Alpha particle measurement device, method, apparatus, storage medium, and program product

Abstract

The invention relates to alpha particle measurement equipment, method and device, a storage medium and a program product. The equipment is formed by surrounding a side wall of the equipment, a cavity top and a cavity bottom; a collector and a cathode are arranged in the cavity; the collector is arranged at the top of the cavity; the cathode is arranged at the bottom of the cavity; the collector is parallel to the cathode; the distance between the collector and the cathode meets a first preset distance; the collector comprises a plurality of first anode wires laid along a first direction and a plurality of second anode wires laid along a second direction; the distance between each first anode wire and each second anode wire in the third direction is a second preset distance, the distance between two adjacent first anode wires in the first direction is a third preset distance, and the distance between two adjacent second anode wires in the second direction is a fourth preset distance. By adopting the method, the accuracy of alpha particle measurement results can be improved.

Description

Technical Field

[0001] The present application relates to the technical field of material detection, and in particular to an alpha particle measurement device, method, apparatus, storage medium and program product. Background Art

[0002] With the development of material detection technology, alpha particle measurement technology has emerged. Alpha particle measurement technology is an indispensable tool in the fields of radiation protection, nuclear material characterization and radioactive waste management. With the increasing requirements for radiation environment monitoring and radioactive material detection, higher requirements are now placed on the accuracy of alpha particle measurement results.

[0003] The current alpha particle measurement technology usually uses an alpha particle measurement ionization chamber as an alpha particle measurement device to measure alpha particles in a sample. However, in the prior art, in the process of measuring alpha particles in a sample, since the collector of the alpha particle measurement device is usually integrated, for example, the current alpha particle measurement device usually uses a flat collector or a cylindrical collector for alpha particle measurement. Obviously, this integrated collector is not conducive to improving the spatial resolution of the alpha particle measurement device, which will lead to a decrease in the accuracy of the alpha particle measurement result. Summary of the invention

[0004] Based on this, it is necessary to provide an alpha particle measurement device, method, apparatus, computer-readable storage medium and computer program product that can improve the accuracy of alpha particle measurement results in response to the above technical problems.

[0005] In a first aspect, the present application provides an alpha particle measuring device, comprising:

[0006] A cavity surrounded by the side walls of the device, the cavity top and the cavity bottom;

[0007] A collector and a cathode are arranged in the cavity; the collector is arranged at the top of the cavity, and the cathode is arranged at the bottom of the cavity; the collector is parallel to the cathode; the distance between the collector and the cathode satisfies a first preset distance; the collector includes a plurality of first anode wires laid along a first direction and a plurality of second anode wires laid along a second direction; the distance between each first anode wire and each second anode wire in the third direction is a second preset distance, the distance between two adjacent first anode wires in the first direction is a third preset distance, and the distance between two adjacent second anode wires in the second direction is a fourth preset distance;

[0008] The collecting electrode is used to collect electrons generated by ionization of the working gas by alpha particles and generate an induction signal; the cathode is used to place the sample to be tested.

[0009] In a second aspect, the present application further provides an alpha particle measurement method, which is applied to the alpha particle measurement device provided in the first aspect of the present application, comprising:

[0010] Place the sample to be tested on the cathode;

[0011] Filling an active gas for ionizing the alpha particles between the collector and the cathode, and forming a voltage difference between the collector and the cathode so that the multiple alpha particles in the cavity ionize the active gas;

[0012] In the ionization process, a plurality of induction signals generated by the electrons generated after the collector ionizes the working gas with each alpha particle are obtained;

[0013] Each sensing signal is analyzed to determine at least one target alpha particle in the sample to be tested.

[0014] In a third aspect, the present application further provides an alpha particle measuring device, which is applied to the alpha particle measuring device provided in the first aspect of the present application, comprising:

[0015] A placement module, used for placing the sample to be tested on the cathode;

[0016] An ionization module, used for filling an active gas for ionizing the alpha particles between the collector and the cathode, and forming a voltage difference between the collector and the cathode so that the multiple alpha particles included in the cavity ionize the active gas;

[0017] An acquisition module is used to acquire multiple induction signals generated by electrons generated by the collector after each alpha particle ionizes the working gas during the ionization process;

[0018] The analysis module is used to analyze each sensing signal and determine at least one target alpha particle in the sample to be tested.

[0019] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements some or all of the steps described in any method of the first aspect of the present application.

[0020] In a fifth aspect, the present application further provides a computer program product, which includes a computer program, and when the computer program is executed by a processor, it implements part or all of the steps described in any method of the first aspect of the embodiment of the present application.

[0021] The above-mentioned alpha particle measurement equipment, method, device, computer-readable storage medium and computer program product, the equipment includes: a cavity surrounded by the side wall of the equipment, the top of the cavity and the bottom of the cavity; a collector and a cathode are arranged in the cavity; the collector is arranged at the top of the cavity, and the cathode is arranged at the bottom of the cavity; the collector is parallel to the cathode; the distance between the collector and the cathode meets the first preset distance; the collector includes a plurality of first anode wires laid along the first direction and a plurality of second anode wires laid along the second direction; the distance between each first anode wire and each second anode wire in the third direction is the second preset distance, the distance between two adjacent first anode wires in the first direction is the third preset distance, and the distance between two adjacent second anode wires in the second direction is the fourth preset distance; wherein the collector is used to collect electrons generated by ionization of the working gas by alpha particles and generate an induction signal; the cathode is used to place the sample to be measured. Since the α particle measurement device provided in the embodiment of the present application has a collector which is an anode wire array composed of a plurality of first anode wires and a plurality of second anode wires, the spatial resolution can be improved by the collector which is an anode wire array, so as to improve the accuracy of the induced signal generated on the collector by the electrons generated after the α particles ionize the active gas, thereby improving the accuracy of the α particle measurement results. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the drawings required for use in the embodiments of the present application or related technical descriptions will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0023] Figure 1 A schematic diagram of the structure of an alpha particle measuring device in one embodiment;

[0024] Figure 2 is a schematic flow chart of an alpha particle measurement method in one embodiment;

[0025] Figure 3 A schematic diagram of the structure of a two-dimensional geometric coordinate area in an embodiment;

[0026] Figure 4 is a signal waveform diagram of a pulse signal corresponding to alpha particles emitted from a sample to be tested in one embodiment;

[0027] Figure 5 is a signal waveform diagram of alpha particles emitted from the top of the cavity (or alpha particles emitted from the collector);

[0028] Figure 6 is a structural block diagram of an alpha particle measuring device in one embodiment;

[0029] Figure 7 is an internal structure diagram of a computer device in one embodiment;

[0030] Figure 8 FIG. 4 is a diagram showing the internal structure of a computer device in another embodiment. DETAILED DESCRIPTION

[0031] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0032] like Figure 1 As shown, the embodiment of the present application provides an alpha particle measurement device, such as Figure 1 (a) shows a front view of the α particle measuring device. Figure 1 (b) shows a side view of the α-particle measuring device. Figure 1 The alpha particle measuring device shown in (a) is described and illustrated, and the alpha particle measuring device includes a cavity surrounded by a side wall of the device, a cavity top and a cavity bottom;

[0033] A collector and a cathode are arranged in the cavity; the collector is arranged at the top of the cavity, and the cathode is arranged at the bottom of the cavity; the collector is parallel to the cathode; the distance between the collector and the cathode satisfies a first preset distance; the collector includes a plurality of first anode wires laid along a first direction and a plurality of second anode wires laid along a second direction; the distance between each first anode wire and each second anode wire in the third direction is a second preset distance, the distance between two adjacent first anode wires in the first direction is a third preset distance, and the distance between two adjacent second anode wires in the second direction is a fourth preset distance;

[0034] The collecting electrode is used to collect electrons generated by ionization of the working gas by alpha particles and generate an induction signal; the cathode is used to place the sample to be tested.

[0035] Among them, the alpha particle measurement equipment is an ionization chamber used to measure the alpha particles in the sample to be measured. Alpha particles are radioactive particles. When there is an electric field between the collector and the cathode, the alpha particles ionize the working gas along the trajectory of movement, so that the working gas produces electron-ion pairs, and the electrons in the electron-ion pairs produced by the working gas move toward the collector under the action of the electric field.

[0036] The working gas is used to ionize with the alpha particles in the cavity when an electric field exists between the collector and the cathode, so that after the alpha particles ionize the working gas, the working gas generates electrons moving toward the collector. Optionally, the working gas can be an inert gas or P10 gas (90% argon + 10% methane) or other gases.

[0037] Specifically, by applying voltage to the collector, a voltage difference can be formed between the collector and the cathode, and a uniform electric field is formed between the collector and the cathode, which are parallel to each other, so that alpha particles can ionize the active gas in the cavity.

[0038] The sidewall is the vertical part of the cavity. It is located on both sides of the collector and cathode. The sidewall is perpendicular to the cavity top, collector, cathode, and cavity bottom. In the alpha particle measurement equipment, the sidewall supports and protects the internal space of the cavity. The sidewall can also block external interference from outside the ionization chamber to ensure the stability of the internal environment of the cavity.

[0039] The top of the cavity is the upper cover of the cavity. The top of the cavity corresponds to the collector. The top of the cavity is parallel to the collector, cathode, and bottom of the cavity. In the alpha particle measurement device, the top of the cavity is used to ensure the uniformity of the electric field formed in the cavity.

[0040] The bottom of the cavity is the lower part of the cavity, and the bottom of the cavity corresponds to the cathode. The design of the bottom of the cavity needs to ensure that the sample to be tested can be placed stably on the cathode and allow alpha particles to be emitted from the sample to be tested to smoothly enter the measurement range. The measurement range is the collectible area where the electrons generated after the alpha particles ionize the working gas can be collected. It is easy to understand that the measurement range is a part of the cavity, that is, the space range formed between the plane where the collector is located and the plane where the cathode is located. The volume size corresponding to the measurement range is called the sensitive volume.

[0041] like Figure 1 As shown, the first preset distance is represented as D. Optionally, the first preset distance may be a sufficiently large distance, so that the distance between the collector and the cathode is sufficiently large to ensure that the collector can accurately collect the electrons generated by the alpha particles generated by the cathode after the alpha particles ionize the working gas. For example, the first preset distance may be a first preset multiple of the maximum range of the highest energy alpha particles within the measurement range, and the first preset multiple may be 3 times, 4 times, or other multiples.

[0042] Specifically, since the collector includes a plurality of first anode wires laid along a first direction and a plurality of second anode wires laid along a second direction, the collector is an anode wire array.

[0043] Optionally, the first direction may be a horizontal direction, and the second direction and the third direction may intersect with the first direction respectively; when the first direction is a horizontal direction, the second direction may be a direction on a horizontal plane perpendicular to the first direction, and the third direction may be a vertical direction perpendicular to the horizontal plane. In other words, the first direction, the second direction, and the third direction may be perpendicular to each other. It is easy to understand that the first direction may be a length direction of the alpha particle measuring device, the second direction may be a width direction of the alpha particle measuring device, and the third direction may be a height direction of the alpha particle measuring device.

[0044] Optionally, the third preset distance and the fourth preset distance may be the same or different.

[0045] like Figure 1 As shown in (a), the second preset distance is represented by σ, and the third preset distance is represented by δ1, as shown in Figure 1 As shown in (b), the fourth preset distance is expressed as δ2. Optionally, the sizes of the second preset distance, the third preset distance and the fourth preset distance can be determined according to the area size of the collector. Exemplarily, when the area of ​​the collector is 40cm*40cm, the second preset distance can be 0.5cm, the third preset distance can be 0.5cm, and the fourth preset distance can be 0.5cm. The sizes of the third preset distance and the fourth preset distance are negatively correlated with the spatial resolution of the collector, that is, the smaller the distance between the two adjacent and parallel first anode wires, the higher the spatial resolution of the collector. Similarly, the smaller the distance between the two adjacent and parallel second anode wires, the higher the spatial resolution of the collector.

[0046] Optionally, each first anode wire can be arranged on the side of the collector closer to the cathode, or each second anode wire can be arranged on the side closer to the cathode. It only needs to ensure that the distance between each first anode wire and each second anode wire in the third direction is the second preset distance, and there is no limitation here.

[0047] The sample to be tested refers to a substance that needs to be measured for radioactivity or material analysis or other purposes by the alpha particle measurement device. Optionally, the sample to be tested can be in the form of solid, liquid or packaged gas, and the form of the sample to be tested depends on the alpha particle measurement requirements and the properties of the sample to be tested. The size and shape of the sample to be tested should be suitable for being placed on the cathode for accurate measurement.

[0048] In the above-mentioned α particle measurement device, the device includes: a cavity surrounded by the side wall of the device, the top of the cavity and the bottom of the cavity; a collector and a cathode are arranged in the cavity; the collector is arranged at the top of the cavity, and the cathode is arranged at the bottom of the cavity; the collector is parallel to the cathode; the distance between the collector and the cathode meets the first preset distance; the collector includes a plurality of first anode wires laid along the first direction and a plurality of second anode wires laid along the second direction; the distance between each first anode wire and each second anode wire in the third direction is the second preset distance, the distance between two adjacent first anode wires in the first direction is the third preset distance, and the distance between two adjacent second anode wires in the second direction is the fourth preset distance; wherein the collector is used to collect electrons generated by ionization of the working gas by α particles and generate an induction signal; the cathode is used to place the sample to be measured. Since the α particle measurement device provided in the embodiment of the present application has a collector which is an anode wire array composed of a plurality of first anode wires and a plurality of second anode wires, the spatial resolution can be improved by the collector which is an anode wire array, so as to improve the accuracy of the induced signal generated on the collector by the electrons generated after the α particles ionize the active gas, thereby improving the accuracy of the α particle measurement results.

[0049] In an exemplary embodiment, a protective electrode is also provided in the cavity; the protective electrode is provided at the top of the cavity; the protective electrode is parallel to the cathode, and the collecting electrode and the protective electrode are at the same potential; the protective electrode is arranged around the collecting electrode, and the width of the protective electrode in the first direction and the second direction is greater than the maximum range of the highest energy alpha particles within the measuring range; the protective electrode is used to collect electrons generated after the alpha particles generated by the side walls ionize the working gas.

[0050] The area of ​​the collecting electrode is much larger than that of the protecting electrode, and there is a certain spacing distance between the collecting electrode and the protecting electrode, that is, there is no electrical short circuit between the collecting electrode and the protecting electrode, and the setting of the spacing distance makes it possible to have a clear separation boundary between the electric field of the collecting electrode and the electric field of the protecting electrode, thereby avoiding the undesirable situation that the different induced signals collected by the two electric fields interfere with each other. Optionally, the spacing distance between the collecting electrode and the protecting electrode can be 1 cm.

[0051] Specifically, the protective electrode is arranged around the collecting electrode, and the width of the protective electrode in the first direction and the second direction is greater than the maximum range of the highest energy alpha particle within the measurement range. Therefore, during the alpha particle measurement process, even if alpha particles are ejected from the side wall and move toward the collecting electrode, the alpha particles on the side wall will first pass through the area covered by the protective electrode during the movement toward the collecting electrode, and due to the width setting of the protective electrode in the first direction and the second direction, the range of the alpha particles ejected from the side wall cannot exceed the area covered by the protective electrode. Therefore, the electrons generated by the alpha particles ejected from the side wall after ionizing the working gas will be collected by the protective electrode, but not by the collecting electrode. Based on this, since the electrons generated by the alpha particles ejected from the side wall after ionizing the working gas will no longer generate an induction signal on the collecting electrode, the existence of the protective electrode can prevent the alpha particles ejected from the side wall from affecting the alpha particle measurement result of the sample to be measured.

[0052] Optionally, when an electric field exists between the collector and the cathode, the protective electrode can also be used to correct the degree of distortion of the electric field between the collector and the cathode.

[0053] Specifically, the collector and the protective electrode are arranged at the top of the cavity, which means that the collector and the protective electrode are arranged at the side of the top of the cavity facing the cathode, and there is a certain distance between the collector and the protective electrode; similarly, the cathode is arranged at the bottom of the cavity, which means that the cathode is arranged at the side of the bottom of the cavity facing the collector, and there is a certain distance between the cathode and the bottom of the cavity. Optionally, the collector and the protective electrode are arranged at the top of the cavity but have no physical contact with the top of the cavity.

[0054] Specifically, the collector and the guard are at the same potential, which means that the collector and the guard are connected to independent output ports of the same voltage source or the same potential output ports of different voltage sources, and the collector and the guard have the same voltage relative to other parts (such as the cathode) in the chamber. The collector and the guard are at the same potential in order to ensure that the guard can effectively collect the electrons generated by the alpha particles generated by the side wall ionizing the working gas, and at the same time, avoid generating an additional electric field between the collector and the guard that may interfere with the alpha particle measurement process.

[0055] Specifically, the α particles in the cavity may include α particles generated by the sample to be tested, the side wall, the cathode, the top of the cavity and the collector. It should be noted that the sample to be tested placed on the cathode is usually an electronic material, and because the sample to be tested has a certain thickness and density, the α particles emitted in the cathode portion covered by the sample to be tested cannot penetrate the sample to be tested. Therefore, the α particle background in the cathode portion covered by the sample to be tested has a negligible effect on the α particle measurement result obtained in this embodiment. At the same time, since the protective electrode collects the α particles generated by the side wall, the collector can collect the electrons generated by the α particles generated by the sample to be tested, the cathode portion not covered by the sample to be tested, the top of the cavity and the collector after ionizing the working gas and generate an induction signal.

[0056] The electrons generated by the ionization of the working gas by the alpha particles within the measurement range (or within the sensitive volume) can generate an induction signal on the collector. The maximum range of the highest energy alpha particles within the measurement range refers to the farthest distance that the alpha particles can penetrate within the measurement range and in a specific working gas. The maximum range is determined based on the energy of the alpha particles when they are emitted and the type of the working gas. Exemplarily, for alpha particles with a maximum energy of 10MeV within the measurement range, the maximum range in argon does not exceed 5cm. At this time, the width of the protective electrode in the first direction and the second direction should be set to 5cm or more, so that the electrons generated by the ionization of the working gas by the alpha particles emitted from the side wall will not generate an induction signal on the collector, thereby significantly reducing the measurement background of alpha particles generated by the side wall.

[0057] Specifically, since the collecting electrode is parallel to the cathode, each first anode wire and each second anode wire are respectively parallel to the cathode; similarly, since the collecting electrode and the protective electrode are at the same potential, each first anode wire and each second anode wire are respectively at the same potential as the protective electrode.

[0058] In the present embodiment, since a protective electrode is also provided in the cavity, and the width of the protective electrode surrounding the collecting electrode in the first direction and the second direction is greater than the maximum range of the highest energy α particles within the measuring range, the protective electrode can fully collect the electrons generated by the α particles generated by the side walls that ionize the active gas, thereby avoiding the influence of the α particles generated by the side walls on the α particle measurement results, and thus can improve the accuracy of the α particle measurement results.

[0059] In an exemplary embodiment, the cavity is provided with a hatch;

[0060] When the hatch is in an open state, the sample to be tested passes through the hatch and is placed on the cathode;

[0061] When the hatch is in a closed state, an active gas for ionizing alpha particles is filled between the collector and the cathode.

[0062] The hatch is a component used to close or open the ionization chamber cavity in the alpha particle measurement device, thereby protecting the internal environment of the cavity from external factors during the alpha particle measurement process, and also facilitating the placement or replacement of the sample to be measured. Optionally, the hatch can be set at the bottom of the cavity or at the top of the cavity.

[0063] Based on Figure 1 The alpha particle measuring device shown in the figure, the embodiment of the present application provides an alpha particle measuring method. In an exemplary embodiment, as Figure 2 As shown, a method for measuring alpha particles is provided, which can be applied to Figure 1 The alpha particle measuring device in the embodiment is taken as an example to illustrate, and the method includes the following steps 202 to 208. Among them:

[0064] Step 202: placing the sample to be tested on the cathode.

[0065] The cathode may include a placement area, so that placing the sample to be tested on the cathode is actually equivalent to placing the sample to be tested on the placement area of ​​the cathode.

[0066] Specifically, in the process of placing the sample to be tested on the cathode, the cleanliness of the surface of the cathode on which the sample to be tested is placed should be ensured to avoid the presence of excess impurities on the cathode that may affect the accuracy of the alpha particle measurement result.

[0067] Step 204 , filling an active gas for ionizing the α particles between the collector and the cathode, and forming a voltage difference between the collector and the cathode so that the multiple α particles in the cavity ionize the active gas.

[0068] Among them, in the process of filling the working gas for ionizing with alpha particles between the collector and the cathode, it should be ensured that the working gas filled between the collector and the cathode must be a pure gas, that is, it does not contain unnecessary impurities such as oxygen, air or water vapor, so as to ensure that the working gas has a stable state, thereby ensuring the accuracy of the alpha particle measurement results.

[0069] Specifically, the multiple α particles included in the cavity include α particles generated by the side wall, the cavity top, the collector, the cathode and α particles generated by the sample to be tested.

[0070] Specifically, in the process of forming a voltage difference between the collector and the cathode, it should be ensured that the working state of the voltage source used to form the voltage difference between the collector and the cathode is stable, and the adverse effects of the lack of stability of the voltage source due to temperature changes, vibration or other environmental factors should be avoided. By ensuring the stability of the electric field between the collector and the cathode, the reliability of the ionization process is ensured, thereby ensuring the accuracy of the alpha particle measurement results.

[0071] Step 206 , during the ionization process, a plurality of induction signals generated by the electrons generated by the collector after the α particles ionize the working gas are obtained.

[0072] Among them, multiple induction signals are generated by the electrons generated by the collector after the alpha particles generated by the sample to be tested, the cathode part area not covered by the sample to be tested, the side wall and the top of the cavity ionize the working gas.

[0073] It should be noted that, during the radioactive decay process, an atomic nucleus decays into another atomic nucleus through the α decay process and emits an α particle, and each α decay involves only one α particle. Therefore, although the sample to be tested includes multiple α particles, the emission of the α particles of the sample to be tested is single. In other words, among the multiple induction signals generated at the same time, there is only an induction signal corresponding to the α particle of the sample to be tested.

[0074] In an exemplary embodiment, when the collector includes a plurality of first anode wires laid along a first direction and a plurality of second anode wires laid along a second direction, the induction signal generated by the collector for electrons generated after each alpha particle ionizes the active gas is jointly generated by each first anode wire and each second anode wire.

[0075] The sensing signal is obtained by digitally integrating and summing the signals of all anode wires including the plurality of first anode wires and the plurality of second anode wires in time sequence. For example, the signal on the i-th first anode wire of the α particle is represented as a i , the signal of the α particle on the jth second anode wire is represented as a j , the total number of the first anode wires is represented as m, the total number of the second anode wires is represented as n, and the energy value of the induced signal generated by the electrons generated after a certain α particle ionizes the working gas is represented as M, then the calculation formula of M can be expressed as:

[0076]

[0077] Step 208: Analyze each sensing signal to determine at least one target alpha particle in the sample to be tested.

[0078] The target α particles are α particles generated by the sample to be tested, that is, the target α particles are α particles whose emission positions are located in the sample to be tested.

[0079] It is easy to understand that in the ionization process of step 206, the multiple induction signals obtained from the collecting electrode are multiple induction signals at different times. Therefore, the multiple induction signals include the induction signal corresponding to at least one target alpha particle emitted by the sample to be tested at different times. Therefore, in step 208, at least one target alpha particle in the sample to be tested can be determined by analyzing each induction signal.

[0080] In an exemplary embodiment, the above-mentioned analysis of each sensing signal to determine at least one target alpha particle in the sample to be tested includes: filtering each sensing signal to obtain each filtered sensing signal; analyzing each filtered sensing signal to determine at least one target alpha particle in the sample to be tested.

[0081] Optionally, each sensing signal may be filtered based on a filter, and the filter may be a low-pass filter, a high-pass filter, a band-pass filter or other filters. By filtering each sensing signal, noise in each sensing signal can be filtered out to obtain more accurate filtered sensing signals, thereby ensuring the accuracy of the alpha particle measurement results.

[0082] In an exemplary embodiment, the above-mentioned analysis of each sensing signal to determine at least one target alpha particle in the sample to be tested includes: analyzing each sensing signal to determine at least one target sensing signal that meets a preset amplitude condition; determining the number and energy value of at least one target alpha particle in the sample to be tested based on the at least one target sensing signal; and obtaining an energy spectrum of at least one target alpha particle based on the number and energy value of the at least one target alpha particle.

[0083] The energy spectrum of the target alpha particles is used to characterize the number of alpha particles of various energy values ​​in the sample to be tested.

[0084] In the above-mentioned α-particle measurement method, applied to any α-particle measurement device provided in the embodiment of the present application, the sample to be measured is placed on the cathode; an active gas for ionizing the α-particles is filled between the collector and the cathode, and a voltage difference is formed between the collector and the cathode so that the multiple α-particles included in the cavity ionize the active gas; in the ionization process, multiple induction signals generated by the collector for the electrons generated after the α-particles ionize the active gas are obtained; each induction signal is analyzed to determine at least one target α-particle in the sample to be measured. By adopting the α-particle measurement method provided in the embodiment of the present application, on the basis of an α-particle measurement device having a specific structure and high spatial resolution, multiple induction signals with high accuracy generated by the collector can be obtained, and at the same time, by analyzing each induction signal, the α-particles located in the sample to be measured can be accurately measured, thereby improving the accuracy of the α-particle measurement results.

[0085] In an exemplary embodiment, the method further includes:

[0086] The electrons generated by the ionization of the working gas by the alpha particles generated by the side wall are collected by the guard electrode of the alpha particle measurement device.

[0087] Among them, since the electrons generated after the α particles generated by the side wall ionize the working gas will be collected by the protective electrode, therefore, in this embodiment, during the ionization process, the multiple induction signals generated by the collecting electrode for the electrons generated after the α particles ionize the working gas do not include the induction signals corresponding to the α particles generated by the side wall. That is to say, under the action of the protective electrode, the multiple induction signals generated by the collecting electrode only include the induction signals generated by the sample to be tested, the cathode part area not covered by the sample to be tested, and the electrons generated after the α particles generated by the top of the cavity ionize the working gas.

[0088] In this embodiment, the electrons generated after the ionization of the working gas by the alpha particles generated by the side wall are collected through the protective electrode of the alpha particle measuring device. Therefore, the alpha particle measurement method provided in the embodiment of the present application can avoid that at least one target alpha particle in the sample to be tested includes alpha particles generated by the side wall, thereby improving the accuracy of the alpha particle measurement results.

[0089] In an exemplary embodiment, the above analysis of each sensing signal to determine at least one target alpha particle in the sample to be tested includes:

[0090] Perform amplitude analysis and time analysis on each sensing signal to determine the emission position of the alpha particles corresponding to each sensing signal;

[0091] At least one alpha particle whose projection point of the emission position along the third direction is located in the two-dimensional geometric coordinate area is determined as at least one target alpha particle.

[0092] The two-dimensional geometric coordinate area refers to a plane area in the cathode used to locate and analyze the sample to be tested. The sample to be tested corresponds to the two-dimensional geometric coordinate area, and the position of the sample to be tested can be determined by an image optical recognition algorithm.

[0093] Specifically, amplitude analysis and time analysis are performed on each sensing signal to determine the emission position of the alpha particle corresponding to each sensing signal. Specifically, first, amplitude analysis is performed on each sensing signal to determine the position of the electron corresponding to the alpha particle in the first direction and the position in the second direction, and then the movement speed of the electron in the cavity is determined by the electric field strength and the type of active gas. Combined with time analysis of each sensing signal, the movement time consumed by the electron corresponding to each sensing signal from emission to arrival at the collector is determined. Therefore, since the electron is generated under the ionization effect of the alpha particle, based on the position of the electron in the first direction, the position in the second direction, the movement speed and the movement time, the emission position of the alpha particle corresponding to each sensing signal can be determined by the kinematic principle.

[0094] Specifically, when the third direction is the vertical direction, the projection point of the emission position along the third direction refers to the projection point position of the emission position of the alpha particle in the vertical direction (i.e., the third direction) when the human eye observes downward from the top of the alpha particle measuring device. The alpha particle whose projection point position of the emission position in the vertical direction is located at the upper position of the two-dimensional geometric coordinate area, that is, the emission position is located as follows: Figure 1 In the three-dimensional geometric coordinate region shown, since the sample to be tested is located in the two-dimensional geometric coordinate region, it is easy to understand that at this time, it can be determined that the α particle whose projection point position of the emission position in the vertical direction is located in the two-dimensional geometric coordinate region is the target α particle emitted from the sample to be tested. Based on this, the α particles in the sample to be tested can be determined more accurately. In other words, by analyzing the projection point position of the α particle in the vertical direction, we can determine whether the α particle originates from the sample to be tested, thereby performing a more accurate analysis of the α particles in the sample to be tested.

[0095] In this embodiment, the amplitude analysis and time analysis are performed on each sensing signal to determine the emission position of the α particles corresponding to each sensing signal, thereby more accurately determining the target α particles at the emission position in the sample to be tested, and further avoiding the influence of the α particle background generated by the cathode part area not covered by the sample to be tested on the α particle measurement result.

[0096] In an exemplary embodiment, placing the sample to be tested on the cathode includes:

[0097] Acquire image data of the sample to be tested based on a camera device;

[0098] The sample to be tested is placed on the cathode, and the two-dimensional geometric coordinate area corresponding to the sample to be tested is determined based on the image data of the sample to be tested.

[0099] The imaging device may be located outside the α-particle measuring equipment, and the imaging device may be a camera.

[0100] For example, Figure 3 As shown, this is a top view from the collector toward the cathode. The sample to be tested is placed on the cathode, and the two-dimensional geometric coordinate area corresponding to the sample to be tested is determined based on the image data of the sample to be tested. The two-dimensional geometric coordinate area can be understood as the area where the sample to be tested is located.

[0101] Optionally, the image data of the sample to be tested may include the size and shape of the sample to be tested.

[0102] In this embodiment, image data of the sample to be tested is acquired by a camera device. After the sample to be tested is placed on the cathode, the two-dimensional geometric coordinate area corresponding to the sample to be tested is determined based on the image data of the sample to be tested. Thus, when the emission position of the α particle is subsequently determined to judge whether it is the target α particle in the sample to be tested, higher judgment accuracy can be achieved, thereby improving the accuracy of the α particle measurement results.

[0103] Based on the above embodiments, it can be known that the collector will ionize the alpha particles generated by the sample to be tested, the top of the cavity and the collector itself to generate electrons, and these electrons will generate induction signals on the collector. Figure 1 It can be seen that in the working gas, the distance that the electrons generated by ionization of α particles located in the sample to be tested move to the collector, and the distance that the electrons generated by ionization of α particles located at the top of the cavity (or at the collector) move to the collector, have a certain difference, and the former is much greater than the latter.

[0104] Based on this, it is easy to understand that the pulse signal rise time and signal amplitude of the induced signal generated on the collector by the electrons generated after the α particles of the sample to be tested ionize the working gas will be much larger than the pulse signal rise time and signal amplitude of the induced signal generated on the collector by the electrons generated after the α particles at the top of the cavity and the α particles at the collector ionize the working gas.

[0105] like Figure 1 As shown in the figure, the α particles located in the top of the cavity and ejected from the top of the cavity and the α particles located in the collector and ejected from the collector are represented as α c , the α particles located in the sample to be tested and ejected from the sample to be tested are represented as α s, the alpha particles α ejected from the top of the cavity c and the α particles α located at the collector and ejected from the collector c The pulse signal rise time is expressed as t c , the alpha particles α ejected from the top of the cavity c and the α particles α located at the collector and ejected from the collector c The signal amplitude is represented by S cMax , the α particles α emitted from the sample to be tested s The pulse signal rise time is expressed as t s , the α particles α emitted from the sample to be tested s The signal amplitude is represented by S sMax , the sensitive volume is represented by V, the distance between the collector and the cathode is represented by D, and the mobility of electrons in the working gas is represented by μ e , the number of electrons produced by ionization in the ionization trajectory is represented by N, the charge of the electron is represented by e, and e = 1.6×10 -19 C, the capacitance in the cavity is expressed as C f , will be emitted from the top of the cavity (or from the collector) c The distance that the electron moves to the collector is denoted as d. c , will be emitted from the sample to be tested α particles α s The distance that the electron moves to the collector is denoted as d. s , then based on the electromagnetic principle and the principle of motion, we know that the α particle α ejected from the top of the cavity c and the α particles α located at the collector and ejected from the collector c The pulse signal rise time t c The calculation formula is as follows:

[0106]

[0107] Alpha particles α ejected from the top of the cavity c and the α particles α located at the collector and ejected from the collector c The signal amplitude S cMax The calculation formula is as follows:

[0108]

[0109] Alpha particles α ejected from the sample to be tested s The pulse signal rise time t s The calculation formula is as follows:

[0110]

[0111] Alpha particles α ejected from the sample to be tested sThe signal amplitude S sMax The calculation formula is as follows:

[0112]

[0113] Based on the above calculation formula, it can be seen that the pulse signal rise time and signal amplitude of the induced signal generated by the electrons generated by the α particles of the sample to be tested after ionizing the working gas on the collector will be much larger than the pulse signal rise time and signal amplitude of the induced signal generated by the electrons generated by the α particles at the top of the cavity after ionizing the working gas on the collector. Next, the difference between the pulse signal rise time and signal amplitude of the two can be intuitively identified by referring to the induced signal of the guard electrode, such as Figure 4 The figure shows the induction signal generated by the electrons generated by the ionization of the working gas by the α particles of the sample to be tested on the collector. Figure 5 The figure shows the induction signal generated by the electrons generated by the ionization of the working gas by the α particles at the top of the cavity on the collector. Figure 4 and Figure 5 The horizontal axis represents the time axis (μs) and the vertical axis represents the signal amplitude of the pulse signal. Figure 4 and Figure 5 The A curve in the figure is the induction signal of the collector. Figure 4 and Figure 5 The curve B in the figure is the induction signal of the guard electrode used as a comparative reference. It can be seen that by analyzing the pulse signal rise time and signal amplitude of the α particles, the α particles emitted from the sample to be tested can be identified and distinguished from a large number of pulse signals. Thus, by screening out the α particles emitted from the sample to be tested, the interference effect of the α particle background emitted from the top of the cavity and the α particle background emitted from the collector electrode on the α ion measurement results can be significantly reduced.

[0114] Based on this, in order to reduce the interference effect of the α particle background emitted from the top of the cavity and the α particle background located at the collector and emitted from the collector on the α ion measurement result, in an exemplary embodiment, the above-mentioned analysis of each sensing signal to determine at least one target α particle in the sample to be tested includes:

[0115] Perform amplitude analysis and time analysis on each sensing signal to determine the signal amplitude and pulse signal rise time corresponding to each sensing signal;

[0116] An alpha particle corresponding to an induction signal whose signal amplitude satisfies a preset threshold condition and whose pulse signal rise time satisfies a preset time condition is determined as at least one target alpha particle.

[0117] The signal amplitude refers to the peak value of the sensing signal in amplitude, that is, the maximum intensity value of the sensing signal.

[0118] The signal amplitude satisfies the preset amplitude condition, which may mean that the signal amplitude is greater than or equal to the preset amplitude threshold, so that the alpha particles corresponding to the induction signal whose signal amplitude is greater than or equal to the preset amplitude threshold and whose pulse signal rise time satisfies the preset time condition will be determined as the target alpha particles in the sample to be tested. The size of the preset amplitude threshold should be sufficient to distinguish the alpha particles emitted from the top of the cavity, the alpha particles emitted from the collector, and the alpha particles emitted from the sample to be tested, that is, the size of the preset amplitude threshold should be between the signal amplitude of the pulse signal corresponding to the alpha particles emitted from the top of the cavity (or the alpha particles emitted from the collector) and the signal amplitude of the pulse signal corresponding to the alpha particles emitted from the sample to be tested.

[0119] For example, based on Figure 4 It can be seen that the signal amplitude of the pulse signal corresponding to the α particles emitted from the sample to be tested is greater than 4700. Figure 5 It can be seen that the signal amplitude of the pulse signal corresponding to the α particles emitted from the top of the cavity (or the α particles emitted from the collector) is approximately 3700. Therefore, the preset amplitude threshold can be determined as a value between [3700, 4700].

[0120] The pulse signal rise time refers to the time required for the induction signal to reach its signal amplitude from the beginning of its appearance. The pulse signal rise time can reflect the time required for electrons to reach the collector from the generation point under the action of the electric field.

[0121] The pulse signal rise time satisfies the preset time condition, which may mean that the pulse signal rise time is greater than or equal to the preset time threshold, so that the alpha particles corresponding to the induction signal whose signal amplitude satisfies the preset threshold condition and whose pulse signal rise time is greater than or equal to the preset time threshold will be determined as the target alpha particles in the sample to be tested. The size of the preset time threshold should be sufficient to distinguish the alpha particles emitted from the top of the cavity, the alpha particles emitted from the collector, and the alpha particles emitted from the sample to be tested, that is, the size of the preset time threshold should be between the pulse signal rise time corresponding to the alpha particles emitted from the top of the cavity (or the alpha particles emitted from the collector) and the pulse signal rise time corresponding to the alpha particles emitted from the sample to be tested.

[0122] In this embodiment, by performing amplitude analysis and time analysis on each sensing signal, at least one alpha particle of the sensing signal whose signal amplitude satisfies a preset amplitude condition and whose pulse signal rise time satisfies a preset time condition is determined as at least one target alpha particle in the sample to be tested, thereby accurately distinguishing from each sensing signal the alpha particles emitted from the top of the cavity, the alpha particles emitted from the collector, and the alpha particles emitted from the sample to be tested through the signal amplitude and the pulse signal rise time, and further, the alpha particles emitted from the top of the cavity and the alpha particles emitted from the collector can be screened out through the signal amplitude and the pulse signal rise time, further ensuring that the at least one target alpha particle determined is an alpha particle in the sample to be tested, and further improving the accuracy of the alpha particle measurement result.

[0123] In an exemplary embodiment, determining at least one alpha particle whose projection point of the emission position along the third direction is located in the two-dimensional geometric coordinate area as at least one target alpha particle includes:

[0124] An alpha particle corresponding to an induction signal whose projection point along the third direction of the emission position is located in a two-dimensional geometric coordinate area, whose signal amplitude meets a preset threshold condition, and whose pulse signal rise time meets a preset time condition is determined as at least one target alpha particle.

[0125] In this embodiment, after performing amplitude analysis and time analysis on each sensing signal to determine the emission position of the alpha particle corresponding to each sensing signal, among at least one alpha particle whose projection point along the third direction of the emission position is located in the two-dimensional geometric coordinate area, it is further determined that at least one alpha particle corresponding to the sensing signal whose signal amplitude satisfies a preset threshold condition and whose pulse signal rise time satisfies a preset time condition is at least one target alpha particle, thereby being able to screen out alpha particles generated in the cathode portion that is not covered by the sample to be tested through the emission position, further ensuring that the at least one target alpha particle determined is an alpha particle in the sample to be tested, thereby further improving the accuracy of the alpha particle measurement result.

[0126] In an exemplary embodiment, the amplitude analysis and time analysis of each sensing signal to determine the emission position of the alpha particle corresponding to each sensing signal includes:

[0127] Perform amplitude analysis and time analysis on each induced signal to determine the emission positions of multiple electrons generated after each alpha particle ionizes the active gas;

[0128] Determine the emission position of the alpha particles corresponding to each induction signal based on the emission positions of multiple electrons generated after each alpha particle ionizes the working gas;

[0129] After determining at least one alpha particle whose projection point of the emission position along the third direction is located in the two-dimensional geometric coordinate area as at least one target alpha particle, the method further includes:

[0130] The emission positions of multiple electrons generated after each target alpha particle ionizes the working gas are connected to obtain a motion trajectory of at least one target alpha particle in the cavity.

[0131] Specifically, time analysis of each induction signal refers to measuring the time taken for multiple electrons to reach different first anode wires or second anode wires to infer the emission positions of multiple electrons generated after the α particles of each induction signal ionize the working gas. Thus, based on the emission positions of multiple electrons generated after each α particle ionizes the working gas, the emission positions of the α particles corresponding to each induction signal can be further determined based on the kinematic principle.

[0132] In this embodiment, after at least one target alpha particle is determined based on the emission position, the emission positions of multiple electrons generated after each target alpha particle ionizes the working gas are connected, so that the motion trajectory of at least one target alpha particle in the cavity can be obtained, allowing researchers to better study and understand the motion law of at least one target alpha particle in the electromagnetic field in the cavity.

[0133] In an exemplary embodiment, in the ionization process, obtaining a plurality of induction signals generated by the electrons generated by the collector after each alpha particle ionizes the working gas includes:

[0134] In the ionization process, a plurality of initial induction signals generated by the electrons generated after the collector ionizes the working gas with each alpha particle are obtained;

[0135] Each initial sensing signal is amplified to obtain a plurality of sensing signals.

[0136] Among them, each initial sensing signal can be amplified based on a signal amplifier to obtain multiple sensing signals. The signal amplifier can be a linear amplifier, a logarithmic amplifier or other amplifiers that can amplify the signal.

[0137] In the present embodiment, by performing signal amplification processing on a plurality of initial induction signals generated by electrons produced after each α particle ionizes the acting gas, the obtained plurality of induction signals can have a higher signal quality, thereby avoiding undesirable problems such as unclear signals caused by a small output signal in the collector, and ensuring that when analyzing each induction signal, at least one target α particle in the sample to be tested can be accurately determined based on the high-quality induction signal.

[0138] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0139] Based on the same inventive concept, the embodiment of the present application also provides an alpha particle measuring device for implementing the alpha particle measuring method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more alpha particle measuring device embodiments provided below can refer to the limitations of the alpha particle measuring method above, and will not be repeated here.

[0140] In an exemplary embodiment, Figure 6 As shown, an alpha particle measuring device is provided, which is applied to any alpha particle measuring device provided in the embodiment of the present application, including: a placement module 602, an ionization module 604, an acquisition module 606 and an analysis module 608, wherein:

[0141] The placement module 602 is used to place the sample to be tested on the cathode.

[0142] The ionization module 604 is used to fill the working gas for ionizing the α particles between the collector and the cathode, and form a voltage difference between the collector and the cathode so that the multiple α particles included in the cavity ionize the working gas.

[0143] The acquisition module 606 is used to acquire, during the ionization process, a plurality of induction signals generated by the electrons generated by the collector after each α particle ionizes the active gas.

[0144] The analysis module 608 is used to analyze each sensing signal and determine at least one target alpha particle in the sample to be tested.

[0145] In an exemplary embodiment, the acquisition module 606 is also used to collect electrons generated by ionizing the active gas through the protective electrode of the alpha particle measurement device.

[0146] In an exemplary embodiment, the above-mentioned analysis module 608 is also used to perform amplitude analysis and time analysis on each sensing signal to determine the emission position of the alpha particle corresponding to each sensing signal; and determine at least one alpha particle whose projection point of the emission position along the third direction is located in the two-dimensional geometric coordinate area as at least one target alpha particle.

[0147] In an exemplary embodiment, the placement module 602 is further used to obtain image data of the sample to be tested based on a camera device; place the sample to be tested on the cathode, and determine a two-dimensional geometric coordinate area based on the image data of the sample to be tested.

[0148] In an exemplary embodiment, the above-mentioned analysis module 608 is also used to perform amplitude analysis and time analysis on each sensing signal to determine the emission positions of multiple electrons generated after each α particle ionizes the active gas; based on the emission positions of multiple electrons generated after each α particle ionizes the active gas, determine the emission positions of the α particles corresponding to each sensing signal; after determining at least one α particle whose projection point of the emission position along the third direction is located in the two-dimensional geometric coordinate area as at least one target α particle, connect the emission positions of multiple electrons generated after each target α particle ionizes the active gas to obtain the movement trajectory of at least one target α particle in the cavity.

[0149] In an exemplary embodiment, the above-mentioned analysis module 608 is also used to perform amplitude analysis and time analysis on each sensing signal to determine the signal amplitude and pulse signal rise time corresponding to each sensing signal; and determine the alpha particle corresponding to the sensing signal whose signal amplitude meets the preset threshold condition and the pulse signal rise time meets the preset time condition as at least one target alpha particle.

[0150] Each module in the above-mentioned α particle measurement device can be implemented in whole or in part by software, hardware or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute the operations corresponding to each module.

[0151] In an exemplary embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be as shown in FIG. Figure 7As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. The processor, the memory and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store sample data to be tested. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, an alpha particle measurement method is implemented.

[0152] In an exemplary embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as shown in FIG. Figure 8 As shown. The computer device includes a processor, a memory, an input / output interface, a communication interface, a display unit and an input device. The processor, the memory and the input / output interface are connected through a system bus, and the communication interface, the display unit and the input device are connected to the system bus through the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, near field communication (Near Field Communication, NFC) or other technologies. When the computer program is executed by the processor, an alpha particle measurement method is implemented. The display unit of the computer device is used to form a visually visible picture, which can be a display screen, a projection device or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covering the display screen, or a button, trackball or touchpad set on the computer device shell, or an external keyboard, touchpad or mouse.

[0153] Those skilled in the art will understand that Figure 8The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0154] In an exemplary embodiment, a computer device is further provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above-mentioned method embodiments when executing the computer program.

[0155] In an exemplary embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0156] In an exemplary embodiment, a computer program product is provided, including a computer program, and when the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0157] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0158] Those of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, an artificial intelligence (AI) processor, etc., but are not limited to this.

[0159] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0160] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. An alpha particle measuring device, characterized in that: The device comprises: A cavity surrounded by the side walls, the cavity top and the cavity bottom of the device; A collector and a cathode are arranged in the cavity; the collector is arranged at the top of the cavity, and the cathode is arranged at the bottom of the cavity; the collector is parallel to the cathode; the distance between the collector and the cathode satisfies a first preset distance; the collector includes a plurality of first anode wires laid along a first direction and a plurality of second anode wires laid along a second direction; the distance between each of the first anode wires and each of the second anode wires in the third direction is a second preset distance, the distance between two adjacent first anode wires in the first direction is a third preset distance, and the distance between two adjacent second anode wires in the second direction is a fourth preset distance; The cathode is used for placing the sample to be tested; the collecting electrode is used for collecting electrons generated after the alpha particles generated by the sample to be tested ionize the working gas and generate an induction signal.

2. The device according to claim 1, characterized in that A protective electrode is arranged in the cavity; the protective electrode is arranged at the top of the cavity; the protective electrode is parallel to the cathode, and the collecting electrode and the protective electrode are at the same potential; the protective electrode is arranged around the collecting electrode, and the width of the protective electrode in the first direction and the second direction is greater than the maximum range of the highest energy alpha particles within the measurement range; the protective electrode is used to collect electrons generated after the alpha particles generated by the side wall ionize the working gas.

3. A method for measuring alpha particles, characterized in that: Using the alpha particle measuring device of claim 1, the method comprises: placing the sample to be tested on the cathode; Filling an active gas for ionizing α particles between the collector and the cathode, and forming a voltage difference between the collector and the cathode so that the multiple α particles in the cavity ionize the active gas; During the ionization process, a plurality of induction signals generated by the collector for the electrons generated after the α particles ionize the working gas are obtained; Each of the sensing signals is analyzed to determine at least one target alpha particle in the sample to be tested.

4. The method according to claim 3, characterized in that The method further comprises: The alpha particle measuring device is provided with a guard electrode, and the guard electrode collects electrons generated when the alpha particles generated by the side wall ionize the working gas.

5. The method according to claim 3, characterized in that: The step of analyzing each of the sensing signals to determine at least one target alpha particle in the sample to be tested includes: Performing amplitude analysis and time analysis on each of the sensing signals to determine the emission position of the alpha particles corresponding to each of the sensing signals; At least one alpha particle whose projection point of the emission position along the third direction is located in a two-dimensional geometric coordinate area is determined as at least one of the target alpha particles.

6. The method according to claim 5, characterized in that Placing the sample to be tested on the cathode comprises: Acquire image data of the sample to be tested based on a camera device; The sample to be tested is placed on the cathode, and the two-dimensional geometric coordinate area is determined based on the image data of the sample to be tested.

7. The method according to claim 5, characterized in that The performing amplitude analysis and time analysis on each of the sensing signals to determine the emission position of the alpha particles corresponding to each of the sensing signals includes: Performing amplitude analysis and time analysis on each of the induction signals to determine the emission positions of multiple electrons generated after each of the α particles ionizes the active gas; Determining the emission position of the alpha particles corresponding to each of the sensing signals based on the emission positions of multiple electrons generated after each of the alpha particles ionizes the working gas; After determining at least one alpha particle whose projection point of the emission position along the third direction is located in the two-dimensional geometric coordinate area as at least one target alpha particle, the method further includes: The emission positions of a plurality of electrons generated after each of the target alpha particles ionizes the working gas are connected to obtain a motion trajectory of at least one of the target alpha particles in the cavity.

8. The method according to claim 3, characterized in that The step of analyzing each of the sensing signals to determine at least one target alpha particle in the sample to be tested includes: Performing amplitude analysis and time analysis on each of the sensing signals to determine the signal amplitude and pulse signal rise time corresponding to each of the sensing signals; The alpha particle corresponding to the induction signal whose signal amplitude satisfies a preset threshold condition and whose pulse signal rise time satisfies a preset time condition is determined as at least one of the target alpha particles.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 3 to 8 are implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 3 to 8 are implemented.

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