line loss calibration component 200 includes at least one group of RF lines to be tested, and the line loss calibration component 200 can also include multiple groups of RF lines to be tested. By testing the line loss values ​​on multiple groups of RF lines to be tested and performing average calculation, the error of the line loss value calculation can be reduced and the accuracy of the line loss value calculation can be improved.

[0054] The line loss calibration component 200 includes an open-circuit calibration component 210. In the open-circuit calibration component 210 (i.e., Open board), the other side of the first connection port 211 and the second connection port 212 is open, and the line loss value in the open-circuit state is detected by the open-circuit calibration component 210; the open-circuit calibration component 210 includes at least a first connection port 211 and a second connection port 212, and the number of connection ports of the open-circuit calibration component 210 corresponds to the number of RF lines to be tested.

[0055] When the test fixture 300 is configured with the open-circuit calibration component 210: the first connection port 211 of the open-circuit calibration component 210 is connected to the first receiving port 310 of the test fixture 300 through the test probe, the first receiving port 310 of the test fixture 300 is connected to one end of the first RF line 610 to be tested, and the other end of the first RF line 610 to be tested is connected to the first RF port 110 of the comprehensive tester 100. When the open-circuit calibration component 210 is configured, the comprehensive tester 100 transmits the signal along the first RF line 610 to be tested to the first receiving port 310 on the test fixture 300 through the first RF port 110, and the first receiving port 310 transmits the received signal to the first connection port 211 through the test probe. Under ideal conditions, the line loss on the test probe can be ignored.

[0056] The second connection port 212 of the open-circuit calibration component 210 is connected to the second receiving port 320 of the test fixture 300 through a test probe, the second receiving port 320 of the test fixture 300 is connected to one end of the second RF line 620 to be tested, and the other end of the second RF line 620 to be tested is connected to the second RF port 120 of the comprehensive tester 100. When configuring the open-circuit calibration component 210, the comprehensive tester 100 transmits the signal along the second RF line 620 to be tested to the second receiving port 320 on the test fixture 300 through the second RF port 120, and the second receiving port 320 transmits the received signal to the second connection port 212 through the test probe. Under ideal conditions, the line loss on the test probe can be ignored.

[0057] The open circuit calibration component 210 is used to detect a first basic line loss between the first RF port 110 of the comprehensive tester 100 and the first connection port 211 of the open circuit calibration component 210 in an open circuit state, and to detect a second basic line loss between the second RF port 120 of the comprehensive tester 100 and the second connection port 212 of the open circuit calibration component 210. The line loss between the first RF port 110 of the comprehensive tester 100 and the first connection port 211 of the open circuit calibration component 210 in an open circuit state detected by the open circuit calibration component 210 is recorded as the first basic line loss, and the line loss between the second RF port 120 and the second connection port 212 of the open circuit calibration component 210 is recorded as the second basic line loss.

[0058] refer to Figure 3 , is a schematic diagram of a short-circuit calibration component testing system provided in an embodiment of the present invention.

[0059] As an optional embodiment, the line loss calibration component 200 also includes a short-circuit calibration component 220; the short-circuit calibration component 220 includes at least a third connection port 221 and a fourth connection port 222; when the test fixture 300 is configured with the short-circuit calibration component 220: the third connection port 221 of the short-circuit calibration component 220 is connected to the first receiving port 310 of the test fixture 300 through a test probe, the first receiving port 310 of the test fixture 300 is connected to one end of the first RF line 610 to be tested, and the other end of the first RF line 610 to be tested is connected to the first RF port 110 of the comprehensive tester 100; the fourth connection port 221 of the short-circuit calibration component 220 is connected to the first receiving port 310 of the test fixture 300 through a test probe, and the first receiving port 310 of the test fixture 300 is connected to one end of the first RF line 610 to be tested, and the other end of the first RF line 610 to be tested is connected to the first RF port 110 of the comprehensive tester 100; The connection port 222 is connected to the second receiving port 320 of the test fixture 300 through a test probe, the second receiving port 320 of the test fixture 300 is connected to one end of the second RF line 620 to be tested, and the other end of the second RF line 620 to be tested is connected to the second RF port 120 of the comprehensive tester 100; the short-circuit calibration component 220 is used to detect the third basic line loss between the first RF port 110 of the comprehensive tester 100 and the third connection port 221 of the short-circuit calibration component 220 in a short-circuit state and the fourth basic line loss between the second RF port 120 of the comprehensive tester 100 and the fourth connection port 222 of the short-circuit calibration component 220.

[0060] Specifically, the line loss calibration component 200 also includes a short-circuit calibration component 220. In the short-circuit calibration component 220 (i.e., the Short board), the other side of the third connection port 221 and the fourth connection port 222 are grounded for detecting the line loss value under the short-circuit state; the short-circuit calibration component 220 includes at least a third connection port 221 and a fourth connection port 222, and the number of connection ports of the short-circuit calibration component 220 corresponds to the number of RF lines to be tested.

[0061] When the test fixture 300 is configured with the short-circuit calibration piece 220: the third connection port 221 of the short-circuit calibration piece 220 is connected to the first receiving port 310 of the test fixture 300 through the test probe, the first receiving port 310 of the test fixture 300 is connected to one end of the first RF line 610 to be tested, and the other end of the first RF line 610 to be tested is connected to the first RF port 110 of the comprehensive tester 100. When the short-circuit calibration piece 220 is configured, the comprehensive tester 100 transmits the signal along the first RF line 610 to be tested to the first receiving port 310 on the test fixture 300 through the first RF port 110, and the first receiving port 310 transmits the received signal to the third connection port 221 through the test probe. Under ideal conditions, the line loss on the test probe can be ignored.

[0062] The fourth connection port 222 of the short-circuit calibration component 220 is connected to the second receiving port 320 of the test fixture 300 through a test probe, and the second receiving port 320 of the test fixture 300 is connected to one end of the second RF line 620 to be tested, and the other end of the second RF line 620 to be tested is connected to the second RF port 120 of the comprehensive tester 100. When configuring the short-circuit calibration component 220, the comprehensive tester 100 transmits the signal along the second RF line 620 to be tested to the second receiving port 320 on the test fixture 300 through the second RF port 120, and the second receiving port 320 transmits the received signal to the fourth connection port 222 through the test probe. Under ideal conditions, the line loss on the test probe can be ignored.

[0063] The short-circuit calibration component 220 is used to detect the third basic line loss between the first RF port 110 of the comprehensive tester 100 and the third connection port 221 of the short-circuit calibration component 220 in the short-circuit state, and to detect the fourth basic line loss between the second RF port 120 of the comprehensive tester 100 and the fourth connection port 222 of the short-circuit calibration component 220. The line loss between the first RF port 110 of the comprehensive tester 100 and the third connection port 221 of the short-circuit calibration component 220 in the short-circuit state detected by the short-circuit calibration component 220 is recorded as the third basic line loss, and the line loss between the second RF port 120 and the fourth connection port 222 of the short-circuit calibration component 220 is recorded as the fourth basic line loss.

[0064] refer to Figure 4 , is a schematic diagram of a load calibration component testing system provided in an embodiment of the present invention.

[0065] Specifically, the line loss calibration component 200 also includes a load calibration component 230, and the load calibration component 230 (i.e., the Load board) is used to detect the line loss value under the load state; the load calibration component 230 includes at least a fifth connection port 231 and a sixth connection port 232, and the number of connection ports of the load calibration component 230 corresponds to the number of RF lines to be tested.

[0066] When the test fixture 300 is configured with the load calibration component 230: the fifth connection port 231 of the load calibration component 230 is connected to the first receiving port 310 of the test fixture 300 through the test probe, the first receiving port 310 of the test fixture 300 is connected to one end of the first RF line 610 to be tested, and the other end of the first RF line 610 to be tested is connected to the first RF port 110 of the comprehensive tester 100. When the load calibration component 230 is configured, the comprehensive tester 100 transmits the signal along the first RF line 610 to be tested to the first receiving port 310 on the test fixture 300 through the first RF port 110, and the signal received by the first receiving port 310 is transmitted to the fifth connection port 231 through the test probe. Under ideal conditions, the line loss on the test probe can be ignored.

[0067] The sixth connection port 232 of the load calibration component 230 is connected to the second receiving port 320 of the test fixture 300 through a test probe, the second receiving port 320 of the test fixture 300 is connected to one end of the second RF line 620 to be tested, and the other end of the second RF line 620 to be tested is connected to the second RF port 120 of the comprehensive tester 100. The signal received by the sixth connection port 232 is transmitted to the second receiving port 320 through the test probe, and the signal of the second receiving port 320 is transmitted to the second RF port 120 through the second RF line 620 to be tested.

[0068] In the load calibration component 230, the fifth connection port 231 and the sixth connection port 232 are short-circuited and connected. The load calibration component 230 is used to detect the total line loss between the first RF port 110 and the second RF port 120 of the comprehensive tester 100 under load. At this time, the signal is sent from the first RF port 110, sent to the first receiving port 310 along the first RF line 610 to be tested, transmitted from the first receiving port 310 to the fifth connection port 231 through the test probe, sent from the fifth connection port 231 to the sixth connection port 232, and then transmitted from the sixth connection port 232 to the second receiving port 320 through the test probe, and transmitted from the second receiving port 320 along the second RF line 620 to be tested to the second RF port 120. At this time, the load calibration component 230 can detect the total line loss between the first RF port 110 and the second RF port 120 of the comprehensive tester 100 under load, which is recorded as LOSS (1→2). Under ideal conditions, the line loss on the test probe can be ignored.

[0069] From the above description, it can be seen that the line loss testing system provided by the present invention greatly improves the accuracy of line loss detection by testing the line loss values ​​of different calibration parts and using the calibration values ​​under different calibration states to perform line loss compensation calculations, thereby effectively avoiding equipment failures or communication interruptions caused by line loss problems, and can effectively maintain the stable operation of the communication network; at the same time, in production testing, it can quickly resolve the problem of incorrect line loss compensation values, improve production efficiency, and extend the service life of the test gold plate; in addition, the line loss testing system is also easy to operate, greatly saves the testing time cost of testers, and improves the efficiency of line loss testing.

[0070] Based on the same inventive concept, corresponding to the line loss testing system provided in any of the above embodiments, the present invention also provides a line loss testing method.

[0071] refer to Figure 5 , is a schematic flow chart of a line loss testing method provided in an embodiment of the present invention.

[0072] Step S501, obtaining a first basic line loss between a first RF port of a comprehensive tester and a first connection port of an open circuit calibration component and a second basic line loss between a second RF port of the comprehensive tester and a second connection port of the open circuit calibration component in a line loss test system in an open circuit state.

[0073] Specifically, when the open-circuit calibration component is subjected to line loss detection, the integrated tester sends a signal to the test fixture. At this time, the signal is sent from the first RF port of the integrated tester, and is sent to the first connection port along the first RF line to be tested. At this time, the line loss on the first RF line to be tested is the first basic line loss; the signal is sent from the second RF port of the integrated tester, and is sent to the second connection port along the second RF line to be tested. At this time, the line loss on the second RF line to be tested is the second basic line loss.

[0074] It should be noted that in actual production, the first basic line loss and the second basic line loss need to be obtained by averaging. In actual production calculations, in order to reduce errors, each signal can be sampled 20 times, at which time the highest value and the lowest value are removed, and the remaining 18 signal values ​​are averaged to obtain the first basic line loss or the second basic line loss.

[0075] Step S502, obtaining a third basic line loss between the first RF port of the comprehensive tester and the third connection port of the short-circuit calibration component and a fourth basic line loss between the second RF port of the comprehensive tester and the fourth connection port of the short-circuit calibration component in the line loss test system in a short-circuit state.

[0076] Specifically, when the short-circuit calibration component is subjected to line loss detection, the integrated tester sends a signal to the test fixture. At this time, the signal is sent from the first RF port of the integrated tester, and is sent to the third connection port along the first RF line to be tested. At this time, the line loss on the first RF line to be tested is the third basic line loss; the signal is sent from the second RF port of the integrated tester, and is sent to the fourth connection port along the second RF line to be tested. At this time, the line loss on the second RF line to be tested is the fourth basic line loss.

[0077] It should be noted that in actual production, the third basic line loss and the fourth basic line loss need to be obtained by averaging. In actual production calculations, in order to reduce errors, each signal can be sampled 20 times, at which time the highest value and the lowest value are removed, and the remaining 18 signal values ​​are averaged to obtain the third basic line loss or the fourth basic line loss.

[0078] Step S503, obtaining a line loss between a first RF port and a second RF port of the comprehensive tester in a load state of the line loss test system.

[0079] Specifically, when the load calibration component is tested, the comprehensive tester sends a signal to the test fixture. At this time, the signal is sent from the first RF port, sent along the first RF line to be tested to the fifth connection port, transmitted to the sixth connection port through the fifth connection port, and the sixth connection port transmits the signal along the second RF line to be tested to the second RF port. At this time, the line loss obtained is the total line loss between the first RF port and the second RF port of the comprehensive tester.

[0080] It should be noted that in actual production, the total bus loss between the first RF port and the second RF port needs to be obtained by averaging. In actual production calculations, in order to reduce errors, each group of signals can be sampled 20 times, and then a group of highest values ​​and a group of lowest values ​​are removed, and the remaining 18 groups of signal values ​​are averaged to obtain the total bus loss LOSS (1→2).

[0081] Step S504, calculate the first target total line loss of the first RF line to be tested and the second target total line loss of the second RF line to be tested according to the first basic line loss, the second basic line loss, the third basic line loss, the fourth basic line loss, the total line loss, the load port line loss and the line loss correction parameters; wherein the load port line loss is the port line loss between the fifth connection port and the sixth connection port of the load calibration component; the line loss correction parameters include a first line loss correction parameter corresponding to the first RF line to be tested and a second line loss correction parameter corresponding to the second RF line to be tested.

[0082] Specifically, the first target total line loss is related to the first basic line loss, the third basic line loss, the total line loss, the load port line loss and the line loss correction parameter, and the second target total line loss is related to the second basic line loss, the fourth basic line loss, the total line loss, the load port line loss and the line loss correction parameter. Among them, since there is also a certain line loss value between the fifth connection port and the sixth connection port of the load calibration component, that is, the line loss between the fifth connection port and the sixth connection port is the load port line loss, recorded as K(1→2), and the load port line loss needs to be obtained through the network analyzer inspection S21. The line loss correction parameters include the first line loss correction parameter corresponding to the first RF line to be tested and the second line loss correction parameter corresponding to the second RF line to be tested.

[0083] It should be noted that in S21, S stands for Scattering parameter, which refers to the characteristics of the reflection signal and the transmission signal of the component. Therefore, the S parameter includes reflection parameters, such as S11, S22, etc.; transmission parameters S12, S21, etc. Among them, S21 is the forward transmission coefficient, also known as insertion loss, which usually refers to the signal loss caused by inserting a cable or component between the signal sending device and the signal receiving device. In an embodiment of the present invention, by using a network analyzer to perform a spot check on the fifth connection port and the sixth connection port, the measured S21 parameter is the line loss between the fifth connection port and the sixth connection port, that is, the load port line loss.

[0084] As an optional embodiment, a first target total line loss of a first RF line to be tested and a second target total line loss of a second RF line to be tested are calculated according to a first basic line loss, a second basic line loss, a third basic line loss, a fourth basic line loss, a total line loss, a load port line loss and a line loss correction parameter, including: calculating the first target basic line loss of the first RF line to be tested in a short-circuit state and an open-circuit state according to the first basic line loss and the third basic line loss; calculating the second target basic line loss of the first RF line to be tested in a short-circuit state and an open-circuit state according to the second basic line loss and the fourth basic line loss; calculating the first target total line loss of the first RF line to be tested according to the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss and the first line loss correction parameter; calculating the second target total line loss of the second RF line to be tested according to the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss and the second line loss correction parameter.

[0085] Specifically, the first target basic line loss is the line loss on the first RF line to be tested in the open circuit state and the short circuit state. The first target basic line loss is recorded as LOSS 1 In actual production calculations, the first target basic line loss is obtained by averaging the first basic line loss and the third basic line loss; the second target basic line loss is the line loss on the second RF line to be tested in the open circuit state and the short circuit state. The second target basic line loss is recorded as LOSS 2 In actual production calculations, the second target basic line loss is obtained by averaging the second basic line loss and the fourth basic line loss. The first target total line loss of the first RF line to be tested is calculated by the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss, and the first line loss correction parameter. The second target total line loss of the second RF line to be tested is calculated by the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss, and the second line loss correction parameter.

[0086] It should be noted that the line loss correction parameter is a correction value for the line loss value error. In actual production calculations, due to multiple factors such as fixture shielding effect, test contact, and ejector pins, there will be some loss deviations in the line loss value. Therefore, it is necessary to evaluate the line loss value according to the production and test conditions to obtain the correction parameter value, and add the correction parameter value when calculating the first target total line loss to ensure the authenticity and validity of the line loss value.

[0087] As an optional embodiment, the first target total line loss of the first RF line to be tested 610 is calculated according to the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss, and the first line loss correction parameter, including:

[0088]

[0089] Among them, P 1 _LOSS is the first target bus loss, LOSS 1 The first target basic line loss, LOSS 2 is the second target basic line loss, LOSS(1→2) is the total line loss, K(1→2) is the load port line loss, Y 1 is the first line loss correction parameter.

[0090] Specifically, the value of the first target total line loss needs to be calculated by the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss and the first line loss correction parameter. In the formula, LOSS(1→2)-K(1→2)-LOSS 1 -LOSS 2 In actual production, under load, the total loss impact value of the load calibration component on the line loss value. Since the signal passes through the first RF line to be tested and the second RF line to be tested under load, the total loss impact value needs to be divided by 2 to obtain the loss impact value on one RF line to be tested, and then it is corrected by the line loss correction parameter, and finally the correct first target total line loss value is obtained according to the formula.

[0091] As an optional embodiment, the second target total line loss of the second RF line to be tested is calculated according to the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss, and the second line loss correction parameter, including:

[0092]

[0093] Among them, P 2 _LOSS is the second target bus loss, LOSS 1 The first target basic line loss, LOSS 2 is the second target basic line loss, LOSS(1→2) is the total line loss, K(1→2) is the load port line loss, Y 2 is the second line loss correction parameter.

[0094] Specifically, the value of the first target total line loss needs to be calculated by the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss and the first line loss correction parameter. In the formula, LOSS(1→2)-K(1→2)-LOSS 1 -LOSS 2 In actual production, under load, the total loss impact value of the load calibration component on the line loss value. Since the signal passes through the first RF line to be tested and the second RF line to be tested under load, the total loss impact value needs to be divided by 2 to obtain the loss impact value on one RF line to be tested, and then it is corrected by the line loss correction parameter, and finally the correct first target total line loss value is obtained according to the formula.

[0095] refer to Figure 6 , is a schematic diagram of the line loss test process during actual production testing provided by an embodiment of the present invention.

[0096] Step S1, open the gold plate inspection tool.

[0097] Specifically, during actual production testing, it is first necessary to select a gold plate inspection tool on the comprehensive tester to provide a radio frequency signal for verifying the calibration component.

[0098] Step S2: according to the prompt of the gold plate inspection tool, place the open circuit calibration piece or the short circuit calibration piece, and perform a line loss test on the open circuit calibration piece or the short circuit calibration piece.

[0099] Specifically, according to the prompt of the gold plate inspection tool, an open circuit calibration piece or a short circuit calibration piece is placed on the test fixture, and the comprehensive tester provides an RF signal to the open circuit calibration piece or the short circuit calibration piece, and records and calculates the basic line loss in the open circuit state or the short circuit state.

[0100] Step S3, according to the prompt of the gold plate inspection tool, load the calibration piece and perform a line loss test on the loaded calibration piece.

[0101] Specifically, when conducting a line loss test on a load calibration device, it is necessary to detect the S21 parameter of the load calibration device through a network analyzer to obtain the load port line loss of the load calibration device. The comprehensive tester provides an RF signal to the load calibration device to record the total line loss.

[0102] Step S4, calculating the first target bus loss and the second target bus loss.

[0103] Specifically, when the first target line loss and the second target line loss are calculated for the first time, the line loss correction parameter can be defaulted to 0, and the first target line loss and the second target line loss are calculated based on the basic line loss and the bus loss. If the calculation of the first target line loss or the second target line loss fails (such as the calculated value deviates too much from the theoretical value), it is necessary to retest all line loss values ​​starting from step S2.

[0104] Step S5, performing a performance test on the first target bus loss and the second target bus loss.

[0105] Specifically, the first target line loss and the second target line loss are usually determined based on specific test requirements to determine whether their performance meets the standards. If the performance does not meet the standards, the line loss correction parameters need to be recalculated and brought into step S4 to recalculate the first target line loss and the second target line loss; if the performance meets the standards, the line loss test process ends and production can be carried out.

[0106] According to a line loss testing method provided by an embodiment of the present invention, the line loss value of the RF signal under different test states is calculated, and the line loss compensation calculation is performed according to the line loss values ​​in different states, thereby greatly improving the accuracy of the line loss test and reducing the error phenomenon caused by repeated manual operations. It is convenient for testers to operate while reducing labor costs, and effectively improving production efficiency.

[0107] It should be noted that the method of the embodiment of the present invention can be performed by a single device, such as a computer or a server. The method of this embodiment can also be applied in a distributed scenario and completed by multiple devices cooperating with each other. In the case of such a distributed scenario, one of the multiple devices can only perform one or more steps in the method of the embodiment of the present invention, and the multiple devices will interact with each other to complete the described method.

[0108] It should be noted that some embodiments of the present invention are described above. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in an order different from that in the above embodiments and still achieve the desired results. In addition, the processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0109] Based on the same inventive concept, corresponding to the method described in any of the above embodiments, the present invention also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the method described in any of the above embodiments when executing the program.

[0110] Figure 7 A more specific schematic diagram of the hardware structure of an electronic device provided in this embodiment is shown, and the device may include: a processor 710, a memory 720, an input / output interface 730, a communication interface 740, and a bus 750. The processor 710, the memory 720, the input / output interface 730, and the communication interface 740 are connected to each other in communication within the device through the bus 750.

[0111] The processor 710 can be implemented by a general-purpose CPU (Central Processing Unit), a microprocessor, an application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this specification.

[0112] The memory 720 may be implemented in the form of ROM (Read Only Memory), RAM (Random Access Memory), static storage device, dynamic storage device, etc. The memory 720 may store an operating system and other application programs. When the technical solutions provided in the embodiments of this specification are implemented by software or firmware, the relevant program codes are stored in the memory 720 and are called and executed by the processor 710.

[0113] The input / output interface 730 is used to connect the input / output module to realize information input and output. The input / output module can be configured in the device as a component (not shown in the figure), or it can be externally connected to the device to provide corresponding functions. The input device may include a keyboard, a mouse, a touch screen, a microphone, various sensors, etc., and the output device may include a display, a speaker, a vibrator, an indicator light, etc.

[0114] The communication interface 740 is used to connect a communication module (not shown) to realize communication interaction between the device and other devices. The communication module can realize communication through a wired mode (such as USB, network cable, etc.) or a wireless mode (such as mobile network, WIFI, Bluetooth, etc.).

[0115] The bus 750 comprises a pathway that transmits information between the various components of the device (eg, the processor 710 , the memory 720 , the input / output interface 730 , and the communication interface 740 ).

[0116] It should be noted that, although the above device only shows the processor 710, the memory 720, the input / output interface 730, the communication interface 740 and the bus 750, in the specific implementation process, the device may also include other components necessary for normal operation. In addition, it can be understood by those skilled in the art that the above device may also only include the components necessary for implementing the embodiments of the present specification, and does not necessarily include all the components shown in the figure.

[0117] The electronic device of the above embodiment is used to implement the corresponding method in any of the above embodiments, and has the beneficial effects of the corresponding method embodiment, which will not be described in detail here.

[0118] Based on the same inventive concept, corresponding to the method described in any of the above embodiments, the present invention also provides a non-transitory computer-readable storage medium, wherein the non-transitory computer-readable storage medium stores computer instructions, and the computer instructions are used to enable the computer to execute the method described in any of the above embodiments.

[0119] The above-mentioned non-transitory computer-readable storage medium can be any available medium or data storage device that can be accessed by a computer, including but not limited to magnetic storage (such as floppy disks, hard disks, magnetic tapes, magneto-optical disks (MO), etc.), optical storage (such as CD, DVD, BD, HVD, etc.), and semiconductor storage (such as ROM, EPROM, EEPROM, non-volatile memory (NAND FLASH), solid-state drive (SSD)), etc.

[0120] The computer instructions stored in the storage medium of the above embodiment are used to enable the computer to execute the method described in any embodiment of the above exemplary method part, and have the beneficial effects of the corresponding method embodiment, which will not be repeated here.

[0121] In addition, although the operations of the method of the present invention are described in a specific order in the accompanying drawings, this does not require or imply that the operations must be performed in this specific order, or that all the operations shown must be performed to achieve the desired results. On the contrary, the steps depicted in the flow chart can be performed in a different order. Additionally or alternatively, some steps can be omitted, multiple steps can be combined into one step, and / or one step can be decomposed into multiple steps.

[0122] It should be understood that the various parts of the present invention can be implemented by hardware, software, firmware or a combination thereof. In the above-mentioned embodiments, a plurality of steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or their combination: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0123] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the embodiments of the present invention should be understood by people with ordinary skills in the field to which the present invention belongs. The "first", "second" and similar words used in the embodiments of the present invention do not indicate any order, quantity or importance, but are only used to distinguish different components. "Include" or "comprise" and similar words mean that the elements or objects appearing before the word include the elements or objects listed after the word and their equivalents, without excluding other elements or objects. "Connect" or "connected" and similar words are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0124] Although the spirit and principle of the present invention have been described with reference to several specific embodiments, it should be understood that the present invention is not limited to the disclosed specific embodiments, and the division of various aspects does not mean that the features in these aspects cannot be combined to benefit, and this division is only for the convenience of expression. The present invention is intended to cover various modifications and equivalent arrangements included in the spirit and scope of the attached claims. The scope of the attached claims conforms to the broadest interpretation, thereby including all such modifications and equivalent structures and functions.

Claims

1. A line loss test system, characterized in that: include: Test fixture (300); A line loss calibration piece (200) is arranged on the test fixture (300), and the line loss calibration piece (200) is connected to a receiving port of the test fixture (300) via a test probe of the test fixture (300); A comprehensive tester (100), the comprehensive tester (100) being connected to the line loss calibration component (200) via a radio frequency line to be tested, the comprehensive tester (100) being used to send or receive a test signal according to a test instruction; A PC end (400), the PC end (400) is respectively connected to the test fixture (300) and the comprehensive tester (100) for communication, and is used to send a test instruction to the comprehensive tester (100).

2. The line loss test system according to claim 1, characterized in that: It also includes a power supply (500), which is connected to the test fixture (300) and is used to supply power to the line loss calibration component (200).

3. The line loss test system according to claim 1, characterized in that: The radio frequency line to be tested comprises at least a first radio frequency line to be tested (610) and a second radio frequency line to be tested (620); the line loss calibration component (200) comprises an open circuit calibration component (210); the open circuit calibration component (210) comprises at least a first connection port (211) and a second connection port (212); When the test fixture (300) is equipped with an open-circuit calibration component (210): The first connection port (211) of the open-circuit calibration component (210) is connected to the first receiving port (310) of the test fixture (300) through a test probe, the first receiving port (310) of the test fixture (300) is connected to one end of the first radio frequency line (610) to be tested, and the other end of the radio frequency line to be tested is connected to the first radio frequency port (110) of the comprehensive tester (100); The second connection port (212) of the open-circuit calibration component (210) is connected to the second receiving port (320) of the test fixture (300) through a test probe, the second receiving port (320) of the test fixture (300) is connected to one end of the second radio frequency line (620) to be tested, and the other end of the second radio frequency line (620) to be tested is connected to the second radio frequency port (120) of the comprehensive tester (100); The open circuit calibration component (210) is used to detect a first basic line loss between a first radio frequency port (110) of the comprehensive tester (100) and a first connection port (211) of the open circuit calibration component (210) and a second basic line loss between a second radio frequency port (120) of the comprehensive tester (100) and a second connection port (212) of the open circuit calibration component (210) in an open circuit state.

4. The line loss test system according to claim 3, characterized in that: The line loss calibration component (200) further comprises a short circuit calibration component (220); the short circuit calibration component (220) comprises at least a third connection port (221) and a fourth connection port (222); When the test fixture (300) is equipped with a short-circuit calibration component (220): The third connection port (221) of the short-circuit calibration component (220) is connected to the first receiving port (310) of the test fixture (300) through a test probe, the first receiving port (310) of the test fixture (300) is connected to one end of the first radio frequency line (610) to be tested, and the other end of the first radio frequency line (610) to be tested is connected to the first radio frequency port (110) of the comprehensive tester (100); The fourth connection port (222) of the short-circuit calibration component (220) is connected to the second receiving port (320) of the test fixture (300) through a test probe, the second receiving port (320) of the test fixture (300) is connected to one end of the second radio frequency line (620) to be tested, and the other end of the second radio frequency line (620) to be tested is connected to the second radio frequency port (120) of the comprehensive tester (100); The short-circuit calibration component (220) is used to detect a third basic line loss between the first radio frequency port (110) of the comprehensive tester (100) and the third connection port (221) of the short-circuit calibration component (220) and a fourth basic line loss between the second radio frequency port (120) of the comprehensive tester (100) and the fourth connection port (222) of the short-circuit calibration component (220) in a short-circuit state.

5. The line loss test system according to claim 3, characterized in that: The line loss calibration component (200) further comprises a load calibration component (230); the load calibration component (230) comprises at least a fifth connection port (231) and a sixth connection port (232); When the test fixture (300) is configured with the load calibration component (230): The fifth connection port (231) of the load calibration component (230) is connected to the first receiving port (310) of the test fixture (300) through a test probe, the first receiving port (310) of the test fixture (300) is connected to one end of the first radio frequency line (610) to be tested, and the other end of the first radio frequency line (610) to be tested is connected to the first radio frequency port (110) of the comprehensive tester (100); The sixth connection port (232) of the load calibration component (230) is connected to the second receiving port (320) of the test fixture (300) through a test probe, the second receiving port (320) of the test fixture (300) is connected to one end of the second radio frequency line (620) to be tested, and the other end of the second radio frequency line (620) to be tested is connected to the second radio frequency port (120) of the comprehensive tester (100); The fifth connection port (231) of the load calibration component (230) is short-circuited to the sixth connection port (232) of the load calibration component (230); The load calibration component (230) is used to detect the total line loss between the first radio frequency port (110) of the comprehensive tester (100) and the second radio frequency port (120) of the comprehensive tester (100) in a load state.

6. A line loss testing method, characterized in that: A line loss test system as claimed in any one of claims 1 to 5, comprising: Obtaining a first basic line loss between a first radio frequency port of the comprehensive tester and a first connection port of the open circuit calibration component and a second basic line loss between a second radio frequency port of the comprehensive tester and a second connection port of the open circuit calibration component in the line loss test system in an open circuit state; Obtaining a third basic line loss between the first RF port of the comprehensive tester and the third connection port of the short-circuit calibration component and a fourth basic line loss between the second RF port of the comprehensive tester and the fourth connection port of the short-circuit calibration component of the line loss test system in a short-circuit state; Obtaining a total line loss between a first RF port of a comprehensive tester and a second RF port of the comprehensive tester in a load state of the line loss test system; A first target total line loss of the first RF line to be tested and a second target total line loss of the second RF line to be tested are calculated according to the first basic line loss, the second basic line loss, the third basic line loss, the fourth basic line loss, the total line loss, the load port line loss and the line loss correction parameters; wherein the load port line loss is the port line loss between the fifth connection port and the sixth connection port of the load calibration component; and the line loss correction parameters include a first line loss correction parameter corresponding to the first RF line to be tested and a second line loss correction parameter corresponding to the second RF line to be tested.

7. The line loss testing method according to claim 6, characterized in that: The calculating a first target total total loss of a first radio frequency line to be tested and a second target total total loss of a second radio frequency line to be tested according to the first basic line loss, the second basic line loss, the third basic line loss, the fourth basic line loss, the total total loss, the load port line loss and the line loss correction parameter comprises: Calculate a first target basic line loss of the first radio frequency line to be tested in a short-circuit state and an open-circuit state according to the first basic line loss and the third basic line loss; Calculate a second target basic line loss of the first radio frequency line to be tested in a short-circuit state and an open-circuit state according to the second basic line loss and the fourth basic line loss; A first target total line loss of the first RF line to be tested is calculated according to the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss, and the first line loss correction parameter; The second target total line loss of the two RF lines to be tested is calculated according to the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss, and the second line loss correction parameter.

8. The line loss testing method according to claim 7, characterized in that: The step of calculating the first target total line loss of the first radio frequency line to be tested according to the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss, and the first line loss correction parameter includes: Among them, P1_LOSS is the first target total line loss, LOSS1 is the first target basic line loss, LOSS2 is the second target basic line loss, LOSS(1→2) is the total line loss, K(1→2) is the load port line loss, and Y1 is the first line loss correction parameter.

9. The line loss testing method according to claim 7, characterized in that: The step of calculating the second target total line loss of the two RF lines to be tested according to the first target basic line loss, the second target basic line loss, the total line loss, the load port line loss, and the second line loss correction parameter includes: Among them, P2_LOSS is the second target total line loss, LOSS1 is the first target basic line loss, LOSS2 is the second target basic line loss, LOSS(1→2) is the total line loss, K(1→2) is the load port line loss, and Y2 is the second line loss correction parameter.

10. An electronic device, comprising one or more memories and one or more processors, characterized in that: The memory is used to store a computer program; the processor is used to call the computer program so that the electronic device executes the method described in any one of claims 6 to 9.

11. A computer storage medium, characterized in that: include: Computer instructions; when the computer instructions are executed on an electronic device, the electronic device executes the method according to any one of claims 6 to 9.

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