Thomson scattering device, map diagnosis method, electronic apparatus, and storage medium

Abstract

The invention provides a Thomson scattering device, an atlas diagnosis method, electronic equipment and a storage medium, and belongs to the technical field of plasma diagnosis, the Thomson scattering device comprises a first laser, a first laser reflector and a first laser focusing lens; a second laser, a second laser reflector, a third laser reflector and a second laser focusing lens; a target material and a target frame; a second collection lens; and a spectrometer. According to the atlas diagnosis method provided by the invention, the technical problem that real-time diagnosis cannot be performed in Thomson scattering experiments in related technologies is solved.

Description

Technical Field

[0001] The present invention relates to the field of plasma diagnosis technology, and in particular to a Thomson scattering device, a spectrum diagnosis method, an electronic device and a storage medium. Background Art

[0002] Accurate diagnosis of plasma is an important prerequisite for in-depth research on the microscopic physical process of laser plasma. Common plasma diagnostic methods include emission spectroscopy, laser interferometry, transient imaging and Thomson scattering. Thomson scattering refers to passing a probe laser through the plasma, causing the electrons or ions inside the plasma to vibrate and emit secondary radiation, thereby generating Thomson scattering. The plasma state parameters can be directly obtained by measuring the relationship between the profile of the Thomson scattering signal and the plasma state parameters. Compared with diagnostic techniques such as spectroscopy, transient imaging and laser interferometry, Thomson scattering has significant advantages such as high temporal and spatial resolution and a wider parameter diagnostic range. However, in specific experimental operations, Thomson scattering has the problem of weak scattering signals and difficult acquisition. It usually requires a large number of repeated experiments to optimize the experimental conditions in order to obtain good scattering signals.

[0003] The Thomson scattering experiment in the related technology not only has the problems of difficulty in optical path debugging and low device integration during the device construction process, but also has the limitations of difficulty in signal measurement and inability to diagnose in real time during the experiment. Summary of the invention

[0004] The present invention provides a Thomson scattering device, a spectrum diagnosis method, an electronic device and a storage medium, which are used to solve the technical problems that the Thomson scattering experiment in the related art not only has the problems of difficulty in optical path debugging and low device integration during the device construction process, but also has the limitations of difficulty in signal measurement and inability to diagnose in real time during the experiment.

[0005] The present invention provides a Thomson scattering device, comprising: a first laser, a first laser reflecting mirror and a first laser focusing lens; the first laser is used to output ablation laser; the first laser reflecting mirror is optically connected to the first laser, and is used to vertically reflect the ablation laser output by the first laser to the first laser focusing lens; the first laser focusing lens is optically connected to the first laser reflecting mirror, and is used to focus the ablation laser output by the first laser reflecting mirror; a second laser, a second laser reflecting mirror, a third laser reflecting mirror and a second laser focusing lens; the second laser is used to output probe laser; the second laser reflecting mirror is optically connected to the second laser, and is used to vertically reflect the probe laser output by the second laser to the third laser reflecting mirror; the third laser reflecting mirror Optically connected to the second laser focusing lens, used for vertically reflecting the probe laser output by the second laser reflecting mirror to the second laser focusing lens; the second laser focusing lens is used for focusing the probe laser output by the third laser reflecting mirror; a target material and a target holder; the target material is used for receiving the ablation laser output by the first laser focusing lens, the target material is used for reacting with the ablation laser to generate laser plasma, and the laser plasma is used for reacting with the probe laser to output a Thomson scattering signal; the target holder is used for fixing the target material; a second collecting lens and a spectrometer; the second collecting lens is optically connected to the spectrometer, the second collecting lens is used for receiving and focusing the light generated by the laser plasma, and the spectrometer is used for receiving the light focused by the second collecting lens and outputting a Thomson scattering spectrum.

[0006] A Thomson scattering device provided according to the present invention also includes: a first collecting lens and a transient camera; the first collecting lens and the transient camera are optically connected, the first collecting lens is used to receive and focus the light generated by the laser plasma, and the transient camera is used to receive the light focused by the first collecting lens and output a transient image of the laser plasma.

[0007] A Thomson scattering device provided according to the present invention further includes: a mobile control platform; the mobile control platform is connected to the target stand and is used to control the three-dimensional movement of the target stand.

[0008] The present invention provides a spectrum diagnosis method implemented based on any one of the above-mentioned Thomson scattering devices, comprising the following steps: acquiring a target Thomson scattering spectrum; determining a target peak displacement and a target half-width of the target Thomson scattering spectrum; determining a target temperature based on the positions of the target peak displacement and the target half-width in a preset electron temperature spectrum; and determining a target density based on the positions of the target peak displacement and the target half-width in a preset electron density spectrum.

[0009] According to a spectrum diagnosis method provided by the present invention, the target Thomson scattering spectrum is obtained, including: obtaining a group of Thomson scattering spectra; each Thomson scattering spectrum in the group of Thomson scattering spectra is output by a spectrometer; outliers in the group of Thomson scattering spectra are screened out to obtain a group of Thomson scattering spectra after the outliers are screened out; and the average value of the spectral intensity of the group of Thomson scattering spectra after the outliers are screened out is calculated to obtain the target Thomson scattering spectrum.

[0010] According to a spectrum diagnosis method provided by the present invention, before obtaining the target Thomson scattering spectrum, the method also includes: obtaining a set of sample temperatures and a set of sample densities; combining each sample temperature in the set of sample temperatures with each sample density in the set of sample densities in turn to obtain a set of sample temperature density data; using each sample temperature density data in the set of sample temperature density data as the target sample temperature density data to perform a preset step to obtain a target theoretical profile, and then obtain a set of theoretical profiles corresponding to the set of sample temperature density data; the target sample temperature density data includes the target sample temperature and the target sample density; calculating the spectral peak displacement and half-maximum full width corresponding to each theoretical profile in the set of theoretical profiles to obtain a set of sample data; constructing the preset electron temperature spectrum and the preset electron density spectrum according to the set of sample data; the preset electron temperature spectrum is used to reflect the relationship between the spectral peak displacement and half-maximum full width and temperature; the preset electron density spectrum is used to reflect the relationship between the spectral peak displacement and half-maximum full width and density; wherein the preset step includes: calculating the target theoretical profile according to the target sample temperature and the target sample density by the following formula : ; ; ; in, is the target sample density; is the target sample temperature; is the Boltzmann constant; is the dielectric constant of vacuum; is the charge carried by the electron; is the wavelength of the probe laser; is the angle between the incident laser direction and the observation direction; is the scattering factor, which is used to characterize the scattering degree of plasma; is the dispersion function; , is the independent variable of the dispersion function, is the thermal average velocity of plasma electrons, is the scattered light frequency and the incident light frequency The difference vector, is the wave vector; Is an imaginary unit.

[0011] According to a spectrum diagnosis method provided by the present invention, obtaining a set of Thomson scattering spectra includes: controlling the target frame and the first laser focusing lens to move synchronously along the Z-axis direction, obtaining the Thomson scattering spectra measured when the target material is at different positions, and obtaining the set of Thomson scattering spectra.

[0012] The present invention also provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, any of the above-mentioned atlas diagnosis methods is implemented.

[0013] The present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements any of the above-described atlas diagnosis methods.

[0014] The present invention also provides a computer program product, comprising a computer program, wherein when the computer program is executed by a processor, the computer program implements any of the above-mentioned atlas diagnosis methods.

[0015] The present invention provides a Thomson scattering device, a spectrum diagnosis method, an electronic device and a storage medium. The Thomson scattering device comprises: a first laser, a first laser reflector and a first laser focusing lens; a second laser, a second laser reflector, a third laser reflector and a second laser focusing lens; a target material and a target stand; a second collecting lens and a spectrometer. The Thomson scattering device of the present invention adopts a cage structure, has simple optical path debugging, high device integration, low signal measurement difficulty, high space utilization, and can realize real-time diagnosis, thereby solving the technical problems in the related art that the Thomson scattering experiment not only has the problems of difficult optical path debugging and low device integration during the device construction process, but also has the limitations of great signal measurement difficulty and inability to diagnose in real time during the experiment. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced one by one below. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0017] Figure 1 It is a front view of the Thomson scattering device provided by the present invention.

[0018] Figure 2It is a left view of the Thomson scattering device provided by the present invention.

[0019] Figure 3 1 is a top view of the Thomson scattering device provided by the present invention.

[0020] Figure 4 It is a schematic diagram of a cage frame of the Thomson scattering device provided by the present invention.

[0021] Figure 5 It is a schematic diagram of the flow chart of the atlas diagnosis method provided by the present invention.

[0022] Figure 6 It is the Thomson scattering spectrum and transient image of the laser plasma measured by the Thomson scattering device provided by the present invention.

[0023] Figure 7 It is the preset electron temperature spectrum provided by the present invention.

[0024] Figure 8 It is a preset electron density map provided by the present invention.

[0025] Fig. 9 This is a graph showing the evolution of the electron temperature of the laser plasma provided by the present invention with respect to the delay time.

[0026] Fig.10 This is a graph showing the evolution of the electron density of the laser plasma provided by the present invention with respect to the delay time.

[0027] Fig.11 It is a structural schematic diagram of the electronic device provided by the present invention.

[0028] Figure numerals: 1-first laser; 2-second laser; 3-first laser reflection mirror; 4-second laser reflection mirror; 5-third laser reflection mirror; 6-first laser focusing lens; 7-second laser focusing lens; 8-first collecting lens; 9-second collecting lens; 10-spectrometer; 11-transient camera; 12-target; 13-target stand; 14-mobile control platform. DETAILED DESCRIPTION

[0029] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the drawings of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0030] It should be noted that in the description of the present invention, the terms "include", "comprise" or any other variant thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "include one..." do not exclude the existence of other identical elements in the process, method, article or device including the elements. The orientation or position relationship indicated by the terms "upper", "lower" and the like is based on the orientation or position relationship shown in the drawings, which is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of the present invention. Unless otherwise clearly specified and limited, the terms "installed", "connected" and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be a connection between the two elements. For those skilled in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0031] The terms "first", "second", etc. in the present invention are used to distinguish similar objects, and are not used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, so that the embodiments of the present invention can be implemented in an order other than those illustrated or described herein, and the objects distinguished by "first", "second", etc. are generally of the same type, and the number of objects is not limited. For example, the first object can be one or more. In addition, "and / or" means at least one of the connected objects, and the character " / " generally indicates that the objects associated with each other are in an "or" relationship.

[0032] Combine the following Figure 1-Figure 11 The present invention describes a Thomson scattering device, a spectrum diagnosis method, an electronic device and a storage medium.

[0033] The Thomson scattering device provided in this embodiment can be applied to the scenario of diagnosing plasma through the Thomson scattering method.

[0034] Figure 1-3 They are respectively a front view, a left view and a top view of the Thomson scattering device provided by the present invention, as shown in Figure 1-3 As shown, the Thomson scattering device includes: A first laser 1, a first laser reflector 3 and a first laser focusing lens 6; the first laser 1 is used to output ablation laser; the first laser reflector 3 is optically connected to the first laser 1, and is used to vertically reflect the ablation laser output by the first laser 1 to the first laser focusing lens 6; the first laser focusing lens 6 is optically connected to the first laser reflector 3, and is used to focus the ablation laser output by the first laser reflector 3.

[0035] The second laser 2, the second laser reflection mirror 4, the third laser reflection mirror 5 and the second laser focusing lens 7; the second laser 2 is used to output a probe laser; the second laser reflection mirror 4 is optically connected to the second laser 2, and is used to vertically reflect the probe laser output by the second laser 2 to the third laser reflection mirror 5; the third laser reflection mirror 5 is optically connected to the second laser focusing lens 7, and is used to vertically reflect the probe laser output by the second laser reflection mirror 4 to the second laser focusing lens 7; the second laser focusing lens 7 is used to focus the probe laser output by the third laser reflection mirror 5.

[0036] Target material 12 and target holder 13; target material 12 is used to receive ablation laser output by first laser focusing lens 6, target material 12 is used to react with ablation laser to generate laser plasma, laser plasma is used to react with probe laser to generate Thomson scattering signal; target holder 13 is used to fix target material 12.

[0037] The second collecting lens 9 and the spectrometer 10 are optically connected. The second collecting lens 9 is used to receive and focus the light generated by the laser plasma, and the spectrometer 10 is used to receive the light focused by the second collecting lens 9 and output the Thomson scattering spectrum.

[0038] In this embodiment, the first laser 1 is used to output an ablation laser with a wavelength of 1064nm and a pulse width of 10ns. The ablation laser is reflected by the first laser reflecting mirror 3 and focused by the first laser focusing lens 6, and then interacts with the target material 12 to generate laser plasma; the second laser 2 is used to output a probe laser with a wavelength of 532nm and a pulse width of 6ns. The probe laser is reflected by the second laser reflecting mirror 4, reflected by the third laser reflecting mirror 5 and focused by the second laser focusing lens 7, and then interacts with the laser plasma to generate a Thomson scattering signal. The spectrometer 10 receives the light focused by the second collecting lens 9 and outputs a Thomson scattering spectrum.

[0039] Preferably, the first laser focusing lens 6 is a quartz lens with a focal length of 100 mm; the second laser focusing lens 7 is a quartz lens with a focal length of 250 mm; and the second collecting lens 9 is a quartz lens with a focal length of 150 mm.

[0040] Figure 4 Schematic diagram of the cage frame of the Thomson scattering device provided by the present invention. Figure 4As shown, the Thomson scattering device in this embodiment adopts a cage structure, and the first laser reflecting mirror 3, the second laser reflecting mirror 4, the third laser reflecting mirror 5, the first laser focusing lens 6, the second laser focusing lens 7, the first collecting lens 8, and the second collecting lens 9 in the cage frame are all fixed on a compact optical cage frame, together forming a compact cage-structured Thomson scattering optical system and a Thomson scattering signal collection system, which has simple optical path debugging, high device integration, low signal measurement difficulty, and high space utilization.

[0041] Combine the following Figure 1-4 The structure of the Thomson scattering device is described in detail: the first laser 1 and the second laser 2 are arranged in parallel up and down, and are used to emit ablation laser and probe laser respectively, and the optical paths where they are located are called ablation optical path and probe optical path.

[0042] The ablation optical path includes a first laser reflecting mirror 3 and a first laser focusing lens 6. The angle between the first laser reflecting mirror 3 and the ablation laser generated by the first laser 1 is 45 degrees, and the angle between the first laser focusing lens 6 and the ablation laser reflected by the first laser reflecting mirror 3 is 90 degrees.

[0043] The probe optical path includes a second laser reflector 4, a third laser reflector 5 and a second laser focusing lens 7. The angle between the second laser reflector 4 and the probe laser generated by the second laser 2 is 45 degrees. Optionally, the distance between the second laser reflector 4 and the first laser reflector 3 of the ablation optical path in the x-axis direction is 15 cm; the angle between the third laser reflector 5 and the probe laser reflected by the second laser reflector 4 is 45 degrees, and the center is located on the same horizontal plane as the ablation laser focus, and the angle between the second laser focusing lens 7 and the ablation laser reflected by the third laser reflector 5 is 90 degrees.

[0044] The ablation laser output by the first laser 1 is reflected by the first laser reflecting mirror 3 and focused by the first laser focusing lens 6 to act on the target material 12 to generate plasma; the probe laser output by the second laser 2 is reflected by the second laser reflecting mirror 4 and the third laser reflecting mirror 5 and focused by the second laser focusing lens 7 to act on the plasma to generate a Thomson scattering signal.

[0045] The Thomson scattering experimental device of this embodiment further includes a transient image measuring device and a Thomson scattering signal measuring device.

[0046] The transient image measurement device includes a first collecting lens 8 and a transient camera 11, wherein the ablation point, the geometric center of the first collecting lens 8, and the center of the CMOS (Complementary Metal-Oxide-Semiconductor Image Sensor) of the transient camera 11 are located on the same straight line, and the angle between the first collecting lens 8 and the straight line is 90 degrees; the transient image measurement optical path is perpendicular to the ablation optical path and the probe optical path.

[0047] The Thomson scattering signal measuring device includes a second collecting lens 9 and a spectrometer 10, wherein the ablation point, the geometric center of the second collecting lens 9, and the slit center of the spectrometer 10 are located on the same straight line, and the angle between the second collecting lens 9 and the straight line is 90 degrees; the Thomson scattering signal measuring optical path is perpendicular to the ablation optical path and the probe optical path. The Thomson scattering signal measuring optical path and the transient image measuring optical path are located on the same straight line and on both sides of the laser ablation point.

[0048] It should be noted that the optical path of the second collecting lens 9 and the spectrometer 10 for collecting the Thomson scattering spectrum is perpendicular to the optical path of the probe laser to the laser plasma; the intensity of the Thomson scattering spectrum collected in the direction perpendicular to the optical path of the probe laser to the laser plasma is the highest.

[0049] According to the present embodiment, the Thomson scattering device includes: a first laser 1, a first laser reflecting mirror 3 and a first laser focusing lens 6; the first laser 1 is used to output ablation laser; the first laser reflecting mirror 3 is optically connected to the first laser 1, and is used to vertically reflect the ablation laser output by the first laser 1 to the first laser focusing lens 6; the first laser focusing lens 6 is optically connected to the first laser reflecting mirror 3, and is used to focus the ablation laser output by the first laser reflecting mirror 3; a second laser 2, a second laser reflecting mirror 4, a third laser reflecting mirror 5 and a second laser focusing lens 7; the second laser 2 is used to output a probe laser; the second laser reflecting mirror 4 is optically connected to the second laser 2, and is used to vertically reflect the probe laser output by the second laser 2 to the third laser reflecting mirror 5; the third laser reflecting mirror 5 is optically connected to the second laser focusing lens 7, and is used to vertically reflect the probe laser output by the second laser reflecting mirror 4 to the second laser focusing lens 7. ; The second laser focusing lens 7 is used to focus the probe laser output by the third laser reflector 5; the target material 12 and the target stand 13; the target material 12 is used to receive the ablation laser output by the first laser focusing lens 6, the target material 12 is used to react with the ablation laser to generate laser plasma, and the laser plasma is used to react with the probe laser to output a Thomson scattering signal; the target stand 13 is used to fix the target material 12; the second collecting lens 9 and the spectrometer 10; the second collecting lens 9 and the spectrometer 10 are optically connected, the second collecting lens 9 is used to receive and focus the light generated by the laser plasma, and the spectrometer 10 is used to receive the light focused by the second collecting lens 9 and output the Thomson scattering spectrum; the invention solves the technical problems that the Thomson scattering experiment in the related technology not only has the problems of difficult optical path debugging and low device integration during the device construction process, but also has the technical problems of difficulty in signal measurement and limitation of being unable to diagnose in real time during the experiment, thereby improving the efficiency of the Thomson scattering experiment.

[0050] As an alternative, Figure 1-4 As shown, the Thomson scattering device also includes: a first collecting lens 8 and a transient camera 11; the first collecting lens 8 and the transient camera 11 are optically connected, the first collecting lens 8 is used to receive and focus the light generated by the laser plasma, and the transient camera 11 is used to receive the light focused by the first collecting lens 8 and output a transient image of the laser plasma.

[0051] Preferably, the first collecting lens 8 is a quartz lens with a focal length of 150 mm.

[0052] It should be noted that if Figure 1-4 As shown, the Thomson scattering spectrum measurement optical path is perpendicular to the ablation optical path and the probe optical path, the transient image measurement optical path is perpendicular to the ablation optical path and the probe optical path, and the Thomson scattering signal measurement optical path and the transient image measurement optical path are on the same straight line.

[0053] Through this embodiment, the transient image of the laser plasma can be accurately collected, thereby improving the applicability of the Thomson scattering device of this embodiment.

[0054] As an alternative, Figure 1-3 As shown, the Thomson scattering device further includes: a mobile control platform 14 ; the mobile control platform 14 is connected to the target frame 13 and is used to control the three-dimensional movement of the target frame 13 .

[0055] In this embodiment, the target stand 13 is used to fix the target material 12 , and the target stand 13 is rigidly connected to the mobile control platform 14 .

[0056] It should be noted that when performing multiple measurements, in order to ensure the stability of the laser plasma, the mobile control platform 14 can be used to adjust the movement of the target 12 in the XOY plane to prevent the ablation laser from always acting on the same point of the target 12; the target 12 is controlled to move along the Z axis by the mobile control platform 14, and the first laser focusing lens 6 also moves synchronously with the target 12, so that spatially resolved measurement can be achieved.

[0057] Optionally, the Thomson scattering device of this embodiment also includes a digital delay generator for controlling the first laser 1, the second laser 2, the spectrometer 10, and the transient camera 11; the computer is connected to the output end of the spectrometer 10, and uses the atlas method to perform real-time diagnosis of the laser plasma state parameters; the computer is connected to the output end of the transient camera 11 to obtain a transient image of the laser plasma.

[0058] Through this embodiment, the three-dimensional movement of the target frame 13 can be controlled by the mobile control platform 14, thereby improving the functionality of the Thomson scattering device.

[0059] Figure 5 It is a schematic diagram of the flow chart of the atlas diagnosis method provided by the present invention, such as Figure 5 As shown, including but not limited to the following steps: Step 501, obtaining a target Thomson scattering spectrum; Step 502, determining a target peak shift and a target full width at half maximum of a target Thomson scattering spectrum; Step 503, determining the target temperature based on the position of the target peak displacement and the target half-width in the preset electron temperature spectrum; Step 504 , determining the target density based on the position of the target peak displacement and the target half-width in the preset electron density spectrum.

[0060] Optionally, obtain the target Thomson scattering spectrum, including: Acquire a set of Thomson scattering spectra; each Thomson scattering spectrum in the set of Thomson scattering spectra is output by the spectrometer 10; Screening out the outliers in a set of Thomson scattering spectra to obtain a set of Thomson scattering spectra after the outliers are screened out; The average value of the spectral intensity of a group of Thomson scattering spectra after filtering out the outliers is calculated to obtain the target Thomson scattering spectrum.

[0061] The atlas diagnosis method in this embodiment can be executed by a computer.

[0062] Optionally, obtain a set of Thomson scattering spectra, including: The target holder 13 and the first laser focusing lens 6 are controlled to move synchronously along the Z-axis direction, and the Thomson scattering spectra measured when the target material 12 is at different positions are obtained to obtain a set of Thomson scattering spectra.

[0063] In this embodiment, the acquisition process of a set of Thomson scattering spectra is described below. Specifically, the digital delay generator controls the first laser 1 to output an ablation laser with a wavelength of 1064nm and a pulse width of 10ns, which is reflected by the first laser reflector 3 and then focused by the first laser focusing lens 6. The laser acts on the target material 12 along the negative direction of the Z axis to generate plasma. The specific optical path is as follows: Figure 1 As shown; after the plasma is generated, the digital delay generator controls the second laser 2 to output a probe laser with a wavelength of 532nm and a pulse width of 6ns, which is reflected by the second laser reflector 4 and the third laser reflector 5, and then focused by the second laser focusing lens 7, and then passes through the plasma along the negative direction of the X-axis. The specific optical path is as follows Figure 1 As shown; at the same time, the digital delay generator controls the spectrometer 10 and the transient camera 11 to synchronously measure the Thomson scattering signal and the plasma transient image; since the scattering signal is very weak, the scattering spectrum is generally measured cumulatively 500 times with a repetition frequency of 5 Hz, thereby obtaining a set of Thomson scattering spectra.

[0064] In particular, when performing multiple measurements, in order to ensure the stability of the plasma, the mobile control platform 14 can be used to adjust the movement of the target 12 in the XOY plane to prevent the ablation laser from always acting on the same point of the target 12; the target 12 is controlled to move along the Z axis by the mobile control platform 14, and the first laser focusing lens 6 also moves synchronously with the target 12 to achieve spatially resolved measurement.

[0065] After obtaining a group of Thomson scattering spectra; outliers in the group of Thomson scattering spectra are screened out to obtain a group of Thomson scattering spectra after the outliers are screened out; the average value of the spectral intensity of the group of Thomson scattering spectra after the outliers are screened out is calculated to obtain a target Thomson scattering spectrum; that is, it is necessary to perform a preprocessing step on the group of Thomson scattering spectra, and calculate the average value of the spectral intensity of the group of Thomson scattering spectra to obtain the target Thomson scattering spectrum.

[0066] Figure 6The Thomson scattering spectrum and transient image of the laser plasma measured by the Thomson scattering device provided by the present invention are as follows: Figure 6 As shown, Figure 6 The image on the right is a transient image of the laser plasma measured by the Thomson scattering device. The ablation laser acts on the target material along the direction shown in the figure to generate plasma, and the probe laser passes through different positions of the laser plasma in the direction shown in the figure (such as 0mm, 0.4mm, ..., 2.4mm); Figure 6 The image on the left is the Thomson scattering spectrum obtained by the spectrometer after the probe laser passes through different positions of the laser plasma; the horizontal axis represents the wavelength in the Thomson scattering spectrum, and the vertical axis represents the light intensity corresponding to different wavelengths in the Thomson scattering spectrum; the peak displacement refers to the center point of the peak and the wavelength ( Figure 6 The full width at half maximum refers to the width of the peak measured from half the height of the spectral peak (i.e. half the intensity of the peak).

[0067] Determine a target peak displacement and a target full width at half maximum of a target Thomson scattering spectrum; after obtaining the target Thomson scattering spectrum, the target peak displacement and the target full width at half maximum can be determined based on the target Thomson scattering spectrum.

[0068] Specifically, a preset program can be used to automatically search for small symmetrical peaks on both sides of the probe laser wavelength of 532nm. The small peaks found are the Thomson scattering signals, and then the spectral peak fitting method is used to obtain its central wavelength and half-maximum full width, thereby obtaining the target spectral peak displacement and target half-maximum full width.

[0069] Determining a target temperature based on a position of a target spectral peak shift and a target half-width at half maximum in a preset electron temperature spectrum; Figure 7 is the preset electron temperature spectrum provided by the present invention, such as Figure 7 As shown in the figure, the preset electron temperature spectrum shows the relationship between electron temperature, half-width and peak shift; after obtaining the target peak shift and half-width, as shown in the figure, Figure 7 As shown, the intersection corresponding to the target spectral peak displacement and the target half-height full width is found, and the temperature of the intersection corresponds to the temperature of the laser plasma, that is, the target temperature; it should be noted that after determining the position of the intersection, the temperature corresponding to the intersection can be determined according to the position of the intersection.

[0070] Determine the target density based on the position of the target peak shift and the target half-width in the preset electron density map; Figure 8 is a preset electron density map provided by the present invention, such as Figure 8 As shown in the figure, the preset electron density spectrum shows the relationship between electron density, half-height full width and peak shift; after obtaining the target peak shift and target half-height full width, as shown in Figure 8As shown, the intersection corresponding to the target spectral peak displacement and the target half-height full width is found, and the density of the intersection corresponds to the density of the laser plasma, that is, the target density; it should be noted that after determining the position of the intersection, the density corresponding to the intersection can be determined according to the position of the intersection.

[0071] It can be understood that in this embodiment, the ablation laser and the target material interact to generate plasma, the probe laser acts on the plasma to generate a Thomson scattering signal, and the Thomson scattering profile is measured by a spectrometer. Combined with the experimental scattering spectrum preprocessing method, the scattering spectrum profile information extraction method and the pre-constructed temperature density map, a rapid and real-time diagnosis of the laser plasma state parameters can be achieved, and real-time monitoring of the instantaneous state of the entire evolution process of the generation, expansion and cooling of the laser plasma can be achieved. This has important scientific significance for an in-depth and accurate understanding of the microscopic physics and dynamics of laser plasma in different scenarios, and has potential application value in on-site real-time detection and remote online monitoring.

[0072] Through the embodiments provided in the present application, a target Thomson scattering spectrum is obtained; a target peak displacement and a target half-width of the target Thomson scattering spectrum are determined; a target temperature is determined based on the position of the target peak displacement and the target half-width in a preset electron temperature map; a target density is determined based on the position of the target peak displacement and the target half-width in a preset electron density map; the entire process of generation, expansion, and cooling evolution of laser plasma can be monitored in real time, and the microscopic physics and kinetic processes of laser plasma in different scenarios can be deeply and accurately understood.

[0073] As an optional solution, before obtaining the target Thomson scattering spectrum, the method further includes: S11, obtaining a set of sample temperatures and a set of sample densities; S12, combining each sample temperature in a set of sample temperatures with each sample density in a set of sample densities in sequence to obtain a set of sample temperature density data; S13, executing a preset step using each sample temperature density data in a set of sample temperature density data as target sample temperature density data to obtain a target theoretical profile, and then obtaining a set of theoretical profiles corresponding to the set of sample temperature density data; the target sample temperature density data includes a target sample temperature and a target sample density; S14, calculating the spectral peak displacement and the half-maximum full width corresponding to each theoretical profile in a set of theoretical profiles to obtain a set of sample data; S15, constructing a preset electron temperature spectrum and a preset electron density spectrum according to a set of sample data; the preset electron temperature spectrum is used to reflect the relationship between the spectrum peak displacement and the half-maximum full width and temperature; the preset electron density spectrum is used to reflect the relationship between the spectrum peak displacement and the half-maximum full width and density; The preset steps include: According to the target sample temperature and target sample density, the target theoretical profile is calculated by the following formula: : ; ; ; in, is the target sample density, that is is the target sample data of electron density; is the target sample temperature, that is is the target sample data of electron temperature; is the Boltzmann constant; is the dielectric constant of vacuum; is the charge carried by the electron; is the wavelength of the probe laser; is the angle between the incident laser direction and the observation direction; is the scattering factor, which is used to characterize the scattering degree of plasma; is the dispersion function; , is the independent variable of the dispersion function, is the thermal average velocity of plasma electrons, is the scattered light frequency and the incident light frequency The difference vector, is the wave vector; Is an imaginary unit.

[0074] In this embodiment, a method for determining a preset electron temperature spectrum and a preset electron density spectrum is provided; a set of sample temperatures and a set of sample densities are obtained; each sample temperature in a set of sample temperatures is combined with each sample density in a set of sample densities in turn to obtain a set of sample temperature density data; each sample temperature density data in a set of sample temperature density data is used as target sample temperature density data to execute preset steps to obtain a target theoretical profile, and then a set of theoretical profiles corresponding to a set of sample temperature density data is obtained; the target sample temperature density data includes a target sample temperature and a target sample density; the spectral peak displacement and half-maximum full width corresponding to each theoretical profile in a set of theoretical profiles are calculated to obtain a set of sample data; a preset electron temperature spectrum and a preset electron density spectrum are constructed according to a set of sample data; the preset electron temperature spectrum is used to reflect the relationship between the spectral peak displacement and the half-maximum full width and temperature; the preset electron density spectrum is used to reflect the relationship between the spectral peak displacement and the half-maximum full width and density.

[0075] In this example, the target theoretical profile of the Thomson scattering spectrum The profile and distribution of Thomson scattering are determined. When constructing the preset electron temperature map and the preset electron density map, it is first necessary to calculate the Thomson scattering profiles under different electron temperatures and electron densities based on the Thomson scattering theory, analyze these profiles, and extract their peak displacement and half-maximum full width. In this way, a one-to-one correspondence between the peak displacement, half-maximum full width and electron temperature or electron density can be obtained, thereby constructing the electron temperature map and the electron density map, where the horizontal axis of the map is the peak displacement, and the vertical axis of the map is the half-maximum full width, and the map represents the plasma electron temperature or electron density.

[0076] Specifically, when constructing a temperature or density map, it is first necessary to calculate the Thomson scattering profile at different electron temperatures and electron densities according to the Thomson scattering theory. Specifically, the scattering factor is calculated according to the preset steps. and dispersion function , then according to and Calculated ,according to The Thomson scattering profile can be obtained; then the profiles obtained by these theoretical calculations are analyzed to extract their peak displacement and half-maximum full width, so that the one-to-one correspondence between the peak displacement and half-maximum full width and the electron temperature or electron density can be obtained, thereby constructing a preset electron temperature spectrum and a preset electron density spectrum, wherein the horizontal axis of the spectrum is the peak displacement, and the vertical axis of the spectrum is the half-maximum full width, and the spectrum represents the plasma electron temperature or electron density.

[0077] Through this embodiment, the preset electron temperature spectrum and the preset electron density spectrum can be accurately obtained, thereby improving the reliability and stability of the spectrum diagnosis method of this embodiment.

[0078] Optionally, the spectrum diagnosis method provided by the present invention is used to perform real-time diagnosis of laser plasma at a spatial position of 1.6 mm, and the following results can be obtained: Figure 9-10 The evolution of the electron temperature and electron density of the laser plasma with the delay time is shown in the figure. Fig. 9 : is a graph showing the evolution of the electron temperature of the laser plasma with the delay time provided by the present invention; the horizontal axis is the delay time, and different delay times correspond to different evolution states of the laser plasma; the vertical axis is the electron temperature; T e represents the electron temperature; is the expression of the fitting curve; is the determination coefficient.

[0079] Fig.10 : is an evolution diagram of the electron density of the laser plasma provided by the present invention with the delay time, the horizontal axis is the delay time, and different delay times correspond to different evolution states of the laser plasma; the vertical axis is the electron density; N erepresents the electron density; is the expression of the fitting curve; is the determination coefficient.

[0080] Fig.11 is a schematic diagram of the structure of the electronic device provided by the present invention, such as Fig.11 As shown, the electronic device may include: a processor 1110, a communication interface 1120, a memory 1130 and a communication bus 1140, wherein the processor 1110, the communication interface 1120 and the memory 1130 communicate with each other through the communication bus 1140. The processor 1110 may call the logic instructions in the memory 1130 to execute the spectrum diagnosis method, which includes: obtaining a target Thomson scattering spectrum; determining a target peak displacement and a target half-maximum full width of the target Thomson scattering spectrum; determining a target temperature based on the position of the target peak displacement and the target half-maximum full width in a preset electron temperature spectrum; determining a target density based on the position of the target peak displacement and the target half-maximum full width in a preset electron density spectrum.

[0081] In addition, the logic instructions in the above-mentioned memory 1130 can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when it is sold or used as an independent product. Based on such an understanding, the technical solution of the present invention can be essentially or partly embodied in the form of a software product that contributes to the prior art. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods of various embodiments of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0082] On the other hand, the present invention also provides a computer program product, which includes a computer program stored on a non-transitory computer-readable storage medium, and the computer program includes program instructions. When the program instructions are executed by a computer, the computer can execute the spectrum diagnosis method provided by the above-mentioned embodiments, and the method includes: obtaining a target Thomson scattering spectrum; determining a target peak displacement and a target half-width of the target Thomson scattering spectrum; determining a target temperature based on the position of the target peak displacement and the target half-width in a preset electron temperature spectrum; determining a target density based on the position of the target peak displacement and the target half-width in a preset electron density spectrum.

[0083] On the other hand, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, is implemented to execute the spectrum diagnosis method provided by the above-mentioned embodiments, the method comprising: obtaining a target Thomson scattering spectrum; determining a target peak displacement and a target half-width of the target Thomson scattering spectrum; determining a target temperature based on the position of the target peak displacement and the target half-width in a preset electron temperature spectrum; determining a target density based on the position of the target peak displacement and the target half-width in a preset electron density spectrum.

[0084] The device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, i.e., they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Those of ordinary skill in the art may understand and implement it without creative effort.

[0085] Through the description of the above implementation modes, those skilled in the art can clearly understand that each implementation mode can be implemented by means of software plus a necessary general hardware platform, or of course by hardware. Based on such an understanding, the above technical solution can essentially or in other words be embodied in the form of a software product that contributes to the prior art. The computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a magnetic disk, an optical disk, etc., and includes a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods of each embodiment or some parts of the embodiment.

[0086] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A Thomson scattering device, characterized in that: include: a first laser, a first laser reflecting mirror and a first laser focusing lens; The first laser is used to output ablation laser; The first laser reflector is optically connected to the first laser, and is used to vertically reflect the ablation laser output by the first laser to the first laser focusing lens; the first laser focusing lens is optically connected to the first laser reflector, and is used to focus the ablation laser output by the first laser reflector; A second laser, a second laser reflecting mirror, a third laser reflecting mirror and a second laser focusing lens; the second laser is used to output a probe laser; the second laser reflecting mirror is optically connected to the second laser, and is used to vertically reflect the probe laser output by the second laser to the third laser reflecting mirror; the third laser reflecting mirror is optically connected to the second laser focusing lens, and is used to vertically reflect the probe laser output by the second laser reflecting mirror to the second laser focusing lens; the second laser focusing lens is used to focus the probe laser output by the third laser reflecting mirror; A target material and a target stand; the target material is used to receive the ablation laser output by the first laser focusing lens and the probe laser output by the second laser focusing lens, the target material is used to react with the ablation laser to generate laser plasma, and the laser plasma is used to react with the probe laser to output a Thomson scattering signal; the target stand is used to fix the target material; A second collecting lens and a spectrometer; the second collecting lens and the spectrometer are optically connected, the second collecting lens is used to receive and focus the light generated by the laser plasma, and the spectrometer is used to receive the light focused by the second collecting lens and output a Thomson scattering spectrum.

2. The Thomson scatterer device according to claim 1, characterized in that Also includes: A first collecting lens and a transient camera; the first collecting lens and the transient camera are optically connected, the first collecting lens is used to receive and focus the light generated by the laser plasma, and the transient camera is used to receive the light focused by the first collecting lens and output a transient image of the laser plasma.

3. The Thomson scatterer device according to claim 1, characterized in that Also includes: Mobile control platform; the mobile control platform is connected to the target frame and is used to control the three-dimensional movement of the target frame.

4. A spectrum diagnosis method, the method being applied to the Thomson scattering device according to any one of claims 1 to 3, characterized in that: The method comprises: Obtain the target Thomson scattering spectrum; Determining a target peak shift and a target full width at half maximum of the target Thomson scattering spectrum; Determining a target temperature based on the position of the target spectral peak displacement and the target half-width at half maximum in a preset electron temperature spectrum; The target density is determined based on the position of the target spectral peak displacement and the target half-width in a preset electron density spectrum.

5. The method for diagnosing with a spectrum according to claim 4, characterized in that: The step of obtaining a target Thomson scattering spectrum comprises: Acquire a set of Thomson scattering spectra; each Thomson scattering spectrum in the set of Thomson scattering spectra is output by a spectrometer; Screening out the abnormal values ​​in the set of Thomson scattering spectra to obtain a set of Thomson scattering spectra after the abnormal values ​​are screened out; The target Thomson scattering spectrum is obtained by calculating the average value of the spectral intensity of the group of Thomson scattering spectra after the outliers are screened out.

6. The method for diagnosing with a spectrum according to claim 4, characterized in that: Before acquiring the target Thomson scattering spectrum, the method further includes: Get a set of sample temperatures and a set of sample densities; Combining each sample temperature in the set of sample temperatures with each sample density in the set of sample densities in sequence to obtain a set of sample temperature density data; Using each sample temperature density data in the set of sample temperature density data as target sample temperature density data to perform a preset step, obtaining a target theoretical profile and then obtaining a set of theoretical profiles corresponding to the set of sample temperature density data, wherein the target sample temperature density data includes a target sample temperature and a target sample density; Calculating the peak displacement and the full width at half maximum corresponding to each theoretical profile in the set of theoretical profiles to obtain a set of sample data; The preset electron temperature spectrum and the preset electron density spectrum are constructed according to the set of sample data; the preset electron temperature spectrum is used to reflect the relationship between the spectrum peak displacement and the half-maximum full width and the temperature; the preset electron density spectrum is used to reflect the relationship between the spectrum peak displacement and the half-maximum full width and the density; Wherein, the preset steps include: According to the target sample temperature and the target sample density, the target theoretical profile is calculated by the following formula: : ； ； ； in, is the target sample density; is the target sample temperature; is the Boltzmann constant; is the dielectric constant of vacuum; is the charge carried by the electron; is the wavelength of the probe laser; is the angle between the incident direction of the probe laser and the observation direction; is the scattering factor, which is used to characterize the scattering degree of plasma; is the dispersion function; , is the independent variable of the dispersion function, is the thermal average velocity of plasma electrons, is the scattered light frequency and the incident light frequency The difference vector, is the wave vector; Is an imaginary unit.

7. The method for diagnosing with a spectrum according to claim 5, characterized in that: The step of obtaining a set of Thomson scattering spectra comprises: The target holder and the first laser focusing lens are controlled to move synchronously along the Z-axis direction, and the Thomson scattering spectra measured when the target material is at different spatial positions are obtained to obtain the set of Thomson scattering spectra.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, the atlas diagnosis method according to any one of claims 4 to 7 is implemented.

9. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the atlas diagnosis method according to any one of claims 4 to 7 is implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the atlas diagnosis method according to any one of claims 4 to 7 is implemented.

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