Feedback-based automatic detection system

Abstract

The invention relates to an automatic detection system based on feedback, and the system comprises a control module which is used for transmitting an ADC detection instruction, obtaining a feedback signal of a to-be-detected channel, and carrying out the fault detection of the to-be-detected channel based on the value of an ADC result register in the feedback signal; wherein the fault detection comprises LED open and short circuit, channel open circuit, channel short circuit, short circuit between adjacent column channels, short circuit between adjacent row channels, row drive overall damage, column drive overall damage and row and column integrated drive overall damage; and the voltage detection module is used for setting an ADC circuit in the column driving chip, receiving an ADC detection instruction, detecting the voltage of the channel to be detected, storing the voltage to an ADC result register, and feeding back the value of the ADC result register to the control module. According to the invention, the voltage is detected by the built-in ADC of the driving chip, the fault is detected by the control module according to the voltage of each channel, the efficiency is high, and the judgment is accurate.

Description

Technical Field

[0001] The present invention relates to the technical field of module fault detection, and in particular to an automatic detection system based on feedback. Background Art

[0002] like Figure 1 As shown, the circuit of the LED display module is relatively complex, especially as the pixel pitch continues to shrink, resulting in an increasing number of components per unit area and a continuous decrease in the PCB patch yield.

[0003] There are multiple row driver chips and multiple column driver chips on the module. Both the row driver chip and the column driver chip have multiple output channels, which are respectively connected to the positive and negative poles of the LED lamp to light up the LED lamp.

[0004] LED display screens are divided into common cathode screens and common anode screens:

[0005] Common anode display screen: the output of the row driver chip is connected to the positive pole of the LED, and the output of the column driver chip is connected to the negative pole of the LED.

[0006] Common cathode display screen: the output of the row driver chip is connected to the negative pole of the LED, and the output of the column driver chip is connected to the positive pole of the LED.

[0007] The smaller the spacing between LED beads, the denser the row driver chips and column driver chips, and the more likely various faults are to occur.

[0008] Controller: The controller can be a receiving card or a control chip. The controller sends instructions and images to the row driver chip and column driver chip, so that the row and column drivers open or close the output channel.

[0009] The current LED modules only have two functions: open circuit detection and short circuit detection. The basic principles are as follows:

[0010] Common cathode display: The column drive chip switches to constant current mode and detects the voltage of the output channel. If the voltage is too high, it is an open circuit, and if the voltage is too low, it is a short circuit (the internal resistance of the LED lamp bead is 0).

[0011] Common anode display: The column drive chip switches to constant current mode and detects the voltage of the output channel. If the voltage is too low, it is an open circuit, and if the voltage is too high, it is a short circuit (cold solder joint, or the internal resistance of the LED lamp bead is infinite).

[0012] LED module failures are not limited to open and short circuits, but also include driver chip failures, short circuits between output channels, and output channels that are always open.

[0013] Since there are many driver chips on the module, these faults are difficult to detect manually. More importantly, it is very dangerous for the output channel of the row driver to be always open. The output current of the row driver is in amperes, and the normal display should be turned on alternately. If a channel is turned on for a long time, it may cause a fire.

[0014] At present, the testing of modules is basically based on lighting up the LED, and then workers rely on their eyes to see if the LED lights up normally to determine the fault. This is not only inefficient, but also has the possibility of missing faults. There are also automatic detections through external equipment, adding detection equipment outside the module to detect faults through cameras or ammeters. This is very efficient, but there are still disadvantages: the detection equipment is only available to the manufacturer, and the module may have new faults after transportation after leaving the factory. After the module has been used for a period of time, new faults may also occur, and users cannot detect them without detection equipment. Therefore, a simple automatic detection mechanism is needed. Summary of the invention

[0015] In order to solve the above problems in the prior art, the purpose of the present invention is to provide a testing method with high efficiency, high accuracy and no reliance on external equipment.

[0016] To achieve the above object, the present invention provides the following solutions:

[0017] A feedback-based automatic detection system, comprising:

[0018] A control module is used to send an ADC detection instruction, obtain a feedback signal of a channel to be detected, and perform fault detection on the channel to be detected based on the value of an ADC result register in the feedback signal; wherein the fault detection includes: LED open-short circuit, channel open circuit, channel short circuit, short circuit between adjacent column channels, short circuit between adjacent row channels, overall damage of row drive, overall damage of column drive, and overall damage of row-column integrated drive;

[0019] The voltage detection module is used to set an ADC circuit inside the column driver chip, receive the ADC detection instruction, detect the voltage of the channel to be detected, save the voltage to the ADC result register, and feed back the value of the ADC result register to the control module.

[0020] Optionally, the control module includes:

[0021] The instruction sending submodule is used to send ADC detection instructions;

[0022] A feedback receiving submodule, used for receiving a feedback signal from the column driver chip;

[0023] The fault detection submodule is used to perform fault detection on the channel to be detected based on the value of the ADC result register in the feedback signal.

[0024] Optionally, the fault detection submodule includes:

[0025] LED open-short circuit detection unit, used to detect whether the LED lamp bead is open or short-circuited;

[0026] The LED open-short circuit detection unit comprises:

[0027] The common cathode display screen detection subunit is used to determine that the LED lamp bead at the intersection of the row signal and the column signal is open or not welded if the voltage of the row signal and the column signal is higher than the open circuit detection voltage; if the voltage of the row signal and the column signal is lower than the short circuit detection voltage, determine that the LED lamp bead at the intersection of the row signal and the column signal is short-circuited;

[0028] The common anode display screen detection subunit is used to determine that the LED lamp beads at the intersection of the row signal and the column signal are open or not welded if the voltages of the row signal and the column signal are lower than the open circuit detection voltage; if the voltages of the row signal and the column signal are higher than the short circuit detection voltage, then determine that the LED lamp beads at the intersection of the row signal and the column signal are short-circuited.

[0029] Optionally, the fault detection submodule further includes:

[0030] A channel open circuit detection unit is used to determine that the column drive channel corresponding to the column signal is damaged or poorly soldered if all the row signals are open circuited with the column signal of the same column; if all the column signals are open circuited with the row signal of the same row, then determine that the row drive channel corresponding to the row signal is damaged or poorly soldered;

[0031] The channel short circuit detection unit is used to determine that the column drive channel corresponding to the column signal is damaged if all the row signals are short-circuited with the column signal of the same column; if all the column signals are short-circuited with the row signal of the same row, it is determined that the row drive channel corresponding to the row signal is damaged.

[0032] Optionally, the fault detection submodule further includes:

[0033] A short-circuit detection unit between adjacent column channels, used for determining that a channel corresponding to the column signal and a channel corresponding to the adjacent column signal are short-circuited if the voltage between all rows and any column signal is the same as the voltage between adjacent column signals of the column signal;

[0034] The short circuit detection unit between adjacent row channels is used to determine that there is a short circuit between the channel corresponding to the row signal and the channel corresponding to the adjacent row signal if the voltage between all columns and any row signal is the same as the voltage between the adjacent row signals of the row signal.

[0035] Optionally, the fault detection submodule further includes:

[0036] A row driver overall damage detection unit, used to determine that the row driver chip is overall damaged if all row channels of the row driver chip are open;

[0037] The overall column driver damage detection unit is used to send a write instruction to each column driver to write a preset value to a register; then send a read instruction to read the preset value of the register. If the read preset value is not equal to the written preset value, it is determined that the column driver chip is damaged as a whole, or the power pin and the data pin are not welded well; if the read preset value is equal to the written preset value, the column channel is checked. If all the column channels of the column driver chip are open, it is determined that the column driver chip is damaged as a whole.

[0038] Optionally, the fault detection submodule further includes:

[0039] The row-column integrated driver overall damage detection unit is used to send a write instruction to each row-column integrated driver chip, write a preset value to a register, and then send a read instruction to read the preset value of the register. If the read preset value is not equal to the written preset value, it is determined that the row-column integrated driver chip is damaged as a whole, or the power pin and data pin are not welded well; if the read preset value is equal to the written preset value, check the channel. If all row channels of the row-column integrated driver chip are open, or all column channels of the row-column integrated driver chip are open, it is determined that the row-column integrated driver chip is damaged as a whole.

[0040] Optionally, the voltage detection module includes:

[0041] The voltage detection submodule is used to set an ADC circuit inside the column driver chip or the row-column integrated driver chip, receive the ADC detection instruction, detect the voltage of the channel to be detected, and save the voltage to the ADC result register.

[0042] Optionally, the voltage detection module further includes:

[0043] The feedback submodule is used to feed back the value of the ADC result register in the voltage detection submodule to the control module.

[0044] The beneficial effects of the present invention are:

[0045] The present invention detects voltage by using an ADC built into a driver chip, and uses a control module to detect faults according to the voltages of various channels, with high efficiency and accurate judgment.

[0046] The present invention no longer requires external equipment and has a relatively low detection cost.

[0047] The present invention can be re-tested at any time, so that the module can be re-tested after being transported and used for a period of time. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0049] Figure 1 A schematic diagram of an LED display module of the background technology of the present invention;

[0050] Figure 2 A schematic diagram of adding an ADC detection circuit to the column drive of an embodiment of the present invention;

[0051] Figure 3 This is a schematic diagram of the column driver chips in series connection according to an embodiment of the present invention;

[0052] Figure 4 This is a schematic diagram of the parallel connection between column driver chips according to an embodiment of the present invention;

[0053] Figure 5 This is a schematic diagram of row-column integrated driving according to an embodiment of the present invention;

[0054] Figure 6 A flowchart of a controller reading an output channel voltage according to an embodiment of the present invention;

[0055] Figure 7 A schematic diagram of sending control signals between column driver chips connected in series according to an embodiment of the present invention;

[0056] Figure 8 A schematic diagram of sending control signals between column driver chips connected in parallel according to an embodiment of the present invention;

[0057] Fig. 9 Schematic diagram of row-column signal output channels of row-column integrated drive according to an embodiment of the present invention. DETAILED DESCRIPTION

[0058] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0059] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments.

[0060] The present embodiment discloses an automatic detection system based on feedback, including: a control module, used to send an ADC detection instruction, obtain a feedback signal of a channel to be detected, and perform fault detection on the channel to be detected based on the value of an ADC result register in the feedback signal; wherein the fault detection includes: LED open-short circuit, channel open circuit, channel short circuit, short circuit between adjacent column channels, short circuit between adjacent row channels, overall damage of the row driver, overall damage of the column driver, and overall damage of the row-column integrated driver; a voltage detection module, used to set an ADC circuit inside a column driver chip, receive an ADC detection instruction, detect the voltage of the channel to be detected, save the voltage to the ADC result register, and feed back the value of the ADC result register to the control module.

[0061] Specifically, in this embodiment, a simple ADC circuit is added inside the column driver chip to detect the voltage of the output channel, and then the voltage is fed back to the controller. The software of the controller performs calculations based on the voltage to determine the fault on the module.

[0062] like Figure 2 As shown in the figure, the voltage detection module consists of two parts: a voltage detection submodule and a feedback submodule. The voltage detection submodule is built into the column driver chip or the row-column integrated driver chip, and is equipped with an ADC circuit for receiving ADC detection instructions, detecting the voltage of the specified channel, and storing the detection results in the ADC result register. The feedback submodule is responsible for passing the voltage value in the ADC result register to the control module.

[0063] The ADC module and the column driver output channel are devices inside the column driver chip, and the ADC module measures the output channel voltage when the LED lamp is turned on (the column driver output channel is turned on).

[0064] Furthermore, the control module includes: an instruction sending submodule for sending ADC detection instructions; a feedback receiving submodule for receiving feedback signals from the column driver chip; and a fault detection submodule for performing fault detection on the channel to be detected based on the value of the ADC result register in the feedback signal.

[0065] Specifically, a feedback circuit is added between the controller and the column driver: a signal for feedback data is added between the controller (receiving card or control chip) and the column driver chip. The original signal (the signal sent by the controller to the column driver chip) can also be reused, such as latch, line feed, enable and other signals, and the communication direction can be staggered in time.

[0066] like Figure 3 As shown, if the column driver chips are connected in series, the driver chip feeds back data to the previous driver chip.

[0067] like Figure 4As shown, if the column driver chips are connected in parallel, all the driver chips are connected to the controller, and the time of feeding back the ADC result register value is staggered.

[0068] like Figure 5 As shown, row-column integrated driving: the row-column integrated driving chip can output row signals and column signals at the same time. This embodiment is also effective for row-column integrated driving.

[0069] For example: 1 column driver outputs 16 column signals + 8 row signals, which is adjusted to 1 row driver outputs 48 column signals + 16 row signals, which is equivalent to the original 3 column drivers + 2 row drivers.

[0070] For the row-column integrated driver, an ADC detection circuit is added to the row-column integrated driver, and a feedback circuit is added between the controller and the row-column integrated driver: the control module is responsible for issuing ADC detection instructions, receiving feedback signals from the row-column integrated driver, and using the value of the ADC result register to perform fault detection of the channel to be detected. At the same time, the voltage detection module integrates an ADC circuit inside the row-column integrated driver to receive detection instructions, measure the voltage of the channel to be detected, and store the measurement results in the ADC result register, and finally feed back the value of the ADC result register to the control module.

[0071] The controller implements the detection process of the detection algorithm:

[0072] The controller is a receiving card or control chip. The controller reads the output channel voltage process, such as Figure 6 As shown, for the module with integrated row and column drive, Figure 6 On the right side is the row-column integrated drive.

[0073] The controller sends instructions to the column driver chip, which is a control signal for configuring the column driver register (or sending a grayscale value to the column driver) through the controller.

[0074] If the column driver chips are connected in series, the control signal is sent, such as Figure 7 As shown; if the column driver chips are connected in parallel, the control signal is sent, such as Figure 8 shown.

[0075] A column driver chip has many output channels. In order to reduce costs, only the voltage of one output channel is detected each time. There is only one register to store the ADC result, so only one channel can be detected and fed back.

[0076] Multiple column driver chips can be connected in series or in parallel, and are also detected one by one: the controller sends multiple instructions, and each driver chip determines its own instructions according to the sequence, for example: the first instruction is for the first driver, and the second instruction is for the second driver.

[0077] The controller is a receiving card or control chip. The internal digital circuit or software needs to implement the detection algorithm. The following are the detection methods for various faults:

[0078] A row driver chip has multiple channel pins, each channel is connected to a row signal, and multiple row driver chips can output many row signals in parallel. For example: a row driver has 8 channels, and 4 row drivers can output 32 row signals. Row signal 0 corresponds to the output channel 0 of the first row driver; row signal 1 corresponds to the output channel 1 of the first row driver; row signal 2 corresponds to the output channel 2 of the first row driver; row signal 8 corresponds to the output channel 0 of the second row driver.

[0079] One column driver chip has multiple channel pins, each channel is connected to a column signal, and multiple column driver chips can output many column signals in parallel.

[0080] For example: 1 column driver has 16 channels, and 4 column drivers can output 64 column signals; column signal 0 corresponds to output channel 0 of the 1st column driver; column signal 1 corresponds to output channel 1 of the 1st column driver; column signal 2 corresponds to output channel 2 of the 1st column driver; column signal 16 corresponds to output channel 0 of the 2nd column driver.

[0081] For the module with row and column integrated drive, Fig. 9 The row and column signals all come from the row-column integrated drive.

[0082] The common cathode display or common anode display traverses all row signals and column signals: the controller first opens a row drive channel corresponding to a row signal, then opens a column drive channel corresponding to a column signal, and then sends an ADC detection instruction to detect the voltage of the column drive channel, and reads the voltage and saves it to the controller's memory: row signal X, column signal Y, voltage V. In actual operation, multiple column channels can also be opened at one time, and the voltages are detected one by one, and finally the data is obtained, as shown in Table 1, assuming that the row signal is 0~M and the column signal is 0~N.

[0083] Table 1

[0084] Column signal 0 Column signal 1 …… Column signal N row signal 0 Voltage XXX Voltage XXX Voltage XXX row signal 1 Voltage XXX Voltage XXX Voltage XXX …… Line signal M Voltage XXX Voltage XXX Voltage XXX

[0085] The entire algorithm is implemented by the controller's software or hardware, with the goal of distinguishing the types and locations of various faults, thereby providing information for the repair module.

[0086] Furthermore, the fault detection submodule includes: an LED open-short circuit detection unit, which is used to detect whether the LED lamp beads are open or short-circuited; the LED open-short circuit detection unit includes: a common cathode display screen detection subunit, which is used to determine that the LED lamp beads at the intersection of the row signal and the column signal are open or not welded if the voltages of the row signal and the column signal are higher than the open circuit detection voltage; if the voltages of the row signal and the column signal are lower than the short circuit detection voltage, then the LED lamp beads at the intersection of the row signal and the column signal are short-circuited; a common anode display screen detection subunit, which is used to determine that the LED lamp beads at the intersection of the row signal and the column signal are open or not welded if the voltages of the row signal and the column signal are lower than the open circuit detection voltage; if the voltages of the row signal and the column signal are higher than the short circuit detection voltage, then the LED lamp beads at the intersection of the row signal and the column signal are short-circuited.

[0087] (1) Determine whether the LED is open or short-circuited:

[0088] Common cathode display screen: If the voltage of row signal X and column signal Y is higher than the open circuit detection voltage, it can be determined that the LED lamp bead at the intersection of row signal X and column signal Y is open circuit or the lamp bead is not soldered properly. If the voltage of row signal X and column signal Y is lower than the short circuit detection voltage, it can be determined that the LED lamp bead at the intersection of row signal X and column signal Y is short circuited.

[0089] Common anode display: If the voltage of row signal X and column signal Y is lower than the open circuit detection voltage, it can be determined that the LED lamp bead at the intersection of row signal X and column signal Y is open circuit, or the lamp bead is not soldered well.

[0090] If the voltage of the row signal X and the column signal Y is higher than the short-circuit detection voltage, it can be determined that the LED lamp bead at the intersection of the row signal X and the column signal Y is short-circuited.

[0091] Methods for obtaining open circuit detection voltage and short circuit detection voltage:

[0092] Manually detect the modules without problems, traverse all row channels and column channels, and obtain the column channel voltage range when all LED lights are normally lit.

[0093] Common cathode display: open circuit detection voltage = normal column channel maximum voltage + voltage offset, short circuit detection voltage = normal column channel minimum voltage - voltage offset.

[0094] Common anode display: open circuit detection voltage = normal column channel minimum voltage - voltage offset, short circuit detection voltage = normal column channel maximum voltage + voltage offset.

[0095] The voltage offset is not fixed, it can be 0.3V, 0.5V, 0.8V..., as long as it can distinguish between normal voltage and abnormal voltage.

[0096] Furthermore, the fault detection submodule also includes: a channel open circuit detection unit, which is used to determine that the column drive channel corresponding to the column signal is damaged or poorly soldered if all row signals are open circuited with the column signal of the same column; if all column signals are open circuited with the row signal of the same row, it is determined that the row drive channel corresponding to the row signal is damaged or poorly soldered; a channel short circuit detection unit, which is used to determine that the column drive channel corresponding to the column signal is damaged if all row signals are short circuited with the column signal of the same column; if all column signals are short circuited with the row signal of the same row, it is determined that the row drive channel corresponding to the row signal is damaged.

[0097] (2) Determine channel open circuit: If all row signals are open circuited with column signal Y, it can be determined that the column drive channel corresponding to column signal Y is damaged, or the column drive channel is poorly soldered. If all column signals are open circuited with row signal X, it can be determined that the row drive channel corresponding to row signal X is damaged, or the row drive channel is poorly soldered.

[0098] (3) Determine channel short circuit: If all row signals are short-circuited with column signal Y, it can be determined that the column drive channel corresponding to column signal Y is damaged. If all column signals are short-circuited with row signal X, it can be determined that the row drive channel corresponding to row signal X is damaged.

[0099] Note: There are two possibilities for the channel of the driver chip to be damaged. It may be always disconnected or always connected.

[0100] Furthermore, the fault detection submodule also includes: a short-circuit detection unit between adjacent column channels, which is used to determine that there is a short circuit between the channel corresponding to the column signal and the channel corresponding to the adjacent column signal if the voltage between all rows and any column signal is the same as the voltage between adjacent column signals of the column signal; a short-circuit detection unit between adjacent row channels, which is used to determine that there is a short circuit between the channel corresponding to the row signal and the channel corresponding to the adjacent row signal if the voltage between all columns and any row signal is the same as the voltage between adjacent row signals of the row signal.

[0101] (4) Determine whether there is a short circuit between adjacent column channels: If the voltage of the signal Y in all rows and columns in the table is exactly the same as the voltage of the column signal Y+1, it can be determined that there is a short circuit between the column signals Y and Y+1.

[0102] (5) Determine if there is a short circuit between adjacent row channels: If the voltage of all column and row signals X in the table is exactly the same as the voltage of row signal X+1, it can be determined that there is a short circuit between row signals X and X+1.

[0103] Due to the difference in VF voltage of each LED lamp, the possibility of two LEDs having the same voltage is very small, and the probability of two rows of LED lamps in each row or column being the same is basically 0. This situation can only be caused by the short circuit of the two row or column signals themselves due to poor welding.

[0104] Furthermore, the fault detection submodule also includes: a row driver overall damage detection unit, which is used to determine that the row driver chip is damaged as a whole if all row channels of the row driver chip are open; a column driver overall damage detection unit, which is used to send a write instruction to each column driver to write a preset value to a register; then send a read instruction to read the preset value of the register, if the read preset value is not equal to the written preset value, it is determined that the column driver chip is damaged as a whole, or the power pin and the data pin are not welded well; if the read preset value is equal to the written preset value, the column channel is checked, and if all column channels of the column driver chip are open, it is determined that the column driver chip is damaged as a whole.

[0105] (6) Determine whether the row driver is damaged as a whole: If the row driver chip is damaged as a whole, or the power pin and data pin are not soldered properly, all channels of the chip will be open. If all the row channels of a row driver chip are open, it can be determined that the row driver chip is damaged as a whole.

[0106] (7) Determine whether the column driver is damaged as a whole: If the column driver chip is damaged as a whole, or the power and data pins are not properly soldered, the control chip will be unable to read the voltage correctly: the feedback signal is always at a low level, always at a high level, or at a random value. The driver chip sends a write instruction to each column driver to write a value to a certain register; then sends a read instruction to read the value of the register. If the read value is not equal to the written value, it means that the column driver is damaged as a whole, or the power and data pins are not properly soldered. If the read value is equal to the written value, check the column channel again: If all column channels of a column driver chip are open, it can also be determined that the column driver chip is damaged as a whole.

[0107] Furthermore, the fault detection submodule also includes: a row-column integrated driver overall damage detection unit, which is used to send a write instruction to each row-column integrated driver chip, write a preset value to a register, and then send a read instruction to read the preset value of the register. If the read preset value is not equal to the written preset value, it is determined that the row-column integrated driver chip is damaged as a whole, or the power pin and data pin are not welded well; if the read preset value is equal to the written preset value, check the channel, if all row channels of the row-column integrated driver chip are open, or all column channels of the row-column integrated driver chip are open, it is determined that the row-column integrated driver chip is damaged as a whole.

[0108] (8) Determine whether the row-column integrated driver is damaged as a whole: The control chip sends a write instruction to each driver chip to write a value to a certain register; then sends a read instruction to read the value of the register. If the read value is not equal to the written value, it means that the driver chip is damaged as a whole, or the power pin and data pin are not soldered properly. If the read value is equal to the written value, check the channel again: If all the row channels of a driver are open, or all the column channels of a driver are open, it can also be determined that the driver chip is damaged as a whole.

[0109] Furthermore, the voltage detection module includes: a voltage detection submodule, which is used to set an ADC circuit inside the column driver chip or the row-column integrated driver chip, receive an ADC detection instruction, detect the voltage of the channel to be detected, and save the voltage to the ADC result register.

[0110] Furthermore, the voltage detection module further includes: a feedback submodule, which is used to feed back the value of the ADC result register in the voltage detection submodule to the control module.

[0111] The embodiments described above are only descriptions of the preferred embodiments of the present invention and are not intended to limit the scope of the present invention. Without departing from the design spirit of the present invention, various modifications and improvements made to the technical solutions of the present invention by ordinary technicians in this field should all fall within the protection scope determined by the claims of the present invention.

Claims

1. A feedback-based automatic detection system, characterized in that: include: A control module is used to send an ADC detection instruction, obtain a feedback signal of a channel to be detected, and perform fault detection on the channel to be detected based on the value of an ADC result register in the feedback signal; wherein the fault detection includes: LED open-short circuit, channel open circuit, channel short circuit, short circuit between adjacent column channels, short circuit between adjacent row channels, overall damage of row drive, overall damage of column drive, and overall damage of row-column integrated drive; The voltage detection module is used to set an ADC circuit inside the column driver chip, receive the ADC detection instruction, detect the voltage of the channel to be detected, save the voltage to the ADC result register, and feed back the value of the ADC result register to the control module.

2. The automatic detection system based on feedback according to claim 1, characterized in that: The control module comprises: The instruction sending submodule is used to send ADC detection instructions; A feedback receiving submodule, used for receiving a feedback signal from the column driver chip; The fault detection submodule is used to perform fault detection on the channel to be detected based on the value of the ADC result register in the feedback signal.

3. The automatic detection system based on feedback according to claim 2, characterized in that: The fault detection submodule comprises: LED open-short circuit detection unit, used to detect whether the LED lamp bead is open or short-circuited; The LED open-short circuit detection unit comprises: The common cathode display screen detection subunit is used to determine that the LED lamp bead at the intersection of the row signal and the column signal is open or not welded if the voltage of the row signal and the column signal is higher than the open circuit detection voltage; if the voltage of the row signal and the column signal is lower than the short circuit detection voltage, determine that the LED lamp bead at the intersection of the row signal and the column signal is short-circuited; The common anode display screen detection subunit is used to determine that the LED lamp beads at the intersection of the row signal and the column signal are open or not welded if the voltages of the row signal and the column signal are lower than the open circuit detection voltage; if the voltages of the row signal and the column signal are higher than the short circuit detection voltage, then determine that the LED lamp beads at the intersection of the row signal and the column signal are short-circuited.

4. The automatic detection system based on feedback according to claim 2, characterized in that: The fault detection submodule also includes: A channel open circuit detection unit is used to determine that the column drive channel corresponding to the column signal is damaged or poorly soldered if all the row signals are open circuited with the column signal of the same column; if all the column signals are open circuited with the row signal of the same row, then determine that the row drive channel corresponding to the row signal is damaged or poorly soldered; The channel short circuit detection unit is used to determine that the column drive channel corresponding to the column signal is damaged if all the row signals are short-circuited with the column signal of the same column; if all the column signals are short-circuited with the row signal of the same row, it is determined that the row drive channel corresponding to the row signal is damaged.

5. The automatic detection system based on feedback according to claim 2, characterized in that: The fault detection submodule also includes: A short-circuit detection unit between adjacent column channels, used for determining that a channel corresponding to the column signal and a channel corresponding to the adjacent column signal are short-circuited if the voltage between all rows and any column signal is the same as the voltage between adjacent column signals of the column signal; The short circuit detection unit between adjacent row channels is used to determine that there is a short circuit between the channel corresponding to the row signal and the channel corresponding to the adjacent row signal if the voltage between all columns and any row signal is the same as the voltage between the adjacent row signals of the row signal.

6. The automatic detection system based on feedback according to claim 2, characterized in that: The fault detection submodule also includes: A row driver overall damage detection unit, used to determine that the row driver chip is overall damaged if all row channels of the row driver chip are open; The overall column driver damage detection unit is used to send a write instruction to each column driver to write a preset value to a register; then send a read instruction to read the preset value of the register. If the read preset value is not equal to the written preset value, it is determined that the column driver chip is damaged as a whole, or the power pin and the data pin are not welded well; if the read preset value is equal to the written preset value, the column channel is checked. If all the column channels of the column driver chip are open, it is determined that the column driver chip is damaged as a whole.

7. The automatic detection system based on feedback according to claim 2, characterized in that: The fault detection submodule also includes: The row-column integrated driver overall damage detection unit is used to send a write instruction to each row-column integrated driver chip, write a preset value to a register, and then send a read instruction to read the preset value of the register. If the read preset value is not equal to the written preset value, it is determined that the row-column integrated driver chip is damaged as a whole, or the power pin and data pin are not welded well; if the read preset value is equal to the written preset value, check the channel. If all row channels of the row-column integrated driver chip are open, or all column channels of the row-column integrated driver chip are open, it is determined that the row-column integrated driver chip is damaged as a whole.

8. The automatic detection system based on feedback according to claim 1, characterized in that: The voltage detection module comprises: The voltage detection submodule is used to set an ADC circuit inside the column driver chip or the row-column integrated driver chip, receive the ADC detection instruction, detect the voltage of the channel to be detected, and save the voltage to the ADC result register.

9. The automatic detection system based on feedback according to claim 8, characterized in that: The voltage detection module also includes: The feedback submodule is used to feed back the value of the ADC result register in the voltage detection submodule to the control module.

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