External test platform for Fourier transform infrared spectrometer

By designing an external test platform for Fourier infrared spectrometers and using optical components to guide liquid nitrogen refrigeration MCT detectors, the problem that domestic Fourier infrared spectrometers can only be equipped with one detector is solved, and the Fourier infrared spectrometers are realized Low-cost expansion meets customers' detection needs for dual detectors.

CN119438111APending Publication Date: 2025-02-14BEIJING BEIFEN RUILI ANALYTICAL INSTR GROUP
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Patent Information

Application Number
CN202411578330.9
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-11-06
Publication Date
2025-02-14

AI Technical Summary

Technical Problem

Domestic Fourier infrared spectrometers usually can only be equipped with one pyroelectric detector, which cannot meet the detection needs of customers for multiple detectors.

Method used

Design an external test platform for Fourier infrared spectrometer. This platform guides the parallel interference light emitted by the interferometer of the infrared spectrometer host to the liquid nitrogen refrigeration MCT detector through optical components such as planar mirrors, ellipsoids and parabolics to realize External expansion of Fourier infrared spectrometer.

Benefits of technology

The platform can extend an additional liquid nitrogen refrigerated MCT detector to the Fourier infrared spectrometer of a single detector, meeting customers' detection needs for dual detectors and achieving low-cost expansion.

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Abstract

The invention provides an external test platform for a Fourier transform infrared spectrometer, and the platform comprises a first plane mirror which is disposed in a host of the Fourier transform infrared spectrometer and can reflect the parallel interference light emitted by an interferometer of the host of the Fourier transform infrared spectrometer outwards; the device further comprises a second plane mirror, a first ellipsoid mirror, a sample chamber, a parabolic mirror, a second ellipsoid mirror and a liquid nitrogen refrigeration MCT detector which are arranged on a light emitting path of the first plane mirror. The device can be directly and externally connected to an existing single-detector Fourier infrared spectrometer, a detector is additionally expanded for the infrared spectrometer, and the detection requirements of customers for double detectors are met in a low-cost mode.
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Description

Technical Field

[0001] The invention relates to the technical field of infrared spectrometers, and in particular to an external test platform for a Fourier infrared spectrometer. Background Art

[0002] Infrared spectroscopy is a method of functional group identification and structural analysis of a substance by utilizing the absorption of infrared radiation by the substance. In modern chemistry, infrared spectroscopy, mass spectrometry, nuclear magnetic resonance and ultraviolet spectroscopy are collectively referred to as the four major spectra, and are recognized as one of the modern material analysis techniques. Fourier transform infrared spectrometers are widely used in scientific research and education, agriculture, food industry, polymers, petrochemicals, pharmaceuticals, semiconductor industry, geology, archeology, public security criminal investigation and environmental science.

[0003] Fourier transform infrared spectrometer is mainly composed of light source, interferometer, sample chamber, detector and computer system. With the advancement of technology and the increase of detection tasks, many users need to use dual detectors (usually pyroelectric detector and liquid nitrogen cooled MCT detector). Pyroelectric detector is used for routine sample testing (ATR test, potassium bromide tablet test, liquid pool test), and liquid nitrogen cooled MCT detector is used for high sensitivity testing (infrared microscope, photo / electric / thermal in situ catalytic reaction test).

[0004] Imported mid-to-high-end Fourier transform infrared spectrometers can be equipped with multiple detectors at the same time through optical path switching and reasonable layout. Due to technical reasons, most domestic Fourier transform infrared spectrometers on the market can only be equipped with one pyroelectric detector, which cannot meet customers' multi-detector detection needs. Summary of the invention

[0005] In view of the problems existing in the prior art, the purpose of the present invention is to provide an external test platform for a Fourier transform infrared spectrometer, which can additionally expand a liquid nitrogen cooled MCT detector for a Fourier transform infrared spectrometer equipped with only one pyroelectric detector to meet customer needs for a dual-detector Fourier transform infrared spectrometer.

[0006] The technical solution adopted by the present invention is:

[0007] A Fourier transform infrared spectrometer external test platform, characterized by comprising:

[0008] A plane reflector 1 arranged in the mainframe of the Fourier transform infrared spectrometer can reflect outward the parallel interference light emitted by the interferometer of the mainframe of the Fourier transform infrared spectrometer;

[0009] A sample chamber and a liquid nitrogen cooled MCT detector are arranged on the light output path of the plane reflector 1.

[0010] The Fourier infrared spectrometer external test platform, wherein the light output path of the plane reflector 1 is sequentially arranged with: plane reflector 2, ellipsoidal mirror 1, the sample chamber, parabolic mirror, ellipsoidal mirror 2 and the liquid nitrogen refrigerated MCT detector.

[0011] The Fourier infrared spectrometer external test platform further includes a bottom plate and a sealed cavity. The sealed cavity is covered on the bottom plate to seal the second plane reflector, the first ellipsoidal mirror, the parabolic mirror, the second ellipsoidal mirror and the liquid nitrogen cooled MCT detector.

[0012] The Fourier transform infrared spectrometer external test platform, wherein a connection mechanism is provided on one side of the sealed cavity, which is used to connect with the Fourier transform infrared spectrometer host so that the light output path of the plane reflector 1 can pass through.

[0013] The external test platform of the Fourier transform infrared spectrometer, wherein the connecting mechanism includes an optical path sealing cylinder, one end of the optical path sealing cylinder is sealingly connected to the light hole on the side panel of the Fourier transform infrared spectrometer host, and the other end is sealingly connected to the sealed cavity, a sealing flange is fixed on the inner wall of the sealed cavity, a flange sealing gasket is arranged between the sealing flange and the inner wall of the sealed cavity, the other end of the optical path sealing cylinder extends into the outer side of the sealing flange, and a sealing cylinder locking ring is also sleeved on the sealing flange, a sealing ring is arranged between the sealing cylinder locking ring and the sealing flange and connected by threads; a window piece sealing gasket 1, a sealing window piece 3 and a window piece locking ring are installed on the inner side of the sealing flange in sequence, a window piece sealing gasket 2 is arranged between the window piece locking ring and the sealing flange and connected by threads, for sealing and fixing the sealing window piece 3.

[0014] The Fourier transform infrared spectrometer external test platform, wherein an ellipsoid mirror three-dimensional adjustment mechanism is provided beside the ellipsoid mirror 2, which is used to adjust the three-dimensional distance of the ellipsoid mirror 2 relative to the liquid nitrogen MCT detector.

[0015] The Fourier transform infrared spectrometer external test platform, wherein the liquid nitrogen refrigerated MCT detector is connected to a detector cable group, which is used to feed back the signal received by the liquid nitrogen refrigerated MCT detector to the infrared spectrometer host.

[0016] The Fourier infrared spectrometer external test platform, wherein the sealed cavity has a recess to form the sample chamber, and the sealed cavity is provided with a sealing window piece 1 and a sealing window piece 2 on both sides corresponding to the sample chamber, so that the light path is reflected from the ellipsoidal mirror 1, passes through the sealing window piece 1 to enter the sample chamber, and then passes through the sealing window piece 2 to enter the parabolic mirror.

[0017] The Fourier transform infrared spectrometer external test platform, wherein the sealed cavity forms a closed structure inside, a nitrogen purge inlet is provided on the bottom plate, and a nitrogen purge outlet is arranged on the sealed cavity.

[0018] The Fourier infrared spectrometer external test platform, wherein the plane reflector can change position under the drive of the optical path adjustment mechanism, and has a first position in which the parallel interference light emitted by the interferometer of the infrared spectrometer host is turned 90 degrees and emitted outward, and a second position in which the parallel interference light emitted by the interferometer of the infrared spectrometer host is no longer blocked.

[0019] The Fourier transform infrared spectrometer external test platform of the present invention can be directly connected to an existing single-detector Fourier transform infrared spectrometer to add an additional detector to the infrared spectrometer, thereby meeting the customer's dual-detector detection needs in a low-cost manner. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 A schematic top view of an external test platform for a Fourier transform infrared spectrometer according to the present invention;

[0021] Figure 2 A side view schematic diagram of an external test platform for a Fourier infrared spectrometer of the present invention;

[0022] Figure 3 A side view schematic diagram of a connection mechanism of a Fourier transform infrared spectrometer externally connected to a test platform of the present invention;

[0023] Figure 4 The present invention is a usage status diagram of an external test platform for a Fourier transform infrared spectrometer.

[0024] Explanation of the reference numerals: 1-plane reflector 1; 2-connecting mechanism; 3-bottom plate; 4-plane reflector 2; 5-ellipsoidal mirror 1; 6-sealed window piece 1; 7-sample chamber; 8-sealed window piece 2; 9-parabolic mirror; 10-ellipsoidal mirror three-dimensional adjustment mechanism; 11-ellipsoidal mirror 2; 12-liquid nitrogen refrigerated MCT detector; 13-detector cable assembly; 14-nitrogen purge inlet; 15-optical path adjustment mechanism; 16-height adjustment foot; 17-side panel of Fourier transform infrared spectrometer host; 18-optical path sealing cylinder; 19-sealing cylinder locking ring; 20-sealing ring; 21-flange sealing gasket; 22-sealing flange; 23-window piece sealing gasket 1; 24-sealed window piece 3; 25-window piece locking ring; 26-window piece sealing gasket 2; 27-Fourier transform infrared spectrometer host; 28-nitrogen purge outlet; 29-liquid nitrogen injection sealing port; 30-sealed cavity. DETAILED DESCRIPTION

[0025] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0026] like Figure 1-Figure 4 As shown, the present invention provides a Fourier infrared spectrometer external test platform, which has a bottom plate 3, the bottom plate 3 is supported by four height-adjustable feet 16, and a sealed cavity 30 is provided on the bottom plate 3 (see Figure 4 );

[0027] A connecting mechanism 2 is provided on one side of the sealed cavity 30, which is used to connect to the Fourier transform infrared spectrometer host 27 and is opposite to the light emitting direction of the plane reflector 1 in the Fourier transform infrared spectrometer host 27;

[0028] The plane reflector 1 is installed in the Fourier transform infrared spectrometer host 27, and changes its position under the drive of the optical path adjustment mechanism 15 (preferably a voice coil motor), thereby adjusting the direction of the parallel interference light emitted by the interferometer of the infrared spectrometer host; specifically, the direction of the parallel interference light emitted by the interferometer of the infrared spectrometer host is called the first direction ( Figure 1 The plane reflector 1 can be moved in a direction perpendicular to the first direction ( Figure 1 When the plane reflector 1 moves to Figure 1 When the plane reflector 1 is moved to the leftmost position, the parallel interference light emitted by the interferometer of the infrared spectrometer host can be turned 90 degrees and emitted in the direction of the connecting mechanism 2; Figure 1 When it is at the rightmost end, the parallel interference light emitted by the interferometer of the infrared spectrometer host is no longer blocked by the plane reflector 1, and enters the original optical path of the infrared spectrometer;

[0029] The specific structure of the connecting mechanism 2 is as follows Figure 3 As shown, it includes an optical path sealing cylinder 18, one end of which is sealed and connected to the light hole on the side plate 17 of the Fourier transform infrared spectrometer host 27, and the other end is sealed and connected to the sealed cavity 30 (see Figure 4), the interior of which is for the interference light reflected by the plane reflector 1 to pass through; specifically, a sealing flange 22 is fixed on the inner wall of the sealing cavity 30, a flange sealing gasket 21 is provided between the sealing flange 22 and the inner wall of the sealing cavity 30, the other end of the optical path sealing cylinder 18 extends into the outer side of the sealing flange 22, a sealing cylinder locking ring 19 is also sleeved on the sealing flange 22, a sealing ring 20 is provided between the sealing cylinder locking ring 19 and the sealing flange 22 and connected by threads; a window piece sealing gasket 1 23, a sealing window piece 3 24 and a window piece locking ring 25 are sequentially installed on the inner side of the sealing flange 22, a window piece sealing gasket 26 is provided between the window piece locking ring 25 and the sealing flange 22 and connected by threads, for sealing and fixing the sealing window piece 3 24;

[0030] On the bottom plate 3, plane reflector 2 4, ellipsoid mirror 1 5, sample chamber 7, parabolic mirror 9, ellipsoid mirror 2 11 and liquid nitrogen refrigeration MCT detector 12 are arranged in sequence along the optical path, wherein the optical path is turned 90 degrees at the positions of plane reflector 2 4, ellipsoid mirror 1 5, parabolic mirror 9 and ellipsoid mirror 2 11 respectively; moreover, in the above optical path, the focus is on making the parallel interference light emitted by the interferometer of the infrared spectrometer host pass through the sample chamber 7 and enter the liquid nitrogen refrigeration MCT detector 12, and other optical path components can be reasonably replaced;

[0031] An ellipsoid mirror three-dimensional adjustment mechanism 10 is provided beside the ellipsoid mirror 11 to adjust the three-dimensional distance between the ellipsoid mirror 11 and the liquid nitrogen MCT detector so that the liquid nitrogen refrigerated MCT detector 12 can obtain the best energy;

[0032] The liquid nitrogen refrigerated MCT detector 12 is connected to a detector cable group, which is used to feed back the signal received by the liquid nitrogen refrigerated MCT detector 12 to the infrared spectrometer host;

[0033] Wherein, the sealed cavity 30 (see Figure 4 ) is covered on the bottom plate 3, and the sealed cavity 30 has a depression to form the sample chamber 7 for placing various test accessories and samples; the sealed cavity 30 is provided with a sealing window piece 1 6 and a sealing window piece 2 8 on both sides corresponding to the sample chamber 7, so that the light path is reflected from the ellipsoid mirror 1 5, passes through the sealing window piece 1 6, enters the sample chamber 7, and then passes through the sealing window piece 2 8 to enter the parabolic mirror 9;

[0034] The sealed cavity 30 forms a closed structure inside, a nitrogen purge inlet 14 is provided on the bottom plate 3, and a nitrogen purge outlet 28 (one-way seal) is arranged on the sealed cavity 30. After nitrogen is introduced through the nitrogen purge inlet 14, the influence of water and carbon dioxide in the sealed cavity 30 on the external test platform can be completely removed;

[0035] The liquid nitrogen injection sealing port 29 on the sealing chamber 30 is used to add liquid nitrogen to the liquid nitrogen refrigeration MCT detector 12, because the liquid nitrogen refrigeration MCT detector 12 needs to be filled with liquid nitrogen to ensure normal operation.

[0036] In the above example:

[0037] The optical reflective surfaces of the plane reflector 1, the plane reflector 2, the ellipsoidal mirror 1, the parabolic mirror 9, and the ellipsoidal mirror 2, 11 are gold-plated optical reflective surfaces;

[0038] The sealing ring is made of fluorosilicone rubber;

[0039] The sealing window piece 1 6 , the sealing window piece 2 8 , and the sealing window piece 3 are made of potassium bromide.

[0040] The Fourier transform infrared spectrometer external test platform of the present invention can be directly connected to an existing single-detector Fourier transform infrared spectrometer to add an additional detector to the infrared spectrometer, thereby meeting the customer's dual-detector detection needs in a low-cost manner.

[0041] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A Fourier transform infrared spectrometer external test platform, characterized in that: include: A plane reflector 1 arranged in the mainframe of the Fourier transform infrared spectrometer can reflect outward the parallel interference light emitted by the interferometer of the mainframe of the Fourier transform infrared spectrometer; A sample chamber and a liquid nitrogen cooled MCT detector are arranged on the light output path of the plane reflector 1.

2. The Fourier transform infrared spectrometer external test platform according to claim 1, characterized in that: Arranged in sequence on the light-emitting path of the plane reflector 1 are: a plane reflector 2, an ellipsoidal mirror 1, the sample chamber, a parabolic mirror, an ellipsoidal mirror 2 and the liquid nitrogen-cooled MCT detector.

3. The Fourier transform infrared spectrometer external test platform according to claim 2, characterized in that: It also includes a bottom plate and a sealed cavity, wherein the sealed cavity is covered on the bottom plate to seal the second plane reflector, the first ellipsoidal mirror, the parabolic mirror, the second ellipsoidal mirror and the liquid nitrogen refrigerated MCT detector.

4. The Fourier transform infrared spectrometer external test platform according to claim 3, characterized in that: A connecting mechanism is provided on one side of the sealed cavity, which is used to connect with the host of the Fourier transform infrared spectrometer so as to allow the light output path of the plane reflector 1 to pass through.

5. The Fourier transform infrared spectrometer external test platform according to claim 4, characterized in that: The connecting mechanism includes an optical path sealing cylinder, one end of which is sealingly connected to the light hole on the side panel of the Fourier transform infrared spectrometer host, and the other end is sealingly connected to the sealed cavity, a sealing flange is fixed on the inner wall of the sealed cavity, a flange sealing gasket is arranged between the sealing flange and the inner wall of the sealed cavity, the other end of the optical path sealing cylinder extends into the outer side of the sealing flange, a sealing cylinder locking ring is also sleeved on the sealing flange, a sealing ring is arranged between the sealing cylinder locking ring and the sealing flange and connected by threads; a window piece sealing gasket 1, a sealing window piece 3 and a window piece locking ring are installed on the inner side of the sealing flange in sequence, a window piece sealing gasket 2 is arranged between the window piece locking ring and the sealing flange and connected by threads, for sealing and fixing the sealing window piece 3.

6. The Fourier transform infrared spectrometer external test platform according to claim 3, characterized in that: An ellipsoid mirror three-dimensional adjustment mechanism is provided beside the ellipsoid mirror 2, which is used to adjust the three-dimensional distance of the ellipsoid mirror 2 relative to the liquid nitrogen MCT detector.

7. The Fourier transform infrared spectrometer external test platform according to claim 2, characterized in that: The liquid nitrogen refrigeration MCT detector is connected to a detector cable group, which is used to feed back the signal received by the liquid nitrogen refrigeration MCT detector to the infrared spectrometer host.

8. The Fourier transform infrared spectrometer external test platform according to claim 3, characterized in that: The sealed cavity has a recess to form the sample chamber, and the sealed cavity is provided with a sealing window piece 1 and a sealing window piece 2 on both sides corresponding to the sample chamber, so that the light path is reflected from the ellipsoidal mirror 1, passes through the sealing window piece 1 to enter the sample chamber, and then passes through the sealing window piece 2 to enter the parabolic mirror.

9. The Fourier transform infrared spectrometer external test platform according to claim 3, characterized in that: The sealed cavity forms a closed structure inside, a nitrogen purge inlet is arranged on the bottom plate, and a nitrogen purge outlet is arranged on the sealed cavity.

10. The Fourier transform infrared spectrometer external test platform according to claim 1, characterized in that: The plane reflector can change position under the drive of the optical path adjustment mechanism, and has a first position that turns the parallel interference light emitted by the interferometer of the infrared spectrometer host 90 degrees and emits it outward, and a second position that no longer blocks the parallel interference light emitted by the interferometer of the infrared spectrometer host.