Heat dissipation parameter acquisition method and device, electronic equipment and storage medium

By obtaining the target current value and actual output current value of the electronic device, and determining the heat dissipation parameters when specific test conditions are met, the problem of low accuracy in obtaining heat dissipation parameters in the prior art is solved, and the accuracy of heat dissipation parameters is improved.

CN119492925APending Publication Date: 2025-02-21BEIJING XIAOMI MOBILE SOFTWARE CO LTD
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Patent Information

Application Number
CN202311021827.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2023-08-14
Publication Date
2025-02-21

AI Technical Summary

Technical Problem

The method for obtaining heat dissipation parameters in the prior art has the problem of low accuracy.

Method used

By obtaining the target current value when the output power value of the electronic device is the target power value, obtain the actual output current value, and determine the heat dissipation parameters of the electronic device when specific test conditions are met.

Benefits of technology

The accuracy of the heat dissipation parameters is improved to ensure that the heat dissipation parameters of the electronic equipment can be accurately obtained when the target power value and actual output current value meet the test conditions.

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Abstract

The invention relates to a heat dissipation parameter acquisition method and device, electronic equipment and a storage medium, and belongs to the technical field of heat dissipation. The method comprises the following steps: acquiring a target current value corresponding to the electronic equipment when an output power value of the electronic equipment is a target power value; acquiring an actual output current value of the electronic equipment; determining that the target current value and the actual output current value meet a test condition, and obtaining a first operation parameter of the electronic device, the first operation parameter being determined by the electronic device under the condition that a second operation parameter remains unchanged; and based on the first operation parameter, determining a heat dissipation parameter of the electronic equipment. Therefore, the target current value can be determined based on the target power value, and when the target current value and the actual output current value meet the test conditions, the first operation parameter is acquired to obtain the heat dissipation parameter, so that the accuracy of the heat dissipation parameter is improved.
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Description

Technical Field

[0001] The present disclosure relates to the field of heat dissipation technology, and in particular to a method, device, electronic device and storage medium for obtaining heat dissipation parameters. Background Art

[0002] The heat dissipation parameters of electronic devices are used to characterize the heat dissipation performance of electronic devices and are important indicators for evaluating the product quality of electronic devices. The better the heat dissipation performance of electronic devices, the more stable the temperature of the electronic devices, which is conducive to the normal operation of the electronic devices. However, the methods for obtaining heat dissipation parameters in related technologies have the problem of low accuracy of heat dissipation parameters. Summary of the invention

[0003] The present disclosure provides a method, device, electronic device, computer-readable storage medium, and computer program product for obtaining heat dissipation parameters, so as to at least solve the problem of low accuracy of heat dissipation parameters in the method for obtaining heat dissipation parameters in the related art. The technical solution of the present disclosure is as follows:

[0004] According to a first aspect of an embodiment of the present disclosure, a method for obtaining heat dissipation parameters is provided, comprising: obtaining a target current value corresponding to the electronic device when the output power value of the electronic device is a target power value; obtaining an actual output current value of the electronic device; determining that the target current value and the actual output current value satisfy a test condition, and obtaining a first operating parameter of the electronic device, wherein the first operating parameter is determined by the electronic device when a second operating parameter remains unchanged; and determining a heat dissipation parameter of the electronic device based on the first operating parameter.

[0005] In one embodiment of the present disclosure, the method further includes: obtaining a first average value of the actual output current values ​​of the N electronic devices after sorting, wherein the multiple actual output current values ​​are sorted from early to late according to the acquisition time, and N is a positive integer; based on the target current value and the first average value, identifying whether the test condition is met.

[0006] In one embodiment of the present disclosure, identifying whether a test condition is met based on the target current value and the first average value includes: obtaining the absolute value of the difference between the target current value and the first average value; if the absolute value is greater than a first set threshold, identifying that the test condition is not met; if the absolute value is less than or equal to the first set threshold, identifying that the test condition is met.

[0007] In one embodiment of the present disclosure, after obtaining the actual output current value of the electronic device, the method further includes: obtaining the standard deviation of the last N actual output current values;

[0008] The identification of whether the test condition is met based on the target current value and the first average value includes: if the absolute value is less than or equal to the first set threshold, and the standard deviation at the end of the sorting is greater than the second set threshold, identifying that the test condition is not met, wherein the multiple standard deviations are sorted from early to late according to the acquisition time; if the absolute value is less than or equal to the first set threshold, and the standard deviation at the end of the sorting is less than or equal to the second set threshold, and at least one standard deviation among the M standard deviations after sorting is greater than the second set threshold, identifying that the test condition is not met; if the absolute value is less than or equal to the first set threshold, and the standard deviation at the end of the sorting is less than or equal to the second set threshold, and the M standard deviations after sorting are all less than or equal to the second set threshold, identifying that the test condition is met.

[0009] In one embodiment of the present disclosure, the method further includes: if the test condition is not met and the absolute difference is greater than the first set threshold, adjusting the second operating parameter, and returning to execute the measurement of the actual output current value of the electronic device and its subsequent steps.

[0010] In one embodiment of the present disclosure, the adjusting of the second operating parameter includes: when the first average value is greater than the target current value, lowering the second operating parameter to lower the actual output current value; when the first average value is less than the target current value, increasing the second operating parameter to increase the actual output current value.

[0011] In one embodiment of the present disclosure, the electronic device is deployed with a central processing unit, and the adjusting of the second operating parameter includes: adjusting the frequency of the central processing unit; in response to the completion of the frequency adjustment of the central processing unit, adjusting the load of the central processing unit; in response to the completion of the load adjustment of the central processing unit, adjusting the backlight brightness of the electronic device.

[0012] In one embodiment of the present disclosure, the electronic device is deployed with a graphics processor, and the adjusting of the second operating parameter further includes: in response to the completion of backlight brightness adjustment of the electronic device, adjusting the frequency of the graphics processor; in response to the completion of frequency adjustment of the graphics processor, adjusting the load of the graphics processor.

[0013] In one embodiment of the present disclosure, the first operating parameter includes the output power value and the temperature value of the electronic device; determining the heat dissipation parameter of the electronic device based on the first operating parameter includes: determining the heat dissipation coefficient based on a second average value of multiple output power values, a third average value of multiple temperature values ​​of the electronic device and an ambient temperature value.

[0014] In one embodiment of the present disclosure, before obtaining the actual output current value of the electronic device, it also includes: obtaining a fourth average value of the maximum value and the minimum value of the actual output current value; if the target current value is greater than the fourth average value, adjusting the second operating parameter to a first value to adjust the actual output current value to the fourth average value, wherein the first value is the second operating parameter when the actual output current value is the fourth average value; if the target current value is less than or equal to the fourth average value, adjusting the second operating parameter to a second value to adjust the actual output current value to the minimum value, wherein the second value is the second operating parameter when the actual output current value is the minimum value.

[0015] In one embodiment of the present disclosure, the method further includes: determining that the target current value and the actual output current value do not satisfy the test condition, returning to the step of obtaining the actual output current value of the electronic device and subsequent steps until the target current value and the actual output current value satisfy the test condition.

[0016] According to a second aspect of an embodiment of the present disclosure, a device for acquiring heat dissipation parameters is provided, comprising: a first acquisition module, configured to execute acquisition of a target current value corresponding to the electronic device when the output power value of the electronic device is a target power value; a second acquisition module, configured to execute acquisition of an actual output current value of the electronic device; a third acquisition module, configured to execute determination that the target current value and the actual output current value satisfy a test condition, and acquire a first operating parameter of the electronic device, wherein the first operating parameter is determined by the electronic device when the second operating parameter remains unchanged; and a determination module, configured to execute determination of the heat dissipation parameter of the electronic device based on the first operating parameter.

[0017] In one embodiment of the present disclosure, the device also includes: an identification module, which is configured to execute: obtaining a first average value of N actual output current values ​​of the electronic devices after sorting, wherein the multiple actual output current values ​​are sorted from early to late according to the acquisition time, and N is a positive integer; based on the target current value and the first average value, identifying whether the test condition is met.

[0018] In one embodiment of the present disclosure, the identification module is further configured to perform: obtaining the absolute value of the difference between the target current value and the first average value; if the absolute value is greater than a first set threshold, identifying that the test condition is not met; if the absolute value is less than or equal to the first set threshold, identifying that the test condition is met.

[0019] In one embodiment of the present disclosure, after obtaining the actual output current value of the electronic device, the identification module is further configured to perform: obtaining the standard deviation of the last N actual output current values;

[0020] The identification module is further configured to execute: if the absolute value is less than or equal to the first set threshold, and the standard deviation at the end of the sorting is greater than the second set threshold, identifying that the test condition is not met, wherein the multiple standard deviations are sorted from early to late according to the acquisition time; if the absolute value is less than or equal to the first set threshold, and the standard deviation at the end of the sorting is less than or equal to the second set threshold, and at least one standard deviation among the M standard deviations after sorting is greater than the second set threshold, identifying that the test condition is not met; if the absolute value is less than or equal to the first set threshold, and the standard deviation at the end of the sorting is less than or equal to the second set threshold, and the M standard deviations after sorting are all less than or equal to the second set threshold, identifying that the test condition is met.

[0021] In one embodiment of the present disclosure, the device also includes: an adjustment module, which is configured to execute: if the test condition is not met and the absolute difference is greater than the first set threshold, adjust the second operating parameter, and return to execute the measurement of the actual output current value of the electronic device and its subsequent steps.

[0022] In one embodiment of the present disclosure, the adjustment module is further configured to perform: when the first average value is greater than the target current value, reducing the second operating parameter to reduce the actual output current value; when the first average value is less than the target current value, increasing the second operating parameter to increase the actual output current value.

[0023] In one embodiment of the present disclosure, the electronic device is deployed with a central processing unit, and the adjustment module is further configured to execute: adjusting the frequency of the central processing unit; in response to the completion of the frequency adjustment of the central processing unit, adjusting the load of the central processing unit; in response to the completion of the load adjustment of the central processing unit, adjusting the backlight brightness of the electronic device.

[0024] In one embodiment of the present disclosure, the electronic device is deployed with a graphics processor, and the adjustment module is further configured to execute: in response to the completion of backlight brightness adjustment of the electronic device, adjusting the frequency of the graphics processor; in response to the completion of frequency adjustment of the graphics processor, adjusting the load of the graphics processor.

[0025] In one embodiment of the present disclosure, the first operating parameter includes the output power value and the temperature value of the electronic device; the determination module is further configured to execute: determining the heat dissipation coefficient based on a second average value of multiple output power values, a third average value of multiple temperature values ​​of the electronic device and the ambient temperature value.

[0026] In one embodiment of the present disclosure, before obtaining the actual output current value of the electronic device, the device also includes: an adjustment module, which is configured to execute: obtaining a fourth average value of the maximum value and the minimum value of the actual output current value; if the target current value is greater than the fourth average value, adjusting the second operating parameter to a first value to adjust the actual output current value to the fourth average value, wherein the first value is the second operating parameter when the actual output current value is the fourth average value; if the target current value is less than or equal to the fourth average value, adjusting the second operating parameter to a second value to adjust the actual output current value to the minimum value, wherein the second value is the second operating parameter when the actual output current value is the minimum value.

[0027] In one embodiment of the present disclosure, the third acquisition module is further configured to execute: determining that the target current value and the actual output current value do not meet the test condition, returning to the step of obtaining the actual output current value of the electronic device and subsequent steps until the target current value and the actual output current value meet the test condition.

[0028] According to a third aspect of an embodiment of the present disclosure, there is provided an electronic device, comprising a processor; and a memory for storing instructions executable by the processor; wherein the processor is configured to implement the steps of the method described in the first aspect of the embodiment of the present disclosure.

[0029] According to a fourth aspect of an embodiment of the present disclosure, a computer-readable storage medium is provided, on which computer program instructions are stored. When the program instructions are executed by a processor, the steps of the method described in the first aspect of the embodiment of the present disclosure are implemented.

[0030] According to a fifth aspect of an embodiment of the present disclosure, a computer program product is provided, comprising a computer program, wherein when the computer program is executed by a processor of an electronic device, the computer program implements the steps of the method described in the first aspect of the embodiment of the present disclosure.

[0031] The technical solution provided by the embodiment of the present disclosure brings at least the following beneficial effects: obtaining the target current value corresponding to the electronic device when the output power value of the electronic device is the target power value, obtaining the actual output current value of the electronic device, determining whether the target current value and the actual output current value meet the test conditions, obtaining the first operating parameter of the electronic device, wherein the first operating parameter is determined by the electronic device when the second operating parameter remains unchanged, and determining the heat dissipation parameter of the electronic device based on the first operating parameter. Thus, the target current value can be determined based on the target power value, and the first operating parameter is not obtained until the target current value and the actual output current value meet the test conditions, which helps to improve the accuracy of the heat dissipation parameter.

[0032] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present disclosure. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] The drawings herein are incorporated into and constitute a part of the specification, illustrate embodiments consistent with the present disclosure, and together with the description are used to explain the principles of the present disclosure, and do not constitute improper limitations on the present disclosure.

[0034] Figure 1 The figure is a flow chart of a method for obtaining heat dissipation parameters according to an exemplary embodiment.

[0035] Figure 2 is a flow chart of a method for acquiring heat dissipation parameters according to another exemplary embodiment.

[0036] Figure 3 is a flow chart of a method for acquiring heat dissipation parameters according to another exemplary embodiment.

[0037] Figure 4 is a flow chart of a method for acquiring heat dissipation parameters according to another exemplary embodiment.

[0038] Figure 5 is a flow chart of a method for acquiring heat dissipation parameters according to another exemplary embodiment.

[0039] Figure 6 The figure is a block diagram of a device for acquiring heat dissipation parameters according to an exemplary embodiment.

[0040] Figure 7 It is a block diagram of an electronic device according to an exemplary embodiment. DETAILED DESCRIPTION

[0041] In order to enable ordinary persons in the art to better understand the technical solutions of the present disclosure, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the accompanying drawings.

[0042] It should be noted that the terms "first", "second", etc. in the specification and claims of the present disclosure and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present disclosure described herein can be implemented in an order other than those illustrated or described herein. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. Instead, they are merely examples of devices and methods consistent with some aspects of the present disclosure as detailed in the appended claims.

[0043] The acquisition, storage, use, and processing of data in the technical solution disclosed in this disclosure are in compliance with the relevant provisions of national laws and regulations.

[0044] Figure 1 is a flow chart of a method for obtaining heat dissipation parameters according to an exemplary embodiment. Figure 1 As shown, the method for obtaining heat dissipation parameters of the embodiment of the present disclosure includes the following steps.

[0045] S101, obtaining a target current value corresponding to the electronic device when the output power value of the electronic device is a target power value.

[0046] It should be noted that the execution subject of the method for obtaining the heat dissipation parameters of the embodiment of the present disclosure is an electronic device, and the electronic device includes a mobile phone, a notebook, a desktop computer, a vehicle-mounted terminal, a smart home appliance, a wearable device, etc. Among them, the wearable device may include a wrist-worn device (such as a smart watch, a smart bracelet), a head-worn device, a foot-worn device, etc. The method for obtaining the heat dissipation parameters of the embodiment of the present disclosure can be executed by the device for obtaining the heat dissipation parameters of the embodiment of the present disclosure, and the device for obtaining the heat dissipation parameters of the embodiment of the present disclosure can be configured in any electronic device to execute the method for obtaining the heat dissipation parameters of the embodiment of the present disclosure.

[0047] It should be noted that the target current value refers to the reference output current value of the electronic device when the output power value of the electronic device is the target power value. The reference output current value refers to the ideal output current value of the electronic device under a certain operating state, which can be calibrated or calculated in advance. The target current value is a reference output current value. The target power value refers to the ideal output power value of the electronic device during the measurement process, which can be calibrated or calculated in advance. There are no excessive restrictions on the target power value and the target current value.

[0048] In one implementation, a mapping relationship between the output power value of the electronic device and the reference output current value can be pre-established, the mapping relationship can be queried based on the target power value, and the output power value can be used as the reference output current value mapped to the target power value as the target current value.

[0049] S102, obtaining an actual output current value of the electronic device.

[0050] It should be noted that the actual output current value refers to the real output current value of the electronic device under a certain operating state, which can be measured. The measurement of the actual output current value of the electronic device can be achieved by using any electronic device output current value measurement method in the relevant technology, and no further restrictions are made here.

[0051] In one embodiment, measuring the actual output current value of the electronic device includes measuring the actual output current value of the electronic device according to a set period, so as to achieve periodic measurement of the actual output current value. It should be noted that there are no excessive restrictions on the set period, such as 50 milliseconds, 200 milliseconds, 1 second, 2 seconds, 3 seconds, etc.

[0052] S103, determining whether the target current value and the actual output current value meet the test condition, and obtaining a first operating parameter of the electronic device, wherein the first operating parameter is determined by the electronic device when the second operating parameter remains unchanged.

[0053] In the embodiment of the present disclosure, if the target current value and the actual output current value do not meet the test condition, the first operating parameter is not obtained at this time, and the heat dissipation parameter is not obtained, that is, the first operating parameter is obtained only when the target current value and the actual output current value meet the test condition, and then the heat dissipation parameter is obtained. It can be understood that the test condition refers to the condition for obtaining the first operating parameter, and also refers to the condition for obtaining the heat dissipation parameter.

[0054] In one embodiment, the method further includes identifying whether the target current value and the actual output current value satisfy a test condition.

[0055] In some examples, identifying whether a test condition is satisfied based on the target current value and the actual output current value includes obtaining a difference between the target current value and the actual output current value, and identifying whether the test condition is satisfied based on the difference.

[0056] In some examples, whether the test condition is met is identified based on the difference, including if the absolute value of the difference is greater than a first set threshold, it indicates that the target current value and the actual output current value differ greatly, that is, the actual output power value of the electronic device differs greatly from the target power value, and it is identified that the test condition is not met. Conversely, if the absolute value of the difference is less than or equal to the first set threshold, it indicates that the target current value and the actual output current value differ little, that is, the actual output power value of the electronic device differs little from the target power value, and it is identified that the test condition is met.

[0057] It should be noted that the first set threshold mentioned in the above example is not excessively limited. For example, the first set threshold may be the product of the target current value and the current error coefficient, wherein the current error coefficient may be an empirical value, for example, the current error coefficient may be 0.1.

[0058] In some examples, whether the test condition is satisfied based on the difference recognition includes determining the target interval where the difference is located from multiple candidate intervals, and obtaining the recognition result mapped to the target interval. Among them, the recognition result includes satisfying the test condition and not satisfying the test condition. It can be understood that the value interval of the difference can be divided into multiple candidate intervals in advance, and a mapping relationship between each candidate interval and the recognition result is established. Different candidate intervals can map the same recognition result or different recognition results, and no excessive restrictions are made here.

[0059] In the embodiment of the present disclosure, the first operating parameter is determined by the electronic device when the second operating parameter remains unchanged, that is, the second operating parameter is not adjusted during the process of obtaining the first operating parameter.

[0060] It should be noted that there are no excessive restrictions on the first operating parameter and the second operating parameter.

[0061] For example, the first operating parameter includes an output power value and a temperature value of the electronic device. The temperature value of the electronic device may include a temperature value of a target area of ​​the electronic device. The target area is an area with the highest temperature of the electronic device. For example, taking the electronic device as a mobile phone, the target area may be any one of the front, back, and side of the mobile phone.

[0062] For example, the second operating parameter includes the frequency and load of processors such as a CPU (Central Processing Unit) and a GPU (Graphics Processing Unit), and the backlight brightness of the electronic device.

[0063] S104: Determine a heat dissipation parameter of the electronic device based on the first operating parameter.

[0064] It should be noted that the process of determining the heat dissipation parameter based on the first operating parameter can be implemented by using any heat dissipation parameter calculation method in the relevant technology, and no further limitation is made here.

[0065] In one embodiment, before determining the heat dissipation parameter of the electronic device based on the first operating parameter, it also includes identifying that the measurement duration reaches a set duration. It should be noted that there is no excessive limitation on the set duration, for example, the set duration can be 15 minutes.

[0066] In one embodiment, determining a heat dissipation parameter of the electronic device based on the first operating parameter includes determining the heat dissipation parameter based on a plurality of first operating parameters within a set time period.

[0067] In one embodiment, the first operating parameter includes an output power value and a temperature value of the electronic device. Based on the first operating parameter, a heat dissipation parameter of the electronic device is determined, including determining the heat dissipation parameter based on a second average value of multiple output power values, a third average value of temperature values ​​of multiple electronic devices, and an ambient temperature value.

[0068] In some examples, the thermal parameters are calculated as follows:

[0069] Heat dissipation parameter=second average value / (third average value-ambient temperature value).

[0070] For example, taking the electronic device as a mobile phone, if the area with the highest temperature of the mobile phone, that is, the target area, is the back of the mobile phone, and if the test conditions are met, the output power value of the mobile phone and the temperature value of the back of the mobile phone are measured, and in response to the measurement time reaching 15 minutes, the second average value of multiple output power values ​​of the mobile phone within 15 minutes, the third average value of multiple temperature values ​​on the back of the mobile phone within 15 minutes and the ambient temperature value can be obtained to determine the heat dissipation parameters.

[0071] The method for obtaining heat dissipation parameters provided by the embodiment of the present disclosure obtains the target current value corresponding to the electronic device when the output power value of the electronic device is the target power value, obtains the actual output current value of the electronic device, determines whether the target current value and the actual output current value meet the test conditions, and obtains the first operating parameter of the electronic device, wherein the first operating parameter is determined by the electronic device when the second operating parameter remains unchanged, and the heat dissipation parameter of the electronic device is determined based on the first operating parameter. Thus, the target current value can be determined based on the target power value, and the first operating parameter is not obtained until the target current value and the actual output current value meet the test conditions, which helps to improve the accuracy of the heat dissipation parameters.

[0072] Based on any of the above embodiments, the method further includes determining that the target current value and the actual output current value do not meet the test condition, returning to obtain the actual output current value of the electronic device and subsequent steps until the target current value and the actual output current value meet the test condition. Thus, when the test condition is not met, the actual output current value continues to be obtained, and whether the test condition is met is re-identified based on the target current value and the re-acquired actual output current value.

[0073] Figure 2 is a flow chart showing a method for obtaining heat dissipation parameters according to another exemplary embodiment. Figure 3 As shown, the method for obtaining heat dissipation parameters of the embodiment of the present disclosure includes the following steps.

[0074] S201, obtaining a target current value corresponding to the electronic device when the output power value of the electronic device is a target power value.

[0075] S202, obtaining an actual output current value of the electronic device.

[0076] For the relevant contents of steps S201 - S202 , please refer to the above embodiment and will not be described again here.

[0077] S203, obtaining a first average value of the sorted N actual output current values ​​of the electronic devices, wherein the multiple actual output current values ​​are sorted from early to late according to the acquisition time, and N is a positive integer.

[0078] S204: Based on the target current value and the first average value, identify whether a test condition is met.

[0079] It should be noted that the sorted N actual output current values ​​refer to the latest set of actual output current values ​​obtained, and the first average value refers to the average value of the latest set of actual output current values ​​obtained. N is not limited too much, for example, N is 5, 10, etc.

[0080] For example, the actual output current value of the electronic device includes current values ​​1 to 10, and the current values ​​1 to 10 are sorted from early to late according to the acquisition time, and the sorting result is current values ​​1 to 10, that is, the acquisition time of current value 1 is the earliest, and the acquisition time of current value 10 is the latest. Taking N=5 as an example, the first average value of current values ​​6 to 10 can be obtained, and based on the target current value and the first average value, it is identified whether the test condition is met.

[0081] If the test condition is not met, the actual output current value of the electronic device can be further obtained to obtain current values ​​11 to 13. The updated actual output current value of the electronic device includes current values ​​1 to 13. The current values ​​1 to 13 are sorted from early to late according to the acquisition time. The sorting result is current values ​​1 to 13, that is, the acquisition time of current value 1 is the earliest, and the acquisition time of current value 13 is the latest. The first average value of current values ​​9 to 13 can be obtained, and based on the target current value and the first average value, it is identified whether the test condition is met.

[0082] In one embodiment, based on the target current value and the first average value, identifying whether the test condition is met includes obtaining the difference between the target current value and the first average value, determining the target interval where the difference is located from multiple candidate intervals, and obtaining the recognition result of the target interval mapping. The recognition result includes whether the test condition is met or not.

[0083] In one embodiment, based on the target current value and the first average value, identifying whether the test condition is met includes obtaining the absolute value of the difference between the target current value and the first average value. If the absolute value is greater than a first set threshold value, it indicates that there is a large difference between the target current value and the first average value, that is, there is a large difference between the actual output power of the electronic device and the target power value, and it is identified that the test condition is not met. If the absolute value is less than or equal to the first set threshold value, it indicates that there is a small difference between the target current value and the first average value, that is, there is a small difference between the actual output power of the electronic device and the target power value, and it is identified that the test condition is met.

[0084] S205, if the test condition is not met, return to execute the actual output current value of the electronic device and subsequent steps until the test condition is met.

[0085] S206: Acquire a first operating parameter of the electronic device, where the first operating parameter is determined by the electronic device when the second operating parameter remains unchanged.

[0086] S207: Determine a heat dissipation parameter of the electronic device based on the first operating parameter.

[0087] For the relevant contents of steps S205-S207, please refer to the above embodiment and will not be repeated here.

[0088] The method for obtaining heat dissipation parameters provided by the embodiment of the present disclosure obtains the first average value of the actual output current values ​​of the N electronic devices after sorting, wherein the multiple actual output current values ​​are sorted from early to late according to the acquisition time, and whether the test condition is met is identified based on the target current value and the first average value. Thus, the first average value of the actual output current values ​​of the N electronic devices after sorting can be obtained, and the target current value and the first average value can be comprehensively considered to identify whether the test condition is met, which helps to improve the recognition accuracy of the test condition, thereby improving the accuracy of the heat dissipation parameters.

[0089] Based on any of the above embodiments, after measuring the actual output current value of the electronic device in step S102, the step further includes obtaining the standard deviation of the sorted N actual output current values.

[0090] Figure 3 is a flow chart showing a method for obtaining heat dissipation parameters according to another exemplary embodiment. Figure 3 As shown, the method for obtaining heat dissipation parameters of the embodiment of the present disclosure includes the following steps.

[0091] S301, obtaining a target current value corresponding to the electronic device when the output power value of the electronic device is a target power value.

[0092] S302, obtaining an actual output current value of the electronic device.

[0093] S303, obtaining a first average value of the sorted N actual output current values ​​of the electronic devices, wherein the multiple actual output current values ​​are sorted from early to late according to the acquisition time, and N is a positive integer.

[0094] S304, obtaining an absolute value of a difference between the target current value and the first average value.

[0095] For the relevant contents of steps S301 - S304 , please refer to the above embodiments and will not be described again here.

[0096] S305: If the absolute value is less than or equal to the first set threshold, and the last standard deviation of the sorting is greater than the second set threshold, it is identified that the test condition is not met, wherein the multiple standard deviations are sorted from early to late according to the acquisition time.

[0097] It should be noted that the standard deviation at the end of the sorting refers to the standard deviation with the latest acquisition time, and there is no excessive limitation on the second set threshold.

[0098] In an embodiment of the present disclosure, if the absolute value is less than or equal to the first set threshold, and the standard deviation at the end of the sorting is greater than the second set threshold, it indicates that the difference between the target current value and the first average value is small, that is, the difference between the actual output power of the electronic device and the target power value is small, and the discrete degree of a group of actual output current values ​​acquired at the latest time is large, that is, the actual output current value of the electronic device fluctuates greatly and is unstable, that is, the output power value of the electronic device fluctuates greatly and is unstable, and it is identified that the test conditions are not met.

[0099] S306: If the absolute value is less than or equal to the first set threshold, and the standard deviation at the end of the sorting is less than or equal to the second set threshold, and at least one of the M standard deviations after sorting is greater than the second set threshold, it is determined that the test condition is not met.

[0100] It should be noted that the M standard deviations after sorting refer to the set of standard deviations with the latest acquisition time, and there is no excessive limitation on M, for example, M is 5, 10, etc.

[0101] In an embodiment of the present disclosure, if the absolute value is less than or equal to a first set threshold, and the standard deviation at the end of the sorting is less than or equal to a second set threshold, and at least one standard deviation among the M standard deviations after sorting is greater than the second set threshold, it indicates that the difference between the target current value and the first average value is small, that is, the difference between the actual output power of the electronic device and the target power value is small, and the discrete degree of a group of actual output current values ​​with the latest acquisition time is small, and there is at least one group of actual output current values ​​with the latest acquisition time. The discrete degree is large, that is, the actual output current value of the electronic device fluctuates greatly and is unstable, that is, the output power value of the electronic device fluctuates greatly and is unstable, and it is identified that the test conditions are not met.

[0102] S307, if the absolute value is less than or equal to the first set threshold, and the standard deviation at the end of the sorting is less than or equal to the second set threshold, and the M standard deviations after sorting are all less than or equal to the second set threshold, it is identified that the test condition is met.

[0103] In an embodiment of the present disclosure, if the absolute value is less than or equal to the first set threshold, and the standard deviation at the end of the sorting is less than or equal to the second set threshold, and the M standard deviations after sorting are all less than or equal to the second set threshold, it indicates that the difference between the target current value and the first average value is small, that is, the difference between the actual output power of the electronic device and the target power value is small, and the discrete degree of the latest group of actual output current values ​​obtained is small, and the discrete degrees of multiple groups of actual output current values ​​obtained at the latest are all small, that is, the actual output current value of the electronic device fluctuates less and is relatively stable, that is, the output power value of the electronic device fluctuates less and is relatively stable, and the identification meets the test conditions.

[0104] S308: If the absolute value is greater than the first set threshold, it is determined that the test condition is not met.

[0105] For the relevant contents of step S308, please refer to the above embodiment, which will not be repeated here.

[0106] S309: If the test condition is not met and the absolute value is greater than the first set threshold, the second operating parameter is adjusted, and the process returns to execute the steps of obtaining the actual output current value of the electronic device and subsequent steps.

[0107] In an embodiment of the present disclosure, if the test condition is not met and the absolute value is greater than the first set threshold, it indicates that there is a large difference between the target current value and the first average value, that is, there is a large difference between the actual output power of the electronic device and the target power value. The second operating parameter is adjusted, and the process returns to execute the actual output current value of the electronic device and its subsequent steps.

[0108] In one embodiment, adjusting the second operating parameter may include obtaining an adjustment amount of the second operating parameter based on the absolute value, and adjusting the second operating parameter according to the adjustment amount. For example, the absolute value is positively correlated with the adjustment amount.

[0109] In one embodiment, adjusting the second operating parameter may include determining an adjustment amount of the second operating parameter based on the category of the second operating parameter, and adjusting the second operating parameter according to the adjustment amount. It is understandable that different second operating parameters may correspond to different adjustment amounts.

[0110] For example, the adjustment amount can be set to 1 gear, which can achieve graded adjustment of the second operating parameter.

[0111] For example, the adjustment amount can be set to 1%, 10%, etc. of the second operating parameter, so as to achieve linear adjustment of the second operating parameter.

[0112] In one embodiment, adjusting the second operating parameter may include obtaining an adjustment direction of the second operating parameter based on a magnitude relationship between the target current value and the first average value, and adjusting the second operating parameter according to the adjustment direction. For example, if the first current value is greater than the target average value, the adjustment direction may be determined to be decreasing, and if the first current value is less than the target average value, the adjustment direction may be determined to be increasing.

[0113] S310, if the test condition is not met and the absolute value is less than or equal to the first set threshold, the second operating parameter remains unchanged, and the process returns to executing the actual output current value of the electronic device and subsequent steps until the test condition is met.

[0114] In an embodiment of the present disclosure, if the test condition is not met and the absolute value is less than or equal to the first set threshold value, it indicates that the difference between the target current value and the first average value is small, that is, the difference between the actual output power of the electronic device and the target power value is small, the second operating parameter remains unchanged, and the process returns to execute the actual output current value of the electronic device and its subsequent steps until the test condition is met.

[0115] S311: If the test condition is met, obtain a first operating parameter of the electronic device, wherein the first operating parameter is determined by the electronic device when the second operating parameter remains unchanged.

[0116] S312: Determine a heat dissipation parameter of the electronic device based on the first operating parameter.

[0117] For the relevant contents of steps S311 - S312 , please refer to the above embodiments and will not be described again here.

[0118] The method for obtaining the heat dissipation parameters provided by the embodiment of the present disclosure, if the absolute value is less than or equal to the first set threshold, can comprehensively consider the size relationship between the last set of standard deviations and the second set threshold to identify whether the test conditions are met, that is, the discrete degree of the actual output current value can be considered to identify whether the test conditions are met, which helps to improve the recognition accuracy of the test conditions, thereby improving the accuracy of the heat dissipation parameters. In addition, when the test conditions are not met and the absolute value is large, the second operating parameter can be adjusted to adjust the actual output current value to adjust the output power value so that the output power value is closer to the target power value.

[0119] Based on any of the above embodiments, the second operating parameter is adjusted in step S309, including when the first average value is greater than the target current value, indicating that the average value of the output power value is greater than the target power value, reducing the second operating parameter to reduce the actual output current value, and then reducing the output power value, so that the output power value is closer to the target power value.

[0120] When the first average value is less than the target current value, it indicates that the average value of the output power value is less than the target power value. The second operating parameter is increased to increase the actual output current value, thereby increasing the output power value, so that the output power value is closer to the target power value.

[0121] In one embodiment, the electronic device is equipped with a central processor, and the second operating parameter is adjusted, including adjusting the frequency of the central processor, adjusting the load of the central processor in response to the completion of the frequency adjustment of the central processor, and adjusting the backlight brightness of the electronic device in response to the completion of the load adjustment of the central processor. Thus, multiple second operating parameters can be adjusted in the order of the frequency of the central processor, the load of the central processor, and the backlight brightness.

[0122] In some examples, the electronic device is equipped with a graphics processor, and adjusting the second operating parameter also includes adjusting the frequency of the graphics processor in response to the completion of the backlight brightness adjustment of the electronic device, and adjusting the load of the graphics processor in response to the completion of the frequency adjustment of the graphics processor. Thus, the multiple second operating parameters can be adjusted in the order of the frequency of the central processor, the load of the central processor, the backlight brightness, the frequency of the graphics processor, and the load of the graphics processor.

[0123] Figure 4 is a flow chart showing a method for obtaining heat dissipation parameters according to another exemplary embodiment. Figure 4 As shown, the method for obtaining heat dissipation parameters of the embodiment of the present disclosure includes the following steps.

[0124] S401, obtaining a target current value corresponding to the electronic device when the output power value of the electronic device is a target power value.

[0125] For the relevant contents of step S401, please refer to the above embodiment, which will not be repeated here.

[0126] S402, obtaining a fourth average value of the maximum value and the minimum value of the actual output current value.

[0127] It should be noted that the maximum value and the minimum value of the actual output current value are both reference output current values, and no excessive restrictions are imposed on the maximum value and the minimum value of the actual output current value.

[0128] In one implementation, the maximum value of the actual output current value refers to the reference output current value when the second operating parameter of the electronic device is maximum, and the minimum value of the actual output current value refers to the reference output current value when the second operating parameter of the electronic device is minimum.

[0129] For example, the maximum value of the actual output current value refers to the reference output current value when the frequency of the central processing unit of the electronic device is the maximum, the load of the central processing unit is the maximum, the frequency of the graphics processing unit is the maximum, the load of the graphics processing unit is the maximum, and the backlight brightness is the set brightness value.

[0130] For example, the minimum value of the actual output current value refers to the reference output current value when the frequency of the central processing unit of the electronic device is the minimum, the load of the central processing unit is the minimum, the frequency of the graphics processing unit is the minimum, the load of the graphics processing unit is the minimum, and the backlight brightness is the set brightness.

[0131] It should be noted that there are no excessive restrictions on the set brightness value, for example, it may include the average value of the maximum value and the minimum value of the backlight brightness.

[0132] S403, if the target current value is greater than the fourth average value, adjusting the second operating parameter to a first value to adjust the actual output current value to the fourth average value, wherein the first value is the second operating parameter when the actual output current value is the fourth average value.

[0133] S404, if the target current value is less than or equal to the fourth average value, adjust the second operating parameter to a second value to adjust the actual output current value to a minimum value, wherein the second value is the second operating parameter when the actual output current value is the minimum value.

[0134] In an embodiment of the present disclosure, if the target current value is greater than the fourth average value, indicating that the target current value is large, the second operating parameter is adjusted to the first value to adjust the actual output current value to the fourth average value, so that the actual output current value is closer to the target current value, and thus the output power value is closer to the target power value.

[0135] If the target current value is less than or equal to the fourth average value, indicating that the target current value is small, the second operating parameter is adjusted to the second value to adjust the actual output current value to the minimum value, so that the actual output current value is closer to the target current value, and thus the output power value is closer to the target power value.

[0136] S405, obtaining an actual output current value of the electronic device.

[0137] S406, identifying whether the target current value and the actual output current value meet the test conditions.

[0138] S407, if the test condition is not met, return to execute the actual output current value of the electronic device and subsequent steps until the test condition is met.

[0139] S408: If the test condition is met, obtain a first operating parameter of the electronic device, wherein the first operating parameter is determined by the electronic device when the second operating parameter remains unchanged.

[0140] S409: Determine a heat dissipation parameter of the electronic device based on the first operating parameter.

[0141] For the relevant contents of steps S405-S409, please refer to the above embodiment and will not be repeated here.

[0142] The method for obtaining heat dissipation parameters provided in the embodiment of the present disclosure obtains the fourth average value of the maximum value and the minimum value of the actual output current value. Taking into account the size relationship between the target current value and the fourth average value, the second operating parameter can be adjusted to adjust the actual output current value to adjust the output power value so that the output power value is closer to the target power value.

[0143] In order to make those skilled in the art understand the present disclosure more clearly, Figure 5 is a flow chart showing a method for obtaining heat dissipation parameters according to another exemplary embodiment. Figure 5 As shown, the method for obtaining heat dissipation parameters of the embodiment of the present disclosure includes the following steps.

[0144] S501, obtaining a target current value corresponding to the electronic device when the output power value of the electronic device is a target power value.

[0145] S502: Acquire an actual output current value of the electronic device.

[0146] S503: Obtain a first average value of the actual output current values ​​of the N sorted electronic devices.

[0147] S504, obtaining an absolute value of a difference between the target current value and the first average value.

[0148] S505: If the first average value is greater than the target current value, and the absolute value of the difference between the target current value and the first average value is greater than a first set threshold, it is determined that the test condition is not met.

[0149] S506: If the first average value is less than the target current value, and the absolute value of the difference between the target current value and the first average value is greater than a first set threshold, it is determined that the test condition is not met.

[0150] S507: If the absolute value of the difference between the target current value and the first average value is less than or equal to the first set threshold, determine whether the standard deviation at the end of the sorting is greater than the second set threshold.

[0151] If yes, execute step S510, if no, execute step S511.

[0152] S508, reducing the second operating parameter to reduce the actual output current value, and returning to execute step S502 and subsequent steps.

[0153] S509, increasing the second operating parameter to increase the actual output current value, and returning to execute step S502 and subsequent steps.

[0154] S510, identifying that the test condition is not met, the second operating parameter remains unchanged, and returning to execute step S502 and subsequent steps.

[0155] S511, determining whether the M standard deviations after sorting are all less than or equal to a second set threshold.

[0156] If yes, execute step S512; if no, execute step S510.

[0157] S512, identifying that a test condition is met, and obtaining a first operating parameter of the electronic device, wherein the first operating parameter is determined by the electronic device when the second operating parameter remains unchanged.

[0158] S513: Determine a heat dissipation parameter of the electronic device based on the first operating parameter.

[0159] For the relevant contents of steps S501-S513, please refer to the above embodiment and will not be repeated here.

[0160] Figure 6 is a block diagram of a device for obtaining heat dissipation parameters according to an exemplary embodiment. Figure 6 The device 100 for acquiring heat dissipation parameters according to the embodiment of the present disclosure includes: a first acquisition module 110 , a second acquisition module 120 , a third acquisition module 130 and a determination module 140 .

[0161] The first acquisition module 110 is configured to acquire a target current value corresponding to the electronic device when the output power value of the electronic device is a target power value;

[0162] The second acquisition module 120 is configured to acquire an actual output current value of the electronic device;

[0163] A third acquisition module 130 is configured to determine whether the target current value and the actual output current value meet a test condition, and acquire a first operating parameter of the electronic device, wherein the first operating parameter is determined by the electronic device when the second operating parameter remains unchanged;

[0164] The determination module 140 is configured to determine a heat dissipation parameter of the electronic device based on the first operating parameter.

[0165] In one embodiment of the present disclosure, the heat dissipation parameter acquisition device 100 also includes: an identification module, which is configured to execute: obtaining a first average value of N actual output current values ​​of the electronic device after sorting, wherein the multiple actual output current values ​​are sorted from early to late according to the acquisition time, and N is a positive integer; based on the target current value and the first average value, identifying whether the test condition is met.

[0166] In one embodiment of the present disclosure, the identification module is further configured to perform: obtaining the absolute value of the difference between the target current value and the first average value; if the absolute value is greater than a first set threshold, identifying that the test condition is not met; if the absolute value is less than or equal to the first set threshold, identifying that the test condition is met.

[0167] In one embodiment of the present disclosure, after obtaining the actual output current value of the electronic device, the identification module is further configured to perform: obtaining the standard deviation of the last N actual output current values;

[0168] The identification module is further configured to execute: if the absolute value is less than or equal to the first set threshold, and the standard deviation at the end of the sorting is greater than the second set threshold, identifying that the test condition is not met, wherein the multiple standard deviations are sorted from early to late according to the acquisition time; if the absolute value is less than or equal to the first set threshold, and the standard deviation at the end of the sorting is less than or equal to the second set threshold, and at least one standard deviation among the M standard deviations after sorting is greater than the second set threshold, identifying that the test condition is not met; if the absolute value is less than or equal to the first set threshold, and the standard deviation at the end of the sorting is less than or equal to the second set threshold, and the M standard deviations after sorting are all less than or equal to the second set threshold, identifying that the test condition is met.

[0169] In one embodiment of the present disclosure, the heat dissipation parameter acquisition device 100 also includes: an adjustment module, which is configured to execute: if the test condition is not met and the absolute difference is greater than the first set threshold, adjust the second operating parameter, and return to execute the measurement of the actual output current value of the electronic device and its subsequent steps.

[0170] In one embodiment of the present disclosure, the adjustment module is further configured to perform: when the first average value is greater than the target current value, reducing the second operating parameter to reduce the actual output current value; when the first average value is less than the target current value, increasing the second operating parameter to increase the actual output current value.

[0171] In one embodiment of the present disclosure, the electronic device is deployed with a central processing unit, and the adjustment module is further configured to execute: adjusting the frequency of the central processing unit; in response to the completion of the frequency adjustment of the central processing unit, adjusting the load of the central processing unit; in response to the completion of the load adjustment of the central processing unit, adjusting the backlight brightness of the electronic device.

[0172] In one embodiment of the present disclosure, the electronic device is deployed with a graphics processor, and the adjustment module is further configured to execute: in response to the completion of backlight brightness adjustment of the electronic device, adjusting the frequency of the graphics processor; in response to the completion of frequency adjustment of the graphics processor, adjusting the load of the graphics processor.

[0173] In one embodiment of the present disclosure, the first operating parameter includes the output power value and the temperature value of the electronic device; the determination module 140 is further configured to execute: determining the heat dissipation coefficient based on a second average value of multiple output power values, a third average value of multiple temperature values ​​of the electronic device and the ambient temperature value.

[0174] In one embodiment of the present disclosure, before obtaining the actual output current value of the electronic device, the heat dissipation parameter acquisition device 100 also includes: an adjustment module, which is configured to execute: obtaining a fourth average value of the maximum value and the minimum value of the actual output current value; if the target current value is greater than the fourth average value, adjusting the second operating parameter to a first value to adjust the actual output current value to the fourth average value, wherein the first value is the second operating parameter when the actual output current value is the fourth average value; if the target current value is less than or equal to the fourth average value, adjusting the second operating parameter to a second value to adjust the actual output current value to the minimum value, wherein the second value is the second operating parameter when the actual output current value is the minimum value.

[0175] In one embodiment of the present disclosure, the third acquisition module 130 is further configured to execute: determining that the target current value and the actual output current value do not meet the test condition, returning to the step of obtaining the actual output current value of the electronic device and subsequent steps until the target current value and the actual output current value meet the test condition.

[0176] Regarding the device in the above embodiment, the specific manner in which each module performs operations has been described in detail in the embodiment of the method, and will not be elaborated here.

[0177] The heat dissipation parameter acquisition device provided by the embodiment of the present disclosure acquires the target current value corresponding to the electronic device when the output power value of the electronic device is the target power value, acquires the actual output current value of the electronic device, determines whether the target current value and the actual output current value meet the test conditions, and acquires the first operating parameter of the electronic device, wherein the first operating parameter is determined by the electronic device when the second operating parameter remains unchanged, and the heat dissipation parameter of the electronic device is determined based on the first operating parameter. Thus, the target current value can be determined based on the target power value, and the first operating parameter is acquired to obtain the heat dissipation parameter only when the target current value and the actual output current value meet the test conditions, which helps to improve the accuracy of the heat dissipation parameter.

[0178] Figure 7 is a block diagram of an electronic device 200 according to an exemplary embodiment.

[0179] like Figure 7 As shown, the electronic device 200 includes:

[0180] The memory 210 and the processor 220, a bus 230 connecting different components (including the memory 210 and the processor 220), the memory 210 stores a computer program, and when the processor 220 executes the program, the method for obtaining the heat dissipation parameters described in the embodiment of the present disclosure is implemented.

[0181] Bus 230 represents one or more of several types of bus structures, including a memory bus or memory controller, a peripheral bus, an accelerated graphics port, a processor or a local bus using any of a variety of bus architectures. For example, these architectures include but are not limited to Industry Standard Architecture (ISA) bus, Micro Channel Architecture (MAC) bus, Enhanced ISA bus, Video Electronics Standards Association (VESA) local bus and Peripheral Component Interconnect (PCI) bus.

[0182] The electronic device 200 typically includes a variety of electronic device readable media. These media can be any available media that can be accessed by the electronic device 200, including volatile and non-volatile media, removable and non-removable media.

[0183] The memory 210 may also include computer system readable media in the form of volatile memory, such as random access memory (RAM) 240 and / or cache memory 250. The electronic device 200 may further include other removable / non-removable, volatile / non-volatile computer system storage media. By way of example only, the storage system 260 may be used to read and write non-removable, non-volatile magnetic media ( Figure 7 not shown, usually called a "hard drive"). Although Figure 7 Not shown, a disk drive for reading and writing to a removable non-volatile disk (e.g., a "floppy disk"), and an optical disk drive for reading and writing to a removable non-volatile optical disk (e.g., a CD-ROM, a DVD-ROM, or other optical media) may be provided. In these cases, each drive may be connected to the bus 230 via one or more data medium interfaces. The memory 210 may include at least one program product having a set (e.g., at least one) of program modules that are configured to perform the functions of the various embodiments of the present disclosure.

[0184] A program / utility 280 having a set (at least one) of program modules 270 may be stored, for example, in the memory 210, such program modules 270 including, but not limited to, an operating system, one or more application programs, other program modules, and program data, each of which or some combination may include an implementation of a network environment. The program modules 270 generally perform the functions and / or methods of the embodiments described in the present disclosure.

[0185] The electronic device 200 may also communicate with one or more external devices 290 (e.g., keyboards, pointing devices, displays 291, etc.), one or more devices that enable a user to interact with the electronic device 200, and / or any device that enables the electronic device 200 to communicate with one or more other computing devices (e.g., network cards, modems, etc.). Such communication may be performed through an input / output (I / O) interface 292. Furthermore, the electronic device 200 may also communicate with one or more networks (e.g., local area networks (LANs), wide area networks (WANs), and / or public networks, such as the Internet) through a network adapter 293. Figure 7 As shown, the network adapter 293 communicates with other modules of the electronic device 200 via the bus 230. It should be understood that, although not shown in the figure, other hardware and / or software modules can be used in conjunction with the electronic device 200, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, and data backup storage systems.

[0186] The processor 220 executes various functional applications and data processing by running the programs stored in the memory 210 .

[0187] It should be noted that the implementation process and technical principles of the electronic device of this embodiment refer to the aforementioned explanation of the method for obtaining the heat dissipation parameters of the embodiment of the present disclosure, and will not be repeated here.

[0188] The electronic device provided by the embodiment of the present disclosure can execute the above-mentioned method for obtaining heat dissipation parameters, obtain the target current value corresponding to the electronic device when the output power value of the electronic device is the target power value, obtain the actual output current value of the electronic device, determine whether the target current value and the actual output current value meet the test conditions, and obtain the first operating parameter of the electronic device, wherein the first operating parameter is determined by the electronic device when the second operating parameter remains unchanged, and the heat dissipation parameter of the electronic device is determined based on the first operating parameter. Thus, the target current value can be determined based on the target power value, and the first operating parameter is not obtained until the target current value and the actual output current value meet the test conditions, which helps to improve the accuracy of the heat dissipation parameters.

[0189] In order to implement the above embodiments, the present disclosure further proposes a computer-readable storage medium on which computer program instructions are stored. When the program instructions are executed by a processor, the steps of the method for obtaining heat dissipation parameters provided by the present disclosure are implemented.

[0190] Alternatively, the computer readable storage medium may be a ROM, a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, or the like.

[0191] In order to implement the above embodiments, the present disclosure further provides a computer program product, including a computer program, characterized in that when the computer program is executed by a processor of an electronic device, the method for obtaining the heat dissipation parameters as described above is implemented.

[0192] Those skilled in the art will readily appreciate other embodiments of the present disclosure after considering the specification and practicing the invention disclosed herein. The present disclosure is intended to cover any variations, uses or adaptations of the present disclosure that follow the general principles of the present disclosure and include common knowledge or customary techniques in the art that are not disclosed in the present disclosure. The description and examples are to be considered exemplary only, and the true scope and spirit of the present disclosure are indicated by the following claims.

[0193] It should be understood that the present disclosure is not limited to the exact structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims

1. A method for obtaining heat dissipation parameters, characterized in that: include: Acquiring a target current value corresponding to the electronic device when the output power value of the electronic device is the target power value; Obtaining an actual output current value of the electronic device; Determine that the target current value and the actual output current value meet a test condition, and obtain a first operating parameter of the electronic device, wherein the first operating parameter is determined when the second operating parameter of the electronic device remains unchanged; Based on the first operating parameter, a heat dissipation parameter of the electronic device is determined.

2. The method according to claim 1, characterized in that The method further comprises: Obtaining a first average value of the sorted N actual output current values ​​of the electronic devices, wherein the plurality of actual output current values ​​are sorted from early to late according to acquisition time, and N is a positive integer; Based on the target current value and the first average value, it is identified whether the test condition is satisfied.

3. The method according to claim 2, characterized in that The step of identifying whether a test condition is met based on the target current value and the first average value includes: Obtaining an absolute value of a difference between the target current value and the first average value; If the absolute value is greater than a first set threshold, identifying that the test condition is not met; If the absolute value is less than or equal to the first set threshold, it is recognized that the test condition is met.

4. The method according to claim 3, characterized in that After obtaining the actual output current value of the electronic device, the method further includes: Obtaining the standard deviation of the last N actual output current values; The step of identifying whether a test condition is met based on the target current value and the first average value includes: If the absolute value is less than or equal to the first set threshold, and the last standard deviation in the sorting is greater than the second set threshold, it is identified that the test condition is not met, wherein the plurality of standard deviations are sorted from early to late according to the acquisition time; If the absolute value is less than or equal to the first set threshold, and the standard deviation at the end of the sorting is less than or equal to the second set threshold, and at least one standard deviation among the M standard deviations after sorting is greater than the second set threshold, it is identified that the test condition is not met; If the absolute value is less than or equal to the first set threshold, and the final standard deviation after sorting is less than or equal to the second set threshold, and the M standard deviations after sorting are all less than or equal to the second set threshold, it is identified that the test condition is met.

5. The method according to claim 3, characterized in that: The method further comprises: If the test condition is not met and the absolute value is greater than the first set threshold, the second operating parameter is adjusted, and the process returns to executing the step of obtaining the actual output current value of the electronic device and subsequent steps.

6. The method according to claim 5, characterized in that The adjusting the second operating parameter includes: When the first average value is greater than the target current value, reducing the second operating parameter to reduce the actual output current value; When the first average value is smaller than the target current value, the second operating parameter is increased to increase the actual output current value.

7. The method according to claim 5, characterized in that The electronic device is equipped with a central processor, and the adjusting the second operating parameter includes: Adjusting the frequency of the central processing unit; In response to the frequency point adjustment of the central processing unit being completed, adjusting the load of the central processing unit; In response to the completion of the load adjustment of the central processor, the backlight brightness of the electronic device is adjusted.

8. The method according to claim 7, characterized in that The electronic device is equipped with a graphics processor, and the adjusting the second operating parameter further includes: In response to the backlight brightness adjustment of the electronic device being completed, adjusting the frequency of the graphics processor; In response to the frequency adjustment of the graphics processor being completed, the load of the graphics processor is adjusted.

9. The method according to any one of claims 1 to 8, characterized in that The first operating parameter includes the output power value and the temperature value of the electronic device; The determining, based on the first operating parameter, a heat dissipation parameter of the electronic device includes: The heat dissipation coefficient is determined based on a second average value of the plurality of output power values, a third average value of the plurality of temperature values ​​of the electronic devices, and an ambient temperature value.

10. The method according to any one of claims 1 to 8, characterized in that Before obtaining the actual output current value of the electronic device, the method further includes: Obtaining a fourth average value of the maximum value and the minimum value of the actual output current value; If the target current value is greater than the fourth average value, adjusting the second operating parameter to a first value to adjust the actual output current value to the fourth average value, wherein the first value is the second operating parameter when the actual output current value is the fourth average value; If the target current value is less than or equal to the fourth average value, the second operating parameter is adjusted to a second value to adjust the actual output current value to the minimum value, wherein the second value is the second operating parameter when the actual output current value is the minimum value.

11. The method according to any one of claims 1 to 10, characterized in that The method further comprises: Determine that the target current value and the actual output current value do not satisfy the test condition, return to the step of obtaining the actual output current value of the electronic device and subsequent steps until the target current value and the actual output current value satisfy the test condition.

12. A device for obtaining heat dissipation parameters, characterized in that: include: A first acquisition module is configured to acquire a target current value corresponding to the electronic device when the output power value of the electronic device is a target power value; A second acquisition module is configured to acquire an actual output current value of the electronic device; A third acquisition module is configured to determine whether the target current value and the actual output current value meet a test condition, and acquire a first operating parameter of the electronic device, wherein the first operating parameter is determined by the electronic device when the second operating parameter remains unchanged; The determination module is configured to determine the heat dissipation parameter of the electronic device based on the first operating parameter.

13. An electronic device, characterized in that: include: processor; a memory for storing processor-executable instructions; Wherein, the processor is configured to: Implement the steps of the method according to any one of claims 1 to 11.

14. A computer-readable storage medium having computer program instructions stored thereon, characterized in that: When the program instructions are executed by a processor, the steps of the method described in any one of claims 1 to 11 are implemented.