Glass cover plate defect detection device and method

Abstract

The invention discloses a glass cover plate defect detection device and method. The glass cover plate defect detection device comprises an image acquisition unit, a lighting source and a bracket, wherein the lighting light source comprises an annular light source and a movable coaxial light source; the image acquisition unit is fixed at the top of the bracket; the annular light source is arranged below the image acquisition unit and is fixed on the bracket; the movable coaxial light source is located above the annular light source, arranged on the sliding rail and connected with an air cylinder. The air cylinder is used for pushing the movable coaxial light source to move on the sliding rail so as to adjust whether the movable coaxial light source is located on a light path between the image acquisition unit and the annular light source or not. The annular light source and the movable coaxial light source are used for lighting a to-be-detected glass cover plate, and the image acquisition unit is used for acquiring a to-be-detected image of the to-be-detected glass cover plate so as to carry out defect detection. According to the technical scheme of the embodiment of the invention, the efficiency and accuracy of defect detection on the glass cover plate can be improved.

Description

Technical Field

[0001] The present invention relates to the field of display technology, and in particular to a device and method for detecting defects in a glass cover. Background Art

[0002] Compared with conventional OLED panels, Micro OLED has a higher pixel density ratio, smaller panel size, thinner thickness and lower power consumption. As a new generation of display device, Micro OLED has a broad market.

[0003] The preparation process of Micro OLED is relatively complicated, especially during the process of fully bonding the crystal grains and the single-grain cover glass before the chip is packaged. If there are defects in the cover, the chip yield will decrease. Therefore, defect detection of the cover is an important guarantee for improving product yield and quality. However, the current cover defect detection mostly uses a microscope to magnify the image and determine the defects through manual observation. The detection method that relies on manual labor is labor-intensive and inefficient, and is easily affected by subjective factors during the detection process, resulting in poor consistency of detection standards and poor accuracy of detection results. Summary of the invention

[0004] The present invention provides a glass cover plate defect detection device and method to solve the problems that manual detection of cover plate defects has low detection efficiency and is easily affected by subjective factors.

[0005] According to one aspect of the present invention, a glass cover defect detection device is provided, comprising: an image acquisition unit, a lighting light source and a bracket; wherein the lighting light source comprises a ring light source and a movable coaxial light source;

[0006] The image acquisition unit is fixed to the top of the bracket; the annular light source is arranged below the image acquisition unit and fixed to the bracket; the movable coaxial light source is located above the annular light source, and the movable coaxial light source is arranged on a slide rail and is connected to a cylinder; the cylinder is used to push the movable coaxial light source to move on the slide rail to adjust whether the movable coaxial light source is in the optical path between the image acquisition unit and the annular light source;

[0007] The annular light source and the movable coaxial light source are used to illuminate the glass cover plate to be tested, and the image acquisition unit is used to acquire the image to be tested of the glass cover plate to be tested for defect detection.

[0008] Optionally, the movable coaxial light source is pushed by the cylinder to move between the image acquisition unit and the annular light source, so that the image acquisition unit, the movable coaxial light source and the annular light source are arranged in a vertical direction.

[0009] Optionally, the image acquisition unit includes an AOI camera.

[0010] Optionally, the glass cover plate defect detection device further includes a vacuum adsorption stage;

[0011] The vacuum adsorption platform is arranged at the bottom of the bracket, and is used to carry and adsorb the glass cover plate to be tested, and control the glass cover plate to be tested to move to the bottom of the image acquisition unit.

[0012] Optionally, the glass cover defect detection device further includes a control unit;

[0013] The control unit is electrically connected to the image acquisition unit, the lighting source and the vacuum adsorption stage; the control unit is used to control the image acquisition unit, the lighting source and the vacuum adsorption stage to complete defect detection of the image to be tested.

[0014] According to another aspect of the present invention, there is provided a method for detecting defects in a glass cover plate, which is performed by using the device for detecting defects in a glass cover plate as described in any embodiment of the first aspect;

[0015] The glass cover plate defect detection method comprises:

[0016] Acquire image acquisition parameters and light source parameters, and set the image acquisition unit according to the image acquisition parameters, and set the lighting light source according to the light source parameters; wherein the lighting light source includes a ring light source and a movable coaxial light source;

[0017] Get defect parameter thresholds;

[0018] Controlling the image acquisition unit to acquire the image to be tested of the glass cover plate to be tested;

[0019] The defect parameter threshold and the image to be tested are input into a simulated defect model to perform defect detection and generate a quality inspection result of the glass cover plate to be tested; wherein the simulated defect model establishes a relationship model between the quality inspection standard of the glass cover plate to be tested and the defect parameter threshold.

[0020] Optionally, controlling the image acquisition unit to acquire the image to be tested of the glass cover plate to be tested includes:

[0021] When performing scratch defect detection, at least two image acquisition positions are set on the glass cover plate to be tested;

[0022] Image acquisition is performed at each of the image acquisition positions to obtain at least two images to be measured.

[0023] Optionally, the controlling the image acquisition unit to acquire the image to be tested of the glass cover plate to be tested further includes:

[0024] Switching the vacuum adsorption stage with different background colors to carry the glass cover plate to be tested;

[0025] According to the vacuum adsorption stage with different background colors, the corresponding image acquisition parameters and the light source parameters are set to perform multiple defect inspections on the glass cover plate to be inspected.

[0026] Optionally, the step of inputting the defect parameter threshold and the image to be tested into a simulated defect model, performing defect detection and generating a quality detection result of the glass cover plate to be tested includes:

[0027] Measuring and recording the defect size in the image to be tested; when performing scratch defect detection, measuring and calculating the average defect size in at least two images to be tested;

[0028] The defect size or the average defect size is compared with the defect parameter threshold to generate the quality inspection result.

[0029] Optionally, the image acquisition parameters include an exposure value, a cover plate grayscale value range, and a cover plate area range;

[0030] The light source parameters include light intensity and light emitting angle of the lamp beads;

[0031] The defect parameter thresholds include an edge corrosion depth threshold, a scratch area range threshold, a scratch width range threshold, and a scratch depth range threshold.

[0032] The glass cover defect detection device provided by the embodiment of the present invention is provided with an image acquisition unit and a lighting light source and fixed on a bracket. The lighting light source includes an annular light source and a movable coaxial light source, and the movable coaxial light source is arranged on a slide rail and connected with a cylinder. The movable coaxial light source can be moved on the slide rail under the action of the cylinder, so that when the movable coaxial light source is required to participate in the lighting of the glass cover to be tested, the movable coaxial light source can be moved along the slide rail to the vertical direction between the image acquisition unit and the annular light source; and when the movable coaxial light source is not required to participate in the lighting of the glass cover to be tested, the movable coaxial light source is moved out of the image acquisition unit and the annular light source. In this way, the glass cover defect detection device is used, and the defects on the glass cover to be tested can be clearly displayed in the collected image by combining the image acquisition unit with the annular light source and the movable coaxial light source, so that a clear image to be tested can be collected and defect detection with a unified standard can be performed. Compared with the method of relying on manual detection, the glass cover defect detection device provided by the embodiment of the present invention is used for defect detection, which is conducive to improving the efficiency of defect detection and the accuracy of the detection results.

[0033] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0035] Figure 1 is a structural schematic diagram of a glass cover defect detection device provided according to an embodiment of the present invention;

[0036] Figure 2 is a schematic diagram of an enlarged structure of a ring-shaped light source in a glass cover defect detection device provided according to an embodiment of the present invention;

[0037] Figure 3 is a schematic flow chart of a method for detecting defects in a glass cover plate provided according to an embodiment of the present invention;

[0038] Figure 4 is a specific flow chart of step S130 in a method for detecting defects in a glass cover provided according to an embodiment of the present invention;

[0039] Figure 5 is a specific flow chart of step S130 in another method for detecting defects in a glass cover provided according to an embodiment of the present invention;

[0040] Figure 6 1 is a schematic diagram of a specific flow chart of step S140 in another method for detecting defects in a glass cover provided according to an embodiment of the present invention. DETAILED DESCRIPTION

[0041] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0042] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0043] An embodiment of the present invention provides a glass cover plate defect detection device. Figure 1 A structural schematic diagram of a glass cover plate defect detection device provided by an embodiment of the present invention, Figure 2 1 is a schematic diagram of an enlarged structure of a ring light source in a glass cover defect detection device provided by an embodiment of the present invention. Figure 1 and Figure 2 The glass cover defect detection device includes: an image acquisition unit 10, a lighting light source 20 and a bracket 30; wherein the lighting light source 20 includes a ring light source 21 and a movable coaxial light source 22.

[0044] The image acquisition unit 10 is fixed on the top of the bracket 30; the annular light source 21 is arranged below the image acquisition unit 10 and fixed on the bracket 30; the movable coaxial light source 22 is located above the annular light source 21, and the movable coaxial light source 22 is arranged on the slide rail and is connected to a cylinder; the cylinder is used to push the movable coaxial light source 22 to move on the slide rail to adjust whether the movable coaxial light source 22 is in the optical path between the image acquisition unit 10 and the annular light source 21; the annular light source 21 and the movable coaxial light source 22 are used to illuminate the glass cover plate to be tested, and the image acquisition unit 10 is used to collect the image to be tested of the glass cover plate to be tested for defect detection.

[0045] Specifically, the image acquisition unit 10 and the lighting light source 20 are fixed on the bracket 30, wherein the image acquisition unit 10 is on the top and the lighting light source 20 is on the bottom, so that the image acquisition unit 10 and the lighting light source 20 are arranged in the vertical direction. Exemplarily, the image acquisition unit 10 includes an AOI camera. AOI (Automatically optical inspection) is an automatic optical inspection, that is, a means of automatic inspection through optical system imaging, and is one of the many automatic image sensing inspection technologies. The working principle of the AOI camera is to use camera technology to output the reflected light intensity of the inspected object in a quantitative grayscale value, and analyze and determine the defects and classify them by comparing them with the grayscale value of the standard image.

[0046] The lighting light source 20 includes a ring light source 21 and a movable coaxial light source 22, wherein the ring light source 21 is a light source composed of high-density LED lamp beads arranged in a ring shape, which can provide a variety of different illumination angles, for example: including 0-degree ring light, 30-degree ring light and 60-degree ring light. Compared with the 0-degree ring light, the 30-degree ring light and the 60-degree ring light have stronger illumination light in the horizontal direction, and illuminate the uneven parts of the object to be measured from all sides at a low angle. The movable coaxial light source 22 is a standard linear light, and the coaxial light transmits light from the side to the semi-reflecting mirror, and the mirror reflects the light to the target. The mirror reflected light is allowed to return to the AOI camera, while the diffuse light from the target is rejected, thereby forming a contrast at the edge point of the object to be measured. In addition, the farther the light is from the object to be measured, the greater the suppression of diffuse light, resulting in greater image contrast and clarity. Coaxial light sources are mainly used to detect flat objects with severe reflectivity, such as glass. Coaxial light sources can highlight the unevenness of the object's surface and overcome the interference caused by surface reflection. They are mainly used to detect bumps, scratches, cracks and foreign matter on the flat and smooth surface of objects.

[0047] The image acquisition unit 10 and the annular light source 21 are arranged in the vertical direction. The glass cover plate to be tested is located below the annular light source 21, and its center corresponds to the lens of the AOI camera serving as the image acquisition unit 10. The annular light source 21 emits light to the glass cover plate to be tested below. The lens of the AOI camera is located below the camera and is used to capture an image of the glass cover plate to be tested below the camera. In the embodiment of the present invention, the movable coaxial light source 22 is connected to the cylinder and is disposed on a slide rail. The cylinder and the slide rail are not in contact with each other. Figure 1As shown in . Therefore, when the defects on the glass cover plate to be tested are not clearly displayed by the annular light source 21 alone, illustratively, the movable coaxial light source 22 is moved between the image acquisition unit 10 and the annular light source 21 under the push of the cylinder, so that the image acquisition unit 10, the movable coaxial light source 22 and the annular light source 21 are arranged in the vertical direction, that is, the movable coaxial light source 22 participates in the lighting of the glass cover plate to be tested, so that the defects on the glass cover plate to be tested are clearly displayed. When the defects on the glass cover plate to be tested can also be clearly displayed by the annular light source 21 alone, the movable coaxial light source 22 is not required to participate in the lighting. At this time, the cylinder acts on the movable coaxial light source 22 to retract it. In this way, the combination of the AOI camera, the annular light source 21 and the movable coaxial light source 22 can make the defects on the glass cover plate to be tested clearly displayed, so that a clear image to be tested can be collected and defect detection with a unified standard can be performed, which is conducive to improving the efficiency of defect detection and the accuracy of the detection results.

[0048] The glass cover defect detection device provided by the embodiment of the present invention is provided with an image acquisition unit and a lighting light source and fixed on a bracket. The lighting light source includes an annular light source and a movable coaxial light source, and the movable coaxial light source is arranged on a slide rail and connected with a cylinder. The movable coaxial light source can be moved on the slide rail under the action of the cylinder, so that when the movable coaxial light source is required to participate in the lighting of the glass cover to be tested, the movable coaxial light source can be moved along the slide rail to the vertical direction between the image acquisition unit and the annular light source; and when the movable coaxial light source is not required to participate in the lighting of the glass cover to be tested, the movable coaxial light source is moved out of the image acquisition unit and the annular light source. In this way, the glass cover defect detection device is used, and the defects on the glass cover to be tested can be clearly displayed in the collected image by combining the image acquisition unit with the annular light source and the movable coaxial light source, so that a clear image to be tested can be collected and defect detection with a unified standard can be performed. Compared with the method of relying on manual detection, the glass cover defect detection device provided by the embodiment of the present invention is used for defect detection, which is conducive to improving the efficiency of defect detection and the accuracy of the detection results.

[0049] Optionally, based on the above embodiment, the glass cover defect detection device further includes a vacuum adsorption carrier.

[0050] The vacuum adsorption stage is disposed at the bottom of the bracket 30 , and is used to carry and adsorb the glass cover plate to be tested, and control the glass cover plate to be tested to move to just below the image acquisition unit 10 .

[0051] Specifically, the vacuum adsorption stage can adsorb the glass cover plate to be tested placed thereon, and keep the relative position between the glass cover plate to be tested and the vacuum adsorption stage from changing easily. The vacuum adsorption stage can drive the glass cover plate to be tested to move, so that the center of the glass cover plate to be tested moves to correspond to the lens of the image acquisition unit 10, which is conducive to the image acquisition unit 10 to capture a clear image of the glass cover plate to be tested.

[0052] Optionally, based on the above embodiments, the glass cover defect detection device further includes a control unit.

[0053] The control unit is electrically connected to the image acquisition unit 10, the lighting light source 20 and the vacuum adsorption stage; the control unit is used to control the image acquisition unit 10, the lighting light source 20 and the vacuum adsorption stage to complete defect detection of the image to be tested.

[0054] Specifically, the control unit is connected to the image acquisition unit 10, the lighting source 20 and the vacuum adsorption stage. Figure 1 The control unit controls the vacuum adsorption stage to drive the glass cover plate to be tested to move to a position corresponding to the lens of the image acquisition unit 10. The control unit controls the lighting light source 20 to illuminate the glass cover plate to be tested, and adjusts the relevant parameters of the lighting light source 20 to make the defects on the glass cover plate to be tested clearly visible. The control unit controls the image acquisition unit 10 to acquire the image to be tested of the glass cover plate to be tested under the corresponding image acquisition conditions, and performs defect detection on the image to be tested according to a certain defect detection standard.

[0055] The embodiment of the present invention also provides a method for detecting defects of a glass cover plate. Figure 3 1 is a flow chart of a method for detecting defects in a glass cover provided by an embodiment of the present invention. The method for detecting defects in a glass cover is implemented by using a device for detecting defects in a glass cover provided by any of the above embodiments. Figure 3 As shown, the glass cover defect detection method specifically includes the following steps:

[0056] S110, acquiring image acquisition parameters and light source parameters, and setting the image acquisition unit according to the image acquisition parameters, and setting the lighting light source according to the light source parameters; wherein the lighting light source includes a ring light source and a movable coaxial light source.

[0057] Exemplarily, the image acquisition parameters include exposure value, cover plate grayscale value range and cover plate area range; light source parameters include illumination intensity and lamp bead emitting angle. Among them, by setting the illumination intensity and lamp bead emitting angle of the annular light source and the movable coaxial light source, the defects on the glass cover plate to be tested can be clearly displayed in the captured image under the lighting effect of the annular light source and the movable coaxial light source, which is conducive to improving the accuracy of defect detection. Setting the exposure value when shooting for the image acquisition unit can ensure that the captured image can clearly show the scratch defect on the glass cover plate to be tested. The cover plate grayscale value range includes the minimum grayscale value and the maximum grayscale value set when shooting the glass cover plate to be tested, and the cover plate area range includes the minimum shooting area and the maximum shooting area set when shooting the glass cover plate to be tested. By setting the corresponding image acquisition parameters for the image acquisition unit in advance, it can be ensured that the image acquisition unit captures the area within the edge of the glass cover plate to be tested, preventing the captured image from containing areas outside the glass cover plate to be tested, thereby affecting the accuracy of subsequent defect detection.

[0058] S120: Obtain defect parameter thresholds.

[0059] Specifically, the defect parameter threshold is used to limit the size of defects that do not meet the requirements when performing defect detection. Exemplarily, the defect parameter threshold includes an edge corrosion depth threshold, a scratch area range threshold, a scratch width range threshold, and a scratch depth range threshold. It should be noted that defect detection can be performed on the glass cover plate to be tested according to a variety of different requirements, and corresponding defect parameter thresholds correspond to different requirements. Commonly used defect parameter thresholds can be stored in advance, so that when defect detection is performed on the glass cover plate to be tested with corresponding requirements, the pre-stored defect parameter threshold can be directly called, which is conducive to improving the efficiency of defect detection.

[0060] S130, controlling the image acquisition unit to acquire the image to be tested of the glass cover plate to be tested.

[0061] Specifically, the image acquisition unit is controlled to shoot with the set corresponding image acquisition parameters to acquire the corresponding image to be tested for the entire glass cover plate to be tested, so as to determine all defects existing on the glass cover plate to be tested, which can effectively prevent the occurrence of defect omissions and is conducive to improving the yield rate of the glass cover plate.

[0062] S140, inputting the defect parameter threshold and the image to be tested into the simulated defect model, performing defect detection and generating a quality inspection result of the glass cover plate to be tested; wherein the simulated defect model establishes a relationship model between the quality inspection standard of the glass cover plate to be tested and the defect parameter threshold.

[0063] Specifically, the set defect parameter threshold and the collected image of the glass cover plate to be tested are input into the simulated defect model, the defects on the glass cover plate to be tested are identified, and the various dimensions of the defects are measured to determine whether the defects meet the requirements of the corresponding defect parameter threshold, thereby obtaining the quality inspection result of the glass cover plate to be tested, and determining whether the glass cover plate to be tested is a good product or a defective product. Compared with relying on manual inspection and judgment, the glass cover plate defect detection method provided by the embodiment of the present invention automatically generates an algorithm model of the simulated defect model according to the defect parameter threshold, without the need for a large amount of simulation training, which can greatly reduce the development time and improve the efficiency of defect detection. Using a unified defect parameter threshold as the defect detection standard can effectively improve the accuracy of defect detection of the glass cover plate to be tested, thereby improving the yield rate of the glass cover plate to be tested.

[0064] The glass cover plate defect detection method provided by the embodiment of the present invention obtains the set image acquisition parameters and light source parameters to ensure that the existing defects can be clearly displayed in the image collected from the glass cover plate to be tested. The set defect parameter threshold is obtained so that the defect detection is performed on each glass cover plate to be tested with a unified detection standard under the same detection requirements, which is conducive to improving the accuracy of defect detection on the glass cover plate to be tested. Under the conditions of corresponding image acquisition parameters and light source parameters, the image acquisition unit is controlled to perform complete image acquisition on the glass cover plate to be tested to obtain the image to be tested. The image to be tested and the defect parameter threshold are input into the simulated defect model, the defects on the glass cover plate to be tested are identified, and the size of the defects is measured. The defect parameter threshold is used as the detection standard to determine whether the defect meets the requirements, thereby determining whether the glass cover plate to be tested is a good product. Compared with the manual method of defect detection on the glass cover plate to be tested, the glass cover plate defect detection method provided by the embodiment of the present invention can effectively improve the accuracy of defect detection on the glass cover plate to be tested, thereby improving the yield rate of the glass cover plate to be tested.

[0065] Optionally, Figure 4 FIG. 1 is a schematic diagram of a specific flow chart of step S130 in a method for detecting defects in a glass cover provided by an embodiment of the present invention. Figure 4 As shown, controlling the image acquisition unit in step S130 to acquire the image to be tested of the glass cover plate to be tested specifically includes the following steps:

[0066] S131. When performing scratch defect detection, at least two image acquisition positions are set on the glass cover plate to be tested.

[0067] Specifically, since the length of the scratch defect is relatively long, when performing scratch defect detection on the glass cover to be tested, at least two image acquisition positions may be set near the location of the scratch defect so as to capture a relatively complete image of the scratch defect.

[0068] S132, performing image acquisition at each image acquisition position to obtain at least two images to be tested.

[0069] Specifically, images to be tested are collected at multiple image collection positions respectively, and the scratch defect is identified and detected based on at least two obtained images to be tested, thereby facilitating improving the accuracy of scratch defect detection.

[0070] Optionally, Figure 5 FIG. 1 is a schematic diagram of a specific flow chart of step S130 in another method for detecting defects in a glass cover provided by an embodiment of the present invention. Figure 5 As shown, controlling the image acquisition unit in step S130 to acquire the image to be tested of the glass cover plate to be tested specifically includes the following steps:

[0071] S133, switching the vacuum adsorption stage with a different background color to carry the glass cover plate to be tested.

[0072] Specifically, since the glass cover plate to be tested is made of transparent glass, the background color of the vacuum adsorption stage carrying the glass cover plate to be tested has a certain influence on the defect presentation on the glass cover plate to be tested. To ensure the accuracy of defect detection, the vacuum adsorption stage with different background colors can be replaced to carry the glass cover plate to be tested for defect detection.

[0073] S134, according to the vacuum adsorption stage with different background colors, set corresponding image acquisition parameters and light source parameters, and perform multiple defect inspections on the glass cover plate to be tested.

[0074] Specifically, after switching the vacuum adsorption platforms with different background colors to carry the glass cover plate to be tested, appropriate image acquisition parameters and light source parameters need to be set corresponding to the background colors of the different vacuum adsorption platforms, so that the defects of the glass cover plate to be tested can be clearly presented when being carried by the vacuum adsorption platforms with different background colors.

[0075] Optionally, Figure 6 FIG. 1 is a schematic diagram of a specific flow chart of step S140 in another method for detecting defects in a glass cover provided by an embodiment of the present invention. Figure 6 As shown, in step S140, the defect parameter threshold and the image to be tested are input into the simulated defect model to perform defect detection and generate the quality inspection result of the glass cover plate to be tested, which specifically includes the following steps:

[0076] S141, measuring and recording the defect size in the image to be tested; when performing scratch defect detection, measuring and calculating the average defect size in at least two images to be tested.

[0077] Specifically, the size of the defect in the image to be tested is measured. Exemplarily, the size of the defect may include the edge corrosion depth, scratch length, scratch width and scratch depth of the glass cover plate to be tested, which are not limited here. The measured edge corrosion depth of the glass cover plate to be tested is used to detect whether the glass cover plate to be tested has a chipping defect. In addition, for a relatively long scratch defect, at least two images to be tested are obtained by collecting at least two image acquisition positions, and the relevant sizes of the scratch defects in the at least two images to be tested are measured respectively, and the average values ​​of the relevant sizes of the scratch defects are calculated to obtain the average defect size, so that the average defect size can be used to detect and determine the scratch defect later.

[0078] S142. Compare the defect size or the average defect size with the defect parameter threshold to generate a quality inspection result.

[0079] Specifically, the measured defect size or average defect size is compared with a preset defect parameter threshold. If the defect size or average defect size does not exceed the defect parameter threshold, it indicates that the defect meets the detection requirements, and the generated quality inspection result is that the glass cover plate to be tested can be regarded as a good product. If the defect size or average defect size exceeds the defect parameter threshold, it indicates that the defect does not meet the detection requirements, that is, the defect is not within an acceptable range for practical applications, and therefore, the generated quality inspection result is that the glass cover plate to be tested is a defective product.

[0080] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A glass cover defect detection device, characterized in that: include: An image acquisition unit, a lighting light source and a bracket; wherein the lighting light source includes a ring light source and a movable coaxial light source; The image acquisition unit is fixed to the top of the bracket; the annular light source is arranged below the image acquisition unit and fixed to the bracket; the movable coaxial light source is located above the annular light source, and the movable coaxial light source is arranged on a slide rail and is connected to a cylinder; the cylinder is used to push the movable coaxial light source to move on the slide rail to adjust whether the movable coaxial light source is in the optical path between the image acquisition unit and the annular light source; The annular light source and the movable coaxial light source are used to illuminate the glass cover plate to be tested, and the image acquisition unit is used to acquire the image to be tested of the glass cover plate to be tested for defect detection.

2. The glass cover defect detection device according to claim 1, characterized in that: The movable coaxial light source is pushed by the cylinder to move between the image acquisition unit and the annular light source, so that the image acquisition unit, the movable coaxial light source and the annular light source are arranged in a vertical direction.

3. The glass cover defect detection device according to claim 1, characterized in that: The image acquisition unit includes an AOI camera.

4. The glass cover defect detection device according to claim 1, characterized in that: Also includes a vacuum adsorption stage; The vacuum adsorption platform is arranged at the bottom of the bracket, and is used to carry and adsorb the glass cover plate to be tested, and control the glass cover plate to be tested to move to the bottom of the image acquisition unit.

5. The glass cover defect detection device according to claim 4, characterized in that: Also includes a control unit; The control unit is electrically connected to the image acquisition unit, the lighting source and the vacuum adsorption stage; the control unit is used to control the image acquisition unit, the lighting source and the vacuum adsorption stage to complete defect detection of the image to be tested.

6. A method for detecting defects in a glass cover, characterized in that: The method is performed by using the glass cover plate defect detection device as described in any one of claims 1 to 5; The glass cover plate defect detection method comprises: Acquire image acquisition parameters and light source parameters, and set the image acquisition unit according to the image acquisition parameters, and set the lighting light source according to the light source parameters; wherein the lighting light source includes a ring light source and a movable coaxial light source; Get defect parameter thresholds; Controlling the image acquisition unit to acquire the image to be tested of the glass cover plate to be tested; The defect parameter threshold and the image to be tested are input into a simulated defect model to perform defect detection and generate a quality inspection result of the glass cover plate to be tested; wherein the simulated defect model establishes a relationship model between the quality inspection standard of the glass cover plate to be tested and the defect parameter threshold.

7. The method for detecting defects in a glass cover according to claim 6, wherein: The controlling the image acquisition unit to acquire the image to be tested of the glass cover plate to be tested comprises: When performing scratch defect detection, at least two image acquisition positions are set on the glass cover plate to be tested; Image acquisition is performed at each of the image acquisition positions to obtain at least two images to be measured.

8. The method for detecting defects in a glass cover according to claim 7, characterized in that: The controlling the image acquisition unit to acquire the image to be tested of the glass cover plate to be tested also includes: Switching the vacuum adsorption stage with different background colors to carry the glass cover plate to be tested; According to the vacuum adsorption stage with different background colors, the corresponding image acquisition parameters and the light source parameters are set to perform multiple defect inspections on the glass cover plate to be inspected.

9. The method for detecting defects in a glass cover according to claim 6, wherein: The step of inputting the defect parameter threshold and the image to be tested into a simulated defect model, performing defect detection and generating a quality inspection result of the glass cover plate to be tested comprises: Measuring and recording the defect size in the image to be tested; when performing scratch defect detection, measuring and calculating the average defect size in at least two images to be tested; The defect size or the average defect size is compared with the defect parameter threshold to generate the quality inspection result.

10. The method for detecting defects in a glass cover according to claim 6, wherein: The image acquisition parameters include exposure value, cover plate gray value range and cover plate area range; The light source parameters include light intensity and light emitting angle of the lamp beads; The defect parameter thresholds include an edge corrosion depth threshold, a scratch area range threshold, a scratch width range threshold, and a scratch depth range threshold.

Images