Display module testing method and device

Abstract

The invention discloses a display module test method and device, and the method comprises the steps: testing a display module according to a test index, automatically recording test information, generating a unique test code corresponding to the test process of the display module, and carrying out the associated storage of the test information and the test code; obtaining test information, and burning the test information into a driving IC of the display module; and tracing the test process of the display module according to the test code. According to the method, the unique test code corresponding to the display module is generated, the test information and the test code are stored in an associated manner, and the test information table obtained after association is burnt in the drive IC of the display module, so that subsequent process personnel can obtain the whole test process and the test information of the display module by reading the test information table in the drive IC; the traceability of the test information of the display module of the display screen is improved, the manpower and material resource cost is saved, and the production efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of liquid crystal display screen test tracing, and in particular to a display module testing method and device. Background Art

[0002] Display screens are widely used in today's society and can be seen everywhere. By using display screens, information can be expressed more intuitively and vividly. In the industrial and consumer fields, in addition to the products that generally use display screens, such as monitors, telephones, handheld scanners, cameras, etc., many devices that did not use display screens before are now beginning to use display screens for better interaction, such as remote controls, ovens, refrigerators and other electrical equipment.

[0003] Therefore, display screens have a huge application market, and the corresponding display module shipments are also huge. Display modules need to be tested with test fixtures for display effects before shipment, and they can be shipped normally if the test is OK. However, once the current display modules are shipped, the functional test records can no longer be traced back. Whether the display module has been tested or not, and the test results, cannot be traced back. The reason is that the test baseboard of the current test device drives the display module to display white, red, green, blue and other images according to the program software settings to detect the display effect, but does not record and mark the test process of a specific single display module. Summary of the invention

[0004] When testing display modules, current testing devices only test the display effect and do not have a traceability function. After shipment, users cannot obtain the testing process information of the display modules.

[0005] In view of the above problems, a display module testing method and device are proposed. By generating a unique test code corresponding to the display module, the test information is associated with the test code and stored, and the test information table obtained after the association is burned into the driver IC of the display module. In this way, subsequent process personnel can obtain the entire test process and test information of the display module by reading the test information table in the driver IC, thereby improving the traceability of the test information of the display module, saving manpower and material costs, and improving production efficiency.

[0006] In a first aspect, a display module testing method includes: Step 100: testing the display module according to the test index, automatically recording the test information, generating a unique test code corresponding to the test process of the display module, and storing the test information in association with the test code; Step 200, obtaining the test information, and burning the test information into the driver IC of the display module; Step 300: Tracing the test process of the display module according to the test code.

[0007] In conjunction with the display module testing method of the present invention, in a first possible implementation manner, step 100 includes: Step 110: Connect the display module to a test fixture, and use the test fixture to test the image integrity, color accuracy, brightness uniformity, and response time of the display module; Step 120, the test fixture automatically obtains test information, the test information including the test start time, end time, display module number and test result information of each test indicator; Step 130: store the test information of all the test indicators in association with the test code to obtain a test information table.

[0008] In combination with the first possible implementation manner of the present invention, in a second possible implementation manner, step 130 includes: Step 131, setting the test code field in the information table; Step 132: Use the test code field as a foreign key constraint to associate it with the device code information of the display module.

[0009] In combination with the second possible implementation manner of the present invention, in a third possible implementation manner, step 130 further includes: Step 133: Obtain the field structure of the test information table; Step 134: Store the test information and the test code in corresponding fields respectively.

[0010] In combination with the third possible implementation manner of the present invention, in a fourth possible implementation manner, step 200 includes: Step 210, establishing a communication connection between the burning device and the test fixture; Step 220: Read the test information table from the storage unit.

[0011] In combination with the fourth possible implementation manner of the present invention, in a fifth possible implementation manner, step 200 further includes: Step 230, establishing communication connection between the burning device and the display module; Step 240, obtaining the driver IC model of the display module; Step 250: Burn the test signal table into the driver IC according to the data storage structure of the driver IC model.

[0012] In combination with the fifth possible implementation manner of the present invention, in a sixth possible implementation manner, step 250 includes: Step 251, configuring the burning parameters of the burning device, wherein the burning parameters include a starting address, a data length and a burning mode; Step 252: Load the test information table into the programming device, and write the test information table into the storage unit of the driver IC according to the programming parameters.

[0013] In a second aspect, a display module testing device adopts the display module testing method described in the first aspect, comprising: A test module, used to test the display module according to the test indicators, automatically record the test information, generate a unique test code corresponding to the test process of the display module, and associate and store the test information with the test code; A burning module, used for acquiring the test information and burning the test information into the driver IC of the display module; The tracing module is used to trace the testing process of the display module according to the testing code.

[0014] In conjunction with the display module testing device described in the second aspect of the present invention, in a first possible implementation manner, the testing module includes: A testing unit, used to connect the display module to a testing fixture, and use the testing fixture to test the picture integrity, color accuracy, brightness uniformity and response time of the display module; An acquisition unit, used for the test fixture to automatically acquire test information, wherein the test information includes the test start time, end time, display module number and test result information of each test indicator; The associated storage unit is used to obtain a test information table and associate the test information of all the test indicators with the test code for storage.

[0015] In conjunction with the first possible implementation manner of the second aspect of the present invention, in a second possible implementation manner, the associated storage unit is further used for: The field of the test code is set in the information table, and the field of the test code is used as a foreign key constraint to associate with the device code information of the display module, obtain the field structure of the test information table, and store the test information and test code in corresponding fields respectively.

[0016] Compared with the prior art, the embodiments of the present application mainly have the following technical effects: by generating a unique test code corresponding to the display module, the test information is stored in association with the test code, and the test information table obtained after the association is burned into the driver IC of the display module, so that subsequent process personnel can obtain the entire test process and test information of the display module by reading the test information table in the driver IC, thereby improving the traceability of the test information of the display screen module, saving manpower and material costs, and improving production efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the scheme in the present application, a brief introduction is given below to the drawings required for use in the description of the embodiments of the present application. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0018] Figure 1 is a flow chart of an embodiment of a display module testing method of the present application; Figure 2 yes Figure 1 A flowchart of a specific implementation of S100; Figure 3 yes Figure 2 A flowchart of a specific implementation of S130; Figure 4 yes Figure 2 A flowchart of another specific implementation of S130; Figure 5 yes Figure 1 A flowchart of a specific implementation of S200; Figure 6 yes Figure 1 A flowchart of another specific implementation of S200; Figure 7 yes Figure 6 A flowchart of a specific implementation of S250; Figure 8 It is a structural schematic diagram of an embodiment of a display module testing device of the present application. DETAILED DESCRIPTION

[0019] The following will be combined with the accompanying drawings in the invention to clearly and completely describe the technical solutions in the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, other embodiments obtained by ordinary technicians in this field without creative work are all within the scope of protection of the present invention.

[0020] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0021] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used in the specification of the application are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0022] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0023] When testing display modules, current testing devices only test the display effect and do not have a traceability function. After shipment, users cannot obtain the testing process information of the display modules.

[0024] In view of the above problems, a display module testing method and device are proposed.

[0025] In a first aspect, a display module testing method is provided. Figure 1 , Figure 1 This is a flow chart of an embodiment of a display module testing method of the present application; it includes: S100, testing the display module according to the test index, automatically recording the test information, generating a unique test code corresponding to the test process of the display module, and storing the test information and the test code in association.

[0026] In this embodiment, the test code may be a serial number, which includes multiple digits and may include information such as the model, production batch, and production date of the display module. It may also be a barcode or a QR code, which may be bound or associated with the test information.

[0027] In a preferred embodiment, Figure 2 , Figure 2 yes Figure 1A flowchart of a specific implementation of S100; S100 includes: S110, connect the display module to the test fixture, and use the test fixture to test the picture integrity, color accuracy, brightness uniformity and response time of the display module; S120, the test fixture automatically obtains test information, and the test information includes the test start time, end time, display module number and test result information of each test indicator; S130, associate the test information of all test indicators with the test code and store it to obtain the test information table.

[0028] In this embodiment, various test indicators of the display function are comprehensively tested according to a predetermined procedure, and the test fixture automatically records the start time, end time, display module number and test result information. For display modules with touch functions, test indicators such as touch sensitivity and accuracy are also required to be tested.

[0029] In some implementations, the test information also includes: Test equipment information (equipment number, calibration validity period), test environment parameters (temperature, humidity, light, etc.), appearance inspection results, aging test data.

[0030] In a preferred embodiment, Figure 3 , Figure 3 yes Figure 2 A flowchart of a specific implementation of S130; S130 includes: S131, setting a test code field in the information table; S132, using the test code field as a foreign key constraint to associate with the device code information of the display module.

[0031] In the database table design, a field is set in the test information table to store the test code (serial number), and this field is used to establish an association with the module basic information table.

[0032] Foreign key constraints are used to ensure that the serial number in the test information table matches the serial number in the module basic information table, enhancing data integrity.

[0033] In the test fixture storage, one is the product information table, which stores the basic information of the product, including product serial number, product name, model, etc.; the other is the test information table obtained by the test, which is used to record the details of the product test, such as test time, test results, etc.

[0034] The product serial number field in the test information table and the product serial number field in the product information table are related to each other. Specifically, the foreign key constraint requires that the value of the product serial number in the test information table must be the value of the product serial number that already exists in the product information table. This ensures that the test information must correspond to the actual product, and there will be no error such as the recorded test information pointing to a non-existent product.

[0035] In a preferred embodiment, Figure 4 , Figure 4 yes Figure 2 A flowchart of another specific implementation of S130; S130 also includes: S133, obtaining the field structure of the test information table; S134, storing the test information and the test code in the corresponding fields respectively.

[0036] In this embodiment, when the display module completes the test, the basic information and the test information are stored in the corresponding fields. For the associated part, when storing the test information, the test code (serial number) of the corresponding display module is stored in the corresponding field of the test information table.

[0037] S200, acquiring test information, and burning the test information into the driver IC of the display module.

[0038] In a preferred embodiment, if Figure 5 , Figure 5 yes Figure 1 A flowchart of a specific implementation of S200; S200 includes: S210, communicating and connecting the burning device with the test fixture; S220, reading the test information table from the storage unit.

[0039] In this embodiment, the burning device must match the interface and communication protocol of the driver IC. At the same time, the burning software is loaded, and the software supports the programming operation of the driver IC of this model. The burning device is connected to the driver IC of the display module through an interface (such as SPI, I2C, etc.). After reading the test information from the storage unit, the test information is sorted according to the format and data structure that the driver IC can accept.

[0040] In a preferred embodiment, Figure 6 , Figure 6 yes Figure 1 A flowchart of another specific implementation of S200; S200 also includes: S230, communicating and connecting the burning device with the display module; S240, obtaining the driver IC model of the display module; S250, burning the test signal table into the driver IC according to the data storage structure of the driver IC model.

[0041] In a preferred embodiment, Figure 7 , Figure 7 yes Figure 6 A flowchart of a specific implementation of S250; S250 includes: S251, configuring the burning parameters of the burning device, the burning parameters include the starting address, data length and burning mode; S252, loading the test information table into the burning device, and writing the test information table into the storage unit of the driver IC according to the burning parameters.

[0042] Select the correct driver IC model and operate according to the storage structure and programming rules of the IC. According to the content and format of the test information, configure the burning parameters in the software, including the starting address, data length, and burning mode (such as byte write, page write, etc.).

[0043] S300, tracing the test process of the display module according to the test code. By generating a unique test code corresponding to the display module, the test information is associated with the test code and stored, and the test information table obtained after association is burned into the driver IC of the display module, so that the subsequent process personnel can obtain the entire test process and test information of the display module by reading the test information table in the driver IC, thereby improving the traceability of the test information of the display screen display module, saving manpower and material costs, and improving production efficiency.

[0044] In a second aspect, a display module testing device adopts the display module testing method of the first aspect, such as Figure 8 , Figure 8 4 is a schematic diagram of a display module testing device 400 of the present application. The test module 401 is used to test the display module according to the test index, automatically record the test information, generate a unique test code corresponding to the test process of the display module, and associate and store the test information with the test code; The burning module 402 is used to obtain the test information and burn the test information into the driver IC of the display module; The tracing module 403 is used to trace the test process of the display module according to the test code.

[0045] In conjunction with the display module testing device according to the second aspect of the present invention, in a first possible implementation manner, the testing module includes: A test unit, used to connect the display module to a test fixture, and use the test fixture to test the image integrity, color accuracy, brightness uniformity and response time of the display module; The acquisition unit is used for the test fixture to automatically acquire test information, including the test start time, end time, display module number and test result information of each test indicator; The associated storage unit is used to obtain the test information table and associate the test information of all test indicators with the test codes for storage.

[0046] In conjunction with the first possible implementation manner of the second aspect of the present invention, in a second possible implementation manner, the associated storage unit is further used for: A test code field is set in the information table, and the test code field is used as a foreign key constraint to associate it with the device code information of the display module, obtain the field structure of the test information table, and store the test information and test code in the corresponding fields respectively.

[0047] Compared with the prior art, the embodiments of the present application mainly have the following technical effects: by generating a unique test code corresponding to the display module, the test information is stored in association with the test code, and the test information table obtained after the association is burned into the driver IC of the display module, so that subsequent process personnel can obtain the entire test process and test information of the display module by reading the test information table in the driver IC, thereby improving the traceability of the test information of the display screen module, saving manpower and material costs, and improving production efficiency.

[0048] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A display module testing method, characterized in that it includes: Step 100: testing the display module according to the test index, automatically recording the test information, generating a unique test code corresponding to the test process of the display module, and storing the test information in association with the test code; Step 200, obtaining the test information, and burning the test information into the driver IC of the display module; Step 300: Tracing the test process of the display module according to the test code.

2. The display module testing method according to claim 1, characterized in that: The step 100 comprises: Step 110: Connect the display module to a test fixture, and use the test fixture to test the image integrity, color accuracy, brightness uniformity, and response time of the display module; Step 120, the test fixture automatically obtains test information, the test information including the test start time, end time, display module number and test result information of each test indicator; Step 130: store the test information of all the test indicators in association with the test code to obtain a test information table.

3. The display module testing method according to claim 2, characterized in that: The step 130 includes: Step 131, setting the test code field in the information table; Step 132: Use the test code field as a foreign key constraint to associate it with the device code information of the display module.

4. The display module testing method according to claim 3, characterized in that: The step 130 further includes: Step 133: Obtain the field structure of the test information table; Step 134: Store the test information and the test code in corresponding fields respectively.

5. The display module testing method according to claim 4, characterized in that: The step 200 comprises: Step 210, establishing a communication connection between the burning device and the test fixture; Step 220: Read the test information table from the storage unit.

6. The display module testing method according to claim 5, characterized in that: The step 200 further includes: Step 230, establishing communication connection between the burning device and the display module; Step 240, obtaining the driver IC model of the display module; Step 250: Burn the test signal table into the driver IC according to the data storage structure of the driver IC model.

7. The display module testing method according to claim 6, characterized in that: The step 250 includes: Step 251, configuring the burning parameters of the burning device, wherein the burning parameters include a starting address, a data length and a burning mode; Step 252: Load the test information table into the programming device, and write the test information table into the storage unit of the driver IC according to the programming parameters.

8. A display module testing device, using the display module testing method according to any one of claims 1 to 7, characterized in that: include: A test module, used to test the display module according to the test indicators, automatically record the test information, generate a unique test code corresponding to the test process of the display module, and associate and store the test information with the test code; A burning module, used for acquiring the test information and burning the test information into the driver IC of the display module; The tracing module is used to trace the testing process of the display module according to the testing code.

9. The display module testing device according to claim 8, characterized in that: The test module includes: A testing unit, used to connect the display module to a testing fixture, and use the testing fixture to test the picture integrity, color accuracy, brightness uniformity and response time of the display module; An acquisition unit, used for the test fixture to automatically acquire test information, wherein the test information includes the test start time, end time, display module number and test result information of each test indicator; The associated storage unit is used to obtain a test information table and associate the test information of all the test indicators with the test code for storage.

10. The display module testing device according to claim 9, characterized in that: The associated storage unit is further used for: The field of the test code is set in the information table, and the field of the test code is used as a foreign key constraint to associate with the device code information of the display module, obtain the field structure of the test information table, and store the test information and test code in corresponding fields respectively.

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