Mold system, parameter debugging method and equipment

Abstract

The invention relates to the technical field of intelligent control, in particular to a mold system and a parameter debugging method and device. The method comprises the following steps: acquiring measured values of a plurality of key parameters of the mold system; determining the deviation between the measured values and the theoretical values of the plurality of key parameters; according to the deviation of the plurality of key parameters, determining an associated influence value of the plurality of key parameters on stable production; determining whether to trigger the parameter debugging of the mold system according to the associated influence value; if it is determined that parameter debugging of the mold system is triggered, target key parameters are selected from the multiple key parameters; and performing parameter debugging on the target key parameter. According to the embodiment of the invention, the parameters can be debugged according to the superposition influence of each key parameter on stable production, a reasonable basis is provided for parameter debugging, and the debugging efficiency is improved.

Description

Technical Field

[0001] The present application relates to the field of intelligent control technology, and in particular to a mold system, a parameter debugging method and a device. Background Art

[0002] The traditional way to debug a mold system is to debug the relevant parameters of the mold, stamping equipment or production materials. Each time you debug, you need to try a little bit to reach the balance point of each parameter in production, so as to achieve the purpose of stable production. However, debugging parameters by trial and error will cause a lot of waste of resources, such as waste of personnel, equipment, raw materials, water, electricity, gas, site, etc., and waste of debugging time. It is also difficult to judge whether the parameters are reasonable after debugging. Therefore, how to efficiently debug the parameters of the mold system has become a technical problem that needs to be solved. Summary of the invention

[0003] In view of this, the present application provides a mold system, parameter debugging method and equipment, which can debug parameters according to the superimposed impact of each key parameter on stable production, provide a reasonable basis for debugging parameters, and improve debugging efficiency.

[0004] In a first aspect, an embodiment of the present invention provides a parameter debugging method for a mold system, comprising:

[0005] Obtain the measured values ​​of multiple key parameters of the mold system;

[0006] Determining the deviation between the measured values ​​and the theoretical values ​​of the plurality of key parameters;

[0007] Determining, based on the deviations of the multiple key parameters, associated impact values ​​of the multiple key parameters on stable production;

[0008] Determining whether to trigger parameter debugging of the mold system according to the associated impact value;

[0009] If it is determined that parameter debugging of the mold system is triggered, selecting a target key parameter from the multiple key parameters;

[0010] Parameter debugging is performed on the target key parameters.

[0011] In some embodiments, determining the deviations between the measured values ​​and the theoretical values ​​of the plurality of key parameters comprises:

[0012] respectively determining the differences between the theoretical values ​​and the measured values ​​of the plurality of key parameters;

[0013] The difference rates of the multiple key parameters are determined respectively according to the ratios of the difference values ​​of the multiple key parameters to the corresponding theoretical values, and the difference rates are used to represent the deviations between the measured values ​​and the theoretical values ​​of the key parameters.

[0014] In some embodiments, determining the associated impact values ​​of the multiple key parameters on stable production according to the deviations of the multiple key parameters includes:

[0015] The difference rates of the multiple key parameters are weighted to obtain the associated impact value.

[0016] In some embodiments, determining whether to trigger parameter debugging of the mold system according to the associated impact value includes:

[0017] If the associated impact value is greater than the first set value, it is determined to trigger parameter debugging of the mold system.

[0018] In some embodiments, if it is determined that parameter debugging of the mold system is triggered, selecting a target key parameter from the multiple key parameters includes:

[0019] The key parameter whose deviation is within the preset adjustable range is selected as the target key parameter.

[0020] In some embodiments, the parameter debugging of the target key parameter includes:

[0021] Determining the parameter adjustment amount and adjustment direction according to the difference between the theoretical value and the measured value of the target key parameter;

[0022] According to the parameter adjustment amount and adjustment direction, the target key parameter is adjusted; wherein,

[0023] The parameter adjustment amount is smaller than the absolute value of the difference between the theoretical value and the measured value of the target key parameter;

[0024] The adjustment direction is to approach the theoretical value of the target key parameter.

[0025] In some embodiments, determining the parameter adjustment amount according to the difference between the theoretical value and the measured value of the target key parameter includes:

[0026] If the absolute value of the difference between the theoretical value and the measured value of the target key parameter is greater than the second set value, determining a first adjustment amount;

[0027] Adjusting the target key parameter in a direction approaching the theoretical value according to the first adjustment amount, wherein the absolute value of the difference between the adjusted value of the target key parameter and the theoretical value is the second set value;

[0028] Based on the second setting value, the target key parameter continues to be adjusted multiple times until the absolute value of the difference between the target key parameter and the theoretical value is less than a third setting value.

[0029] In some embodiments, the step of continuing to adjust the target key parameter in multiple steps based on the second setting value until the absolute value of the difference between the target key parameter and the theoretical value is less than a third setting value includes:

[0030] Determining a second adjustment amount according to the second set value and the number of steps;

[0031] adjusting the target key parameter in a direction approaching the theoretical value according to the second adjustment amount;

[0032] Determining whether the absolute value of the difference between the adjusted target key parameter and the theoretical value is less than the third set value;

[0033] If yes, stop adjusting the target key parameter;

[0034] If not, determine the third adjustment amount based on the absolute value of the difference between the adjusted target key parameter and the theoretical value and the number of steps, and continue to adjust the target key parameter until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

[0035] In some embodiments, the method also includes: if the absolute value of the difference between the theoretical value and the measured value of the target key parameter is less than or equal to a second set value, then, according to the absolute value of the difference between the theoretical value and the measured value of the target key parameter and the number of steps, adjusting the target key parameter in multiple times until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

[0036] In some embodiments, before determining whether to trigger parameter debugging of the mold system according to the associated impact value, the method further includes:

[0037] The plurality of key parameters are independently debugged respectively, and the absolute value of the difference between the theoretical value and the measured value of each key parameter after independent debugging is less than the fourth set value

[0038] In a second aspect, an embodiment of the present invention provides a control device, comprising: at least one processor; and at least one memory communicatively connected to the processor, wherein: the memory stores program instructions executable by the processor, and the processor calls the program instructions to execute the method described in the first aspect or any one of the first aspects.

[0039] In the third aspect, an embodiment of the present invention provides a mold system, comprising: a mold device, a sensor component, used to collect the measured values ​​of multiple key parameters of the mold device in the mold system; a control device, used to receive the measured values ​​of the multiple key parameters, and execute the method described in the first aspect or any one of the first aspects according to the measured values ​​of the multiple key parameters.

[0040] In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium, wherein the computer-readable storage medium includes a stored program, wherein when the program is running, the device where the computer-readable storage medium is located is controlled to execute the method described in the first aspect or any one of the first aspects.

[0041] The mold system, parameter debugging method and device of the embodiments of the present invention have at least the following beneficial effects:

[0042] After obtaining the measured values ​​of each key parameter, the embodiment of the present invention determines the deviation between the measured value and the theoretical value of each key parameter, and the associated impact of each key parameter on stable production can be determined based on the deviation of each key parameter. According to the associated impact, it can be determined whether to perform parameter debugging and which key parameters to debug, thereby providing a basis for parameter debugging. The method of the embodiment of the present invention does not need to blindly attempt to debug each parameter, avoids the waste caused by debugging each parameter, reduces debugging time, and improves debugging efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0044] Figure 1 A schematic diagram of a mold system provided by an embodiment of the present invention;

[0045] Figure 2 A flow chart of a method for debugging key parameters of a mold system provided by an embodiment of the present invention;

[0046] Figure 3 A flow chart of a method for parameter debugging according to the correlation between key parameters provided by an embodiment of the present invention;

[0047] Figure 4 A schematic diagram of the structure of a control device provided by an embodiment of the present invention;

[0048] Figure 5 A schematic diagram of the structure of a control device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0049] In order to better understand the technical solution of the present application, the embodiments of the present application are described in detail below with reference to the accompanying drawings.

[0050] It should be clear that the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.

[0051] The terms used in the embodiments of the present application are only for the purpose of describing specific embodiments, and are not intended to limit the present application. The singular forms "a", "said" and "the" used in the embodiments of the present application and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings.

[0052] It should be understood that the term "and / or" used in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0053] See also Figure 1 , which is a schematic diagram of a mold system provided in an embodiment of the present invention. Figure 1 The mold system shown can be a mold system for a vehicle production line. Figure 1 As shown, the mold system includes a mold device, a sensing component and a control device. The mold device may include a product mold and a stamping device. The sensing component is deployed on the mold device to collect the measured values ​​of the key parameters of the product mold and / or the stamping device. The sensing component transmits the collected measured values ​​of the key parameters of the product mold and / or the stamping device to the control device. The control device executes the parameter debugging strategy according to the measured values ​​of the key parameters of the product mold and / or the stamping device.

[0054] Figure 1After the mold equipment is installed in the mold system shown, the theoretical values ​​of the production parameters of the mold equipment are set, such as the theoretical values ​​of the various production parameters of the product mold and the stamping equipment, and then the mold system is run. During the operation of the mold system, the sensing component can collect the measured values ​​of the key parameters of the various production parameters of the product mold and / or the stamping equipment at a certain sampling frequency. Inevitably, there may be deviations between the theoretical values ​​and the measured values ​​of the key parameters of the mold equipment. The deviations of the key parameters can form a parameter chain, and the deviation parameter chain formed by the key parameters will have a correlation effect on the stable production of the product, and then can trigger the parameter debugging of the mold system. The parameter debugging method of the present invention will be described in detail in conjunction with the embodiments below.

[0055] Figure 1 After the mold equipment is installed in the mold system shown, the theoretical values ​​of various production parameters of the mold equipment are set, and then the mold system is operated. During the operation of the mold system, the sensor component collects the measured values ​​of multiple key parameters of the mold equipment. The sensor component sends the measured values ​​of multiple key parameters of the mold equipment to the control device. The control device can first independently debug each key parameter, where the difference between each key parameter after independent debugging and the theoretical value is within a controllable range. After independent debugging of each key parameter, the stable operation of the mold system can be ensured to a certain extent.

[0056] See also Figure 2 , is a flow chart of a method for debugging key parameters of a mold system provided by an embodiment of the present invention. Figure 2 As shown, the processing steps of the method include:

[0057] 101, obtaining the measured values ​​of each key parameter.

[0058] 102, determine the deviation between the measured value and the theoretical value of each key parameter.

[0059] 103, determine whether the deviation of each key parameter is within the adjustable range. If the deviation of the key parameter is within the adjustable range, the corresponding key parameter is independently debugged. If the deviation of the key parameter is less than the minimum boundary value of the adjustable range, the key parameter is not debugged. If the deviation of the key parameter is greater than the maximum boundary value of the adjustable range, the mold system needs to be shut down for maintenance.

[0060] Among them, determining the deviation between the theoretical value and the measured value of the key parameter includes: determining the difference between the theoretical value and the measured value of the key parameter; determining the difference rate of the key parameter based on the ratio between the difference and the theoretical value, and the difference rate is used to represent the deviation value between the measured value and the theoretical value of the key parameter.

[0061] In one example, let Fs be the theoretical value of the key parameter, Fa be the measured value of the key parameter, and α be the difference rate. Then the calculation formula for the difference rate of the key parameter can be:

[0062] Formula 1: α=(Fs-Fa) / Fs*100%.

[0063] When α is less than 0.05%, the mold system continues to execute; or, when the absolute value of α is less than 0.05%, the mold system continues to execute.

[0064] When 0.05%≤α≤0.1%, it is determined that the key parameters of the mold system are to be debugged. Alternatively, when 0.05%≤the absolute value of α≤0.1%, it is determined that the key parameters of the mold system are to be debugged.

[0065] When α>0.1%, the difference rate of key parameters exceeds the adjustable range, and the mold system is controlled to stop for maintenance. Or, when the absolute value of α>0.1%, the difference rate of key parameters exceeds the adjustable range, and the mold system is controlled to stop for maintenance.

[0066] In the above example, when the difference rate is [0.05%, 0.1%] or the absolute value of the difference rate is [0.05%, 0.1%], it means that the key parameter is within the adjustable range, and the key parameter can be debugged. When the difference rate of the key parameter or the absolute value of the difference rate is less than the minimum boundary value of the adjustable range, the key parameter can be debugged. When the difference rate of the key parameter or the absolute value of the difference rate is greater than the maximum boundary value of the adjustable range, the mold system is controlled to shut down for maintenance.

[0067] When debugging key parameters, in order to avoid damage to mold equipment or waste of materials, the single adjustment of key parameters should not be too large. Among them, the key parameters can be adjusted multiple times according to the difference between the theoretical value and the measured value of the key parameters. Specifically:

[0068] According to the difference between the theoretical value and the measured value of the key parameter, the parameter adjustment amount and adjustment direction are determined. According to the parameter adjustment amount and adjustment direction, the key parameter is adjusted; wherein the parameter adjustment amount is less than the absolute value of the difference between the theoretical value and the measured value of the key parameter; and the adjustment direction is the direction approaching the theoretical value of the key parameter.

[0069] Wherein, determining the parameter adjustment amount according to the difference between the theoretical value and the measured value of the key parameter includes: if the absolute value of the difference between the theoretical value and the measured value of the key parameter is greater than the second set value, then determining the first adjustment amount. Adjusting the key parameter in the direction of approaching the theoretical value according to the first adjustment amount, wherein the absolute value of the difference between the adjusted value of the key parameter and the theoretical value is the second set value. Based on the second set value, continue to adjust the target key parameter in multiple times until the absolute value of the difference between the key parameter and the theoretical value is less than the third set value.

[0070] Wherein, based on the second setting value, the key parameter is continuously adjusted in multiple times until the absolute value of the difference between the key parameter and the theoretical value is less than the third setting value, including: determining the second adjustment amount according to the second setting value and the number of steps. Adjusting the key parameter in the direction of approaching the theoretical value according to the second adjustment amount; determining whether the absolute value of the difference between the adjusted key parameter and the theoretical value is less than the third setting value; if so, stopping adjusting the key parameter; if not, determining the third adjustment amount and continuing to adjust the key parameter according to the absolute value of the difference between the adjusted key parameter and the theoretical value and the number of steps, until the absolute value of the difference between the key parameter and the theoretical value is less than the third setting value.

[0071] Among them, if the absolute value of the difference between the theoretical value and the measured value of the key parameter is less than or equal to the second set value, the key parameter is adjusted multiple times according to the absolute value of the difference between the theoretical value and the measured value of the key parameter and the number of steps until the absolute value of the difference between the key parameter and the theoretical value is less than the third set value.

[0072] In one example, when the absolute value of the difference between the theoretical value and the measured value of the key parameter is less than or equal to the second set value, the single adjustment amount αn of the key parameter can be determined according to Formula 2.

[0073] Formula 2: αn=(Fs-Fa) / n.

[0074] Among them, the value of n can be a fixed value. The size of αn represents the single adjustment amount of the key parameter, and the positive or negative value of αn represents the adjustment direction of the key parameter. Among them, when αn is a positive number, it means that the measured value of the key parameter is less than the theoretical value, and the key parameter needs to be adjusted in the direction of increase. When αn is a negative number, it means that the measured value of the key parameter is greater than the theoretical value, and the key parameter needs to be adjusted in the direction of decrease.

[0075] In some examples, the key parameters of the mold system include: production tonnage (a), production cycle (b), air cushion size (c), material inflow (d), mold closing height (e), mold temperature (f), and mold wear (g). For those skilled in the art, other parameters can be obtained according to the listed parameters, and the debugging methods of other parameters can refer to the debugging methods of the trained parameters.

[0076] In some examples, the tuning of various key parameters includes:

[0077] Production tonnage (a): Increase or decrease the output tonnage of the equipment;

[0078] Production pace (b): reduce or increase the pace;

[0079] Air cushion size (c): Increase or decrease the size of the air cushion output pressure source;

[0080] Material inflow (d): increase or decrease the amount of material used;

[0081] Mold closing height (e): reduce or increase the closing height;

[0082] Mold temperature (f): Increase or decrease the flow rate of the cooling medium to reduce or increase the mold temperature;

[0083] Die wear (g): Increase or decrease the friction force;

[0084] (g): Increase or decrease the magnitude of friction.

[0085] Example 1:

[0086] The theoretical value of the mold closing height is 1000mm. During the production process, the closing height changes slightly, causing the closing height to drop to 999mm. At this time, the product produced has cracking defects. The difference rate α = (1000-999) / 1000 = 0.1%, and the value of α is within the adjustable range. The control equipment adjusts the mold closing height including:

[0087] Case 1: The difference between the theoretical value and the measured value of the mold closing height is 1mm, which is less than the set value of 2mm. Then the mold closing height should be debugged multiple times in the following way:

[0088] The difference between the theoretical value and the measured value of the mold closing height is 1mm, that is, the total adjustment value is 1mm. The number of steps n = 5 times, then the adjustment amount each time is:

[0089] The amount of the first adjustment is α1 = (1000-999) / 5 = 0.2 mm;

[0090] The amount of the second adjustment is α2 = (1000-999.2) / 5 = 0.16 mm;

[0091] The third adjustment amount is α3 = (1000-999.36) / 5 = 0.128 mm;

[0092] When the difference between the adjusted value of the mold closing height and the theoretical value, that is, the total adjustment value, is less than 0.1 mm, the adjustment of the mold closing height is stopped.

[0093] Case 2: If the difference between the theoretical value and the measured value of the mold closing height is greater than the set value of 2mm, the mold closing height is allowed to be quickly adjusted. The absolute value of the difference between the mold closing height after quick adjustment and the theoretical value is 2mm. Then the mold closing height is adjusted in steps according to the case.

[0094] Case 3: The theoretical value of the mold closing height is smaller than the measured value. For example, if the theoretical value is 1000mm and the measured value is 1001mm, the adjustment direction is opposite to the above adjustment direction.

[0095] Example 2:

[0096] The theoretical value of production tonnage is 2000 tons, and the measured value is 1800 tons. Insufficient pressure will cause wrinkles or overlaps in the product. At this time, the difference rate α=(2000-1800) / 2000=10%, and the machine should be shut down for maintenance. If the measured value is 1998 tons, the difference rate α=(2000-1998) / 2000=0.1%, and the production tonnage should be adjusted according to formula 2. The adjustment method can refer to Example 1.

[0097] After each key parameter is independently debugged so that the absolute value of the difference between each key parameter and the theoretical value is within the third set value, the control device can superimpose the key parameters together to calculate the correlation between the key parameters, and then debug the mold system according to the correlation between the key parameters.

[0098] See also Figure 3 , is a flow chart of a method for parameter debugging according to the correlation between key parameters provided by an embodiment of the present invention. Figure 3 As shown, the processing steps of the method include:

[0099] 201, obtaining measured values ​​of multiple key parameters of the mold system.

[0100] 202, determine the deviation between the measured values ​​and the theoretical values ​​of multiple key parameters.

[0101] 203. Determine, based on the deviations of the multiple key parameters, the associated impact values ​​of the multiple key parameters on stable production.

[0102] 204 , determining whether to trigger debugging of mold system parameters according to the associated impact value.

[0103] 205 , if it is determined to trigger parameter debugging of the mold system, a target key parameter is selected from a plurality of key parameters.

[0104] 206 , parameter debugging is performed on target key parameters.

[0105] The above-mentioned multiple key parameters may include: one or more of production tonnage (a), production cycle (b), air cushion size (c), material inflow (d), mold closing height (e), mold temperature (f) and mold wear (g). For those skilled in the art, other parameters can be obtained according to the listed parameters, and the debugging methods of other parameters can refer to the debugging methods of the trained parameters.

[0106] The above-mentioned multiple key parameters may have a correlation effect on the stable production of the mold system. After the measured values ​​of the multiple key parameters are obtained, the correlation effect values ​​on the stable production can be calculated according to the measured values ​​of the multiple key parameters.

[0107] In some embodiments, a functional relationship f(a, b, c, d, e, f, g) between the associated impact value β and the above-mentioned multiple key parameters can be preset. After the measured values ​​of the multiple key parameters are obtained, the associated impact value β can be obtained by substituting the above-mentioned functional relationship f(a, b, c, d, e, f, g).

[0108] In some embodiments, each key parameter has its own theoretical value. After obtaining the measured value of each key parameter, the difference between the theoretical value and the measured value of each key parameter can be determined. According to the ratio between the difference of each key parameter and the corresponding theoretical value, the difference rate of each key parameter can be determined respectively, and the difference rate is used to represent the deviation between the measured value and the theoretical value of the key parameter. The calculation method of the difference rate of each key parameter can be referred to Formula 1.

[0109] In some embodiments, the difference rates of the above multiple key parameters are weighted to obtain the associated impact values ​​of the multiple key parameters on stable production. In one example, the associated impact value β can be calculated according to the following formula 3.

[0110] Formula 3: β = a + b + c + d + e + f + g. a, b, c, d, e, f and g are the difference rates of key parameters (a), (b), (c), (d), (e), (f) and (g) respectively. In Formula 3, the values ​​of a, b, c, d, e, f and g can be positive or negative.

[0111] In some embodiments, if the associated influence value is greater than the first set value, it is determined to trigger parameter debugging of the mold system. For example, when the β value is ≤0.3, it means that the production of the mold system is stable and there is no need to trigger parameter debugging; when the β value is greater than 0.3, it means that the production of the mold system is unstable and it is necessary to trigger parameter debugging of the mold system. Optionally, after taking the absolute value of the associated influence value, it is possible to determine whether the absolute value of the associated influence value is greater than the first set value. If it is greater, it is determined to trigger parameter debugging of the mold system. For example, when the absolute value of β is ≤0.3, it means that the production of the mold system is stable and there is no need to trigger parameter debugging; when the absolute value of β is greater than 0.3, it means that the production of the mold system is unstable and it is necessary to trigger parameter debugging of the mold system.

[0112] After determining to trigger parameter debugging of the mold system according to the associated influence value β, not all key parameters are debugged directly, but target key parameters are selected from multiple key parameters for debugging.

[0113] The method of selecting the target key parameter from the multiple key parameters may include: selecting a key parameter whose deviation between the measured value and the theoretical value is within an adjustable range as the target key parameter.

[0114] The difference rate of each key parameter can be calculated according to Formula 1, and the target key parameter can be selected according to the rule corresponding to Formula 1, and the target key parameter can be debugged.

[0115] Among them, debugging the target key parameters includes: determining the parameter adjustment amount and adjustment direction according to the difference between the theoretical value and the measured value of the target key parameters; adjusting the target key parameters according to the parameter adjustment amount and the adjustment direction; wherein the parameter adjustment amount is less than the absolute value of the difference between the theoretical value and the measured value of the target key parameters; and the adjustment direction is to approach the theoretical value of the target key parameters.

[0116] Among them, determining the parameter adjustment amount according to the difference between the theoretical value and the measured value of the target key parameter includes: if the absolute value of the difference between the theoretical value and the measured value of the target key parameter is greater than the second set value, determining the first adjustment amount; adjusting the target key parameter in the direction of approaching the theoretical value according to the first adjustment amount, wherein the absolute value of the difference between the adjusted value of the target key parameter and the theoretical value is the second set value; based on the second set value, continuing to adjust the target key parameter in multiple times until the absolute value of the difference between the target key parameter and the theoretical value is less than a third set value.

[0117] Among them, based on the second set value, continue to adjust the target key parameter in multiple times until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value, including: determining the second adjustment amount according to the second set value and the number of steps; adjusting the target key parameter in the direction of approaching the theoretical value according to the second adjustment amount; determining whether the absolute value of the difference between the adjusted target key parameter and the theoretical value is less than the third set value; if so, stop adjusting the target key parameter; if not, determine the third adjustment amount and continue to adjust the target key parameter according to the absolute value of the difference between the adjusted target key parameter and the theoretical value and the number of steps, until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

[0118] Among them, if the absolute value of the difference between the theoretical value and the measured value of the target key parameter is less than or equal to the second set value, the target key parameter is adjusted multiple times according to the absolute value of the difference between the theoretical value and the measured value of the target key parameter and the number of steps until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

[0119] The debugging method of the target key parameters can refer to the description above.

[0120] Corresponding to the parameter debugging method of the above-mentioned mold system, the embodiment of the present invention also provides a structural schematic diagram of a control device. Figure 4 As shown, the control device includes:

[0121] The acquisition module 301 is used to acquire measured values ​​of multiple key parameters of the mold system.

[0122] The determination module 302 is used to determine the deviation between the measured values ​​and the theoretical values ​​of the multiple key parameters; and determine the associated impact values ​​of the multiple key parameters on stable production according to the deviation of the multiple key parameters.

[0123] The judgment module 303 is used to determine whether to trigger parameter debugging of the mold system according to the associated impact value.

[0124] The debugging module 304 is used to select a target key parameter from the multiple key parameters when determining to trigger parameter debugging of the mold system; and to perform parameter debugging on the target key parameter.

[0125] The control device of the embodiment of the present invention can execute the parameter debugging method of the embodiment shown above. For the parts not described in detail in this embodiment, reference can be made to the relevant description of the method embodiment. The execution process and technical effects of the technical solution refer to the description of the embodiment shown in the method, which will not be repeated here.

[0126] See also Figure 5 , which is a structural diagram of a control device provided in an embodiment of the present invention. Figure 5 The control device shown is implemented in the form of a computer. Figure 5 As shown, the control device 400 may include: a processor 401, a memory 402 and a communication unit 403. These components communicate through one or more buses. Those skilled in the art can understand that the structure of the control device shown in the figure does not constitute a limitation on the embodiments of the present application. It can be a bus structure or a star structure, and can also include more or fewer components than shown in the figure, or combine certain components, or arrange the components differently.

[0127] The communication unit 403 is used to establish a communication channel so that the control device can communicate with other devices, receive user data sent by other devices or send user data to other devices.

[0128] The processor 401 is the control center of the control device. It uses various interfaces and lines to connect various parts of the entire control device. It runs or executes software programs, instructions, and / or modules stored in the memory 402, and calls data stored in the memory to perform various functions of the control device and / or process data. The processor can be composed of an integrated circuit (IC), for example, it can be composed of a single packaged IC, or it can be composed of a plurality of packaged ICs with the same or different functions. For example, the processor 401 can include only a central processing unit (CPU). In the embodiment of the present application, the CPU can be a single computing core or multiple computing cores.

[0129] The memory 402 is used to store the execution instructions of the processor 401. The memory 402 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk.

[0130] When the execution instruction in the memory 402 is executed by the processor 401, the control device 400 is able to execute Figure 1 Part or all of the steps of the parameter debugging method of the mold system in the illustrated embodiment.

[0131] In a specific implementation, the present application further provides a computer storage medium, wherein the computer storage medium may store a program, and when the program is executed, the program may include some or all of the steps in each embodiment of the printing method of the image forming device provided by the present application. The storage medium may be a disk, an optical disk, a read-only memory (ROM) or a random access memory (RAM), etc.

[0132] In a specific implementation, the present application also provides a computer program product, wherein the computer program product includes executable instructions, and when the executable instructions are executed on a computer, the computer executes part or all of the steps in each embodiment of the parameter debugging method of the mold system provided in the present application.

[0133] The embodiment of the present application also provides a non-temporary computer-readable storage medium, which stores computer instructions, and the computer instructions enable the computer to execute the method provided by the embodiment of the present application.

[0134] The above-mentioned non-temporary computer-readable storage medium can adopt any combination of one or more computer-readable media. The computer-readable medium can be a computer-readable signal medium or a computer-readable storage medium. The computer-readable storage medium can be, for example, - but not limited to - an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or device, or any combination of the above. More specific examples (non-exhaustive list) of computer-readable storage media include: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (Read On ly Memory; hereinafter referred to as: ROM), an erasable programmable read-only memory (Erasab leProgrammab le Read On ly Memory; hereinafter referred to as: EPROM) or flash memory, optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above. In this document, a computer-readable storage medium can be any tangible medium containing or storing a program, which can be used by an instruction execution system, device or device or used in combination with it.

[0135] Computer-readable signal media may include a data signal propagated in baseband or as part of a carrier wave, which carries a computer-readable program code. Such propagated data signals may take a variety of forms, including, but not limited to, electromagnetic signals, optical signals, or any suitable combination of the above. Computer-readable signal media may also be any computer-readable medium other than a computer-readable storage medium, which may send, propagate, or transmit a program for use by or in conjunction with an instruction execution system, apparatus, or device.

[0136] Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.

[0137] Those skilled in the art can clearly understand that the technology in the embodiments of the present application can be implemented by means of software plus a necessary general hardware platform. Based on this understanding, the technical solution in the embodiments of the present application is essentially or the part that contributes to the prior art can be embodied in the form of a software product, which can be stored in a storage medium such as ROM / RAM, a disk, an optical disk, etc., including several instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment of the present application or some parts of the embodiments.

[0138] In this specification, the same or similar parts between the various embodiments can be referred to each other. In particular, for the device embodiment and the terminal embodiment, since they are basically similar to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the description in the method embodiment.

Claims

1. A parameter debugging method for a mold system, characterized in that: include: Obtain the measured values ​​of multiple key parameters of the mold system; Determining the deviation between the measured values ​​and the theoretical values ​​of the plurality of key parameters; Determining, based on the deviations of the multiple key parameters, associated impact values ​​of the multiple key parameters on stable production; Determining whether to trigger parameter debugging of the mold system according to the associated impact value; If it is determined that parameter debugging of the mold system is triggered, selecting a target key parameter from the multiple key parameters; Parameter debugging is performed on the target key parameters.

2. The method according to claim 1, characterized in that Determining the deviations between the measured values ​​and the theoretical values ​​of the plurality of key parameters comprises: respectively determining the differences between the theoretical values ​​and the measured values ​​of the plurality of key parameters; The difference rates of the multiple key parameters are determined respectively according to the ratios of the difference values ​​of the multiple key parameters to the corresponding theoretical values, and the difference rates are used to represent the deviations between the measured values ​​and the theoretical values ​​of the key parameters.

3. The method according to claim 2, characterized in that Determining the associated impact values ​​of the multiple key parameters on stable production according to the deviations of the multiple key parameters includes: The difference rates of the multiple key parameters are weighted to obtain the associated impact value.

4. The method according to claim 1, characterized in that: The determining whether to trigger parameter debugging of the mold system according to the associated impact value includes: If the associated impact value is greater than the first set value, it is determined to trigger parameter debugging of the mold system.

5. The method according to claim 1, characterized in that If it is determined that parameter debugging of the mold system is triggered, selecting a target key parameter from the multiple key parameters includes: The key parameter whose deviation is within the preset adjustable range is selected as the target key parameter.

6. The method according to claim 1 or 5, characterized in that: The parameter debugging of the target key parameters includes: Determining the parameter adjustment amount and adjustment direction according to the difference between the theoretical value and the measured value of the target key parameter; According to the parameter adjustment amount and adjustment direction, the target key parameter is adjusted; wherein, The parameter adjustment amount is smaller than the absolute value of the difference between the theoretical value and the measured value of the target key parameter; The adjustment direction is to approach the theoretical value of the target key parameter.

7. The method according to claim 6, characterized in that The step of determining the parameter adjustment amount according to the difference between the theoretical value and the measured value of the target key parameter comprises: If the absolute value of the difference between the theoretical value and the measured value of the target key parameter is greater than the second set value, determining a first adjustment amount; Adjusting the target key parameter in a direction approaching the theoretical value according to the first adjustment amount, wherein the absolute value of the difference between the adjusted value of the target key parameter and the theoretical value is the second set value; Based on the second setting value, the target key parameter continues to be adjusted multiple times until the absolute value of the difference between the target key parameter and the theoretical value is less than a third setting value.

8. The method according to claim 7, characterized in that The step of continuing to adjust the target key parameter in multiple steps based on the second set value until the absolute value of the difference between the target key parameter and the theoretical value is less than a third set value includes: Determining a second adjustment amount according to the second set value and the number of steps; adjusting the target key parameter in a direction approaching the theoretical value according to the second adjustment amount; Determining whether the absolute value of the difference between the adjusted target key parameter and the theoretical value is less than the third set value; If yes, stop adjusting the target key parameter; If not, determine the third adjustment amount based on the absolute value of the difference between the adjusted target key parameter and the theoretical value and the number of steps, and continue to adjust the target key parameter until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

9. The method according to claim 7, characterized in that: The method further comprises: If the absolute value of the difference between the theoretical value and the measured value of the target key parameter is less than or equal to the second set value, the target key parameter is adjusted multiple times according to the absolute value of the difference between the theoretical value and the measured value of the target key parameter and the number of steps until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

10. The method according to claim 1, characterized in that Before determining whether to trigger parameter debugging of the mold system according to the associated impact value, the method further includes: The multiple key parameters are debugged independently respectively, and the absolute value of the difference between the theoretical value and the measured value of each key parameter after the independent debugging is less than the fourth set value.

11. A control device, characterized in that: include: at least one processor; as well as at least one memory in communication with the processor, wherein: The memory stores program instructions that can be executed by the processor, and the processor calls the program instructions to perform the method according to any one of claims 1 to 10.

12. A mold system, characterized in that: include: Mould equipment; A sensor component, used to collect measured values ​​of multiple key parameters of the mold equipment in the mold system; A control device, configured to receive the measured values ​​of the plurality of key parameters and execute the method according to any one of claims 1 to 10 according to the measured values ​​of the plurality of key parameters.

13. A computer-readable storage medium, characterized in that: The computer-readable storage medium includes a stored program, wherein when the program is executed, the device where the computer-readable storage medium is located is controlled to execute any one of the methods of claims 1 to 10.

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