Accelerometer parameter determination method and device, computer equipment and storage medium

Abstract

The invention relates to an accelerometer parameter determination method and device, computer equipment and a storage medium. The method comprises the following steps: controlling a turntable to rotate at different rotating speeds; a to-be-tested accelerometer is arranged on the rotary table, and the sensitive axis direction of the to-be-tested accelerometer is perpendicular to the rotation axis direction of the rotary table. Acquiring voltage curves of the accelerometer to be tested at different rotating speeds; wherein each voltage curve is constructed based on voltage values of the to-be-measured accelerometer at different moments under the corresponding rotating speed; and according to the different rotating speeds and the voltage curve under the corresponding rotating speed, determining the accelerometer parameters of the accelerometer to be tested. By adopting the method, the parameter testing environment of the to-be-tested accelerometer can be constructed through continuous rotation of the rotary table, and the accelerometer parameters of the to-be-tested accelerometer can be more accurately determined in the corresponding parameter testing environment according to different rotating speeds of the to-be-tested accelerometer and the voltage curve under the corresponding rotating speeds.

Description

Technical Field

[0001] The present application relates to the field of computer technology, and in particular to a method, apparatus, computer equipment and storage medium for determining accelerometer parameters. Background Art

[0002] With the development of computer technology, methods for determining accelerometer performance parameters have emerged. Due to the existence of processing errors, even the performance parameters of the same batch of accelerometers will inevitably have some slight differences. Therefore, accelerometers are generally calibrated before being put into actual use.

[0003] In conventional technology, a calibrated high-precision accelerometer is usually compared with the acceleration to be measured, and the performance parameters of the accelerometer are determined based on the comparison results. Although this method can complete the determination of the performance parameters of the accelerometer, there is a problem of inaccurate parameter determination. Summary of the invention

[0004] Based on this, it is necessary to provide an accelerometer parameter determination method, device, computer equipment and storage medium that can accurately determine the accelerometer parameters in response to the above technical problems.

[0005] In a first aspect, the present application provides a method for determining accelerometer parameters, comprising:

[0006] The turntable is controlled to rotate at different speeds; an accelerometer to be tested is arranged on the turntable, and the sensitive axis direction of the accelerometer to be tested is perpendicular to the rotation axis direction of the turntable;

[0007] Obtaining voltage curves of the accelerometer to be tested at different rotation speeds; wherein each voltage curve is constructed based on voltage values ​​of the accelerometer to be tested at different times at the corresponding rotation speed;

[0008] According to different rotation speeds and voltage curves at corresponding rotation speeds, the accelerometer parameters of the accelerometer to be tested are determined.

[0009] In one embodiment, when the voltage curves at different speeds include a first voltage curve at a first speed and a second voltage curve at a second speed, determining the accelerometer parameters of the accelerometer to be tested according to the different speeds and the voltage curves collected at the corresponding speeds includes:

[0010] Determining first curve parameters of the first voltage curve according to the first voltage curve; the first curve parameters include: a first amplitude and a first offset;

[0011] Determining second curve parameters of the second voltage curve according to the second voltage curve; the second curve parameters include: a second amplitude and a second offset;

[0012] According to the first rotation speed, the second rotation speed, the first curve parameter and the second curve parameter, an accelerometer parameter of the accelerometer to be tested is determined.

[0013] In one embodiment, the accelerometer parameters include a scale factor and a zero bias; determining the accelerometer parameters of the accelerometer to be tested according to the first rotation speed, the second rotation speed, the first curve parameter, and the second curve parameter includes:

[0014] Determining a zero bias of the accelerometer to be tested according to the first rotation speed, the second rotation speed, the first bias, and the second bias;

[0015] A scale factor of the accelerometer to be measured is determined according to the first amplitude or the second amplitude.

[0016] In one embodiment, determining the zero bias of the accelerometer to be measured according to the first rotation speed, the second rotation speed, the first bias, and the second bias includes:

[0017] Determine a reference acceleration component of the centrifugal acceleration of the accelerometer to be measured in the direction of the sensitive axis according to the first rotation speed, the second rotation speed, the first bias and the second bias;

[0018] Selecting a reference bias from a first bias and a second bias according to a reference acceleration component;

[0019] The zero bias of the accelerometer to be tested is determined according to the difference between the reference bias and the reference acceleration component.

[0020] In one embodiment, selecting a reference bias from a first bias and a second bias according to a reference acceleration component comprises:

[0021] When the reference acceleration component takes the first rotation speed as the reference rotation speed, selecting the first bias as the reference bias;

[0022] When the reference acceleration component takes the second rotation speed as the reference rotation speed, the second offset is selected as the reference offset.

[0023] In one embodiment, determining a scale factor of the accelerometer to be tested according to the first amplitude or the second amplitude includes:

[0024] Obtain the gravity acceleration of the area where the accelerometer to be tested is located;

[0025] The scale factor of the accelerometer to be measured is determined according to the ratio between the first amplitude and the acceleration due to gravity; or the scale factor of the accelerometer to be measured is determined according to the ratio between the second amplitude and the acceleration due to gravity.

[0026] In a second aspect, the present application further provides an accelerometer parameter determination device, comprising:

[0027] The turntable rotation module is used to control the turntable to rotate at different speeds; an accelerometer to be tested is arranged on the turntable, and the sensitive axis direction of the accelerometer to be tested is perpendicular to the rotation axis direction of the turntable;

[0028] A curve acquisition module is used to acquire voltage curves of the accelerometer to be tested at different rotation speeds; wherein each voltage curve is constructed based on the voltage values ​​of the accelerometer to be tested at different times at the corresponding rotation speed;

[0029] The parameter determination module is used to determine the accelerometer parameters of the accelerometer to be tested according to different rotation speeds and voltage curves at corresponding rotation speeds.

[0030] In a third aspect, the present application further provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the following steps are implemented:

[0031] The turntable is controlled to rotate at different speeds; an accelerometer to be tested is arranged on the turntable, and the sensitive axis direction of the accelerometer to be tested is perpendicular to the rotation axis direction of the turntable;

[0032] Obtaining voltage curves of the accelerometer to be tested at different rotation speeds; wherein each voltage curve is constructed based on voltage values ​​of the accelerometer to be tested at different times at the corresponding rotation speed;

[0033] According to different rotation speeds and voltage curves at corresponding rotation speeds, the accelerometer parameters of the accelerometer to be tested are determined.

[0034] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed by a processor, the following steps are implemented:

[0035] The turntable is controlled to rotate at different speeds; an accelerometer to be tested is arranged on the turntable, and the sensitive axis direction of the accelerometer to be tested is perpendicular to the rotation axis direction of the turntable;

[0036] Obtaining voltage curves of the accelerometer to be tested at different rotation speeds; wherein each voltage curve is constructed based on voltage values ​​of the accelerometer to be tested at different times at the corresponding rotation speed;

[0037] According to different rotation speeds and voltage curves at corresponding rotation speeds, the accelerometer parameters of the accelerometer to be tested are determined.

[0038] In a fifth aspect, the present application further provides a computer program product, including a computer program, which implements the following steps when executed by a processor:

[0039] The turntable is controlled to rotate at different speeds; an accelerometer to be tested is arranged on the turntable, and the sensitive axis direction of the accelerometer to be tested is perpendicular to the rotation axis direction of the turntable;

[0040] Obtaining voltage curves of the accelerometer to be tested at different rotation speeds; wherein each voltage curve is constructed based on voltage values ​​of the accelerometer to be tested at different times at the corresponding rotation speed;

[0041] According to different rotation speeds and voltage curves at corresponding rotation speeds, the accelerometer parameters of the accelerometer to be tested are determined.

[0042] The above-mentioned accelerometer parameter determination method, device, computer equipment and storage medium control the turntable to rotate at different speeds; the turntable is provided with an accelerometer to be tested, and the sensitive axis direction of the accelerometer to be tested is perpendicular to the rotation axis direction of the turntable; the voltage curve of the accelerometer to be tested at different speeds is obtained; wherein each voltage curve is constructed based on the voltage value of the accelerometer to be tested at different times at the corresponding speed; the accelerometer parameters of the accelerometer to be tested are determined according to the different speeds and the voltage curves at the corresponding speeds. This embodiment constructs a parameter test environment for the accelerometer to be tested through the continuous rotation of the turntable, and in the corresponding parameter test environment, according to the different speeds of the accelerometer to be tested and the voltage curves at the corresponding speeds, the accelerometer parameters of the accelerometer to be tested can be determined more accurately. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the related technologies, the drawings required for use in the embodiments or the related technical descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0044] FIG1 is a diagram showing an application environment of an accelerometer parameter determination method provided by this embodiment;

[0045] FIG2 is a schematic flow chart of a first accelerometer parameter determination method provided by this embodiment;

[0046] FIG3 is a schematic diagram of a voltage curve provided by this embodiment;

[0047] FIG4 is a structural block diagram of an accelerometer parameter determination device provided by this embodiment;

[0048] FIG5 is an internal structure diagram of a first computer device provided in this embodiment;

[0049] FIG6 is a diagram showing the internal structure of a second type of computer device provided in this embodiment. DETAILED DESCRIPTION

[0050] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0051] The accelerometer parameter determination method provided in the embodiment of the present application can be applied in the application environment as shown in Figure 1. Among them, the computer device 10 communicates with the horizontal axis turntable 11, and can control the turntable (i.e., the horizontal axis turntable 11) to rotate at different speeds, and control the turntable to stop; the turntable (i.e., the horizontal axis turntable 11) is provided with an accelerometer to be tested (i.e., the test sample 12), and the sensitive axis direction of the accelerometer to be tested is perpendicular to the rotation axis direction of the turntable. The computer device 10 communicates with the signal collector 13, and the voltage curve of the accelerometer to be tested at different speeds can be obtained from the signal collector 13. The signal collector 13 communicates with the test sample 12, and can obtain the voltage values ​​of the test sample 12 (i.e., the accelerometer to be tested) at different speeds at different times. Specifically, the computer device 10 controls the turntable (i.e., the horizontal axis turntable 11) to rotate at different speeds; obtains the voltage curve of the accelerometer to be tested (i.e., the test sample 12) at different speeds; wherein each voltage curve is constructed based on the voltage value of the accelerometer to be tested at different times at the corresponding speed; and determines the accelerometer parameters of the accelerometer to be tested according to the different speeds and the voltage curves at the corresponding speeds. The computer device 10 can be either a terminal or a server. The terminal can be, but is not limited to, various personal computers, laptops, smart phones, tablet computers, Internet of Things devices, and portable wearable devices. The server can be implemented as an independent server or a server cluster consisting of multiple servers.

[0052] In an exemplary embodiment, as shown in FIG2 , a method for determining accelerometer parameters is provided, which is described by taking the method applied to the computer device in FIG1 as an example, and includes the following steps 201 to 203. Among them:

[0053] Step 201, controlling the turntable to rotate at different speeds.

[0054] The turntable is provided with an accelerometer to be tested, and the sensitive axis direction of the accelerometer to be tested is perpendicular to the rotation axis direction of the turntable. The accelerometer to be tested may be a MEMS accelerometer composed of a micro-electromechanical system (MEMS).

[0055] Specifically, the computer device controls the turntable to rotate at a uniform speed, and at the same time simulates an amplitude of 1g for the accelerometer to be tested set on the turntable, and a gravity field environment that changes according to a sinusoidal wave.

[0056] Exemplarily, in a standard earth gravity field, the sensitive axis direction of the accelerometer to be tested is made perpendicular to the rotation axis direction of the horizontal-axis turntable, and the accelerometer to be tested is installed on the horizontal-axis turntable, the accelerometer to be tested and the signal collector are turned on, and a preset first period of time (such as 1 minute) is waited for the accelerometer to be tested to reach a thermally stable state; for each target rotation speed, the computer device controls the horizontal-axis turntable to rotate at the target rotation speed, waits for a preset second period of time (such as 10 seconds) for the turntable rotation speed to stabilize, and then turns on the signal collector.

[0057] Step 202: Obtain voltage curves of the accelerometer to be tested at different rotation speeds.

[0058] Each voltage curve is constructed based on the voltage value of the accelerometer to be tested at different times under the corresponding rotation speed.

[0059] Specifically, for each target speed, the signal collector obtains the voltage value of the accelerometer to be tested at different times under the target speed; the computer device obtains the voltage value of the accelerometer to be tested at different times under each speed through the signal collector; for each target speed, according to the voltage value of the accelerometer to be tested at different times under the target speed, a voltage curve at the target speed is constructed.

[0060] Exemplarily, for the accelerometer to be tested at each target speed, the signal collector collects the voltage value output by the accelerometer to be tested within a preset third time period (such as 40s), and performs trigonometric function fitting on the voltage value collected within the preset third time period to generate a voltage curve of the accelerometer to be tested at the target speed, as shown in the following formula (1-1). The voltage curve can refer to the voltage curve schematic diagram shown in Figure 3, where the voltage curve corresponding to (1) in the figure is the first voltage curve at the first speed, and the second voltage curve corresponding to (2) in the figure is the second voltage curve at the second speed.

[0061] U out =A+Bsin(wt-T) (1-1)

[0062] Among them, U out represents the voltage curve, A represents the bias of the voltage curve, B represents the amplitude of the voltage curve, w represents the target speed, t represents the time of the voltage curve, and T represents the phase of the voltage curve.

[0063] Step 203: determining the accelerometer parameters of the accelerometer to be tested according to different rotation speeds and voltage curves at corresponding rotation speeds.

[0064] In one of the embodiments, based on the zero bias determination model, the zero bias of the accelerometer to be tested is determined according to the voltage curves at different rotational speeds; based on the scale factor determination model, the scale factor of the accelerometer to be tested is determined according to the voltage curves at different rotational speeds and corresponding rotational speeds; and based on the zero and scale factors, the accelerometer parameters of the accelerometer to be tested are determined.

[0065] Exemplarily, when the voltage curves at different speeds include a first voltage curve at a first speed and a second voltage curve at a second speed, the accelerometer parameters of the accelerometer to be tested are determined according to the different speeds and the voltage curves collected at the corresponding speeds, including: determining first curve parameters of the first voltage curve according to the first voltage curve; the first curve parameters include: a first amplitude and a first bias; determining second curve parameters of the second voltage curve according to the second voltage curve; the second curve parameters include: a second amplitude and a second bias; and determining the accelerometer parameters of the accelerometer to be tested according to the first speed, the second speed, the first curve parameters and the second curve parameters.

[0066] The above-mentioned accelerometer parameter determination method controls the turntable to rotate at different speeds; the turntable is provided with an accelerometer to be tested, and the sensitive axis direction of the accelerometer to be tested is perpendicular to the rotation axis direction of the turntable; the voltage curve of the accelerometer to be tested at different speeds is obtained; wherein each voltage curve is constructed based on the voltage value of the accelerometer to be tested at different times at the corresponding speed; the accelerometer parameters of the accelerometer to be tested are determined according to the different speeds and the voltage curves at the corresponding speeds. This embodiment constructs a parameter test environment for the accelerometer to be tested by the continuous rotation of the turntable, and in the corresponding parameter test environment, according to the different speeds of the accelerometer to be tested and the voltage curves at the corresponding speeds, the accelerometer parameters of the accelerometer to be tested can be determined more accurately.

[0067] In some embodiments, the accelerometer parameters include a scale factor and a zero bias; determining the accelerometer parameters of the accelerometer to be tested according to the first rotational speed, the second rotational speed, the first curve parameter and the second curve parameter includes: determining the zero bias of the accelerometer to be tested according to the first rotational speed, the second rotational speed, the first bias and the second bias; determining the scale factor of the accelerometer to be tested according to the first amplitude or the second amplitude.

[0068] Specifically, based on the zero bias determination model, the zero bias of the accelerometer to be tested is determined according to the first amplitude or the second amplitude; based on the scale factor determination model, the scale factor of the accelerometer to be tested is determined according to the first rotation speed, the second rotation speed, the first bias and the second bias.

[0069] In some embodiments, the zero bias of the accelerometer to be tested is determined according to the first rotational speed, the second rotational speed, the first bias and the second bias, including: determining a reference acceleration component of the centrifugal acceleration of the accelerometer to be tested in the direction of the sensitive axis according to the first rotational speed, the second rotational speed, the first bias and the second bias; selecting a reference bias from the first bias and the second bias according to the reference acceleration component; and determining the zero bias of the accelerometer to be tested according to the difference between the reference bias and the reference acceleration component.

[0070] Among them, since the uniform rotation of the horizontal axis turntable will generate a centrifugal acceleration, and the magnitude of the centrifugal acceleration is linearly related to the square of the turntable rotation speed, and the direction of the centrifugal acceleration deviates from the center of rotation of the turntable, the centrifugal acceleration of the accelerometer to be measured will generate a component in the direction of the sensitive axis, namely the reference acceleration component. It should be noted that the centrifugal acceleration will not change the peak value of the output voltage curve during the measurement process of the MEMS accelerometer.

[0071] Specifically, according to the first rotational speed, the second rotational speed, the first bias and the second bias, the first acceleration component and the second acceleration component of the centrifugal acceleration of the accelerometer to be tested in the direction of the sensitive axis are respectively determined by the following formula (1-2); the first acceleration component or the second acceleration component is randomly selected to determine the reference acceleration component of the centrifugal acceleration of the accelerometer to be tested in the direction of the sensitive axis; when the first acceleration component is the reference acceleration component, the first bias is selected as the reference bias; when the second acceleration component is the reference acceleration component, the second bias is selected as the reference bias; and the difference between the reference bias and the reference acceleration component is used as the zero bias of the accelerometer to be tested.

[0072] (1-2)

[0073] Among them, a1 represents the first acceleration component, a2 represents the first acceleration component, A1 represents the first offset, A2 represents the second offset, w1 represents the first rotation speed, and w2 represents the second rotation speed.

[0074] In some embodiments, a reference bias is selected from a first bias and a second bias according to a reference acceleration component, including: when the reference acceleration component takes a first rotational speed as a reference rotational speed, selecting the first bias as a reference bias; when the reference acceleration component takes a second rotational speed as a reference rotational speed, selecting the second bias as a reference bias.

[0075] In a specific embodiment, taking the case where the reference acceleration component takes the first rotation speed as the reference rotation speed as an example, the zero bias of the accelerometer to be tested can be determined by the following formula (1-3).

[0076] (1-3)

[0077] Among them, U0 represents the zero bias of the accelerometer to be tested, a1 represents the first acceleration component, a2 represents the first acceleration component, A1 represents the first bias, A2 represents the second bias, w1 represents the first speed, and w2 represents the second speed. In this formula, the first speed w1 is used as the reference speed to determine the first acceleration component As the reference component, the first bias A1 is selected as the reference bias, and finally the zero bias of the accelerometer to be tested is determined.

[0078] It should be noted that in order to ensure the accuracy of the zero bias of the accelerometer to be measured, the reference zero bias calculated at different reference speeds can be obtained first (such as determining the first reference zero bias U1 when the first speed w1 is used as the reference speed, and determining the second reference zero bias U2 when the second speed w2 is used as the reference speed), and then further determine the mean or weighted mean corresponding to each reference zero bias as the target zero bias, and finally use the target zero bias as the zero bias of the accelerometer to be measured.

[0079] In some embodiments, determining the scale factor of the accelerometer to be measured based on the first amplitude or the second amplitude includes: obtaining the gravity acceleration of the area where the accelerometer to be measured is located; determining the scale factor of the accelerometer to be measured based on the ratio between the first amplitude and the gravity acceleration; or, determining the scale factor of the accelerometer to be measured based on the ratio between the second amplitude and the gravity acceleration.

[0080] Specifically, according to the ratio between the first amplitude and the gravitational acceleration, the scale factor of the accelerometer to be tested is determined by the following formula (1-4).

[0081] (1-4)

[0082] Wherein, K represents the scale factor of the accelerometer to be measured, B1 represents the first amplitude, and g represents the gravitational acceleration.

[0083] It should be noted that, in order to ensure the accuracy of the zero bias of the accelerometer to be measured, the reference scale factors determined under different amplitudes can be first obtained (such as the first scale factor K1 determined under the first amplitude B1, and the second scale factor K2 determined under the second amplitude B2), and then the mean or weighted mean corresponding to each reference scale factor can be further determined as the target scale factor, and finally the target scale factor can be used as the scale factor of the acceleration to be measured.

[0084] In this embodiment, the accelerometer parameters of the accelerometer to be tested are determined according to the first rotational speed, the second rotational speed, the first curve parameter and the second curve parameter, including: determining the zero bias of the accelerometer to be tested according to the first rotational speed, the second rotational speed, the first bias and the second bias; determining the scale factor of the accelerometer to be tested according to the first amplitude or the second amplitude, so that the zero bias and scale factor of the accelerometer to be tested can be determined more accurately.

[0085] It should be noted that this embodiment proposes a test device composed of a horizontal axis turntable, a host computer, a signal collector, and a computing device, etc., and completes the measurement of the zero bias and scale factor of the MEMS accelerometer based on the method of continuous rolling of the gravity field and data fitting calibration. This method solves the problem that the existing methods generally have high requirements for installation accuracy. Since the measurement method requires the MEMS accelerometer to be continuously flipped during measurement, any direction of the MEMS accelerometer will experience a sinusoidal waveform gravity field with an amplitude of 1g, and the installation error will only cause their phases to change slightly, which will not affect the measurement of the zero bias and scale factor of the MEMS accelerometer. Therefore, this method has low requirements for installation accuracy and high operational feasibility. This method helps designers of MEMS accelerometers to calibrate the zero bias and scale factor of the device and verify the key performance of the MEMS gyroscope.

[0086] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0087] Based on the same inventive concept, the embodiment of the present application also provides an accelerometer parameter determination device for implementing the accelerometer parameter determination method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations of one or more accelerometer parameter determination device embodiments provided below can refer to the limitations of the accelerometer parameter determination method above, and will not be repeated here.

[0088] In an exemplary embodiment, as shown in FIG4 , an accelerometer parameter determination device is provided, comprising: a turntable rotation module 10, a curve acquisition module 11 and a parameter determination module 12, wherein:

[0089] The turntable rotation module 10 is used to control the turntable to rotate at different speeds; an accelerometer to be tested is arranged on the turntable, and the sensitive axis direction of the accelerometer to be tested is perpendicular to the rotation axis direction of the turntable;

[0090] The curve acquisition module 11 is used to acquire the voltage curve of the accelerometer to be tested at different rotation speeds; wherein each voltage curve is constructed based on the voltage value of the accelerometer to be tested at different times at the corresponding rotation speed;

[0091] The parameter determination module 12 is used to determine the accelerometer parameters of the accelerometer to be tested according to different rotation speeds and voltage curves at corresponding rotation speeds.

[0092] In one embodiment, the parameter determination module 12 in Figure 4 is also used to determine the first curve parameters of the first voltage curve based on the first voltage curve; the first curve parameters include: a first amplitude and a first bias; determine the second curve parameters of the second voltage curve based on the second voltage curve; the second curve parameters include: a second amplitude and a second bias; determine the accelerometer parameters of the accelerometer to be tested based on the first speed, the second speed, the first curve parameters and the second curve parameters.

[0093] In one embodiment, the parameter determination module 12 in FIG. 4 is further used to determine the zero bias of the accelerometer to be measured according to the first rotation speed, the second rotation speed, the first bias and the second bias; and to determine the scale factor of the accelerometer to be measured according to the first amplitude or the second amplitude.

[0094] In one embodiment, the parameter determination module 12 in Figure 4 is also used to determine the reference acceleration component of the centrifugal acceleration of the accelerometer to be tested in the sensitive axis direction according to the first rotational speed, the second rotational speed, the first bias and the second bias; select a reference bias from the first bias and the second bias according to the reference acceleration component; and determine the zero bias of the accelerometer to be tested according to the difference between the reference bias and the reference acceleration component.

[0095] In one embodiment, the parameter determination module 12 in Figure 4 is also used to select the first bias as the reference bias when the reference acceleration component takes the first speed as the reference speed; and select the second bias as the reference bias when the reference acceleration component takes the second speed as the reference speed.

[0096] In one embodiment, the parameter determination module 12 in Figure 4 is also used to obtain the gravity acceleration of the area where the accelerometer to be tested is located; determine the scale factor of the accelerometer to be tested based on the ratio between the first amplitude and the gravity acceleration; or, determine the scale factor of the accelerometer to be tested based on the ratio between the second amplitude and the gravity acceleration.

[0097] Each module in the above-mentioned accelerometer parameter determination device can be implemented in whole or in part by software, hardware and a combination thereof. Each of the above-mentioned modules can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute the operations corresponding to each of the above modules.

[0098] In an exemplary embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be shown in FIG5. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. The processor, the memory and the input / output interface are connected via a system bus, and the communication interface is connected to the system bus via the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store data. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a method for determining accelerometer parameters is implemented.

[0099] In an exemplary embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be shown in FIG6. The computer device includes a processor, a memory, an input / output interface, a communication interface, a display unit, and an input device. The processor, the memory, and the input / output interface are connected via a system bus, and the communication interface, the display unit, and the input device are connected to the system bus via the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner may be implemented through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, a method for determining accelerometer parameters is implemented. The display unit of the computer device is used to form a visually visible picture, which may be a display screen, a projection device, or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covering the display screen, or a button, trackball or touchpad set on the computer device shell, or an external keyboard, touchpad or mouse.

[0100] Those skilled in the art will understand that the structures shown in FIGS. 5 and 6 are merely block diagrams of partial structures related to the scheme of the present application, and do not constitute a limitation on the computer device to which the scheme of the present application is applied. The specific computer device may include more or fewer components than those shown in the figures, or combine certain components, or have a different arrangement of components.

[0101] In one embodiment, a computer device is further provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above-mentioned method embodiments when executing the computer program.

[0102] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0103] In one embodiment, a computer program product is provided, including a computer program, which implements the steps in the above method embodiments when executed by a processor.

[0104] It should be noted that the data involved in this application (including but not limited to data used for analysis, stored data, displayed data, etc.) are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0105] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0106] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0107] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A method for determining accelerometer parameters, characterized in that: The method comprises: The turntable is controlled to rotate at different speeds; an accelerometer to be tested is arranged on the turntable, and the sensitive axis direction of the accelerometer to be tested is perpendicular to the rotation axis direction of the turntable; Obtaining voltage curves of the accelerometer to be tested at different rotation speeds; wherein each voltage curve is constructed based on voltage values ​​of the accelerometer to be tested at different times at a corresponding rotation speed; According to the different rotational speeds and the voltage curves at the corresponding rotational speeds, the accelerometer parameters of the accelerometer to be tested are determined.

2. The method according to claim 1, characterized in that In a case where the voltage curves at different speeds include a first voltage curve at a first speed and a second voltage curve at a second speed, determining the accelerometer parameters of the accelerometer to be tested according to the different speeds and the voltage curves collected at the corresponding speeds includes: Determining first curve parameters of the first voltage curve according to the first voltage curve; the first curve parameters include: a first amplitude and a first offset; Determining second curve parameters of the second voltage curve according to the second voltage curve; the second curve parameters include: a second amplitude and a second offset; The accelerometer parameters of the accelerometer to be tested are determined according to the first rotation speed, the second rotation speed, the first curve parameter, and the second curve parameter.

3. The method according to claim 2, characterized in that The accelerometer parameters include a scale factor and a zero bias; the accelerometer parameters of the accelerometer to be tested are determined according to the first rotation speed, the second rotation speed, the first curve parameter and the second curve parameter, including: Determining a zero bias of the accelerometer to be tested according to the first rotation speed, the second rotation speed, the first bias, and the second bias; A scale factor of the accelerometer to be measured is determined according to the first amplitude or the second amplitude.

4. The method according to claim 3, characterized in that Determining the zero bias of the accelerometer to be tested according to the first rotation speed, the second rotation speed, the first bias, and the second bias includes: Determine a reference acceleration component of the centrifugal acceleration of the accelerometer to be measured in the direction of the sensitive axis according to the first rotation speed, the second rotation speed, the first bias and the second bias; Selecting a reference bias from a first bias and a second bias according to the reference acceleration component; The zero bias of the accelerometer to be tested is determined according to the difference between the reference bias and the reference acceleration component.

5. The method according to claim 4, characterized in that The step of selecting a reference bias from a first bias and a second bias according to the reference acceleration component comprises: When the reference acceleration component takes the first rotational speed as the reference rotational speed, selecting the first bias as the reference bias; In the case where the reference acceleration component takes the second rotational speed as the reference rotational speed, the second offset is selected as the reference offset.

6. The method according to claim 3, characterized in that Determining the scale factor of the accelerometer to be tested according to the first amplitude or the second amplitude includes: Obtaining the gravitational acceleration of the area where the accelerometer to be tested is located; The scale factor of the accelerometer to be measured is determined according to the ratio between the first amplitude and the acceleration due to gravity; or the scale factor of the accelerometer to be measured is determined according to the ratio between the second amplitude and the acceleration due to gravity.

7. An accelerometer parameter determination device, characterized in that: The device comprises: A turntable rotation module, used for controlling the turntable to rotate at different speeds; an accelerometer to be tested is arranged on the turntable, and the sensitive axis direction of the accelerometer to be tested is perpendicular to the rotation axis direction of the turntable; A curve acquisition module, used to acquire voltage curves of the accelerometer to be tested at different rotation speeds; wherein each voltage curve is constructed based on voltage values ​​of the accelerometer to be tested at different times at a corresponding rotation speed; The parameter determination module is used to determine the accelerometer parameters of the accelerometer to be tested according to the different rotation speeds and the voltage curves at the corresponding rotation speeds.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 6 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

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